CN107085194B - A method of reducing Amount of Decay of Microwaves uncertainty of measurement - Google Patents
A method of reducing Amount of Decay of Microwaves uncertainty of measurement Download PDFInfo
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- CN107085194B CN107085194B CN201710321721.6A CN201710321721A CN107085194B CN 107085194 B CN107085194 B CN 107085194B CN 201710321721 A CN201710321721 A CN 201710321721A CN 107085194 B CN107085194 B CN 107085194B
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
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Abstract
The invention belongs to Microwave Measurement Technique and instrument fields, are related to a kind of method for reducing Amount of Decay of Microwaves uncertainty of measurement.Comprising steps of determining the technical indicator and attenuation size of attenuation device, attenuation device is individually demarcated or combined using Network Analyzer and is even marked；Analysis on Uncertainty is carried out to measurement result, calibration uncertainty of the attenuation device under different standing waves is provided according to analysis on Uncertainty.Differential declines amount and attenuation device characteristic are judged according to calibration uncertainty, select multiple attenuation device combinations even to mark or individually demarcate and then be applied in combination: the method that the present invention reduces Amount of Decay of Microwaves uncertainty of measurement passes through analysis on Uncertainty, provide attenuation device list mark corresponding to specific decaying numerical quantity or combination calibration, while reducing staking-out work amount in actual work, also reduce the uncertainty of multiple device attenuations.
Description
Technical field
The invention belongs to Microwave Measurement Technique and instrument field, it is related to a kind of Amount of Decay of Microwaves uncertainty of measurement that reduces
Method.
Background technique
Attenuation device is the common device in microwave measurement system, usually incessantly simply includes a kind of attenuator in system
Part or even same attenuation device need multiple combinations.Generation is mismatched in the port connection of microwave band, different components
Reflection signal and incoming signal be superimposed it is not only related with the amplitude of voltage, it is also related with phase.It declines for multiple attenuation devices
The calibration of decrement usually considers that repeatedly connection can generate the uncertainty introduced due to factors such as artificial, environment, so that selection is more
A combination of devices calibration.But due to introduce attenuation device uncertainty factor mainly include measuring device, calibration system mismatch,
Multiple combination of devices mismatch three parts, comprehensively consider several some factors, and multiple attenuation device combination calibration cannot reduce device
Uncertainty lacks suitable scaling method at present, to reduce the uncertainty of multiple device attenuations.
Summary of the invention
The purpose of the present invention is to provide a kind of methods for reducing Microwave attenuation measurement uncertainty.
In order to achieve the above object, the present invention uses following technical solutions:
A method of reducing Amount of Decay of Microwaves uncertainty of measurement, comprising steps of
S1, the technical indicator for determining attenuation device and attenuation size carry out attenuation device using Network Analyzer single
A calibration or combination are even marked
S11, Network Analyzer carry out parameter setting and system calibration according to the use condition of attenuation device；
Attenuation device to be measured is connected after S12, system calibration one by one to be demarcated, calibration includes that attenuation and standing wave parameter are surveyed
Examination；
After S13, the measurement of single attenuation device, multiple attenuators are combined；
S2, attenuation device is provided in different standing waves according to analysis on Uncertainty to measurement result progress analysis on Uncertainty
Under calibration uncertainty；
Differential declines amount and attenuation device characteristic are judged according to calibration uncertainty, and multiple attenuation device combinations is selected even to mark
Or it individually demarcates and then is applied in combination:
When attenuation device working frequency is less than 2GHz, if the system attenuation amount of multiple attenuation devices composition is greater than 60dB,
Multiple attenuation devices are individually demarcated, use is then combined；If the system attenuation amount of multiple attenuation device compositions is small
When 60dB, multiple attenuation devices are combined calibration；
When attenuation device working frequency be greater than 2GHz when, if multiple attenuation devices composition system attenuation amount be greater than 70dB,
Standing wave individually demarcates multiple attenuation devices less than 1.2, is then combined use；If multiple attenuation device compositions
System attenuation amount is greater than 70dB, standing wave is greater than 1.2, and multiple attenuation devices are combined calibration；If multiple attenuation device compositions
System attenuation amount be less than 70dB, multiple attenuation devices are combined calibration.
Further, step S2 analysis on Uncertainty process is as follows:
Establish Mason's formula
When the characteristic impedance of Transmission system is Z0When, output power P in Network Analyzer0For | e |2/Z0, decline by be measured
Reception power P i is after subtracting device | b2|2/Z0, the reflection power P of receiverRFor | a2|2/Z0, then receiver receives power are as follows:
PL=Pi-PR=(| b2|2/Z0)-(|a2|2/Z0)
By a2=b2ΓLIt arranges:
Thus the parameter L for the characterization decaying that Network Analyzer obtains are as follows:
When the exact matching of the connectivity port of attenuator and Network Analyzer, the expression formula of attenuation parameter are as follows:
Thus mismatch error is
ΔAm=20lg (1 ± | ΓG||S11|)(1±|ΓL||S22|)+10lg(1±|ΓL|2)
Attenuation device mismatch uncertainty in use are as follows:
Wherein, e is source output voltage, a1For attenuation device Single port input voltage, b1Electricity is exported for attenuation device Single port
Pressure, a2For attenuation device Two-port netwerk input voltage, b2For attenuation device Two-port netwerk output voltage, S11It is anti-for attenuation device Single port
Penetrate parameter, dimensionless, S21For attenuation device forward direction configured transmission, S12For attenuation device reverse transfer parameter, S22For attenuation device
Two-port netwerk reflection parameters, ΓLFor load reflection, ΓGFor source reflection parameters.
The present invention reduces the method for Amount of Decay of Microwaves uncertainty of measurement by analysis on Uncertainty, provides specific attenuation
Attenuation device list mark corresponding to numerical value or combination calibration also reduce multiple while reducing staking-out work amount in actual work
The uncertainty of device attenuation.
Detailed description of the invention
Fig. 1 is that attenuation device demarcates schematic diagram.
Fig. 2 is calibration result analysis on Uncertainty signal flow graph.
Fig. 3 is that judgement schematic diagram is even marked or individually demarcates and then be applied in combination in attenuation device combination.
Specific embodiment
The present invention is made with reference to the accompanying drawings and detailed description to carry out a step detailed description.
A method of reducing Amount of Decay of Microwaves uncertainty of measurement, comprising steps of
S1, the technical indicator for determining attenuation device and attenuation size carry out attenuation device using Network Analyzer single
A calibration or combination are even marked
S11, as shown in Figure 1, Network Analyzer carries out parameter setting and system calibration according to the use condition of attenuation device；
Attenuation device to be measured is connected after S12, system calibration one by one to be demarcated, calibration includes that attenuation and standing wave parameter are surveyed
Examination；
After S13, the measurement of single attenuation device, multiple attenuators are combined；
S2, analysis on Uncertainty is carried out to measurement result, analysis on Uncertainty process is as follows:
As shown in Fig. 2, e is source output voltage, a in figure1For attenuation device Single port input voltage, b1For attenuation device one
Port output voltage, a2For attenuation device Two-port netwerk input voltage, b2For attenuation device Two-port netwerk output voltage, S11For attenuator
Part Single port reflection parameters, dimensionless, S21For attenuation device forward direction configured transmission, S12For attenuation device reverse transfer parameter, S22
For attenuation device Two-port netwerk reflection parameters, ΓLFor load reflection, ΓGFor source reflection parameters, C is the leakage ginseng of source and load end
Amount, can ignore.
Establish Mason's formula
When the characteristic impedance of Transmission system is Z0When, output power P in Network Analyzer0For | e |2/Z0, decline by be measured
Reception power P i is after subtracting device | b2|2/Z0, the reflection power P of receiverRFor | a2|2/Z0, then receiver receives power are as follows:
PL=Pi-PR=(| b2|2/Z0)-(|a2|2/Z0)
By a2=b2ΓLIt arranges:
Thus the parameter L for the characterization decaying that Network Analyzer obtains are as follows:
When the exact matching of the connectivity port of attenuator and Network Analyzer, the expression formula of attenuation parameter are as follows:
Thus mismatch error is
ΔAm=20lg (1 ± | ΓG||S11|)(1±|ΓL||S22|)+10lg(1±|ΓL|2)
Attenuation device mismatch uncertainty in use are as follows:
According to analysis on Uncertainty, calibration uncertainty of the attenuation device under different standing waves is provided；
Differential declines amount and attenuation device characteristic are judged according to calibration uncertainty, and multiple attenuation device combinations is selected even to mark
Or it individually demarcates and then is applied in combination:
As shown in figure 3, when attenuation device working frequency is less than 2GHz, if the system attenuation amount of multiple attenuation devices composition
Greater than 60dB, (i.e. subsection calibration) is individually demarcated to multiple attenuation devices, use is then combined, can reduce system
Uncertainty；If the system attenuation amount of multiple attenuation device compositions is less than 60dB, multiple attenuation devices are combined calibration
(connecting mark)；
When attenuation device working frequency be greater than 2GHz when, if multiple attenuation devices composition system attenuation amount be greater than 70dB,
Standing wave individually demarcates multiple attenuation devices less than 1.2, is then combined use；If multiple attenuation device compositions
System attenuation amount is greater than 70dB, standing wave is greater than 1.2, and multiple attenuation devices are combined calibration；If multiple attenuation device compositions
System attenuation amount be less than 70dB, multiple attenuation devices are combined calibration.
Claims (2)
1. a kind of method for reducing Amount of Decay of Microwaves uncertainty of measurement, which is characterized in that comprising steps of
S1, the technical indicator for determining attenuation device and attenuation size individually mark attenuation device using Network Analyzer
Fixed or combination is even marked；
S11, Network Analyzer carry out parameter setting and system calibration according to the use condition of attenuation device；
Attenuation device to be measured is connected after S12, system calibration one by one to be demarcated, calibration includes attenuation and standing wave parameter testing；
After S13, the measurement of single attenuation device, multiple attenuators are combined；
S2, attenuation device is provided under different standing waves according to analysis on Uncertainty to measurement result progress analysis on Uncertainty
Demarcate uncertainty；
Differential declines amount and attenuation device characteristic are judged according to calibration uncertainty, select multiple attenuation device combinations even mark or single
It is a to demarcate and then be applied in combination:
When attenuation device working frequency is less than 2GHz, if the system attenuation amount of multiple attenuation devices composition is greater than 60dB, to more
A attenuation device is individually demarcated, and use is then combined；If the system attenuation amount of multiple attenuation device compositions is less than
When 60dB, multiple attenuation devices are combined calibration；
When attenuation device working frequency is greater than 2GHz, if the system attenuation amount of multiple attenuation devices composition is greater than 70dB, standing wave
Less than 1.2 subsection calibration attenuations, multiple attenuation devices are individually demarcated, are then combined use；If multiple decaying
The system attenuation amount of device composition is greater than 70dB, standing wave is greater than 1.2 attenuations and even marks, and multiple attenuation devices are combined mark
It is fixed；If the system attenuation amount of multiple attenuation device compositions is less than 70dB, multiple attenuation devices are combined calibration.
2. a kind of method for reducing Amount of Decay of Microwaves uncertainty of measurement according to claim 1, which is characterized in that step S2
Analysis on Uncertainty process is as follows:
Establish Mason's formula
When the characteristic impedance of Transmission system is Z0When, output power P in Network Analyzer0For | e |2/Z0, after attenuator to be measured
Receiving power P i is | b2|2/Z0, the reflection power P of receiverRFor | a2|2/Z0, then receiver receives power are as follows:
PL=Pi-PR=(| b2|2/Z0)-(|a2|2/Z0)
By a2=b2ΓLIt arranges:
Thus the parameter L for the characterization decaying that Network Analyzer obtains are as follows:
When the exact matching of the connectivity port of attenuator and Network Analyzer, the expression formula of attenuation parameter are as follows:
Thus mismatch error is
ΔAm=20lg (1 ± | ΓG||S11|)(1±|ΓL||S22|)+10lg(1±|ΓL|2)
Attenuation device mismatch uncertainty in use are as follows:
Wherein, e is source output voltage, a2For attenuation device Two-port netwerk input voltage, b2For attenuation device Two-port netwerk output voltage,
S11For attenuation device Single port reflection parameters, dimensionless, S21For attenuation device forward direction configured transmission, S12It is reversed for attenuation device
Configured transmission, S22For attenuation device Two-port netwerk reflection parameters, ΓLFor load reflection, ΓGFor source reflection parameters.
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| CN104183894A (en) * | 2014-08-29 | 2014-12-03 | 中国人民解放军63655部队 | Cut-off microwave power attenuator |
| CN106441117A (en) * | 2016-09-22 | 2017-02-22 | 西安交通大学 | Turntable error detection method based on multi-station etalon laser tracking system |
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2017
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| US7180314B1 (en) * | 2001-12-14 | 2007-02-20 | Lecroy Corporation | Self-calibrating electrical test probe calibratable while connected to an electrical component under test |
| CN103364752A (en) * | 2013-07-19 | 2013-10-23 | 中国电子科技集团公司第十三研究所 | Field calibration method of on-wafer load traction measurement system |
| CN103983931A (en) * | 2014-05-06 | 2014-08-13 | 中国电子科技集团公司第十三研究所 | Method for determining uncertainty of S parameter measurement conducted through vector network analyzer |
| CN104183894A (en) * | 2014-08-29 | 2014-12-03 | 中国人民解放军63655部队 | Cut-off microwave power attenuator |
| CN106441117A (en) * | 2016-09-22 | 2017-02-22 | 西安交通大学 | Turntable error detection method based on multi-station etalon laser tracking system |
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