CN107064910A - Laser optical path axis calibrating method and system - Google Patents
Laser optical path axis calibrating method and system Download PDFInfo
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- CN107064910A CN107064910A CN201710037529.4A CN201710037529A CN107064910A CN 107064910 A CN107064910 A CN 107064910A CN 201710037529 A CN201710037529 A CN 201710037529A CN 107064910 A CN107064910 A CN 107064910A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/497—Means for monitoring or calibrating
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
- G01S7/497—Means for monitoring or calibrating
- G01S7/4972—Alignment of sensor
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- Computer Networks & Wireless Communication (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
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- Studio Devices (AREA)
Abstract
Embodiment of the disclosure is on a kind of laser optical path axis calibrating method, including the first light beam is formed into the first image on imaging device by the first lens, the second light beam from the first light source is passed through into speculum and the second lens lighting object to be measured, object to be measured is formed into the second image on imaging device by the second lens and first lens；And at least one of orientation and pitching of the object to be measured are adjusted until described first image and the second image are overlapped in the imaging center of imaging device.
Description
Technical field
The invention belongs to optical technical field, and in particular to a kind of to realize that laser transmitting-receiving light path light axis is parallel or common optical axis
Calibration method and system.
Background technology
The laser launched laser irradiation object and receive to return from object is frequently necessary in laser acquisition fields
Signal detects come the target to needs detection.Must be parallel with the common optical axis or optical axis of receiving light path by Laser emission
Calibration just may insure the enough accuracy of ranging or target acquisition.Therefore laser transmitting-receiving light path light axis is parallel or common optical axis is calibrated
It always is one of problem that laser ranging field must be faced.At present, traditional common optical axis calibration is contrasted by aperture
Spot center is calibrated, and eye-observation judges to introduce uncertain error.And optical axis collimation needs to use multiple planes to send out
Mirror adjustment optical axis is penetrated, finally to realize that common optical axis is calibrated.The use of multiple eyeglasses more possibly brings error greatly, complicated
Structure also brings great inconvenience to calibration, and operates these complicated structures to carry out optical axis calibrator to optical system
Also require that considerable degree of professional knowledge.Common laser radar user may lack the element of calibration and perform the skill of calibration
Can training and can not voluntarily complete calibration, therefore optical axis regulating measure a kind of easy to operate and visual and understandable is provided can be with
Provide the user more facilities.
The content of the invention
Embodiment of the disclosure passes through the first lens on a kind of laser optical path axis calibrating method, including by the first light beam
The first image is formed on imaging device, the second light beam from the first light source is to be measured by speculum and the second lens lighting
Object, forms the second image, and adjust to be measured right by object to be measured by the second lens and the first lens on imaging device
At least one of the orientation of elephant and pitching are until the first image and the second image are overlapped in the imaging center of imaging device.
In certain embodiments, the first light source is located on the equivalent focal plane of the second lens, and the second light beam passes through speculum
Directional light is converted to the second lens.
In certain embodiments, the first light beam is sent by secondary light source, and secondary light source and the first light source are identical or different.
In certain embodiments, methods described also include adjustment secondary light source orientation and at least one of pitching until the
One image and the second image are overlapped in the imaging center of imaging device.
In certain embodiments, methods described also includes adjustment secondary light source to the distance of the first lens.
In certain embodiments, methods described also includes the distance of adjustment the first light source to the second lens.
In certain embodiments, the first light beam incides the first lens after being reflected by speculum.
In certain embodiments, the light from the first light source is incided after the first lens by speculum reflection
Second lens.
Embodiment of the disclosure also includes a kind of laser optical path optical axis calibrator system, including the first light source, the first lens, the
Two lens, speculum, imaging device and adjusting apparatus, wherein the first lens are used to that the will to be formed on the first light beam imaging device
One image, the first light source is used to launch the second light beam to pass through speculum and the second lens lighting object to be measured, and adjustment dress
Put for passing through the second image and the first image that the second lens and the first lens are formed on imaging device based on object to be measured
Whether at least one of orientation and pitching to adjust object to be measured are overlapped in the imaging center of imaging device.
In certain embodiments, the first light source is located on the equivalent focal plane of the second lens, and the second light beam passes through speculum
Directional light is converted to the second lens.
It is fast there is provided can be used for that embodiment of the disclosure helps to solve at least some problems of the prior art
The method and system that quick-mounting adjusts the optical axis of laser transmitting-receiving light path parallel or common optical axis is calibrated, can be solved simultaneously relative to prior art
Parallel and common optical axis the calibration of laser transmitting-receiving light path light axis, and calibration method is more easy, quick and directly perceived, calibration result
Therefore more accurately and reliably.
Brief description of the drawings
Present disclose provides accompanying drawing in order to be further understood to disclosure, accompanying drawing constitutes the one of present disclosure
Part, but it is only used for illustrating the non-limiting example in terms of some for embodying involved inventive concept, rather than be used for
Make any limitation.
Fig. 1 is the schematic diagram of the laser optical path optical axis parallel calibration system according to the disclosure some embodiments.
Fig. 2 is the schematic diagram of the laser optical path common optical axis calibration system according to the disclosure some embodiments.
Fig. 3 is the flow chart of the laser optical path axis calibrating method according to the disclosure some embodiments.
Embodiment
It will hereinafter use those skilled in the art and pass on them the essence institute worked to others skilled in the art
Usually used term describes the various aspects of this paper illustrative embodiments.However, for a person skilled in the art
It is evident that, alternative can be put into practice using only some in described many aspects.For explanation
Purpose, there is set forth herein specific numerical value, material and configuration, to be more easily understood illustrative embodiment.However, right
Be evident that for those skilled in the art, can also put into practice this paper's in the case where eliminating specific detail
Alternative.In other cases, it is convenient to omit or simplify well-known feature, so as not to be difficult to the embodiments herein
Understand.
In addition, various operations will be in turn described as in the way of most helpful in illustrative embodiment is understood herein multiple
Discrete operation.However, described order is not construed as meaning that these operations are necessarily dependent upon described order.
Especially, these operations are not necessarily performed in the order of presentation.
It will be appreciated by those skilled in the art that although the grade of term first, second can be used to describe various elements herein,
These elements should not be limited by these terms.These terms are only used for element being distinguished from each other out.For example, the first element can claim
Make second element, and similarly, second element can be referred to as the first element, be made without departing from the scope of the present invention.As made herein
, any or all combination listed in one or more of project of term "and/or" including association.Use herein
Term merely to description specific embodiment purpose and be not intended to limitation the present invention.As used herein, singulative
" one " and "the" are intended to also include plural form, and other look like unless the context clearly.Those skilled in the art will
Term " comprising " and/or "comprising" are further understood when herein in use, defining the feature of statement, entirety, step, behaviour
Make, the presence of element and/or part, but be not excluded for one or more of the other feature, entirety, step, operation, element, part and/
Or the presence or increase of its combination.
In addition, term "and/or" can represent " and ", "or", distance, " one ", " some but be not all of ", " both
Neither " and/or " both are all ", but the scope of the theme is not intended to limit in these areas.In appended specification and/or power
During profit is required, term " comprising " and "comprising" and its derivative words can be used, they should be regarded as mutual synonym.Similar accompanying drawing
Mark is hereinafter used to refer to similar part.
Fig. 1 is the schematic diagram of the laser optical path optical axis parallel calibration system 100 according to the disclosure some embodiments.System
100 include optional first lens 101, the second lens 103, optional first light source 105, imaging device 107, secondary light source
109th, speculum 111, the 3rd lens 113 and adjusting apparatus 117.Wherein the first lens 101 and the first light source 105 are outside
It can be omitted in the case of boundary's incident light.System 100 is used for the optical axis and the first light source for adjusting light path corresponding to object 115 to be measured
The optical axis of reference path corresponding to 105 it is parallel.Wherein the first light source 105 is located on the focal plane F1 of the first lens 101.The
The focal length f1 of one lens 101 is, it is known that the focal plane F1 of the first lens 101 position therefore can be determined by measurement distance.
First light source 105 can be used as reference light source, and can include any light-emitting component, can especially include unicast
Long, multi-wavelength or white light laser.According to image-forming principle, the incident light within system 100 from the first light source 105 passes through first
Will be on imaging device 107 into the first image after the lens 103 of lens 101 and second.In the first lens 101 and the first light source 105
In some embodiments omitted, first light beam can be imaged on imaging device 107 merely with the second lens 103.This first
Light beam can be the reference ray for including but is not limited to directional light beyond laser optical path optical axis parallel calibration system 100,
System 100 is used to the reference ray adjust the light path corresponding to object 115 to be measured to parallel.First light beam can pass through
Modulation is to form the first image, and if imaging is not on focal plane, the information that can also be carried by it carries out current shape
The judgement of state.First light beam can be by light source or the later transmitting of other devices regulation, while it can also be self-contained each
Kind of information, by the processing to entrained information, equally can determine that optical axis is parallel or characteristic of common optical axis.In some implementations
In example, secondary light source 109 can also use as the first light source 105 and only need to carry out adaptation to light path simultaneously.Should
Imaging device 107 can include a variety of devices and/or the structure that can be reproduced in visual mode to imaging.Imaging
Device 107 is for example including camera, charge coupling device (CDD), complementary mos device (CMOS), display screen
With projection screen etc..It is saturating that light path to be measured corresponding to object 115 to be measured includes secondary light source 109, speculum the 111, the 3rd
Mirror 113 and adjusting apparatus 117.Object 115 to be measured can be any object for treating adjustment, including but not limited to other light sources
And/or imaging device, the role of itself and the first light source 105 can mutually replace, that is to say, that can adjust the He of object 115 to be measured
In first light source 105 any one with cause the light source 105 of object 115 and first to be measured respectively corresponding optical axis be parallel to each other.
In one embodiment, object 115 to be measured is such as CCD optical pickup apparatus.Secondary light source 109 is for example arranged at
On the equivalent focal plane F`2 of 3rd lens 113, equivalent focal plane F`2 is defined as from the reflected mirror 111 in the center of secondary light source 109
The distance value at the center of the 3rd lens 113, i.e. optical axis line length are reflexed to, equal to the focal length value F2 of the 3rd lens 113.Secondary light source
109 the second light beams launched incide exiting parallel after the 3rd lens 113 after the reflection of speculum 111, and irradiate position
Object to be measured 115 on the focal plane F2 of the 3rd lens 113.The focal length f2 of 3rd lens 113 be, it is known that therefore by measure away from
The position of its focal plane and equivalent focal plane is placed from determination.The principle reversible according to light path, from illuminated object to be measured
115 light sent through the 3rd lens 113 and the second lens 103 on imaging device 107 into the second image.Speculum 111
It can be semi-transparent semi-reflecting lens, or plate semi-transparent semi-reflecting film, so that the light sent from object 115 to be measured can be by speculum
111 enter the second lens 103, and finally on imaging device 107 into the second image.
In certain embodiments, the first image and the second image include but is not limited to luminous point, array of light spots or predefined
Other patterns.In certain embodiments, the first image and the second image include pixel.Adjusting apparatus 117 is used to adjust to be measured
The orientation of at least one both light sources 105 of object 115 and first and/or pitching, until the first image and the second image are in imaging
Overlapped on device, wherein, the orientation of object 115 to be measured and pitching include：Distance, to be measured of the object 115 to be measured to the 3rd lens 113
The angle of pitch of object 115 in the horizontal direction and the angle of pitch in vertical direction；The orientation and pitching bag of first light source 105
Include：The distances of first the 105 to the first lens of light source 101, the first light source 105 angle of pitch in the horizontal direction and in vertical direction
On the angle of pitch.In certain embodiments, adjusting apparatus 117 is connected to object 115 to be measured, and including those skilled in the art
At least one of orientation and the pitching of known mechanical part and electric structure to adjust object 115 to be measured.Adjusting apparatus
117 can include graduated scale, adjusting knob, movable platform, drive motor and timer etc..Adjusting apparatus 117 can also be intelligence
Energy device, you can with including the special of the one or more softwares or firmware program for driving the adjusting apparatus 117 to act of execution
With integrated circuit (ASIC), electronic circuit, processor, memory, combinational logic circuit and/or the described regulatory function of offer
Other suitable components, or be connected to above-mentioned application specific integrated circuit (ASIC), electronic circuit, processor, memory, group
Combinational logic circuit and/or other suitable components that described function is provided.Orientation herein can be included in three-dimensional space
Between in translation any selected free degree, and pitching can include allocating around the rotation of selected dead axle and relative to selected
The adjustment at the inclination angle in face.
In certain embodiments, adjusting apparatus 117 is also connected to the first light source 105 to adjust its orientation and pitching at least
One of.Adjusting apparatus 117 is optionally also for adjusting distance, the object to be measured 115 of the first lens of distance 101 of the first light source 105
The distances of the lens 113 of distance the 3rd, the orientation of the first light source 105, the pitching of the first light source 105, the orientation of object to be measured 115 and
One or more of the pitching of object 115 to be measured, to be minimum clear of hot spot by the first image and the second Image Adjusting
Clear image.In certain embodiments, by the ginseng corresponding to the first light source 105 and its formed first image during adjustment process
Examine light path to remain stationary as, so that the first image will also keep constant in the case where imaging device 107 is remained stationary as.When adjustment dress
Second image change in location will occur on imaging device 107 when putting orientation or the pitching of 117 adjustment object 115 to be measured.Thus
It is in course of adjustment and the second image and the first image is carried out to the comparison of position, when the second image and the first image are in imaging device
When being overlapped at 107 center, such as center pel, it may be determined that the first image distinguishes the light of corresponding light path with the second image
Axle, which has been adjusted to, to be parallel to each other.Conversely, object 115 to be measured can also be fixed so that the second image is fixed, pass through
Adjust the first light source orientation or pitching so that the first image completed with the second picture registration optical axis it is parallel adjustment.In a word, only
The object 115 to be measured adjustment parallel with the i.e. achievable optical axis of the relative position of an object among the first light source 205 need to be adjusted.
Fig. 2 is the schematic diagram of the laser optical path common optical axis calibration system 200 according to the disclosure other embodiments.System
200 are similarly included optional first lens 201, the second lens 203, optional first light source 205, imaging dress with system 100
Put 207, secondary light source 209, speculum 211, the 3rd lens 213 and adjusting apparatus 217.System 200 is used to adjust to be measured right
As light path is coaxial with reference path optical axis.From unlike system 100, light from the first light source 205 in system 200 is in warp
Reflected by speculum 211 after crossing the first lens 201 and incide the second lens 203, and the shape on imaging device 207 afterwards
Into the first image.Speculum 211 can be semi-transparent semi-reflecting lens, or plate semi-transparent semi-reflecting film.Speculum 211 is simultaneously for reference light
In order to the regulation of common optical axis in road and light path to be measured.Similar to system 100, the adjusting apparatus 217 in system 200 is based on to be measured
The second image and the first figure that object 115 is formed by the 3rd lens 213 and the second lens 203 on the imaging device 207
Seem the no imaging center 207 in imaging device overlap at least one of orientation and pitching to adjust object 115 to be measured or
At least one of the orientation of first light source 205 and pitching.It is in course of adjustment and the second image and the first image is subjected to position
Compare, when the second image and the first image are overlapped at the center of imaging device 207, such as center pel, it may be determined that the
One image and the second image the optical axis of corresponding light path respectively have been adjusted to common optical axis.By increasing the second lens 203
Bore, system 100 or 200 can also be designed to include multiple first light sources and multiple objects to be measured so as to multicast, many
The form such as the receipts of hair one or MIMO carries out the calibration of optical axis.For example, secondary light source 209 can include more than one light
Source, system 100 or 200 is used equally for calibrating the optical axis of any one light emitting source in secondary light source 209.
In certain embodiments, the first light beam can be made through the second lens 203 in imaging device merely with speculum 211
It is imaged on 207.The light beam can be the reference ray beyond laser optical path optical axis parallel calibration system 200, the reference light
Line incides speculum 211 and reflexes to the second lens 203 and be then imaged, and system 200 is used for corresponding to object 215 to be measured
Light path adjusted with the reference ray to parallel.The light beam can form the first image through ovennodulation, and if be imaged not
On focal plane, the information that can also be carried by it carries out the judgement of current state.First light beam can by light source or
The later transmitting of other devices regulation, at the same it can also self-contained various information, by the processing to entrained information, equally
It can determine that optical axis is parallel or characteristic of common optical axis.In certain embodiments, secondary light source 209 can also be used as first simultaneously
Light source 205 uses and only needs to carry out adaptation to light path.
Fig. 3 is the flow chart of the laser optical path axis calibrating method according to the disclosure some embodiments.The calibration method makes
Performed with the system 100 or 200 shown in similar Fig. 1 or 2, because the action of involved part and execution has been described above,
Therefore the description to method and step is not being repeated., will bag by the second lens 103,203 in the step 301 of the calibration method
Include but be not limited to the first light beam of directional light and form the first image on imaging device 107,207.For example, can be saturating by first
Mirror 101,201 and the second lens 103,203 using as the first light source 105,205 of reference light source on imaging device 107,207
Form the first image.The optical axis for forming light path used in the first image is defined as primary optic axis.In step 303, it will come from
Second light beam of secondary light source 109,209 by speculum 111,211 and the 3rd lens 113,213 irradiate object 115 to be measured,
215.In step 305, object 115,215 to be measured is filled in imaging by the 3rd lens 113,213 and the second lens 103,203
Put and the second image is formed on 107,207.The optical axis for forming light path used in the second image is defined as the second optical axis.In step
In 307, adjust at least one of orientation and pitching of object to be measured until the first image and the second image imaging device 107,
207 imaging center is overlapped.Be the minimum picture rich in detail of hot spot in the first image and the second image, and imaging device 107,
When 207 imaging center is overlapped, it may be determined that primary optic axis has been calibrated to parallel or coaxial with the second optical axis.Object 115 to be measured,
215 and first light source 105,205 can exchange, i.e., only need to adjust one of both.First light source 105,205 and object to be measured
115th, 215 may each be one or more to be calibrated in batch, or to this it is one or more among any one school
It is accurate.
The above-mentioned embodiment of the example of the present invention is not intended to exhaustion, is also not intended to limit the invention to disclosed above bright
True form.Although will recognize described above is the particular example of the present invention, in the technology people of association area for the purpose of illustration
Various suitable modifications may be realized within the scope of the present invention by knowing.Although various processes or block diagram may in this application with to
Fixed order is stated, but can perform the routine of these steps with different order in an alternative embodiment, or is implemented with different suitable
The system of the block diagram of sequence.Some processes or frame can be deleted, mobile, be added, subdivision, and combination and/or modification are alternative to provide
Or sub-portfolio.In addition, although some processes or block diagram are possibly shown as continuously performing, but can on the contrary perform parallel or realize these
Process or block diagram, or can perform or realize these processes or block diagram in the different time.In addition, any spy indicated herein
Fixed number value is example.Different value or scope can be used by being appreciated that in alternative.
As described above, the specific term for describing to use when some characteristics or aspect of the invention is not construed as implying that the term exists
Redefine to be restricted to of the invention any specific feature, characteristic or the aspect associated with the term herein.Generally, exist
The term used in appended claims should not be construed as limiting the invention to the particular example disclosed in specification, but on
Except stating when embodiment part exactly defines such term.Correspondingly, actual range of the invention not only includes public affairs
The example opened, and including being practiced or carried out all equivalent ways of the present invention according to claims.
Claims (11)
1. a kind of laser optical path axis calibrating method, including：
First light beam is formed into the first image by the first lens on imaging device；
The second light beam from the first light source is passed through into speculum and the second lens lighting object to be measured；
Object to be measured is formed into the second image on imaging device by the second lens and first lens；And
At least one of orientation and pitching of the object to be measured are adjusted until described first image and the second image are filled in imaging
The imaging center put is overlapped.
2. the method described in claim 1, wherein first light source is located on the equivalent focal plane of second lens, it is described
Second light beam is converted to directional light by speculum and the second lens.
3. the method described in claim 1, wherein first light beam is sent by secondary light source, secondary light source and the first light source phase
It is same or different.
4. the method described in claim 3, in addition at least one of the orientation of the adjustment secondary light source and pitching are until the
One image and the second image are overlapped in the imaging center of imaging device.
5. the method for claim 3, in addition to the secondary light source is adjusted to the distance of first lens.
6. the method for claim 1, in addition to first light source is adjusted to the distance of second lens.
7. the method for claim 1 wherein first light beam, to incide described first saturating after being reflected by the speculum
Mirror.
8. the method for claim 1 wherein the light from first light source is passing through the speculum after the first lens
Reflect and incide the second lens.
9. the method for claim 1 wherein the orientation of the object to be measured and pitching include：The object to be measured is to described second
The distance of lens, the angle of pitch of object to be measured in the horizontal direction and the angle of pitch in vertical direction.
10. a kind of laser optical path optical axis calibrator system, including：
First light source, the first lens, the second lens, speculum, imaging device and adjusting apparatus；Wherein
First lens are used to that the first image will to be formed on the first light beam imaging device；
First light source is used to launch the second light beam to pass through speculum and the second lens lighting object to be measured；And
The adjusting apparatus is used for based on the object to be measured by second lens and the first lens in the imaging device
The second image and described first image of upper formation whether the imaging device imaging center overlap it is described to be measured to adjust
At least one of the orientation of object and pitching.
11. the system described in claim 9, wherein first light source is located on the equivalent focal plane of second lens, institute
State the second light beam and be converted to directional light by speculum and the second lens.
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| CN110568420B (en) * | 2019-08-29 | 2021-06-11 | 北京空间机电研究所 | Laser radar receiving and transmitting alignment device and method |
| CN110749876A (en) * | 2019-08-30 | 2020-02-04 | 上海禾赛光电科技有限公司 | Calibration method and calibration structure for laser radar |
| CN110749876B (en) * | 2019-08-30 | 2021-11-19 | 上海禾赛科技有限公司 | Calibration method and calibration structure for laser radar |
| WO2022077711A1 (en) * | 2020-10-12 | 2022-04-21 | 北醒（北京）光子科技有限公司 | Laser radar system and calibration method therefor |
| CN113189776A (en) * | 2021-04-25 | 2021-07-30 | 歌尔股份有限公司 | Calibration system, calibration method and calibration device for augmented reality equipment |
| CN113189776B (en) * | 2021-04-25 | 2022-09-20 | 歌尔股份有限公司 | Calibration system, calibration method and calibration device for augmented reality equipment |
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Application publication date: 20170818 |