CN107014493B - A kind of direct measuring device and method of photon polarization state density matrix - Google Patents

A kind of direct measuring device and method of photon polarization state density matrix Download PDF

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CN107014493B
CN107014493B CN201710258109.9A CN201710258109A CN107014493B CN 107014493 B CN107014493 B CN 107014493B CN 201710258109 A CN201710258109 A CN 201710258109A CN 107014493 B CN107014493 B CN 107014493B
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polarization
measured signal
state
incident
displacement crystal
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CN107014493A (en
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张子静
岑龙柱
赵远
张建东
李硕
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Heilongjiang Industrial Technology Research Institute Asset Management Co ltd
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Harbin Institute of Technology
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00Measuring polarisation of light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00Measuring the characteristics of individual optical pulses or of optical pulse trains
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00Measuring polarisation of light
    • G01J4/04Polarimeters using electric detection means

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  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

A kind of direct measuring device and method of photon polarization state density matrix, are related to a kind of direct measuring of photon polarization state density matrix, and coherent approach in quantum physics is directly acquired in order to solve the problems, such as that quantum tomography can not provide.Measured signal is incident to first state converter, it is incident to diagonal polarization correlation displacement crystal via the transformed measured signal of first state converter, measured signal after diagonally polarizing correlation displacement crystal transition is incident to the second state converter, it is incident to imaging system by the transformed measured signal of the second state converter, the measured signal of imaging system output is incident to third state converter, is received by CCD camera by the transformed measured signal of third state converter.It has the beneficial effect that the measurement method only needs the measurement three times of two substrates, is the very attractive effective ways for substituting tomography and localization and detecting potential mixed state with the optional density matrix array element of determination without considering system dimension d.

Description

A kind of direct measuring device and method of photon polarization state density matrix
Technical field
The present invention relates to a kind of direct measurings of photon polarization state density matrix.
Background technology
Quantum tomography (Quantum State Tomography, QST) is a kind of standard approach measuring density matrix. In QST frames, it usually needs carried out originally using a large amount of cut-and-dried identical quantum aspects a series of based on incompatible base The excessively complete measurement of arrow;Then Measurement Algorithm is fitted and is obtained based on certain restructing algorithm again the expression of quantum state Formula.Although having emerged many achievements, the expansibility of experimental provision and the complexity of restructing algorithm to improve QST Property makes QST seem weak in face of the very high system of dimension.Further, since QST progress is a total reconfiguration process.Cause This can not provide the method for directly acquiring coherence very interested in quantum physics, such as:The amount of directly acquiring can not be provided The method of nondiagonal element in muon physics.
Invention content
It can not provide the purpose of the present invention is to solve quantum tomography and directly acquire coherent approach in quantum physics The problem of, provide a kind of direct measuring device and method of photon polarization state density matrix.
A kind of direct measuring device of photon polarization state density matrix of the present invention, including first state converter, Diagonal polarization correlation displacement crystal, the second state converter, imaging system, third state converter and CCD camera;
Measured signal is incident to first state converter, is incident to via the transformed measured signal of first state converter Diagonal polarization correlation displacement crystal, the measured signal after diagonally polarizing correlation displacement crystal transition are incident to the second state and turn Parallel operation is incident to imaging system, the measured signal of imaging system output by the transformed measured signal of the second state converter It is incident to third state converter, is received by CCD camera by the transformed measured signal of third state converter;
The first state converter includes that the first vertical polarization correlation displacement crystal and first level polarize correlation displacement Crystal;
First vertical polarization correlation displacement crystal:For the spot center of incident measured signal to be generated in the x direction One displacement polarized vertically with incident measured signal;
First level polarizes correlation displacement crystal:For the spot center of incident measured signal to be generated in the x direction One with the displacement of incident measured signal horizontal polarization;
The directions x are horizontal direction;
Second state converter includes the second vertical polarization correlation displacement crystal and the second horizontal polarization correlation displacement Crystal;
Second vertical polarization correlation displacement crystal:It is polarized vertically for will be incident in the incident light of the second state converter Component worry removes;
Second horizontal polarization correlation displacement crystal:For horizontal polarization in the incident light of the second state converter will to be incident to Component worry removes;
The third state converter includes spherical surface Fourier transform lens, horizontal cylinder Fourier transform lens and vertical Cylinder Fourier transform lens;
Spherical surface Fourier transform lens:For making two-dimensional Fourier transform to imaging system imaging;
Horizontal cylinder Fourier transform lens:One-dimensional Fourier for making horizontal direction to imaging system imaging becomes It changes, vertical direction keeps preimage;
Vertical cylinder Fourier transform lens:One-dimensional Fourier for making vertical direction to imaging system imaging becomes It changes, horizontal direction keeps preimage.
A kind of measurement method of the direct measuring device of photon polarization state density matrix of the present invention, the measurement method Include the following steps:
Step 1: adjustment first state converter, light path is added by the first vertical polarization correlation displacement crystal;Adjustment second Light path is added in state converter, the second vertical polarization correlation displacement crystal;Third state converter is adjusted, it successively will be in spherical surface Fu Light path is added in leaf transformation lens, horizontal cylinder Fourier transform lens and vertical cylinder Fourier transform lens and blank state, The ccd image of a CCD camera is respectively acquired every time;The ccd image of four CCD cameras acquisition is calculated respectively, obtains the One photon polarizes density of states array element;
Step 2: adjustment first state converter, light path is added by first level polarization correlation displacement crystal;Adjustment second Light path is added in state converter, the second vertical polarization correlation displacement crystal;Third state converter is adjusted, it successively will be in spherical surface Fu Light path is added in leaf transformation lens, horizontal cylinder Fourier transform lens and vertical cylinder Fourier transform lens and blank state, The ccd image of a CCD camera is respectively acquired every time;The ccd image of four CCD cameras acquisition is calculated respectively, obtains the Two photons polarize density of states array element;
Step 3: adjustment first state converter, light path is added by the first vertical polarization correlation displacement crystal;Adjustment second State converter, the second perpendicular level shake correlation displacement crystal be added light path;Third state converter is adjusted, it successively will be in spherical surface Fu Light path is added in leaf transformation lens, horizontal cylinder Fourier transform lens and vertical cylinder Fourier transform lens and blank state, The ccd image of a CCD camera is respectively acquired every time;The ccd image of four CCD cameras acquisition is calculated respectively, obtains the Three-photon polarizes density of states array element;
Step 4: adjustment first state converter, light path is added by first level polarization correlation displacement crystal;Adjustment second State converter, the second perpendicular level shake correlation displacement crystal be added light path;Third state converter is adjusted, it successively will be in spherical surface Fu Light path is added in leaf transformation lens, horizontal cylinder Fourier transform lens and vertical cylinder Fourier transform lens and blank state, The ccd image of a CCD camera is respectively acquired every time;The ccd image of four CCD cameras acquisition is calculated respectively, obtains the Four photons polarize density of states array element;
The first photon polarization density of states array element, the second photon polarization density of states array element, third photon polarize the density of states Array element, the 4th photon polarization density of states array element form photon polarization state density matrix.
The beneficial effects of the invention are as follows the measuring devices can be used as non-destructive probe to determine quantum in local positions State, for example, determining quantum state during quantum calculation or differentiation are evolved;Coherence can be measured by the device or is tangled Criterion directly observes state global nature, such as the presence of non-classical correlation;Quantum tomography usually requires to organize base in O (d) Arrow is lower to carry out O (d2) secondary measurement, to obtain theoretical density matrix;Therefore, as d increases, experimentation and algorithm for reconstructing become It becomes increasingly complex;And the measurement method only needs the measurement three times of two substrates, with the optional density matrix array element of determination System dimension d is not considered.Therefore, in the system with big d, which is replacement tomography and localization detection is potential The very attractive effective ways of mixed state.
Description of the drawings
Fig. 1 is that a kind of structure of the direct measuring device of photon polarization state density matrix described in specific implementation mode one is shown It is intended to;
Fig. 2 is the structural schematic diagram of measured signal preparation facilities in specific implementation mode one;
Fig. 3 is the relation schematic diagram that density matrix and theoretical value are actually measured in specific implementation mode one.
Specific implementation mode
Specific implementation mode one:Illustrate present embodiment in conjunction with Fig. 1 to Fig. 3, a kind of photon described in present embodiment is inclined The direct measuring device of polarization state density matrix, including wait for first state converter 2, diagonal polarization correlation displacement crystal 3, the second shape State converter 4, the first convex lens 7, the second convex lens 8, third state converter 9 and CCD camera 10;
Measured signal is incident to first state converter 2, incident via 2 transformed measured signal of first state converter To diagonal polarization correlation displacement crystal 3, the second shape is incident to by diagonally polarizing 3 transformed measured signal of correlation displacement crystal State converter 4 is incident to imaging system 11 by 4 transformed measured signal of the second state converter, and imaging system 11 exports Measured signal be incident to third state converter 9, by 9 transformed measured signal of third state converter by CCD camera 10 receive;
The first state converter 2 includes the first vertical polarization correlation displacement crystal 2-1 related to first level polarization Displacement crystal 2-2;
First vertical polarization correlation displacement crystal 2-1:For the spot center of incident measured signal to be produced in the x direction Raw one displacement polarized vertically with incident measured signal;
First level polarizes correlation displacement crystal 2-2:For the spot center of incident measured signal to be produced in the x direction Give birth to the displacement of one and incident measured signal horizontal polarization;
The directions x are horizontal direction;
Second state converter 4 includes that the second vertical polarization correlation displacement crystal 4-1 and the second horizontal polarization are related Displacement crystal 4-2;
Second vertical polarization correlation displacement crystal 4-1:It is vertical for that will be incident in the incident light of the second state converter 4 Polarized component worry removes;
Second horizontal polarization correlation displacement crystal 4-2:It is horizontal for that will be incident in the incident light of the second state converter 4 Polarized component worry removes;
The third state converter 9 includes spherical surface Fourier transform lens 9-3, horizontal cylinder Fourier transform lens 9- 2 and vertical cylinder Fourier transform lens 9-1;
Spherical surface Fourier transform lens 9-3:For making two-dimensional Fourier transform to imaging system imaging;
Horizontal cylinder Fourier transform lens 9-2:For making in one-dimensional Fu of horizontal direction to imaging system imaging Leaf transformation, vertical direction keep preimage;
Vertical cylinder Fourier transform lens 9-1:For making in one-dimensional Fu of vertical direction to imaging system imaging Leaf transformation, horizontal direction keep preimage;
Imaging system 11 includes the first convex lens 7 and the second convex lens 8;
After the emergent light by the second state converter 4 is incident to the first convex lens 7, penetrated by the second convex lens 8 Go out.
In the present embodiment, measured signal is prepared by measured signal preparation facilities 1, measured signal preparation facilities 1 includes laser A1, third convex lens A2, the 4th convex lens A3, polaroid A 4, half-wave plate A5 and quarter-wave plate A6;
The laser that the laser A1 is sent out is incident to the 4th convex lens A3 after third convex lens A2 transmission, by the It is incident to polaroid A 4 after four convex lens A3 transmissions, half-wave plate A5 is incident to after the polarization of polaroid A 4, by half-wave plate A5 It is incident to quarter-wave plate A6 after optical filtering, measured signal light is formed after quarter-wave plate A6 filters;
The focal length of the third convex lens A2 is 50mm, and the focal length of the 4th convex lens A3 is 100mm;Measured signal prepares dress Set the Gaussian that the light that 1 is sent out is 830 μm of half height;
The photon function of the polarization degree of freedom of measured signal is | ψ>=cos θ | H>-eiαπ/2sinθ|V>, measured signal it is close Spending matrix is:Wherein, i is imaginary unit, and α is to be measured The wave function of signal polarization degree of freedom | H>And | V>The phase difference parameter of component, θ are the wave function that measured signal polarizes degree of freedom | H>And | V>The intensive parameter of component;
Change when adjustment quarter-wave plate A6 fast axis directions parallel (α=- 1) parallel with vertical direction and continuously half-wave plate It can get the polarization state photon that along Fig. 3 (c) 2. Poincare sphere upper pathway changes when the angle of A5 fast axis directions and vertical direction, It is set as measured signal 2..When taking away quarter-wave plate A6 (α=0) from light path, and continuously change half-wave plate A5 fast axis directions With can get the polarization state photon that along Fig. 3 (c) 1. Poincare sphere upper pathway changes when the angle of vertical direction, be set as letter to be measured Number 1..The first vertical polarization correlation displacement crystal 2-1, first level polarization correlation displacement crystal 2-2, second are erected in implementation process Straight polarization correlation displacement crystal 4-1, the second horizontal polarization correlation displacement crystal 4-2 and diagonal polarization correlation displacement crystal 3 are all Bbo crystal;The focal length of first convex lens 7 is 1000mm, the focal length 1200mm of the second convex lens 8.Spherical surface Fourier transform lens The focal length of 9-3, horizontal cylinder Fourier transform lens 9-2 and vertical cylinder Fourier transform lens 9-1 are 1000mm, CCD Camera 10 set at 9 latter times of focal lengths of third state converter.
To measured signal shown in such as Fig. 3 (a) of measurement result 1., such as figure (b) of measurement result 2. is shown to measured signal, It coincide very well with theoretical curve it can be seen that measuring gained density matrix array element.Difference when θ is close to 90 ° may be by wave Piece defect causes, because may all introduce systematic error when preparing polarization state and calibration bbo crystal by wave plate defect;
The wave function of measured signal | Ψ>It is expressed as spatial degrees of freedom wave function | χ>And polarization degree of freedom wave function | ψ>'s Direct product,
I.e.:
Wherein,
|H>Horizontal polarization substrate is represented, | V>Represent vertical polarization substrate, a represent state to be measured polarize degree of freedom wave function to The probability amplitude of horizontal polarization substrate projection, b represent state to be measured and polarize the probability that degree of freedom wave function is projected to vertical polarization substrate Width;
Spatial degrees of freedom wave functionIt is Gaussian in Coordinate image
Wherein, ζ takes x and y, x to represent the axis of abscissas in dimensional Cartesian coordinates system, and y represents dimensional Cartesian coordinates system In axis of ordinates, σξThe standard deviation of Gaussian Profile on the directions ζ is represented, origin is the spot center of laser (A1).
It is for the wave function by the measured signal after the first vertical polarization correlation displacement crystal 2-1:
Wherein, for the spot center of incident measured signal to be generated one and incident measured signal water in the x direction Flat polarization is δx1, χxRepresent wave function of the measured signal spatial degrees of freedom wave function x-component under Coordinate image, χyRepresentative waits for Survey wave function of the signal space degree of freedom wave function y-component under Coordinate image;
It is for the wave function by the measured signal after first level polarization correlation displacement crystal 2-2:
Wherein, it is erected with incident measured signal for the spot center of incident measured signal to be generated one in the x direction Directly polarize is δx2
The spot center of incident light is generated one and diagonal polarization phase by diagonal polarization correlation displacement crystal 3 in y-direction The displacement δ of passy
When the first vertical polarization correlation displacement crystal 2-1 accesses light path, for by diagonally polarizing correlation displacement crystal 3 Measured signal wave function afterwards is:
When first level polarization correlation displacement crystal 2-2 accesses light path, for by diagonally polarizing correlation displacement crystal 3 Measured signal wave function afterwards is:
Wherein,
When the first vertical polarization correlation displacement crystal 2-1 accesses light path, for passing through the second vertical polarization correlation displacement Measured signal wave function after crystal 4-1 is:
When first level polarization correlation displacement crystal 2-2 accesses light path, for passing through the second vertical polarization correlation displacement Measured signal wave function after crystal 4-1 is:
When the first vertical polarization correlation displacement crystal 2-1 accesses light path, for passing through the second horizontal polarization correlation displacement Measured signal wave function after crystal 4-2 is:
When first level polarization correlation displacement crystal 2-2 accesses light path, for passing through the second horizontal polarization correlation displacement Measured signal wave function after crystal 4-2 is:
Specific implementation mode two:Present embodiment is to a kind of photon polarization state density matrix described in specific implementation mode one The direct measuring device of battle array further limits, and further includes the first reflective mirror 5 and the second reflective mirror 6 in the present embodiment;
First reflective mirror 5 and the second reflective mirror 6 are arranged at the light between the second state converter 4 and the first convex lens 7 On the road.
In the present embodiment, the second state converter 4 hair is assisted by increasing the first reflective mirror 5 and the second reflective mirror 6 The emergent light gone out injects the first convex lens 7.
Specific implementation mode three:Direct survey based on a kind of photon polarization state density matrix described in specific implementation mode one The measurement method of device is measured,
The measurement method includes the following steps:
Step 1: adjustment first state converter 2, light path is added by the first vertical polarization correlation displacement crystal 2-1;Adjustment Light path is added in second state converter 4, the second vertical polarization correlation displacement crystal 4-1;Third state converter 9 is adjusted, respectively By spherical surface Fourier transform lens 9-3, horizontal cylinder Fourier transform lens 9-2 and vertical cylinder Fourier transform lens 9-1 And light path is added in blank state, respectively acquires the ccd image of a CCD camera 10 every time;Four CCD cameras 10 are acquired respectively Ccd image is calculated, and show that the first photon polarizes density of states array element;
Step 2: adjustment first state converter 2, light path is added by first level polarization correlation displacement crystal 2-2;Adjustment Light path is added in second state converter 4, the second vertical polarization correlation displacement crystal 4-1;Third state converter 9 is adjusted, respectively By spherical surface Fourier transform lens 9-3, horizontal cylinder Fourier transform lens 9-2 and vertical cylinder Fourier transform lens 9-1 And light path is added in blank state, respectively acquires the ccd image of a CCD camera 10 every time;Four CCD cameras 10 are acquired respectively Ccd image is calculated, and show that the second photon polarizes density of states array element;
Step 3: adjustment first state converter 2, light path is added by the first vertical polarization correlation displacement crystal 2-1;Adjustment Light path is added in second state converter 4, shake correlation displacement crystal 4-2 of the second perpendicular level;Third state converter 9 is adjusted, respectively By spherical surface Fourier transform lens 9-3, horizontal cylinder Fourier transform lens 9-2 and vertical cylinder Fourier transform lens 9-1 And light path is added in blank state, respectively acquires the ccd image of a CCD camera 10 every time;Four CCD cameras 10 are acquired respectively Ccd image is calculated, and show that third photon polarizes density of states array element;
Step 4: adjustment first state converter 2, light path is added by first level polarization correlation displacement crystal 2-2;Adjustment Light path is added in second state converter 4, shake correlation displacement crystal 4-2 of the second perpendicular level;Third state converter 9 is adjusted, respectively By spherical surface Fourier transform lens 9-3, horizontal cylinder Fourier transform lens 9-2 and vertical cylinder Fourier transform lens 9-1 And light path is added in blank state, respectively acquires the ccd image of a CCD camera 10 every time;Four CCD cameras 10 are acquired respectively Ccd image is calculated, and show that the 4th photon polarizes density of states array element;
The first photon polarization density of states array element, the second photon polarization density of states array element, third photon polarize the density of states Array element, the 4th photon polarization density of states array element form photon polarization state density matrix.
It is to the circular that is calculated of ccd image of four CCD cameras 10 acquisition respectively in step 1:
Wherein, ρ (V, V) is that the first photon polarizes density of states array element;pxpyIt is added to work as spherical surface Fourier transform lens 9-3 The intensity barycenter for the image that CCD camera 10 acquires when light path;xpyLight path is added to work as horizontal cylinder Fourier transform lens 9-2 When CCD camera 10 acquire image intensity barycenter;pxY is the CCD when light path is added in vertical cylinder Fourier transform lens 9-1 The intensity barycenter for the image that camera 10 acquires;Xy is the figure that CCD camera 10 acquires when third state converter 9 is blank state The intensity barycenter of picture;
It is to the circular that is calculated of ccd image of four CCD cameras 10 acquisition respectively in step 2:
Wherein, ρ (H, V) is that the second photon polarizes density of states array element;
It is to the circular that is calculated of ccd image of four CCD cameras 10 acquisition respectively in step 3:
Wherein, ρ (V, H) is that third photon polarizes density of states array element;
It is to the circular that is calculated of ccd image of four CCD cameras 10 acquisition respectively in step 3:
Wherein, ρ (H, H) is that the 4th photon polarizes density of states array element.
The intensity barycenter p for the image that CCD camera 10 acquires when light path is added in spherical surface Fourier transform lens 9-3xpyTool Body computational methods are:
It is p for coordinate according to 10 the image collected of CCD camerax,pyPixel will a corresponding intensity value I1 (px,py), the intensity value addition of all pixels point can be obtained into overall strength I1, i.e.,:
Then,
The intensity barycenter xp for the image that CCD camera 10 acquires when light path is added in vertical cylinder Fourier transform lens 9-1y Circular be:
It is x, p for coordinate according to 10 the image collected of CCD camerayPixel will a corresponding intensity value I2 (x,py), the intensity value addition of all pixels point can be obtained into overall strength I2, i.e.,:
Then,
The intensity barycenter p for the image that CCD camera 10 acquires when light path is added in vertical cylinder Fourier transform lens 9-1xy Circular be:
It is p for coordinate according to 10 the image collected of CCD camerax, the pixel of y will a corresponding intensity value I3 (px, y), the intensity value addition of all pixels point can be obtained into overall strength I3, i.e.,:
Then,
The specific meter of the intensity barycenter xy for the image that CCD camera 10 acquires when third state converter 9 is blank state Calculation method is:
It is x for coordinate, the pixel of y will a corresponding intensity value I according to 10 the image collected of CCD camera4 The intensity value addition of all pixels point can be obtained overall strength I by (x, y)4, i.e.,:
Then,

Claims (9)

1. a kind of direct measuring device of photon polarization state density matrix, which is characterized in that including first state converter (2), Diagonal polarization correlation displacement crystal (3), the second state converter (4), imaging system (11), third state converter (9) and CCD Camera (10);
Measured signal is incident to first state converter (2), incident via the transformed measured signal of first state converter (2) To diagonal polarization correlation displacement crystal (3), the is incident to by diagonally polarizing correlation displacement crystal (3) transformed measured signal Two-state converter (4) is incident to imaging system (11) by the second state converter (4) transformed measured signal, imaging The measured signal of system (11) output is incident to third state converter (9), is waited for by third state converter (9) is transformed Signal is surveyed to be received by CCD camera (10);
The first state converter (2) includes that the first vertical polarization correlation displacement crystal (2-1) is related to first level polarization Displacement crystal (2-2);
First vertical polarization correlation displacement crystal (2-1):For the spot center of incident measured signal to be generated in the x direction One displacement polarized vertically with incident measured signal;
First level polarizes correlation displacement crystal (2-2):For the spot center of incident measured signal to be generated in the x direction One with the displacement of incident measured signal horizontal polarization;
The directions x are horizontal direction;
Second state converter (4) includes that the second vertical polarization correlation displacement crystal (4-1) is related to the second horizontal polarization Displacement crystal (4-2);
Second vertical polarization correlation displacement crystal (4-1):It is vertical for that will be incident in the incident light of the second state converter (4) Polarized component worry removes;
Second horizontal polarization correlation displacement crystal (4-2):It is horizontal for that will be incident in the incident light of the second state converter (4) Polarized component worry removes;
The third state converter (9) includes spherical surface Fourier transform lens (9-3), horizontal cylinder Fourier transform lens (9-2) and vertical cylinder Fourier transform lens (9-1);
Spherical surface Fourier transform lens (9-3):For making two-dimensional Fourier transform to imaging system imaging;
Horizontal cylinder Fourier transform lens (9-2):One-dimensional Fourier for making horizontal direction to imaging system imaging Transformation, vertical direction keep preimage;
Vertical cylinder Fourier transform lens (9-1):One-dimensional Fourier for making vertical direction to imaging system imaging Transformation, horizontal direction keep preimage.
2. a kind of direct measuring device of photon polarization state density matrix according to claim 1, which is characterized in that
The wave function of measured signal | Ψ>It is expressed as spatial degrees of freedom wave function | χ>And polarization degree of freedom wave function | ψ>Direct product,
I.e.:
Wherein, | H>Horizontal polarization substrate is represented, | V>Vertical polarization substrate is represented, a represents state polarization degree of freedom wave function to be measured The probability amplitude projected to horizontal polarization substrate, b represent state to be measured and polarize degree of freedom wave function to the general of vertical polarization substrate projection Rate width;
Spatial degrees of freedom wave functionIt is Gaussian in Coordinate image
Wherein, ζ takes x and y, x to represent the axis of abscissas in dimensional Cartesian coordinates system, and y is represented in dimensional Cartesian coordinates system Axis of ordinates, σξThe standard deviation of Gaussian Profile on the directions ζ is represented, origin is the spot center of laser (A1).
3. a kind of direct measuring device of photon polarization state density matrix according to claim 2, which is characterized in that
Wave function by the measured signal after the first vertical polarization correlation displacement crystal (2-1) is:
Wherein, for by the spot center of incident measured signal generate in the x direction one it is horizontal partially with incident measured signal The displacement shaken is that δ x1, χ x represent wave function of the measured signal spatial degrees of freedom wave function x-component under Coordinate image, χyIt represents Wave function of the measured signal spatial degrees of freedom wave function y-component under Coordinate image;
The wave function that the measured signal after correlation displacement crystal (2-2) is polarized by first level is:
Wherein, for by the spot center of incident measured signal generate in the x direction one it is inclined vertically with incidence measured signal It is δ to shakex2
4. a kind of direct measuring device of photon polarization state density matrix according to claim 3, which is characterized in that diagonal The spot center of incident light is generated one and diagonally polarizes relevant displacement δ by polarization correlation displacement crystal (3) in y-directiony
When the first vertical polarization correlation displacement crystal (2-1) accesses light path, after diagonally polarizing correlation displacement crystal (3) Measured signal wave function is:
Wherein,
When first level polarization correlation displacement crystal (2-2) accesses light path, after diagonally polarizing correlation displacement crystal (3) Measured signal wave function is:
5. a kind of direct measuring device of photon polarization state density matrix according to claim 4, which is characterized in that
When the first vertical polarization correlation displacement crystal (2-1) accesses light path, pass through the second vertical polarization correlation displacement crystal (4- 1) the measured signal wave function after is:
When first level polarization correlation displacement crystal (2-2) accesses light path, pass through the second vertical polarization correlation displacement crystal (4- 1) the measured signal wave function after is:
When the first vertical polarization correlation displacement crystal (2-1) accesses light path, pass through the second horizontal polarization correlation displacement crystal (4- 2) the measured signal wave function after is:
When first level polarization correlation displacement crystal (2-2) accesses light path, pass through the second horizontal polarization correlation displacement crystal (4- 2) the measured signal wave function after is:
6. a kind of direct measuring device of photon polarization state density matrix according to claim 1, which is characterized in that also wrap Include measured signal preparation facilities (1);Measured signal preparation facilities (1) includes laser (A1), third convex lens (A2), the 4th convex Lens (A3), polarizing film (A4), half-wave plate (A5) and quarter-wave plate (A6);
The laser that the laser (A1) sends out is incident to the 4th convex lens (A3) after third convex lens (A2) transmission, passes through It is incident to polarizing film (A4) after the transmission of 4th convex lens (A3), half-wave plate (A5) is incident to after polarizing film (A4) polarization, passes through It crosses after half-wave plate (A5) filters and is incident to quarter-wave plate (A6), letter to be measured is formed after quarter-wave plate (A6) optical filtering Number.
7. a kind of direct measuring device of photon polarization state density matrix according to claim 1, which is characterized in that imaging System (11) includes the first convex lens (7) and the second convex lens (8);
After being incident to the first convex lens (7) by the emergent light of the second state converter (4), projected by the second convex lens (8).
8. a kind of direct measuring device of photon polarization state density matrix according to claim 7, which is characterized in that also wrap Include the first reflective mirror (5) and the second reflective mirror (6);
First reflective mirror (5) and the second reflective mirror (6) are arranged between the second state converter (4) and the first convex lens (7) Light path on.
9. the measurement method of the direct measuring device based on a kind of photon polarization state density matrix described in claim 5, special Sign is that the measurement method includes the following steps:
Step 1: adjustment first state converter (2), light path is added by the first vertical polarization correlation displacement crystal (2-1);Adjustment Light path is added in second state converter (4), the second vertical polarization correlation displacement crystal (4-1);Adjust third state converter (9), respectively by spherical surface Fourier transform lens (9-3), horizontal cylinder Fourier transform lens (9-2) and vertical cylinder Fourier Light path is added in transform lens (9-1) and blank state, respectively acquires the ccd image of a CCD camera (10) every time;Respectively to four times The ccd image of CCD camera (10) acquisition is calculated, and show that the first photon polarizes density of states array element;
Step 2: adjustment first state converter (2), light path is added by first level polarization correlation displacement crystal (2-2);Adjustment Light path is added in second state converter (4), the second vertical polarization correlation displacement crystal (4-1);Adjust third state converter (9), respectively by spherical surface Fourier transform lens (9-3), horizontal cylinder Fourier transform lens (9-2) and vertical cylinder Fourier Light path is added in transform lens (9-1) and blank state, respectively acquires the ccd image of a CCD camera (10) every time;Respectively to four times The ccd image of CCD camera (10) acquisition is calculated, and show that the second photon polarizes density of states array element;
Step 3: adjustment first state converter (2), light path is added by the first vertical polarization correlation displacement crystal (2-1);Adjustment Second state converter (4), the second perpendicular level shake correlation displacement crystal (4-2) be added light path;Adjust third state converter (9), respectively by spherical surface Fourier transform lens (9-3), horizontal cylinder Fourier transform lens (9-2) and vertical cylinder Fourier Light path is added in transform lens (9-1) and blank state, respectively acquires the ccd image of a CCD camera (10) every time;Respectively to four times The ccd image of CCD camera (10) acquisition is calculated, and show that third photon polarizes density of states array element;
Step 4: adjustment first state converter (2), light path is added by first level polarization correlation displacement crystal (2-2);Adjustment Second state converter (4), the second perpendicular level shake correlation displacement crystal (4-2) be added light path;Adjust third state converter (9), respectively by spherical surface Fourier transform lens (9-3), horizontal cylinder Fourier transform lens (9-2) and vertical cylinder Fourier Light path is added in transform lens (9-1) and blank state, respectively acquires the ccd image of a CCD camera (10) every time;Respectively to four times The ccd image of CCD camera (10) acquisition is calculated, and show that the 4th photon polarizes density of states array element;
First photon polarizes density of states array element, the second photon polarizes density of states array element, third photon polarizes density of states array element, 4th photon polarizes density of states array element and forms photon polarization state density matrix.
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