CN106997743A - A kind of test device of Thin Film Transistor-LCD - Google Patents
A kind of test device of Thin Film Transistor-LCD Download PDFInfo
- Publication number
- CN106997743A CN106997743A CN201710407289.2A CN201710407289A CN106997743A CN 106997743 A CN106997743 A CN 106997743A CN 201710407289 A CN201710407289 A CN 201710407289A CN 106997743 A CN106997743 A CN 106997743A
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- CN
- China
- Prior art keywords
- dac
- main control
- chip
- lcd
- control chip
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Abstract
The present invention relates to a kind of test device of Thin Film Transistor-LCD, including main control chip, the DAC chip of 2 12, power circuit, high-tension circuit and 2 op amps circuits, described power circuit is respectively communicated with main control chip and high-tension circuit, the high pressure required for operational amplifier is produced by high-tension circuit, the power supply needed for main control chip is produced by power circuit, exporting chip selection signal by main control chip and enable needs the DAC chip of work, and the output voltage for the SPI interface configuration DAC for passing through main control chip, DAC output voltage is amplified 10 times 20 times by operational amplifier, export and give TFT LCD, realize that LCD's is red, it is green, blue picture is shown.The present invention disclosure satisfy that the output requirement of different size voltage, each road voltage can be changed with positive and negative amplitude, and each road voltage signal can not be interfered with each other, and complete machine current loading minimum requires 2A, test device leaves external program download interface, it is possible to achieve in-system programmable components function.
Description
Technical field
The present invention relates to a kind of test device of Thin Film Transistor-LCD, more particularly to it is a kind of based on single-chip microcomputer and
The test device of the Thin Film Transistor-LCD of converter.
Background technology
Thin Film Transistor-LCD（TFT-LCD）Test, it is necessary to use low and high level conversion AC signal, frequency
Rate needs to reach more than 60Hz, and ceiling voltage needs to reach ± 30V or so.The Thin Film Transistor-LCD commonly used at present
（TFT-LCD）Test device can only export maximum 5V output voltage, and can not meet the requirement of particular job frequency, therefore weight
Newly design and develop out new Thin Film Transistor-LCD（TFT-LCD）Test device come meet it is existing the need for.
The content of the invention
It is an object of the invention to：For the defect of prior art, it is proposed that a kind of Thin Film Transistor-LCD
Test device, can effectively meet it is existing the need for.
The technical solution adopted in the present invention is：A kind of test device of Thin Film Transistor-LCD, including master control
Chip, the DAC chip of 2 12, power circuit, high-tension circuit and 2 op amps circuits, described power circuit difference
Main control chip and high-tension circuit are connected, high-tension circuit is connected with 2 operational amplifiers respectively, producing computing by high-tension circuit puts
High pressure required for big device, the power supply needed for main control chip is produced by power circuit, chip selection signal is exported by main control chip
Enable needs the DAC chip of work, and the output voltage for the SPI interface configuration DAC for passing through main control chip, passes through main control chip
Timer interruption function, configures the frequency and dutycycle of DAC output voltage, is entered DAC output voltage by operational amplifier
10 times -20 times of row amplification, exports to TFT-LCD, realizes that LCD red, green, blue picture is shown.
In the present invention：Described main control chip uses P89V51RD2, concussion frequency for 22.1184MHz chip, makes
It is controlled with SPI interface.
In the present invention：Described power circuit uses RT8272, and input voltage range is 4.75V-24V, is passed through
Feedback ends electric resistance partial pressure, produces+5V burning voltage；Maximum output current can reach 3A, meet minimum 2A
The output loading of electric current.
In the present invention：Described high-tension circuit is by LT1615 and LT1617 generation+- 33V and -5V voltage, for LCD
Driving is used.
In the present invention：Described DAC chip includes DAC1 and DAC2, DAC1 control DATA voltages, DAC2 controls Gate
And COM voltages；Wherein DAC VREFL and VREFH maximum input voltages are+2.5V and -2.5V；Therefore REF3112 is first passed through, produce
Raw+1.25V voltage, then by NJM4562, the voltage that a maximum is+2.5V and minimum -2.5V is produced, for DAC
VREFH and VREFL use.
After adopting the above technical scheme, beneficial effects of the present invention are：Present system is simple, reasonable in design, Neng Gouman
The output requirement of sufficient different size voltage, each road voltage can be changed with positive and negative amplitude, and each road voltage signal can not be interfered with each other,
Complete machine current loading minimum requires 2A, and test device leaves external program download interface, it is possible to achieve in-system programmable components function.
Brief description of the drawings
Fig. 1 is systematic schematic diagram of the invention；
Fig. 2 is main control chip perimeter circuit figure in the present invention；
Fig. 3 is the power circuit diagram in the present invention；
Fig. 4 is the high-tension circuit figure in the present invention；
Fig. 5 is the another high-tension circuit figure in the present invention；
Fig. 6 is the DAC chip line map in the present invention；
Fig. 7 is the another DAC chip line map in the present invention；
Fig. 8 is op amps circuit figure in the present invention.
Embodiment
Below in conjunction with accompanying drawing, the present invention is further illustrated.
As shown in Figure 1, a kind of test device of Thin Film Transistor-LCD, including main control chip, 2 12
DAC chip, power circuit, high-tension circuit and 2 op amps circuits, described power circuit be respectively communicated with main control chip and
High-tension circuit, high-tension circuit is connected with 2 operational amplifiers respectively, and the height required for operational amplifier is produced by high-tension circuit
Pressure, the power supply needed for main control chip is produced by power circuit, and exporting chip selection signal by main control chip and enable needs work
DAC chip, and the output voltage for the SPI interface configuration DAC for passing through main control chip, pass through the timer interruption work(of main control chip
Can, the frequency and dutycycle of DAC output voltage are configured, DAC output voltage is amplified 10 times -20 by operational amplifier
Times, export to TFT-LCD, realize that LCD red, green, blue picture is shown.
As shown in Fig. 2 described main control chip uses P89V51RD2, concussion frequency for 22.1184MHz chip, use
SPI interface is controlled.
As shown in figure 3, described power circuit uses RT8272, input voltage range is 4.75V-24V, is passed through
Feedback ends electric resistance partial pressure, produces+5V burning voltage；Maximum output current can reach 3A, meet minimum 2A
The output loading of electric current.
As illustrated in figures 4-5, described high-tension circuit is supplied by LT1615 and LT1617 generation+- 33V and -5V voltage
LCD drivings are used.
As shown in fig. 6, DAC VREFL and VREFH maximum input voltages are+2.5V and -2.5V；Therefore first pass through
REF3112, generation+1.25V voltage, then by NJM4562, it is+2.5V and minimum -2.5V to produce a maximum
Voltage, is used for DAC VREFH and VREFL.- VREF=- VR1/R7*1.25+VREF=VR2/R8*1.25, is adjusted by resistance
It is whole, make+VREFL=+ 2.048V ,-VREFL=- 2.048V.12-BIT DAC has 4096 ranks, and such DAC is per single order voltage
Variable quantity is 0.001V, i.e. 1mV.
As shown in fig. 7, described DAC chip include DAC1 and DAC2, DAC1 control DATA voltages, DAC2 control Gate and
COM voltages；Because R_SEL is set to high level, therefore after DAC 12bit register electrification resets, initial value is 800H.By ground
Location selector A1A0 selects DAC four passages, therefore DAC register 16 data are：0800H-selection VA passages,
4800H-selection VB passages,
8800H-selection VC passages, C800H-selection VD passages.
As shown in figure 8, because+VREFL and-VREFL are set in+2.048V and -2.048V respectively, therefore DAC output is most
Value and minimum value are+2.048V and -2.048V greatly, therefore drive LCD to need to be amplified DAC output voltage.With VGG electricity
Exemplified by pressure, VG=(VR15//R51)/R22*GATE.Wherein VGG is by OP by 20 times of voltage amplification, and remaining voltage is amplified by OP
10 times.
When it is implemented, DAC VREFH and VREFL are transferred to+2.048V and -2.048V, the peak-to-peak value of DAC outputs respectively
It is 2 altogether for 12bit DAC for 4.096V12=4096 ranks, therefore 1 rank voltage is adjusted to 1mV.When DAC R_SEL is set to
During high level, after DAC electrification resets, register values are 800H, and output voltage is VREFH and VREFL central value, i.e. 0V.
Therefore to export certain voltage, as long as the corresponding magnitude of voltage of correspondence plus-minus on 800H（mV）.VCOM is such as allowed to export 4V,
Just can DAC2 VA passages, wherein writing commands are as follows：
MOV DPTR,#0800H+0400 ;VCOM DAC2A
CALL SPI_WR2
Wherein numbers illustrated is as follows：
MOV DPTR,#0800H + 0400
VA passage DAC initial values
Increase by 400 ranks, i.e. 400mV on the basis of DAC initial values
Increased 400mV voltages, then by operational amplifier by 10 times of voltage amplification, OP can export 4V voltage.
Survey machine crystal oscillator uses 22.1184MHz, and each machine cycle is 45.2ns.Mod is put 1 in a program, therefore each referred to
The run time of order is 6 machine cycles, and 45.2*6=271.2ns.
Therefore timer timing can be calculated according to following：
MOV TH0,#(65536-1000000/273)/256
MOV TL0,#(65536-1000000/273).MOD.256
This is timing 1000000ns, i.e. 1ms.TH0 most-significant byte is obtained by being rounded to 256,256 remainders are obtained with the low by 8 of TH0
Position.
Similarly, if wanting timing 1.6ms, program is calculated as follows：
MOV TH0,#(65536-1600000/273)/256
MOV TL0,#(65536-1600000/273).MOD.256
Program controls the cycle of each voltage by timer interruption, and coordinates flag FLAG.0 to judge interrupt routine knot
Beam.
The embodiment to the present invention is described above, but the present invention is not limited to above description.For this
For the technical staff in field, any equal modifications and substitutions to the technical program are all within the scope of the invention.Cause
This, the impartial conversion and modification made without departing from the spirit and scope of the invention all should be contained within the scope of the invention.
Claims (5)
1. a kind of test device of Thin Film Transistor-LCD, it is characterised in that：DAC including main control chip, 2 12
Chip, power circuit, high-tension circuit and 2 op amps circuits, described power circuit are respectively communicated with main control chip and height
Volt circuit, high-tension circuit is connected with 2 operational amplifiers respectively, and the height required for operational amplifier is produced by high-tension circuit
Pressure, the power supply needed for main control chip is produced by power circuit, and exporting chip selection signal by main control chip and enable needs work
DAC chip, and the output voltage for the SPI interface configuration DAC for passing through main control chip, pass through the timer interruption work(of main control chip
Can, the frequency and dutycycle of DAC output voltage are configured, DAC output voltage is amplified 10 times -20 by operational amplifier
Times, export to TFT-LCD, realize that LCD red, green, blue picture is shown.
2. a kind of test device of Thin Film Transistor-LCD according to claim 1, it is characterised in that：Described
Main control chip uses P89V51RD2, concussion frequency for 22.1184MHz chip, is controlled using SPI interface.
3. a kind of test device of Thin Film Transistor-LCD according to claim 1, it is characterised in that：Described
Power circuit uses RT8272, and input voltage range is 4.75V-24V, by Feedback ends electric resistance partial pressure, produces+a 5V
Burning voltage；Maximum output current can reach 3A, meet the output loading of minimum 2A electric currents.
4. a kind of test device of Thin Film Transistor-LCD according to claim 1, it is characterised in that：Described
High-tension circuit is used by LT1615 and LT1617 generation+- 33V and -5V voltage for LCD drivings.
5. a kind of test device of Thin Film Transistor-LCD according to claim 1, it is characterised in that：Described
DAC chip includes DAC1 and DAC2, DAC1 control DATA voltages, DAC2 control Gate and COM voltages；Wherein DAC VREFL and
VREFH maximum input voltages are+2.5V and -2.5V；Therefore REF3112 is first passed through, generation+1.25V voltage, then pass through
NJM4562, produces the voltage that a maximum is+2.5V and minimum -2.5V, is used for DAC VREFH and VREFL.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710407289.2A CN106997743A (en) | 2017-06-02 | 2017-06-02 | A kind of test device of Thin Film Transistor-LCD |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710407289.2A CN106997743A (en) | 2017-06-02 | 2017-06-02 | A kind of test device of Thin Film Transistor-LCD |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106997743A true CN106997743A (en) | 2017-08-01 |
Family
ID=59436346
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710407289.2A Pending CN106997743A (en) | 2017-06-02 | 2017-06-02 | A kind of test device of Thin Film Transistor-LCD |
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| CN102063877A (en) * | 2009-11-12 | 2011-05-18 | 群康科技(深圳)有限公司 | LCD (Liquid Crystal Display) and detecting method thereof |
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| CN102983744A (en) * | 2012-12-25 | 2013-03-20 | 深圳市华星光电技术有限公司 | DC/DC module for LCD driving circuit |
| CN203232677U (en) * | 2013-04-17 | 2013-10-09 | 深圳市宏大创展科技有限公司 | Liquid crystal display test circuit |
| CN204044458U (en) * | 2014-09-16 | 2014-12-24 | 冀雅(廊坊)电子有限公司 | A kind of LCDs having transformer |
| CN104267249A (en) * | 2014-10-09 | 2015-01-07 | 长智光电（四川）有限公司 | Device for measuring voltage difference between LED string lights |
| CN204832878U (en) * | 2015-08-10 | 2015-12-02 | 湖南城市学院 | Switching mode digital display constant voltage power supply |
| CN106019647A (en) * | 2016-05-05 | 2016-10-12 | 武汉精测电子技术股份有限公司 | Liquid crystal module 1-wire write-in and write-in function test system and method |
-
2017
- 2017-06-02 CN CN201710407289.2A patent/CN106997743A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101046560A (en) * | 2006-03-30 | 2007-10-03 | 比亚迪股份有限公司 | OTP burning control method and system |
| CN102063877A (en) * | 2009-11-12 | 2011-05-18 | 群康科技(深圳)有限公司 | LCD (Liquid Crystal Display) and detecting method thereof |
| CN201804530U (en) * | 2010-09-10 | 2011-04-20 | 京东方科技集团股份有限公司 | Liquid crystal display panel detecting device |
| CN202487114U (en) * | 2012-03-08 | 2012-10-10 | 无锡博一光电科技有限公司 | Liquid crystal display testing jig of RGB (Red, Green, Blue) interface |
| CN102983744A (en) * | 2012-12-25 | 2013-03-20 | 深圳市华星光电技术有限公司 | DC/DC module for LCD driving circuit |
| CN203232677U (en) * | 2013-04-17 | 2013-10-09 | 深圳市宏大创展科技有限公司 | Liquid crystal display test circuit |
| CN204044458U (en) * | 2014-09-16 | 2014-12-24 | 冀雅(廊坊)电子有限公司 | A kind of LCDs having transformer |
| CN104267249A (en) * | 2014-10-09 | 2015-01-07 | 长智光电（四川）有限公司 | Device for measuring voltage difference between LED string lights |
| CN204832878U (en) * | 2015-08-10 | 2015-12-02 | 湖南城市学院 | Switching mode digital display constant voltage power supply |
| CN106019647A (en) * | 2016-05-05 | 2016-10-12 | 武汉精测电子技术股份有限公司 | Liquid crystal module 1-wire write-in and write-in function test system and method |
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Application publication date: 20170801 |
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