CN106996995A - A kind of flexible stylet - Google Patents
A kind of flexible stylet Download PDFInfo
- Publication number
- CN106996995A CN106996995A CN201610045067.6A CN201610045067A CN106996995A CN 106996995 A CN106996995 A CN 106996995A CN 201610045067 A CN201610045067 A CN 201610045067A CN 106996995 A CN106996995 A CN 106996995A
- Authority
- CN
- China
- Prior art keywords
- microprobe
- probe
- flexible
- soft contact
- support arm
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims abstract description 25
- 241000208125 Nicotiana Species 0.000 claims abstract description 15
- 235000002637 Nicotiana tabacum Nutrition 0.000 claims abstract description 15
- 239000007769 metal material Substances 0.000 claims description 20
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 10
- 239000010949 copper Substances 0.000 claims description 10
- 229910052802 copper Inorganic materials 0.000 claims description 10
- 229910052782 aluminium Inorganic materials 0.000 claims description 9
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 9
- 239000004332 silver Substances 0.000 claims description 7
- 229910052709 silver Inorganic materials 0.000 claims description 7
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 6
- 239000004411 aluminium Substances 0.000 claims description 6
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 6
- 239000010931 gold Substances 0.000 claims description 6
- 229910052737 gold Inorganic materials 0.000 claims description 6
- 238000000034 method Methods 0.000 abstract description 12
- 229910052751 metal Inorganic materials 0.000 abstract description 4
- 239000002184 metal Substances 0.000 abstract description 4
- 238000012360 testing method Methods 0.000 abstract description 4
- 230000001771 impaired effect Effects 0.000 abstract description 2
- 238000001514 detection method Methods 0.000 description 13
- 239000000463 material Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 230000005684 electric field Effects 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 235000014347 soups Nutrition 0.000 description 2
- 230000002776 aggregation Effects 0.000 description 1
- 238000004220 aggregation Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
A kind of flexible stylet that the present invention is provided, probe includes support arm, soft contact microprobe and flexible connection point, and flexibility can be fixedly connected or detachably, soft contact microprobe is two dimension or three-dimensional structure；Soft contact microprobe is tobacco pipe shape or soupspoon shape and its spatial volume is 1 μm3~0.1m3.The probe that the present invention is provided, which is carried, to be fixed, dismountable flexible contact point, be conveniently replaceable impaired probe；Using the tobacco pipe shape or soupspoon shape structure of two dimension or three-dimensional structure, the probe of one-dimensional point contact structures of the prior art is replaced, is avoided that and chip surface metal level and damage electrical part is damaged in chip testing process；The probe is big with chip electrode contact surface, CURRENT DISTRIBUTION can be made in high-current device test process evenly, it is to avoid device is burnt in the one-dimensional powered sparking of point-like probe tip, significantly improves the security of electrical part chip-scale test process.
Description
Technical field
The present invention relates to a kind of probe, specifically, it is related to a kind of flexible stylet.
Background technology
It is required to carry out chip-scale detection before electric device package, its detection method is to utilize probe in super-clean environment
Performance detection is carried out to chip, detection content includes the detection of forward and reverse the quasi-static characteristics and dynamic characteristic detection etc..
Existing detection probe is one-dimensional dots structure, and the probe is in contact chip surface metal-layer to be non-flexible
Easily cause chip surface metal level to damage in contact, detection process, damage metal electrode, cause chip to exist
It is damaged in detection process, brings serious economic loss.In addition, the point-contact junction structure that prior art is used is visited
Pin, contact point is smaller, is easily caused forward current skewness in detection process or the problems such as reversed electric field is assembled,
Influence testing result even damages chip, causes the damage of electrical part.
Accordingly, it is desirable to provide a kind of improved technology scheme not enough for above-mentioned prior art.
The content of the invention
The purpose of the present invention is the damage for overcoming easily damaged chip in above-mentioned existing probe techniques to cause electrical part
Ruin, the problem of also resulting in terms of forward current skewness and reversed electric field aggregation proposes a kind of two dimension
Or three-dimensional structure flexible stylet, damage chip and electrical part, and security are avoided that during the probe use
Can be high
To achieve the above object, the present invention uses following technical scheme：
A kind of flexible stylet, the probe includes support arm, soft contact microprobe and connection support arm and flexibility connects
The flexible connection point of feeler inspection pin, the flexible connection includes fixing or detachable, and the soft contact microprobe is two
Dimension or three-dimensional structure.
Further, the soft contact microprobe be tobacco pipe shape or soupspoon shape, the tobacco pipe shape or soupspoon shape it is soft
Property probe spatial volume be 1 μm3~0.1m3。
Further, the support arm is metal material, and the metal material is copper, aluminium, silver, gold.
Further, the support arm is rectangular parallelepiped structure, wherein, the value of length is 1 μm~100cm.
Further, the support arm is cylindrical structure, wherein, the length of the cylinder and taking for radius
It is worth for 1 μm~100cm.
Further, the flexible connection includes screw thread, neck or spring.
Further, the soft contact microprobe is prepared by cylinder or cuboid processing；The flexible contact
Probe is metal material, and the metal material is copper, aluminium, silver, gold.
Compared with immediate prior art, the technical scheme that the present invention is provided has following excellent effect：
1st, the probe that the present invention is provided, which is carried, to fix, dismountable flexible contact point, be conveniently replaceable impaired
Probe.
2nd, the probe that the present invention is provided replaces existing using the tobacco pipe shape or soupspoon shape structure of two dimension or three-dimensional structure
There is the probe of the one-dimensional point contact structures in technology, be avoided that the damage chip surface metal in chip detection process
Layer and damage electrical part.
3rd, the probe and chip electrode contact surface that the present invention is provided are big, can make in high-current device detection process
CURRENT DISTRIBUTION is evenly, it is to avoid device is burnt in the one-dimensional powered sparking of point-like probe tip, significantly improves electrical part
The security of chip-scale detection process.
Brief description of the drawings
, below will be attached to what is used required in embodiment in order to illustrate more clearly of the technical scheme in the present invention
Figure is briefly described, it should be apparent that, drawings in the following description are only some embodiments of the present invention,
For those of ordinary skill in the art, on the premise of not paying creative work, can also be according to these
Accompanying drawing obtains other accompanying drawings.
One-dimensional point-like probe structure schematic diagram used in Fig. 1 prior arts；
Fig. 2 tobacco pipe shape flexible stylet three dimensional structure diagrams of the present invention；
Fig. 3 soupspoon shape flexible stylet two-dimensional structure schematic diagrames of the present invention.
In figure：11st, support arm；12nd, it is flexibly connected point；13rd, soft contact microprobe.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out it is clear,
It is fully described by, it is clear that described embodiment is only a part of embodiment of the present invention, rather than all
Embodiment.Based on the embodiment in the present invention, the every other implementation that those of ordinary skill in the art are obtained
Example, belongs to the scope of protection of the invention.
As shown in Figures 2 and 3, a kind of flexible stylet for providing of the present invention, probe includes support arm 11, soft
Property contact probe 13 and connection support arm 11 and soft contact microprobe 13 flexible connection point 12, flexible connection
It can be fixedly connected or detachably, soft contact microprobe 13 is two dimension or three-dimensional structure；Soft contact microprobe 13
For tobacco pipe shape or soupspoon shape, the flexible stylet spatial volume of tobacco pipe shape or soupspoon shape is 1 μm3~0.1m3。
Support arm 11 is metal material, and the metal material is copper, aluminium, silver, gold.The support arm 11
For rectangular parallelepiped structure or cylindrical structure, wherein, when being rectangular parallelepiped structure, the value of length is 1 μ
M~100cm；During for cylindrical structure, the length of cylinder and the value of radius are 1 μm~100cm.It is flexible
The mode that is fixedly connected of tie point 12 is screw thread, neck or spring.Soft contact microprobe 13 be by cylinder or
Cuboid processing prepare, soft contact microprobe 13 be metal material, the metal material be copper, aluminium, silver,
Gold.
In addition, in a specific embodiment, a kind of flexible stylet, including support arm 11, flexible connection point
12nd, soft contact microprobe 13, flexible connection can be fixedly connected, detachably, and soft contact microprobe 13 is tobacco pipe
Shape, is three-dimensional structure.The support arm 11 is made up of metallic material of aluminum；Support arm 11 is rectangular parallelepiped structure,
The value of length is 4cm, 100mm and 300um.The fixed form of flexible connection point 12 is solid for screw thread
It is fixed.The material of tobacco pipe shape soft contact microprobe 13 be metal material of copper, be by length be 2cm, radius is 60
μm cylinder process, therefore its spatial volume be 5.35 × 10-5cm3。
It is preferred that, a kind of flexible stylet, including support arm 11, flexible connection point 12, soft contact microprobe 13,
Flexible connection can be fixedly connected, detachably, and soft contact microprobe 13 is tobacco pipe shape, is three-dimensional structure.It is described
Support arm 11 is made up of metal material silver；Support arm 11 is cylindrical structure, and the length of cylinder is 15cm,
Radius is 500 μm.The fixed form of flexible connection point 12 is fixed for neck.Tobacco pipe shape soft contact microprobe
13 material is metallic material of aluminum, is rectangular for 3cm, 200mm and 260um by the value of length
Body is processed, therefore its spatial volume is 8.15 × 10-5cm3。
It is preferred that, in a specific embodiment, a kind of flexible stylet, including support arm 11, flexible connection
Point 12, soft contact microprobe 13, flexible connection can be fixedly connected, detachably, and soft contact microprobe 13 is soup
Spoon-shaped, is two-dimensional structure.The support arm 11 is made up of metal material of copper；Support arm 11 is cylindrical structure,
The length of cylinder is 6cm, and radius is 200 μm.The fixed form of flexible connection point 12 is fixed for neck.
The material of soupspoon shape soft contact microprobe 13 be metal material of copper, be by length be 1cm, radius be 50 μm
Cylinder process, therefore its spatial volume be 7.85 × 10-5cm3。
It is preferred that, in a specific embodiment, a kind of flexible stylet, including support arm 11, flexible connection
Point 12, soft contact microprobe 13, flexible connection can be fixedly connected, detachably, and soft contact microprobe 13 is soup
Spoon-shaped, is two-dimensional structure.The support arm 11 is made up of metal material of copper；Support arm 11 is rectangular parallelepiped structure,
The value of length is 6cm, 69mm and 260um.The fixed form of flexible connection point 12 is solid for spring
It is fixed.The material of the tobacco pipe shape soft contact microprobe 13 be metallic material of aluminum, be by length be 1cm, radius
Cylinder for 80 μm is processed, therefore its spatial volume is about 4.65 × 10-5cm3。
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in the present invention
Spirit and principle within, any modification, equivalent substitution and improvements made etc., in pending right of the invention
Within the scope of claimed.
Claims (10)
1. a kind of flexible stylet, it is characterised in that the probe includes support arm, soft contact microprobe and connects the support arm
Flexible connection point with soft contact microprobe, the flexible connection includes fixing or detachable, and the soft contact microprobe is two dimension
Or three-dimensional structure.
2. a kind of flexible stylet as claimed in claim 1, it is characterised in that the soft contact microprobe is tobacco pipe shape or soupspoon
Shape.
3. a kind of flexible stylet as claimed in claim 2, it is characterised in that the flexible stylet of the tobacco pipe shape or soupspoon shape is empty
Between volume be 1 μm3~0.1m3。
4. a kind of flexible stylet as claimed in claim 1, it is characterised in that the support arm is metal material.
5. a kind of flexible stylet as claimed in claim 4, it is characterised in that the metal material is copper, aluminium, silver, gold.
6. a kind of flexible stylet as claimed in claim 4, it is characterised in that the support arm is that the value of length is 1
μm~100cm cuboid.
7. a kind of flexible stylet as claimed in claim 4, it is characterised in that the support arm is length and the value 1 of radius
μm~100cm cylinder.
8. a kind of flexible stylet as claimed in claim 1, it is characterised in that the flexible connection includes screw thread, neck or bullet
Spring.
9. a kind of flexible stylet as claimed in claim 1, it is characterised in that the soft contact microprobe is by cylinder or length
It is prepared by cube processing.
10. a kind of flexible stylet as claimed in claim 1, it is characterised in that the soft contact microprobe is metal material；
The metal material is copper, aluminium, silver, gold.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610045067.6A CN106996995A (en) | 2016-01-22 | 2016-01-22 | A kind of flexible stylet |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610045067.6A CN106996995A (en) | 2016-01-22 | 2016-01-22 | A kind of flexible stylet |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106996995A true CN106996995A (en) | 2017-08-01 |
Family
ID=59428192
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610045067.6A Pending CN106996995A (en) | 2016-01-22 | 2016-01-22 | A kind of flexible stylet |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106996995A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109856526A (en) * | 2018-12-06 | 2019-06-07 | 北京长城华冠汽车科技股份有限公司 | Circuit board continuity test tooling |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1421675A (en) * | 2001-11-30 | 2003-06-04 | 布朗和沙普·特萨有限公司 | Trigger probe and method for assembling the same trigger probe |
| CN2757136Y (en) * | 2004-12-28 | 2006-02-08 | 中国铝业股份有限公司 | Probe contact head for carbon product resistivity detection |
| CN101793914A (en) * | 2009-01-23 | 2010-08-04 | 微探测株式会社 | Contact type probe using flexible wire |
| TW201115152A (en) * | 2009-10-20 | 2011-05-01 | Nat Univ Tsing Hua | Soft three-dimensional micro probe structure |
| CN202903311U (en) * | 2012-10-12 | 2013-04-24 | 东莞清溪光荣塑胶五金厂 | Multifunctional ladle temperature measurement electronic scale |
| CN203270215U (en) * | 2013-05-19 | 2013-11-06 | 新昌县洪伟机械有限公司 | Flexible contact self-recovery type fault sensing device |
| CN205539079U (en) * | 2016-01-22 | 2016-08-31 | 国网智能电网研究院 | Flexible probe |
-
2016
- 2016-01-22 CN CN201610045067.6A patent/CN106996995A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1421675A (en) * | 2001-11-30 | 2003-06-04 | 布朗和沙普·特萨有限公司 | Trigger probe and method for assembling the same trigger probe |
| CN2757136Y (en) * | 2004-12-28 | 2006-02-08 | 中国铝业股份有限公司 | Probe contact head for carbon product resistivity detection |
| CN101793914A (en) * | 2009-01-23 | 2010-08-04 | 微探测株式会社 | Contact type probe using flexible wire |
| TW201115152A (en) * | 2009-10-20 | 2011-05-01 | Nat Univ Tsing Hua | Soft three-dimensional micro probe structure |
| CN202903311U (en) * | 2012-10-12 | 2013-04-24 | 东莞清溪光荣塑胶五金厂 | Multifunctional ladle temperature measurement electronic scale |
| CN203270215U (en) * | 2013-05-19 | 2013-11-06 | 新昌县洪伟机械有限公司 | Flexible contact self-recovery type fault sensing device |
| CN205539079U (en) * | 2016-01-22 | 2016-08-31 | 国网智能电网研究院 | Flexible probe |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109856526A (en) * | 2018-12-06 | 2019-06-07 | 北京长城华冠汽车科技股份有限公司 | Circuit board continuity test tooling |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information |
Address after: 102209 18 Riverside Avenue, Changping District science and Technology City, Beijing Applicant after: GLOBAL ENERGY INTERCONNECTION RESEARCH INSTITUTE Co.,Ltd. Applicant after: STATE GRID CORPORATION OF CHINA Address before: 102209 18 Riverside Avenue, Changping District science and Technology City, Beijing Applicant before: GLOBAL ENERGY INTERCONNECTION RESEARCH INSTITUTE Applicant before: State Grid Corporation of China Address after: 102209 18 Riverside Avenue, Changping District science and Technology City, Beijing Applicant after: GLOBAL ENERGY INTERCONNECTION Research Institute Applicant after: STATE GRID CORPORATION OF CHINA Address before: 102211 Beijing Changping District small Tang Shan town big east stream Village Road 270 (future science and technology city) Applicant before: STATE GRID SMART GRID Research Institute Applicant before: State Grid Corporation of China |
|
| CB02 | Change of applicant information |