CN106970281A - A kind of high-low temperature tester - Google Patents
A kind of high-low temperature tester Download PDFInfo
- Publication number
- CN106970281A CN106970281A CN201710211497.5A CN201710211497A CN106970281A CN 106970281 A CN106970281 A CN 106970281A CN 201710211497 A CN201710211497 A CN 201710211497A CN 106970281 A CN106970281 A CN 106970281A
- Authority
- CN
- China
- Prior art keywords
- low temperature
- casing
- case lid
- antenna
- electronic product
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
Abstract
The invention provides a kind of high-low temperature tester, including wooden case, the wooden case is made up of case lid and casing, and case lid and casing are connected by Limiting hinge；The body side is provided with handle；The body side is provided with the mounting disc for installing the electronic product with antenna；The wooden case inwall posts absorbing material of the energy shield test reactor environment to the interference of the electronic product with antenna；It is provided with the case lid top surface on suspension ring, suspension ring and is fixed with static line；The support is fixed on the side of casing；The pulley is rack-mount.The present invention can effectively solve the problem of electronic product with antenna is influenceed test data accuracy by the interference of experimental enviroment when carrying out thermocycling, simple in construction, cheap, and installation, operation and maintenance are convenient, and test effect is good, and test reliability is high.
Description
Technical field
The present invention relates to a kind of high-low temperature tester.
Background technology
With the rapid development of electronic technology, requirement to electronic product yet more and more higher, property at normal temperatures is not required nothing more than
Can be excellent, the work of the energy normal reliable under high/low temperature condition is more required, therefore high/low temperature reliability examination is carried out to electronic product
Tool is tested to be of great significance.Current thermocycling is widely used to Aero-Space, communication, test, armament systems etc.
Field, to detect and identify combination property of the electronic product in high and low temperature environment.It is exactly by electronic product to carry out thermocycling
It is placed in high-low temperature test chamber, low temperature, high temperature low humidity and the various environment such as hot and humid is simulated by high-low temperature test chamber
Condition is so as to test working condition of the electronic product under this environmental condition.
Because thermocycling chamber interior wall is made by metal material, if the electronic product with antenna is straight
Connect and be put into high-low temperature test chamber and tested, the interference that product will be reflected by metal material causes test data inaccurate
So as to cause erroneous judgement.
The content of the invention
In order to solve the above technical problems, the invention provides a kind of high-low temperature tester, the high-low temperature tester energy
Effectively solve the electronic product with antenna is influenceed test data by the interference of experimental enviroment when carrying out thermocycling
The problem of accuracy
The present invention is achieved by the following technical programs.
A kind of high-low temperature tester that the present invention is provided, including wooden case, the wooden case are made up of case lid and casing, case lid
Connected with casing by Limiting hinge；The body side is provided with handle；The body side is provided with carries day for installing
The mounting disc of the electronic product of line；The wooden case inwall is posted can interference of the shield test reactor environment to the electronic product with antenna
Absorbing material；It is provided with the case lid top surface on suspension ring, suspension ring and is fixed with static line；The support is fixed on the side of casing
Face；The pulley is rack-mount.
Installation site of the pulley on support is on same central plane with installation site of the suspension ring on case lid.
The static line is placed in the grooving of pulley, and one end is fixed on suspension ring, and the other end passes through high-low temperature test chamber
The cable-through hole of side is drawn.
The body side is provided with the cable-through hole for crossing line in mounting disc projected position.
The mounting disc is that hollow part is made by nonmetallic materials, and provided with mounting hole, test cable passes through cable-through hole
And mounting hole.
What is buffered when 1mm thickness is pasted with the faying face when case lid and casing are closed, being closed for case lid is industrial
Wool felt.
The size of the casing is 480mm × 450mm × 350mm.
In use, be put into the mounting disc that the electronic product with antenna is arranged in wooden case in high-low temperature test chamber,
Test cable and static line are drawn outside high-low temperature test chamber, high-low temperature test chamber chamber door is closed, experimental enviroment parameter is set, and
Pull static line to open case lid, the electronic product with antenna is progressivelyed reach experimental enviroment requirement, reach that experimental enviroment will
After asking, loosening static line closes case lid, and the experiment retention time up to after requiring, tests product, sentenced according to test data
Whether fixed output quota product are working properly in such a case.
The beneficial effects of the present invention are：Can effectively solve the electronic product with antenna when carrying out thermocycling by
It is simple in construction to the interference of experimental enviroment the problem of influence test data accuracy, it is cheap, install, operation and maintenance
Convenient, test effect is good, and test reliability is high.
Brief description of the drawings
Fig. 1 is the structural representation of the present invention.
In figure：1- case lids, 2- casings, 3- supports, 4- mounting discs, 5- pulleys, 6- absorbing materials, 7- static lines, 8- is spacing
Hinge, 9- handles, 10- suspension ring, 11- cable-through holes
Embodiment
Be described further below technical scheme, but claimed scope be not limited to it is described.
A kind of high-low temperature tester as shown in Figure 1, including wooden case, the wooden case are made up of case lid 1 and casing 2, case
Lid 1 and casing 2 are connected by Limiting hinge 8；The side of casing 2 is provided with handle 9；The side of casing 2 is provided with for pacifying
The mounting disc 4 of electronic product of the dress with antenna；The wooden case inwall posts energy shield test reactor environment to the electronics with antenna
The absorbing material 6 of the interference of product；It is provided with the top surface of case lid 1 on suspension ring 10, suspension ring 10 and is fixed with static line 7；It is described
Support 3 is fixed on the side of casing 2；The pulley 5 is arranged on support 3.
Installation site of the pulley 5 on support 3 is flat in same center with installation site of the suspension ring 10 on case lid 1
On face.
The static line 7 is placed in the grooving of pulley 5, and one end is fixed on suspension ring 10, and the other end is tried by high/low temperature
The cable-through hole of tryoff side is drawn.
The side of casing 2 is provided with the cable-through hole 11 for crossing line in the projected position of mounting disc 4.
The mounting disc 4 is that hollow part is made by nonmetallic materials, and provided with mounting hole, test cable passes through cable-through hole
11 and mounting hole.
The industry buffered when 1mm thickness is pasted with the faying face when case lid 1 and casing 2 are closed, being closed for case lid 1
Use wool felt.
The size of the casing 2 is 480mm × 450mm × 350mm.
In use, be put into the mounting disc 4 that the electronic product with antenna is arranged in wooden case in high-low temperature test chamber,
Test cable and static line 7 are drawn outside high-low temperature test chamber, high-low temperature test chamber chamber door is closed, experimental enviroment parameter is set,
And pull static line 7 to open case lid 1, the electronic product with antenna is progressivelyed reach experimental enviroment requirement, reach proving ring
After border is required, loosening static line 7 closes case lid 1, and the experiment retention time up to after requiring, is tested product, according to test
Whether data judging product is working properly in such a case.
Ambient parameter is including temperature and humidity etc..
Claims (8)
1. a kind of high-low temperature tester, including wooden case, it is characterised in that：The wooden case is made up of case lid (1) and casing (2),
Case lid (1) and casing (2) are connected by Limiting hinge (8)；The casing (2) is provided with handle (9) sideways；Casing (2) side
Face is provided with the mounting disc (4) for installing the electronic product with antenna；The wooden case inwall is posted can shield test reactor environment
To the absorbing material (6) of the interference of the electronic product with antenna；Suspension ring (10), suspension ring are provided with case lid (1) top surface
(10) static line (7) is fixed with；The support (3) is fixed on the side of casing (2)；The pulley (5) is arranged on support (3)
On.
2. high-low temperature tester as claimed in claim 1, it is characterised in that：Installation of the pulley (5) on support (3)
Position is on same central plane with installation site of the suspension ring (10) on case lid (1).
3. high-low temperature tester as claimed in claim 1, it is characterised in that：The static line (7) is placed on pulley (5)
In grooving, one end is fixed on suspension ring (10), and the other end is drawn by the cable-through hole of high-low temperature test chamber side.
4. high-low temperature tester as claimed in claim 1, it is characterised in that：The casing (2) is thrown in mounting disc (4) sideways
Shadow position is provided with the cable-through hole (11) for crossing line.
5. high-low temperature tester as claimed in claim 1, it is characterised in that：The mounting disc (4) is by nonmetallic materials
Hollow part is made, and provided with mounting hole, test cable passes through cable-through hole (11) and mounting hole.
6. high-low temperature tester as claimed in claim 1, it is characterised in that：When the case lid (1) and casing (2) closing
The industrial wool felt buffered when 1mm thickness is pasted with faying face, being closed for case lid (1).
7. high-low temperature tester as claimed in claim 1, it is characterised in that：The size of the casing (2) be 480mm ×
450mm×350mm。
8. high-low temperature tester as claimed in claim 1, it is characterised in that：In use, by the electronic product with antenna
It is put into mounting disc (4) in wooden case in high-low temperature test chamber, test cable and static line (7) is drawn into high/low temperature examination
Outside tryoff, high-low temperature test chamber chamber door is closed, experimental enviroment parameter is set, and pulls static line (7) to open case lid (1), is made
Electronic product with antenna progressivelyes reach experimental enviroment requirement, reaches after experimental enviroment requirement, and loosening static line (7) makes case lid
(1) close, the experiment retention time up to after requiring, is tested product, product is judged in such a case according to test data
It is whether working properly.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710211497.5A CN106970281A (en) | 2017-03-31 | 2017-03-31 | A kind of high-low temperature tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710211497.5A CN106970281A (en) | 2017-03-31 | 2017-03-31 | A kind of high-low temperature tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106970281A true CN106970281A (en) | 2017-07-21 |
Family
ID=59336195
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710211497.5A Pending CN106970281A (en) | 2017-03-31 | 2017-03-31 | A kind of high-low temperature tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106970281A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112014653A (en) * | 2019-05-28 | 2020-12-01 | 山东交通学院 | Electrician electronic product low temperature test ability verification equipment |
| CN113447748A (en) * | 2021-06-29 | 2021-09-28 | 贵州航天电子科技有限公司 | Device for high and low temperature test of electronic product |
| CN113447046A (en) * | 2021-06-28 | 2021-09-28 | 贵州航天电子科技有限公司 | Tool for dynamic simulation test of electronic product |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09289393A (en) * | 1996-04-23 | 1997-11-04 | Hisashi Kato | Magnetic shield room and assembling method therefor |
| CN201229396Y (en) * | 2008-06-05 | 2009-04-29 | 中国船舶重工集团公司第七一〇研究所 | High and low-temperature magnetic test system |
| CN203084112U (en) * | 2012-12-28 | 2013-07-24 | 北京中电华大电子设计有限责任公司 | High/low temperature test device of non-contact communication chips |
| CN204086332U (en) * | 2014-09-22 | 2015-01-07 | 深圳市佳晨科技有限公司 | A kind of shielded box with operation gloves |
| CN205374636U (en) * | 2016-02-02 | 2016-07-06 | 航天科工防御技术研究试验中心 | A combined test device for environmental test |
| CN205808653U (en) * | 2016-05-24 | 2016-12-14 | 贵州航天电子科技有限公司 | A kind of product reaction test device by mistake |
| CN205910232U (en) * | 2016-06-24 | 2017-01-25 | 东莞市冠雄达电子科技有限公司 | Construction improvement's shielded cell |
| CN106405168A (en) * | 2016-08-31 | 2017-02-15 | 贵州航天电子科技有限公司 | Radio transceiver test shielding box |
-
2017
- 2017-03-31 CN CN201710211497.5A patent/CN106970281A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09289393A (en) * | 1996-04-23 | 1997-11-04 | Hisashi Kato | Magnetic shield room and assembling method therefor |
| CN201229396Y (en) * | 2008-06-05 | 2009-04-29 | 中国船舶重工集团公司第七一〇研究所 | High and low-temperature magnetic test system |
| CN203084112U (en) * | 2012-12-28 | 2013-07-24 | 北京中电华大电子设计有限责任公司 | High/low temperature test device of non-contact communication chips |
| CN204086332U (en) * | 2014-09-22 | 2015-01-07 | 深圳市佳晨科技有限公司 | A kind of shielded box with operation gloves |
| CN205374636U (en) * | 2016-02-02 | 2016-07-06 | 航天科工防御技术研究试验中心 | A combined test device for environmental test |
| CN205808653U (en) * | 2016-05-24 | 2016-12-14 | 贵州航天电子科技有限公司 | A kind of product reaction test device by mistake |
| CN205910232U (en) * | 2016-06-24 | 2017-01-25 | 东莞市冠雄达电子科技有限公司 | Construction improvement's shielded cell |
| CN106405168A (en) * | 2016-08-31 | 2017-02-15 | 贵州航天电子科技有限公司 | Radio transceiver test shielding box |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112014653A (en) * | 2019-05-28 | 2020-12-01 | 山东交通学院 | Electrician electronic product low temperature test ability verification equipment |
| CN112014653B (en) * | 2019-05-28 | 2023-05-12 | 山东交通学院 | Low-temperature test capability verification equipment for electrical and electronic products |
| CN113447046A (en) * | 2021-06-28 | 2021-09-28 | 贵州航天电子科技有限公司 | Tool for dynamic simulation test of electronic product |
| CN113447748A (en) * | 2021-06-29 | 2021-09-28 | 贵州航天电子科技有限公司 | Device for high and low temperature test of electronic product |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20170721 |
|
| RJ01 | Rejection of invention patent application after publication |