CN106950588A - Survey radon system based on semi-conductor dehumidifying technology - Google Patents

Survey radon system based on semi-conductor dehumidifying technology Download PDF

Info

Publication number
CN106950588A
CN106950588A CN201611223881.9A CN201611223881A CN106950588A CN 106950588 A CN106950588 A CN 106950588A CN 201611223881 A CN201611223881 A CN 201611223881A CN 106950588 A CN106950588 A CN 106950588A
Authority
CN
China
Prior art keywords
condensation chamber
semi
heat dissipation
dissipation cavity
refrigeration sheet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201611223881.9A
Other languages
Chinese (zh)
Other versions
CN106950588B (en
Inventor
冯威锋
关键
王腾飞
丁海云
曹放
柳杰
侯江
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BEIJING BRICEM SCIENCE AND TECHNOLOGY Co.,Ltd.
Original Assignee
Beijing Research Institute of Chemical Engineering and Metallurgy of CNNC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beijing Research Institute of Chemical Engineering and Metallurgy of CNNC filed Critical Beijing Research Institute of Chemical Engineering and Metallurgy of CNNC
Priority to CN201611223881.9A priority Critical patent/CN106950588B/en
Publication of CN106950588A publication Critical patent/CN106950588A/en
Application granted granted Critical
Publication of CN106950588B publication Critical patent/CN106950588B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • G01T1/24Measuring radiation intensity with semiconductor detectors
    • G01T1/244Auxiliary details, e.g. casings, cooling, damping or insulation against damage by, e.g. heat, pressure or the like

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)

Abstract

The invention belongs to emanometer technical field, and in particular to a kind of survey radon system based on semi-conductor dehumidifying technology.Including filter membrane, sampling pump, heat dissipation cavity, the hot face of semiconductor refrigeration sheet, the huyashi-chuuka (cold chinese-style noodles) of semiconductor refrigeration sheet, condensation chamber, thermal insulation layer, water-storage pot, measuring system and radiator;Condensation chamber is mounted on the huyashi-chuuka (cold chinese-style noodles) of semiconductor refrigeration sheet, condensation chamber periphery is enclosed with thermal insulation layer, the one side of heat dissipation cavity is mounted on the hot face of semiconductor refrigeration sheet, the another side of heat dissipation cavity is pasted with radiator, sample gas enters condensation chamber in the presence of sampling pump by filter membrane, water-storage pot is connected with condensation chamber, and heat dissipation cavity is connected with measuring system.The present invention can solve the problems, such as influence of the sample gas humidity to static collection emanometer, and stable, higher collection efficiency is realized without drier.

Description

Survey radon system based on semi-conductor dehumidifying technology
Technical field
The invention belongs to emanometer technical field, and in particular to a kind of survey radon system based on semi-conductor dehumidifying technology.
Background technology
Static collection is the current method using a kind of measurement radon consistence widely, and this method is by collecting The first generation daughter Po-218 of radon is measured, it is desirable to which instrument has high and stable collection efficiency.Just decayed generation Po-218 be free state metallic atom, the probability that there are about 90% is positively charged, and they are collected into the presence of electric field Detector surface.But during collection, positively charged Po-218 atoms are easy to the water vapour molecule phase with polarizing Effect becomes neutral particle, and electric field is to its ineffective power, so that collection efficiency is influenceed, so the influence for excluding humidity is to use The instrument of static collection needs the major issue solved, is also a great problem for perplexing instrument development person for many years.
Influence of the sample gas humidity to static collection emanometer is solved, it is general at present to use desiccant dryness sample gas The RAD7 electronics emanometers of the method for body, such as the U.S. production, but this method can consume substantial amounts of drier, it is necessary to often more Drier is changed, uses and carries all inconvenient, can not more realize unattended continuous on-line operation.There is a method in which being exactly Using temperature and humidity compensation algorithm, but the relation of collection efficiency and humiture is complicated, while also by electric-field intensity, the body of collecting chamber The influence of the factor such as product and shape, and collection efficiency is very low during measurement high humility gaseous sample, so as to cause the sensitive of instrument Degree is substantially reduced, and measurement error is still very big after compensation, so in the market almost can not find the shaping instrument made in this way.
The content of the invention
It is wet to solve sample gas it is an object of the invention to provide a kind of survey radon system based on semi-conductor dehumidifying technology The influence problem to static collection emanometer is spent, stable, higher collection efficiency is realized without drier.
To reach above-mentioned purpose, the technical solution used in the present invention is:
A kind of survey radon system based on semi-conductor dehumidifying technology, including filter membrane, sampling pump, heat dissipation cavity, semiconductor refrigeration sheet Hot face, the huyashi-chuuka (cold chinese-style noodles) of semiconductor refrigeration sheet, condensation chamber, thermal insulation layer, water-storage pot, measuring system and radiator;Condensation chamber is mounted on The huyashi-chuuka (cold chinese-style noodles) of semiconductor refrigeration sheet, condensation chamber periphery is enclosed with thermal insulation layer, and the one side of heat dissipation cavity is mounted on the heat of semiconductor refrigeration sheet Face, the another side of heat dissipation cavity is pasted with radiator, and sample gas enters condensation chamber, water storage in the presence of sampling pump by filter membrane Bottle is connected with condensation chamber, and heat dissipation cavity is connected with measuring system.
Described sample gas enter condensation chamber after temperature rapidly reduction and it is supersaturated, institute's containing water vapor is in the wall of condensation chamber four Water is condensed into, moisture in water-storage pot or drainpipe, sample gas is flowed into and substantially reduces;Described sample gas passes through radiating After chamber, temperature recovery is to 20 DEG C~40 DEG C, and relative humidity drops to 15%, subsequently into the electrostatic collection room of measuring system, collects The radon daughter that new decay is produced.
Described heat dissipation cavity is processed into aluminium alloy.
Described condensation cavity material is aluminium alloy, and the temperature of condensation chamber is slightly above as low as possible while 0 DEG C.
Described insulating layer material is polyurethane.
Described water-storage pot can be replaced with drainpipe.
Fan is installed on described radiator.
Between described condensation chamber and the huyashi-chuuka (cold chinese-style noodles) of semiconductor refrigeration sheet, between the hot face of semiconductor refrigeration sheet and heat dissipation cavity, Heat-conducting silicone grease is all smeared between heat dissipation cavity and radiator.
Described measuring system includes electrostatic collection room, silicon semiconductor detector, amplifier and single track or multichannel analyzer, Analysis calculating is carried out by single-chip microcomputer or microcomputer, the concentration value of radon is obtained.
The Po-218 atoms that radon decay is produced are collected into silicon semiconductor detection in the presence of the electric field of electrostatic collection room The surface of device, Po-218 continues to decay produces signal on silicon semiconductor detector, by amplifier and multichannel analyzer, obtains Alpha energy spectrum;Single-chip microcomputer calculates the 6MeV corresponding energy spectral peak of α particles, obtained by calculating peak area by analyzing α spectrums Po-218 decay is counted, and then calculates the radon consistence of sample gas.
Having the beneficial effect that acquired by the present invention:
The present invention uses conductor refrigeration dehumidifying technology, removes the most of moisture in sample gas, realizes stable , efficient collection efficiency, so as to solve the problems, such as influence of the sample gas humidity to static collection emanometer.Without using drying Agent, it is to avoid change the drier of failure, simplify the operation of instrument, it is possible to achieve unattended continuous on-line operation.Without Substantial amounts of drier is carried, the portability of instrument can be improved.The technology can apply to the electrostatic using semiconductor detector Collecting method, is also applied for the static collection using scintillator detector.
Brief description of the drawings
Fig. 1 is the survey radon system construction drawing of the present invention based on semi-conductor dehumidifying technology;
In figure:1st, filter membrane;2nd, sampling pump;3rd, heat dissipation cavity;4th, the hot face of semiconductor refrigeration sheet;5th, semiconductor refrigeration sheet is cold Face;6th, condensation chamber;7th, thermal insulation layer;8th, water-storage pot;9th, measuring system;10th, radiator.
Embodiment
The present invention is described in detail with specific embodiment below in conjunction with the accompanying drawings.
As shown in figure 1, the survey radon system of the present invention based on semi-conductor dehumidifying technology includes filter membrane 1, sampling pump 2, dissipated Hot chamber 3, the hot face 4 of semiconductor refrigeration sheet, the huyashi-chuuka (cold chinese-style noodles) 5 of semiconductor refrigeration sheet, condensation chamber 6, thermal insulation layer 7, water-storage pot 8, measurement system System 9 and radiator 10;Condensation chamber 6 is mounted on the huyashi-chuuka (cold chinese-style noodles) 5 of semiconductor refrigeration sheet, and the periphery of condensation chamber 6 is enclosed with thermal insulation layer 7, radiating The one side of chamber 3 is mounted on the hot face 4 of semiconductor refrigeration sheet, and the another side of heat dissipation cavity 3 is pasted with radiator 10, and sample gas is being adopted Condensation chamber 6 is entered by filter membrane 1 in the presence of sample pump 2, water-storage pot 8 is connected with condensation chamber 6, and heat dissipation cavity 3 connects with measuring system 9 Connect.
The condensation chamber 6 can use aluminium alloy or other intermetallic composite coatings, the huyashi-chuuka (cold chinese-style noodles) 5 of semiconductor refrigeration sheet is mounted on, outside it Enclose and be enclosed with thermal insulation layer 7, the material of thermal insulation layer 7 is polyurethane or other insulation materials.Sample gas is reached after condensation chamber 6, temperature Rapidly reduction causes vapor supersaturation, and most of water vapor condensation gets off.The system can use water-storage pot 8 to store condensation Water, can also be expelled directly out with drainpipe.The temperature of condensation chamber 6 be slightly above it is as low as possible while 0 DEG C, such as 1 DEG C ± 0.5 DEG C Or 2 DEG C ± 1 DEG C etc., not limited to this scope.Sample gas enter condensation chamber 6 after temperature rapidly reduction and it is supersaturated, it is aqueous Steam condenses into water in the wall of condensation chamber 6 four, flows into water-storage pot 8 or drainpipe.Moisture is substantially reduced in sample gas.
The heat dissipation cavity 3 can use aluminium alloy or the good intermetallic composite coating of other heat conduction, be mounted on semiconductor refrigeration sheet Hot face 4.The another side of heat dissipation cavity 3 is pasted with radiator 10.If it is necessary, fan, forced heat radiation can be installed on radiator 10.
Between condensation chamber 6 and the huyashi-chuuka (cold chinese-style noodles) of semiconductor refrigeration sheet 5, between the hot face 4 of semiconductor refrigeration sheet and heat dissipation cavity 3, dissipate Heat-conducting silicone grease is all smeared between hot chamber 3 and radiator 10, to eliminate the air gap of contact surface, thermal resistance is reduced, strengthens its heat The ability of transmission.
After sample gas is by heat dissipation cavity 3, temperature recovery is to 20 DEG C~40 DEG C, and relative humidity can drop to 15% or so. Subsequently into the electrostatic collection room of measuring system, the radon daughter that new decay is produced is collected.
Measuring system 9 includes amplifier and single track or multichannel analyzer, carries out analysis calculating by single-chip microcomputer or microcomputer, obtains To the concentration value of radon.
All pipeline connections should use highdensity plastic flexible pipe, it is to avoid use metal tube.
The semiconductor dehumidifying device of the system has used semiconductor refrigeration sheet.Conductor refrigeration is that a kind of produce bears thermal resistance Refrigeration Technique:When one piece of N-type semiconductor material and one piece of p-type semiconductor material connect to galvanic couple pair, connect in this circuit After logical DC current, the transfer with regard to that can produce energy, the joint that electric current flows to p-type element by N-type element absorbs heat, as cold End, the joint for flowing to N-type element by p-type element discharges heat, as hot junction.Conductor refrigeration advantage is a lot:Refrigeration speed is fast, Its refrigeration speed can be controlled by adjusting operating current;It is noiseless, without friction, without abrasion, it is reliable, easy to maintenance;Body Product is small, lightweight;It is free from environmental pollution without using refrigerant;Two kinds of purposes of cooling and heating type can be reached by changing the sense of current, Accurate temperature control can be realized.
Embodiment one,
Sample gas is by filter membrane 1 in the presence of sampling pump 2, and by condensation chamber 6, radiator 3 reaches measuring system 9 Electrostatic collection room, then emit.Measuring system 9 includes electrostatic collection room, silicon semiconductor detector, amplifying circuit, many Channel analyzer, SCM system etc..
The temperature control of condensation chamber 6 in the range of 2 DEG C ± 1 DEG C, the rapid drop in temperature of sample gas and it is supersaturated, condensation Water flows into water-storage pot 8 (manually outwelling water after full).Sample gas enters heat dissipation cavity 3 after condensation chamber 6, and temperature, which rises, to be caused 40 DEG C, relative humidity can be reduced to less than 15%.Radiator 10 installs fan, when the temperature of heat dissipation cavity 3 is too high, is entered using fan Row forced heat radiation.
The Po-218 atoms that radon decay is produced are collected into silicon semiconductor detection in the presence of the electric field of electrostatic collection room The surface of device, Po-218 continues to decay produces signal on semiconductor detector, by amplifying circuit and multichannel analyzer, obtains Alpha energy spectrum.SCM system calculates the 6MeV corresponding energy spectral peak of α particles, by calculating peak area by analyzing α spectrums The decay for obtaining Po-218 is counted, and then calculates the radon consistence of sample gas.
Sampling pump 2 can always be run in whole measurement process, can also coordinate intermittent duty with semiconductor refrigeration sheet, When the gas of electrostatic collection room is fully replaced by sample gas, you can stop membrane pump 2 and semiconductor chilling plate Work, to save electric energy.
Embodiment two,
Sample gas is by filter membrane 1 in the presence of sampling pump 2, and by condensation chamber 6, radiator 3 reaches measuring system 9 Electrostatic collection room, then emit.Measuring system 9 includes electrostatic collection room, silicon semiconductor detector, amplifying circuit, many Channel analyzer, SCM system etc..
The temperature control of condensation chamber 6 in the range of 1 DEG C ± 0.5 DEG C, the rapid drop in temperature of sample gas and it is supersaturated, it is cold Solidifying water flows into drainpipe.
Because the effect of sampling pump 2, the gas pressure in condensation chamber 6 is more slightly larger than the emanometer external world, the condensation in drainpipe Water can discharge emanometer in the presence of pressure differential.
Sample gas enters heat dissipation cavity 3 after condensation chamber 6, and temperature, which rises, causes 40 DEG C, and relative humidity can be reduced to Less than 15%.Fan is installed on radiator 10, when the temperature of heat dissipation cavity 3 is too high, forced heat radiation is carried out using fan.
The Po-218 atoms that radon decay is produced are collected into silicon semiconductor detection in the presence of the electric field of electrostatic collection room The surface of device, Po-218 continues to decay produces signal on semiconductor detector, by amplifying circuit and multichannel analyzer, obtains α is composed.SCM system calculates the 6MeV corresponding energy spectral peak of α particles, obtained by calculating peak area by analyzing α spectrums Decay to Po-218 is counted, and then calculates the radon consistence of sample gas.
Membrane pump 2 is continuously run, and the gas in electrostatic collection room is continuously updated as newest sample gas, every Single-chip microcomputer carries out a α analysis of spectrum within 30 minutes, calculates a radon consistence, and measurement result and power spectrum are all stored in into historical data In.So as to realize the unattended continuous measurement of radon, and measurement result can be sent to numeral in real time by communication interface Change and information system.

Claims (10)

1. a kind of survey radon system based on semi-conductor dehumidifying technology, it is characterised in that:Including filter membrane (1), sampling pump (2), radiating Chamber (3), the hot face (4) of semiconductor refrigeration sheet, the huyashi-chuuka (cold chinese-style noodles) (5) of semiconductor refrigeration sheet, condensation chamber (6), thermal insulation layer (7), water-storage pot (8), measuring system (9) and radiator (10);Condensation chamber (6) is mounted on the huyashi-chuuka (cold chinese-style noodles) (5) of semiconductor refrigeration sheet, and condensation chamber (6) is outside Enclose and be enclosed with thermal insulation layer (7), the one side of heat dissipation cavity (3) is mounted on the hot face (4) of semiconductor refrigeration sheet, heat dissipation cavity (3) it is another Face is pasted with radiator (10), and sample gas enters condensation chamber (6), water-storage pot in the presence of sampling pump (2) by filter membrane (1) (8) it is connected with condensation chamber (6), heat dissipation cavity (3) is connected with measuring system (9).
2. the survey radon system according to claim 1 based on semi-conductor dehumidifying technology, it is characterised in that:Described sample gas Body enter condensation chamber (6) afterwards temperature rapidly reduction and it is supersaturated, institute's containing water vapor condenses into water in the wall of condensation chamber (6) four, inflow Moisture is substantially reduced in water-storage pot (8) or drainpipe, sample gas;After described sample gas is by heat dissipation cavity (3), temperature Degree goes back up to 20 DEG C~40 DEG C, and relative humidity drops to 15%, and subsequently into the electrostatic collection room of measuring system (9), collection newly declines Become the radon daughter produced.
3. the survey radon system according to claim 1 based on semi-conductor dehumidifying technology, it is characterised in that:Described heat dissipation cavity (3) it is processed into aluminium alloy.
4. the survey radon system according to claim 1 based on semi-conductor dehumidifying technology, it is characterised in that:Described condensation chamber (6) material is aluminium alloy, and the temperature of condensation chamber (6) is slightly above as low as possible while 0 DEG C.
5. the survey radon system according to claim 1 based on semi-conductor dehumidifying technology, it is characterised in that:Described thermal insulation layer (7) material is polyurethane.
6. the survey radon system according to claim 1 based on semi-conductor dehumidifying technology, it is characterised in that:Described water-storage pot (8) it can be replaced with drainpipe.
7. the survey radon system according to claim 1 based on semi-conductor dehumidifying technology, it is characterised in that:Described radiator (10) fan is installed on.
8. the survey radon system according to claim 1 based on semi-conductor dehumidifying technology, it is characterised in that:Described condensation chamber (6) between the huyashi-chuuka (cold chinese-style noodles) (5) of semiconductor refrigeration sheet, between the hot face (4) of semiconductor refrigeration sheet and heat dissipation cavity (3), heat dissipation cavity (3) Heat-conducting silicone grease is all smeared between radiator (10).
9. the survey radon system according to claim 1 based on semi-conductor dehumidifying technology, it is characterised in that:Described measurement system System (9) includes electrostatic collection room, silicon semiconductor detector, amplifier and single track or multichannel analyzer, passes through single-chip microcomputer or microcomputer Analysis calculating is carried out, the concentration value of radon is obtained.
10. the survey radon system according to claim 9 based on semi-conductor dehumidifying technology, it is characterised in that:Radon decay is produced Po-218 atoms the surface of silicon semiconductor detector is collected into the presence of the electric field of electrostatic collection room, Po-218 continues Decay produces signal on silicon semiconductor detector, by amplifier and multichannel analyzer, obtains alpha energy spectrum;Single-chip microcomputer passes through to α Spectrum is analyzed, and calculates the 6MeV corresponding energy spectral peak of α particles, and the decay that Po-218 is obtained by calculating peak area is counted, so The radon consistence of sample gas is calculated afterwards.
CN201611223881.9A 2016-12-27 2016-12-27 Survey radon system based on semi-conductor dehumidifying technology Active CN106950588B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201611223881.9A CN106950588B (en) 2016-12-27 2016-12-27 Survey radon system based on semi-conductor dehumidifying technology

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201611223881.9A CN106950588B (en) 2016-12-27 2016-12-27 Survey radon system based on semi-conductor dehumidifying technology

Publications (2)

Publication Number Publication Date
CN106950588A true CN106950588A (en) 2017-07-14
CN106950588B CN106950588B (en) 2019-09-17

Family

ID=59466322

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201611223881.9A Active CN106950588B (en) 2016-12-27 2016-12-27 Survey radon system based on semi-conductor dehumidifying technology

Country Status (1)

Country Link
CN (1) CN106950588B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109541666A (en) * 2018-11-27 2019-03-29 衡阳师范学院 Measurement222The device and method of temperature and humidity effect is eliminated when Rn mean concentration
CN110243997A (en) * 2018-03-07 2019-09-17 霍尼韦尔国际公司 The cooling system that draws water in detector
CN111337966A (en) * 2020-03-19 2020-06-26 衡阳师范学院 Device and method for measuring soil radon concentration

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20120118974A (en) * 2011-04-20 2012-10-30 한국지질자원연구원 Field measurement system and methods of radon gas in groundwater bore hole
KR20120124534A (en) * 2011-05-04 2012-11-14 한국지질자원연구원 Soil radon gas measuring system for uranium exploration
CN203191565U (en) * 2013-05-03 2013-09-11 贝谷科技股份有限公司 Device for monitoring radon gas in underground water
CN105703244A (en) * 2016-03-24 2016-06-22 四川中科源创科技有限公司 Refrigerating intelligent dehumidification device and dehumidification method for power cabinet

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20120118974A (en) * 2011-04-20 2012-10-30 한국지질자원연구원 Field measurement system and methods of radon gas in groundwater bore hole
KR20120124534A (en) * 2011-05-04 2012-11-14 한국지질자원연구원 Soil radon gas measuring system for uranium exploration
CN203191565U (en) * 2013-05-03 2013-09-11 贝谷科技股份有限公司 Device for monitoring radon gas in underground water
CN105703244A (en) * 2016-03-24 2016-06-22 四川中科源创科技有限公司 Refrigerating intelligent dehumidification device and dehumidification method for power cabinet

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
K.HOSOKAWA ET AL.: "Development of a high-sensitivity 80L radon detector for purified gases", 《PROG.THEORY.EXP.PHYS》 *
S.HEIDARYET AL.: "Monitoring and measurement of radon activity in a new design of radon calibration chamber", 《RADIATION MEASUREMENTS》 *
郑永明 等: "中型氡室温湿度智能控制系统设计", 《中国测试技术》 *

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110243997A (en) * 2018-03-07 2019-09-17 霍尼韦尔国际公司 The cooling system that draws water in detector
CN110243997B (en) * 2018-03-07 2022-03-01 霍尼韦尔国际公司 Water pumping and cooling system in gas detector
CN109541666A (en) * 2018-11-27 2019-03-29 衡阳师范学院 Measurement222The device and method of temperature and humidity effect is eliminated when Rn mean concentration
CN109541666B (en) * 2018-11-27 2023-09-05 衡阳师范学院 Measurement of 222 Device and method for eliminating temperature and humidity effect during Rn average concentration
CN111337966A (en) * 2020-03-19 2020-06-26 衡阳师范学院 Device and method for measuring soil radon concentration

Also Published As

Publication number Publication date
CN106950588B (en) 2019-09-17

Similar Documents

Publication Publication Date Title
CN106950588B (en) Survey radon system based on semi-conductor dehumidifying technology
Alizadeh et al. An experimental study of a forced flow solar collector/regenerator using liquid desiccant
US9329279B2 (en) Method and device for measuring radon by electrostatic collection method without influence of environmental temperature and environmental humidity
CN103207109B (en) The numerical control dehumidification and temperature adjustment apparatus and method of air particle concentration monitor sample collection
CN101782655A (en) Method and device for measuring radon exhalation rate in open loop way
Nianping et al. Experimental study on energy efficiency of heat-source tower heat pump units in winter condition
CN208540355U (en) A kind of active Phase cooling system
CN106840766A (en) A kind of sampling method for air tritiated water
CN103412097B (en) The pick-up unit of a kind of VOC and burst size of methanal and detection method thereof
Ge et al. Experimental investigation on performance of desiccant coated heat exchanger and sensible heat exchanger operating in series
Jack et al. Evaluation Methods for Heat Pipes in Solar Thermal Collectors-Test Equipment and First Results
CN102305665B (en) High-temperature high-vacuum temperature measuring device
CN106950591B (en) Static collection based on cooling technique of semiconductor surveys radon device
CN110762670B (en) Heat exchange efficiency evaluation method for indirect evaporative cooling energy recoverer
CN207528582U (en) A kind of aluminium flake frosting performance testing device
CN209549087U (en) A kind of flue gas condensing de-watering apparatus
CN208275425U (en) A kind of distillation apparatus
CN208688996U (en) A kind of pyroconductivity test device
CN207832721U (en) A kind of test device of fiber assembly heat storage performance
CN206420683U (en) A kind of portable sampling equipment for air tritiated water
CN202735280U (en) Building envelope structure heat transfer coefficient detector
CN208568083U (en) A kind of Cryo Refrigerator low temperature parameter measuring device
Ahmed et al. Experimental study of heat and mass transfer of Solar Powered liquid desiccant regeneration system
CN204390064U (en) The attemperating unit of energy-dispersion X-ray fluorescence spectrometer
TWI480565B (en) Simulation System of Thermoelectric Power Generation Performance

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
TR01 Transfer of patent right
TR01 Transfer of patent right

Effective date of registration: 20210425

Address after: 101149 Beijing city Tongzhou District jiukeshu No. 145

Patentee after: BEIJING BRICEM SCIENCE AND TECHNOLOGY Co.,Ltd.

Address before: 101149 Beijing city Tongzhou District jiukeshu No. 145

Patentee before: Beijing Institute of chemical metallurgy of nuclear industry