CN106950489B - A kind of electric power detection and fail-ure criterion system and method - Google Patents
A kind of electric power detection and fail-ure criterion system and method Download PDFInfo
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- CN106950489B CN106950489B CN201710218932.7A CN201710218932A CN106950489B CN 106950489 B CN106950489 B CN 106950489B CN 201710218932 A CN201710218932 A CN 201710218932A CN 106950489 B CN106950489 B CN 106950489B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
Abstract
The invention discloses a kind of electric power detection and fail-ure criterion system and method, which includes command process module, data memory module, OS detection module, energy supply control module, voltage self calibration module, firmware update module, driving capability detection module, electric power detection module, failure detection module.Multinomial electricity electrical specifications are integrated in set of system by the system and method carries out detection and fail-ure criterion, includes chip physical electrical connection performance itself, greatly improves working efficiency, and analyzed and indicated according to relevant issues；Entire detection and failure analysis process carry out automatically, high degree of automation.
Description
Technical field
The invention belongs to chip testing technology field, in particular to it is a kind of based on embedded microprocessor control to chip
The device of the electric quantity tests such as voltage-current characteristic, electric leakage and the power consumption of I/O pin input and output and fail-ure criterion.
Background technique
In order to meet research and development test phase to the application needs of chip electric quantity test and fail-ure criterion, while considering detection system
The demands such as integration, reliability and the durability of system propose the electricity performance indicator application scenarios of chip product very high
It is required that.Test platform cannot automatically detect I/O pin electrical resistance and electricity range parameter in the case of different voltages at present, to setting
Meter personnel problem analysis and the comprehensive of data bring certain difficulty；Using C51 as the test equipment of control core, peripheral hardware is few,
Accuracy of data acquisition and processing speed are low, cannot detect to the high-speed, high precision signal of input electricity；Tested person personnel's
The influence of the technical ability of itself and careful degree, under conditions of being not inserted into detection, during the test when chip inconsistent phenomenon
There is generation, so that increasing the unnecessary orientation problem time, the erroneous judgement to chip performance is caused when serious；Traditional electricity is defeated
The shake of device output voltage is big out, cannot effectively lock output voltage, cause that test data fluctuation is big, data validity is big and
Repetitive operation etc.；It not can be carried out online burning, each burning needs outsourcing to include device removal chip progress burning, is unfavorable for journey
Sequence updates, and working efficiency is low and additional workload is big；The failure of multi objective item cannot be detected simultaneously, such as IOH/IOL, VIL/
The parameters such as VIH, VOL/VOH, power consumption and electric leakage are detected, and measurement every time requires individually equipment together, low efficiency and when
Between it is at high cost, seriously affect client production and test progress.
It is that current existing detection device is separate from and multinomial failure detection cannot be carried out simultaneously, it is based on 8 MCU
The detection device of framework has a single function, and internal peripheral hardware is few, procedure, data memory space is small and working frequency of chip is not high, module
Between coupling too strong low-density height coupling, cause software Hierarchical Design simple, program modularity and reusability design
It is low, new detection and fail-ure criterion device can not be quickly developed, input signal is unstable to cause data unreliable, repeated work
Work amount is big, cannot to chip because of none complete detection discriminating gear of electrical characteristic failure problem detection device
Electric power detection and failure analysis are carried out simultaneously, and burning needs chip under test taking out burning every time, bring to entire test
Very big time trouble, whole process need artificial participation, and a large amount of repeated works make the cost of manpower and material resources and time resource
Increase, in-fighting is larger to cause testing cost higher, detects and causes hardware cost to increase without integration, subsequent maintainability difficulty
It increases；It can all affect by the technical ability and carefulness of tester itself to the function and performance of chip testing, sternly
When weight tester can judge problem by accident, increase design cost and testing time；Detection device based on tester table, equipment
It is inconvenient to carry, cannot effectively apply to client and test, client detected and fail differentiate it is limited；Traditional detection
Method needs a large amount of manual operations, single to the analysis of expired entry, will receive the restriction of current conditions and cannot effectively differentiate, lacks
Few compound detection and failure distinguish the device of one, rely only on plug-in instrument and equipment list and carry out only manual analyzing, efficiency
Lowly.
Summary of the invention
Based on this, therefore primary mesh of the invention be to provide a kind of electric power detection and fail-ure criterion system and method, should
System and method can carry out detection and fail-ure criterion to chip electricity electrical characteristic, while can detect a variety of failures point simultaneously
Parameter, adaptive voltage linear scan and voltage lockout are analysed, entire detection and failure analysis process are participated in without artificial, automation
Degree is high.
Another mesh of the invention it is to provide a kind of electric power detection and fail-ure criterion system and method, the system and side
Method is integrated by Linear Control and failure detection, saves hardware cost and software design period, real-time detection and protection, has
The advantage that real-time is good, high-performance, high reliability, circuit structure are simple, less maintenance complexity can be improved personnel's efficiency.
To achieve the above object, the technical solution of the present invention is as follows:
A kind of electric power detection and fail-ure criterion system, it is characterised in that the system includes that command process module, data are deposited
Store up module, OS detection module, energy supply control module, voltage self calibration module, firmware update module, driving capability detection module,
Electric power detection module, crash handling module, above-mentioned module are integrated in embedded microprocessor, wherein
Described instruction processing module, to establish the connection of upper and lower computer and receive and dispatch the control instruction sum number of upper and lower computer part
According to the command process module calls each functional module to be handled according to related command, to meet the setting of user's different modes
Demand, command process module include connection control, handshake process, instruction check, Error disposal, time-out detect, scheme control and
Real-time control may be implemented by command process module in the relevant operations such as information transmit-receive, to meet user's different demands, returns
Operating result.
The data memory module, to store test hex, chip configuration file concordance list, chip failure data information,
The correlations such as pin and module input resistance, electrical characteristic range information, chip model, identification information and test macro version number are matched
Set the file information.System receives the data storage command of transmission, starts initialization data memory module, and prepares to receive hex
After file, feedback configuration file and the test the file informations such as hex, starts to receive data and store data into data storage mould
Block, while feedback data transmits information, initialization data memory module obtains data storage request information, and will be requested
Data information memory is to data memory module, while feedback data transmission information is to prompt.In system work, data store mould
Block also records the test data in test process, in case subsequent examination.Data memory module have internal storage and
External memory module, external memory module are divided into file index area and data field again.Store the basic of chip in file index area
Information, such as chip model, size of data, storage position, the test address area hex and other data information storage address letter
Breath；Data field is used to store the data of address shown in file index area, wherein including test hex data and test data etc..
OS detection module, to detect chip under test whether place it is correct and contact it is whether good, do not place it is correct or
Poor contact will be prompted to user and reappose, to ensure the validity of test data；When carrying out OS detection, channel is needed to select
Select switch selection, by the port of OS detection module be connected to chip under test power supply, and I/O port, the end IO of chip under test
Mouthful classify according to odd even, setting DUT voltage is low level, be then turned on electric power detection and set respectively (- 500uA~-100uA) and
The electric current of (100uA~500uA) is input to chip under test, and electric power detection module detects voltage at this time, if voltage range absolute value
In (0.2V~1.2V), then it is assumed that chip OS characteristic is good.
The energy supply control module, to functions such as control and the DUT power supply controls of completing DUT burning voltage.
The voltage self calibration module, can be to energy supply control module, OS detection module and electric power detection module to realize
Adaptive calibration function, can guarantee that output voltage is more accurate and stablizes, and have the clamping action of voltage, so that defeated
Voltage is more accurate out.Embedded microprocessor control voltage self calibration module acquisition energy supply control module, OS detection module and
The output voltage amount of electric power detection module etc., and by its voltage compared with normal voltage amount, adjust in real time energy supply control module,
The input quantity of OS detection module and electric power detection module reaches more accurate voltage, by amplifier feed circuit, by voltage
Clamper is on required voltage nominal value.
The firmware update module, to realize that the program of embedded microprocessor chip updates, while by embedded
Firmware program is downloaded to data memory module by microprocessor, according to the different demands of user can carry out firmware all update and when
Sequence logic function updates etc., and chip does not need to weld bring damage back and forth, user using control software carry out firmware program into
Row update or upgrading, it is convenient to provide the expansion of subsequent system function and performance, can be on Speeding up development period and shortening product
The application demand in city.
The driving capability detection module, comprising external DAC, outside ADC, OP operational amplifier, programmable resistance and
The composition such as electronic switch, the voltage data that embedded microprocessor is converted needed for being written to by the SPI interface of external DAC,
Voltage signal amount is converted out, by OP operational amplifier, the I/O port that electronic switch is linked into chip under test is controlled, carries out height
The I/O port of chip under test is set as exporting by level corresponding IOH/IOL current detecting when high-level output current IOH is tested
1, then voltage output is adjusted to 0.9VDD, and the I/O port output electric current of chip under test is IOH；Low-level output current IOL
When test, the I/O port of chip under test is set as output 0, then voltage output is adjusted to 0.1VDD, the I/O port of chip under test
On electric current be IOL.
Electric power detection module includes external DAC, outside ADC, OP operational amplifier, programmable resistance and electronic switch
Deng composition, the control instruction after system electrification according to host computer opens external ADC/DAC into electric power detection module, according to survey
The demand for trying variable, carries out different measurement processing, such as VIL/VIH, VOL/VOH, power consumption and electric leakage parameter are detected,
In, VOL/VOH test is the high-low voltage value of the I/O pin output level of detection DUT and the height that embedded microprocessor is got
Low-level data；VIL/VIH is the high-low voltage value for detecting the I/O pin incoming level of DUT, and voltage value at this time can be by embedding
Enter microsever and controls external DAC realization；Electric leakage is to configure the I/O pin of tested DUT to input disconnection pull-up, and then IO is managed
Foot is separately added into high voltage and low-voltage, tests the electric current of pin at this time, and the excessive chip characteristics that will lead to of leakage current change,
The leakage current of usual chip is in 100nA or so；Power consumption is the power consumption for measuring DUT when disparate modules are opened.
Crash handling module, to realize to upper and lower computer transmitting-receiving instruction and data processing, communication interface crash handling,
Firmware update crash handling, extension instrument equipment failure processing and electric power detection item (such as VIL/VIH, VOL/VOH, power consumption and leakage
The parameters such as electricity are detected) crash handling etc., realize the crash handling of the events such as all test index items, each functional module exists
Treatment mechanism, the verification scheme of data of program operation process, corrupt data processing, data re-transmission and timeout treatment etc..Failure
Whether the electrical characteristic for the series of tests item that processing module mainly carries out between completion embedded microprocessor and chip under test
Meet design requirement, to judge its expired entry, and then carries out tentative reparation and crash handling.
Multinomial electricity electrical specifications are integrated in set of system by the system carries out detection and fail-ure criterion, includes chip sheet
Body physical electrical connection performance, greatly improves working efficiency, and is analyzed and indicated according to relevant issues；Entire detection and mistake
Effect analytic process carries out automatically, high degree of automation.
A kind of electric power detection and fail-ure criterion method, it is characterised in that this method comprises the following steps:
101, system (electric power detection and fail-ure criterion system) powers on, and is initialized；
The initialization refers to system module self-test, clock system setting, I/O port, Peripheral Interface, instrument and meter control
The module initializations such as system, external ADC/DAC, the module initializations such as DUT supply voltage and burning voltage are then completed communication and are held
Hand carries out the self-test of system detection module, if it is confirmed that fail self-test, equipment fault prompt, system exit, user replaces module；
Otherwise the order to be received such as slave computer.
102, it checks profile information, if not checking configuration file, client is prompted to be input to specified file
Designated position is just continued to execute until checking configuration file.
The profile information, comprising storage test hex, chip configuration file concordance list, chip failure data information,
The information such as pin and module input resistance, electrical characteristic range information, chip model, identification information and test macro version number.
Further comprise having in 102 step:
1021, it then waits for user and sends control instruction, selection enters firmware update mode；
1022, pre-read firmware program to be updated first after completing firmware program pre-read, notifies system, prepare into
Row firmware update, system call firmware update program；
1023, chip enters burning mode, starts the firmware program information of reading system, and is saved, system judgement
Whether firmware program has been programmed, if burning firmware program, compares and judge whether currently used firmware program is most
New version is then not required to update firmware program if it is latest edition；If not latest edition program and more new procedures are needed,
Firmware program is then updated, after the completion of update, system re-powers and self-test.
103, into user mode, start waiting user and input order, system carries out command analysis, initially enter test and
Failure analysis mode；
104, chip enters test and failure analysis mode, system according to the profile information of acquisition, then start into
The burning voltage and supply voltage of row DUT configures；
The burning voltage for carrying out DUT and supply voltage configuration, first reading configuration file obtain chip supply voltage
And burning information of voltage, energy supply control module is then called, configures chip supply voltage and burning voltage according to configuration information, then
Call voltage self calibration module make output voltage stabilization, at this time open channel selection switch selection supply voltage, burning voltage,
Clock control pin and data communicaion pins read ROM data and save so that chip enters burning mode.
105, judge chip type, if fruit chip is not sky piece and ROM is OTP type, prompts user's burning failure, exit
Test waits user's replacement；If fruit chip is sky piece and ROM is that OTP or FLASH type or chip are not sky pieces and ROM is
FLASH type, then hex is tested in burning.
106, burning completion chip enters user mode, sends configuration file to system, number is written in configuration file by it
According to memory module, OS detection is then carried out, to determine that chip Electric connection characteristic is normal, then user's selection is tested automatically
Or individual event test starts to execute automatic test if user selects to enter automatic test, otherwise executes individual event test.
Further, the automatic test includes:
1061, system reads configuration file, the operating voltage and high-low temperature chamber initial temperature tested needed for setting chip, control
Electronic switch processed switches to the I/O port for needing to detect, and detects into driving capability detection module, calls voltage self calibration module,
Whether detection is output to DUT voltage respectively in 0.1VDD/0.9VDD, if do not reached, adjusts in stipulated number, beyond limit
Determine number, record failure number carries out crash handling, performs the next step；Otherwise, start driving capability detection module, system control
Programmable resistance processed stabilizes the output voltage value in 0.1VDD/0.9VDD, calls electric power detection module detection I/O port output electricity
Pressure calculates IOL/IOH output electric current according to output voltage and current resistance, according to configuration information, inquire I/O port whether be
Leak electricity pin, if it is not, performing the next step；If it is electric leakage pin, then DAC output measurement of correlation voltage is controlled, is calculated
Leakage current simultaneously records, and whether feedback test data, driving capability detection module detects completion, if not detecting completion,
Continue to execute this step；
1062, driving capability detection module detection is completed, and into power consumption test, system sends control instruction, DUT to DUT
According to test module needed for command adapted thereto sequence starting, profile information is obtained, includes the letter such as design objective, input resistance
Breath calls electric power detection module to obtain the supply voltage of chip, calculates module work according to voltage value and input resistance information
Electric current then calculates module dissipation, then judges whether to complete power consumption test, if it is not complete, continuing to execute this step；
1063, power consumption test is completed, and into VOL/VOH detection module, calls electric power detection module, it is defeated that system controls DUT
Low and high level VOH/VOL is to electric power detection module input terminal out, and system reads the digital quantity that electric power detection module is converted out, through counting
Calculation obtains corresponding simulation input quantity, and test data under conditions of being less than regulation detection number, executes sheet not in scope of design
Step then executes crash handling, record failure number beyond stipulated number；Test data is in scope of design, sequence switching inspection
Test tube foot judges whether that detection is completed, does not detect completion, then continue to execute this step；
1064, VOL/VOH detection is completed, and is detected into VIL/VIH, is opened the DAC output unit of electric power detection module, is adjusted
With voltage self calibration module stability output voltage amount, the I/O port of system configuration DUT is input pin, adjusts the output to DUT pipe
The voltage of foot, according to the DUT register data of detection, the voltage that linearly increasing or reduction is input on the I/O port of DUT, directly
Change to register data is reached to required numerical value, reads electric power detection module, the voltage value obtained at this time is chip
VIL/VIH numerical value, then judge VIL/VIH detect whether detection complete, if detection do not complete, continue to execute this step
Suddenly；Otherwise, the data information that will acquire shows that the index under Current Temperatures and voltage conditions is drawn, and includes design value and measured value
Image then judges whether to complete the test of full voltage total temperature, does not complete, then execute from 1061 sequence of steps；If test
It completes, terminates a wheel test process, it includes design value and measured value figure that the index drawn under Current Temperatures and voltage conditions, which is drawn,
Picture then carries out next round test, waits user input instruction.
Further, this method further includes individual event test, specifically:
107, into individual event test pattern, system controls DUT burning voltage and supply voltage, so that DUT enters user's mould
Formula tests instruction according to the individual event that user sends, and system enters dependence test module, System self-test, inside initialization test item
Each module；
108, system call interception ADC/DAC input and output electric power detection loop controls programmable resistance after output electricity is stablized
Device module and channel selecting form corresponding test circuit, collect test data, corresponding electricity data is calculated, with design objective
Compare whether in design allowed band, not in the range of design objective allows, judge to fail, carries out crash handling and record
Failure number, performs the next step；In the range of design objective allows, control channel selecting sequence change detection port, record
Current data simultaneously saves；
109, judge whether to complete individual event detection, do not complete, then carry out previous step step；If detection is completed, feedback
Test data simultaneously saves, and control software shows that the index measured value image under the conditions of current voltage is drawn, then according to confidence
Breath adjustment test voltage then judges whether to complete full voltage test, if it is not, executing from previous step sequence of steps；Such as
Fruit completes full voltage test, terminates a wheel test process, carries out next round test, wait user input instruction.
The present invention is exactly a process of the test and failure detection cyclic query working condition to chip electricity index,
Continuous test and judgement, the parsing of order, it is therefore an objective to individual event is tested, automatically test, electricity failure detection, leakage tests,
The characteristics of OS detection, device failure alert, voltage lockout, data compare, information alert, firmware update combines, automatic to realize
The test of change and fail-ure criterion system and method.
The present invention utilizes electric power detection and FAILURE ANALYSIS TECHNOLOGY, carries out test to multinomial electricity performance indicator and repairs with tentative
It is multiple, realize the test of chip and the integrated control mode of burning, while preventing to chip using online burning and on-line checking
It causes to damage, saves the time of tester and designer debugging and orientation problem；Also introduce chip total temperature full voltage
Test mode and voltage can greatly reduce the testing time from lock-in techniques, improve test accuracy, and reduction is led because of contact problems
The data inaccuracy of cause, equipment is easy to use and easy to operate, greatly improves the testing efficiency of development phase.
Detailed description of the invention
Fig. 1 is the system architecture diagram that the present invention is implemented.
Fig. 2 is the hardware structural diagram that the present invention is implemented.
Fig. 3 is the control flow chart of the implemented command process module of the present invention.
Fig. 4 is the control flow chart of the implemented OS detection module of the present invention.
Fig. 5 is the control flow chart of the implemented voltage self calibration module of the present invention.
Fig. 6 is the control flow chart of the implemented driving capability detection module of the present invention.
Fig. 7 is the control flow chart of the implemented electric power detection module of the present invention.
Fig. 8 is the control flow chart of the implemented crash handling module of the present invention.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to the accompanying drawings and embodiments, right
The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and
It is not used in the restriction present invention.
Ginseng as shown in FIGS. 1 and 2, the electric power detection and fail-ure criterion system of chip are realized for the present invention, the system is to will be multinomial
Electricity electrical specifications, which are integrated in set of system, carries out detection and fail-ure criterion, includes chip physical electrical connection performance itself,
Working efficiency is greatly improved, and is analyzed and is indicated according to relevant issues.Wherein system composition is divided into command process module, number
Mould is detected according to memory module, OS detection module, energy supply control module, voltage self calibration module, firmware update module, driving capability
Block, electric power detection module, crash handling module, above-mentioned module are integrated in embedded microprocessor, wherein are embedded in the place that declines
Reason device and PC are communicated by data transmission interface.
Wherein, command process module, to establish upper and lower computer connection and receive and dispatch upper and lower computer part control instruction and
Data, the command process module call each functional module to be handled according to related command, to meet the setting of user's different modes
Demand, command process module include connection control, handshake process, instruction check, Error disposal, time-out detect, scheme control
And the relevant operations such as information transmit-receive, real-time control may be implemented by command process module, to meet user's different demands, return
Return operating result.
Its process flow is as shown in figure 3, specific steps are as follows:
101, initialization directive processing module；
102, start host computer, upper computer and lower computer is shaken hands；
103, enter command reception state after shaking hands successfully, receive instruction；
104, after the completion of receiving instruction, data check is calculated, and compare；
105, judge whether frame format meets the requirements, be, carry out in next step, otherwise doing crash handling；
106, instruction and data is extracted, and is saved；
107, correlation function function is called, is terminated.
Data memory module, to store test hex, chip configuration file concordance list, chip failure data information, pin
And the relevant configurations text such as module input resistance, electrical characteristic range information, chip model, identification information and test macro version number
Part information.System receives the data storage command of transmission, starts initialization data memory module, and prepares to receive hex file,
After the file informations such as feedback configuration file and test hex, starts to receive data and store data into data memory module, simultaneously
Feedback data transmits information, and initialization data memory module obtains data storage request information, and by requested data information
Data memory module is stored, while feedback data transmission information is to prompt.In system work, data memory module is also to survey
Test data during examination is recorded, in case subsequent examination.Data memory module has internal storage and external storage
Module, external memory module are divided into file index area and data field again.Store the essential information of chip, such as core in file index area
Piece model, size of data, storage position, the test memory address informations such as the address area hex and other data informations；It uses data field
The data of address shown in file index area are stored, wherein including test hex data and test data etc..
OS detection module, to detect chip under test whether place it is correct and contact it is whether good, do not place it is correct or
Poor contact will be prompted to user and reappose, to ensure the validity of test data；When carrying out OS detection, channel is needed to select
Switch selection is selected, by the interface of OS detection module (since OS detection module is integrated in embedded microprocessor, at this point, directly
By the detection interface of embedded microprocessor) be connected to chip under test power supply, and I/O port, the I/O port of chip under test
Classify according to odd even, set DUT voltage be low level, be then turned on electric power detection and set respectively (- 500uA~-100uA) and
The electric current of (100uA~500uA) is input to chip under test, and electric power detection module detects voltage at this time, if voltage range absolute value
In (0.2V~1.2V), then it is assumed that chip OS characteristic is good.
As shown in figure 4, its specific control flow are as follows:
201, OS detection module is initialized；
202, all pin matter embedded microprocessor being connected with DUT are low；
203, judge whether chip is inserted into, otherwise execute previous step, be to continue in next step；
204, electric power detection module is called to adjust programmable resistance；
205, so that electric power detection module is exported -100 μ A electric currents, and measure voltage；
206, whether in the normal range to judge voltage, be to illustrate that pin connection is good, otherwise illustrate that pin connection is special
Property failure, record corresponding number of pins, carry out fail-ure criterion；
207, tested order of the pin is connected to electrical measurement module, completes all IO tests, is returned if without completing
205 steps；
208, terminate.
Energy supply control module needs to complete the functions such as control and the DUT power supply control of DUT burning voltage, the control of burning voltage
It is energy supply control module according to the specific voltage of the programmable digital analog converter setting of chip id operation, is realized by control instruction
To different ID type chip burning power voltage supplies, then burning voltage is precisely controlled by feedback OS detection module realization；
DUT power supply control be export different type ID chip supply voltage, by channel selecting realize in multiple chips which
The control of a chip power supply or power down, as a self adaptive control mode；The side that energy supply control module is run according to system
The different types of ID that formula and client use determines which chip enters burning mode and setting power supply electricity in special time period
The effective means of pressure, by the coordinate operation to burning power supply and power supply, to ensure to the differentiation that needs to detect and fail
The effective control of chip operation mode.
Voltage self calibration module, it is main realize can to energy supply control module, OS detection module and electric power detection module from
The function of adapting to calibration can guarantee that output voltage is more accurate and stablizes, and have the clamping action of voltage, so that output electricity
Press it is more accurate, embedded microprocessor control voltage self calibration inside modules analog-to-digital conversion device acquisition energy supply control module,
The output voltage amount of OS detection module and electric power detection module etc., and by its voltage compared with normal voltage amount, it adjusts in real time
The input quantity of energy supply control module, OS detection module and electric power detection module reaches more accurate voltage, anti-by amplifier
Current feed circuit clamps the voltage on required voltage nominal value.
As shown in figure 5, its specific control flow are as follows:
301, starting and initialization voltage self calibration module；
302, determine whether that voltage detecting instructs；Nothing, then time-out exits, and has and then enters in next step；
303, input voltage amount is detected；
304, the actual value of input voltage amount and standard value are compared；
305, the actual value of voltage is judged whether in scope of design, is to continue in next step, otherwise further judgement
It whether is more than otherwise number more than crash handling is then carried out adjusts output voltage, return step 303；
306, Self-tuning Information is stored, and is fed back.
Firmware update module, to realize that the program of embedded microprocessor chip updates, while by being embedded in the place that declines
It manages device and firmware program is downloaded into data memory module, can carrying out firmware according to the different demands of user, all update and timing are patrolled
Function renewal etc. is collected, chip does not need to weld bring damage back and forth, and user carries out firmware program progress more using control software
Newly or upgrade, it is convenient to provide the expansion of subsequent system function and performance, can Speeding up development period and shortening launch
Application demand, firmware update module can be achieved by the prior art, and details are not described herein.
Driving capability detection module, mainly comprising external DAC, outside ADC, OP operational amplifier, programmable resistance and
The composition such as electronic switch, the voltage data that embedded microprocessor is converted needed for being written to by the SPI interface of external DAC,
Voltage signal amount is converted out, by OP operational amplifier, the I/O port that electronic switch is linked into chip under test is controlled, carries out height
The I/O port of chip under test is set as exporting by level corresponding IOH/IOL current detecting when high-level output current IOH is tested
1, then voltage output is adjusted to 0.9VDD, and the I/O port output electric current of chip under test is IOH；Low-level output current IOL
When test, the I/O port of chip under test is set as output 0, then voltage output is adjusted to 0.1VDD, the I/O port of chip under test
On electric current be IOL.
As shown in fig. 6, its specific control flow are as follows:
401, start driving capability detection module, initialize external DAC；
402, determine whether to carry out driving capability detection, otherwise time-out exits, and is, carries out in next step；
403, electric power detection module is called to detect output voltage amount；
404, the actual value of output voltage amount and standard value are compared；
405, the actual value of output voltage amount is judged whether in scope of design, is to continue in next step, otherwise further
Judge whether to be more than number, more than crash handling is then carried out, otherwise adjusts DAC output voltage data, return step 403；
406, Self-tuning Information is stored, and is fed back.
Electric power detection module includes external DAC, outside ADC, OP operational amplifier, programmable resistance and electronic switch
Deng composition, the control instruction after system electrification according to host computer opens external ADC/DAC into electric power detection module, according to survey
The demand for trying variable, carries out different measurement processing, such as VIL/VIH, VOL/VOH, power consumption and electric leakage parameter are detected,
In, VOL/VOH test is the high-low voltage value of the I/O pin output level of detection DUT and the height that embedded microprocessor is got
Low-level data；VIL/VIH is the high-low voltage value for detecting the I/O pin incoming level of DUT, and voltage value at this time can be by embedding
Enter microsever and controls external DAC realization；Electric leakage is to configure the I/O pin of tested DUT to input disconnection pull-up, and then IO is managed
Foot is separately added into high voltage and low-voltage, tests the electric current of pin at this time, and the excessive chip characteristics that will lead to of leakage current change,
The leakage current of usual chip is in 100nA or so；Power consumption is the power consumption for measuring DUT when disparate modules are opened, for low-power consumption
It is extremely important using this index.
As shown in fig. 7, the specific control flow of electric power detection are as follows:
501, start electric power detection module, initialize external DAC, ADC and I/O port；
502, electric power detection request is determined whether there is, otherwise time-out exits, and is, carries out in next step；
503, detection solicited message is obtained according to test item；
504, it configures external DAC and exports given voltage amount；
505, ADC detection is called to obtain amplifier end actual output voltage amount；
506, the actual value of output voltage amount and nominal value are compared；
507, the actual value of output voltage amount is judged whether in scope of design, is to continue in next step, otherwise further
Judge whether to be more than number, more than crash handling is then carried out, terminate；Otherwise crash handling, feedback information and return step are carried out
504；
508, control electronic switch is ready for testing next time；
509, sequential control respective channel input and output electricity；
510, judge whether to complete all pin detections, otherwise return step 504, are to continue in next step；
511, the detection for judging whether to complete required project is in next step, otherwise obtain index item instruction code, return
Return step 503；
512, feedback information, and data are saved, terminate.
Crash handling module, the main instruction comprising being received and dispatched to upper and lower computer and data processing, communication interface crash handling,
Firmware update crash handling, extension instrument equipment failure processing and electric power detection item (such as VIL/VIH, VOL/VOH, power consumption and leakage
The parameters such as electricity are detected) crash handling etc., realize the crash handling of the events such as all test index items, each functional module exists
Treatment mechanism, the verification scheme of data of program operation process, corrupt data processing, data re-transmission and timeout treatment etc..Mainly
It is to complete the electrical characteristic of the series of tests item carried out between embedded microprocessor and chip under test whether to meet design requirement,
To judge its expired entry, and then carry out tentative reparation and crash handling.Failure detection uses microprocessor detection plus external mould
Several and digital-to-analogue detection module is realized, after confirmation problem and then is carried out batch failure statistics and record, is finally being controlled failure special envoy
Software on Drawing image processed is shown, and is prompted.
Its specific control flow is as shown in figure 8, including several aspects once:
For receiving command frame failure, mistake number is saved, error type information is sent and gives the end PC (control software)；Request
Command frame is retransmitted, receives information frame again；If communication failure is greater than 3 times, the end PC transmitting data frame again is notified.
It fails for interface communication, sends error type information and give the end PC, re-establish connection, shake hands, and prompt user
It shakes hands again；If communication failure is greater than 3 times, sends USB initialization failure or enumerate failure or failure information of shaking hands
The end PC is given, the end PC shows error message, plugs communication interface again, and prompt to re-establish connection.
It fails for meter communication, sends error type information and give the end PC, reinitialize sensor junctor highway interface；
If communication failure is greater than 3 times, sends failure information of shaking hands and give the end PC, and prompt to check.
It fails for firmware update, reinitializes communication interface, reacquire firmware update data；If communication failure
Greater than 3 times, then transmission interface initialization failure or register configuration failure information give the end PC, and prompt to check.
It fails for electricity inspection, disconnects channel, reinitialize ADC/DAC, and carry out module self-test；Then judge certainly
It examines successfully and is greater than 3 times, failure feedback is then carried out greater than 3 times, prompt replacement module.
The method that present aspect is realized, specifically comprises the following steps:
601, system electrification, system module self-test, clock system setting, I/O port, Peripheral Interface, instrument and meter control,
The module initializations such as external ADC/DAC, the module initializations such as DUT supply voltage and burning voltage, then complete communication handshake, into
Row system detection module self-test, if it is confirmed that fail self-test, equipment fault prompt, system exit, user replaces module；Otherwise under
The orders to be received such as position machine.
602, it checks there is no clients configuring file information, includes storage test hex, chip configuration file concordance list, chip
Fail data information, pin and module input resistance, electrical characteristic range information, chip model, identification information and test macro
The information such as version number.If not checking configuration file, prompt client that specified file is input to designated position, until checking
It is just continued to execute to configuration file.It then waiting for user and sends control instruction, selection enters firmware update mode or detection pattern,
If user's selection enters firmware update mode, start execution 603,604,605,606, otherwise executes 607.
603, into firmware update mode, first pre-read firmware program to be updated, after completing firmware program pre-read,
Notice system, is ready for firmware update, and system calls firmware update program.
604, chip enters burning mode, starts the firmware program information of reading system, and is sent to the preservation of the end PC,
System judges whether to be programmed firmware program, if burning firmware program, obtains latest firmware program, comparison judgement is current
Whether the firmware program used is latest edition, if it is latest edition, then is not required to update firmware program；If not latest edition
This program and needs more new procedures, then update firmware program, and after the completion of update, system closes burning voltage and supply voltage, is
System re-powers and self-test, executes 606 steps.
605, system is not programmed firmware program, obtains latest firmware program, if you do not need to carrying out version updating, is
System re-powers and self-test, into user mode；If necessary to carry out version updating, then update firmware program, system again on
Electricity and self-test, then system starts waiting user and inputs order, and system carries out command analysis, initially enters test and failure analysis
Mode.
606, chip enters test and failure analysis mode, system according to the profile information of acquisition, then start into
The burning voltage and supply voltage of row DUT configures, and system reads configuration file and obtains chip supply voltage and burning information of voltage,
Energy supply control module is called, chip supply voltage and burning voltage is configured according to configuration information, voltage self calibration module is called to make
Output voltage stabilization is obtained, it is logical to open channel selection switch selection supply voltage, burning voltage, clock control pin and data at this time
Fuse tube foot reads ROM data and saves so that chip enters burning mode.
607, such as fruit chip is not sky piece and ROM is OTP type, prompts user's burning failure, exits test, waits user
Replacement；If fruit chip is sky piece and ROM is that OTP or FLASH type or chip are not sky pieces and ROM is FLASH type, then
Hex is tested in burning.Burning completes chip and enters user mode, and the end PC sends configuration file to system, write configuration file by it
Enter memory module, then carry out OS detection, to determine that chip Electric connection characteristic is normal, then user's selection is tested automatically
Or individual event test starts execution 608,609,610,611 if user selects to enter automatic test.Otherwise it executes
612 and etc..
608, system reads configuration file, the operating voltage and high-low temperature chamber initial temperature tested needed for setting chip, control
Electronic switch processed switches to the I/O port for needing to detect, and detects into driving capability detection module, calls voltage self calibration module,
Whether detection is output to DUT voltage respectively in 0.1VDD/0.9VDD, if do not reached, adjusts in stipulated number, beyond limit
Determine number, record failure number carries out crash handling, executes 609；Otherwise, start driving capability detection module, system control can
Programming resistor stabilizes the output voltage value in 0.1VDD/0.9VDD, electric power detection module is called to detect I/O port output voltage,
According to output voltage and current resistance, IOL/IOH output electric current is calculated according to configuration information and inquires whether I/O port is leakage
Fulgurite foot, if it is not, executing 609；If it is electric leakage pin, then DAC output measurement of correlation voltage is controlled, electric leakage electricity is calculated
It flows and records, whether feedback test data, driving capability detection module detects completion, if not detecting completion, executes 608.
609, driving capability detection module detection is completed, and into power consumption test, system sends control instruction, DUT root to DUT
According to test module needed for command adapted thereto sequence starting, profile information is obtained, includes the letter such as design objective, input resistance
Breath calls electric power detection module to obtain the supply voltage of chip, calculates module work according to voltage value and input resistance information
Electric current then calculates module dissipation, then judges whether to complete power consumption test, if it is not complete, executing 609.
610, power consumption test is completed, and into VOL/VOH detection module, calls electric power detection module, system controls DUT output
The digital quantity that low and high level VOH/VOL is converted out to electric power detection module input terminal, system reading electric power detection module, is computed
Obtaining corresponding simulation input quantity, test data under conditions of being less than regulation detection number, executes 610 not in scope of design,
Crash handling, record failure number are then executed beyond stipulated number；Test data is in scope of design, sequence change detection pipe
Foot judges whether that detection is completed, does not detect completion, then execute 610.
611, VOL/VOH detection is completed, and is detected into VIL/VIH, is opened the DAC output unit of electric power detection module, is adjusted
With voltage self calibration module stability output voltage amount, the I/O port of system configuration DUT is input pin, adjusts the output to DUT pipe
The voltage of foot, according to the DUT register data of detection, the voltage that linearly increasing or reduction is input on the I/O port of DUT, directly
Change to register data is reached to required numerical value, reads electric power detection module, the voltage value obtained at this time is chip
VIL/VIH numerical value, then judge VIL/VIH detect whether detection complete, if detection do not complete, execute 611；Otherwise,
The data information that will acquire shows that the index under Current Temperatures and voltage conditions is drawn, and includes design value and measured value image, after
And judge whether to complete the test of full voltage total temperature, it does not complete, is then executed from 608 sequences；If test is completed, terminate a wheel
Test process, the index drawn under Current Temperatures and voltage conditions draw, include design value and measured value image, then carry out down
One wheel test, waits user input instruction.
612, into individual event test pattern, system controls DUT burning voltage and supply voltage, so that DUT enters user's mould
Formula tests instruction according to the individual event that user sends, and system enters dependence test module, System self-test, inside initialization test item
Each module.
613, system call interception ADC/DAC input and output electric power detection loop controls programmable resistance after output electricity is stablized
Device module and channel selecting form corresponding test circuit, collect test data, corresponding electricity data is calculated, with design objective
Compare whether in design allowed band, not in the range of design objective allows, judge to fail, carries out crash handling and record
Failure number, executes 614；In the range of design objective allows, control channel selecting sequence change detection port, record is currently
Data simultaneously save.
614, judge whether to complete individual event detection, do not complete, then carry out 613 steps；If detection is completed, feedback test
Data simultaneously save, and show that the index measured value image under the conditions of current voltage is drawn, then adjust test electricity according to configuration information
Pressure then judges whether to complete full voltage test, if it is not, executing from 613 sequence of steps；If completing full voltage to survey
Examination terminates a wheel test process, carries out next round test, wait user input instruction.
The detection and fail-ure criterion that the present invention is realized, are looked into the test of chip electricity index and the circulation of failure detection
Ask a process of working condition, continuous test and judgement, the parsing of order, it is therefore an objective to individual event be tested, test, electricity automatically
Amount failure detection, leakage tests, OS detection, device failure alert, voltage lockout, data compare, information alert, firmware update and
It controls software feature to combine, realizes test and the fail-ure criterion of automation.
For this purpose, being responsible under control, data transmit-receive and each temperature spot of electric power detection and failure analysis by controlling software
Image Rendering, the major function for controlling software are described as the acquisition of (1) profile information: by configuration file by chip type
Acquisition of information is simultaneously shown；(2) individually index item test: control software directly controls veneer and carries out independent index test to DUT, this
The test of thing is the test under room temperature or fixed temperature, is determined depending on environment temperature locating for tested DUT；(3) state is aobvious
Show: the control software moment tracks and obtains single-board testing platform to the test mode of DUT, and the shape that current state equipment is run
State information is shown, so that user carries out understanding test progress and the problem in real time；(4) it image display area: is selected according to user
The automatic test selection selected, under automatic test pattern, test macro is to all index sequential automations in index viewing area
Test, this thing prompt the user whether carry out total temperature test, if tested DUT is placed into high-low temperature chamber by user, select into
Row total temperature can carry out the scanning of performance total temperature to test index and show total temperature performance curve when testing, otherwise, test system
System will not control high-low temperature chamber, and then the performance of the index item under sequential testing Current Temperatures, and show index item performance curve.
The chip detection and failure analysis device that the present invention is realized are to will test the device integrated with fail-ure criterion,
Using 32 embedded microprocessors, program and data space are big, peripheral interface is abundant, processing capacity is strong and high communication speed
Rate etc. realizes voltage linear scanning, firmware in practical application requests such as system update, System self-test；It is adaptive to include multivoltage
Control module passes through to adapt to the burning chip voltage and chip supply voltage demand of different electrical power system type and selects tested core
Piece carries out corresponding operating to chip under test, to meet actual needs；Using integrated design philosophy, it is more to solve chip
Index failure detection problem, facilitates client to use, easy to carry；The development mode taking multiplex roles and depositing, using serial ports to ARM
Firmware is carried out in system update, USB carries out the transmission of instruction and data to upper and lower computer；System is using modularization and administrative levels
Software and hardware architecture is carried out modularized design by design concept, facilitates subsequent maintenance and upgrading exploitation；Due to using integrated
Detection and analysis means greatly reduce development cost and improve the versatility of system；Spare interface can with plug-in instrument and meter,
Meets high-resolution and on electric power detection and FAILURE ANALYSIS TECHNOLOGY the needs of；Introduce the design side of linearity test and failure analysis
Method, carries out accurate signal detection by high-precision adc/DAC and semaphore supplies, and multiple voltage output form solves more
Scape business diagnosis demand introduces automatic measurement and analysis method, realizes to chip automation control, has many indexes electricity
Abatement detecting method and adaptive voltage linear scanning mode carry out automatic detection and fail-ure criterion mechanism, solve personnel and repeat
Labour and inefficiency problem, whole process reduce people and participate in, and work efficiency is high.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention
Made any modifications, equivalent replacements, and improvements etc., should all be included in the protection scope of the present invention within mind and principle.
Claims (10)
1. a kind of electric power detection and fail-ure criterion system, it is characterised in that the system includes command process module, data storage
Module, OS detection module, energy supply control module, voltage self calibration module, firmware update module, driving capability detection module, electricity
Detection module, crash handling module are measured, above-mentioned module is integrated in embedded microprocessor, wherein
Described instruction processing module should to establish the connection of upper and lower computer and receive and dispatch the control instruction and data of upper and lower computer
Command process module calls each functional module to be handled according to related command；
The data memory module, to store test hex, chip configuration file concordance list, chip failure data information, pin
And module input resistance, electrical characteristic range information, chip model, identification information and test macro version number associated profile
Information；
OS detection module does not place correct or contact to detect whether chip under test is placed correctly and whether contact is good
It is bad, it will be prompted to user and reappose, to ensure the validity of test data；
The energy supply control module, to complete the control and DUT power supply control function of DUT burning voltage；
The voltage self calibration module, to realize can to energy supply control module, OS detection module and electric power detection module from
The function of adapting to calibration can guarantee that output voltage is more accurate and stablizes, and have the clamping action of voltage, so that output electricity
It presses more accurate；
The firmware update module, to realize that the program of embedded microprocessor chip updates, while by being embedded in the place that declines
It manages device and firmware program is downloaded into data memory module, can carrying out firmware according to the different demands of user, all update and timing are patrolled
Collect function renewal；
The driving capability detection module, the voltage data that embedded microprocessor is converted needed for being written to, converts out voltage
Semaphore；
The electric power detection module, according to the control instruction of host computer after system electrification, into electric power detection module, according to test
The demand of variable carries out different measurement processing；
Crash handling module, to realize instruction and data processing, communication interface crash handling, firmware to upper and lower computer transmitting-receiving
Crash handling, extension instrument equipment failure processing and electric power detection item crash handling are updated, realizes all test index item events
Crash handling, each functional module is in the treatment mechanism of program operation process, the verification scheme of data, corrupt data processing, number
According to re-transmission and timeout treatment.
2. electric power detection as described in claim 1 and fail-ure criterion system, it is characterised in that described instruction processing module includes
Control, handshake process, instruction check, Error disposal, time-out detection, scheme control and information transmit-receive relevant operation are connected, is passed through
Real-time control may be implemented in command process module.
3. electric power detection as described in claim 1 and fail-ure criterion system, it is characterised in that when carrying out OS detection, need to lead to
Road selection switch selection, by the port of OS detection module be connected to chip under test power supply, and I/O port, chip under test
I/O port is classified according to odd even, set DUT voltage be low level, be then turned on electric power detection and set respectively -500uA~-100uA and
The electric current of 100uA~500uA is input to chip under test, and electric power detection module detects voltage at this time, if voltage range absolute value exists
In 0.2V~1.2V, then it is assumed that chip OS characteristic is good.
4. electric power detection as described in claim 1 and fail-ure criterion system, it is characterised in that the driving capability detection module
Comprising external DAC, outside ADC, OP operational amplifier, programmable resistance and electronic switch, embedded microprocessor passes through outer
The voltage data that the SPI interface of portion DAC is converted needed for being written to, converts out voltage signal amount, by OP operational amplifier, control
Electronic switch processed is linked into the I/O port of chip under test, carries out the corresponding IOH/IOL current detecting of low and high level, high level output
When electric current IOH is tested, the I/O port of chip under test is set as output 1, then voltage output is adjusted to 0.9VDD, chip under test
It is IOH that I/O port, which exports electric current,；When low-level output current IOL is tested, the I/O port of chip under test is set as output 0, so
Voltage output is adjusted to 0.1VDD afterwards, and the electric current on the I/O port of chip under test is IOL.
5. electric power detection as described in claim 1 and fail-ure criterion system, it is characterised in that the electric power detection module includes
External DAC, outside ADC, OP operational amplifier, programmable resistance and electronic switch form, according to host computer after system electrification
Control instruction open external ADC/DAC according to the demand of test variable and carry out different measurements into electric power detection module
Processing；Wherein, VOL/VOH test is that the high-low voltage value for detecting the I/O pin output level of DUT and embedded microprocessor obtain
The low and high level data got, VIL/VIH are the high-low voltage value for detecting the I/O pin incoming level of DUT, voltage value at this time
It can be realized by controlling external DAC；Electric leakage is to configure the I/O pin of DUT to input disconnection pull-up, and then I/O pin is separately added into
High voltage and low-voltage test the electric current of pin at this time；Power consumption is the power consumption for measuring DUT when disparate modules are opened.
6. a kind of electric power detection and fail-ure criterion method, it is characterised in that this method comprises the following steps:
101, system electrification is initialized；
102, it checks profile information, if not checking configuration file, prompts client to be input to specified file specified
Position is just continued to execute until checking configuration file；
The profile information includes storage test hex, chip configuration file concordance list, chip failure data information, pin
And module input resistance, electrical characteristic range information, chip model, identification information and test macro version number information；
103, it into user mode, starts waiting user and inputs order, system carries out command analysis, initially enters test and failure
Analytical model；
104, chip enters test and failure analysis mode, and system then starts to carry out DUT according to the profile information of acquisition
Burning voltage and supply voltage configuration；
105, judge chip type, if fruit chip is not sky piece and ROM is OTP type, prompts user's burning failure, exit survey
Examination waits user's replacement；If fruit chip is sky piece and ROM is that OTP or FLASH type or chip are not sky pieces and ROM is
FLASH type, then hex is tested in burning；
106, burning completion chip enters user mode, sends configuration file to system, is deposited configuration file write-in data by it
Module is stored up, OS detection is then carried out, to determine that chip Electric connection characteristic is normal, then user selects to carry out automatic test still
Individual event test starts to execute automatic test if user selects to enter automatic test, otherwise executes individual event test.
7. electric power detection as claimed in claim 6 and fail-ure criterion method, it is characterised in that in 102 steps, further comprise
Have:
1021, it then waits for user and sends control instruction, selection enters firmware update mode；
1022, pre-read firmware program to be updated first after completing firmware program pre-read, notifies system, is ready for solid
Part updates, and system calls firmware update program；
1023, chip enters burning mode, starts the firmware program information of reading system, and is saved, and system judges whether
It is programmed firmware program, if burning firmware program, compares and judge whether currently used firmware program is latest edition
This is then not required to update firmware program if it is latest edition；If not latest edition program and more new procedures are needed, then more
New firmware program, after the completion of update, system re-powers and self-test.
8. electric power detection as claimed in claim 6 and fail-ure criterion method, it is characterised in that in step 104, the carry out DUT
Burning voltage and supply voltage configuration, first reading configuration file obtain chip supply voltage and burning information of voltage, then
Energy supply control module is called, chip supply voltage and burning voltage is configured according to configuration information, recalls voltage self calibration module
So that output voltage stabilization, opens channel selection switch selection supply voltage, burning voltage, clock control pin and data at this time
Pin is communicated, so that chip enters burning mode, ROM data is read and saves.
9. electric power detection as claimed in claim 6 and fail-ure criterion method, it is characterised in that the automatic test includes:
1061, system reads configuration file, the operating voltage and high-low temperature chamber initial temperature tested needed for setting chip, control electricity
Sub switch switches to the I/O port for needing to detect, and detects into driving capability detection module, calls voltage self calibration module, detection
DUT voltage is output to whether respectively in 0.1VDD/0.9VDD；Otherwise, start driving capability detection module, stabilize the output voltage value
In 0.1VDD/0.9VDD, electric power detection module is called to detect I/O port output voltage, according to output voltage and current resistance, meter
It calculates IOL/IOH and exports electric current, according to configuration information, inquire whether I/O port is electric leakage pin, if it is not, executing next
Step；If it is electric leakage pin, then DAC output measurement of correlation voltage is controlled, leakage current is calculated and records, feedback test number
According to whether driving capability detection module detects completion, if not detecting completion, continues to execute this step；
1062, driving capability detection module detection is completed, and into power consumption test, system gives DUT to send control instruction, DUT according to
Test module needed for command adapted thereto sequence starting obtains profile information, includes design objective, input resistance information, adjusts
Electricity consumption detection module obtains the supply voltage of chip, calculates module operating current according to voltage value and input resistance information,
Then module dissipation is calculated, then judges whether to complete power consumption test, if it is not complete, continuing to execute this step；
1063, power consumption test is completed, and into VOL/VOH detection module, calls electric power detection module, it is high that system controls DUT output
Low level VOH/VOL reads the digital quantity that electric power detection module is converted out, is computed and obtains phase to electric power detection module input terminal
Simulation input amount is answered, test data does not exist
In scope of design, under conditions of being less than regulation detection number, this step is executed, is then executed at failure beyond stipulated number
Reason；Test data is in scope of design, sequence change detection pin, judges whether that detection is completed, does not detect completion, then continue
Execute this step；
1064, VOL/VOH detection is completed, and is detected into VIL/VIH, and the DAC output unit of electric power detection module is opened, and calls electricity
Self calibration module stability output voltage amount is pressed, the I/O port of system configuration DUT is input pin, adjusts the output to DUT pin
Voltage, according to the DUT register data of detection, the voltage that linearly increasing or reduction is input on the I/O port of DUT, until reaching
Change to register data to required numerical value, reads electric power detection module, the voltage value obtained at this time is chip
VIL/VIH numerical value then judges that VIL/VIH detects whether that detection is completed, if detection is not completed, continues to execute this step；
Then judge whether to complete the test of full voltage total temperature, do not complete, then executed from 1061 sequence of steps；If test is completed,
Terminate a wheel test process.
10. electric power detection as claimed in claim 6 and fail-ure criterion method, it is characterised in that this method further includes that individual event is surveyed
Examination, specifically:
107, into individual event test pattern, system controls DUT burning voltage and supply voltage, so that DUT enters user mode, root
Instruction is tested according to the individual event that user sends, system enters dependence test module, System self-test, each mould in initialization test item inside
Block；
108, system call interception ADC/DAC input and output electric power detection loop controls programmable resistance mould after output electricity is stablized
Block and channel selecting form corresponding test circuit, collect test data, corresponding electricity data is calculated, compared with design objective
Whether in design allowed band, not in the range of design objective allows, judge to fail, carries out crash handling and record failure
Number, performs the next step；In the range of design objective allows, control channel selecting sequence change detection port, record is currently
Data simultaneously save；
109, judge whether to complete individual event detection, do not complete, then carry out previous step step；If detection is completed, feedback test
Data simultaneously save, and control software shows that the index measured value image under the conditions of current voltage is drawn, then according to configuration information tune
Whole test voltage then judges whether to complete full voltage test, if it is not, executing from previous step sequence of steps；If complete
Voltage tester is helped, terminates a wheel test process, carries out next round test, wait user input instruction.
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