CN106941101A - Package substrate and preparation method thereof - Google Patents

Package substrate and preparation method thereof Download PDF

Info

Publication number
CN106941101A
CN106941101A CN201610004607.6A CN201610004607A CN106941101A CN 106941101 A CN106941101 A CN 106941101A CN 201610004607 A CN201610004607 A CN 201610004607A CN 106941101 A CN106941101 A CN 106941101A
Authority
CN
China
Prior art keywords
circuit chip
connecting elements
conductor layer
package substrate
conductive connecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610004607.6A
Other languages
Chinese (zh)
Inventor
胡竹青
许诗滨
刘晋铭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Phoenix pioneer Limited by Share Ltd
Original Assignee
Persistent Strength Or Power Science And Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Persistent Strength Or Power Science And Technology Co Ltd filed Critical Persistent Strength Or Power Science And Technology Co Ltd
Priority to CN201610004607.6A priority Critical patent/CN106941101A/en
Publication of CN106941101A publication Critical patent/CN106941101A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/36Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
    • H01L23/367Cooling facilitated by shape of device
    • H01L23/3672Foil-like cooling fins or heat sinks
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16245Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation
    • H01L2924/1815Shape
    • H01L2924/1816Exposing the passive side of the semiconductor or solid-state body
    • H01L2924/18161Exposing the passive side of the semiconductor or solid-state body of a flip chip

Abstract

The invention discloses a kind of package substrate and preparation method thereof.The package substrate includes:One conductor layer, includes an at least metal routing;One conductive connecting elements, on the conductor layer;One circuit chip, with least one external foot pad, and is arranged on the conductive connecting elements;And a conductive film, coat the conductor layer, the conductive connecting elements and the circuit chip;Wherein, one of them one of them with an at least metal routing of the conductive connecting elements to connect at least one external foot pad.

Description

Package substrate and preparation method thereof
Technical field
The present invention on a kind of package substrate with and preparation method thereof, belong to technical field of semiconductors.
Background technology
Electronic product of new generation not only pursues compact high density, more there is the trend developed towards high power; Therefore, IC (Integrated Circuit, abbreviation IC) technology and the wafer package technology of its rear end also with Progress, to meet the efficiency specification of this electronic product of new generation.Buried in circuit chip embedment package substrate Element Technology, because having the advantages that reduction package substrate product is disturbed by noise and product size reduces, Turn into the Research Emphasis of this area manufacturer in recent years.Prior art is typically first by circuit chip or crystal grain It is embedded in the casting die compound as package substrate main body, then to make leading as package substrate circuit layout Line layer.
However, conductor layer is mostly the fine rule road of narrower width, processing procedure difficulty is high so that when conductor layer occurs During defect in making, the circuit chip or crystal grain related must also be scrapped.Once in addition, circuit chip or Crystal grain is embedded in package substrate, and the electric connection circuit of the circuit chip or crystal grain and external circuit will become It must be difficult to handle, for example, procedure for processing and the labyrinth such as extra laser perforate, dielectric materials layer pressing Electric connection circuit, these can all improve manufacturing cost and reduction product yield.Therefore, it is necessary to develop New package substrate technology, the problem of with to controlling and improving above-mentioned.
The content of the invention
To reach this purpose, the present invention provides a kind of package substrate, and it is included:One conductor layer, comprising at least One metal routing;One conductive connecting elements, on the conductor layer;One circuit chip, outside at least one Pin pad, and be arranged on the conductive connecting elements;And a conductive film, coat the conductor layer, The conductive connecting elements and the circuit chip;Wherein, the conductive connecting elements are at least one external to connect this One of them of one of them of foot pad and an at least metal routing.
In one embodiment, the conductive connecting elements are a columnar metal thing.
In one embodiment, the conductive connecting elements are a solder bump thing.
In one embodiment, the package substrate further includes a fin, and it is arranged on the circuit chip, and Connect the circuit chip.
In one embodiment, the package substrate further includes a metal loading plate, and it is arranged under the conductor layer.
On the other hand, the present invention provides a kind of preparation method of package substrate, and its step is included:One is provided to hold Support plate;A conductor layer No.1 is formed on the loading plate so that the conductor layer No.1 includes at least one first gold medal Belong to cabling;A conductive connecting elements are formed on the conductor layer No.1;Setting one has at least one external foot pad Circuit chip on the conductive connecting elements so that the conductive connecting elements connect at least one external foot pad One of them one of them with least one first metal routing;And one conductive film of formation exists On the circuit chip, and make it that the conductive film fills the space between the circuit chip and the loading plate.
In one embodiment, the conductive connecting elements are one first columnar metal thing.
In one embodiment, the conductive connecting elements are a solder bump thing.
In one embodiment, this method is further included:The conductive film of part is removed, to expose the electricity The upper surface of road chip;And remove the loading plate.
In one embodiment, this method is further included:One fin is set on the circuit chip so that this dissipates Backing connects the upper surface of the circuit chip.
In one embodiment, this method is further included:One second conductor layer is formed on the conductive film, So that second conductor layer includes at least one second metal routing;A conductive posts are formed in second conductor layer On, the conductive posts include at least one second columnar metal thing;And a dielectric materials layer is formed in the mold On compound layer, and make it that the dielectric materials layer coats all this at least one second on the conductive film Metal routing and at least one second columnar metal thing.
Brief description of the drawings
Fig. 1 is the diagrammatic cross-section according to first embodiment of the invention package substrate.
Fig. 2~6 are the profile of each fabrication steps of first embodiment of the invention package substrate.
Fig. 7 A and 7B are the diagrammatic cross-section of the package substrate according to second embodiment of the invention.
Fig. 8~10 are the profile of each fabrication steps according to third embodiment of the invention package substrate.
Description of reference numerals:100th, 200,300-package substrate;110-loading plate;120-the first leads Line layer;121~125-the first metal routing;130th, 131~134-conductive connecting elements;140-circuit is brilliant Piece;141~144-external foot pad;150-conductive film;160-fin;170-the second wire Layer;171~174-the second metal routing;180-conductive posts;181~184-columnar metal thing;190— Dielectric materials layer.
Embodiment
It is further cognitive with understanding to make to have feature, purpose and the function of the present invention, hereby coordinate schema Embodiments of the invention are described in detail as after.In all specifications and diagram, identical element will be used Numbering is with specified same or similar element.
In the explanation of each embodiment, when an element be described be another element " top/on " or " under Side/under ", refer to the situation either directly or indirectly on or below another element, it may include setting Other elements therebetween;So-called " directly " refers to therebetween and is not provided with other intermediary elements." top/ On " or the description of " lower section/under " etc. illustrated on the basis of schema, but also include other possible directions Transformation.So-called " first ", " second " and " the 3rd " to describe different elements, these yuan Element is not restricted because of such meaning diction.For the facility on illustrating and clearly, each element in schema Thickness or size, by exaggerate or omit or outline in the way of represent, and each element size be entirely its Actual size.
Fig. 1 is the diagrammatic cross-section of the package substrate 100 according to first embodiment of the invention.The package substrate 100 include:One conductor layer No.1 120, a conductive connecting elements 130, a circuit chip 140 and a casting Mold compound layer 150.The conductor layer No.1 120 represents the configuration of the package substrate 100, and it is comprising extremely Few one first metal routing;The conductive connecting elements 130 are formed on the conductor layer No.1 120, its quantity Can be more than one;The circuit chip 140 is arranged on the conductive connecting elements 130, and the circuit is brilliant Piece 140 has at least one external foot pad;For convenience of description, example as shown in Figure 1, this One conductor layer 120 have five the first metal routings (numbering is 121~125 from left to right), this be conductively connected list The quantity of member 130 is external with four for four (numbering is 131~134 from left to right), the circuit chips 140 Foot pad (from left to right numbering be 141~144), but its quantity is not limited thereto, and end regards the package substrate 100 Depending on the need for configuration.Each conductive connecting elements 131~134 is to connect the external foot pad such as this One of them of one of them of 141~144 and first metal routing of grade 121~125;For example, the conduction is even Order member 131 connects the external foot pad 141 and first metal routing 121, and the conductive connecting elements 132 connect The external foot pad 142 and first metal routing 122 are connect, the conductive connecting elements 133 connect the external foot pad 143 with first metal routing 123, the conductive connecting elements 134 connect the external foot pad 144 with this first Metal routing 124.In addition, the conductive film 150 then coats the conductor layer No.1 120, the conduction even Order member 130 and the circuit chip 140, it can be used as the envelope beyond the part of the upper surface of circuit chip 140 Fill the outermost protective layer of substrate 100.
The composition material of the conductor layer No.1 120 can be copper (Cu), nickel (Ni), tin (Sn) and ni au (Ni/Au) Combination or alloy, its can plating (Electrolytic plating), sputter (Sputtering coating) or evaporation (Evaporation) formed metal film after, by the patterning process of lithography (Photolithography) come Make, be used as wherein one layer of the circuit layout line layer of the package substrate 100.In the present embodiment, should Conductor layer No.1 120 has five the first metal routings 121~125, as shown in Figure 1.
The circuit chip 140 is an active member.In the present embodiment, the making of the circuit chip 140 can To be to put on semiconductor crystal wafer (wafer) with IC (IC) processing procedure, and crystal grain (die) is cut into, and Connect external foot pad (for example, conductive connecting pin (pin), conductive spacer (pad) or conductive projection (bump)) in advance, And will be embedded to using embedded element technology in the package substrate 100.Thereby, package substrate can effectively be lowered Noise suffered by product disturbs and reduced its finished size, and can be applied to the application processing of portable apparatus Device (Application processor) and power management chip.As shown in figure 1, the circuit chip 140 has four Individual external foot pad 141~144, can self contraposition when it is arranged on the conductive connecting elements 130 (Self-alignment) the external foot pad 141~144 such as this is connected into the grade conductive connecting elements respectively 131~134, and be not necessary to use fine alignment technique.
First led to allow the circuit chip 140 to be connected to this in the case of without using fine alignment technique Line layer 120, the present embodiment makes the conduction for having column structure or projection cube structure on 120 layers of the conductor layer No.1 Connection unit 131~134, for example, copper post (Cu pillar) or solder bump (solder bump) so that the circuit The external foot pad 141~144 of chip 140 simply self can be aligned to the grade conductive connecting elements 131~134, Then it can will effectively reduce the cost of manufacture of package substrate.In the present embodiment, single conductive connecting elements 130 (or, the grade conductive connecting elements 131~134) to connect the external foot pad 141~144 such as this one of them with One of them of first metal routing of grade 121~125.As shown in figure 1, the conductive connecting elements 131 connect The external foot pad 141 and first metal routing 121 are connect, the conductive connecting elements 132 connect the external foot pad 142 with first metal routing 122, the conductive connecting elements 133 connect the external foot pad 143 with this first Metal routing 123, the conductive connecting elements 134 connect the external foot pad 144 and first metal routing 124, So that the circuit chip 140 can be connected to the conductor layer No.1 according to the circuit design of the package substrate 100 120。
The conductive film 150 can be made by the molded technology of packing colloid, for example, compression mold Method (Compression Molding), and the composition material of packing colloid can be phenolic group resin (Novolac-Based Resin), epoxy (Epoxy-Based Resin) or silicone Insulating materials such as (Silicone-Based Resin), but be not limited.The conductive film 150 can be coated The circuit chip 140, and fill the space between the circuit chip 140 and the conductor layer No.1 120 so that The electronic component or product of the package substrate 100 formation tool robust structure.In addition, the conductive film 150 The part beyond the upper surface of circuit chip 140 can act also as the outside protective layer of the package substrate 100, To protect the package substrate 100 to be protected from the possibility from external environment condition or successive process (for example, welding) Injury.
In the present embodiment, the package substrate 100 can be used as the crystal covering type applied to mold interconnection substrates technology The substrate of chip-size package (FCCSP).In addition, the single conductor of the configuration of the present embodiment package substrate is also Can be the stacking structure of multi-layer conductor leads layer, for example, the conductor layer of two layers, three layers or more layers.
Illustrate the processing procedure of the package substrate 100 of the embodiment of the present invention below.It refer to Fig. 2~6 and Fig. 1, its point Not Dui Ying above-described embodiment package substrate 100 each fabrication steps package substrate profile.
First, as shown in Figure 2 there is provided a loading plate 110, it can be the substrate of a conductive material, for example, Metal substrate or surface are coated with the dielectric material substrate of one layer of conductive layer, to carry or support the encapsulation base The successive process of plate 100, for example, making the conducting wire of the package substrate 100.Above-mentioned metal substrate Comprising iron (Fe), copper (Cu), nickel (Ni), tin (Sn), aluminium (Al), ni au (Ni/Au) and combinations thereof or alloy, But the present invention is not limited.
Then, as shown in Fig. 2 forming a conductor layer No.1 120 on the loading plate 110 so that this One conductor layer 120 includes at least one first metal routing.For example, the photoresist of photosensitive type can be used in we, A photoresistance film is first formed on the loading plate 110, then is patterned by micro image etching procedure, is formed The resistance coating of metal plating, re-plating metal film thereon, and forms the pattern of metal routing in the loading plate On 110.Either, the dielectric material of non-photo-sensing type can be used in we, first forms one on the loading plate 110 Dielectric film, then the dielectric film is patterned by laser transfer technique, then be deposited with or jet-plating metallization Film thereon, finally removes the dielectric film with stripping method (Lift-off), while the pattern of metal routing is stayed in On the loading plate 110.In the present embodiment, the conductor layer 120 has five the first metal routings 121~125, And it constitutes combination or the alloy that material can be copper, nickel, tin and ni au.
Then, an at least conductive connecting elements 130 are formed on the conductor layer No.1 120.Such as Fig. 4 A institutes Show, an at least conductive connecting elements 130 include the conductive connecting elements 131~134 of four projection cube structures, example Such as, solder bump (Solder bump), in successive process by the circuit chip 140 be connected to this first Conductor layer 120.But the quantity of an at least conductive connecting elements 130 is not limited thereto, end regards the encapsulation base The need for the configuration of plate 100 or depending on the external foot pad quantity of the circuit chip 140.In another embodiment In, grade conductive connecting elements 131 '~134 ' also can be column structure, as shown in Figure 4 B, for example, copper post, Aluminium post, nickel post, tin post or alloy column, preferably be copper post.For avoid it is excessive repeat, after this specification Half portion illustrates the implementation of correlation with the grade conductive connecting elements 131~134 for projection cube structure (as shown in Figure 4 A) Example, but reader can appreciate that, those embodiments are also equally applicable to grade conductive connecting elements 131 '~134 ' and are The case of column structure (as shown in Figure 4 B).
Then, a circuit chip 140 with least one external foot pad is set at least one to be conductively connected list in this (in the present embodiment, the circuit chip 140 has four external foots pad 141~144, such as Fig. 5 in member 130 It is shown, but the present invention is not limited thereto system) so that each external connection of foot pad 141~144 this outside at least one One of them of one of them of pin pad 141~144 and at least one first metal routing 121~125.Should Circuit chip 140 is to cut into crystal grain (die) form with the active member made by IC (IC) processing procedure Chip, and connected external foot pad (for example, conductive connecting pin, conductive spacer or conductive projection) in advance, can answer It is embedded to embedded element technology in the package substrate 100.When the circuit chip 140 is installed on the conduction even When in order member 130, the external foot pad 141~144 such as this can be placed on this etc. easily and be conductively connected list Member 131~134, for example, self contraposition (self-alignment), and be not necessary to use fine alignment technique.At this In embodiment, the conductive connecting elements 131 connect the external foot pad 141 and first metal routing 121, should Conductive connecting elements 132 connect the external foot pad 142 and first metal routing 122, the conductive connecting elements 133 connect the external foot pad 143 and first metal routing 123, and it is outer that the conductive connecting elements 134 connect this Pin pad 144 and first metal routing 124 so that the circuit chip 140 can be according to the package substrate 100 Circuit design and be connected to the conductor layer No.1 120.
Then, as shown in fig. 6, forming a conductive film 150 on the circuit chip 140, and make Obtain the space between the conductive film 150 filling circuit chip 140 and the loading plate 110.The casting Mold compound layer 150 can be made by the molded technology of packing colloid, for example, compression mold method, and seal The composition material of dress colloid can be that phenolic aldehyde (Novolac) base resin, epoxy or silicone etc. are exhausted Edge material, but be not limited.The conductive film 150 can coat the circuit chip 140, and filling should Space between circuit chip 140 and the conductor layer No.1 120 so that the package substrate 100 formation tool is steady The electronic component or product of fixing structure.In addition, the conductive film 150 exceed the circuit chip 140 The part of upper surface can act also as the outside protective layer of the package substrate 100, to protect the package substrate 100 It is protected from the possibility injury from external environment condition or successive process (for example, welding).So far, the package substrate 100 basic circuit has been completed, and first can be removed the loading plate 110, as shown in Figure 1.
Circuit chip be embedded to package substrate embedded element technology because with reduction package substrate product by The advantage that noise is disturbed and product size reduces, turns into the Research Emphasis of this area manufacturer in recent years.With Exemplified by Fig. 1 package substrate, prior art is typically that circuit chip 140 first is embedded into package substrate 100 In main body (conductive film 150), then to make the conductor layer No.1 120 as package substrate circuit layout, And the conductor layer No.1 120 is mostly the fine rule road of narrower width, processing procedure difficulty is high so that when this first is led The defect made occurs for line layer 120, then the circuit chip 140 related must also be scrapped.In addition, once The circuit chip 140 is embedded in the package substrate 100, the electric connection of the circuit chip 140 and external circuit Circuit will become to be difficult to handle, for example, the procedure for processing such as extra laser perforate, dielectric materials layer pressing And the electric connection circuit of labyrinth, these can all improve manufacturing cost and reduction product yield.
The technology of the present invention is reviewed, is performed as described above described in the fabrication steps of example, is embedded to by circuit chip 140 Before the package substrate 100, the conductor layer No.1 120 as package substrate circuit layout is just first completed, then will The circuit chip 140 is bonded to the conductor layer No.1 120, finally again by conductive film 150 with mold side Formula is injected, and completes package substrate 100 as shown in Figure 1.Therefore, narrower width, processing procedure difficulty are higher Fine rule road (conductor layer No.1 120) can be first produced, and the conductor layer No.1 120 can also include circuit chip 140 with the electric connection circuit of external circuit and complete or be not necessary to additional processing simultaneously;Therefore, it is possible to decrease Manufacturing cost and raising product yield.
According to above-described embodiment, Fig. 6 package substrate can be further developed into the production with higher order function Product.For example, Fig. 7 A are the diagrammatic cross-section of the package substrate 200 according to second embodiment of the invention.Upper State after the step of first embodiment processing procedure proceeds to Fig. 6, the conductive film 150 can be removed from top to bottom To the upper surface for exposing the circuit chip 140;For example, removing the conductive film using lapping mode 150 first half, and using the upper surface of the circuit chip 140 as grinding halt.Therefore, because the circuit The upper surface of chip 140 is exposed state, and this is beneficial to the radiating effect of the circuit chip 140. In another embodiment, a fin (Heat sink) 160 can be further disposed upon on the circuit chip 140, made Obtain the fin 160 and connect the circuit chip 140, to strengthen the radiating effect to the circuit chip 140, such as Shown in Fig. 7 B.For example, using bonding method, the fin 160 is directly adhered into the circuit chip 140 Upper surface.
Further, since the loading plate 110 that above-described embodiment is used is conductive substrate, no matter its It is the metal substrate of monoblock or the dielectric substrate of conductive layer is only coated with surface, the loading plate 110 can be also made It is used for the radiating that provides the circuit chip 140, and the processing procedure that it is remained in after Fig. 6.For example, figure 8~10 be to be illustrated according to the section of the package substrate 300 of third embodiment of the invention correspondence successive process steps Figure.When above-mentioned first embodiment proceeds to Fig. 6 step, if being intended to regard the loading plate 110 as radiating Piece, then the conductor layer No.1 120 can be used as heat produced by the circuit chip 140 to the loading plate 110 The heat dissipation path of transmission.In the present embodiment, we can separately make envelope on the conductive film 150 Fill the circuit layout line layer of substrate;Therefore, as shown in figure 8, one second conductor layer 170 can be formed at this On conductive film 150 so that second conductor layer 170 includes at least one second metal routing;For example, Second conductor layer 170 has four the second metal routings 171~174, and its production method and composition material can join According to the conductor layer No.1 120 of such as Fig. 2 steps, but it is not limited.
Then, as shown in figure 9, a conductive posts 180 can be formed on second conductor layer 170, this is led Electric post layer 180 includes an at least columnar metal thing;For example, the conductive posts 180 have four columnar metals Thing 181~184, it is respectively to that should wait the second metal routing 171~174.
Then, as shown in Figure 10, a dielectric materials layer 190 is formed on the conductive film 150, and So that the dielectric materials layer 190 coats second metal routing of grade 171~174 on the conductive film 150 With the grade columnar metal thing 181~184.The production method and composition material of the dielectric materials layer 190 can refer to as The conductive film 150 of Fig. 6 steps, but be not limited
In addition, we can be made based on Fig. 1 package substrate 100 in response to different demand or purposes Further application.For example, it is outer to connect that tin ball (Solder ball) is made in the lower section of the package substrate 100 Portion's circuit;The package substrate 100 top superposition surface adhering technical (Surface-Mount Technology, Abbreviation SMT) element or other circuit chip or crystal grain;Above or below the package substrate 100 Superposition others package substrate, forms the package substrate of sandwich construction.
The above embodiment is only exemplary, does not constitute any limitation to the scope of the present invention.Ability Field technique personnel should be understood that without departing from the spirit and scope of the invention can be to the technology of the present invention The details and form of scheme are modified or replaced, but these modifications and replacement each fall within the protection model of the present invention In enclosing.

Claims (11)

1. a kind of package substrate, it is characterised in that include:
One conductor layer, includes an at least metal routing;
One conductive connecting elements, on the conductor layer;
One circuit chip, with least one external foot pad, and is arranged on the conductive connecting elements;With And
One conductive film, coats the conductor layer, the conductive connecting elements and the circuit chip;
Wherein, the conductive connecting elements to connect at least one external foot pad one of them with this extremely One of them of a few metal routing.
2. package substrate as claimed in claim 1, it is characterised in that the conductive connecting elements are a gold medal Belong to column.
3. package substrate as claimed in claim 1, it is characterised in that the conductive connecting elements are a weldering Tin projection thing.
4. package substrate as claimed in claim 1, it is characterised in that further include a fin, it sets It is placed on the circuit chip, and connects the circuit chip.
5. package substrate as claimed in claim 1, it is characterised in that further include a metal loading plate, It is arranged under the conductor layer.
6. a kind of preparation method of package substrate, it is characterised in that step is included:
(A) loading plate is provided;
(B) conductor layer No.1 is formed on the loading plate so that the conductor layer No.1 includes at least one First metal routing;
(C) conductive connecting elements are formed on the conductor layer No.1;
(D) set a circuit chip with least one external foot pad on the conductive connecting elements, make Obtain the conductive connecting elements connect at least one external foot pad one of them with this at least one One of them of first metal routing;And
(E) conductive film is formed on the circuit chip, and make it that the conductive film fills The space filled out between the circuit chip and the loading plate.
7. preparation method as claimed in claim 6, it is characterised in that the conductive connecting elements are one the One columnar metal thing.
8. preparation method as claimed in claim 6, it is characterised in that the conductive connecting elements are a weldering Tin projection thing.
9. preparation method as claimed in claim 6, it is characterised in that further include:
(F1) conductive film of part is removed, to expose the upper surface of the circuit chip;And
(F2) loading plate is removed.
10. preparation method as claimed in claim 9, it is characterised in that further include:
One fin is set on the circuit chip so that the fin connects the upper table of the circuit chip Face.
11. preparation method as claimed in claim 6, it is characterised in that further include:
(H1) one second conductor layer is formed on the conductive film so that second conductor layer is included At least one second metal routing;
(H2) conductive posts are formed on second conductor layer, the conductive posts include at least one second Columnar metal thing;And
(H3) dielectric materials layer is formed on the conductive film, and causes the dielectric materials layer bag Cover at least one second metal routings all on the conductive film with this at least 1 the Two columnar metal things.
CN201610004607.6A 2016-01-05 2016-01-05 Package substrate and preparation method thereof Pending CN106941101A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610004607.6A CN106941101A (en) 2016-01-05 2016-01-05 Package substrate and preparation method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610004607.6A CN106941101A (en) 2016-01-05 2016-01-05 Package substrate and preparation method thereof

Publications (1)

Publication Number Publication Date
CN106941101A true CN106941101A (en) 2017-07-11

Family

ID=59469360

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610004607.6A Pending CN106941101A (en) 2016-01-05 2016-01-05 Package substrate and preparation method thereof

Country Status (1)

Country Link
CN (1) CN106941101A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109427714A (en) * 2017-08-24 2019-03-05 日月光半导体制造股份有限公司 Semiconductor packages and its manufacturing method
CN110035625A (en) * 2019-03-07 2019-07-19 武汉迈斯卡德微电子科技有限公司 A kind of production method that signal measures medium soft board

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103151274A (en) * 2013-01-31 2013-06-12 日月光半导体制造股份有限公司 Semiconductor component and manufacturing method thereof
CN203055893U (en) * 2012-12-17 2013-07-10 北京工业大学 Re-wiring thermal enhanced FCQFN packaging device
TW201409584A (en) * 2012-08-28 2014-03-01 Zhen Ding Technology Co Ltd Package on package structure and method for manufacturing same
US20150044823A1 (en) * 2013-08-08 2015-02-12 Invensas Corporation Microelectronic package with integrated bearing surfaces
CN104952828A (en) * 2014-03-25 2015-09-30 恒劲科技股份有限公司 Flip chip package on package structure and method for fabricating the same

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201409584A (en) * 2012-08-28 2014-03-01 Zhen Ding Technology Co Ltd Package on package structure and method for manufacturing same
CN203055893U (en) * 2012-12-17 2013-07-10 北京工业大学 Re-wiring thermal enhanced FCQFN packaging device
CN103151274A (en) * 2013-01-31 2013-06-12 日月光半导体制造股份有限公司 Semiconductor component and manufacturing method thereof
US20150044823A1 (en) * 2013-08-08 2015-02-12 Invensas Corporation Microelectronic package with integrated bearing surfaces
CN104952828A (en) * 2014-03-25 2015-09-30 恒劲科技股份有限公司 Flip chip package on package structure and method for fabricating the same

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109427714A (en) * 2017-08-24 2019-03-05 日月光半导体制造股份有限公司 Semiconductor packages and its manufacturing method
CN109427714B (en) * 2017-08-24 2023-09-08 日月光半导体制造股份有限公司 Semiconductor package and method of manufacturing the same
CN110035625A (en) * 2019-03-07 2019-07-19 武汉迈斯卡德微电子科技有限公司 A kind of production method that signal measures medium soft board
CN110035625B (en) * 2019-03-07 2021-07-06 武汉迈斯卡德微电子科技有限公司 Method for manufacturing signal measurement medium soft board

Similar Documents

Publication Publication Date Title
KR100551641B1 (en) A method of manufacturing a semiconductor device and a semiconductor device
KR101193416B1 (en) Three-dimensionally integrated semiconductor device and method for manufacturing the same
CN108028225A (en) Thermal-enhanced full molding is fanned out to module
US10636715B2 (en) Semiconductor package and method of fabricating the same
KR20150104186A (en) Semiconductor device assembly with through-package interconnect and associated systems, devices, and methods
TW201123374A (en) Package structure and fabrication method thereof
US20140239475A1 (en) Packaging substrate, semiconductor package and fabrication methods thereof
US20130234330A1 (en) Semiconductor Packages and Methods of Formation Thereof
TWM512216U (en) Semiconductor substrate structure and semiconductor package structure
CN108022870A (en) Package substrate and manufacturing method thereof
CN106169445B (en) Method for manufacturing semiconductor package having multi-layer molded conductive substrate and structure
CN109037188A (en) Semiconductor device packages
US20040124516A1 (en) Circuit device, circuit module, and method for manufacturing circuit device
TWI602275B (en) Package structure and its fabrication method
TW201705426A (en) Resin-encapsulated semiconductor device and method of manufacturing the same
CN106941101A (en) Package substrate and preparation method thereof
JP7239342B2 (en) ELECTRONIC DEVICE AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE
CN107301954A (en) Manufacturing method of packaging substrate
US10057995B2 (en) Electronic device
US8062927B2 (en) Wiring board and method of manufacturing the same, and electronic component device using the wiring board and method of manufacturing the same
CN105206595B (en) Package substrate, flip chip package circuit comprising same and manufacturing method thereof
CN103915397B (en) More bare crystallines, high current wafer-level packaging
CN105244340B (en) Package substrate, flip chip package circuit and manufacturing method thereof
TWI628756B (en) Package structure and its fabrication method
US20170317031A1 (en) Fabrication Method OF A Package Substrate

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
TA01 Transfer of patent application right
TA01 Transfer of patent application right

Effective date of registration: 20180326

Address after: The Cayman Islands KY1-1205 Grand Cayman West Bay Road No. 802 Furong Road Hongge mailbox No. 31119

Applicant after: Phoenix pioneer Limited by Share Ltd

Address before: Hsinchu County, Taiwan, China

Applicant before: Persistent strength or power Science and Technology Co., Ltd.

WD01 Invention patent application deemed withdrawn after publication
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20170711