CN106932672B - A kind of appraisal procedure of radiation of equipment interference - Google Patents
A kind of appraisal procedure of radiation of equipment interference Download PDFInfo
- Publication number
- CN106932672B CN106932672B CN201710127350.8A CN201710127350A CN106932672B CN 106932672 B CN106932672 B CN 106932672B CN 201710127350 A CN201710127350 A CN 201710127350A CN 106932672 B CN106932672 B CN 106932672B
- Authority
- CN
- China
- Prior art keywords
- equipment
- interference
- radiation
- frequency spectrum
- conduction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
Abstract
A kind of appraisal procedure of radiation of equipment interference.This method comprises: obtaining the Conduction Interference frequency spectrum Fc and radiation interference frequency spectrum Fr of equipment before modification equipment；Find out the amplitude the larger value Ai and its corresponding N of frequency fi, i=1,2 ... in radiation interference frequency spectrum；Find out the range value Bi of respective frequencies fi in Conduction Interference frequency spectrum；Calculate calibration coefficient Ci=Ai/Bi；After modifying equipment, the Conduction Interference frequency spectrum of equipment is reacquired, and the modified radiation interference of assessment equipment according to the following formula: F ' r=B ' i X Ci.The beneficial effects of the method for the present invention is: can carry out in workshop to the compatible situation verifying analysis of installation electromagnetical after apparatus modifications, accelerate the development rate of product；Radiation interference is assessed by Conduction Interference, reduces expensive screened room testing expense, to reduce the compatible cost of installation electromagnetical.
Description
Technical field
The present invention relates to a kind of appraisal procedures of radiation of equipment interference, more particularly to radiation interference after a kind of apparatus modifications
Appraisal procedure, belong to technical field of electromagnetic compatibility.
Background technique
Any equipment cannot interfere the normal work of other equipment when working, here it is " electromagnetic compatibility " (EMC).In order to true
The electromagnetic compatibility of product is protected, the electromagnetic interference (EMI) of existing EMC laws and regulations requirement product could be sold lower than rules and regulations, and true
Recognizing product whether to meet the main means of EMC rules and regulations is that Conduction Interference and radiation interference test are done to product, these tests
It must be carried out in screened room, to exclude influence of the environmental disturbances to test.Screened room tests the complexity for increasing test
And expense, increase product cost.
People explore through two kinds of approach the expense for reducing product E MC test for a long time.First is that product is placed on
The open place in field is tested, but with the extensive use of electronic equipment, is difficult to find " clean without electromagnetic interference "
Open place.An other approach, is to derive radiation interference from the Conduction Interference of product, and two tests are reduced to one,
Therefore testing expense reduces less than half.It can be accurate from the Conduction Interference of equipment however, there are no a kind of methods up to now
The radiation interference of product is calculated, result can be approved by EMC regulation.
On the other hand, when the standard testing of screened room the result shows that device manufacturer is necessary when the EMI of an equipment exceeded
Equipment is modified to reduce EMI.Period needs constantly to send standard laboratory to test modified equipment, to verify the effect of modification
Fruit.Although the main purpose of the test of this verifying modification effect is that whether original exceeded EMI reduces after checking this modification,
But the radiation interference validation test of equipment will carry out in which can not be substituted in screened room, increase the research and development cost of product.
Summary of the invention
The present invention proposes a kind of appraisal procedure of radiation of equipment interference, and unlike the prior art, this method permission is being set
The workshop of standby manufacturer, rather than in the Conduction Interference of expensive screened room test equipment, and according to the conduction of equipment
The radiation interference of interference assessment equipment, to reduce testing cost.
The appraisal procedure of a kind of radiation of equipment interference proposed by the present invention, it is characterised in that this method comprises the following steps:
Before modifying equipment, the Conduction Interference frequency spectrum Fc and radiation interference frequency spectrum Fr of equipment are obtained,
Find out the range value Ai and its corresponding frequency fi of specific frequency electromagnetic interference in radiation interference frequency spectrum, i=1,
2 ... N；
Find out the range value Bi of respective frequencies fi in Conduction Interference frequency spectrum；
Calculate calibration coefficient Ci=Ai/Bi；
After modifying equipment, the Conduction Interference frequency spectrum of equipment is reacquired, and according to the following formula after assessment equipment modification
Radiation interference:
F’r = B’i X Ci
Wherein
F ' r is the radiation interference after apparatus modifications；
B ' i is the Conduction Interference after apparatus modifications.
A kind of appraisal procedure of radiation of equipment interference, which is characterized in that the Conduction Interference frequency for obtaining equipment
Spectrum and radiation interference frequency spectrum, including obtain from history test record or obtained by test.
A kind of appraisal procedure of radiation of equipment interference, which is characterized in that the Conduction Interference frequency for obtaining equipment
Spectrum is included in shielding environment and tests the equipment or test the equipment in unshielded environments.
A kind of appraisal procedure of the radiation of equipment interference, which is characterized in that the Conduction Interference frequency spectrum of the equipment, it can
To measure the voltage signal of the equipment by voltage tester instrument and be obtained by mathematic(al) manipulation.
A kind of appraisal procedure of the radiation of equipment interference, which is characterized in that the Conduction Interference frequency spectrum of the equipment, it can
It is obtained with measuring the equipment by frequency test instrument.
Beneficial effect
Compared with first technology, the beneficial effects of the method for the present invention includes:
The compatible situation verifying analysis of installation electromagnetical after apparatus modifications can be carried out in workshop, accelerate opening for product
Send out speed；
Radiation interference is assessed by Conduction Interference, reduces expensive screened room testing expense, so that it is simultaneous to reduce installation electromagnetical
Rongcheng sheet.
The those of ordinary skill of known art technology can further appreciate that claim defined by reading specification
The other benefits and purpose of the application patented invention.
Detailed description of the invention
Fig. 1 is the step flow chart of 1-2 of the embodiment of the present invention.
Fig. 2 is the radiation interference spectrogram that 1-2 of the embodiment of the present invention is devices under.
Fig. 3 is the spectrogram before the calibration of 1-2 of the embodiment of the present invention.
Fig. 4 is the calibrated spectrogram of the embodiment of the present invention 1.
Specific embodiment
Below in conjunction with drawings and examples, specific embodiments of the present invention will be described in further detail.
Embodiment 1
In embodiment 1, being devices under (EUT) is a digital circuit, the laboratory standard EMC radiation interference test report
(Fig. 2) shows that the EMI amplitude that the EUT frequency is 98.288000 MHz is 65.9 dBu, and frequency is 131.074000 MHz's
EMI amplitude is 57.2 dBu, and the EMI amplitude that frequency is 163.811500MHz is 55.8 dBu, has exceeded the amplitude of permission
(50dBu).It is desirable that by modification circuit, to reduce these exceeded EMI.According to the method for the present invention, following steps are taken
(Fig. 1):
Obtain the radiation interference frequency spectrum Fr of equipment.In the present embodiment, it is dry that EUT has done overshoot in the laboratory standard EMC
Test is disturbed, and did not make modification after testing, the radiation interference frequency spectrum Fr that test report (Fig. 2) includes can bring use；
If EUT does not have history test report available, need to send EUT EMC laboratory test to obtain test report.
Obtain the Conduction Interference frequency spectrum Fc of equipment.In workshop, with a digital oscilloscope EUT DC power supply terminal
Test obtains a voltage waveform, then does Fourier transformation to waveform and obtains Conduction Interference frequency spectrum Fc(Fig. 3 of equipment).It is aobvious
So, the interference in Fc not only contains Fig. 2 radiation interference, but also contains some far fields (radiation interference) of not being launched into
Near-field interference (Conduction Interference) and environmental disturbances.Since our purpose is each specific several frequencies after modifying equipment of monitoring
Whether the EMI of rate declines, therefore can ignore the EMI of other frequencies in addition to specific frequency.
Find out the amplitude the larger value Ai and its corresponding N of frequency fi, i=1,2 ... in radiation interference frequency spectrum.The present embodiment
In, A1=65.9dBu, A2=57.2dBu, A3=55.8dBu; f1=98.288000MHz, f2=131.074000MHz,f3=
163.811500MHz。
Find out the range value Bi of respective frequencies fi in Conduction Interference frequency spectrum.In the present embodiment, B1=100.3dBu, B2=
81.1dBu, B3=85.5dBu。
Calculate calibration coefficient Ci=Ai/Bi.In the present embodiment, C1=0.659, C2=0.705, C3=0.653.
In view of in the present embodiment, the interference of f1 frequency is mainly to interfere, we are only to the interference calculation mark of f1 frequency
Determine coefficient C1 and demarcate the interference of all frequencies with C1, calibrated result is as shown in Figure 3.Obviously, after calibration, frequency f1
The amplitude of Conduction Interference and the amplitude of radiation interference tend to consistent.Experience have shown that if not to the shielding design of EUT and wiring
Big variation is done, the amplitude variation of Conduction Interference and the amplitude variation of radiation interference are substantially directly proportional after modification EUT.Therefore,
By the method for the invention, it test voltage waveform and can be counted in the same test point of EUT after modifying EUT with oscillograph
Conduction Interference frequency spectrum is calculated, and assesses the variation of radiation interference, very big convenience is carried out to the change tape of EUT.
Embodiment 2
In embodiment 2, EUT and solve the problems, such as it is same as Example 1, except that use frequency test instrument
(frequency spectrograph) is carried out in shielding indoor test Conduction Interference, and to all 3 exceeded interference all in accordance with following formula respectively
Calibration:
F’r = B’i X Ci
Wherein
F ' r is the radiation interference after apparatus modifications
B ' i is the Conduction Interference after apparatus modifications.
Above embodiments are only to illustrate the principle and function of the method for the present invention, not the limitation present invention.Therefore it is familiar with ability
The modification and variation without prejudice to spirit of that invention that the technical staff in domain makes above-described embodiment are still covered by the present invention.
Interest field of the invention should be as listed by present patent application claim.
Claims (5)
1. a kind of appraisal procedure of radiation of equipment interference, which is characterized in that this method comprises the following steps:
Before modifying equipment, the Conduction Interference frequency spectrum Fc and radiation interference frequency spectrum Fr of equipment are obtained,
Find out the range value Ai and its corresponding N of frequency fi, i=1,2 ... of specific frequency electromagnetic interference in radiation interference frequency spectrum；
Find out the range value Bi of respective frequencies fi in Conduction Interference frequency spectrum；
Calculate calibration coefficient Ci=Ai/Bi；
After modifying equipment, the Conduction Interference frequency spectrum of equipment is reacquired, and the modified spoke of assessment equipment according to the following formula
Blackberry lily is disturbed:
F’r = B’i× Ci
Wherein
F ' r is the radiation interference after apparatus modifications；
B ' i is the Conduction Interference after apparatus modifications.
2. a kind of appraisal procedure of radiation of equipment interference as described in claim 1, which is characterized in that the biography for obtaining equipment
Interference spectrum and radiation interference frequency spectrum are led, including obtains from history test record or is obtained by test.
3. a kind of appraisal procedure of radiation of equipment interference as described in claim 1, which is characterized in that the biography for obtaining equipment
Interference spectrum is led, is included in shielding environment and is tested the equipment or test the equipment in unshielded environments.
4. a kind of appraisal procedure of radiation of equipment interference as described in claim 1, which is characterized in that the conduction of the equipment is dry
Scrambling spectrum can be measured the voltage signal of the equipment by voltage tester instrument and be obtained by mathematic(al) manipulation.
5. a kind of appraisal procedure of radiation of equipment interference as described in claim 1, which is characterized in that the conduction of the equipment is dry
Scrambling spectrum can measure the equipment by frequency test instrument and obtain.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710127350.8A CN106932672B (en) | 2017-03-06 | 2017-03-06 | A kind of appraisal procedure of radiation of equipment interference |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710127350.8A CN106932672B (en) | 2017-03-06 | 2017-03-06 | A kind of appraisal procedure of radiation of equipment interference |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106932672A CN106932672A (en) | 2017-07-07 |
| CN106932672B true CN106932672B (en) | 2019-06-07 |
Family
ID=59424697
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710127350.8A Active CN106932672B (en) | 2017-03-06 | 2017-03-06 | A kind of appraisal procedure of radiation of equipment interference |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106932672B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115291022A (en) * | 2018-01-06 | 2022-11-04 | 吴伟 | Quality control method for batch products |
| CN110516335B (en) * | 2019-08-16 | 2023-04-07 | 广东浪潮大数据研究有限公司 | Radiation risk assessment method and device, electronic equipment and storage medium |
| CN114236291B (en) * | 2021-12-20 | 2024-04-26 | 宁波奥克斯电气股份有限公司 | Electromagnetic interference detection device, detection method and computer readable storage medium |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101294998A (en) * | 2007-04-28 | 2008-10-29 | 华为技术有限公司 | Method and system for acquiring communication electromagnetic radiation value of power line |
| CN101349729A (en) * | 2008-09-04 | 2009-01-21 | 北京航空航天大学 | Electromagnetic compatible transmitting test method |
| CN101701986A (en) * | 2009-10-27 | 2010-05-05 | 中国舰船研究设计中心 | System for pre-testing and diagnosing electro magnetic interference of electronic equipment and method thereof |
| CN102162828A (en) * | 2010-12-28 | 2011-08-24 | 哈尔滨工业大学 | Device and method for qualitatively detecting PCB (printed circuit board) board electromagnetic interference radiation performance |
| CN102749539A (en) * | 2012-06-27 | 2012-10-24 | 北京航空航天大学 | Fast electromagnetic compatibility test and diagnosis system with quantization electromagnetic interference |
| CN105044520A (en) * | 2015-08-06 | 2015-11-11 | 西安电子科技大学 | Method and device for measuring electromagnetic emission characteristics of electronic device on site |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7342528B2 (en) * | 2006-06-15 | 2008-03-11 | Semiconductor Components Industries, L.L.C. | Circuit and method for reducing electromagnetic interference |
-
2017
- 2017-03-06 CN CN201710127350.8A patent/CN106932672B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101294998A (en) * | 2007-04-28 | 2008-10-29 | 华为技术有限公司 | Method and system for acquiring communication electromagnetic radiation value of power line |
| CN101349729A (en) * | 2008-09-04 | 2009-01-21 | 北京航空航天大学 | Electromagnetic compatible transmitting test method |
| CN101701986A (en) * | 2009-10-27 | 2010-05-05 | 中国舰船研究设计中心 | System for pre-testing and diagnosing electro magnetic interference of electronic equipment and method thereof |
| CN102162828A (en) * | 2010-12-28 | 2011-08-24 | 哈尔滨工业大学 | Device and method for qualitatively detecting PCB (printed circuit board) board electromagnetic interference radiation performance |
| CN102749539A (en) * | 2012-06-27 | 2012-10-24 | 北京航空航天大学 | Fast electromagnetic compatibility test and diagnosis system with quantization electromagnetic interference |
| CN105044520A (en) * | 2015-08-06 | 2015-11-11 | 西安电子科技大学 | Method and device for measuring electromagnetic emission characteristics of electronic device on site |
Non-Patent Citations (1)
| Title |
|---|
| A Novel Method of Ambient Interferences Suppressing for In Situ Electromagnetic Radiated Emission Test;Zhong-Hao Lu，等;《IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY》;20120930;第54卷(第6期);1205-1213 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106932672A (en) | 2017-07-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Rubio-Serrano et al. | Electro-acoustic detection, identification and location of partial discharge sources in oil-paper insulation systems | |
| CN106932672B (en) | A kind of appraisal procedure of radiation of equipment interference | |
| Kučera et al. | Electromagnetic compatibility analysing of electrical equipment | |
| Giaquinto et al. | Criteria for automated estimation of time of flight in TDR analysis | |
| Franchet et al. | Soft fault detection in cables using the cluster time-frequency domain reflectometry | |
| CN103257273A (en) | Method for measuring phase difference of signals with same frequency period | |
| US5894223A (en) | Non-intrusive cable tester | |
| Shen et al. | ESD immunity prediction of D flip-flop in the ISO 10605 standard using a behavioral modeling methodology | |
| Wright et al. | Evaluation of EMI effects on static electricity meters | |
| CN104502875B (en) | Signal detection apparatus calibration method based on time and frequency parameter standard signal source mode | |
| Besharatifard et al. | Evaluation of a calibration technique in measuring partial discharges inside mineral oils with a high‐frequency current transformer (HFCT) sensor: A case study | |
| Cerri et al. | Theoretical and experimental evaluation of electromagnetic fields radiated by ESD | |
| RU2497282C9 (en) | Method of evaluating electromagnetic compatibility of aircraft on-board equipment in frequency range from 10 khz to 400 mhz | |
| Pavel et al. | A measurement system for the automatic survey of the low frequency magnetic field | |
| Kučera et al. | Electromagnetic compatibility analysis of electric equipments | |
| Shen et al. | Simple D flip-flop behavioral model of ESD immunity for use in the ISO 10605 standard | |
| Parvis et al. | A precompliance EMC test-set based on a sampling oscilloscope | |
| Stanciu et al. | Voltage sags and Total Harmonic Distortion monitoring in power systems. A case study | |
| Clarkson et al. | A wavelet-based method of measuring fluctuating harmonics for determining the filter time constant of IEC standard harmonic analyzers | |
| Mariscotti | A magnetic field probe with MHz bandwidth and 7-decade dynamic range | |
| Nuccio et al. | Virtual instruments: Uncertainty evaluation in the presence of unknown electromagnetic interferences | |
| Frigerio et al. | Noise metering via mobile phones: limitations, opportunities and findings in a workplace testing | |
| Cakir et al. | Investigation of undesired ripple voltage across power source side and solutions in military low-frequency immunity tests | |
| Xu et al. | Ambient noise cancellation in frequency domain EMI measurement | |
| Schraeder et al. | Load-and Source-Based Impedance Measuring Methods: Comparing Concepts and Structural Limitations in a Laboratory Environment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20190508 Address after: 325000 South Asia Garden 3-301, Jiangbin Road, Lucheng District, Wenzhou City, Zhejiang Province Applicant after: Wu Wei Applicant after: Wu Yuejia Address before: 325000 South Asia Garden 3-301, Jiangbin Road, Lucheng District, Wenzhou City, Zhejiang Province Applicant before: Wu Wei |
|
| TA01 | Transfer of patent application right | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |