CN106908633A - board card testing machine - Google Patents
board card testing machine Download PDFInfo
- Publication number
- CN106908633A CN106908633A CN201710071023.5A CN201710071023A CN106908633A CN 106908633 A CN106908633 A CN 106908633A CN 201710071023 A CN201710071023 A CN 201710071023A CN 106908633 A CN106908633 A CN 106908633A
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- China
- Prior art keywords
- board
- pin
- testing cassete
- test
- set casing
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- 238000012360 testing method Methods 0.000 title claims abstract description 264
- 230000007246 mechanism Effects 0.000 claims abstract description 20
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 25
- 230000003287 optical effect Effects 0.000 claims description 11
- 230000033001 locomotion Effects 0.000 claims description 5
- 230000002093 peripheral effect Effects 0.000 claims description 3
- 239000000523 sample Substances 0.000 description 9
- 229910000679 solder Inorganic materials 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000006641 stabilisation Effects 0.000 description 2
- 238000011105 stabilization Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000003032 molecular docking Methods 0.000 description 1
- 230000008450 motivation Effects 0.000 description 1
- 239000011435 rock Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention relates to the field of electronic instrument testing, and provides a board testing machine which comprises a base, a board testing device and a manipulator, wherein the board testing device and the manipulator are arranged on the base; the board card testing device comprises a base, a portal frame erected on the base, a board card testing assembly and a pressing assembly arranged at the top of the portal frame; the base is provided with a guide rail and a first driving mechanism, the board card testing assembly is arranged on the guide rail, and the first driving mechanism drives the board card testing assembly to move along the guide rail; the lower end of the portal frame is provided with a test pin receiving port, and the side part of the board card test assembly opposite to the test pin receiving port is provided with a test pin input port corresponding to the test pin receiving port, wherein the test pin input port is correspondingly inserted into the test pin receiving port.
Description
Technical field
The present invention relates to electronic instrument testing field, more particularly to a kind of board test machine.
Background technology
When the function to board is tested, typically board is fixed in the board fixed plate of board test machine, made
Solder joint on board is contacted with the probe of testing cassete, and then probe conducts to test device the electric signal of solder joint, with to board
Electrical property tested;In order that the solder joint of board is effectively contacted, it is necessary to testing cassete is navigated into work with the probe of testing cassete
In clamps, promote thimble to move downward by cylinder and compress board, so that the solder joint of board and probe reliable contacts.
And for the ease of automation mechanized operation, by testing cassete there is provided feeding/unloading station and test station, and driven by cylinder
Dynamic testing cassete is moved back and forth between the two stations, but, the probe of existing testing cassete is by wire and test device
Connection, when testing cassete is moved back and forth between that two stations, wire can also be pullled by testing cassete and moved therewith,
Wire is pullled and the junction fatigue of wire and probe is caused loose contact, influences testing result;Meanwhile, wire also can
Easily it is torn and frequently changes, influences the testing efficiency of board.
The content of the invention
Will not be with the contact power supply testing device of testing cassete motion it is an object of the invention to provide a kind of wire that is provided with
Board test machine, occurs with the phenomenon for avoiding the tested box of wire from pullling, and is connected with test device with the probe for improving testing cassete
Stability, and be both improve board testing efficiency.
To achieve these goals, the invention provides a kind of board test machine, including pedestal, it is arranged on the pedestal
Board test device, the conveyer for conveying board and the manipulator for capturing and carrying board, the board
Test device and the manipulator are located on the pedestal, and the light for positioning mechanical arm run location is additionally provided with the pedestal
Learn position indicator;Wherein, the board test device includes base, portal frame, the board test suite being erected on the base
And be arranged at the top of the portal frame, for compressing holding down assembly for board;The base is provided with guide rail and the first drive
Motivation structure, the board test suite is arranged on the guide rail, and first drive mechanism drives the board test suite
Moved along the guide rail;The lower end of the portal frame is provided with test pin receiving port, with institute on the board test suite
State the opposite sidepiece of test pin receiving port and be provided with the test pin input corresponding with the test pin receiving port
Port;When first drive mechanism drives the board test suite to be moved into the portal frame, the test pin input
Port grafting corresponding with the test pin receiving port.
Preferably, the lower end of the portal frame is provided with transverse slat, and the two ends of the transverse slat are connected across the dragon respectively
On two relative columns of door frame;The test pin receiving port includes pin integrated package and multiple first pins, described
Pin integrated package is fixed on the middle part of the transverse slat, and multiple first pin arrangements are on the pin integrated package and described
The two ends of the first pin pass from the pin integrated package.
Preferably, the test pin input port includes multiple second pins, multiple second pin rows
Be listed on the sidepiece, and one end of the second pin is extend into the board test suite, the second pin it is another
Expose the board test suite in one end;When first drive mechanism drives the board test suite to be moved into the portal frame
When, the first pin connection corresponding with the second pin.
Preferably, the sidepiece of the board test suite is provided with relative with the pin integrated package position
The interface answered;When first drive mechanism drives the board test suite to be moved into the portal frame, the pin collection
Blocking correspondence is plugged in the interface.
Preferably, the board test suite includes testing cassete and the upper opening surrounded by base plate and side wall
Testing cassete set casing;The bottom of the testing cassete set casing is connected on the guide rail, the testing cassete set casing with it is described
The opposite side wall of test pin receiving port is provided with the pin integrated package correspondence grafting for the test pin receiving port
Interface;It is provided with the inside of the side wall of the testing cassete set casing and is held down assembly, at least the one of the compact heap for holding down assembly
Part can be stretched out and return from the inside of the side wall of the testing cassete set casing;When testing cassete opening from the testing cassete set casing
When mouth inserts the testing cassete set casing, the compact heap is resisted against on the side wall of the testing cassete.
Preferably, it is described to hold down assembly including the first elastic component, compact heap and fixed block, first elastic component
One end be connected on the inner side of side wall of the housing, the other end of first elastic component connects the compact heap;It is described
Via is provided with the middle part of fixed block, the inside sidewalls of the testing cassete set casing are provided with accepting groove;The fixed block is fixed on institute
State in accepting groove, outside contouring and the via inside portion contour shape of the compact heap coordinate, and the compact heap can
Along the axial movement of the through hole.
Preferably, the compact heap stretches out the end face of the side wall of the testing cassete set casing and is provided with from the survey
Guide part and be undertaken on the guide part end that the opening of examination box set casing is set to the testing cassete set casing bottom angled
The compressed part at end.
Preferably, the testing cassete includes the opening of the housing of upper end open, Outside Dimensions more than the housing
Outside Dimensions upper lid and board fixed plate, the upper lid be removably attached to the upper end of the housing, and it is described on
Lid near its peripheral region stretches out the side-wall outer side of the housing, the board fixed plate can floating ground be located at the upper lid
Upper surface;The board fixed plate is provided with multiple first through hole corresponding with the bump position of board, the upper lid
The position corresponding with the first through hole is provided with the 3rd pin, and the lower end of the 3rd pin is input into the test pin
The upper surface of the upper lid and relative with the first through hole is stretched out in the pin electrical connection of port, the upper end of the 3rd pin
Should.
Preferably, the upper end of the side wall of the testing cassete set casing is provided with alignment pin, and the upper lid stretches out institute
The location hole matched with the alignment pin is provided with the region of the side-wall outer side for stating testing cassete set casing;When the testing cassete is inserted
It is connected to when in the testing cassete set casing, the location hole correspondence is socketed on the alignment pin.
Preferably, the upper lid is provided with multiple flexible positioning pieces, and the flexible positioning piece includes sleeve, positioning
Bar and the 3rd elastic component, the second through hole, institute are provided with the board fixed plate position corresponding with the flexible positioning piece
State sleeve to be vertically fixed on the upper lid, in the sleeve, one end of the locating rod can for the 3rd elastic component
Slidably it is socketed in the sleeve, the other end of the locating rod is provided with taper location division, and the taper location division passes institute
State the second through hole.
Board test machine of the invention, test pin receiving port is provided with the lower end of the portal frame of board test device,
The survey corresponding with test pin receiving terminal is provided with the sidepiece opposite with test pin receiving port on the board test suite
Examination pin input end mouthful;When the first drive mechanism Driver Card test suite is moved into portal frame (i.e. testing cassete is located at test station)
When, the grafting corresponding with test pin receiving port of test pin input port is capable of achieving testing cassete and is well electrically connected with test device
Connect, and surveyed when the first drive mechanism Driver Card test suite removes portal frame (i.e. testing cassete is located at feeding/unloading station)
Examination pin input end mouthful disconnects with test pin receiving port, now, because board need not be tested, test pin input port
Being disconnected with test pin receiving port does not influence test process, therefore, there is no need to wire and testing cassete is connected with test device, from
And the phenomenon that the tested box of wire is pullled can be avoided to occur, with the stabilization that the probe for improving testing cassete is connected with test device
Property, and the testing efficiency of board is improved simultaneously.
Brief description of the drawings
Fig. 1 is that the board test machine of preferred embodiment of the present invention removes the structure diagram after casing;
Fig. 2 is the overall structure sketch of the board test device of the preferred embodiment of the present invention;
Fig. 3 is the test pin input port and test pin receiving terminal of the board test device of the preferred embodiment of the present invention
The attachment structure schematic diagram of mouth;
Fig. 4 is the overall structure sketch of the testing cassete set casing of the preferred embodiment of the present invention;
Fig. 5 is the overall structure sketch of the testing cassete of the preferred embodiment of the present invention.
Wherein, 1, pedestal;2nd, board test device;21st, base;211st, guide rail;212nd, the first drive mechanism;22nd, gantry
Frame;23rd, board test suite;231st, testing cassete set casing;2310th, interface;2311st, testing cassete fixes shell side wall;2312nd, press
Tight block;2313rd, the first elastic component;2314th, accepting groove;2315th, fixed block;2316th, via;2317th, guide part;2318th, compress
Portion;2319th, alignment pin;232nd, testing cassete;2320th, housing;2321st, testing cassete side wall;2322nd, upper lid;2323rd, board is fixed
Plate;2324th, first through hole;2325th, elastic supporting member for supporting optical member;23251st, guide cylinder;23252nd, support bar;2326th, the 3rd pin;
2327th, location hole;2328th, flexible positioning piece;23281st, sleeve;23282nd, locating rod;23283rd, taper location division;2329th,
Two through holes;24th, hold down assembly;241st, the second drive mechanism;242nd, lower platen;25th, transverse slat;250th, pin passes through hole;26th, test
Pin receiving port;261st, pin integrated package;262nd, the first pin;27th, test pin input port;270th, second pin;3、
Manipulator;41st, the first conveyer belt;42nd, the second conveyer belt;43rd, the 3rd conveyer belt;5th, optical orientator;6th, mounting bracket;7th, protect
Net.
Specific embodiment
With reference to the accompanying drawings and examples, specific embodiment of the invention is described in further detail.Hereinafter implement
Example is not limited to the scope of the present invention for illustrating the present invention.
With reference to shown in Fig. 1 to Fig. 5, the board test machine of the embodiment of the present invention is schematically showed, including pedestal 1, set
Put the multiple board test devices 2 on pedestal 1, the conveyer for conveying board and for capturing and carrying board
Manipulator 3, multiple board test devices 2 are located on pedestal 1, and are evenly distributed on the both sides of pedestal 1, and manipulator 3 is located at pedestal 1
On, and between the board test device 2 of the both sides of pedestal 1;Preferably, the quantity of board test device 2 is set to four, should
Four board test devices 2 are symmetrically distributed in the both sides of pedestal 1;It is additionally provided with pedestal 1 for the run location of positioning mechanical arm 3
Optical orientator 5;Preferably, conveyer includes the first conveyer belt 41, the second conveyer belt 42 and the 3rd conveyer belt 43, its
In, the first conveyer belt 41 and the second conveyer belt 42 are arranged in the same side of pedestal 1, and length direction substantially with pedestal 1 keeps
Parallel, the first conveyer belt 41 and the adjacent end of the second conveyer belt 42 are close together;3rd conveyer belt 43 along pedestal 1 width
Direction is set, and is passed through between the board test device 2 of the both sides of pedestal 1, and one end of the 3rd conveyer belt 43 is near the first transmission
With 41 and the second adjacent end of conveyer belt 42;Wherein, the first conveyer belt 41 is used to convey board to be detected, the second conveyer belt 42
The board qualified for conveying detection, the 3rd conveyer belt 43 is used to convey the underproof board of detection.
The manipulator of the embodiment of the present invention is standard component commonly used in the art, and its concrete structure and function are not situated between one by one
Continue.
The optical orientator 5 of the embodiment of the present invention is preferably CCD camera, and optical orientator 5 can position each board test
The movement position information of the positional information and real-time tracking manipulator 3 of device 2 and each conveyer belt, and positional information is sent to
Central processing module, is beneficial to central processing module control machinery hand 3 and moves, and realizes crawl or places the action of board;For example,
When the board to be tested of the conveying of the first conveyer belt 41 enters into catching block, optical orientator 5 orients the position of the board first
Put, and the positional information is fed back into central processing module, the position for moving to the board of central processing module control machinery hand 3
Place is put, board is captured, be then placed on the board test device 2 of free time;If board test device 2 detects on-gauge plate
Card, then can feed back qualified information to central processing module, and therewith, the action of central processing module control machinery hand 3 will detect qualified
Board be transported on the second conveyer belt 42 and transport;If board test device 2 detects unqualified board, can feed back unqualified
To central processing module, therewith, central processing module control machinery hand 3 is acted and for the underproof board of detection to be transported to the information
Transported on three conveyer belts 43, so as to realize the full-automatic board test function of board test machine.
As shown in figure 1, optical orientator 5 is arranged on the first conveyer belt 41, the second conveyer belt 42 and the 3rd conveyer belt 43 handing over
The top at place is connect, so as to Overall Acquisition positional information;The side of pedestal 1 is provided with mounting bracket 6, and optical orientator 5 is installed in the peace
Shelve on 6;In order to protect the working region of manipulator 3 not by external interference, it is additionally provided with the periphery in robot work region anti-
Protecting wire net 7, the protection network 7 is generally rectangular shaped mesh casing;Preferably, the protection network 7 is erected at the first conveyer belt 41, second passing
The outside with 42 and the junction of the 3rd conveyer belt 43 is sent, so that external interference is not received in the working region for preferably protecting manipulator 3;
Additionally, can also set casing (not shown) on pedestal 1, the casing is erected at the upper end of pedestal 1, and it is generally rectangular shaped housing,
So as to cover the board test device 2 set on pedestal 1 completely.
With reference to shown in Fig. 2 to Fig. 5, the board test device 2 of board test machine includes base 21, is erected on base 21
Portal frame 222, board test suite 23 and the top of portal frame 222 is arranged on, 24 are held down assembly for compress board;
Base 21 is provided with the drive mechanism 212 of guide rail 211 and first, and the board test suite 23 is arranged on guide rail 211, and first drives
The Driver Card test suite 23 of mechanism 212 is moved along guide rail 211;Test pin receiving port is provided with the lower end of portal frame 222
26, it is provided with and test pin receiving port 26 on the sidepiece opposite with test pin receiving port 26 on the board test suite 23
Corresponding test pin input port 27.
When 212 Driver Card test suite of the first drive mechanism 23 is moved into portal frame 22, test pin input port 27
With the corresponding grafting of test pin receiving port 26, it is capable of achieving testing cassete and is well electrically connected with test device, and when the first driving machine
When 212 Driver Card test suite of structure 23 removes portal frame 22 (i.e. testing cassete is located at feeding/unloading station), test pin input
Port 27 disconnects with test pin receiving port 26, now, because board need not be tested, test pin input port 27 with survey
The disconnection of examination pin receiving port 26 does not influence test process, therefore, there is no need to wire and testing cassete is connected with test device, from
And the phenomenon that the tested box of wire is pullled can be avoided to occur, with the stabilization that the probe for improving testing cassete is connected with test device
Property, and the testing efficiency of board is improved simultaneously.
Incorporated by reference to shown in Fig. 2 and Fig. 3, transverse slat 25, the two ends difference of the transverse slat 25 can be set in the lower end of portal frame 22
It is connected across on two relative columns of portal frame 22;Test pin receiving port 26 can include pin integrated package 261 and many
Individual first pin 262, the pin integrated package 261 is fixed on the middle part of transverse slat 25, and it is integrated that multiple first pins 262 are arranged in pin
On block 261, and the two ends of the first pin 262 pass from pin integrated package 261;One end of first pin 262 can be by leading
Line is connected with test device point, and the other end of the first pin 262 is used for docking corresponding with test pin input port 27;Can be
The middle part of transverse slat 25 sets pin and passes through hole 250, so that the first pin 262 is passed through, it is to avoid the wire being connected with the first pin 262
Need to bypass transverse slat 25, cause loose contact.
Incorporated by reference to shown in Fig. 3 and Fig. 5, test pin input port 27 includes multiple second pins 270, multiple second pins
270 are arranged on the sidepiece corresponding with test pin receiving port 26 of board test suite 23, and second pin 270 one end
It extend into board test suite 23, the other end of second pin 270 exposes board test suite 23;In board test suite 23
The corresponding sidepiece of test pin receiving port 26 be provided with the interface 2310 corresponding with the position of pin integrated package 261;
When 212 Driver Card test suite of the first drive mechanism 23 is moved into portal frame 22, the pin integrated package 261 correspondence is plugged on slotting
In interface 2310.
Incorporated by reference to shown in Fig. 2 to Fig. 5, board test suite 23 includes testing cassete 232 and is surrounded by base plate and side wall
The testing cassete set casing 231 of upper opening;The bottom of testing cassete set casing 231 is connected on guide rail 211, and interface 2310 is set
Fixed on shell side wall 2311 in testing cassete set casing 231 and the opposite side wall of test pin receiving port 26, i.e. testing cassete;Test
It is provided with the inside of the side wall of box set casing 231 and is held down assembly, at least a portion for the compact heap 2312 that this holds down assembly can be from survey
Stretch out and return on the inside of the side wall of examination box set casing 231;When testing cassete 232 is inserted from the opening of testing cassete set casing 231,
Compact heap 2312 is resisted against on the side wall of testing cassete 232.
Preferably, hold down assembly including compact heap 2312, the first elastic component 2313 and fixed block 2315, the first bullet
Property part 2313 one end be connected on the inner side of side wall of testing cassete set casing 231, the connection of the other end of the first elastic component 2313
Compact heap 2312;The middle part of fixed block 2315 is provided with via 2316, and the inside sidewalls of testing cassete set casing 231 are provided with accepting groove
2314;Fixed block 2315 is fixed in accepting groove 2314, outside contouring and the inner side contouring of via 2316 of compact heap 2312
Form fit, and compact heap 2312 can be along the axial movement of via 2316.
When testing cassete 232 inserts testing cassete set casing 231 from opening, the side wall of testing cassete 232 can pushing tow compact heap
2312 return, and compact heap 2312 can then be resisted against the side of testing cassete 232 all the time due to the reaction force of the first elastic component 2313
On wall, so as to carry out reliable location with to testing cassete 232, prevent testing cassete from freeing and rock;And due to the first elastic component 2313
The performance of compressible and resilience so that compact heap 2312 can stretch out and return LAP such that it is able to allow that there is difference
It is fixed in the testing cassete insertion testing cassete set casing 2310 of size, the versatility of testing cassete fixing device is improve with this,
And also extremely convenient is operated, the testing efficiency of board can be improved.
Self-test box set casing is set on the end face of the side wall that can stretch out testing cassete set casing 231 in compact heap 2312
Guide part 2317 from 231 opening to the bottom angled of testing cassete set casing 231 and be undertaken on the compression of the end of guide part 2317
Portion 2318;Guide part 2317 has guide effect to testing cassete 232, is beneficial to the insertion of testing cassete 232, and by compressed part
2318 are fixed testing cassete 232.
Incorporated by reference to shown in Fig. 1 to Fig. 4, testing cassete 232 includes that the housing 2320, Outside Dimensions of upper end open is more than housing
The upper lid 2322 and board fixed plate 2323 of the Outside Dimensions of 2320 opening, upper lid 2322 are removably attached to housing
2320 upper end, and upper lid 2322 near its peripheral region stretches out the side-wall outer side of housing 2320, board fixed plate 2323
Can floating ground located at upper lid 2322 upper surface;Board fixed plate 2323 is provided with multiple corresponding with the bump position of board
First through hole 2324, the position corresponding with first through hole 423 of upper lid 2322 is provided with the 3rd pin 2326, the 3rd pin
2326 lower end electrically connects with the second pin 270 of test pin input port 27, and Shang Gai is stretched out in the upper end of the 3rd pin 2326
2322 upper surface and corresponding with first through hole 2324.
Multiple elastic supporting member for supporting optical member 2325 are provided with upper lid 2322, the elastic supporting member for supporting optical member 2325 includes guide cylinder 23251, branch
The elastic component (not shown) of strut 23252 and second, guide cylinder 23251 is vertically fixed on lid 2322 and extend into housing
In 2320, in guide cylinder 23251, one end of support bar 23252 is slideably socketed on guide cylinder 23251 to the second elastic component
Interior and its end face is abutted with the first elastic component, and the other end fixed connecting plate of support bar 23252 fixes the lower surface of fixed board 2323;
When push plate fixes fixed board 2323 to the push rod of testing jig (not shown) from top to bottom, the second elastic component is compressed, and board is fixed
Plate 2323 is moved downward, when hold down assembly 24 the second drive mechanism 241 drive 242 lifting of lower platen when, the second elastic component return
Again so as to support bar 23252 is extrapolated to guide cylinder 23251 so that board fixed plate 2323 is moved upwards.
Multiple flexible positioning pieces 2328 can be provided with upper lid 2322, the flexible positioning piece 2328 include sleeve 23281,
The elastic component (not shown) of locating rod 23282 and the 3rd, at the position corresponding with flexible positioning piece 323 of board fixed plate 2323
The second through hole 2329 is provided with, sleeve 23281 is vertically fixed on lid 2322, the 3rd elastic component is fixed in sleeve 23281
One end of position bar 23282 is slideably socketed in sleeve 23281, and the other end of locating rod 23282 is provided with taper location division
23283, and the taper location division 23283 passes the second through hole 2329;Flexible positioning piece 2328 can be fixed to putting into board
Board (not shown) on plate 2323 is accurately positioned, and when being positioned to board, the datum hole on board is socketed in cone
On shape location division 23283, taper location division 23283 can carry out self-adaptative adjustment to the position of board, to improve determining for board
The accuracy of position.
Alignment pin 2319 can be provided with the upper end of the side wall of testing cassete set casing 231, in the upper lid 323 of testing cassete 232
The side-wall outer side for stretching out housing 2320 region in be provided with the location hole 2327 matched with alignment pin 2319;Work as testing cassete
232 are plugged in when in testing cassete set casing 231, and the correspondence of location hole 2327 is socketed on alignment pin 2319;Using this positioning side
Formula, can exactly navigate on testing cassete set casing 231 testing cassete 232, and its Position location accuracy not tested person box 232
The influence of size.
The above is only the preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
For member, on the premise of the technology of the present invention principle is not departed from, some improvement and replacement can also be made, these improve and replace
Also should be regarded as protection scope of the present invention.
Claims (10)
1. a kind of board test machine, it is characterised in that including pedestal, the board test device being arranged on the pedestal, be used for
Convey the conveyer and the manipulator for capturing and carrying board, the board test device and the manipulator of board
It is located on the pedestal, the optical orientator for positioning mechanical arm run location is additionally provided with the pedestal;Wherein, the plate
Card test device includes base, the portal frame being erected on the base, board test suite and is arranged on the portal frame
Top, for compressing holding down assembly for board;The base is provided with guide rail and the first drive mechanism, the board test group
Part is arranged on the guide rail, and first drive mechanism drives the board test suite to be moved along the guide rail;The dragon
The lower end of door frame is provided with test pin receiving port, opposite with the test pin receiving port on the board test suite
Sidepiece be provided with the test pin input port corresponding with the test pin receiving port;When first drive mechanism
When driving the board test suite to be moved into the portal frame, the test pin input port and the test pin receiving terminal
Mouth correspondence grafting.
2. board test machine according to claim 1, it is characterised in that the lower end of the portal frame is provided with transverse slat, described
The two ends of transverse slat are connected across on two relative columns of the portal frame respectively;The test pin receiving port includes pin
Integrated package and multiple first pins, the pin integrated package are fixed on the middle part of the transverse slat, multiple first pin arrangements
On the pin integrated package, and the two ends of first pin pass from the pin integrated package.
3. board test machine according to claim 2, it is characterised in that the test pin input port includes multiple the
Two pins, multiple second pins are arranged on the sidepiece, and one end of the second pin extend into the board survey
In examination component, the other end of the second pin exposes the board test suite;Described in being driven when first drive mechanism
When board test suite is moved into the portal frame, the first pin connection corresponding with the second pin.
4. the board test machine according to Claims 2 or 3, it is characterised in that the sidepiece of the board test suite
It is provided with the interface corresponding with the pin integrated package position;When first drive mechanism drives the board test group
When part is moved into the portal frame, the pin integrated package correspondence is plugged in the interface.
5. board test machine according to claim 1, it is characterised in that the board test suite include testing cassete and
The testing cassete set casing of the upper opening surrounded by base plate and side wall;The bottom of the testing cassete set casing is connected to the guide rail
On, the testing cassete set casing side wall opposite with the test pin receiving port is provided with for the test pin receiving terminal
The interface of the pin integrated package correspondence grafting of mouth;
It is provided with the inside of the side wall of the testing cassete set casing and is held down assembly, at least a portion of the compact heap for holding down assembly
Can stretch out and return from the inside of the side wall of the testing cassete set casing;When testing cassete is inserted from the opening of the testing cassete set casing
When entering the testing cassete set casing, the compact heap is resisted against on the side wall of the testing cassete.
6. board test machine according to claim 5, it is characterised in that described to hold down assembly including the first elastic component, pressure
Tight block and fixed block, one end of first elastic component are connected on the inner side of side wall of the housing, first elastic component
The other end connect the compact heap;Via is provided with the middle part of the fixed block, the inside sidewalls of the testing cassete set casing set
There is accepting groove;The fixed block is fixed in the accepting groove, the outside contouring of the compact heap and the via inside portion
Contour shape coordinates, and the compact heap can be along the axial movement of the through hole.
7. the board test machine according to claim 5 or 6, it is characterised in that the compact heap stretches out the testing cassete and consolidates
The end face for determining the side wall of shell is provided with from the opening of the testing cassete set casing and is set to the testing cassete set casing bottom angled
Guide part and be undertaken on the compressed part of the guide part end.
8. board test machine according to claim 5, it is characterised in that the testing cassete include upper end open housing,
Outside Dimensions are more than the upper lid and board fixed plate of the Outside Dimensions of the opening of the housing, and the upper lid is removably secured
The side-wall outer side of the housing, the board are stretched out in close its peripheral region of the upper end of the housing, and the upper lid
Fixed plate can floating ground located at the upper lid upper surface;
The board fixed plate is provided with multiple first through hole corresponding with the bump position of board, it is described it is upper cover with it is described
The corresponding position of first through hole is provided with the 3rd pin, lower end and the test pin input port of the 3rd pin
Pin is electrically connected, and the upper surface of the upper lid and corresponding with the first through hole is stretched out in the upper end of the 3rd pin.
9. board test machine according to claim 8, it is characterised in that the upper end of the side wall of the testing cassete set casing sets
There is alignment pin, be provided with the region of the side-wall outer side for stretching out the testing cassete set casing of the upper lid and the alignment pin phase
The location hole matched somebody with somebody;When the testing cassete is plugged in the testing cassete set casing, it is described fixed that the location hole correspondence is socketed on
On the pin of position.
10. board test machine according to claim 8, it is characterised in that the upper lid is provided with multiple flexible positioning pieces,
The flexible positioning piece includes sleeve, locating rod and the 3rd elastic component, in the board fixed plate and the flexible positioning piece phase
The second through hole is provided with corresponding position, the sleeve is vertically fixed on the upper lid, the 3rd elastic component is located at institute
State in sleeve, one end of the locating rod is slideably socketed in the sleeve, and the other end of the locating rod is provided with taper
Location division, and the taper location division passes second through hole.
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CN201710071023.5A CN106908633B (en) | 2017-02-09 | 2017-02-09 | Board card testing machine |
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CN201710071023.5A CN106908633B (en) | 2017-02-09 | 2017-02-09 | Board card testing machine |
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CN106908633B CN106908633B (en) | 2020-10-16 |
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