CN106886843A - Based on the digital microcurrent-controlled failure of chip detection method and system of improving particle cluster algorithm - Google Patents
Based on the digital microcurrent-controlled failure of chip detection method and system of improving particle cluster algorithm Download PDFInfo
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Abstract
The present invention relates to a kind of based on the digital microcurrent-controlled failure of chip detection method and system of improving particle cluster algorithm, belong to micro- digital microcurrent-controlled failure of chip detection field, for the digital microcurrent-controlled failure of chip detection method fault location time for solving prior art shortcoming more long, and a kind of digital microcurrent-controlled failure of chip detection method based on improvement particle cluster algorithm is proposed, including：Obtain original position and the final position of test droplets；Build taboo list；At least one population is built, is that each population builds corresponding location matrix；The velocity vector of each particle in particle cluster algorithm is determined, until all adjacent electrodes are traversed；According to the position sequence of formula more new particle；The fitness of the position vector of each particle is calculated, and determines the current shortest path of each population and global shortest path respectively；Repeat the above steps, until predetermined iterations is reached, the global shortest path of output.Fault detect of the present invention suitable for digital microcurrent-controlled chip.
Description
Technical field
The present invention relates to a kind of based on the digital microcurrent-controlled failure of chip detection method and system of improving particle cluster algorithm, category
In micro- digital microcurrent-controlled failure of chip detection field.
Background technology
With the development of science and technology, field of automatic testing is expanded to microcomputer from the test to analog circuit or digital circuit
The test of electric system MEMS (Micro-Electromechanical Systems).Micro-fluidic chip is also referred to as laboratory on piece
(Lab-on-a-chip), can be completed on one piece several square centimeters of chip biology laboratory and conventional chemical inspection it is each
Plant function.With miniaturization, high sensitive, low cost, it is integrated the features such as.First generation microflow controlled biochip has permanent quarter
The micro-valve of erosion, Micropump and fluid channel, continuous flow of fluid is all based on as concrete operations.Micro-fluidic technologies and manufacturing process
Development promoted the generation of digital microcurrent-controlled chip, digital microcurrent-controlled chip is in the discrete liquid of two-dimentional micro-fluidic array upper-pilot
Drop, with the system architecture that can significantly extend.
Digital microcurrent-controlled chip with continuous fluid control compared with, emphasize for liquid dispersion to turn to micro drop to operate,
Each drop is individually controlled, and energy consumption is very low, is particularly well-suited to need high-performance and operates more complicated biochemical analysis.With biography
The Biochemical Analyzer of system pattern is compared, and digital microcurrent-controlled chip has small reusable, size, high degree of automation, integrated
Spend high advantage.Have the ability it is accurate drive micro liquid (as little as microlitre even the other liquid of nanoliter level), stream is completed on chip
The operations such as transport, storage, separation and the mixing of body, overdelicate biochemistry detection is completed with low cost, can significantly reduce survey
Examination time and lab space, due to reducing manual operation process, increased the stability and accuracy of result.Therefore facing
The aspects such as bed diagnosis, biologic medical, health examination, pharmacodiagnosis, the detection of air quality all have wide practical use, and have
Important meaning.
With the development of digital microcurrent-controlled chip, in order to meet the requirement of the biochemical analysis experimental system for becoming increasingly complex,
The scale and chip density of digital microcurrent-controlled chip expand rapidly, so very easily occur various physics events in use
Barrier and fault in production, such failure, with more danger, are also easier to destructive failure occur for microfluidic system.
Meanwhile, digital microcurrent-controlled biochip is commonly used in the safety-critical such as biological detection, clinical diagnosis, drug development field, its reliability
Property turn into make and design major criterion.To ensure the reliability of chip system, it is necessary to carry out effective and comprehensive failure
Detection.The validity test of chip is not only existed only in after the completion of chip production, before carrying out biochemistry detection, or even test into
It is required for constantly being tested during row, to ensure stability.After the completion of fault detect, in order to realize experiment drop walking
Route is reconfigured, in addition it is also necessary to chip array carry out accurate fault location.How the test path of test droplets is entered
It is to save the chip testing time, improve the key problem of chip testing efficiency that professional etiquette is drawn.
The method of testing of digital microcurrent-controlled chip is actual measurement is tried the electrode unit that drop travels through chip, therefore experiment drop is walked
The length for crossing path directly affects the length of testing time.In order to not influence the normal work of experiment drop, digital microcurrent-controlled core
Chip arrays fault detect belongs to the routing problem under resource constraint, belongs to np hard problem.
Accordingly, it would be desirable to a kind of fault detection method of new digital microcurrent-controlled chip so that ensureing fault coverage
Under the premise of, farthest shorten fault location time, fault detection efficiency is improved, testing cost is saved, ensure digital miniflow
Control the security of chip.
The content of the invention
The invention aims to during the digital microcurrent-controlled failure of chip detection method fault location for solving prior art
Between shortcoming more long, and propose a kind of new based on the detection of digital microcurrent-controlled failure of chip and positioning side for improving particle cluster algorithm
Method.
Based on the digital microcurrent-controlled failure of chip detection method for improving particle cluster algorithm, it is characterised in that including following step
Suddenly：
Step one：Obtain original position and the final position of test droplets；The test droplets are used for digital microcurrent-controlled
Whether there is failure between being moved between the adjacent electrode array of chip to judge the adjacent electrode array；Each two adjacent electrode battle array
Side between row has been assigned mutually different numbering；
Step 2：Build taboo list, the taboo list is used to depositing the side that drop can not access in current location and
Side through accessing；
Step 3：At least one population is built, is that each population builds corresponding location matrix, the position
The line number of matrix represents the total number of particles in particle cluster algorithm；The columns of the location matrix is formed between representing adjacent electrode array
The sum on side；The velocity vector of the specific particle of element representation in the location matrix at special electrodes array；The speed
The sequence number on the side where vectorial each particle for subsequent time of degree；
Step 4：The velocity vector Speed of each particle in particle cluster algorithm is determined, until all sides are traversed；Institute
Velocity vector Speed is stated to determine especially by the random a kind of of following manner：
A, select the random one side Speed for allowing selection1；
B, select from the closest a line Speed in current location2；
The side Speed adjacent with the position at current time in the shortest path sequence that C, the last iteration of selection are obtained3；
Step 5：According to formulaThe position sequence of more new particle, wherein Xt=(1, x1,x2,...,xt,
0 ...), xtIt is the position of t particle, Vt=(0,0,0 ..., xt+1, 0 ...), xt+1=Speed；
Step 6：The fitness of the position vector of each particle is calculated, and determines each respectively
Current shortest path PbestiAnd global shortest path Gbest；The fitness is used to represent the side of generation
The length in the path corresponding to ordered sequence；
Step 7：Iteration step 3 is to step 6, until predetermined iterations is reached, the global shortest path of output
Gbest。
Beneficial effects of the present invention are：It is maximum in the premise for ensureing fault coverage using particle cluster algorithm
Shorten fault location time, improve fault detection efficiency, save testing cost, ensure the security of digital microcurrent-controlled chip.Together
When, the present invention merges the thought of PSO algorithms and greedy algorithm, improvement particle cluster algorithm is solved elementary particle group and solves
The difficulty faced during routing problem, and have efficiency higher.To the position of particle in basic PSO algorithms, speed and
Operation is redefined, and makes particle cluster algorithm that numeral is completed more suitable for solving shortest path first's problem, preferably micro-
The online fault detect of fluidic chip.Meanwhile, the present invention proposes to carry out fault location using infraluminescence pipe and infrared receiving tube
Method, can effectively find trouble point, be easy to follow-up experiment droplet path reconstruction.
Brief description of the drawings
Fig. 1 is the flow chart based on the digital microcurrent-controlled failure of chip detection method for improving particle cluster algorithm of the invention；
Test result when Fig. 2 (a) is digital microcurrent-controlled chip fault-free unit；
Test result when Fig. 2 (b) is digital microcurrent-controlled chip faulty unit；
The schematic diagram that Fig. 3 (a) is moved for the drop of digital microcurrent-controlled chip in one embodiment since starting point；Wherein
Two connected expression short circuits of electrode；Arrow represents moving direction；
Fig. 3 (b) moves to the schematic diagram of location of short circuit for the drop of Fig. 3 (a)；
Fig. 4 (a) is the schematic diagram that is moved since starting point of drop of digital microcurrent-controlled chip in another embodiment；Its
In two electrodes connected expressions short circuit；Arrow represents moving direction；
Fig. 4 (b) for Fig. 4 (a) drop due to deviate moving direction and by the situation of fault electrode；
Fig. 4 (c) is moved to the situation of next electrode for the drop of Fig. 4 (b) does not rest on fault electrode；
Fig. 5 is by schematic diagram that micro-fluidic chip model conversion is figure.
Specific embodiment
The present invention relates to general principle it is as follows：
The mode of digital microcurrent-controlled chip drives microfluid is that dielectric soaks driving.Electricity is applied to drop by electrod-array
To change its surface tension, the solid surface tension of liquid utilized on hydrophobic polymer surface changes to drive drop for field.In order that liquid
Drop movement, driving voltage is added on adjacent electrode unit, using dielectric electro-wetting principle so that electricity is accumulated on the surface of drop
Amount, so as in the surface tension gradient of droplet surface generation covering adjacent electrode, when the tension force more than upper and lower surface and drop it
Between resistance when, just can complete drop movement driving, this be control drop movement most basic method.By corresponding
Applied voltage sequence on electrod-array, it becomes possible to basic operation in realizing realizing biochemistry detection on chip, such as：Liquid droplet distribution,
Transport, storage, mixing and separation etc..
Digital microcurrent-controlled failure of chip type is divided into two kinds：Parametric failure and permanent fault.Parametric failure is main
Produced in manufacturing process, such as dimensional parameters error causes, when electrod-array not level, not parallel between two layers of surface or electrode
When in uneven thickness, the driving of digital drop will be affected, and it is larger that influence of such failure to experimental result shows as generation
Deviation, is severely impacted the performance of chip.
Permanent fault is caused by the open circuit and short circuit between chip electrode unit, and these failures are probably derived from and made
Cheng Zhong, or caused by the improper caused electrode degradation of control voltage.Permanent fault can cause drop to rest on failure
Unit, it is impossible to advanced according to design route, it is impossible to complete experiment and move to waste liquid pool, cause the failure of biochemistry detection, in safety
Property require that the application in field high can produce great harmful effect.Present invention primarily contemplates the online fault detect of permanent fault
Method.
The permanent fault of digital microcurrent-controlled chip can mainly cause the drop of system cannot to move, therefore can be according to survey
Whether test solution drop movement normally judges whether failure, but due to failure may the generation when experiment is carried out, so needing
Test is constantly carried out to chip and just can guarantee that chip long-term stable operation.Can make detection drop and experiment drop and survey
On-line testing method：By to electrode applied voltage so as to control test droplets from individually detection liquid stock solution pond,
Test order is followed on the premise of not influenceing experiment drop to walk, test terminal is eventually arrived at by traveling through array element.At end
Point end increases capacitive detection circuit and judges that test droplets are reached, that is, complete fault test.As shown in Figure 2：
But drop is traveled through each electrod-array can not complete fault detect, from above-mentioned introduction, forever
Failure can be caused by short circuit between electrode, and different situations, Fig. 3 Fig. 4 occur during the adjacent electrode of test droplets experience short circuit
In (a) represent drop original position and the direction of motion, solid line be connected represent two electrodes between short circuit, i.e., driving voltage simultaneously produce
It is raw to disappear simultaneously.To Fig. 3, the direction of motion is parallel with electric pole short circuit direction, when drop is by two short-circuit electrodes, due to left and right
Driving voltage is produced and disappeared simultaneously simultaneously, and drop can be rested in the middle of short-circuiting electrode, such as (b).To Fig. 4, drop direct of travel with
Short-circuiting electrode direction is mutually perpendicular to, and being off slightly from shown in (b) is had during by abort situation, but still can be by short circuit
Electrode reaches the unit of lower an array, such as (c), trouble unit is not rested on.
So, to prevent above-mentioned situation, it is necessary to test all array elements and adjacent array element, so that
Just can guarantee that the validity of detection and the reliability of chip operation.The online fault detection problem of digital microcurrent-controlled chip is converted into
Find the most short problem for traveling through all array elements and adjacent array element.
Digital microcurrent-controlled failure of chip detection is solved the problems, such as present invention uses basic particle group algorithm.
The flight of basic particle group algorithm (Particle Swarm Optimization, PSO) principle main analog flock of birds
Foraging behavior, is cooperated by the collective of flock of birds and reaches the purpose of optimizing.In PSO algorithms, each particle utilizes the history of itself
The information that the globally optimal solution of optimal location and whole population is provided, constantly flies in solution space, realizes finding optimal solution
Purpose.
If search space is N-dimensional, total population is Num, and i-th position of particle is xi=(xi1,xi2,...,xin), the
The velocity vector of i particle is Vi=(vi1,vi2,...,vin), i-th in-flight particle optimal location of particle is Pi=
(Pi1,Pi2,...,Pin), PsThe global optimum's particle for being found in whole population so far is represented, particle is as follows
Flight：
vij t=w × vij t+c1×r1×[Pij t-xij t]+c2×r2×[Psj t-xij t]
xij t+1=xij t+vij t+1
Wherein, subscript j represents that jth is tieed up, and t is the number of times of flight；W is inertia weight, particle is kept motional inertia, control
Influence of the previous speed to present speed, larger w is applied to solution space is detected on a large scale, less w be suitable for into
Row small range optimizing；c1,c2It is aceleration pulse, generally in 0~2 value, c1Regulation particle flies to itself desired positions direction
Step-length, c2Regulation particle is to global desired positions flight step-length；r1,r2It is separate random number between [0,1].Particle
Each dimension excursion is [X in position vectormin,Xmax], speed variation is [Vmin,Vmax], if position and speed in iteration
Boundary value is then taken more than bounds.By particle, constantly pace of change vector changes position to PSO algorithms in solution space,
Finally seek optimal solution.
Analyzed from sociological angle, the Part I of speed iterative formula is " memory " item, the speed before being particle
Degree, illustrates that particle present speed vector will be acted on by last speed；Formula Part II is " autognosis " item, be from
Current point particle position points to the individual optimal vector of particle, illustrates experience of the motion of particle before particle；
The Part III of formula is " group is cognitive " item, is a vector that colony's optimum point is pointed to from current point, is reflected interparticle
Information Sharing and cooperative cooperating.Particle determines speed and the position of subsequent time by the optimal experience of experience and colony.
It is exactly that Part I serves Local Search and the global ability of balance, Part II ensures that particle possesses local search ability,
Preferably explore solution space；Part III illustrates interparticle Information Sharing, particle is explored broader space, so
Particle can effectively search optimal solution.
Specific embodiment one：The digital microcurrent-controlled failure of chip detection based on improvement particle cluster algorithm of present embodiment
Method, as shown in figure 1, comprising the following steps：
Step one：Obtain original position and the final position of test droplets；The test droplets are used for digital microcurrent-controlled
Whether there is failure between being moved between the adjacent electrode array of chip to judge the adjacent electrode array；Each two adjacent electrode battle array
Side between row has been assigned mutually different numbering.
Specifically, it is for liquid storage tank present on correspondence lion micro-fluidic chip to set original position and final position
And waste liquid pool, testing drop need to reach waste liquid pool from liquid storage tank after traveling through all electrod-arrays and adjacent electrod-array,
So needing to determine original position and the final position of drop, to reduce the dimension of solution space first, the efficiency of test process is improved.Together
When, according to experiment droplet position determine can not access while and passed by while, be stored in taboo list, according to experiment drop
Motion, upgrade in time taboo list.
Chip is traveled through adjacent two unit problem and is converted into figure, founding mathematical models by the present invention.In view of chip form rule
Design feature then, carries out the solution of problem using discrete particle cluster algorithm for convenience, by the physical model profit in chip
Carried out with the related notion in graph theory equivalent.Each electrode unit is equivalent to the point in figure, two vertically or horizontally phases
Adjacent electrode unit is equivalent to a line, it is abstract after figure represented with G=(V, E), digital microcurrent-controlled chip model such as Fig. 5 shows.
Research shows that digital microcurrent-controlled chip testing problem is a kind of traversal electrod-array unit array element adjacent thereto
Problem.The model of chip is unconnected graph, and theoretical by Eulerian path, we are unlikely to find once and only once pass through
Path per a line.Assuming that experiment drop is passed by, the time of each edge is certain, can be converted into chip on-line testing problem
Find the shortest route problem on all sides in traversing graph.Two side i are tried to achieve by Floy algorithms, the shortest path d between jij.Assuming that
The total number on the side that test droplets need to be traveled through is n, xijThe side that representative need to be accessed, the solution space of problem is X=(X1,X2,...Xk),
I-th feasible solution is Xi=(xi1,xi2,...,xin), the fitness function of the feasible solution is
Then on-line testing problem can be converted into and seek optimal solution z：
From step one, digital microcurrent-controlled failure of chip on-line testing problem finds optimal path to access difference
Problem, similar to TSP problems.TSP problems require each point access and only access once, and this problem in the absence of traversal and only
Access the loop of each edge.
Step 2：Build taboo list, the taboo list is used to depositing the side that drop can not access in current location and
Side through accessing.
Specifically, in taboo list can not access while can include experiment drop where while.Experiment drop is several
Word micro-fluidic chip when experiment is normally used for, existing drop thereon.And the test droplets that the present invention is previously mentioned are and reality
Test that drop is different, another drop for test failure.The present invention can be normally carried out the situation of experiment in experiment drop
Under tested, and experiment show, test droplets and experiment drop between to have certain spacing distance, two drops can not be in
Direct neighbor or diagonal adjacent array element, can otherwise cause droplet coalescence, so static constraint condition is：To random time
Unit t, di(test droplets) and dj(experiment drop) is needed in horizontal or vertical direction at a distance of more than a coordinate unit (otherwise
Test droplets may be in experiment droplet coalescence)：
|xi t-xj t| ＞ 1 and | yi t-yj t| ＞ 1
Meanwhile, diCan not be with d in the target location of future time piecejIt is adjacent, it is dynamic constrained condition, use mathematical formulae table
It is shown as：
|xi t+1-xj t| ＞ 1 and | yi t+1-yj t| ＞ 1
It means that due to the presence of experiment drop, there is dynamic constraint in On-line Fault Detection problem.
Step 3：At least one population is built, is that each population builds corresponding location matrix, the position
The line number of matrix represents the total number of particles in particle cluster algorithm；The columns of the location matrix is formed between representing adjacent electrode array
The sum on side；The velocity vector of the specific particle of element representation in the location matrix at special electrodes array；The speed
The sequence number on the side where vectorial each particle for subsequent time of degree.
Specifically, particle cluster algorithm is applied into fault test the very corn of a subject thought is：Each particle is from start bit
Beginning is put, the position on side where lower a moment is produced according to algorithm flow successively, and forms motion sequence.Set algorithm parameter：Calculate
Method maximum iteration genmax, speed parameter rand1、rand2And rand3With number of particles a.Initialization iterations, particle
Group's algorithm needs to produce the position of primary group.In the present invention, in order to improve detection efficiency, shorten detection time, improve
Particle cluster algorithm, can simultaneously produce multiple colonies, while scanning for.
For example when Liang Ge colony A and B is produced, if test droplets are tested since side " 1 ", then according to total side number and particle
Sum produces colony A and colony's beta particle initial position vector respectively.Location matrix is used for recording when each particle is scanned for
The order arrangement on the side crossed, velocity vector represents the position of subsequent time particle.Population scale ensure that the validity of algorithm,
Population scale is big, it is easier to contain optimal solution, and iterations is few when finding optimal path, but the time required to each iteration more
It is long.
Step 4：The velocity vector of each particle in particle cluster algorithm is determined, until all sides are traversed；The speed
Vector determines especially by the random a kind of of following manner：
A, select the random one side Speed1 for allowing selection.
B, select from the closest a line Speed2 in current location.
The Speed3 adjacent with current time position in the shortest path sequence that C, the last iteration of selection are obtained.
Specifically, the sequence number on side where the location of particle subsequent time, i.e. particle is defined as speed by the present invention
Vector.Used here as the method choice particle rapidity vector that greedy algorithm and particle cluster algorithm are combined, velocity vector herein
It is by randomly selected in above-mentioned tri- kinds of methods of A, B, C.Can be optimal to obtain by adjusting the probability proportion of A, B, C
Parameter.
Below by taking the micro-fluidic chip of Fig. 5 as an example, the method for illustrating to determine velocity vector：
If the most short optimal path of complete particle that previous iteration is formed is：Gbest=(1,5,7,3,8,2,6,4,12,9,
10、11)
3 particles are had, this route searching proceeds to the 5th moment, and the motion sequence of formation is；
For particle 1, the new position Speed not passed by is randomly generated1=8.By figure as can be seen that from upper a period of time
It is " 12,7,5 " to carve position " 10 " nearest side, and Speed is randomly choosed here2=12.Observation optimal path, " 10 " position
Be afterwards " 11 ", and particle 1 do not pass by also " 11 " in this search, then Speed3=11.
If the influence shared by 3 partial velocity components is respectively 20%, 50%, 30%.Then setup parameter rand1=0.2,
rand2=0.7, rand3=0.1, the random number p between 0 to 1 is produced, if p<rand1, select Speed=Speed1For next
Moment position；If rand1<p<rand2, select Speed=Speed2It is subsequent time position；rand2<p<rand3, selection
Speed=Speed3It is subsequent time position.
If random number p=0.5627, then Speed=12, location matrix is changed into：
In this way, the position to each particle each moment is updated.
Step 5：According to formulaThe position sequence of more new particle, wherein Xt=(1, x1,x2,...,xt,
0 ...), xtIt is the position of t particle, Vt=(0,0,0 ..., xt+1, 0 ...), xt+1=Speed.
Specifically, from description above, digital microcurrent-controlled on-line testing is class TSP problems, belongs to discretization and asks
Topic.With foregoing PSO Algorithm, the problem is needed to the position of particle, velocity encoded cine and operator in basic PSO algorithms
Redefined.The position of particle is the sequence on the side passed by, and speed is defined as the position of the particle subsequent time, during t
The position sequence for carving certain particle is Xt=(1, x1,x2,...,xt, 0 ...), Vt=(0,0,0 ..., xt+1, 0 ...), x hereint +1=Speed (see step 4), defining location updating formula is：
That is Xt+1=(1, x1,x2,...,xt,xt+1,0,...)。
Step 6：The fitness of the position vector of each particle is calculated, and determines the current shortest path of each population respectively
Footpath PbestiAnd global shortest path Gbest；Fitness is used for the path corresponding to the ordered sequence on the side for representing generation
Length.
Step 7：Iteration step 3 is to step 6, until reaching predetermined iterations genmax, the output overall situation is most
Short path Gbest.
Specific embodiment two：Present embodiment from unlike specific embodiment one：
In step 4, velocity vector Speed is 20% especially by the ratio that mode A determines, the ratio that pass-through mode B determines
Rate is 50%, and the ratio that pass-through mode C determines is 30%.
Being previously noted can adjust out optimal parameter, this implementation by adjusting the mode of tri- kinds of ratios of mode of A, B, C
The ratio provided in mode is one group of preferred ratio.
Other steps and parameter are identical with specific embodiment one.
Specific embodiment three：Present embodiment from unlike specific embodiment one or two：
Also there is experiment drop, the experiment drop meets following bar with the test droplets on digital microcurrent-controlled chip
Part：
|xi t-xj t| ＞ 1 and | yi t-yj t| ＞ 1
|xi t+1-xj t| ＞ 1 and | yi t+1-yj t| ＞ 1
Wherein, xi tRepresent abscissa of the test droplets in t, yi tRepresent ordinate of the test droplets in t, xj t
Represent abscissa of the experiment drop in t, yj tRepresent ordinate of the experiment drop in t, xi t+1Represent test droplets in t
The abscissa at+1 moment, yi t+1Represent ordinate of the test droplets at the t+1 moment.
It is i.e. foregoing, in order to ensure that experiment drop is not merged with test droplets, and need the static constraint of satisfaction and move
Modal constraint condition.
Other steps and parameter are identical with specific embodiment one or two.
Specific embodiment four：Unlike one of present embodiment and specific embodiment one to three：
In the mode A of step 4, " allowing the side of selection " is any limit not in taboo list.The benefit for so setting
It is that can as far as possible avoid test droplets and test merging for drop, reduces the probability of test crash.
Other steps and parameter are identical with one of specific embodiment one to three.
Specific embodiment five：Present embodiment provides a kind of based on the digital microcurrent-controlled chip event for improving particle cluster algorithm
Barrier detecting system, including：At least one liquid storage tank, for producing experiment drop and/or test droplets；Waste liquid pool, for reclaiming
By the experiment drop after micro-fluidic chip；The electrode being connected with liquid storage tank on micro-fluidic chip micro-fluidic chip is used as initial electricity
Pole, the electrode being connected with waste liquid pool is used as terminal electrode；Main control unit, for according to any in such as specific embodiment one to four
Method described in one produces global shortest path, and by controlling the electrode Control release drop of micro-fluidic chip along the overall situation
Shortest path is moved.
The beneficial effect of present embodiment has been to provide a kind of to be entered foregoing digital microcurrent-controlled chip on-line testing method
The hardware configuration of row concrete application.
Specific embodiment six：Present embodiment from unlike specific embodiment five：
The electrod-array of micro-fluidic chip is n × n, and system also includes：
The first infraluminescence pipe group being separately positioned on the outside of two adjacent edges of micro-fluidic chip and the second infrared hair
Light pipe group, the first infraluminescence pipe group and the second infraluminescence Guan Zujun include n infraluminescence pipe corresponding with electrode；With
And it is separately positioned on the first infrared receiving tube group and the second infrared receiver on the outside of the two other adjacent edge of micro-fluidic chip
Pipe group, the first infraluminescence pipe group and the second infraluminescence Guan Zujun include n infraluminescence pipe corresponding with electrode, are used for
Receive the infrared light that the first infraluminescence pipe group and the second infraluminescence pipe group are launched；Main control unit is used for basis and does not receive
Sequence number to the second infrared receiving tube of infrared light determines the position of the electrode for breaking down.
Specifically, the permanent fault of digital microcurrent-controlled biochip can mainly cause the drop of system cannot to move,
Therefore forward purchasing can be moved according to test droplets and judges whether that failure, i.e. test droplets are triggered from liquid storage tank, in electrod-array
Whether unit is moved, reached in destination terminal test experience drop.If running into trouble unit, drop can be stuck in the array element
On, it is impossible to reach home.Therefore the beneficial effect of present embodiment is, it is possible to use infraluminescence pipe and reception pipe are to failure
Position is positioned, and infraluminescence pipe, the corresponding electrode peace of right-hand member and upper end are installed in digital microcurrent-controlled chip left end and lower end
Dress infrared receiving tube.Can so cause that the positioning of failure is quick and accurate.
After the completion of fault detect, experiment drop and detection drop are had on digital microcurrent-controlled chip, experiment drop can be with
The carrying out of experiment continues to move to, and the detection drop of abort situation is then fixed on the position, makes infraluminescence pipe by experiment drop
Driving voltage is synchronously triggered, and is emitted beam, and what reception pipe was not exported is then the position for having drop.Assuming that having n on chip
Drop, then after n drop is all moved, the row and column that reception pipe is not exported all the time as abort situation.
Other steps and parameter are identical with specific embodiment five.
The present invention can also have other various embodiments, in the case of without departing substantially from spirit of the invention and its essence, this area
Technical staff works as can make various corresponding changes and deformation according to the present invention, but these corresponding changes and deformation should all belong to
The protection domain of appended claims of the invention.
Claims (6)
1. it is a kind of based on the digital microcurrent-controlled failure of chip detection method for improving particle cluster algorithm, it is characterised in that including as follows
Step：
Step one：Obtain original position and the final position of test droplets；The test droplets are used in digital microcurrent-controlled chip
Adjacent electrode array between move to judge the adjacent electrode array between whether there is failure；Between each two adjacent electrode array
Side have been assigned mutually different numbering；
Step 2：Taboo list is built, the taboo list is for depositing the side and visited that drop can not be accessed in current location
The side asked；
Step 3：At least one population is built, is that each population builds corresponding location matrix, the location matrix
Line number represent total number of particles in particle cluster algorithm；The columns of the location matrix forms side between representing adjacent electrode array
Sum；The velocity vector of the specific particle of element representation in the location matrix at special electrodes array；The speed to
Measure the sequence number on the side where subsequent time each particle；
Step 4：The velocity vector Speed of each particle in particle cluster algorithm is determined, until all sides are traversed；The speed
Degree vector Speed determines especially by the random a kind of of following manner：
A, select the random one side Speed for allowing selection1As velocity vector Speed；
B, select from the closest a line Speed in current location2As velocity vector Speed；
The side Speed adjacent with the position at current time in the shortest path sequence that C, the last iteration of selection are obtained3As speed
Vectorial Speed；
Step 5：According to formulaThe position sequence of more new particle, wherein Xt=(1, x1,x2,...,xt,
0 ...), xtIt is the position of t particle, Vt=(0,0,0 ..., xt+1, 0 ...), xt+1=Speed；
Step 6：The fitness of the position vector of each particle is calculated, and determines the current shortest path of each population respectively
PbestiAnd global shortest path Gbest；The fitness is used for the path corresponding to the ordered sequence on the side for representing generation
Length；
Step 7：Iteration step 3 is to step 6, until predetermined iterations is reached, the global shortest path of output
Gbest。
2. method according to claim 1, it is characterised in that in step 4, the velocity vector Speed is especially by side
The ratio that formula A determines is 20%, and the ratio that pass-through mode B determines is 50%, and the ratio that pass-through mode C determines is 30%.
3. method according to claim 1 and 2, it is characterised in that also there is experiment liquid on the digital microcurrent-controlled chip
Drop, the experiment drop meets following condition with the test droplets：
|xi t-xj t|>1 and | yi t-yj t|>1
|xi t+1-xj t|>1 and | yi t+1-yj t|>1
Wherein, xi tRepresent abscissa of the test droplets in t, yi tRepresent ordinate of the test droplets in t, xj tRepresent
Test abscissa of the drop in t, yj tRepresent ordinate of the experiment drop in t, xi t+1Represent test droplets in t+1
The abscissa at quarter, yi t+1Represent ordinate of the test droplets at the t+1 moment.
4. method according to claim 3, it is characterised in that in the mode A of the step 4, the side for allowing selection
It is any limit not in taboo list.
5. a kind of based on the digital microcurrent-controlled failure of chip detecting system for improving particle cluster algorithm, it is characterised in that including：
At least one liquid storage tank, for producing experiment drop and/or test droplets；
Waste liquid pool, for reclaiming by the experiment drop after micro-fluidic chip；
Micro-fluidic chip, the electrode being connected with liquid storage tank on the micro-fluidic chip is connected as starting electrode with waste liquid pool
Electrode is used as terminal electrode；
Main control unit, for producing global shortest path according to the method as described in any one in Claims 1-4, and leads to
The electrode for controlling the micro-fluidic chip is crossed, controls the experiment drop to be moved along the global shortest path.
6. system according to claim 5, the electrod-array of the micro-fluidic chip is n × n, it is characterised in that institute
Stating system also includes：
The first infraluminescence pipe group being separately positioned on the outside of two adjacent edges of the micro-fluidic chip and the second infrared hair
Light pipe group, the first infraluminescence pipe group and the second infraluminescence Guan Zujun include n infraluminescence corresponding with electrode
Pipe；
The the first infrared receiving tube group and second being separately positioned on the outside of the two other adjacent edge of the micro-fluidic chip are red
Outer reception pipe group, the first infraluminescence pipe group and the second infraluminescence Guan Zujun are corresponding with electrode infrared comprising n
Luminous tube, for receiving the infrared light that the first infraluminescence pipe group and the second infraluminescence pipe group are launched；
The main control unit is used for the electricity broken down according to the sequence number determination of the second infrared receiving tube for not receiving infrared light
The position of pole.
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