CN106875373A - Mobile phone screen MURA defect inspection methods based on convolutional neural networks pruning algorithms - Google Patents

Mobile phone screen MURA defect inspection methods based on convolutional neural networks pruning algorithms Download PDF

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CN106875373A
CN106875373A CN201611154333.5A CN201611154333A CN106875373A CN 106875373 A CN106875373 A CN 106875373A CN 201611154333 A CN201611154333 A CN 201611154333A CN 106875373 A CN106875373 A CN 106875373A
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picture
neural networks
convolutional neural
mobile phone
phone screen
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CN106875373B (en
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宋明黎
高鑫
沈红佳
邱画谋
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Huizhou Xu Xin Intelligent Technology Co Ltd
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Zhejiang University ZJU
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Abstract

Mobile phone screen MURA defect inspection methods based on convolutional neural networks pruning algorithms, including:1) self-defined depth convolutional neural networks, a neutral net for being used for detecting mobile phone screen MURA defects is trained using existing training data;2) cut operator of convolutional neural networks is carried out using the method for adaptive template matching, reduces network size, shorten Riming time of algorithm;3) the mobile phone screen picture that high resolution camera shoots is carried out the scaling of different proportion, form picture pyramid, for the picture of each yardstick, using the method for sliding window by picture segmentation into fritter, sent into all fritter pictures as a group together in convolutional neural networks;4) all characteristic patterns in intermediate layer are chosen as the response diagram of defect, mobile phone screen MURA defect areas position is finally obtained using the method for Threshold segmentation.

Description

Mobile phone screen MURA defect inspection methods based on convolutional neural networks pruning algorithms
Technical field
The invention belongs to object detection and recognition field, it is related to detect specific objective from image, specifically detects mobile phone The method of screen defect.
Background technology
There is many weak points in traditional manually detection screen flaw method, in the present of industrial production high speed development My god, it cannot adapt to current industrial production and efficiently, accurately require completely.For mobile phone screen business men, find a kind of Efficiently, accurate automatic detection system is used to substitute manual detection link, becomes urgent demand.As computer is regarded The development in the fields such as feel, image procossing, the automated detection system based on machine vision becomes a kind of good solution. The program gathers mobile phone screen image by high resolution industrial camera, and then image information is carried out by image analysis module Treatment in real time, so as to judge whether mobile phone screen is qualified.
Traditional screen defects detection algorithm based on machine vision, the screen that one or more classifications are directed to mostly lacks Fall into what is be designed, without versatility, so for special flaw, it is necessary to write special algorithm.It is special due to screen Property, moire fringes when taking pictures in imaging are inevitable, and traditional algorithm can not well solve the problems, such as moire fringes.Separately Outward, although traditional algorithm can detect obvious wire, spot defect, lack for bulk MURA very light in imaging Fall into, accuracy rate is very low.Finally, traditional screen defects detection algorithm needs to adjust quantity of parameters, is especially changed in screen product During type, adjustment quantity of parameters can cause waste of time.Therefore, designing one has the algorithm of good generalization with very real Value.
In recent years, deep learning method generates tremendous influence in computer vision field.Deep learning uses multilayer Network structure, the hierarchical relationship and transfer mode of nervous system in simulation human brain, it is obtained in the multiple fields of pattern-recognition To being widely applied and achieve good achievement.This method is made using the sorting algorithm based on depth convolutional neural networks With pretreated mobile phone screen topography block as the input of grader, the characteristic pattern work of convolutional neural networks is then extracted It is testing result, defects detection problem is transformed into an image block classification problem, the depth model obtained by the method is not Only can effectively learn the background texture pattern to image, position defect exactly from the image block containing background texture Position, and have accuracy rate very high for bulk MURA defects.Additionally, being calculated compared to tradition using convolutional neural networks algorithm Method, parameter setting is less, because algorithm has good versatility, is particularly suited for the quick of screen product and remodels, and shortening is changed The type time, improve producing line efficiency.
The content of the invention
The present invention will overcome the drawbacks described above of the screen defects detection algorithm based on machine vision, there is provided one kind is based on convolution The mobile phone screen MURA defect inspection methods of neural networks pruning algorithm.
To achieve the above object, the mobile phone screen MURA defects based on convolutional neural networks pruning algorithms of the present invention Detection method comprises the following steps:
1) self-defined convolutional neural networks, train the network until restraining and have compared with high-accuracy by training data;
2) beta pruning of convolutional neural networks is carried out by the method for adaptive template matching, network size and network is reduced Parameter;
3) mobile phone screen image data is gathered, picture pyramid is generated, picture block is divided into, for the life of test phase data Into being sent to step 2) computing is carried out in convolutional neural networks after the beta pruning that obtains;
4) the characteristic pattern sum of middle hidden layer is taken as response diagram, and defect final position is obtained using the method for Threshold segmentation And iris out, the method is particularly for detection MURA defects.
Step 2) described in adaptive template matching beta pruning be specifically:The characteristic pattern of hidden layer in the middle of network there is response Part is corresponded in artwork, and part is left as background in the part as prospect, calculates the mean luminance differences of foreground and background It is different;Several maximum characteristic patterns of difference are taken to be retained;Remaining characteristic pattern and associated convolution kernel from network Beta pruning.
Step 3) described in picture pyramid be specifically:Original high resolution picture is dwindled into the picture of different scale, The picture of these different scales collectively one group of picture pyramid.Different chis are detected using the pyramidal purpose of picture On degree, different size of flaw.
Step 4) described in response diagram be specifically:The 4th output of convolutional layer is used, this layer of network after beta pruning Characteristic pattern sum as defect response diagram.
Beneficial effects of the present invention are as follows:
The present invention is a kind of mobile phone screen MURA defect inspection methods based on convolutional neural networks pruning algorithms.It is based on The convolutional neural networks algorithm of deep learning, the method matched using adaptive template carries out network beta pruning, compression network model And parameter, to reach the effect of near real-time.Further, since convolutional neural networks algorithm can automatically learn to background texture Information, can preferably be processed into the moire fringes interference as in.When screen product is remodeled, it is only necessary to which a small amount of training picture enters Row network is finely tuned, it is possible to reassure that the accuracy rate of network is up to standard.
Compared with conventional method, the present invention can more effectively detect the thin defect of imaging, such as bulk MURA defects.This Outward, conventional method needs to set quantity of parameters, the accuracy for being required for adjusting parameter just to can guarantee that algorithm of remodeling every time.The present invention The neural network algorithm of use has good self adaptation and generalisation properties, can quickly carry out screen product and remodel, and saves and produces Line deployment time.
Brief description of the drawings
Fig. 1 is adaptive template matching pruning algorithms frame diagram of the invention.
Fig. 2 is picture pyramid of the invention to the diagram for being divided into picture fritter.
Specific embodiment
Clear, complete explanation and description is carried out to technical scheme below.
The present invention proposes the mobile phone screen MURA defect inspection methods based on convolutional neural networks pruning algorithms, the method On the mobile phone screen picture having been taken, determine position of the flaw on picture using convolutional neural networks algorithm and iris out.
Mobile phone screen MURA defect inspection method of the present invention based on convolutional neural networks pruning algorithms comprises the following steps:
Step 1, training stage data acquisition:Collection respectively includes flaw and normal picture fritter, is marked (1 expression Normal picture is represented comprising flaw picture, 0).According to 9:1 ratio is divided into training set and checking collects;Self-defined convolutional Neural net Network, using above-mentioned training data, training convolutional neural networks can reach higher dividing until convergence on checking collection Class accuracy rate.By observing the characteristic pattern of hidden layer in the middle of visualization convolutional neural networks, can analyze whether network is learned well Unwanted visual characteristic is arrived.
Step 2, the method matched using adaptive template carries out beta pruning to convolutional neural networks, reduces network size and net Network parameter.Specifically, all N number of characteristic pattern on l-th convolutional layer, the response bit that i-th (i < N) characteristic pattern is acquired Put and correspond to back artwork, the portion as foreground template, the rest position of artwork as background template, calculate foreground template and The mean flow rate difference D of background templatei.To all of DiDescending sort is carried out, preceding K (K < N) mean flow rate difference D is takeniMost Big characteristic pattern sum is used as response diagram.Remaining characteristic pattern convolution kernel corresponding with its directly by beta pruning, as shown in Figure 1.Cut Whole network re -training again after branch, it is ensured that the network after beta pruning still has accuracy rate higher.
Step 3, test phase data genaration:Collection mobile phone screen image data, picture is included and only includes complete hand Machine screen position.Picture is transformed into image pyramid using the zoom scale of different proportion, for multiple scale detecting.For each The picture of yardstick, is divided into the picture block of fixed size, using all of picture block as a group, as the one of convolutional neural networks Secondary input data, as shown in Figure 2.
Step 4, each picture block chooses the 4th all characteristic pattern sums of convolutional layer as response diagram, by response diagram Again artwork is corresponded to, by the method for Threshold segmentation, the final position of flaw is obtained, and iris out.

Claims (4)

1. the mobile phone screen MURA defect inspection methods based on convolutional neural networks pruning algorithms, comprise the following steps:
1) self-defined convolutional neural networks, train the network until restraining and have compared with high-accuracy by training data;
2) beta pruning of convolutional neural networks is carried out by the method for adaptive template matching, network size and network ginseng is reduced Number;
3) mobile phone screen image data is gathered, picture pyramid is generated, picture block is divided into, for test phase data genaration, Be sent to step 2) obtain beta pruning after convolutional neural networks in carry out computing;
4) the characteristic pattern sum of middle hidden layer is taken as response diagram, and defect final position doubling-up is obtained using the method for Threshold segmentation Go out, the method is particularly for detection MURA defects.
2. method according to claim 1, it is characterised in that:Step 2) described in adaptive template matching beta pruning it is specific It is:During the part that the characteristic pattern of hidden layer in the middle of network has response is corresponded to artwork, part conduct is left in the part as prospect Background, calculates the mean flow rate difference of foreground and background;Several maximum characteristic patterns of difference are taken to be retained;Remaining spy Levy the beta pruning from network of figure and associated convolution kernel.
3. method according to claim 1, it is characterised in that:Step 3) described in picture pyramid be specifically:Will be original High-resolution pictures dwindle into the picture of different scale, the picture of these different scales collectively one group of picture pyramid. Using the pyramidal purpose of picture to detect on different scale, different size of flaw.
4. method according to claim 1, it is characterised in that step 4) described in response diagram be specifically:Use the 4th The output of individual convolutional layer, using the characteristic pattern sum of this layer of network after beta pruning as defect response diagram.
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Cited By (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107742294A (en) * 2017-11-27 2018-02-27 歌尔股份有限公司 Scratch detection method, apparatus and electronic equipment
CN108171707A (en) * 2018-01-23 2018-06-15 武汉精测电子集团股份有限公司 A kind of Mura defects level evaluation method and device based on deep learning
CN108492291A (en) * 2018-03-12 2018-09-04 苏州天准科技股份有限公司 A kind of photovoltaic silicon chip Defect Detection system and method based on CNN segmentations
CN108802041A (en) * 2018-03-16 2018-11-13 浙江大学 A kind of method that the small sample set of screen detection is quickly remodeled
CN108844966A (en) * 2018-07-09 2018-11-20 广东速美达自动化股份有限公司 A kind of screen detection method and detection system
CN109063834A (en) * 2018-07-12 2018-12-21 浙江工业大学 A kind of neural networks pruning method based on convolution characteristic response figure
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CN109509172A (en) * 2018-09-25 2019-03-22 无锡动视宫原科技有限公司 A kind of liquid crystal display flaw detection method and system based on deep learning
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CN109829914A (en) * 2019-02-26 2019-05-31 视睿(杭州)信息科技有限公司 The method and apparatus of testing product defect
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CN110728681A (en) * 2019-12-19 2020-01-24 武汉精立电子技术有限公司 Mura defect detection method and device
CN111080633A (en) * 2019-12-20 2020-04-28 Oppo(重庆)智能科技有限公司 Screen defect detection method and device, terminal equipment and storage medium
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US11568324B2 (en) 2018-12-20 2023-01-31 Samsung Display Co., Ltd. Adversarial training method for noisy labels

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104036323A (en) * 2014-06-26 2014-09-10 叶茂 Vehicle detection method based on convolutional neural network
CN104850858A (en) * 2015-05-15 2015-08-19 华中科技大学 Injection-molded product defect detection and recognition method
CN104977313A (en) * 2014-04-09 2015-10-14 四川省特种设备检验研究院 Method and device for detecting and identifying X-ray image defects of welding seam
CN105118044A (en) * 2015-06-16 2015-12-02 华南理工大学 Method for automatically detecting defects of wheel-shaped cast product

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104977313A (en) * 2014-04-09 2015-10-14 四川省特种设备检验研究院 Method and device for detecting and identifying X-ray image defects of welding seam
CN104036323A (en) * 2014-06-26 2014-09-10 叶茂 Vehicle detection method based on convolutional neural network
CN104850858A (en) * 2015-05-15 2015-08-19 华中科技大学 Injection-molded product defect detection and recognition method
CN105118044A (en) * 2015-06-16 2015-12-02 华南理工大学 Method for automatically detecting defects of wheel-shaped cast product

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