CN106872849A - The device interior IO method of samplings, device and system - Google Patents
The device interior IO method of samplings, device and system Download PDFInfo
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- CN106872849A CN106872849A CN201710104122.9A CN201710104122A CN106872849A CN 106872849 A CN106872849 A CN 106872849A CN 201710104122 A CN201710104122 A CN 201710104122A CN 106872849 A CN106872849 A CN 106872849A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/67—Testing the correctness of wire connections in electric apparatus or circuits
Abstract
The invention provides a kind of device interior IO method of samplings, device and system, wherein, the device includes：I/O scan controller, decoder, simulation multiplex switch and multiple binding posts；The decoder is used to for the target address information to enter row decoding, and export to the simulation multiplex switch decoding result, to control the channel status of the simulation multiplex switch so that same time only one of which passage is output state, and other passages are input state；The I/O scan controller is additionally operable to by output state passage, exporting test signal to the channel attached binding post, and by the passage in input state, read the IO sample informations with the channel attached binding post.The present invention can exclude the wiring fault of cabinet-type air conditioner equipment with efficiency higher.
Description
Technical field
The present invention relates to signal measurement technique field, in particular to a kind of device interior IO method of samplings, device with
And system.
Background technology
In industrial processes, particularly in the manufacturing industry in the fields such as track traffic, telecom communication, exist substantial amounts of
Cabinet-type air conditioner equipment.Need the cable configured in cabinet-type air conditioner more in production process, and be manual assembly, easily produced during distribution
Mistake, fault location is difficult after there is logic error.The localization method to wiring fault is usually using staff's mesh at present
Continuity test is done depending on investigation or using the conducting shelves of universal meter.
But in fact, artificial visual investigation efficiency it is low, and using the conducting shelves of universal meter do continuity test when
Wait, can only once measure a logic connection, i.e., can only carry out man-to-man end points measurement, measurement process is time-consuming long, equally deposits
In the problem of inefficiency.
The content of the invention
In view of this, the purpose of the embodiment of the present invention is to provide a kind of device interior IO method of samplings, device and be
System, can exclude the wiring fault of cabinet-type air conditioner equipment with efficiency higher.
In a first aspect, a kind of device interior IO sampling apparatuses are the embodiment of the invention provides, including：I/O scan controller,
Decoder, simulation multiplex switch and multiple binding posts；
The I/O scan controller is connected with the decoder and the simulation multiplex switch respectively；The decoder sets
Multiple-channel output port is equipped with, and a passage of the simulation multiplex switch is all connected with per output port all the way；The simulation is multiple
A binding post is connected with each passage of switch；
The I/O scan controller is used to send target address information to the decoder；
The decoder is used to for the target address information to enter row decoding, and decoding result is exported into multiple to the simulation
With switch, to control the channel status of the simulation multiplex switch so that same time only one of which passage is output state, its
He is input state by passage；
The I/O scan controller is additionally operable to by output state passage, to the channel attached binding post
Output test signal, and by the passage in input state, read and sampled with the IO of the channel attached binding post
Information.
With reference in a first aspect, the embodiment of the invention provides the first possible implementation method of first aspect, wherein：Institute
State and be additionally provided with power tube between simulation multiplex switch and the binding post；
The signal output part of the power tube is also associated with output indicator.
With reference in a first aspect, the embodiment of the invention provides second possible implementation method of first aspect, wherein：Institute
State and be additionally provided with photoelectrical coupler between simulation multiplex switch and the binding post；
The signal output part of the photoelectrical coupler is also associated with input indicator.
With reference in a first aspect, the embodiment of the invention provides the third possible implementation method of first aspect, wherein：Also
Including：Master controller；
The master controller is connected with the I/O scan controller by communication bus；
The master controller is used to directly send target connection ground to the I/O scan controller by the communication bus
Location；The target address information is pre-stored in the master controller 90；
Or master controller is used to receive the scan instruction transmitted by host computer, and the target is parsed from scan instruction
Address information, the target address information is sent to the corresponding I/O scan controller.
With reference in a first aspect, the embodiment of the invention provides the 4th kind of possible implementation method of first aspect, wherein：Institute
Master controller is stated to be additionally operable to the I/O scan controller sending direction information；
The I/O scan controller is additionally operable to after the directional information is received, and controls itself to enter input state.
With reference in a first aspect, the embodiment of the invention provides the 5th kind of possible implementation method of first aspect, wherein：Institute
Stating I/O scan controller has multiple；Multiple I/O scan controllers are connected with the master controller respectively.
Second aspect, the embodiment of the present invention also provides a kind of device interior IO method of samplings, including：
I/O scan controller sends target address information to decoder；
The target address information is entered row decoding by the decoder, and decoding result is exported to the simulation multiplexing and opened
Close, to control the channel status of the simulation multiplex switch so that same time only one of which passage is output state, and other lead to
Road is input state；
The I/O scan controller to the channel attached binding post output by output state passage, surveying
Trial signal, and by the passage in input state, read the IO sample informations with the channel attached binding post.
With reference to second aspect, the first possible implementation method of second aspect is the embodiment of the invention provides, wherein：Institute
I/O scan controller is stated to be additionally operable to by output state passage, test signal being exported to binding post is connected with the passage
Specifically include：
The test signal is sent to power tube by the I/O scan controller by the passage in output state；
The power tube is used to amplify the test signal, and is transferred to the binding post being attached thereto；
And/or, described by the passage in input state, reading is adopted with the IO of the channel attached binding post
Sample information, specifically includes：
Photoelectrical coupler obtains the IO sampled signals that the binding post being attached thereto is transmitted, and the IO is sampled
Signal is sent to the I/O scan controller by passage.
With reference to second aspect, second possible implementation method of second aspect is the embodiment of the invention provides, wherein：
Also include：
The master controller directly sends target link address by the communication bus to the I/O scan controller；Institute
Target address information is stated to be pre-stored in the master controller 90；
Or,
Master controller is used to receive the scan instruction transmitted by host computer, and the destination address is parsed from scan instruction
Information, the target address information is sent to the corresponding I/O scan controller.
The third aspect, the embodiment of the present invention also provides a kind of device interior IO sampling systems, including such as above-mentioned first aspect
Device interior IO sampling apparatuses described in any one, also include：Equipment to be sampled；
The equipment to be sampled is connected with the binding post of the device interior IO sampling apparatuses.
The device interior IO method of samplings, device and system that the embodiment of the present invention is provided, include I/O scan control
Device, decoder, simulation multiplex switch and multiple binding posts.Wherein, the I/O scan controller respectively with the decoder
And the simulation multiplex switch connection；The decoder is provided with multiple-channel output port, and is all connected with per output port all the way
One passage of the simulation multiplex switch；Each passage of the simulation multiplex switch connects a binding post；
When carrying out IO and sampling, I/O scan controller sends target address information to decoder, and decoder is by target address information
Enter row decoding, and decoding result is sent to simulation multiplex switch so that the passage of simulation multiplex switch only has in the same time
One is output state, and other are input state, so that the binding post only one of which that simulation multiplex switch is connected
Test signal can be outwards exported, and other binding posts are then that can be input into IO sampled signals to I/O scan controller, are entered
And can judge whether the cable being connected with binding post occurs in that wiring error according to IO sampled signals.During this,
Need only to user binding post links together with the contact of equipment, carried out using I/O scan controller when test,
User's manual test is not needed, the poor efficiency of universal meter test is it also avoid such that it is able to cabinet-type air conditioner is excluded with efficiency higher and is set
Standby wiring fault.
To enable the above objects, features and advantages of the present invention to become apparent, preferred embodiment cited below particularly, and coordinate
Appended accompanying drawing, is described in detail below.
Brief description of the drawings
Technical scheme in order to illustrate more clearly the embodiments of the present invention, below will be attached to what is used needed for embodiment
Figure is briefly described, it will be appreciated that the following drawings illustrate only certain embodiments of the present invention, thus be not construed as it is right
The restriction of scope, for those of ordinary skill in the art, on the premise of not paying creative work, can also be according to this
A little accompanying drawings obtain other related accompanying drawings.
Fig. 1 shows a kind of structural representation of device interior IO sampling apparatuses that the embodiment of the present invention is provided；
Fig. 2 shows the structural representation of another device interior IO sampling apparatuses that the embodiment of the present invention is provided；
Fig. 3 shows a kind of flow chart of device interior IO method of samplings that the embodiment of the present invention is provided；
Fig. 4 shows in the device interior IO method of samplings that the embodiment of the present invention is provided that the I/O scan controller is also
For by output state passage, to the flow of the specific method for being connected with the passage binding post output test signal
Figure；
Fig. 5 is shown in the device interior IO method of samplings that the embodiment of the present invention is provided, described by input shape
The passage of state, reads the specific method flow chart with the IO sample informations of the channel attached binding post；
Fig. 6 shows the flow chart of another device interior IO method of samplings that the embodiment of the present invention is provided；
Fig. 7 shows the flow chart of another device interior IO method of samplings that the embodiment of the present invention is provided.
Illustrate：
I/O scan controller 10, decoder 20, simulation multiplex switch 30, binding post 40, power tube 50, output indicator
60th, photoelectrical coupler 70, input indicator 80, master controller 90.
Specific embodiment
To make the purpose, technical scheme and advantage of the embodiment of the present invention clearer, below in conjunction with the embodiment of the present invention
Middle accompanying drawing, is clearly and completely described to the technical scheme in the embodiment of the present invention, it is clear that described embodiment is only
It is a part of embodiment of the invention, rather than whole embodiments.The present invention generally described and illustrated in accompanying drawing herein is real
The component for applying example can be arranged and designed with a variety of configurations.Therefore, it is of the invention to what is provided in the accompanying drawings below
The detailed description of embodiment is not intended to limit the scope of claimed invention, but is merely representative of selected reality of the invention
Apply example.Based on embodiments of the invention, the institute that those skilled in the art are obtained on the premise of creative work is not made
There is other embodiment, belong to the scope of protection of the invention.
At present when the wiring fault of the cable connected to cabinet-type air conditioner equipment is positioned, usually using artificial mesh
Continuity test positioning is carried out depending on investigation positioning or using universal meter.But the method investigation efficiency of both wiring faults positioning
It is low, be unfavorable for that subsequent production is put into practice, based on this, a kind of device interior IO method of samplings, device and system that the application is provided,
The efficiency of discharge wiring fault can be improved.
For ease of understanding the present embodiment, a kind of device interior IO disclosed in the embodiment of the present invention is sampled first
Device describes in detail.The device can sample to the IO of cabinet-type air conditioner, for investigating whether cabinet-type air conditioner has with the connection of cable
By mistake, can be also used for judging whether cabinet-type air conditioner back panel wiring goes wrong；The device can also be connected with other electrical equipments, use
Error correction is carried out in the logic connection to other electrical equipments.
Shown in Figure 1, the device interior IO sampling apparatuses that the embodiment of the present invention is provided include：
I/O scan controller 10, decoder 20, simulation multiplex switch 30 and multiple binding posts 40；
The I/O scan controller 10 is connected with the decoder 20 and the simulation multiplex switch 30 respectively；It is described to translate
Code device 20 is provided with multiple-channel output port, and a passage of the simulation multiplex switch 30 is all connected with per output port all the way；
Each passage of the simulation multiplex switch 30 connects a binding post 40；
The I/O scan controller 10 is used to send target address information to the decoder 20；
The decoder 20 is used to for the target address information to enter row decoding, and decoding result is exported to the simulation
Multiplex switch 30, to control the channel status of the simulation multiplex switch 30 so that same time only one of which passage is output
State, other passages are input state；
The I/O scan controller 10 is defeated to the passage binding post 40 is connected by the passage in output state
Go out test signal, and by the passage in input state, read and sampled with the IO of the channel attached binding post 40
Information.
When implementing, each binding post 40 has ground corresponding and different from other binding posts
Location information.Target address information be user want measurement binding post 40 corresponding to address information.And specifically carrying out IO
When collection, the I/O data that the scan instruction that I/O scan controller 10 can be according to received by it is scanned formula reads,
The address information (i.e. target address information) that user wants the binding post of collection is carried in scan instruction, it is also possible to by it
The address information of all collection terminals that inside is prestored is acquired successively as target address information successively.
In specific gatherer process, target address information can be sent to decoder 20 by I/O scan controller 10.Decoding
Device 20 has multiple-channel output, and a passage of simulation multiplex switch 30 is respectively connected with per output all the way, and in simulation multiplex switch 30
The another side of each passage be then connected with a binding post 40.After decoder 20 enters row decoding to target address information,
The decoding result is exported and gives simulation multiplex switch, to control the state of passage in simulation multiplex switch.
Specifically, each passage can be presented two states, and one kind is output state, i.e. the energy of I/O scan controller 10
It is enough that test signal is sent to and the channel attached binding post 40, the now lead-out terminal from the passage in output state
In output state；Another kind is input state, i.e., binding post can be by the passage that is attached thereto to I/O scan controller
IO sample informations are sent, now, the binding post is in input state.Decoding result be exported to simulation multiplex switch 30 it
Afterwards, one of passage enters input state in simulation multiplex switch, passage binding post corresponding with target address information
40 connections, describe for convenience, and the binding post is called output wiring terminal；Other passages enter output state, into this
A little channel attached binding posts are input wires terminal.This state receives the decoding knot transmitted by decoder until next time
Untill fruit.
When IO samplings are specifically carried out, the meeting of binding post 40 cable different from cabinet-type air conditioner links together, or will
Used as tie point, each tie point connects a binding post 40 to the link position of cable and cabinet-type air conditioner.Channel status is set
Regularly, I/O scan controller 10 can receive what binding post 40 was transmitted into input state, i.e. I/O scan controller 10
IO sample informations.Because the circuit inside cabinet-type air conditioner has different connection status, so if in the case of being no wiring faults,
Voltage between output wiring terminal and input wires terminal all can determine and be not in generally change.And
Once the connection of certain root cable occurs in that the circuit connection inside mistake, or cabinet-type air conditioner there is a problem, then may result in defeated
Go out voltage between binding post and input wires terminal to change.Test signal is exported from output wiring terminal, due to logic
The difference of relation, the IO sample informations that input wires terminal is collected also can be otherwise varied.If for example, output wiring terminal
The short circuit between certain input wires terminal, then the IO sampling letters acquired in I/O scan controller 10 from the input wires terminal
Breath should be just the change with test signal into equal proportion.
It should be noted that simulation multiplex switch typically has multiple passages, if the number of channels of simulation multiplex switch
More than the quantity of binding post, then all of binding post is all connected in same simulation multiplex switch；If binding post
Quantity be more than number of channels, then simulate multiplex switch can also have multiple.
In addition, it is also to be noted that when being sampled to device interior IO, can successively by all of wiring
Terminal is set to output wiring terminal, is once sampled respectively, it is also possible to which which part binding post is set into output connection
Terminal, is sampled.
The device interior IO sampling apparatuses that the embodiment of the present invention is provided, include I/O scan controller, decoder, simulation
Multiplex switch and multiple binding posts.Wherein, the I/O scan controller is multiple with the decoder and the simulation respectively
Connected with switch；The decoder is provided with multiple-channel output port, and every output port all the way is all connected with the simulation multiplexing and opens
The passage for closing；Each passage of the simulation multiplex switch connects a binding post；Carrying out IO samplings
When, I/O scan controller sends target address information to decoder, and target address information is entered row decoding by decoder, and will be translated
Code result is sent to simulation multiplex switch so that the passage of simulation multiplex switch is output state in same time only one of which,
Other are input state.Allow that the binding post only one of which that simulation multiplex switch is connected outwards exports test letter
Number, and other binding posts are then that can be input into IO sampled signals to I/O scan controller such that it is able to sampled according to IO and believed
Number judge whether the cable that is connected with binding post occurs in that wiring error.During this, it is thus only necessary to which user is by wiring
Terminal links together with the contact of equipment, is carried out using I/O scan controller when test, it is not necessary to user's manual test,
It also avoid the poor efficiency of universal meter test such that it is able to the wiring fault of cabinet-type air conditioner equipment is excluded with efficiency higher.
Meanwhile, when the channel direction in the past to simulating multiplex switch is controlled, usually use same with passage
Direction controlling, the combination that the present invention passes through decoder and simulation multiplex switch are done to outside IO etc. the microcontroller I/O ports of quantity
The efficiency of IO direction controllings is improved, the use of decoder reduces the IO quantity that direction controlling is used, improves microcontroller
The utilization rate of device port.
For example, the microcontroller ports quantity saved relative to prior art after 4-32 decoders are used in the present invention is 28
It is individual.
It is shown in Figure 2, in the device interior IO sampling apparatuses that the embodiment of the present invention is provided, the simulation multiplex switch
Power tube 50 is additionally provided between 30 and the binding post 40；
The signal output part of the power tube 50 is also associated with output indicator 60.
When implementing, the input of power tube is connected with the output end of simulation multiplex switch 30, power tube
Output end is connected with binding post.The effect of power tube 50 be by from I/O scan controller 10 by the passage in output state
Transmitted test signal is amplified, and realizes the heavy load ability of binding post.When being gathered to carrying out IO, I/O scan
Controller 10 can send test signal by passage to output wiring terminal, and the test signal will first pass through putting for power tube 50
Greatly, output wiring terminal is just reached.Meanwhile, the output end of power tube is also associated with output indicator 60.There is test in power tube
When signal output, output indicator 60 can due to it is electric and be in luminance, to indicate currently to be input into electric (to indicate
It is currently able to obtain IO sampled signals from input wires terminal).
It is shown in Figure 2, in the device interior IO sampling apparatuses that the embodiment of the present invention is provided, the simulation multiplex switch
Photoelectrical coupler 70 is additionally provided between 30 and the binding post 40；
The signal output part of the photoelectrical coupler 70 is also associated with input indicator 80.
When implementing, the input of photoelectrical coupler 70 is connected with the binding post；Output end and simulation
Multiplex switch 30 is connected.The effect of photoelectrical coupler 70 be for realizing the Phototube Coupling inside connection terminal and whole device,
Prevent unexpected surge voltage or circuit damage equipment.When test signal is from after output wiring terminal output, if the output
There is logic connecting relation (to be connected by the circuit inside cable or cabinet-type air conditioner between binding post and certain input wires terminal
Connect), then the test signal flowed out from exhalation binding post can sweep via passage into IO again by the input connection terminal
Controller is retouched, is collected by I/O scan controller.And in this process, electric current can be first after input wires terminal is flowed through,
Flow through photoelectrical coupler 70.Meanwhile, the input indicator 80 that the signal output part of photoelectrical coupler 70 is connected is obtained electric and is in
Luminance, has signal input to indicate current input wires terminal, can obtain IO sample informations from the binding post.
Shown in Figure 2, the embodiment of the present invention also provides another device interior IO sampling apparatuses, in above-mentioned several realities
Apply on the basis of example, also include：Master controller 90；
The master controller 90 is connected with the I/O scan controller by communication bus；
The master controller 90 is used to directly send the target to the I/O scan controller by the communication bus
Address information；The target address information is pre-stored in the master controller 90；
Or master controller 90 is used to receive the scan instruction transmitted by host computer, and the mesh is parsed from scan instruction
Mark address information, the target address information is sent to the corresponding I/O scan controller.
When implementing, user directly can operate to master controller 90, and pre- in master controller 90
There is the address information of all binding posts, user can trigger master controller 90 so that master controller 90 according to triggering command
The target address information being triggered directly is sent to I/O scan controller.In addition, user can also be by host computer to master control
Device processed 90 is operated, i.e., scan instruction is sent from host computer to master controller, and the destination address is carried in scan instruction
Information.Master controller 90 can parse target address information from scan instruction, then send target address information
To corresponding I/O scan controller 10.
In addition, when implementing, the I/O scan controller 10 has multiple；Multiple I/O scan controllers 10
It is connected with the master controller 90 respectively.Multiple I/O scan controllers 10 can constitute IO sampling matrixs with master controller 90, real
Existing rapider more accurate measurement.
In addition, the master controller 90 is additionally operable to the sending direction information of the I/O scan controller 10；The I/O scan
Controller 10 is additionally operable to after the directional information is received, and controls itself to enter input state.
When implementing, directional information can be directly in main control by user as target address information
It is being input on device 90, or by host computer input.Host computer is transferred in the scanning information of master controller 90 can be with
Direction information is carried, then master controller 90 can parse directional information from scanning information, be sent to corresponding IO
Scanning monitor 10.I/O scan controller 10 can cause oneself to enter input state after directional information is received, i.e., can
IO sample informations are obtained from binding post.
In addition, the main frame of existing electronic system and slave communication process, such as in the communication of typical MODBUS slaves,
Each data interaction must be carried out by way of main frame inquiry slave response, in connection multiple slaves main frame must successively with
There is polling operation in all slaves, could effective interaction data.And in the present invention, master controller 90 (main frame) and I/O scan
In controller 10 (slave) communication process, as a result of trigger signal (main frame and the slave letter between the two of rigid line connection
Number and information transmission), reduce response times between main frame and slave, improve the response real-time of communication system.This hair
Connected by rigid line in bright, unified triggering slave response signal, slave transfers data to main frame, reduces main frame multiple successively
The stand-by period of poll, data transmission efficiency is effectively improved, also improved in connection logic testing by the application of the method
In sweep speed, saved sweep time.
In addition, in the description of the invention, unless otherwise clearly defined and limited, term " installation ", " connected ", " company
Connect " should be interpreted broadly, for example, it may be being fixedly connected, or being detachably connected, or it is integrally connected；It can be machine
Tool is connected, or electrically connected；Can be joined directly together, it is also possible to be indirectly connected to by intermediary, can be two units
Connection inside part.For the ordinary skill in the art, above-mentioned term can be understood in the present invention with concrete condition
Concrete meaning.
Further embodiment of this invention also provides a kind of device interior IO method of samplings, shown in Figure 3, the embodiment of the present invention
The device interior IO method of samplings for being provided include：
S301：I/O scan controller sends target address information to decoder；
S302：The target address information is entered row decoding by the decoder, and decoding result is exported to the simulation
Multiplex switch, to control the channel status of the simulation multiplex switch so that same time only one of which passage is output state,
Other passages are input state；
S303：The I/O scan controller by output state passage, to the channel attached binding post
Output test signal, and by the passage in input state, read and sampled with the IO of the channel attached binding post
Information.
In the present embodiment, the concrete function and interactive mode of each step, reference can be made to the record of the corresponding embodiments of Fig. 1,
Will not be repeated here.
The present invention be the embodiment of the present invention that strength is provided provided the device interior IO method of samplings, adopt carrying out IO
When sample, I/O scan controller sends target address information to decoder, and target address information is entered row decoding by decoder, and
Decoding result is sent to simulation multiplex switch so that the passage of simulation multiplex switch is output shape in same time only one of which
State, other are input state.Allow that the binding post only one of which that simulation multiplex switch is connected outwards exports test
Signal, and other binding posts are then that can be input into IO sampled signals to I/O scan controller such that it is able to sampled according to IO
Signal judges whether the cable being connected with binding post occurs in that wiring error.During this, it is thus only necessary to which user will connect
Line terminals link together with the contact of equipment, are carried out using I/O scan controller when test, it is not necessary to which user surveys manually
Examination, it also avoid the poor efficiency of universal meter test such that it is able to the wiring fault of cabinet-type air conditioner equipment is excluded with efficiency higher.
Further embodiment of this invention also provides a kind of detailed process of S103, referring to shown in Fig. 4 and Fig. 5：
The I/O scan controller is additionally operable to by output state passage, defeated to the passage binding post is connected
Go out test signal to specifically include：
S401：The test signal is sent to power by the I/O scan controller by the passage in output state
Pipe；
S402：The power tube is used to amplify the test signal, and is transferred to the binding post being attached thereto；
And/or, described by the passage in input state, reading is adopted with the IO of the channel attached binding post
Sample information, specifically includes：
S501：Photoelectrical coupler obtains the IO sampled signals that the binding post being attached thereto is transmitted, and will be described
IO sampled signals are sent to the I/O scan controller by passage.
In the present embodiment, the concrete function and interactive mode of each step, reference can be made to the record of the corresponding embodiments of Fig. 2,
Will not be repeated here.
Further embodiment of this invention also provides another device interior IO method of samplings, referring to shown in Fig. 6 and Fig. 7, goes back
Including：
S601：The master controller directly sends target and connects ground by the communication bus to the I/O scan controller
Location；The target address information is pre-stored in the master controller 90；
Or,
S701：Master controller is used to receive the scan instruction transmitted by host computer, and the mesh is parsed from scan instruction
Mark address information, the target address information is sent to the corresponding I/O scan controller.
In the present embodiment, the concrete function and interactive mode of each step, reference can be made to the record of the corresponding embodiments of Fig. 2,
Will not be repeated here.
Further embodiment of this invention additionally provides a kind of device interior IO sampling systems, including such as above-mentioned claim 1-6
Device interior IO sampling apparatuses described in any one, also include：Equipment to be sampled；
The equipment to be sampled is connected with the binding post of the device interior IO sampling apparatuses.
The computer program product of the device interior IO method of samplings, device and system that the embodiment of the present invention is provided,
Computer-readable recording medium including storing program code, the instruction that described program code includes can be used for side before execution
Method described in method embodiment, implements and can be found in embodiment of the method, will not be repeated here.
It is apparent to those skilled in the art that, for convenience and simplicity of description, the system of foregoing description
With the specific work process of device, the corresponding process in preceding method embodiment is may be referred to, will not be repeated here.
If the function is to realize in the form of SFU software functional unit and as independent production marketing or when using, can be with
Storage is in a computer read/write memory medium.Based on such understanding, technical scheme is substantially in other words
The part contributed to prior art or the part of the technical scheme can be embodied in the form of software product, the meter
Calculation machine software product is stored in a storage medium, including some instructions are used to so that a computer equipment (can be individual
People's computer, server, or network equipment etc.) perform all or part of step of each embodiment methods described of the invention.
And foregoing storage medium includes：USB flash disk, mobile hard disk, read-only storage (ROM, Read-Only Memory), arbitrary access are deposited
Reservoir (RAM, Random Access Memory), magnetic disc or CD etc. are various can be with the medium of store program codes.
The above, specific embodiment only of the invention, but protection scope of the present invention is not limited thereto, and it is any
Those familiar with the art the invention discloses technical scope in, change or replacement can be readily occurred in, should all contain
Cover within protection scope of the present invention.Therefore, protection scope of the present invention described should be defined by scope of the claims.
Claims (10)
1. a kind of device interior IO sampling apparatuses, it is characterised in that including：I/O scan controller, decoder, simulation multiplex switch
And multiple binding posts；
The I/O scan controller is connected with the decoder and the simulation multiplex switch respectively；The decoder is provided with
Multiple-channel output port, and a passage of the simulation multiplex switch is all connected with per output port all the way；The simulation multiplexing is opened
Each passage for closing connects a binding post；
The I/O scan controller is used to send target address information to the decoder；
The decoder is opened for the target address information being entered into row decoding, and will decode result to export to the simulation multiplexing
Close, to control the channel status of the simulation multiplex switch so that same time only one of which passage is output state, and other lead to
Road is input state；
The I/O scan controller is additionally operable to by the passage in output state, to the channel attached terminals
Son output test signal, and by the passage in input state, reading is adopted with the IO of the channel attached binding post
Sample information.
2. device according to claim 1, it is characterised in that between the simulation multiplex switch and the binding post also
It is provided with power tube；
The signal output part of the power tube is also associated with output indicator.
3. device according to claim 1, it is characterised in that between the simulation multiplex switch and the binding post also
It is provided with photoelectrical coupler；
The signal output part of the photoelectrical coupler is also associated with input indicator.
4. the device according to claim 1-3 any one, it is characterised in that also include：Master controller；
The master controller is connected with the I/O scan controller by communication bus；
The master controller is used to directly send target link address to the I/O scan controller by the communication bus；Institute
Target address information is stated to be pre-stored in the master controller；
Or master controller is used to receive the scan instruction transmitted by host computer, and the destination address is parsed from scan instruction
Information, the target address information is sent to the corresponding I/O scan controller.
5. device according to claim 4, it is characterised in that the master controller is additionally operable to the I/O scan controller
Sending direction information；
The I/O scan controller is additionally operable to after the directional information is received, and controls itself to enter input state.
6. device according to claim 4, it is characterised in that the I/O scan controller has multiple；Multiple IO sweep
Controller is retouched to be connected with the master controller respectively.
7. a kind of device interior IO method of samplings, it is characterised in that including：
I/O scan controller sends target address information to decoder；
The target address information is entered row decoding by the decoder, and decoding result is exported to simulation multiplex switch, to control
The channel status of the system simulation multiplex switch so that same time only one of which passage is output state, and other passages are
Input state；
The I/O scan controller to the channel attached binding post output test by output state passage, believing
Number, and by the passage in input state, read the IO sample informations with the channel attached binding post.
8. method according to claim 7, it is characterised in that the I/O scan controller is additionally operable to by output
Stator channel, specifically includes to binding post output test signal is connected with the passage：
The test signal is sent to power tube by the I/O scan controller by the passage in output state；
The power tube is used to amplify the test signal, and is transferred to the binding post being attached thereto；
And/or, it is described by the passage in input state, read the IO sampling letters with the channel attached binding post
Breath, specifically includes：
Photoelectrical coupler obtains the IO sampled signals that the binding post that is attached thereto is transmitted, and by the IO sampled signals
Sent to the I/O scan controller by passage.
9. the method according to claim 7 or 8, it is characterised in that also include：
Master controller directly sends target link address by communication bus to the I/O scan controller；The destination address letter
Breath is pre-stored in the master controller；
Or,
Master controller is used to receive the scan instruction transmitted by host computer, and the destination address letter is parsed from scan instruction
Breath, the target address information is sent to the corresponding I/O scan controller.
10. a kind of device interior IO sampling systems, it is characterised in that including as described in above-mentioned claim 1-6 any one
Device interior IO sampling apparatuses, also include：Equipment to be sampled；
The equipment to be sampled is connected with the binding post of the device interior IO sampling apparatuses.
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| CN201710104122.9A CN106872849B (en) | 2017-02-24 | 2017-02-24 | Equipment internal IO sampling method, device and system |
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| CN201710104122.9A CN106872849B (en) | 2017-02-24 | 2017-02-24 | Equipment internal IO sampling method, device and system |
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