CN106842068A - A kind of method and device of the reliability for improving server power supply - Google Patents
A kind of method and device of the reliability for improving server power supply Download PDFInfo
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- CN106842068A CN106842068A CN201710021558.1A CN201710021558A CN106842068A CN 106842068 A CN106842068 A CN 106842068A CN 201710021558 A CN201710021558 A CN 201710021558A CN 106842068 A CN106842068 A CN 106842068A
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- power supply
- server power
- preset temperature
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
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- General Engineering & Computer Science (AREA)
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Abstract
The invention provides it is a kind of improve server power supply reliability method and device, the method, including：Pre-set reliability objectives；S1：According to the reliability objectives, stress test is carried out to server power supply；S2：During the stress test, the performance of server power supply described in real-time detection；S3：During the stress test, the current stress in current performance and the stress test in real time according to the server power supply judges whether the server power supply meets the reliability objectives, if it is not, then performing S4；S4：According to the current performance of the server power supply, judge whether the server power supply breaks down, if it is, performing S5, otherwise, return to S3；S5：The server power supply is modified, S1 is returned.The invention provides a kind of method and device of the reliability for improving server power supply, it is possible to increase the reliability of server power supply.
Description
Technical field
The present invention relates to electronic technology field, the method and dress of more particularly to a kind of reliability for improving server power supply
Put.
Background technology
As the application of server is more and more extensive, requirement more and more higher of the user to the reliability of server.Server
Power supply is used as the pith in server, it is also desirable to reliability higher.How the reliability of server power supply is improved
Increasingly it is taken seriously.
In the prior art, during server power supply is produced, design server power supply is typically rule of thumb carried out, it is impossible to
Determine whether the reliability of server power supply meets requirement.Often be present more defect in the server power supply produced, make
Substantial amounts of failure is there may be during, reliability is relatively low.
The content of the invention
The embodiment of the invention provides a kind of method and device of the reliability for improving server power supply, it is possible to increase service
The reliability of device power supply.
On the one hand, a kind of method of the reliability for improving server power supply is the embodiment of the invention provides, including：
Pre-set reliability objectives；Also include：
S1：According to the reliability objectives, stress test is carried out to server power supply；
S2：During the stress test, the performance of server power supply described in real-time detection；
S3：During the stress test, current performance in real time according to the server power supply and the stress
Current stress in test, judges whether the server power supply meets the reliability objectives, if it is not, then performing S4；
S4：According to the current performance of the server power supply, judge whether the server power supply breaks down, such as
Fruit is then to perform S5, otherwise, returns to S3；
S5：The server power supply is modified, S1 is returned.
Further, it is described to carry out stress test to server power supply, including：
Every the first Preset Time by the environment temperature of the server power supply in the first preset temperature and the second default temperature
Switch between degree, wherein, first preset temperature is A, and second preset temperature is-A.
Further, it is described to carry out stress test to server power supply, including：
Every the second Preset Time by the server power supply be supported on zero load, semi-load, it is fully loaded between cyclic switching.
Further, it is described to carry out stress test to server power supply, including：
Every the 3rd Preset Time by the environment temperature of the server power supply in the 3rd preset temperature and the 4th default temperature
Switch between degree, wherein, the 3rd preset temperature is B, and the 4th preset temperature is-B；
Every the 4th Preset Time by the server power supply be supported on zero load, semi-load, it is fully loaded between cyclic switching.
Further, it is described to carry out stress test to server power supply, including：
The environment temperature of the server power supply is set to the 5th preset temperature；
The environment temperature of the server power supply is reduced into the 6th preset temperature every the 5th Preset Time.
Further, it is described to carry out stress test to server power supply, including：
The environment temperature of the server power supply is set to the 7th preset temperature；
The environment temperature of the server power supply is increased into by the 8th preset temperature every the 6th Preset Time.
On the other hand, a kind of device of the reliability for improving server power supply is the embodiment of the invention provides, including：
Setting unit, for setting reliability objectives；
Test cell, for according to the reliability objectives, stress test being carried out to server power supply；
Detection unit, for during the stress test, the performance of server power supply described in real-time detection；
First judging unit, for during the stress test, in real time according to the current of the server power supply
Current stress in performance and the stress test, judges whether the server power supply meets the reliability objectives, if
It is no, then trigger the second judging unit；
Second judging unit, for the current performance according to the server power supply, judges the server
Whether power supply breaks down, if it is, triggering amending unit, otherwise, triggers first judging unit；
The amending unit, for being modified to the server power supply, triggers the test cell.
Further, the test cell, for every the first Preset Time by the environment temperature of the server power supply
Switch between the first preset temperature and the second preset temperature, wherein, first preset temperature is A, the described second default temperature
Spend for-A.
Further, the test cell, for the server power supply to be supported on into sky every the second Preset Time
Load, semi-load, it is fully loaded between cyclic switching.
Further, the test cell, for every the 3rd Preset Time by the environment temperature of the server power supply
Switch between the 3rd preset temperature and the 4th preset temperature, every the 4th Preset Time being supported on the server power supply
Zero load, semi-load, it is fully loaded between cyclic switching, wherein, the 3rd preset temperature is B, and the 4th preset temperature is-B.
Further, the test cell, for the environment temperature of the server power supply to be set into the 5th default temperature
Degree, the 6th preset temperature is reduced every the 5th Preset Time by the environment temperature of the server power supply.
Further, the test cell, for the environment temperature of the server power supply to be set into the 7th default temperature
Degree, increases by the 8th preset temperature every the 6th Preset Time by the environment temperature of the server power supply.
In embodiments of the present invention, reliability objectives are pre-set, server power supply is answered according to reliability objectives
Power is tested, if server power supply is unable to reach reliability objectives, server power supply is modified, and is constantly carried by amendment
The reliability of server power supply high, to reach reliability objectives, and then can improve the reliability of server power supply.
Brief description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing
The accompanying drawing to be used needed for having technology description is briefly described, it should be apparent that, drawings in the following description are the present invention
Some embodiments, for those of ordinary skill in the art, on the premise of not paying creative work, can also basis
These accompanying drawings obtain other accompanying drawings.
Fig. 1 is a kind of flow chart of the method for the reliability of raising server power supply that one embodiment of the invention is provided；
Fig. 2 is the flow chart of the method for another reliability for improving server power supply that one embodiment of the invention is provided；
Fig. 3 is a kind of schematic diagram of the device of the reliability of raising server power supply that one embodiment of the invention is provided.
Specific embodiment
To make the purpose, technical scheme and advantage of the embodiment of the present invention clearer, below in conjunction with the embodiment of the present invention
In accompanying drawing, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is
A part of embodiment of the present invention, rather than whole embodiments, based on the embodiment in the present invention, those of ordinary skill in the art
The every other embodiment obtained on the premise of creative work is not made, belongs to the scope of protection of the invention.
A kind of method of the reliability for improving server power supply is the embodiment of the invention provides, the method can include following
Step：
S0：Pre-set reliability objectives；
S1：According to the reliability objectives, stress test is carried out to server power supply；
S2：During the stress test, the performance of server power supply described in real-time detection；
S3：During the stress test, current performance in real time according to the server power supply and the stress
Current stress in test, judges whether the server power supply meets the reliability objectives, if it is not, then performing S4；
S4：According to the current performance of the server power supply, judge whether the server power supply breaks down, such as
Fruit is then to perform S5, otherwise, returns to S3；
S5：The server power supply is modified, S1 is returned.
In embodiments of the present invention, reliability objectives are pre-set, server power supply is answered according to reliability objectives
Power is tested, if server power supply is unable to reach reliability objectives, server power supply is modified, and is constantly carried by amendment
The reliability of server power supply high, to reach reliability objectives, and then can improve the reliability of server power supply.
As shown in figure 1, a kind of method of the reliability for improving server power supply is the embodiment of the invention provides, including：
Step 101：Pre-set reliability objectives；
Step 102：According to the reliability objectives, stress test is carried out to server power supply；
Step 103：During the stress test, the performance of server power supply described in real-time detection；
Step 104：During the stress test, current performance real-time according to the server power supply and described
Current stress in stress test, judges whether the server power supply meets the reliability objectives, if it is, performing step
107, if it is not, then performing step 105；
Step 105：According to the current performance of the server power supply, judge whether the server power supply occurs event
Barrier, if it is, performing step 106, otherwise, return to step 104；
Step 106：The server power supply is modified, return to step 102；
Step 107：Terminate current process.
In an embodiment of the present invention, it is described to carry out stress test to server power supply, including：
Every the first Preset Time by the environment temperature of the server power supply in the first preset temperature and the second default temperature
Switch between degree, wherein, first preset temperature is A, and second preset temperature is-A.
In embodiments of the present invention, by the first Preset Time, by the environment temperature of server power supply by the first default temperature
Degree switches to the second preset temperature, by the first Preset Time, the environment temperature of server power supply is cut by the second preset temperature
The first preset temperature is changed to, is circulated according to this.Wherein, the first Preset Time can be 5 minutes, and the first preset temperature can be 60
DEG C, the second preset temperature can be -60 DEG C.
For example, for the stress test, reliability objectives are the clothes under the first preset temperature and the second preset temperature
Business device power supply can normal work, and after first object time switches for several times, server power supply remains able to normal work.Such as
Fruit server power supply before the reliability objectives are not reached, just cannot normal work, then server power supply is modified, it is right
Revised server power supply carries out the stress test, until server power supply reaches the reliability objectives, server at this moment
Power supply reliability is higher.
In an embodiment of the present invention, it is described to carry out stress test to server power supply, including：
Every the second Preset Time by the server power supply be supported on zero load, semi-load, it is fully loaded between cyclic switching.
In embodiments of the present invention, by the second Preset Time, the load of server power supply is changed into semi-load from zero load, passes through
Second Preset Time, the semi-load of server power supply are changed into fully loaded from zero load, by the second Preset Time, server power supply it is fully loaded
It is changed into unloaded from zero load, circulates according to this.Wherein, the second Preset Time can be 15 minutes, and semi-load refer to the negative of server power supply
Carry the half to be fully loaded with.
For example, for the stress test, reliability objectives are by after the second targeted number time switching, server is electric
Source remains able to normal work.If server power supply is not before the reliability objectives are reached, just cannot normal work, then it is right
Server power supply is modified, and the stress test is carried out to revised server power supply, until server power supply reaches this can
By property target, server power supply reliability at this moment is higher.
In an embodiment of the present invention, it is described to carry out stress test to server power supply, including：
Every the 3rd Preset Time by the environment temperature of the server power supply in the 3rd preset temperature and the 4th default temperature
Switch between degree, wherein, the 3rd preset temperature is B, and the 4th preset temperature is-B；
Every the 4th Preset Time by the server power supply be supported on zero load, semi-load, it is fully loaded between cyclic switching.
In embodiments of the present invention, the switching of the environment temperature of server power supply here and the load of server power supply
It is independent of each other between switching, it is each independent to realize.Wherein, the 3rd preset temperature can be 60 DEG C, the 4th preset temperature can be-
60 DEG C, the 3rd Preset Time can be 5 minutes.4th Preset Time can be 15 minutes.
For example, for the stress test, reliability objectives are the clothes under the 3rd preset temperature and the 4th preset temperature
Business device power supply can normal work, and by after the temperature switching of the 3rd targeted number time, server power supply is remained able to normally
Work, also, by after the load switching of the 4th targeted number time, server power supply remains able to normal work.If service
Device power supply before the reliability objectives are not reached, just cannot normal work, then server power supply is modified, after amendment
Server power supply carry out the stress test, until server power supply reaches the reliability objectives, server power supply at this moment can
It is higher by property.
In an embodiment of the present invention, it is described to carry out stress test to server power supply, including：
The environment temperature of the server power supply is set to the 5th preset temperature；
The environment temperature of the server power supply is reduced into the 6th preset temperature every the 5th Preset Time.
In embodiments of the present invention, can be with testing service device power pin to the reliability of low temperature environment by the stress test
Property.Wherein, the 5th preset temperature can be 20 DEG C, and the 6th preset temperature can be 10 DEG C, and the 5th Preset Time can be 15 points
Clock.
For example, the reliability objectives for low temperature environment are the servers under the environment temperature of first object temperature
Power supply being capable of normal work.The environment temperature of server power supply is set to the 5th preset temperature, will every the 5th Preset Time
Environment temperature the 6th preset temperature of reduction of server power supply, is being less than up to before first object temperature, if server power supply
Break down, then server power supply is modified, then, the stress test is carried out to revised server power supply, until
After reaching first object temperature, server power supply remains able to normal work, and server power supply now disclosure satisfy that the reliability
Property target, reliability is higher.Wherein, first object temperature can be -60 DEG C.
In an embodiment of the present invention, it is described to carry out stress test to server power supply, including：
The environment temperature of the server power supply is set to the 7th preset temperature；
The environment temperature of the server power supply is increased into by the 8th preset temperature every the 6th Preset Time.
In embodiments of the present invention, can be with testing service device power pin to the reliability of hot environment by the stress test
Property.Wherein, the 7th preset temperature can be 20 DEG C, and the 8th preset temperature can be 10 DEG C, and the 6th Preset Time can be 15 points
Clock.
For example, the reliability objectives for hot environment are the servers under the environment temperature of the second target temperature
Power supply being capable of normal work.The environment temperature of server power supply is set to the 7th preset temperature, will every the 6th Preset Time
The environment temperature of server power supply increases by the 8th preset temperature, is being less than up to before the second target temperature, if server power supply
Break down, then server power supply is modified, then, the stress test is carried out to revised server power supply, until
After reaching the second target temperature, server power supply remains able to normal work, and server power supply now disclosure satisfy that the reliability
Property target, reliability is higher.Wherein, the second target temperature can be 60 DEG C.
Various stress tests in the embodiment of the present invention, can be used to test same server power supply, Jin Erti successively
The reliability of server power supply various aspects high.
As shown in Fig. 2 the embodiment of the invention provides a kind of method of the reliability for improving server power supply, the method can
To comprise the following steps：
Step 201：Reliability objectives are pre-set, wherein, reliability objectives are：Under -60 DEG C of environment temperature, service
Device power supply occurs without failure.
The present embodiment is the reliability in order to improve server power supply under the environment temperature of low temperature.
Step 202：The environment temperature of server power supply is set to 20 DEG C, every 15 minutes environment by server power supply
10 DEG C of temperature reduction.
Specifically, server power supply can be put into inside test box, the temperature inside adjustment test box.By progressively dropping
Low ambient temperature, it may be determined that go out temperature when server power supply breaks down, is easy to be modified server power supply.
Step 203：During stress test, the output voltage of real-time detection server power supply.
Specifically, it is also possible to by the output current of detection service device power supply, power output, whether can the ginseng such as normal boot-strap
Count to determine the performance of server power supply.
Step 204：During stress test, in real time according to the current output voltage and stress test of server power supply
In current environmental temperature, judge whether server power supply meets reliability objectives, if it is, perform 207, otherwise, perform
205；
Specifically, when current environmental temperature is not reaching to -60 DEG C, it is determined that not meeting reliability objectives.
Step 205：According to the current output voltage of server power supply, judge whether server power supply breaks down, if
It is then to perform step 206, otherwise, return to step 204.
Specifically, failure is sent if environment temperature does not reach -60 DEG C of server power supplies, then needs to be modified,
Proceed stress test.
Specifically, can be by judging that current output voltage and the rated output voltage of server power supply are compared to really
Determine whether server power supply breaks down.
Step 206：Server power supply is modified, return to step 202.
Specifically, internal circuit debugging can be carried out to server power supply, or, device replacing is carried out to server power supply
Etc. come realize amendment.
Step 207：Terminate current process.
By the embodiment of the present invention, the robustness and reliability of server power supply can be improved.The embodiment of the present invention passes through rank
Terraced tension type carries out stress test, can as early as possible find product defects, operational design limit and structural limit.
In embodiments of the present invention, defect, the improvement design of product design and manufacture can be rapidly found out using stress test
Defect, increase product reliability simultaneously shorten its market periods, while can also set up designed capacity, the basic data of product reliability
And the important evidence researched and developed in the future.
In embodiments of the present invention, by stress test can determine server power supply various basic operation boundaries and
Basic failure approach index.The basic operation boundary and basic failure approach index of environment temperature, the basic operation boundary of load and break substantially
Bad boundary etc..
In embodiments of the present invention, any abnormality produced by server power supply in stress test can be remembered
Record, analyses whether that these problems can be overcome by change design, carries out stress test next time after being corrected again, and then improve
The operational limit and failure approach index of server power supply, so as to reach the purpose of lifting server power supply reliability, and then ensure
The operation that server can be stablized.
In embodiments of the present invention, the defect of product design and design process can be quickly found, when can reduce research and development
Between and cost, can before server power supply is discharged into production line i.e. eliminate design on problem.
As shown in figure 3, a kind of device of the reliability for improving server power supply is the embodiment of the invention provides, including：
Setting unit 301, for setting reliability objectives；
Test cell 302, for according to the reliability objectives, stress test being carried out to server power supply；
Detection unit 303, for during the stress test, the performance of server power supply described in real-time detection；
First judging unit 304, for during the stress test, working as according to the server power supply in real time
Current stress in preceding performance and the stress test, judges whether the server power supply meets the reliability objectives, such as
It is really no, then trigger the second judging unit 305；
Second judging unit 305, for the current performance according to the server power supply, judges the service
Whether device power supply breaks down, if it is, triggering amending unit 306, otherwise, triggers first judging unit 304；
The amending unit 306, for being modified to the server power supply, triggers the test cell 302.
In an embodiment of the present invention, the test cell, for every the first Preset Time by the server power supply
Environment temperature switch between the first preset temperature and the second preset temperature, wherein, first preset temperature be A, it is described
Second preset temperature is-A.
In an embodiment of the present invention, the test cell, for every the second Preset Time by the server power supply
Be supported on zero load, semi-load, it is fully loaded between cyclic switching.
In an embodiment of the present invention, the test cell, for every the 3rd Preset Time by the server power supply
Environment temperature switch between the 3rd preset temperature and the 4th preset temperature, every the 4th Preset Time by the server electricity
Source be supported on zero load, semi-load, it is fully loaded between cyclic switching, wherein, the 3rd preset temperature is B, the described 4th default temperature
Spend for-B.
In an embodiment of the present invention, the test cell, for the environment temperature of the server power supply to be set to
5th preset temperature, the 6th preset temperature is reduced every the 5th Preset Time by the environment temperature of the server power supply.
In an embodiment of the present invention, the test cell, for the environment temperature of the server power supply to be set to
7th preset temperature, increases by the 8th preset temperature every the 6th Preset Time by the environment temperature of the server power supply.
The contents such as the information exchange between each unit, implementation procedure in said apparatus, due to implementing with the inventive method
Example is based on same design, and particular content can be found in the narration in the inventive method embodiment, and here is omitted.
Each embodiment of the invention at least has the advantages that：
1st, in embodiments of the present invention, reliability objectives are pre-set, server power supply is carried out according to reliability objectives
Stress test, if server power supply is unable to reach reliability objectives, is modified to server power supply, continuous by amendment
The reliability of server power supply is improved, to reach reliability objectives, and then the reliability of server power supply can be improved.
2nd, in embodiments of the present invention, the product design and manufacture of server power supply can be rapidly found out using stress test
Defect, the design defect that improves, increase product reliability simultaneously shorten its market periods, while designed capacity, product can also be set up can
Basic data by property and the important evidence researched and developed in the future.
3rd, in embodiments of the present invention, any abnormality produced by server power supply in stress test can be carried out
Record, analyses whether that these problems can be overcome by change design, carries out stress test next time, Jin Erti after being corrected again
The operational limit and failure approach index of server power supply high, so as to reach the purpose of lifting server power supply reliability, Jin Erbao
The operation that server can be stablized is demonstrate,proved.
4th, in embodiments of the present invention, the defect of product design and design process can be quickly found, research and development can be reduced
Time and cost, can eliminate the problem in design before server power supply is discharged into production line.
It should be noted that herein, such as first and second etc relational terms are used merely to an entity
Or operation makes a distinction with another entity or operation, and not necessarily require or imply these entities or exist between operating
Any this actual relation or order.And, term " including ", "comprising" or its any other variant be intended to it is non-
It is exclusive to include, so that process, method, article or equipment including a series of key elements not only include those key elements,
But also other key elements including being not expressly set out, or also include by this process, method, article or equipment are solid
Some key elements.In the absence of more restrictions, the key element limited by sentence " including a 〃 ", does not arrange
Except also there is other identical factor in the process including the key element, method, article or equipment.
One of ordinary skill in the art will appreciate that：Realizing all or part of step of above method embodiment can pass through
Programmed instruction related hardware is completed, and foregoing program can be stored in the storage medium of embodied on computer readable, the program
Upon execution, the step of including above method embodiment is performed；And foregoing storage medium includes：ROM, RAM, magnetic disc or light
Disk etc. is various can be with the medium of store program codes.
It is last it should be noted that：Presently preferred embodiments of the present invention is the foregoing is only, skill of the invention is merely to illustrate
Art scheme, is not intended to limit the scope of the present invention.All any modifications made within the spirit and principles in the present invention,
Equivalent, improvement etc., are all contained in protection scope of the present invention.
Claims (10)
1. it is a kind of improve server power supply reliability method, it is characterised in that including：
Pre-set reliability objectives；Also include：
S1：According to the reliability objectives, stress test is carried out to server power supply；
S2：During the stress test, the performance of server power supply described in real-time detection；
S3：During the stress test, current performance in real time according to the server power supply and the stress test
In current stress, judge whether the server power supply meets the reliability objectives, if it is not, then perform S4；
S4：According to the current performance of the server power supply, judge whether the server power supply breaks down, if
It is then to perform S5, otherwise, returns to S3；
S5：The server power supply is modified, S1 is returned.
2. method according to claim 1, it is characterised in that
It is described to carry out stress test to server power supply, including：
Every the first Preset Time by the environment temperature of the server power supply the first preset temperature and the second preset temperature it
Between switch, wherein, first preset temperature be A, second preset temperature be-A.
3. method according to claim 1, it is characterised in that
It is described to carry out stress test to server power supply, including：
Every the second Preset Time by the server power supply be supported on zero load, semi-load, it is fully loaded between cyclic switching.
4. method according to claim 1, it is characterised in that
It is described to carry out stress test to server power supply, including：
Every the 3rd Preset Time by the environment temperature of the server power supply the 3rd preset temperature and the 4th preset temperature it
Between switch, wherein, the 3rd preset temperature be B, the 4th preset temperature be-B；
Every the 4th Preset Time by the server power supply be supported on zero load, semi-load, it is fully loaded between cyclic switching.
5. method according to claim 1, it is characterised in that
It is described to carry out stress test to server power supply, including：
The environment temperature of the server power supply is set to the 5th preset temperature；
The environment temperature of the server power supply is reduced into the 6th preset temperature every the 5th Preset Time；
Or,
It is described to carry out stress test to server power supply, including：
The environment temperature of the server power supply is set to the 7th preset temperature；
The environment temperature of the server power supply is increased into by the 8th preset temperature every the 6th Preset Time.
6. it is a kind of improve server power supply reliability device, it is characterised in that including：
Setting unit, for setting reliability objectives；
Test cell, for according to the reliability objectives, stress test being carried out to server power supply；
Detection unit, for during the stress test, the performance of server power supply described in real-time detection；
First judging unit, for during the stress test, in real time according to the current performance of the server power supply
Current stress with the stress test, judges whether the server power supply meets the reliability objectives, if it is not, then
Trigger the second judging unit；
Second judging unit, for the current performance according to the server power supply, judges the server power supply
Whether break down, if it is, triggering amending unit, otherwise, triggers first judging unit；
The amending unit, for being modified to the server power supply, triggers the test cell.
7. device according to claim 1, it is characterised in that
The test cell, for every the first Preset Time by the environment temperature of the server power supply in the first preset temperature
And second switch between preset temperature, wherein, first preset temperature is A, and second preset temperature is-A.
8. method according to claim 1, it is characterised in that
The test cell, for every the second Preset Time by the server power supply be supported on zero load, semi-load, be fully loaded with it
Between cyclic switching.
9. method according to claim 1, it is characterised in that
The test cell, for every the 3rd Preset Time by the environment temperature of the server power supply in the 3rd preset temperature
And the 4th switch between preset temperature, every the 4th Preset Time being supported on the server power supply zero load, semi-load, be fully loaded with
Between cyclic switching, wherein, the 3rd preset temperature be B, the 4th preset temperature be-B.
10. method according to claim 1, it is characterised in that
The test cell, it is pre- every the 5th for the environment temperature of the server power supply to be set into the 5th preset temperature
If the environment temperature of the server power supply is reduced the 6th preset temperature by the time；
Or,
The test cell, it is pre- every the 6th for the environment temperature of the server power supply to be set into the 7th preset temperature
If the environment temperature of the server power supply is increased by the 8th preset temperature by the time.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
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| CN107732820A (en) * | 2017-11-03 | 2018-02-23 | 郑州云海信息技术有限公司 | A kind of server power supply measurement jig junction box |
| CN108983114A (en) * | 2018-08-07 | 2018-12-11 | 山东卡尔电气股份有限公司 | The identity card decoding server and its method for diagnosing faults of tape jam diagnostic function |
| CN109116266A (en) * | 2018-09-05 | 2019-01-01 | 郑州云海信息技术有限公司 | The test method of power module |
| CN113378393A (en) * | 2021-06-18 | 2021-09-10 | 浪潮商用机器有限公司 | Server product reliability test method and device |
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| CN107732820A (en) * | 2017-11-03 | 2018-02-23 | 郑州云海信息技术有限公司 | A kind of server power supply measurement jig junction box |
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| CN113378393A (en) * | 2021-06-18 | 2021-09-10 | 浪潮商用机器有限公司 | Server product reliability test method and device |
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