CN106841257B - 一种单根一维纳米材料截面应力的分析方法 - Google Patents
一种单根一维纳米材料截面应力的分析方法 Download PDFInfo
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- CN106841257B CN106841257B CN201710110346.0A CN201710110346A CN106841257B CN 106841257 B CN106841257 B CN 106841257B CN 201710110346 A CN201710110346 A CN 201710110346A CN 106841257 B CN106841257 B CN 106841257B
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- 239000000463 material Substances 0.000 title claims abstract description 49
- 238000004458 analytical method Methods 0.000 title claims abstract description 29
- 238000009826 distribution Methods 0.000 claims abstract description 40
- 238000000034 method Methods 0.000 claims abstract description 23
- 239000011159 matrix material Substances 0.000 claims abstract description 15
- 238000002524 electron diffraction data Methods 0.000 claims abstract description 13
- 230000005540 biological transmission Effects 0.000 claims description 10
- 239000002086 nanomaterial Substances 0.000 claims description 9
- 238000004088 simulation Methods 0.000 claims description 5
- 230000005281 excited state Effects 0.000 claims description 4
- 239000007787 solid Substances 0.000 claims 1
- 239000000126 substance Substances 0.000 claims 1
- 239000000284 extract Substances 0.000 abstract description 4
- 238000002441 X-ray diffraction Methods 0.000 abstract description 3
- 230000007812 deficiency Effects 0.000 abstract description 3
- 239000002070 nanowire Substances 0.000 description 32
- 238000001228 spectrum Methods 0.000 description 7
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 229910052709 silver Inorganic materials 0.000 description 4
- 239000004332 silver Substances 0.000 description 4
- 239000013078 crystal Substances 0.000 description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- 230000001427 coherent effect Effects 0.000 description 2
- 230000002708 enhancing effect Effects 0.000 description 2
- 239000004744 fabric Substances 0.000 description 2
- 230000005469 synchrotron radiation Effects 0.000 description 2
- 206010007247 Carbuncle Diseases 0.000 description 1
- 238000005134 atomistic simulation Methods 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000002050 diffraction method Methods 0.000 description 1
- 238000002003 electron diffraction Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 238000004452 microanalysis Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000009828 non-uniform distribution Methods 0.000 description 1
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- 230000005855 radiation Effects 0.000 description 1
- 238000009738 saturating Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000004627 transmission electron microscopy Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
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- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
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- Analysing Materials By The Use Of Radiation (AREA)
Abstract
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CN201710110346.0A CN106841257B (zh) | 2017-02-27 | 2017-02-27 | 一种单根一维纳米材料截面应力的分析方法 |
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CN201710110346.0A CN106841257B (zh) | 2017-02-27 | 2017-02-27 | 一种单根一维纳米材料截面应力的分析方法 |
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CN106841257A CN106841257A (zh) | 2017-06-13 |
CN106841257B true CN106841257B (zh) | 2019-04-19 |
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Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
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FR3074949B1 (fr) * | 2017-12-11 | 2019-12-20 | Electricite De France | Procede, dispositif et programme de traitement d'images de diffraction d'un materiau cristallin |
CN113375581B (zh) * | 2021-04-30 | 2022-12-13 | 西安电子科技大学 | 一种测试低维材料不同方向应变的装置及方法 |
CN114964590B (zh) * | 2022-05-26 | 2023-08-18 | 中国工程物理研究院核物理与化学研究所 | 一种氚化物纳米级微区应力分布的电子显微分析方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101768008A (zh) * | 2009-01-06 | 2010-07-07 | 中国科学院金属研究所 | 结构复杂材料的三维倒易空间重构方法 |
CN103175856A (zh) * | 2013-03-17 | 2013-06-26 | 中国科学院苏州纳米技术与纳米仿生研究所 | 样品位错的扫描透射电镜成像方法 |
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Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN101768008A (zh) * | 2009-01-06 | 2010-07-07 | 中国科学院金属研究所 | 结构复杂材料的三维倒易空间重构方法 |
CN103175856A (zh) * | 2013-03-17 | 2013-06-26 | 中国科学院苏州纳米技术与纳米仿生研究所 | 样品位错的扫描透射电镜成像方法 |
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Address after: 101407 No. 11 Xingke East Street, Yanqi Economic Development Zone, Huairou District, Beijing Patentee after: GUOBIAO (BEIJING) TESTING & CERTIFICATION CO.,LTD. Patentee after: Youyan Technology Group Co.,Ltd. Address before: 101407 Yang Yan Road 88, Yan Qi Economic Development Zone, Huairou District, Beijing Patentee before: GUOBIAO (BEIJING) TESTING & CERTIFICATION CO.,LTD. Patentee before: GENERAL Research Institute FOR NONFERROUS METALS |
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Effective date of registration: 20221103 Address after: 101407 No. 11 Xingke East Street, Yanqi Economic Development Zone, Huairou District, Beijing Patentee after: GUOBIAO (BEIJING) TESTING & CERTIFICATION CO.,LTD. Address before: 101407 No. 11 Xingke East Street, Yanqi Economic Development Zone, Huairou District, Beijing Patentee before: GUOBIAO (BEIJING) TESTING & CERTIFICATION CO.,LTD. Patentee before: Youyan Technology Group Co.,Ltd. |