CN106841255B - A kind of adjustable clamping device for axonometry - Google Patents

A kind of adjustable clamping device for axonometry Download PDF

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Publication number
CN106841255B
CN106841255B CN201710187520.1A CN201710187520A CN106841255B CN 106841255 B CN106841255 B CN 106841255B CN 201710187520 A CN201710187520 A CN 201710187520A CN 106841255 B CN106841255 B CN 106841255B
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China
Prior art keywords
sample
sample disc
axonometry
type support
clamping device
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Expired - Fee Related
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CN201710187520.1A
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Chinese (zh)
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CN106841255A (en
Inventor
朱杰
姬梦
王占山
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Tongji University
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Tongji University
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025Sample holders or supports therefor

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  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

The present invention relates to a kind of adjustable clamping devices for axonometry, pillar including pedestal, on pedestal, L-type support, the sample disc set on L-type support end for being mounted on column upper section, sample disc and L-type support rotation connect, and sample disc is equipped with multiple for clamping the fastener of crystal to be measured.The configuration of the present invention is simple, processing convenience, can be adapted for any crystal direction finder or similar device, be not necessarily to do any change to direction finder itself, effect is prominent;Controllability is good, according to actual measurement sample size, arranges distance between pedestal and direction finder adsorbing metal seat, can adjust height according to sample size, rotates any angle.

Description

A kind of adjustable clamping device for axonometry
Technical field
The present invention relates to a kind of clamping devices, and in particular to a kind of adjustable clamping device for axonometry.
Background technique
Crystal direction finder is the special instrument that measurement is oriented to crystalline material.Its basic principle is to utilize X-ray Bragg diffraction is realized in the periodic lattice of crystal and determines the practical crystal orientation in surface of crystal.It accurate can quickly be surveyed Fixed natural and artificial single crystal's (such as optical crystal, piezo-electric crystal, laser crystal, nonlinear optical crystal, semiconductor crystal etc.) Cutting angle, when being used in combination with cutting machine and (usually have circle cutting machine, inner circle cutting machine, diamond wire saw machine etc.) It can be used in the directional cutting of these crystal, obtain the plane of crystal of specified crystal orientation.Crystal direction finder is that Precision Machining manufacture is brilliant The indispensable instrument of body device is widely used in the research, processing, manufacturing of crystalline material.
Traditional crystal direction finder is usually made of X-ray generator, sample stage and detector three parts, wherein sample Sample platform is a metal flat, and surface is provided with aperture, and inner hollow is connected by small air pump, and the pumping that can continue is at Negative pressure state, to reach the function of adsorption sample.Under normal conditions, since equipment manufacturing cost and size limit, the power of air pump It is not very high, therefore test sample cannot be too big, otherwise can not adsorb fixation since suction is limited.In addition, passing through absorption Mode also has the requirement of surface smoothness, and test sample surface cannot rise and fall too greatly, too coarse, otherwise can not equally adsorb, institute Must be ground to certain smooth degree before test, process is complicated;Secondly, sample orientation when usually using certain crystal orientation as The plane of reference measures corresponding angle and is cut, then the sample after cutting through will not be necessarily irregular figure, and in order to orient Accurately, it at least needs to determine its deviation angle in 4 directions, be reapposed then changing angle measurement and being also required to remove in sample Certain angle, which increases degree of difficulty when accurate pointing.How quickly fixed arbitrary shape crystal prototype, and Completion crystal accurately orients under conditions of not removing sample, is tradesman and the related scientific research for being engaged in crystal high-precision processing One of the problem that personnel face.
Summary of the invention
The purpose of the present invention is to solve the above-mentioned problems and provides a kind of adjustable clamping device for axonometry.
The purpose of the present invention is achieved through the following technical solutions:
A kind of adjustable clamping device for axonometry, including pedestal, the pillar on pedestal, is mounted on pillar The L-type support in portion, the sample disc set on L-type support end, the sample disc and L-type support rotation connect, the sample Disk is equipped with multiple for clamping the fastener of crystal to be measured.
Further, the sample disc includes disk ontology and the annulus wall on disk ontology, the fastener It is distributed on annulus wall.
Further, the fastener is screw, and the annulus wall of the sample disc is equipped with the screw thread passed through for screw Circular hole.
Further, it is set on the annulus wall of the sample disc there are three thread circle hole, is spaced 120 degree of radian distributions, institute The screw stated is mounted in the thread circle hole, can lock the crystal prototype of arbitrary shape.
Further, the screw head is equipped with protective case, glue or Oxford glue in which is polytetrafluoroethylene (PTFE), is outstanding The cylindrical sleeve being rolled into.
Further, the pillar is cylindrical, hollow vertical tube, and the branch is set up in pillar and can carry out 360 degree Rotation, the side of the pillar are provided with aperture, and the threaded pin for securing bracket is equipped in the aperture.
Further, the circumferential outer surface of the sample disc is equipped with 360 degree of cutting, is arranged around periphery, into one Step ground, the cutting is every the bright number of 10 scales.
Further, the L-type support top is equipped with tuning drive gear, can understand when being oriented to crystal prototype straight The direction and the angle turned over that the determination of sight has oriented are finally reached the comprehensive assessment crystal-cut surface within the scope of 360 degree With the angle between real crystal lattice, accurate foundation is provided for subsequent amendment cutting.
Further, the center of the sample disc is equipped with the turnbarrel connecting with L-type support, sets in the turnbarrel There are rotary part, including ball bearing, roller bearing, oilless bearing or runner, guarantees the alignment in rotary course, avoid revolving Turn the deviation that X-ray incidence angle after certain angle generates incidence angle in sample surfaces.
Further, the pedestal is made using stainless steel material, and the sample disc is made using aluminum alloy material, Pedestal is square or circle, can change according to actual needs.
In the use of the present invention, determining the peace of stainless steel base according to the sample size and thickness shape that cut down Holding position may be mounted at apart from the X-ray plane of incidence remotely for compared with large sample, and can be close to the lesser sample of size Direction finder X-ray incidence metal surface.After determining good position, pedestal is fixed on direction finder rotation example platform, to guarantee Positional shift does not occur during orientation survey, heavier stainless steel base can reduce the influence shaken to measurement;Installation After good pedestal, sample is waited for that measured center is overlapped and is consistent with sample disc spindle central, draw mark line with facilitate distinguish, Then sample is put on specimen rotating holder, it is big according to sample by surface to be measured externally towards direction finder adsorbing metal seat one side The screw of small selection appropriate length, which locks sample from three directions for being separated by 120 degree, to be fixed, and installs protective case in screw head, The frictional force between sample can be increased, also simultaneously as the soft safety for guaranteeing material and will not damage more fragile Crystal prototype.The screw of appropriate length can ensure that fix sample after in sample disc surrounding there is no protrusion, to prevent 360 It touches other positions of direction finder in degree rotation process and causes to damage;After sample installs, support height is manually adjusted, makes sample Product center is just overlapped with X-ray plane of incidence central point, and bracket is fixed, and starts to test.According to actual needs, one angle of every survey The diffracted signal that sample disc measures next angle is rotated after the diffracted intensity of degree, rotational angle can be according in rotation sample disc Scale and tuning drive gear read confirmation.
Advantages of the present invention specifically:
1, device structure is simple, and processing convenience can be adapted for any crystal direction finder or similar device, to direction finder sheet For body without doing any change, effect is prominent.
2, controllability is good, and fixture can be placed in any position on direction finder rotating disc, big according to actual measurement sample It is small, arrange distance between pedestal and direction finder adsorbing metal seat.
3, height can be adjusted according to sample size, and any angle can also be rotated within the scope of 360 degree, adaptability is extremely strong, It is carved with scale in sample disc, tuning drive gear is equipped in L-type support, conveniently directly reads rotation scale.
4, fastener is arranged in 120 degree of sample disc interval angle, and head is equipped with protective case, can be replaced according to different samples, due to Sample disc and turnbarrel integrated design, guarantee alignment and stationarity during rotation, furthermore encounter super large sample, sample Product disk can also be replaced.
Detailed description of the invention
Fig. 1 is schematic perspective view of the invention;
Fig. 2 is side structure schematic view of the invention;
Fig. 3 is the structural schematic diagram of sample disc of the present invention;
In figure: 1- pedestal;2- pillar;3- threaded pin;4-L type bracket;5- tuning drive gear;6- sample disc;7- protective case; 8- fastener;9- cutting;10- turnbarrel.
Specific embodiment
The present invention is described in detail with specific embodiment below in conjunction with the accompanying drawings.
Embodiment 1
A kind of adjustable clamping device for axonometry, as shown in Figure 1, 2, including pedestal 1, the branch on pedestal 1 Column 2, the L-type support 4 for being mounted on 2 top of pillar, the sample disc 6 set on 4 end of L-type support, sample disc 6 and L-type support 4 rotate Connection, sample disc 6 is equipped with multiple fasteners 8 for being used to clamp crystal to be measured, as shown in figure 3, sample disc 6 is circle, sample disc 6 Annulus wall including disk ontology and on disk ontology, fastener 8 is screw, on the annulus wall of sample disc 6, sample disc 6 annulus walls are set there are three thread circle hole, are spaced 120 degree of radian distributions, and screw is mounted in the thread circle hole, and screw head is equipped with Protective case 7, the protective case 7 are the cylindrical sleeve that polytetrafluoroethylene (PTFE) is wrapped up in, and pillar 2 is cylindrical, hollow vertical tube, and branch is set up in pillar 2 Interior and can carry out 360 degree rotation, the side of pillar 2 is provided with aperture, and the threaded pin 3 for securing bracket is equipped in the aperture, The circumferential outer surface of sample disc 6 is equipped with 360 degree of cutting 9, is arranged around annulus wall outer surface, cutting 9 is every the bright number of 10 scales Word, 4 top of L-type support are equipped with tuning drive gear 5, and sample disc 6 is equipped with the turnbarrel 10 with sample disc 6 in one, the rotary sleeve Rotary part is equipped in cylinder 10, using ball bearing, pedestal 1 is made using stainless steel material, and sample disc 6 uses aluminum alloy material It is made.
When specifically used, according to the sample size and thickness shape cut down, the installation position of stainless steel base is determined It sets, after determining good position, pedestal is fixed on direction finder rotation example platform, to guarantee that position does not occur during orientation survey Offset is set, heavier stainless steel base can reduce the influence shaken to measurement;After installing pedestal, sample is waited for into measured center It is overlapped and is consistent with sample disc spindle central, draw mark line to facilitate and distinguish, sample is then put into specimen rotating holder On, by surface to be measured externally towards direction finder adsorbing metal seat one side, sample is lockked admittedly from three directions for being separated by 120 degree It is fixed, protective case is installed in screw head, increases the frictional force between sample, also simultaneously as the soft peace for guaranteeing material Crystal prototype complete and that more fragility will not be damaged.After sample installs, manually adjust support height, make sample center just with X-ray plane of incidence central point is overlapped, and bracket is fixed, starts to test.According to actual needs, every diffracted intensity for surveying an angle Rotation sample disc measures the diffracted signal of next angle afterwards, and rotational angle can be according to the scale and scale in rotation sample disc Pointer reads confirmation.The structure of the clamping device is simple, reliable and stable, has good adaptability, is suitble to domestic at present any A kind of crystal direction finder use.

Claims (6)

1. a kind of adjustable clamping device for axonometry, which is characterized in that including pedestal (1), the branch being set on pedestal (1) Column (2), the L-type support (4) for being mounted on pillar (2) top, the sample disc (6) for being set to L-type support (4) end, the sample Disk (6) and L-type support (4) rotation connect, and the sample disc (6) is equipped with multiple fasteners (8) for being used to clamp crystal to be measured, The sample disc (6) includes disk ontology and the annulus wall on disk ontology, and the fastener (8) is distributed in annulus wall On, the outside wall surface of the annulus wall of the sample disc (6) is equipped with 360 degree of cutting (9), and the L-type support (4) top is equipped with Tuning drive gear (5), the center of the sample disc (6) are equipped with the turnbarrel (10) connecting with L-type support (4).
2. a kind of adjustable clamping device for axonometry according to claim 1, which is characterized in that the fastening Part (8) is screw, and the annulus wall of the sample disc (6) is equipped with the thread circle hole passed through for screw.
3. a kind of adjustable clamping device for axonometry according to claim 2, which is characterized in that the sample It is set on the annulus wall of disk (6) there are three thread circle hole, is spaced 120 degree of radian distributions, the screw is mounted on the thread circle hole It is interior.
4. a kind of adjustable clamping device for axonometry according to claim 2, which is characterized in that the screw Head is equipped with protective case (7), the cylindrical sleeve that glue or Oxford glue are rolled into which is polytetrafluoroethylene (PTFE), is outstanding.
5. a kind of adjustable clamping device for axonometry according to claim 1, which is characterized in that the pillar It (2) is cylindrical, hollow vertical tube, the branch is set up in pillar (2) and can carry out 360 degree rotation, the pillar (2) Side is provided with aperture, and the threaded pin (3) for securing bracket is equipped in the aperture.
6. a kind of adjustable clamping device for axonometry according to claim 1, which is characterized in that the pedestal (1) it is made using stainless steel material, the sample disc (6) is made using aluminum alloy material.
CN201710187520.1A 2017-03-27 2017-03-27 A kind of adjustable clamping device for axonometry Expired - Fee Related CN106841255B (en)

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EP4155720A1 (en) * 2021-09-28 2023-03-29 Netzsch-Gerätebau GmbH Device for determining temperature parameters with adjustable sample holder
CN114311350B (en) * 2022-03-15 2022-06-28 天通控股股份有限公司 Head and tail cutting method for lithium tantalate crystal

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CN204882415U (en) * 2015-08-12 2015-12-16 浙江博凡动力装备股份有限公司 Path pipeline fixing device
CN106216502A (en) * 2016-08-15 2016-12-14 江西远大保险设备实业集团有限公司 A kind of wedge buckle bookshelf and preparation method thereof
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US5280178A (en) * 1991-03-18 1994-01-18 U.S. Philips Corporation Specimen holder for use in a charged particle beam device
CN1938123A (en) * 2004-04-08 2007-03-28 玛斯股份有限公司 Method and device for centring semi-finished parts which are to undergo mechanical machining
CN2874723Y (en) * 2006-02-28 2007-02-28 宝山钢铁股份有限公司 Metal phase scan sample table of atomic power microscope
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Granted publication date: 20190705