CN106833962A - Cleaning agent and its preparation and application for removing conductor etching cavity ceramic coating part pollutant - Google Patents

Cleaning agent and its preparation and application for removing conductor etching cavity ceramic coating part pollutant Download PDF

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Publication number
CN106833962A
CN106833962A CN201611215545.XA CN201611215545A CN106833962A CN 106833962 A CN106833962 A CN 106833962A CN 201611215545 A CN201611215545 A CN 201611215545A CN 106833962 A CN106833962 A CN 106833962A
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CN
China
Prior art keywords
cleaning agent
ceramic coating
parts
coating part
etching cavity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201611215545.XA
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Chinese (zh)
Inventor
何桥
贺贤汉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai fullerde Intelligent Technology Development Co., Ltd
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Shanghai Shenhe Thermo Magnetics Electronics Co Ltd
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Publication date
Application filed by Shanghai Shenhe Thermo Magnetics Electronics Co Ltd filed Critical Shanghai Shenhe Thermo Magnetics Electronics Co Ltd
Priority to CN201611215545.XA priority Critical patent/CN106833962A/en
Publication of CN106833962A publication Critical patent/CN106833962A/en
Pending legal-status Critical Current

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    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/32Organic compounds containing nitrogen
    • C11D7/3281Heterocyclic compounds
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/02Inorganic compounds
    • C11D7/04Water-soluble compounds
    • C11D7/10Salts
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/26Organic compounds containing oxygen
    • C11D7/264Aldehydes; Ketones; Acetals or ketals
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/26Organic compounds containing oxygen
    • C11D7/265Carboxylic acids or salts thereof
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/26Organic compounds containing oxygen
    • C11D7/266Esters or carbonates
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/32Organic compounds containing nitrogen
    • C11D7/3218Alkanolamines or alkanolimines
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/32Organic compounds containing nitrogen
    • C11D7/3263Amides or imides
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D2111/00Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
    • C11D2111/10Objects to be cleaned
    • C11D2111/14Hard surfaces
    • C11D2111/22Electronic devices, e.g. PCBs or semiconductors

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  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Wood Science & Technology (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Emergency Medicine (AREA)
  • Inorganic Chemistry (AREA)
  • Detergent Compositions (AREA)

Abstract

The present invention relates to a kind of cleaning agent for removing conductor etching cavity ceramic coating part pollutant, in parts by weight, including following component:5~10 parts of acid buffer agent;5~10 parts of fluoride;30~50 parts of amine organic solvent;10~20 parts of based organic solvent;20~30 parts of organic solvent of ketone;10~30 parts of pure water.It is prepared, including:By above-mentioned weight portion, each component is mixed, in stirring at normal temperature 30min, the cleaning agent of conductor etching cavity ceramic coating part pollutant is obtained.Cleaning agent of the invention can thoroughly remove pollutant, it is ensured that the kind equipment is cleaned up completely, and pollution etch chamber is brought into without particle, in turn ensure that basic material is without prejudice, so as to reduce the risk that ceramic coating comes off.

Description

For remove conductor etching cavity ceramic coating part pollutant cleaning agent and its Prepare and apply
Technical field
It is more particularly to a kind of for removing semiconductor erosion the invention belongs to semiconductor equipment Cleaning of Parts technical field Carve cleaning agent of cavity ceramic coating part pollutant and its preparation method and application.
Background technology
Semiconductor integrated circuit manufacturing process technology sustained and rapid development, new technology continues to bring out drive chip integration Rapid to improve, 28 nanometers have become main flow making technology, while new technology develops to the line width of 16 nanometers, 8 nanometers again.Wherein Plasma etching and plasma cleaning have become one of flow of its manufacture of semiconductor technique most critical.
With process apparatus high are entered into, etch chamber plasma power is increasing, and plasma is to etching technics chamber The particle pollution problem that the lesion ribbon of wall is come is also increasing, in order that the particle pollution introduced by plasma etch process is most Smallization, has been developed for the cell materials of many anti-plasmas bombardment in the market, these plasma materials include by The ceramic spraying layer of the compositions such as Al2O3, AlN, SiC, Y2O3, this kind of ceramic spraying part runs a period of time in etch chamber Afterwards, the substantial amounts of CFization product of its adsorption, if do not cleaned to its regular dismounting, will produce a large amount of contaminated ions, influence Product yield.
Particle pollution, component base (generally anode do not formed thoroughly and there is attachment product cleaning in traditional cleaning method Aluminum oxide) corrode the problems such as causing ceramic spraying layer to come off.
Therefore, a kind of effective cleaning agent formula is researched and developed, pollutant can be thoroughly removed, but it is (generally positive to base material Pole aluminum oxide) protect particularly important well.And up to the present, there is not yet the report of the pertinent literature on such cleaning agent.
The content of the invention
It is an object of the invention to overcome the deficiencies in the prior art, there is provided one kind is for removing conductor etching cavity ceramics Cleaning agent of coating component pollutant and its preparation method and application.Cleaning agent of the invention can thoroughly remove pollutant, Ensure that the kind equipment is cleaned up completely, pollution etch chamber is brought into without particle, in turn ensure that basic material is without prejudice, from And reduce the risk that ceramic coating comes off.
The purpose of the present invention is achieved through the following technical solutions:
The first object of the present invention is to provide a kind of for removing conductor etching cavity ceramic coating part pollutant Cleaning agent, in parts by weight, including following component:
Wherein, the pickling buffer solution is selected from one or more in hydroxyacetic acid, formic acid, acetic acid;The fluoride choosing From ammonium fluoride, one or two mixing of fluoboric acid;The amine organic solvent is selected from monoethanolamine, triethanolamine, N, N- One or more in dimethylformamide, triethylene tetramine;The based organic solvent is selected from ethyl acetate, butyl acetate One or two mixing;The organic solvent of ketone be selected from cyclohexanone, 1-METHYLPYRROLIDONE in one or two Mixing.
Further, the cleaning agent, in parts by weight, including following component:
Further, the cleaning agent, in parts by weight, including following component:
Further, the cleaning agent, in parts by weight, including following component:
The second object of the present invention is to provide a kind of for removing conductor etching cavity ceramic coating part pollutant Cleaning agent preparation method, including:
By above-mentioned weight portion, each component is mixed, in stirring at normal temperature 30min, conductor etching cavity ceramic coating is obtained The cleaning agent of part pollutant.
The third object of the present invention is to provide a kind of for removing conductor etching cavity ceramic coating part pollutant Cleaning agent application, including:Etched parts containing ceramic coating are put into the cleaning agent, cleaning agent temperature is maintained at 30 ~40 DEG C, while ultrasonic wave cleaning frequency is 25~48KHZ, 1~10W/inch2 of ultrasonic power density, carry out ultrasonic wave clear 30min is washed, then etched parts are taken out into 3~5min of pure water rinsing, the pollutant adhered on its ceramic coating is removed completely.
Further, the ultrasonic wave cleaning frequency is 45~48KHZ, 5~10W/inch2 of ultrasonic power density.
Compared with prior art, the positive effect of the present invention is as follows:
Cleaning agent of the invention can thoroughly remove pollutant, it is ensured that the kind equipment is cleaned up completely, without particle Bring pollution etch chamber into, in turn ensure that basic material is without prejudice, so as to reduce the risk that ceramic coating comes off.
Specific embodiment
With reference to specific embodiment, the present invention is expanded on further.It should be understood that these embodiments are merely to illustrate the present invention Rather than limitation the scope of the present invention.In addition, it is to be understood that after the content for having read instruction of the present invention, people in the art Member can make various changes or modifications to the present invention, and these equivalent form of values equally fall within the application appended claims and limited Scope.
The raw material that following examples are used is by commercially available acquisition.
Embodiment 1
By the raw material of following weight portion, cleaning agent is configured:
During above each component raw material sequentially added into flask, mechanical agitation 30min obtains sticky, not stratified transparent liquid Body, as cleaning agent.
Etched parts containing ceramic coating are put into the cleaning agent of the mixing, and rinse bath TEMPERATURE PURGE liquid temperature degree is maintained at 40 DEG C, while imposing 48KHZ frequency ultrasonic waves in rinse bath, 5~10W/inch2 of ultrasonic power density enters in such circumstances The ultrasonic wave cleaning of row 30min, then pure water rinsing 5min is drawn off, cleaning performance evaluation is shown in Table 1.
Embodiment 2
By the raw material of following weight portion, cleaning agent is configured:
During above each component raw material sequentially added into flask, mechanical agitation 30min obtains sticky, not stratified transparent liquid Body, as cleaning agent.
Etched parts containing ceramic coating are put into the cleaning agent of the mixing, and rinse bath TEMPERATURE PURGE liquid temperature degree is maintained at 30 DEG C, while imposing 48KHZ frequency ultrasonic waves in rinse bath, 5~10W/inch2 of ultrasonic power density enters in such circumstances The ultrasonic wave cleaning of row 30min, then pure water rinsing 5min is drawn off, cleaning performance evaluation is shown in Table 1.
Embodiment 3
By the raw material of following weight portion, cleaning agent is configured:
During above each component raw material sequentially added into flask, mechanical agitation 30min obtains sticky, not stratified transparent liquid Body, as cleaning agent.
Etched parts containing ceramic coating are put into the cleaning agent of the mixing, and rinse bath TEMPERATURE PURGE liquid temperature degree is maintained at 30 DEG C, while imposing 48KHZ frequency ultrasonic waves in rinse bath, 5~10W/inch2 of ultrasonic power density enters in such circumstances The ultrasonic wave cleaning of row 30min, then pure water rinsing 5min is drawn off, cleaning performance evaluation is shown in Table 1.
Comparative example 1
Using commercially available SKT-01 cleaning agents, hundred moral chemical companies provide, in 30 DEG C, ultrasonic power density 5W/inch2, The ultrasonic wave cleaning of 30min is carried out in such circumstances, contrasts cleaning performance.
The cleaning agent cleaning performance evaluation table of table 1
Evaluating Embodiment 1 Embodiment 2 Embodiment 3 Comparative example 1
Film clearance 100% 100% 100% 99%
Residual silkgum content Without cull Without cull Without cull A small amount of residual
Ceramic coating dropping situations Nothing comes off Nothing comes off Nothing comes off Have and come off on a small quantity
Substrate damage situation Without damage Without damage Without damage There is a small amount of corrosion
General principle of the invention, principal character and advantages of the present invention has been shown and described above.The technology of the industry Personnel it should be appreciated that the present invention is not limited to the above embodiments, simply explanation described in above-described embodiment and specification this The principle of invention, various changes and modifications of the present invention are possible without departing from the spirit and scope of the present invention, these changes Change and improvement all fall within the protetion scope of the claimed invention.The claimed scope of the invention by appending claims and its Equivalent is defined.

Claims (7)

1. a kind of cleaning agent for removing conductor etching cavity ceramic coating part pollutant, it is characterised in that:With weight Part meter, including following component:
Wherein, the pickling buffer solution is selected from one or more in hydroxyacetic acid, formic acid, acetic acid;The fluoride is selected from fluorine Change ammonium, one or two mixing of fluoboric acid;The amine organic solvent is selected from monoethanolamine, triethanolamine, N, N- diformazans One or more in base formamide, triethylene tetramine;The based organic solvent is selected from ethyl acetate, butyl acetate Kind or two kinds of mixing;The organic solvent of ketone is selected from one or two the mixing in cyclohexanone, 1-METHYLPYRROLIDONE.
2. a kind of cleaning for removing conductor etching cavity ceramic coating part pollutant according to claim 1 Agent, it is characterised in that:The cleaning agent, in parts by weight, including following component:
3. a kind of cleaning for removing conductor etching cavity ceramic coating part pollutant according to claim 1 Agent, it is characterised in that:The cleaning agent, in parts by weight, including following component:
4. a kind of cleaning for removing conductor etching cavity ceramic coating part pollutant according to claim 1 Agent, it is characterised in that:The cleaning agent, in parts by weight, including following component:
5. the one kind according to claim any one of 1-4 is used to remove conductor etching cavity ceramic coating part pollutant Cleaning agent preparation method, including:
By above-mentioned weight portion, each component is mixed, in stirring at normal temperature 30min, conductor etching cavity ceramic coating part is obtained The cleaning agent of pollutant.
6. the one kind according to claim any one of 1-4 is used to remove conductor etching cavity ceramic coating part pollutant Cleaning agent application, including:Etched parts containing ceramic coating are put into the cleaning agent, cleaning agent temperature is maintained at 30 ~40 DEG C, while ultrasonic wave cleaning frequency is 25~48KHZ, 1~10W/inch2 of ultrasonic power density, carry out ultrasonic wave clear 30min is washed, then etched parts are taken out into 3~5min of pure water rinsing, the pollutant adhered on its ceramic coating is removed completely.
7. a kind of cleaning agent for removing conductor etching cavity ceramic coating part pollutant according to claim 6 Application, it is characterised in that:The ultrasonic wave cleaning frequency is 45~48KHZ, 5~10W/inch2 of ultrasonic power density.
CN201611215545.XA 2016-12-26 2016-12-26 Cleaning agent and its preparation and application for removing conductor etching cavity ceramic coating part pollutant Pending CN106833962A (en)

Priority Applications (1)

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CN201611215545.XA CN106833962A (en) 2016-12-26 2016-12-26 Cleaning agent and its preparation and application for removing conductor etching cavity ceramic coating part pollutant

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Application Number Priority Date Filing Date Title
CN201611215545.XA CN106833962A (en) 2016-12-26 2016-12-26 Cleaning agent and its preparation and application for removing conductor etching cavity ceramic coating part pollutant

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111112212A (en) * 2019-11-29 2020-05-08 上海富乐德智能科技发展有限公司 Quartz thermal screen plate regeneration method for integrated circuit manufacturing
CN113000475A (en) * 2019-12-20 2021-06-22 中微半导体设备(上海)股份有限公司 Cleaning method for plasma processing equipment component

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6200891B1 (en) * 1998-08-13 2001-03-13 International Business Machines Corporation Removal of dielectric oxides
CN1447754A (en) * 2000-07-10 2003-10-08 Ekc技术公司 Compsns. for cleaning organic and plasma etched residues for semiconductor devices
CN1479780A (en) * 2000-12-07 2004-03-03 ��ʲ Method for cleaning etcher parts
CN1543498A (en) * 2001-06-14 2004-11-03 �����Ʒ����ѧ��Ʒ��˾ Aqueous buffered fluoride-containing etch residue removers and cleaners
CN1840624A (en) * 2005-03-11 2006-10-04 罗门哈斯电子材料有限公司 Polymer remover
CN1871333A (en) * 2003-06-24 2006-11-29 高级技术材料公司 Compositions and methods for high-efficiency cleaning/polishing of semiconductor wafers
WO2007120259A2 (en) * 2005-11-08 2007-10-25 Advanced Technology Materials, Inc. Formulations for removing copper-containing post-etch residue from microelectronic devices
CN101163776A (en) * 2004-11-19 2008-04-16 霍尼韦尔国际公司 Selective removal chemistries for semiconductor applications, methods of production and uses thereof

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6200891B1 (en) * 1998-08-13 2001-03-13 International Business Machines Corporation Removal of dielectric oxides
CN1447754A (en) * 2000-07-10 2003-10-08 Ekc技术公司 Compsns. for cleaning organic and plasma etched residues for semiconductor devices
CN1479780A (en) * 2000-12-07 2004-03-03 ��ʲ Method for cleaning etcher parts
CN1543498A (en) * 2001-06-14 2004-11-03 �����Ʒ����ѧ��Ʒ��˾ Aqueous buffered fluoride-containing etch residue removers and cleaners
CN1871333A (en) * 2003-06-24 2006-11-29 高级技术材料公司 Compositions and methods for high-efficiency cleaning/polishing of semiconductor wafers
CN101163776A (en) * 2004-11-19 2008-04-16 霍尼韦尔国际公司 Selective removal chemistries for semiconductor applications, methods of production and uses thereof
CN1840624A (en) * 2005-03-11 2006-10-04 罗门哈斯电子材料有限公司 Polymer remover
US20060237392A1 (en) * 2005-03-11 2006-10-26 Rohm And Haas Electronic Materials Llc Polymer remover
WO2007120259A2 (en) * 2005-11-08 2007-10-25 Advanced Technology Materials, Inc. Formulations for removing copper-containing post-etch residue from microelectronic devices

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111112212A (en) * 2019-11-29 2020-05-08 上海富乐德智能科技发展有限公司 Quartz thermal screen plate regeneration method for integrated circuit manufacturing
CN111112212B (en) * 2019-11-29 2021-07-30 上海富乐德智能科技发展有限公司 Quartz thermal screen plate regeneration method for integrated circuit manufacturing
CN113000475A (en) * 2019-12-20 2021-06-22 中微半导体设备(上海)股份有限公司 Cleaning method for plasma processing equipment component
CN113000475B (en) * 2019-12-20 2022-07-22 中微半导体设备(上海)股份有限公司 Cleaning method for plasma processing equipment component

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Effective date of registration: 20191126

Address after: 200444 building 10, No. 181, Shanlian Road, Baoshan District, Shanghai

Applicant after: Shanghai fullerde Intelligent Technology Development Co., Ltd

Address before: 200444 Baoshan District, Baoshan City Industrial Park Road, No., Hill Road, No. 181

Applicant before: Shanghai Shenhe Thermo-magenetic Electronic Co., Ltd.

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Application publication date: 20170613

RJ01 Rejection of invention patent application after publication