CN106814308A - A kind of frequency-characteristic measuring-testing instrument - Google Patents
A kind of frequency-characteristic measuring-testing instrument Download PDFInfo
- Publication number
- CN106814308A CN106814308A CN201710148771.9A CN201710148771A CN106814308A CN 106814308 A CN106814308 A CN 106814308A CN 201710148771 A CN201710148771 A CN 201710148771A CN 106814308 A CN106814308 A CN 106814308A
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- CN
- China
- Prior art keywords
- decay
- frequency
- test
- phase difference
- chip microcomputer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
Abstract
The invention discloses a kind of frequency-characteristic measuring-testing instrument, including PC, communication interface, single-chip microcomputer, numerical control swept signal source, A/D modular converters, phase difference measurement module, circuit-under-test, peak detection and decay, the PC is connected by communication interface with single-chip microcomputer；The numerical control swept signal source is connected with phase difference measurement module, circuit-under-test and decay respectively；The circuit-under-test is connected with decay；The decay is connected with peak detection；The peak detection is connected by A/D modular converters with single-chip microcomputer；The decay is connected by phase difference measurement module with single-chip microcomputer.The present invention, the parameters such as the attenuation coefficient by the frequency range of the softpanel input test signal on PC, signal amplitude, sweep method and input, instruction and data is received from PC, control swept signal source produces required swept-frequency signal, span of control limit of control measurement simultaneously and phase difference measurement, through analyzing and processing, then show measurement result or printing measurement result.
Description
Technical field
The present invention relates to a kind of frequency-characteristic measuring-testing instrument.
Background technology
In circuit test, it is often necessary to test frequency characteristic, the frequency characteristic of circuit embodies the amplification of amplifier
Relation between energy and frequency input signal, frequency-characteristic measuring-testing instrument is to show circuit-under-test amplitude-frequency, the survey of phase-frequency characteristic curve
Measuring appratus.Traditional sweep generator enters only expensive, bulky, and is only able to display amplitude-versus-frequency curve, and entering can obtain phase frequency
Characteristic curve, more enter to print the frequency response curve of tested network to using bring it is many enter just, therefore, the present invention propose it is a kind of
Frequency-characteristic measuring-testing instrument solves this problem.With measurement range is wide, high precision, it is easy to use the features such as.
The content of the invention
It is caused above-mentioned multinomial in the prior art to solve it is an object of the invention to provide a kind of frequency-characteristic measuring-testing instrument
Defect.
The present invention uses following technical scheme：
To reach above-mentioned purpose, the present invention provides a kind of frequency-characteristic measuring-testing instrument, including PC, communication interface, single-chip microcomputer, numerical control
Swept signal source, A/D modular converters, phase difference measurement module, circuit-under-test, peak detection and decay, the PC is by logical
Letter interface is connected with single-chip microcomputer；The numerical control swept signal source is connected with phase difference measurement module, circuit-under-test and decay respectively；
The circuit-under-test is connected with decay；The decay is connected with peak detection；The peak detection passes through A/D modular converters and list
Piece machine is connected；The decay is connected by phase difference measurement module with single-chip microcomputer.
Beneficial effects of the present invention：
There is provided a kind of frequency-characteristic measuring-testing instrument, by the frequency range of the softpanel input test signal on PC, signal width
The parameters such as the attenuation coefficient of degree, sweep method and input, receive instruction and data, needed for control swept signal source is produced from PC
The swept-frequency signal wanted, while span of control limit of control measurement and phase difference measurement, through analyzing and processing, then show measurement result or printing measurement
As a result.
Brief description of the drawings
Fig. 1 is structural representation of the invention.
Specific embodiment
Specific embodiment of the invention is described below.
As shown in figure 1, a kind of frequency-characteristic measuring-testing instrument, including PC 1, communication interface 2, single-chip microcomputer 3, numerical control swept-frequency signal
Source 4, A/D modular converters 5, phase difference measurement module 6, circuit-under-test 7, peak detection 8 and decay 9, the PC 1 is by communication
Interface 2 is connected with single-chip microcomputer 3；The numerical control swept signal source 4 respectively with phase difference measurement module 6, circuit-under-test 7 and decay 9
Connection；The circuit-under-test 7 is connected with decay 9；The decay 9 is connected with peak detection 8；The peak detection 8 is turned by A/D
Mold changing block 5 is connected with single-chip microcomputer 3；The decay 9 is connected by phase difference measurement module 6 with single-chip microcomputer 3.
The present invention, by the frequency range of the softpanel input test signal on PC, signal amplitude, sweep method and defeated
The parameters such as the attenuation coefficient for entering, instruction and data is received from PC, and control swept signal source produces required swept-frequency signal, together
When control amplitude measurement and phase difference measurement, through analyzing and processing, then show measurement result or printing measurement result.
The above, the only present invention preferably specific embodiment, but protection scope of the present invention is not limited thereto,
Any one skilled in the art the invention discloses technical scope in, technology according to the present invention scheme and its
Inventive concept is subject to equivalent or change, should all be included within the scope of the present invention.
Claims (1)
1. a kind of frequency-characteristic measuring-testing instrument, including PC, communication interface, single-chip microcomputer, numerical control swept signal source, A/D modular converters,
Phase difference measurement module, circuit-under-test, peak detection and decay, it is characterised in that the PC passes through communication interface and monolithic
Machine is connected；The numerical control swept signal source is connected with phase difference measurement module, circuit-under-test and decay respectively；The circuit-under-test
It is connected with decay；The decay is connected with peak detection；The peak detection is connected by A/D modular converters with single-chip microcomputer；Institute
Decay is stated to be connected with single-chip microcomputer by phase difference measurement module.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710148771.9A CN106814308A (en) | 2017-03-14 | 2017-03-14 | A kind of frequency-characteristic measuring-testing instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710148771.9A CN106814308A (en) | 2017-03-14 | 2017-03-14 | A kind of frequency-characteristic measuring-testing instrument |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106814308A true CN106814308A (en) | 2017-06-09 |
Family
ID=59115164
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710148771.9A Pending CN106814308A (en) | 2017-03-14 | 2017-03-14 | A kind of frequency-characteristic measuring-testing instrument |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106814308A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108918962A (en) * | 2018-07-18 | 2018-11-30 | 江苏华维电力科技有限公司 | A kind of portable digital frequency meter |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN203745579U (en) * | 2014-03-21 | 2014-07-30 | 河海大学常州校区 | Frequency characteristic test instrument based on waveform superposition |
| CN104483619A (en) * | 2014-12-10 | 2015-04-01 | 四川理工学院 | Frequency characteristic testing system based on virtual instrument |
| CN104808056A (en) * | 2015-04-19 | 2015-07-29 | 华南理工大学 | Frequency characteristic testing method and device based on comparator conversion |
| CN205506977U (en) * | 2016-04-13 | 2016-08-24 | 河北工业大学 | Digit frequency characteristic testing arrangement based on single chip microcomputer control |
-
2017
- 2017-03-14 CN CN201710148771.9A patent/CN106814308A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN203745579U (en) * | 2014-03-21 | 2014-07-30 | 河海大学常州校区 | Frequency characteristic test instrument based on waveform superposition |
| CN104483619A (en) * | 2014-12-10 | 2015-04-01 | 四川理工学院 | Frequency characteristic testing system based on virtual instrument |
| CN104808056A (en) * | 2015-04-19 | 2015-07-29 | 华南理工大学 | Frequency characteristic testing method and device based on comparator conversion |
| CN205506977U (en) * | 2016-04-13 | 2016-08-24 | 河北工业大学 | Digit frequency characteristic testing arrangement based on single chip microcomputer control |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108918962A (en) * | 2018-07-18 | 2018-11-30 | 江苏华维电力科技有限公司 | A kind of portable digital frequency meter |
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Application publication date: 20170609 |