CN106814114B - A kind of empty full field setting method of coplanar capacitor array imaging sensing - Google Patents

A kind of empty full field setting method of coplanar capacitor array imaging sensing Download PDF

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Publication number
CN106814114B
CN106814114B CN201710024565.7A CN201710024565A CN106814114B CN 106814114 B CN106814114 B CN 106814114B CN 201710024565 A CN201710024565 A CN 201710024565A CN 106814114 B CN106814114 B CN 106814114B
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capacitance
field
measured object
barnyard
measured
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CN106814114A (en
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张玉燕
孙东涛
温银堂
张振达
贾文涛
孙娜
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Qinhuangdao Gaochuang Technology Co., Ltd
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Yanshan University
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/24Investigating the presence of flaws

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  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
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Abstract

The present invention relates to a kind of coplanar capacitor array imagings to sense empty full field setting method comprising following steps: (1), by measured object being placed in sensor plate, measures the capacitance of measured object at this time as object field capacitance;(2), using the geometric center of sensor plate as axle center, measured object is rotated by 90 ° counterclockwise, measures the capacitance of measured object at this time as barnyard capacitance;(3), continue for measured object to be rotated by 90 ° counterclockwise, measure the capacitance of measured object at this time as capacitance in the whole field;(4), barnyard capacitance is made the difference with object field capacitance respectively with capacitance in the whole field, and image reconstruction, observation gained difference reconstruction image is carried out to two groups of difference capacitors respectively;(5), compare whether red blue two region in two width difference reconstruction images meets corresponding rotation angular relationship, determine defect.The simple barnyard of this method sets process in the whole field, improves dielectric field image reconstruction quality.

Description

A kind of empty full field setting method of coplanar capacitor array imaging sensing
Technical field
The invention belongs to technical field of nondestructive testing, and in particular to a kind of empty full field of coplanar capacitor array imaging sensing is set Determine method.
Background technique
Composite material is now widely used for the fields such as Aeronautics and Astronautics, and is connected by way of bonding with body, glues The quality for connecing layer has larger impact to its performance, so it is particularly important to carry out effective non-destructive testing to adhesive layer.
Capacitance chromatography imaging (Electrical Capacitance Tomography, ECT) technology is obtained by measurement Capacitance and the obtained sensitivity matrix of emulation solve the distribution of measured object dielectric constant, to reach to tested analyte detection Effect is widely used in industrial pipeline multiphase flow due to advantages such as Noninvasive, response quickly, measurement accuracy height in recent years The fields such as monitoring, electrode arrangement is mainly circumferentially.
When setting electrode barnyard in traditional ECT technology, generally using air as inter-electrode dielectric, corresponding barnyard is obtained Capacitance;When setting electrode in the whole field, generally using the master body of measured object (not having defect) as dielectric, obtain corresponding Capacitance in the whole field.But this method is to set empty full field using Single Medium as dielectric.When the dielectric of measured material is special Property and air difference it is larger, and when tested defect is smaller, according to this empty full field setting means, then can largely reduce Imaging effect is not high so as to cause defectoscopy precision.
Thus the coplanar capacitor array imaging sensing technology developed not only has the characteristics that traditional ECT technology, but also By the geometry advantage of itself, measured object can be examined from single direction in the case where tested object field geometric space is limited Survey, composite material in terms of have huge development prospect.But coplanar capacitor array imaging technique is compared to circle The structure of all formula capacitance imaging technologies, measured object is more complicated with external form, no longer restrains in circular pipe, dielectric constant is remote Much smaller than the dielectric constant of heterogeneous fluid in pipeline, the capacitance values for causing experiment to measure are very small, low measurement accuracy, after Continuous imaging effect is bad.In response to this problem, lot of domestic and foreign scholar mainly builds in sensor plate design optimization, the emulation of sensitive field Mould and image reconstruction algorithm etc. are studied, and improve the imaging effect of tested dielectric field to a certain extent.Dielectric The important prerequisite that field picture is rebuild is to obtain the capacitance data containing measured object information, and key link therein is barnyard/full The setting of field, this is an important factor for influencing dielectric field imaging resolution.Therefore, select suitable barnyard/in the whole field for improving Reconstructed image quality and measurement accuracy are very important.It is multiple when being used using coplanar capacitor array capacitance imaging technology aviation When the adhered layer defects detection of condensation material, according to traditional empty full field setting method, barnyard and measurement capacitance in the whole field with Measurement capacitance difference containing defective measured material is larger, and the dielectric constant influenced in image reconstruction process is distributed to image The mapping of gray scale, so that imaging resolution substantially reduces, to influence imaging effect.The present invention has studied coplanar for this problem Barnyard and setting method in the whole field in array electrode sensor.
For certain aviation composite structure, have the characteristics that porous, open structure, anisotropy, strong sound absorption properties, Sensing technology is imaged using a kind of coplanar capacitor array, the stickup layer defects of composite structure are detected.For measurement Barnyard needed for process, in the whole field capacitance propose a kind of relative type motor setting method, using a variety of dielectric combined situations As setting primary condition, barnyard and in the whole field is set separately, and carry out the image reconstruction of dielectric constant field, it is scarce according to result detection It falls into.
Summary of the invention
Goal of the invention: the present invention has made improvements in view of the above-mentioned problems of the prior art, i.e., the invention discloses one kind Coplanar capacitor array imaging senses empty full field setting method.
A kind of technical solution: the empty full field setting method of coplanar capacitor array imaging sensing, comprising the following steps:
(1), measured object is placed in sensor plate, measures the capacitance of measured object at this time as object field capacitance;
(2), using the geometric center of sensor plate as axle center, measured object is rotated by 90 ° counterclockwise, measurement is tested at this time The capacitance of object is as barnyard capacitance;
(3), continue for measured object to be rotated by 90 ° counterclockwise, measure the capacitance of measured object at this time as capacitance in the whole field;
(4), by measured by barnyard capacitance measured by step (2) and step (3) in the whole field capacitance respectively with step (1) the object field capacitance measured by makes the difference, and carries out image reconstruction to two groups of difference capacitors respectively, and observation gained difference rebuilds figure Picture,
The height of dielectric coefficient is wherein indicated in different colors:
Red represents high dielectric constant,
Blue represents low-k,
Defective locations change with the rotation of tested exemplar;
(5), compare whether red blue two region in two width difference reconstruction images meets corresponding rotation angular relationship, if symbol It closes, then confirmation blue region in barnyard capacitance error image, i.e., the red area in corresponding capacitance error image in the whole field For defective locations;It, will on the basis of confirming that blue region is defective locations in barnyard capacitance error image if not meeting Red area rotates clockwise 90 degree in barnyard capacitance error image, the red area after rotating be testee rotation and Caused by defect intersection, which collectively constitutes lacking in tested object field with fixed defect part before It falls into.
The utility model has the advantages that a kind of coplanar capacitor array imaging disclosed by the invention senses empty full field setting method with following The utility model has the advantages that
1. setting electric contrasted between solid dielectric barnyard and medium in the whole field with relative mode, setting means is not unique, is adjusted;
2. the setting method can reduce the capacitive differential of barnyard capacitance and tested object field, and then improve point of reconstruction image Resolution improves image quality;
3. realizing the detection to certain Composite Bonded layer defects based on coplanar capacitor array imaging sensing technology.
Specific embodiment:
Detailed description of specific embodiments of the present invention below.
A kind of empty full field setting method of coplanar capacitor array imaging sensing, comprising the following steps:
(1), measured object is placed in sensor plate, measures the capacitance of measured object at this time as object field capacitance;
(2), using the geometric center of sensor plate as axle center, measured object is rotated by 90 ° counterclockwise, measurement is tested at this time The capacitance of object is as barnyard capacitance;
(3), continue for measured object to be rotated by 90 ° counterclockwise, measure the capacitance of measured object at this time as capacitance in the whole field;
(4), by measured by barnyard capacitance measured by step (2) and step (3) in the whole field capacitance respectively with step (1) the object field capacitance measured by makes the difference, and carries out image reconstruction to two groups of difference capacitors respectively, and observation gained difference rebuilds figure Picture,
The height of dielectric coefficient is wherein indicated in different colors:
Red represents high dielectric constant,
Blue represents low-k,
Defective locations change with the rotation of tested exemplar;
(5), compare whether red blue two region in two width difference reconstruction images meets corresponding rotation angular relationship, if symbol It closes, then confirmation blue region in barnyard capacitance error image, i.e., the red area in corresponding capacitance error image in the whole field For defective locations;It, will on the basis of confirming that blue region is defective locations in barnyard capacitance error image if not meeting Red area rotates clockwise 90 degree in barnyard capacitance error image, the red area after rotating be testee rotation and Caused by defect intersection, which collectively constitutes lacking in tested object field with fixed defect part before It falls into.
Embodiments of the present invention are elaborated above.But present invention is not limited to the embodiments described above, Technical field those of ordinary skill within the scope of knowledge, can also do without departing from the purpose of the present invention Various change out.

Claims (1)

1. a kind of coplanar capacitor array imaging senses empty full field setting method, measured object is placed in sensor plate, it is special Sign is, comprising the following steps:
(1), the capacitance of measured object when measurement measured object is placed in sensor plate, and using the capacitance as object field electricity Capacitance;
(2), using the geometric center of sensor plate as axle center, measured object is rotated by 90 ° counterclockwise, measurement measured object at this time Capacitance is as barnyard capacitance;
(3), continue for measured object to be rotated by 90 ° counterclockwise, measure the capacitance of measured object at this time as capacitance in the whole field;
(4), by measured by barnyard capacitance measured by step (2) and step (3) in the whole field capacitance respectively with step (1) institute The object field capacitance measured makes the difference, and carries out image reconstruction to two groups of difference capacitors respectively, observes gained difference reconstruction image,
The height of dielectric coefficient is wherein indicated in different colors:
Red represents high dielectric constant,
Blue represents low-k,
Defective locations change with the rotation of tested exemplar;
(5), compare whether red blue two region in two width difference reconstruction images meets corresponding rotation angular relationship, if meeting, Confirmation blue region in barnyard capacitance error image, that is, corresponding to the red area in capacitance error image in the whole field is defect Position;If not meeting, on the basis of confirming that blue region is defective locations in barnyard capacitance error image, by barnyard electricity Red area rotates clockwise 90 degree in capacitance error image, the red area after rotating be testee rotation and caused by Defect intersection, the defect intersection collectively constitute the defects of tested object field with fixed defect part before.
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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101871906A (en) * 2010-06-28 2010-10-27 天津大学 Device and method for multiphase-flow imaging measurement based on double-modal tomography
CN103439375A (en) * 2013-08-23 2013-12-11 华北电力大学 Integrated type capacitance-ultrasound tomography sensor
CN104503161A (en) * 2014-12-24 2015-04-08 厦门天马微电子有限公司 Pixel electrode, array substrate and display panel
US9395317B2 (en) * 2009-01-28 2016-07-19 Massachusetts Institute Of Technology System and method for providing electromagnetic imaging through electroquasistatic sensing

Patent Citations (4)

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Publication number Priority date Publication date Assignee Title
US9395317B2 (en) * 2009-01-28 2016-07-19 Massachusetts Institute Of Technology System and method for providing electromagnetic imaging through electroquasistatic sensing
CN101871906A (en) * 2010-06-28 2010-10-27 天津大学 Device and method for multiphase-flow imaging measurement based on double-modal tomography
CN103439375A (en) * 2013-08-23 2013-12-11 华北电力大学 Integrated type capacitance-ultrasound tomography sensor
CN104503161A (en) * 2014-12-24 2015-04-08 厦门天马微电子有限公司 Pixel electrode, array substrate and display panel

Non-Patent Citations (3)

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Title
3D imaging based on fringe effect of an electrical capacitance tomography sensor;J. Sun et al.;《Measurement》;20150722;第186-199页
Non-destructive evaluation of adhesive layer using a planar array capacitive imaging technology;Yuyan Zhang et al.;《PROCEEDINGS OF SPIE》;20160415;第9804卷;第98042D-1至98042D-7页
基于ECT的复合材料构件胶层缺陷检测;温银堂 等;《仪器仪表学报》;20150831;第36卷(第8期);第1783-1790页

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