CN106771778A - The lossless screening technique of low pressure difference linear voltage regulator Radiation hardness and device - Google Patents
The lossless screening technique of low pressure difference linear voltage regulator Radiation hardness and device Download PDFInfo
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- CN106771778A CN106771778A CN201710057522.9A CN201710057522A CN106771778A CN 106771778 A CN106771778 A CN 106771778A CN 201710057522 A CN201710057522 A CN 201710057522A CN 106771778 A CN106771778 A CN 106771778A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
Abstract
The invention provides a kind of lossless screening technique of low pressure difference linear voltage regulator Radiation hardness and device, method includes：Obtain the output noise magnitude of voltage and output voltage values as the low pressure difference linear voltage regulator predose of random increment；Obtain as the low pressure difference linear voltage regulator of random increment by the output voltage values after irradiation；Output voltage values based on predose and by the output voltage values after irradiation, are calculated output voltage drift value；Using the output noise magnitude of voltage of predose as information parameter, using output voltage drift value as irradiation behaviour parameter, multiple linear regression equations are set up, and calculate the coefficient vector in equation of linear regression；Based on coefficient vector, the lossless screening regression prediction equation set up between information parameter and irradiation behaviour parameter；Using lossless screening regression prediction equation, to being screened with batch other low pressure difference linear voltage regulators.The present invention can be realized under the premise of undamaged to low pressure difference linear voltage regulator, carry out the test screen to component accurately and efficiently Radiation hardness.
Description
Technical field
The present invention relates to electronic apparatus technical field, in particular to a kind of low pressure difference linear voltage regulator Flouride-resistani acid phesphatase energy
The lossless screening technique of power and device.
Background technology
Low pressure difference linear voltage regulator is mainly and is made up of transistor, reference diode, comparison amplifier and sample resistance, should
Device has the outstanding advantages such as load regulation is low, quiescent current is small, noise is low, efficiency is high, is applied in space radiation environment
Low pressure difference linear voltage regulator (LDO, Low Dropout Regulator), in the effect of space charged particle and various rays
Under, its performance can occur significant change, its output ripple, line regulation, quiescent current, conversion efficiency and noise voltage work(
There is corresponding conversion in rate spectral amplitude ratio etc.；Therefore how anti-spoke is carried out to the low pressure difference linear voltage regulator that is applied in space environment
According to the test of ability, so filter out the strong pulse width debugger of Radiation hardness carry out using have highly important meaning
Justice.
In the prior art, the mode to test and the screening of the Radiation hardness of space flight low pressure difference linear voltage regulator is main
Entered as shown in figure 1, treating screening device first using irradiating-annealing screening technique detailed process using " irradiation-annealing " method
The irradiation of row nominal dose；Then one or several sensitive electrical parameters are selected, measurement was completed in two hours, screened out and be not inconsistent
Close desired device；Then the irradiation of 50% nominal dose is carried out；Then electrical testing is carried out again after pressurization annealing；Finally screen
Go out suitable device；This method has that testing cost is high, detection time is long and has in itself to device certain destructive
Defect；And because using heavy dose of rate experiment, come the method for equivalent space LDR radiation environment, analog result is often not
Accurately.
The content of the invention
In view of this, the purpose of the embodiment of the present invention is that a kind of low pressure difference linear voltage regulator Radiation hardness of offer is lossless
Screening technique and device, to solve the above problems.
In a first aspect, the embodiment of the invention provides a kind of lossless screening side of low pressure difference linear voltage regulator Radiation hardness
Method, including：
Obtain the output noise magnitude of voltage and output voltage values as the low pressure difference linear voltage regulator predose of random increment；
The low pressure difference linear voltage regulator as random increment is obtained by the output voltage values after irradiation；
Output voltage values based on the low pressure difference linear voltage regulator predose as random increment and by after irradiation
Output voltage values, be calculated output voltage drift value；
Using the output noise magnitude of voltage of the predose as information parameter, using the output voltage drift value as irradiation
Performance parameter, sets up multiple linear regression equations, and calculate the coefficient vector in equation of linear regression using linear regression method；
Based on the coefficient vector, the lossless screening regression forecasting set up between described information parameter and irradiation behaviour parameter
Equation；
Using the lossless screening regression prediction equation, the anti-radiation performance of single low pressure difference linear voltage regulator is predicted, it is right
Screened with batch other low pressure difference linear voltage regulators.
With reference in a first aspect, the embodiment of the invention provides the first possible implementation method of first aspect, wherein：
The noise voltage value for obtaining the low pressure difference linear voltage regulator as random increment includes：
The input voltage and loading condition of low pressure difference linear voltage regulator are set；
Gather the output signal of low pressure difference linear voltage regulator output end；
Preposition amplification is carried out to the output signal, preamplification signal is obtained；
Based on the preamplification signal, noise voltage value is obtained.
With reference in a first aspect, the embodiment of the invention provides second possible implementation method of first aspect, wherein：
It is described to utilize the lossless screening regression prediction equation, test the Flouride-resistani acid phesphatase of single low pressure difference linear voltage regulator
Can, to being screened with batch low pressure difference linear voltage regulator, including：
Obtain the output noise magnitude of voltage of low pressure difference linear voltage regulator to be screened；
Based on the output noise magnitude of voltage, using the regression prediction equation, this low pressure difference linear voltage regulator is obtained
Output voltage drift value predicted value；
The output voltage drift tolerance limit of the output voltage drift value predicted value and this batch of low pressure difference linear voltage regulator is entered
Row compares, if the predicted value is within the output voltage drift tolerance limit of such low pressure difference linear voltage regulator, then it is assumed that this is low
Pressure difference linear voltage regulator is qualified products；, whereas if the predicted value is not in the output electricity of such low pressure difference linear voltage regulator
Within pressure drift tolerance limit, then it is assumed that this low pressure difference linear voltage regulator is substandard product.
Second aspect, the embodiment of the invention provides a kind of lossless screening dress of low pressure difference linear voltage regulator Radiation hardness
Put, including：
First acquisition unit, for obtaining as the output noise electricity of the low pressure difference linear voltage regulator predose of random increment
Pressure value and output voltage values；
Second acquisition unit, for obtaining the low pressure difference linear voltage regulator as random increment by defeated after irradiation
Go out magnitude of voltage；
Computing unit, for the output voltage values based on the low pressure difference linear voltage regulator predose as random increment
With by the output voltage values after irradiation, output voltage drift value is calculated；
Equation of linear regression sets up unit, for using the output noise magnitude of voltage of the predose as information parameter, with
The output voltage drift value sets up multiple linear regression equations, and calculate as irradiation behaviour parameter using linear regression method
Coefficient vector in equation of linear regression；
It is lossless screening regression prediction equation set up unit, for based on the coefficient vector, set up described information parameter and
Lossless screening regression prediction equation between irradiation behaviour parameter；
Test cell, for utilizing the lossless screening regression prediction equation, predicts single low pressure difference linear voltage regulator
Anti-radiation performance, to being screened with batch other low pressure difference linear voltage regulators.
Method and device that the embodiment of the present invention is provided, can realize undamaged to low pressure difference linear voltage regulator
Under the premise of, low pressure difference linear voltage regulator Radiation hardness is tested, and then realization accurately and efficiently filters out anti-spoke
According to the strong low pressure difference linear voltage regulator component of ability.
To enable the above objects, features and advantages of the present invention to become apparent, preferred embodiment cited below particularly, and coordinate
Appended accompanying drawing, is described in detail below.
Brief description of the drawings
Technical scheme in order to illustrate more clearly the embodiments of the present invention, below will be attached to what is used needed for embodiment
Figure is briefly described, it will be appreciated that the following drawings illustrate only certain embodiments of the present invention, thus be not construed as it is right
The restriction of scope, for those of ordinary skill in the art, on the premise of not paying creative work, can also be according to this
A little accompanying drawings obtain other related accompanying drawings.
Fig. 1 shows " irradiation-annealing " method flow schematic diagram in the prior art；
Fig. 2 shows a kind of lossless screening side of low pressure difference linear voltage regulator Radiation hardness that the embodiment of the present invention is provided
The method flow schematic diagram of method；
Fig. 3 shows the structural representation of the measuring system of the noise voltage value that the embodiment of the present invention is provided；
Fig. 4 shows the lossless screening dress of a kind of low pressure difference linear voltage regulator Radiation hardness that the embodiment of the present invention is provided
The structural representation put.
Specific embodiment
Below in conjunction with accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Ground description, it is clear that described embodiment is only a part of embodiment of the invention, rather than whole embodiments.Generally exist
The component of the embodiment of the present invention described and illustrated in accompanying drawing can be arranged and designed with a variety of configurations herein.Cause
This, the detailed description of the embodiments of the invention to providing in the accompanying drawings is not intended to limit claimed invention below
Scope, but it is merely representative of selected embodiment of the invention.Based on embodiments of the invention, those skilled in the art are not doing
The every other embodiment obtained on the premise of going out creative work, belongs to the scope of protection of the invention.
Carry out that technical solution of the present invention is discussed in detail below by specific embodiment.
As shown in figure 1, the embodiment of the invention provides a kind of lossless screening side of low pressure difference linear voltage regulator Radiation hardness
Method, comprises the following steps：
S201, obtain as random increment low pressure difference linear voltage regulator predose output noise magnitude of voltage EnAnd output
Magnitude of voltage Uo；
Before above-mentioned steps, first according to simple random sampling from " the sampling parent " with a collection of low pressure difference linear voltage regulator
Principle is extracted n " random increment "；
For the low pressure difference linear voltage regulator that a large amount of same techniques are manufactured, its parameter obeys certain statistical distribution,
Individual and the parent of increment have the identical regularity of distribution.Regression analysis is carried out to increment, the probability conclusion for therefrom obtaining can be with
It is generalized to parent.In actual applications, the visual maternal sample number of the number of random increment and permissible accuracy determine increment
Number, typically between 20~30；
Measure the noise voltage value E of these random increment low pressure difference linear voltage regulator predosesnAnd output voltage values Uo, and
Record test condition；
Measurement of the present invention to noise voltage value uses the measuring system of noise voltage value as shown in Figure 3, the system bag
Include：Power supply, LDO devices adapter, bias device, low-noise preamplifier, data collection and transmission；Wherein LDO devices
Adapter and bias device are mainly the specific requirement according to device under test noise testing, there is provided bias condition, loading condition, are allowed to
In corresponding test mode；Noise signal to be measured is sent to microcomputer and carries out data by preamplifier and data collecting card
Analyzing and processing, storage and print out；Data collecting card uses DAQ2010 data collecting cards, and its maximum sampling rate is
2MHz, quantified precision is 14bit, to realize that signal is real-time, fast and accurately gather, and ensure larger frequency range and survey
Examination precision；Further, obtain and comprised the following steps as the noise voltage value of the low pressure difference linear voltage regulator of random increment：
The input voltage and loading condition of low pressure difference linear voltage regulator are set；
Gather the output signal of low pressure difference linear voltage regulator output end；
Preposition amplification is carried out to above-mentioned output signal, preamplification signal is obtained；
Based on above-mentioned preamplification signal, noise voltage value is obtained.
S202, acquisition are as the low pressure difference linear voltage regulator of random increment by the output voltage values U ' after irradiationo；
S203, the output voltage values U based on the low pressure difference linear voltage regulator predose as random incrementoIrradiated with passing through
Output voltage values U ' afterwardso, it is calculated output voltage drift value Δ U=U 'o-Uo；
It should be noted that because with the general presentation normal distribution of output voltage distribution of a collection of device, measuring spoke
Its absolute change amount U can be selected during output voltage drift value according to aftero′-Uo, it is also possible to select relative variation
The selection result is not interfered with.The close rate and accumulated dose of irradiation will according to the specified irradiation dose of specific low pressure difference linear voltage regulator come
Setting, typically in order to simulate space radiation environment, close rate should be 50 to 300rad (Si)/s.It is also noted that irradiation
Measurement threshold voltage will be completed within two hours afterwards, in case device annealing has a strong impact on test result.After the irradiation
Random increment output voltage drift value Δ U is carried out using conventional meanses.
S204, the output noise magnitude of voltage E with predosenAs information parameter, using output voltage drift value Δ U as spoke
According to performance parameter, multiple linear regression equations are set up using linear regression method, and calculate E in equation of linear regressionnCoefficient
Select noise voltage value EnIt is information parameter, output voltage drift value Δ U is irradiation behaviour parameter, using linear regression
Method, sets up EnAnd the equation of linear regression between Δ U.To above-mentioned n increment, multiple linear regression matrix is built
Wherein：It is the drift of output voltage after irradiation, X is by the noise voltage work value E of predosenMeasured value structure
Into known constant matrix,It is coefficient vector,It is residual error；It is measured value with X, calculates E in equation of linear regressionnBe
NumberDetailed process it is as follows：
Step 1, by multiple linear regression equations can further spread out for
Wherein Δ U1、ΔU2、…、ΔUnFor the 1st, 2 ..., output voltage drift value after the irradiation of n random increment；En1、
En2、…、EnnFor the 1st, 2 ..., the predose noise voltage of n random increment；β0、β1Respectively constant term, noise voltage value
Coefficient；ε1、ε2、…、εnFor the 1st, 2 ..., the residual error of the equation of linear regression of n random increment.
Step 2, the coefficient vector for drawing information parameter using the least square estimation method are：
Wherein, XTIt is the transposed matrix of X.
S205, based on coefficient vector, set up information parameter EnAnd the lossless screening between irradiation behaviour parameter, Δ U is returned in advance
Survey equation；
Under given 1- α confidence levels, low pressure difference linear voltage regulator information parameter vector to be screenedWherein
EnkBe the noise voltage value of device to be screened actual measurement, then the lossless screening regression forecasting value of output voltage drift value after it is irradiatedFor：
Wherein：T (1- α/2, (n-2)) is that the t that confidence level is 1- α is distributed,
Wherein,It is residual error,ForTransposition, XTIt is the transposition of X,ForTransposition；
MSE is defined as follows：
SSE is variance quadratic sum,It is residual error
S206, using the lossless screening regression prediction equation, predict the Flouride-resistani acid phesphatase of single low pressure difference linear voltage regulator
Can, to being screened with batch other low pressure difference linear voltage regulators.
Obtain the output noise magnitude of voltage of low pressure difference linear voltage regulator to be screened；
Based on the output noise magnitude of voltage, using the regression prediction equation, this low pressure difference linear voltage regulator is obtained
Output voltage drift value predicted value；
The output voltage drift tolerance limit of the output voltage drift value predicted value and this batch of low pressure difference linear voltage regulator is entered
Row compares, if the predicted value is within the output voltage drift tolerance limit of such low pressure difference linear voltage regulator, then it is assumed that this is low
Pressure difference linear voltage regulator is qualified products；, whereas if the predicted value is not in the output electricity of such low pressure difference linear voltage regulator
Within pressure drift tolerance limit, then it is assumed that this low pressure difference linear voltage regulator is substandard product；
Exemplary, for the low pressure difference linear voltage regulator that XC6204 series is output as 3.3V, output voltage allowed band
It is 3.234V~3.366V.So, the noise voltage power spectral amplitude ratio of device to be screened is measured first, according to the explanation of second step
With the specification of this device, noise voltage power spectrum amplitude measurement condition sets as follows：
Input voltage：Uin=Uout+ 1=4.3 (V), wherein, UoutIt is device nominal output voltage；
Loading condition：Iout=30mA,
The noise voltage measured value of device to be screened is brought into regression prediction equation, the prediction of its output voltage drift is obtained
ValueIf the predicted value of output voltage isIn 3.234V~3.366V within the scope of this, then
Think that the device meets the requirements, can be selected；If the predicted value of output voltage drift is super gone beyond the scope, then it is assumed that the device
Part is undesirable, is screened.
Multiple regression analysis method can avoid the damage to low pressure difference linear voltage regulator to be screened, the pass of this kind of screening technique
Key is the sensitive parameter for choosing predose, and device parameter performance after irradiation is estimated, and the former sensitive parameter is referred to as information
Parameter, it is desirable to device parameter performance referred to as radiance parameter after the irradiation estimated, i.e., the device for being manufactured to same technique,
Irradiation test is carried out by certain amount chance sample, the functional relation between information parameter and radiance parameter is found out,
And then screening of the realization to non-irradiated device；The embodiment of the present invention has taken into full account noise parameter characteristic, irradiation and low voltage difference line
The substantial connection of the defect inside property regulator device, the regression prediction equation for finally giving can be carried out accurately to component
Radiation hardness is screened, and reliability is high.
The embodiment of the present invention is from noise voltage value of the low pressure difference linear voltage regulator predose under certain bias as letter
Breath parameter, from the output voltage drift value after irradiation as radiance parameter, low voltage difference is just echoed from this parameter
Pipe microdefect change after linear voltage regulator irradiation, the defect that noise voltage value is produced after being irradiated with device is in close relations, passes through
Irradiation test is carried out to certain amount sample, the functional relation between information parameter and irradiation behaviour parameter is found out, this function
Relation is also applied for batch other devices, and then realizes the screening to non-irradiated device Radiation hardness, with existing screening side
Method is compared, and it has advantages below：
1st, the device for screening is, without irradiation, to belong to " lossless screening ", therefore screening process will not reduce device
The part life-span；
2nd, selected information parameter, i.e. noise voltage value, cover low pressure difference linear voltage regulator and receive to be exported during irradiation
The main factor of voltage drift, the degree of accuracy is high；
3rd, a parameter of device to be screened need to be only measured, cycle is short is screened, method is simple, it is easy to use.
As shown in figure 4, the embodiment of the present invention additionally provides a kind of lossless screening of low pressure difference linear voltage regulator Radiation hardness
Device, including：
First acquisition unit 410, makes an uproar for obtaining as the output of the low pressure difference linear voltage regulator predose of random increment
Psophometric voltage value and output voltage values；
Second acquisition unit 420, for obtaining the low pressure difference linear voltage regulator as random increment by defeated after irradiation
Go out magnitude of voltage；
Computing unit 430, for the output electricity based on the low pressure difference linear voltage regulator predose as random increment
Pressure value and by the output voltage values after irradiation, is calculated output voltage drift value；
Equation of linear regression sets up unit 440, for using the output noise magnitude of voltage of the predose as information parameter,
Using the output voltage drift value as irradiation behaviour parameter, multiple linear regression equations are set up using linear regression method, and count
Calculate the coefficient vector in equation of linear regression；
Lossless screening regression prediction equation sets up unit 450, for based on the coefficient vector, setting up described information parameter
Lossless screening regression prediction equation and irradiation behaviour parameter between；
Test cell 460, for utilizing the lossless screening regression prediction equation, predict single low pressure difference linear voltage regulator
Anti-radiation performance, to being screened with batch other low pressure difference linear voltage regulators.
It is apparent to those skilled in the art that, for convenience and simplicity of description, the system of foregoing description
Specific work process, may be referred to the corresponding process in preceding method embodiment, will not be repeated here.
If the function is to realize in the form of SFU software functional unit and as independent production marketing or when using, can be with
Storage is in a computer read/write memory medium.Based on such understanding, technical scheme is substantially in other words
The part contributed to prior art or the part of the technical scheme can be embodied in the form of software product, the meter
Calculation machine software product is stored in a storage medium, including some instructions are used to so that a computer equipment (can be individual
People's computer, server, or network equipment etc.) perform all or part of step of each embodiment methods described of the invention.
And foregoing storage medium includes：USB flash disk, mobile hard disk, read-only storage (ROM, Read-Only Memory), arbitrary access are deposited
Reservoir (RAM, Random Access Memory), magnetic disc or CD etc. are various can be with the medium of store program codes.
The above, specific embodiment only of the invention, but protection scope of the present invention is not limited thereto, and it is any
Those familiar with the art the invention discloses technical scope in, change or replacement can be readily occurred in, should all contain
Cover within protection scope of the present invention.Therefore, protection scope of the present invention described should be defined by scope of the claims.
Claims (4)
1. a kind of lossless screening technique of low pressure difference linear voltage regulator Radiation hardness, it is characterised in that including：
Obtain the output noise magnitude of voltage and output voltage values as the low pressure difference linear voltage regulator predose of random increment；
The low pressure difference linear voltage regulator as random increment is obtained by the output voltage values after irradiation；
Output voltage values based on the low pressure difference linear voltage regulator predose as random increment and by defeated after irradiation
Go out magnitude of voltage, be calculated output voltage drift value；
Using the output noise magnitude of voltage of the predose as information parameter, using the output voltage drift value as irradiation behaviour
Parameter, sets up multiple linear regression equations, and calculate the coefficient vector in equation of linear regression using linear regression method；
Based on the coefficient vector, the lossless screening regression forecasting side set up between described information parameter and irradiation behaviour parameter
Journey；
Using the lossless screening regression prediction equation, the anti-radiation performance of single low pressure difference linear voltage regulator is predicted, to same batch
Other low pressure difference linear voltage regulators are screened.
2. a kind of lossless screening technique of low pressure difference linear voltage regulator Radiation hardness according to claim 1, its feature exists
In the noise voltage value for obtaining the low pressure difference linear voltage regulator as random increment includes：
The input voltage and loading condition of low pressure difference linear voltage regulator are set；
Gather the output signal of low pressure difference linear voltage regulator output end；
Preposition amplification is carried out to the output signal, preamplification signal is obtained；
Based on the preamplification signal, noise voltage value is obtained.
3. a kind of lossless screening technique of low pressure difference linear voltage regulator Radiation hardness according to claim 1, its feature exists
In, it is described to utilize the lossless screening regression prediction equation, the anti-radiation performance of single low pressure difference linear voltage regulator is tested, to same
Low pressure difference linear voltage regulator is criticized to be screened, including：
Obtain the output noise magnitude of voltage of low pressure difference linear voltage regulator to be screened；
Based on the output noise magnitude of voltage, using the regression prediction equation, the output of this low pressure difference linear voltage regulator is obtained
Voltage drift amount predicted value；
The output voltage drift tolerance limit of the output voltage drift value predicted value and this batch of low pressure difference linear voltage regulator is compared
Compared with if the predicted value is within the output voltage drift tolerance limit of such low pressure difference linear voltage regulator, then it is assumed that this low voltage difference
Linear voltage regulator is qualified products；, whereas if the predicted value is not floated in the output voltage of such low pressure difference linear voltage regulator
Move within tolerance limit, then it is assumed that this low pressure difference linear voltage regulator is substandard product.
4. a kind of lossless screening plant of low pressure difference linear voltage regulator Radiation hardness, it is characterised in that including：
First acquisition unit, for obtaining the output noise magnitude of voltage as the low pressure difference linear voltage regulator predose of random increment
And output voltage values；
Second acquisition unit, for obtaining the low pressure difference linear voltage regulator as random increment by the output electricity after irradiation
Pressure value；
Computing unit, for output voltage values and warp based on the low pressure difference linear voltage regulator predose as random increment
The output voltage values crossed after irradiation, are calculated output voltage drift value；
Equation of linear regression sets up unit, for using the output noise magnitude of voltage of the predose as information parameter, with described
Output voltage drift value sets up multiple linear regression equations, and calculate linear as irradiation behaviour parameter using linear regression method
Coefficient vector in regression equation；
Lossless screening regression prediction equation sets up unit, for based on the coefficient vector, setting up described information parameter and irradiation
Lossless screening regression prediction equation between performance parameter；
Test cell, for utilizing the lossless screening regression prediction equation, predicts the anti-spoke of single low pressure difference linear voltage regulator
According to performance, to being screened with batch other low pressure difference linear voltage regulators.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110346827A (en) * | 2019-08-26 | 2019-10-18 | 中国科学院新疆理化技术研究所 | A kind of novel dosage detection method based on LDO |
| CN110828007A (en) * | 2019-11-18 | 2020-02-21 | 中国核动力研究设计院 | Special voltage stabilizer and pressure control system for reactor irradiation examination loop |
| CN113971319A (en) * | 2021-10-12 | 2022-01-25 | 浙江腾腾电气有限公司 | Voltage stabilizer with precision compensation and compensation method thereof |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090167261A1 (en) * | 2007-12-17 | 2009-07-02 | Stmicroelectronics Sa | Current measuring device |
| CN103197170A (en) * | 2013-03-01 | 2013-07-10 | 深圳创维数字技术股份有限公司 | Test method, test device, control device and system of voltage stabilizer |
-
2017
- 2017-01-19 CN CN201710057522.9A patent/CN106771778A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090167261A1 (en) * | 2007-12-17 | 2009-07-02 | Stmicroelectronics Sa | Current measuring device |
| CN103197170A (en) * | 2013-03-01 | 2013-07-10 | 深圳创维数字技术股份有限公司 | Test method, test device, control device and system of voltage stabilizer |
Non-Patent Citations (3)
| Title |
|---|
| 杨丽侠: "肖基特二极管抗辐照能力表征技术研究", 《中国优秀硕士学位论文全文数据库信息科技辑》 * |
| 王旭利: "集成电路抗辐射筛选技术研究", 《中国核科技报告》 * |
| 韩光: "双极晶体管总剂量辐射效应及其表征方法研究", 《中国优秀硕士学位论文全文数据库信息科技辑》 * |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110346827A (en) * | 2019-08-26 | 2019-10-18 | 中国科学院新疆理化技术研究所 | A kind of novel dosage detection method based on LDO |
| CN110828007A (en) * | 2019-11-18 | 2020-02-21 | 中国核动力研究设计院 | Special voltage stabilizer and pressure control system for reactor irradiation examination loop |
| CN110828007B (en) * | 2019-11-18 | 2021-06-29 | 中国核动力研究设计院 | Special voltage stabilizer and pressure control system for reactor irradiation examination loop |
| CN113971319A (en) * | 2021-10-12 | 2022-01-25 | 浙江腾腾电气有限公司 | Voltage stabilizer with precision compensation and compensation method thereof |
| CN113971319B (en) * | 2021-10-12 | 2023-04-18 | 浙江腾腾电气有限公司 | Voltage stabilizer with precision compensation and compensation method thereof |
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