CN106771417B - Probe detection mechanism of electronic device pin - Google Patents
Probe detection mechanism of electronic device pin Download PDFInfo
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- CN106771417B CN106771417B CN201710111564.6A CN201710111564A CN106771417B CN 106771417 B CN106771417 B CN 106771417B CN 201710111564 A CN201710111564 A CN 201710111564A CN 106771417 B CN106771417 B CN 106771417B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
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- Measuring Leads Or Probes (AREA)
Abstract
The invention relates to the field of electronic device detection, in particular to a probe detection mechanism compatible with pins of electronic devices with various pin specifications. The invention discloses a probe detection mechanism for pins of an electronic device, which comprises a base and at least one group of probe assemblies, wherein each group of probe assemblies comprises at least two probe installation parts arranged on the base, at least one probe is arranged on each probe installation part, at least one of the probe installation parts is movably arranged relative to the base, and at least one of the probe installation parts movably arranged relative to the base is regulated to change the positions of the probes on the probe installation parts so as to correspond to different pin positions of the electronic device. The invention can realize the rapid switching of the pin detection of the electronic device with various pin specifications after simple adjustment, greatly shortens the production line adjustment time required by the detection when the product is changed, saves time and labor, is simple and convenient, and greatly reduces the technical requirements on staff.
Description
Technical Field
The invention belongs to the field of electronic device detection, and particularly relates to a probe detection mechanism compatible with pins of electronic devices with various pin specifications.
Background
The switching device is a switching device capable of closing, carrying and opening a current under normal circuit conditions and capable of closing, carrying and opening a current under abnormal circuit conditions for a prescribed time. When the switching device leaves the factory, various indexes of the switching device are required to be subjected to on-off test, such as voltage resistance, on-off, mechanical life, coil resistance and the like.
For example, a relay used in a tin pick-up machine needs to detect the coil resistance, usually, a probe on a probe detection board is inserted into a coil pin of the relay to detect, most of the existing detection adopts a probe detection board corresponding to the specifications of the coil pin of the relay, and the types of the relay are various, so that the specifications of the coil pin of the relay are various, thus, a plurality of types of probe detection boards need to be processed, the cost is high, the management and the storage are inconvenient, and when the specifications of the pins of the detected relay are changed, the probe detection board needs to be detached and replaced, then the detection can be performed only by electric connection, and the relay has the advantages of time and labor waste, low efficiency and high cost and has high technical requirements for staff.
In the same way, when detecting other electronic devices, because the specifications of the pins are different, the corresponding probe detection plates also need to be replaced, then the detection can be carried out only by electric wiring, and the method is time-consuming and labor-consuming, low in efficiency, high in cost and high in technical requirements for staff.
Disclosure of Invention
The invention aims to solve the problems and provide the probe detection mechanism for the pins of the electronic device, which is compatible with the detection of the pin specifications of various electronic devices, is time-saving and labor-saving, has high efficiency and low cost, and greatly reduces the technical requirements of staff.
Therefore, the invention discloses a probe detection mechanism for pins of an electronic device, which comprises a base and at least one group of probe assemblies, wherein each group of probe assemblies comprises at least two probe installation parts arranged on the base, at least one probe is arranged on each probe installation part, at least one of the probe installation parts is movably arranged relative to the base, and at least one of the probe installation parts which are movably arranged relative to the base is adjusted to change the positions of the probes on the probe installation parts so as to correspond to different pin positions of the electronic device.
Further, the probe assembly includes at least two probe mounting portions disposed on the base, each of the probe mounting portions having at least one probe disposed thereon, at least one of the probe mounting portions being movably disposed with respect to the base being adjusted to change a position of the probe thereon.
Further, the number of the probe mounting parts of each group of probe assemblies is two, namely a first probe mounting part and a second probe mounting part, the first probe mounting part and the second probe mounting part are respectively movably arranged on the base, the first probe mounting part and/or the second probe mounting part are adjusted to adjust the interval between the probes mounted on the first probe mounting part and the probes mounted on the second probe mounting part, or the first probe mounting part and the second probe mounting part are synchronously adjusted to adjust the positions of the probes mounted on the first probe mounting part and the probes mounted on the second probe mounting part relative to the base.
Further, the first probe mounting portion mounts one probe, and the second probe mounting portion mounts two probes.
Further, the base is further provided with a first adjusting assembly, a second adjusting assembly, a first probe mounting plate and a second probe mounting plate, the first probe mounting parts of each group of probe assemblies are fixedly arranged on the first probe mounting plate, the second probe mounting parts of each group of probe assemblies are fixedly arranged on the second probe mounting plate, the first adjusting assembly is used for adjusting the first probe mounting plate to move relative to the base, and the second adjusting assembly is used for adjusting the second probe mounting plate to move relative to the base.
Still further, the quantity of probe subassembly is 4 groups, first probe installation department and this second probe installation department quantity are 4, this first probe installation board and second probe installation board are rectangular platy structure, first probe installation board is along the spacing fixed this 4 first probe installation departments of side interval of length direction, the distance of adjacent first probe installation department is A, the spacing fixed this 4 second probe installation departments of side interval of length direction of second probe installation board along the side interval of length direction, the distance of adjacent second probe installation department is B,4 first probe installation departments and 4 second probe installation departments intermesh for 4 first probe installation departments and 4 second probe installation departments are crisscross to be set up, distance A is greater than the width of second probe installation department, distance B is greater than the width of first probe installation department, thereby make first probe installation department and second probe installation department can be along the relative keep away from or be close to the motion of length direction of first probe installation board and second probe installation department.
Further, the first adjusting assembly and the second adjusting assembly comprise a first adjusting bolt, a second adjusting bolt, a third adjusting bolt, a spring guide rod, a compression spring, a first positioning plate and a second positioning plate, wherein the first positioning plate and the second positioning plate are fixedly arranged on the base at intervals, the first probe mounting plate and the second probe mounting plate are positioned between the first positioning plate and the second positioning plate, the lengths of the first probe mounting plate and the second probe mounting plate along the directions of the first positioning plate and the second positioning plate are smaller than the intervals between the first positioning plate and the second positioning plate, the first adjusting bolt is in threaded connection with the first positioning plate and abuts against the first end of the first probe mounting plate, the second adjusting bolt is in threaded connection with the second positioning plate and abuts against the second end of the first probe mounting plate, one end of the spring is fixed on the inner side of the first positioning plate, the other end of the spring is movably arranged on the first end of the second probe mounting plate in a penetrating manner, and the compression spring is sleeved on the spring and abuts against the first end of the first positioning plate and the inner side of the second positioning plate respectively.
Still further, still include the first regulation seat and the second regulation seat of fixing on the base, this first regulation seat and second regulation seat are located the outside of first locating plate and second locating plate respectively, and this first adjusting bolt and second adjusting bolt still spiro union pass first regulation seat, third adjusting bolt still spiro union passes the second regulation seat.
Further, still include first deflector and second deflector, this first deflector and second deflector are fixed on the base and are located the outside of first probe mounting panel and second probe mounting panel respectively, and this first deflector and second deflector are equipped with first guide spout and second guide spout respectively, and the outside of this first probe mounting panel and second probe mounting panel slides the setting respectively in first guide spout and second guide spout.
Further, the base is provided with a mounting part, and the mounting part is provided with at least two mounting holes.
Further, the base comprises a base plate, the first probe mounting plate and the second probe mounting plate are movably arranged on the base plate, the base plate is provided with a yielding groove capable of enabling the probe to move, and the lower end of the probe penetrates through the yielding groove and extends out of the bottom surface of the base plate.
The beneficial technical effects of the invention are as follows:
the invention can realize the detection of electronic devices with various pin specifications after simple adjustment, has quick switching, greatly shortens the production line adjustment time required by product change or change detection, does not need to replace a probe detection mechanism, saves time and labor, is simple and convenient, has high efficiency and low cost, greatly reduces the technical requirements on staff, and in addition, the probe detection mechanism only needs one specification, is convenient to manufacture, manage and store, and further reduces the cost.
Drawings
FIG. 1 is a front view of a probe detection mechanism according to an embodiment of the present invention;
FIG. 2 is a left side view of a probe detection mechanism according to an embodiment of the present invention;
FIG. 3 is a top view of a probe detection mechanism according to an embodiment of the present invention;
FIG. 4 is a perspective view of a probe detection mechanism according to an embodiment of the present invention;
FIG. 5 is an exploded view of a probe detection mechanism according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of a 5 pin bit configuration for placement of relay pins in an embodiment of the present invention;
FIG. 7 is a schematic diagram of detecting pins at 1-3-5 pins in an embodiment of the present invention.
Detailed Description
The invention will now be further described with reference to the drawings and detailed description.
A probe detection mechanism for pins of an electronic device comprises a base and at least one group of probe assemblies, wherein each group of probe assemblies is provided with at least two probes, and the position of at least one probe can be changed so as to correspond to different pin positions of the electronic device.
Further, the probe assembly includes at least two probe mounting portions disposed on the base, each of the probe mounting portions having at least one probe disposed thereon, at least one of the probe mounting portions being movably disposed with respect to the base being adjusted to change a position of the probe thereon.
In this embodiment, as shown in fig. 1-5, the base 1 includes an elongated substrate 12 and an L-shaped mounting portion 11, and the top end of the mounting portion 11 is fixed on the bottom surface of the substrate 12, in this embodiment, the mounting portion is fixed by using screws, however, in other embodiments, the mounting portion may be fixed by using bonding, integral molding, or the like. The bottom of the mounting portion 11 is provided with 2 mounting holes 111, but not limited to, for fixing the probe detecting mechanism to the detecting device by screws.
In this embodiment, the number of probe assemblies 2 is 4, however, in other implementations, the number of probe assemblies 2 may be less than 4 or more than 4, which is determined according to practical needs. The probe assembly 2 includes two probe mounts, namely a first probe mount 211 and a second probe mount 221, although in other implementations, the probe assembly 2 may include 3 or more probe mounts, as determined by the actual requirements. The first probe mounting part 211 and the second probe mounting part 221 are movably disposed on the substrate 12, and the first probe mounting part 211 and the second probe mounting part 221 can move relatively, and the first probe mounting part 211 and/or the second probe mounting part 221 are adjusted to adjust the interval between the probe 7 mounted on the first probe mounting part 211 and the probe 7 mounted on the second probe mounting part 221, or the first probe mounting part 211 and the second probe mounting part 221 are synchronously adjusted to adjust the positions of the probe 7 mounted on the first probe mounting part 211 and the probe 7 mounted on the second probe mounting part 221 relative to the substrate 12, so as to realize the detection of electronic devices with different pin specifications.
In some embodiments, the first probe mounting part 211 or the second probe mounting part 221 may be fixedly disposed on the substrate 12, and the second probe mounting part 221 or the first probe mounting part 211 may be movably disposed on the substrate 12. The probe module 2 may include 3 or more probe mounting parts, and part of the probe mounting parts may be fixedly provided on the substrate 12, part of the probe mounting parts may be movably provided on the substrate 12, or all of the probe mounting parts may be movably provided on the substrate 12.
In this embodiment, the number of probes 7 on the first probe mounting portion 211 is one, the number of probes 7 on the second probe mounting portion 221 is two, and three probes 7 form a row, however, in other implementations, the number of probes 7 on the first probe mounting portion 211 and the number of probes 7 on the second probe mounting portion 221 may be selected according to the actual situation, and multiple rows of probes 7 may be mounted, which can be easily implemented by those skilled in the art and will not be described in detail.
The probe 7 is fixed in first probe installation department 211 and second probe installation department 221 respectively, and runs through the upper and lower surfaces of first probe installation department 211 and second probe installation department 221, is equipped with a rectangular groove 121 of stepping down on the base plate 12, and probe 7 bottom passes groove 121 of stepping down and stretches out the base plate 12 bottom surface, the convenient wiring.
In this embodiment, the 4 first probe mounting portions 211 are fixedly arranged on the first probe mounting plate 21,4 and the 4 second probe mounting portions 221 are fixedly arranged on the second probe mounting plate 22, so that the 4 first probe mounting portions 211 and the 4 second probe mounting portions 221 can be adjusted simultaneously by adjusting the first probe mounting plate 21 and the second probe mounting plate 22, and the adjustment efficiency is high. The first probe mounting plate 21 and the second probe mounting plate 22 are movably provided on the base plate 12 and are relatively movable. Of course, in other embodiments, the first probe mounting plate 21 or the second probe mounting plate 22 may be fixedly disposed on the base plate 12, and the second probe mounting plate 22 or the first probe mounting plate 21 may be movably disposed on the base plate 12
In this embodiment, the first probe mounting plate 21 and the second probe mounting plate 22 are both in a strip-shaped plate structure, the length direction of the first probe mounting plate 21 and the length direction of the second probe mounting plate 22 are the same as the length direction of the substrate 12, the first probe mounting plate 21 is provided with 4 first probe mounting portions 211 in a spacing manner along one side in the length direction, the distance a between the adjacent first probe mounting portions 211 is provided with 4 second probe mounting portions 221 in a spacing manner along one side in the length direction of the second probe mounting plate 22, the distance B between the adjacent second probe mounting portions 221 is provided with 4 first probe mounting portions 211 and 4 second probe mounting portions 221 which are engaged with each other, so that the 4 first probe mounting portions 211 and the 4 second probe mounting portions 221 are staggered along the length direction of the substrate 12, the distance a is greater than the width of the second probe mounting portions 221 along the length direction of the substrate 12, and the distance B is greater than the width of the first probe mounting portions 211 along the length direction of the substrate 12, thereby enabling the first probe mounting portions 211 and the second probe mounting portions 221 to move relatively far or near along the length direction of the substrate 12. In this embodiment, the first probe mounting plate 21 and the 4 first probe mounting parts 211 are integrally formed, and the second probe mounting plate 22 and the 4 second probe mounting parts 221 are integrally formed.
Further, the substrate 12 is further provided with a first adjusting component for adjusting the movement of the first probe mounting part 211 relative to the substrate 12, and a second adjusting component for adjusting the movement of the second probe mounting part 221 relative to the substrate 12.
In this embodiment, the first adjusting assembly and the second adjusting assembly include a first adjusting bolt 31, a second adjusting bolt 32, a third adjusting bolt 33, a spring guide rod 35, a compression spring 34, a first positioning plate 36 and a second positioning plate 37, the first positioning plate 36 and the second positioning plate 37 are fixed at two ends of the base plate 12 along the length direction at intervals, the first probe mounting plate 211 and the second probe mounting plate 221 are located between the first positioning plate 36 and the second positioning plate 37, the intervals between the first positioning plate 36 and the second positioning plate 37 are larger than the lengths of the first probe mounting plate 211 and the second probe mounting plate 221, the first adjusting bolt 31 is screwed through the first positioning plate 36 and abuts against a first end of the first probe mounting plate 211, the second adjusting bolt 32 is screwed through the second positioning plate 37 and abuts against a second end of the first probe mounting plate 211, the third adjusting bolt 33 is screwed through the second positioning plate 37 and abuts against a second end of the second probe guide rod 221, one end of the spring 35 is fixed inside the first positioning plate 36, and the other end of the spring 35 is movably sleeved on the first end of the first positioning plate 35 and the second positioning plate 221. The first probe mounting plate 211 can be adjusted to move along the length direction by rotating and adjusting the first adjusting bolt 31 and the second adjusting bolt 32, and the second probe mounting plate 221 can be adjusted to move along the length direction by rotating and adjusting the third adjusting bolt 33.
Of course, in order to make the adjustment more precise, a scale may be provided on the first adjustment bolt 31, the second adjustment bolt 32, the third adjustment bolt 33, the base plate 12, or the like for defining the moving distance of the first probe mounting plate 211 and the second probe mounting plate 221 so as to make the adjustment more precise and convenient.
Further, in order to make the movement of the first probe mounting plate 211 and the second probe mounting plate 221 smoother and more reliable, the probe positioning device further comprises a first guide plate 41 and a second guide plate 42, wherein the first guide plate 41 and the second guide plate 42 are fixed on the base and are respectively positioned at the outer sides of the first probe mounting plate 211 and the second probe mounting plate 222 along the length direction, the first guide plate 41 and the second guide plate 42 are respectively provided with a first guide chute 411 and a second guide chute 421, and the outer sides of the first probe mounting plate 211 and the second probe mounting plate 221 are respectively arranged in the first guide chute 411 and the second guide chute 421 in a sliding manner.
Further, in order to make the structures of the first adjusting bolt 31, the second adjusting bolt 32 and the third adjusting bolt 33 more stable, the structure further comprises a first adjusting seat 51 and a second adjusting seat 52 fixed at two ends of the base plate 12 along the length direction, the first adjusting seat 51 and the second adjusting seat 52 are respectively positioned at the outer sides of the first positioning plate 36 and the second positioning plate 37, the first adjusting bolt 31 is further screwed through the first adjusting seat 51, the spring guide rod 35 passes through the first positioning plate 36 and is fixedly arranged with the first adjusting seat 51, and the second adjusting bolt 32 and the third adjusting bolt 33 are further screwed through the second adjusting seat 52. Of course, in some embodiments, only the first adjustment seat 51 may be provided, without the second adjustment seat 52.
The detection process comprises the following steps: for example, when a relay is to be tested, the relay pins are extended from the corresponding pins of the 5 pins shown in fig. 6, if a relay is extended from the 1-3-5 pins, and if a relay is extended from the 1-5 pins, and if a relay is extended from the 2-4 pins, the probe testing mechanism is fixed to the testing device by the mounting portion 11, and then the first probe mounting plate 211 and/or the second probe mounting plate 221 are moved by adjusting the first adjusting bolt 31, the second adjusting bolt 32, and/or the third adjusting bolt 33, thereby adjusting the distance between the probes 7 and the position relative to the substrate 12 (and the pin position of the relay), and the probes 7 are corresponding to the 1-3-5 pins, the 1-5 pins, and the 2-4 pins, so that the testing of the 1-3-5 pins (as shown in fig. 7), the 1-5 pins, and the 2-4 pins can be achieved.
The invention can realize the detection of electronic devices with various pin specifications after simple adjustment, has quick switching, greatly shortens the production line adjustment time required by product change detection, does not need to replace a probe detection mechanism, saves time and labor, is simple and convenient, has high efficiency and low cost, greatly reduces the technical requirements on staff, and in addition, the probe detection mechanism only needs one specification, is convenient to manufacture, manage and store, and further reduces the cost.
While the invention has been particularly shown and described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (10)
1. A probe detection mechanism for pins of an electronic device, comprising a base and at least one group of probe assemblies, characterized in that: each group of probe components comprises at least two probe installation parts arranged on a base, at least one probe is arranged on each probe installation part, at least one of the probe installation parts is movably arranged relative to the base, at least one of the probe installation parts which are movably arranged relative to the base is adjusted to change the position of the probe on the probe installation part, so that the positions of pins which are corresponding to different electronic devices are respectively a first probe installation part and a second probe installation part, the base is also provided with the first probe installation plate and the second probe installation plate, the first probe installation parts of each group of probe components are fixedly arranged on one side surface of the first probe installation plate in the length direction and are sequentially arranged at intervals, the distance between every two adjacent first probe installation parts is A, the distance between every two adjacent second probe installation parts is B, the first probe installation parts and the second probe installation parts are mutually meshed, the first probe installation parts and the second probe installation parts are alternately arranged, the distance A is larger than the width of the second probe installation parts in the length direction, and the distance between the first probe installation parts and the second probe installation parts can be close to the first probe installation parts in the length direction, and the distance between the first probe installation parts and the second probe installation parts can be relatively arranged in the length direction.
2. The probe detection mechanism for pins of an electronic device of claim 1, wherein: the number of the probe mounting parts of the probe assembly is two, namely a first probe mounting part and a second probe mounting part, the first probe mounting part and the second probe mounting part are respectively movably arranged on the base, the first probe mounting part and/or the second probe mounting part are/is adjusted to adjust the interval between the probe mounted on the first probe mounting part and the probe mounted on the second probe mounting part, or the first probe mounting part and the second probe mounting part are synchronously adjusted to adjust the positions of the probe mounted on the first probe mounting part and the probe mounted on the second probe mounting part relative to the base.
3. The probe detection mechanism for pins of an electronic device of claim 2, wherein: the first probe mounting portion mounts one probe, and the second probe mounting portion mounts two probes.
4. The probe detection mechanism for pins of an electronic device of claim 2, wherein: the base is also provided with a first adjusting component and a second adjusting component, the first adjusting component is used for adjusting the first probe mounting plate to move relative to the base, and the second adjusting component is used for adjusting the second probe mounting plate to move relative to the base.
5. The probe detection mechanism for pins of an electronic device of claim 4, wherein: the number of the first probe installation parts and the number of the second probe installation parts are 4, the first probe installation plates and the second probe installation plates are of strip-shaped plate structures, the first probe installation plates are fixedly arranged at intervals along one side face of the length direction, and the second probe installation plates are fixedly arranged at intervals along one side face of the length direction, so that the 4 second probe installation parts are fixedly arranged at intervals.
6. The probe detection mechanism for pins of an electronic device of claim 4, wherein: the first adjusting assembly and the second adjusting assembly comprise a first adjusting bolt, a second adjusting bolt, a third adjusting bolt, a spring guide rod, a compression spring, a first positioning plate and a second positioning plate, wherein the first positioning plate and the second positioning plate are fixedly arranged on a base at intervals, the first probe mounting plate and the second probe mounting plate are positioned between the first positioning plate and the second positioning plate, the lengths of the first probe mounting plate and the second probe mounting plate along the directions of the first positioning plate and the second positioning plate are smaller than the intervals between the first positioning plate and the second positioning plate, the first adjusting bolt is in threaded connection with the first positioning plate and abuts against the first end of the first probe mounting plate, the second adjusting bolt is in threaded connection with the second positioning plate and abuts against the second end of the first probe mounting plate, one end of the spring guide rod is fixedly arranged on the inner side of the first positioning plate, the other end of the spring guide rod is movably arranged on the first end of the second probe mounting plate in a penetrating manner, and the compression spring is sleeved on the guide rod and abuts against the inner side of the first end of the first positioning plate and the first positioning plate respectively.
7. The probe detection mechanism for pins of an electronic device of claim 6, wherein: the first adjusting seat and the second adjusting seat are respectively positioned on the outer sides of the first positioning plate and the second positioning plate, the first adjusting bolt and the second adjusting bolt are further connected with each other in a threaded mode to penetrate through the first adjusting seat, and the third adjusting bolt is further connected with the second adjusting seat in a threaded mode.
8. The probe detection mechanism for pins of an electronic device according to claim 4, 5 or 6, wherein: still include first deflector and second deflector, this first deflector and second deflector are fixed on the base and are located the outside of first probe mounting panel and second probe mounting panel respectively, and this first deflector and second deflector are equipped with first guide spout and second guide spout respectively, and the outside of this first probe mounting panel and second probe mounting panel slides the setting respectively in first guide spout and second guide spout.
9. The probe detection mechanism for pins of an electronic device according to claim 4, 5 or 6, wherein: the base is provided with a mounting part, and the mounting part is provided with at least two mounting holes.
10. The probe detection mechanism for pins of an electronic device according to claim 4, 5 or 6, wherein: the base comprises a base plate, the first probe mounting plate and the second probe mounting plate are movably arranged on the base plate, the base plate is provided with a yielding groove capable of enabling the probe to move, and the lower end of the probe penetrates through the yielding groove and stretches out of the bottom surface of the base plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710111564.6A CN106771417B (en) | 2017-02-28 | 2017-02-28 | Probe detection mechanism of electronic device pin |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710111564.6A CN106771417B (en) | 2017-02-28 | 2017-02-28 | Probe detection mechanism of electronic device pin |
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| CN106771417A CN106771417A (en) | 2017-05-31 |
| CN106771417B true CN106771417B (en) | 2023-08-08 |
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| CN201710111564.6A Active CN106771417B (en) | 2017-02-28 | 2017-02-28 | Probe detection mechanism of electronic device pin |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108490223B (en) * | 2018-03-28 | 2021-07-06 | Tcl王牌电器(惠州)有限公司 | High voltage testing device |
| CN111044919B (en) * | 2019-12-06 | 2021-01-15 | 广东恒翼能科技有限公司 | Probe module and modularized lithium battery testing device |
| CN114190927A (en) * | 2021-12-08 | 2022-03-18 | 歌尔科技有限公司 | Motion data acquisition equipment, method and device and wearable equipment |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2005274487A (en) * | 2004-03-26 | 2005-10-06 | Micronics Japan Co Ltd | Probe system |
| CN102565564A (en) * | 2010-12-30 | 2012-07-11 | 塔工程有限公司 | Array detection device |
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| Publication number | Publication date |
|---|---|
| CN106771417A (en) | 2017-05-31 |
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