CN106770281A - A kind of chip testing frock and method of testing with infrared emission tally function - Google Patents
A kind of chip testing frock and method of testing with infrared emission tally function Download PDFInfo
- Publication number
- CN106770281A CN106770281A CN201611055614.5A CN201611055614A CN106770281A CN 106770281 A CN106770281 A CN 106770281A CN 201611055614 A CN201611055614 A CN 201611055614A CN 106770281 A CN106770281 A CN 106770281A
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- chip
- infrared emission
- infrared
- tally function
- testing
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- 238000012360 testing method Methods 0.000 title claims abstract description 63
- 238000010998 test method Methods 0.000 title description 3
- 238000000034 method Methods 0.000 claims description 4
- 230000001186 cumulative effect Effects 0.000 claims description 3
- 230000000149 penetrating effect Effects 0.000 claims 3
- 238000004519 manufacturing process Methods 0.000 abstract description 6
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06M—COUNTING MECHANISMS; COUNTING OF OBJECTS NOT OTHERWISE PROVIDED FOR
- G06M1/00—Design features of general application
- G06M1/27—Design features of general application for representing the result of count in the form of electric signals, e.g. by sensing markings on the counter drum
- G06M1/272—Design features of general application for representing the result of count in the form of electric signals, e.g. by sensing markings on the counter drum using photoelectric means
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
The invention provides a kind of chip testing frock with infrared emission tally function, the chip testing frock includes chip carrier, the chip carrier is provided with lid, the lower section covered on this is provided with lower cover, the lower cover is arranged on testing host, the chip carrier is arranged on the side of infrared emission module, the opposite side of the infrared emission module is provided with digital register, infrared ray catch is provided with the middle part of the infrared emission module, the infrared emission module and the digital register are electrically connected with the testing host；The present invention can effectively solve the problem that production line test production capacity statistical problem, reduces employee and gaffer's quantity is checked and checked and waits work, lift production line test efficiency, while it is possible to prevente effectively from the problem made a false report of employee's yield.
Description
Technical field
The invention belongs to chip testing field, more particularly to a kind of chip testing frock with infrared emission tally function and
Method of testing.
Background technology
Factory carries out test screen (wherein every 25 for 1 pounds) in chip testing by piece number, uses test fixture pair
Product by being tested, after the completion of product test, the manually recorded test quantity of employee and in the same day before leaving offices by testing journal sheet
Producing line gaffer is committed to, employee's test product and testing journal sheet are examined by producing line gaffer, calculate employee's yield, this process
It is related to headcount to count, the operation of gaffer's quantity verification, while there is employee's false test quantity, (actual product is not
Tested but employee is reported within yield).
The content of the invention
In view of this, in order to overcome the deficiencies in the prior art, the present invention to provide a kind of core with infrared emission tally function
Built-in testing frock, is capable of the yield of simple and effective statistics employee test, it is to avoid the problem of employee's yield false.
To achieve the above object, technical scheme is as follows：
A kind of chip testing frock with infrared emission tally function, the chip testing frock includes chip carrier, the core
Piece carrier is provided with lid, and the lower section covered on this is provided with lower cover, and the lower cover is arranged on testing host, and the chip carrier is installed
In the side of infrared emission module, the opposite side of the infrared emission module is provided with digital register, the infrared emission mould
Infrared ray catch is provided with the middle part of block, the infrared emission module and the digital register are electrically connected with the testing host.
Further, groove is provided with the middle part of the infrared emission module, the infrared ray catch is arranged in the groove.
Further, moved up and down along the groove under the drive that the infrared ray catch can be covered on described.
Further, it is provided with camera lens in the middle part of the upper exterior surface.
Further, the camera lens can be taken pictures to the chip to be tested in the chip carrier, and image is believed
Number it is transmitted to receiving terminal.
Further, the receiving terminal is computer or mobile phone.
Further, interrupt signal can be transferred to the digital register by the infrared emission module.
Further, the infrared emission module and the digital register are all arranged on the testing host.
The present invention also provides a kind of chip testing frock of use with infrared emission tally function carries out the side of chip testing
Method, comprises the following steps：
1) open to cover and chip to be tested is put into chip carrier, then cover lid；
2) lid is pressed, infrared ray catch is moved downward under the drive of upper lid along groove, so as to interrupt infrared emission
The infrared receiver of module, infrared emission module exports interrupt signal to digital register, and digital register is according to interrupt signal
The cumulative numeration of number of times；Meanwhile, camera lens is treated test chip and is taken pictures, and picture signal is transferred into receiving terminal, by connecing
The quality that receiving end can treat test chip is monitored；
3) open and cover, the test chip that taking-up has counted and has been imaged is subsequently placed into next chip to be tested, then
Cover lid, repeat step 2), until chip to be tested all counts completion.
Beneficial effects of the present invention are：The present invention can effectively solve the problem that production line test production capacity statistical problem, reduce employee with
And work is checked and checked etc. to gaffer's quantity, production line test efficiency is lifted, while it is possible to prevente effectively from the false of employee's yield is asked
Topic.Only pressing lid, counting just comes into force, namely only have passed through test process can just occur the accumulative event of yield.
1) chip carrier is arranged on the side of infrared emission module, is wherein provided with Baltimore groove in the middle part of infrared emission module,
Infrared baffle is arranged in Baltimore groove, and when upper lid is pressed, under the drive of upper lid, infrared baffle is moved downward, and is blocked
Infrared emission module ultrared reception, i.e., digital register numeration；
2) digital register is arranged on the opposite side of infrared emission module, and digital register can be according to infrared emission module
The interruption times of middle infrared (Mid-IR), add up numeration.
Brief description of the drawings
Fig. 1 is a kind of structural representation of the chip testing frock with infrared emission tally function；
Wherein, 1, chip carrier；101st, upper lid；102nd, lower cover；2nd, camera lens；3rd, infrared emission module；4th, digital register；
5th, infrared ray catch；6th, testing host.
Specific embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, below in conjunction with the accompanying drawings and embodiment, it is right
The present invention is further elaborated.It should be appreciated that specific embodiment described herein is only used to explain the present invention, not
For limiting the present invention.
As shown in figure 1, a kind of chip testing frock with infrared emission tally function, the chip testing frock includes chip
Carrier 1, the chip carrier 1 is provided with lid 101, wherein upper lid 101 is cylinder, cuboid or square；Lid 101 on this
Lower section is provided with lower cover 102, and wherein lower cover 102 is the shape one of cylinder, cuboid or square, upper lid 101 and lower cover 102
Cause, that is, when going up lid 101 for square, lower cover 102 is also square；When upper lid 101 is cylinder, lower cover 102 is also cylinder.
Wherein, the region for placing chip to be tested is provided with lower cover 102, the shape in the region keeps one with the shape of chip to be tested
Cause.Lower cover 102 is arranged on testing host 6, and chip carrier 1 is arranged on the side of infrared emission module 3, infrared emission module 3
Opposite side digital register 4 is installed, the middle part of infrared emission module 3 is provided with infrared ray catch 5, the He of infrared emission module 3
Digital register 4 is electrically connected with testing host 6.
The middle part of infrared emission module 3 is provided with groove, and infrared ray catch 5 is installed in a groove, wherein, groove can be U
Shape, can also V-arrangement, the side of groove is provided with the ultrared device of transmitting, and the opposite side of groove is provided with receiving infrared-ray
Device, is provided with infrared ray catch 5 in the middle part of groove, when being moved downward under drive of the infrared ray washer 5 in upper lid 101, energy
Ultrared reception is enough blocked, i.e. the interrupt signal is sent to digital register 4, and digital register 4 can add up numeration, from
And reach the purpose for counting chip to be tested.
Infrared ray catch 5 can move up and down under the drive of upper lid 101 along Baltimore groove.
Upper lid 102 is provided with camera lens 2 in the middle part of outer surface.When upper lid 101 is moved downward, that is, start the imaging of camera lens 2
Switch, after camera lens 2 is taken pictures to the chip to be tested in chip carrier 1, receiving terminal is transferred to by picture signal, wherein receiving
Hold is computer or mobile phone.I.e. inspection personnel can count the quantity of chip to be tested, at the same also can by computer or mobile phone come
Check the quality of chip to be tested.
Interrupt signal can be transferred to digital register 4 by infrared emission module 3.
Infrared emission module 3 and digital register 4 are all arranged on testing host 6.
The method that a kind of chip testing frock of use with infrared emission tally function carries out chip testing, including following step
Suddenly：
1) open to cover and chip to be tested is put into chip carrier, then cover lid；
2) press lid, infrared ray catch is moved downward under the drive of upper lid along Baltimore groove, thus interrupt it is infrared right
The infrared receiver of module is penetrated, infrared emission module exports interrupt signal to digital register, and digital register is believed according to interruption
Number the cumulative numeration of number of times；Meanwhile, camera lens is treated test chip and is taken pictures, and picture signal is transferred into receiving terminal, passes through
The quality that receiving terminal can treat test chip is monitored；
3) open and cover, the test chip that taking-up has counted and has been imaged is subsequently placed into next chip to be tested, then
Cover lid, repeat step 2), until chip to be tested all counts completion.
Embodiment described above only expresses embodiments of the present invention, and its description is more specific and detailed, but can not
Therefore it is interpreted as the limitation to the scope of the claims of the present invention.It should be pointed out that for the person of ordinary skill of the art,
Without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to protection model of the invention
Enclose.Therefore, the protection domain of patent of the present invention should be determined by the appended claims.
Claims (9)
1. a kind of chip testing frock with infrared emission tally function, it is characterised in that：The chip testing frock includes chip
Carrier, the chip carrier is provided with lid, and the lower section covered on this is provided with lower cover, and the lower cover is arranged on testing host, the core
Piece carrier is arranged on the side of infrared emission module, and the opposite side of the infrared emission module is provided with digital register, described
Infrared ray catch, the infrared emission module and the digital register and the test master are provided with the middle part of infrared emission module
Plate is electrically connected.
2. the chip testing frock with infrared emission tally function according to claim 1, it is characterised in that：It is described infrared
Groove is provided with the middle part of module to penetrating, the infrared ray catch is arranged in the groove.
3. the chip testing frock with infrared emission tally function according to claim 2, it is characterised in that：It is described infrared
Moved up and down along the groove under the drive that line catch can be covered on described.
4. the chip testing frock with infrared emission tally function according to claim 1, it is characterised in that：The upper lid
Camera lens is provided with the middle part of outer surface.
5. the chip testing frock with infrared emission tally function according to claim 4, it is characterised in that：The camera lens
Chip to be tested in the chip carrier can be taken pictures, and picture signal is transmitted to receiving terminal.
6. the chip testing frock with infrared emission tally function according to claim 5, it is characterised in that：The reception
Hold is computer or mobile phone.
7. the chip testing frock with infrared emission tally function according to claim 1, it is characterised in that：It is described infrared
Interrupt signal can be transferred to the digital register to penetrating module.
8. the chip testing frock with infrared emission tally function according to claim 1, it is characterised in that：It is described infrared
All it is arranged on the testing host to penetrating module and the digital register.
9. a kind of chip testing frock with infrared emission tally function using as any one of claim 1~8 is entered
The method of row chip testing, it is characterised in that comprise the following steps：
1) open to cover and chip to be tested is put into chip carrier, then cover lid；
2) lid is pressed, infrared ray catch is moved downward under the drive of upper lid along groove, so as to interrupt infrared emission module
Infrared receiver, infrared emission module to digital register export interrupt signal, digital register according to interrupt signal time
The cumulative numeration of number；Meanwhile, camera lens is treated test chip and is taken pictures, and picture signal is transferred into receiving terminal, by receiving terminal
The quality that test chip can be treated is monitored；
3) open and cover, the test chip that taking-up has counted and has been imaged is subsequently placed into next chip to be tested, then covers
Upper lid, repeat step 2), until chip to be tested all counts completion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611055614.5A CN106770281A (en) | 2016-11-25 | 2016-11-25 | A kind of chip testing frock and method of testing with infrared emission tally function |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611055614.5A CN106770281A (en) | 2016-11-25 | 2016-11-25 | A kind of chip testing frock and method of testing with infrared emission tally function |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106770281A true CN106770281A (en) | 2017-05-31 |
Family
ID=58912867
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201611055614.5A Pending CN106770281A (en) | 2016-11-25 | 2016-11-25 | A kind of chip testing frock and method of testing with infrared emission tally function |
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| Country | Link |
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| CN (1) | CN106770281A (en) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102774590A (en) * | 2012-03-05 | 2012-11-14 | 北京华兴长泰物联网技术研究院有限责任公司 | Counting medicine box |
| CN103824111A (en) * | 2014-02-28 | 2014-05-28 | 北京蝶禾谊安信息技术有限公司 | Infrared radiation type drug storage device with counting function |
| CN203759740U (en) * | 2014-03-13 | 2014-08-06 | 北京屏联科技有限公司 | Infrared correlation counter |
| CN104102945A (en) * | 2014-07-15 | 2014-10-15 | 江西方迪科技有限公司 | Intelligent object detecting and counting control system |
| CN204423411U (en) * | 2015-01-04 | 2015-06-24 | 成都辰鑫智能设备有限公司 | Powered battery two-way infrared thread count |
| CN105606993A (en) * | 2016-03-02 | 2016-05-25 | 太仓思比科微电子技术有限公司 | Hand-operated single-chip microcomputer chip testing device and operation method thereof |
| CN106022453A (en) * | 2016-05-23 | 2016-10-12 | 南宁市茂百科技有限公司 | Product counter with infrared bi-emission |
| CN207610990U (en) * | 2016-11-25 | 2018-07-13 | 太仓思比科微电子技术有限公司 | A kind of chip testing tooling with infrared emission tally function |
-
2016
- 2016-11-25 CN CN201611055614.5A patent/CN106770281A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102774590A (en) * | 2012-03-05 | 2012-11-14 | 北京华兴长泰物联网技术研究院有限责任公司 | Counting medicine box |
| CN103824111A (en) * | 2014-02-28 | 2014-05-28 | 北京蝶禾谊安信息技术有限公司 | Infrared radiation type drug storage device with counting function |
| CN203759740U (en) * | 2014-03-13 | 2014-08-06 | 北京屏联科技有限公司 | Infrared correlation counter |
| CN104102945A (en) * | 2014-07-15 | 2014-10-15 | 江西方迪科技有限公司 | Intelligent object detecting and counting control system |
| CN204423411U (en) * | 2015-01-04 | 2015-06-24 | 成都辰鑫智能设备有限公司 | Powered battery two-way infrared thread count |
| CN105606993A (en) * | 2016-03-02 | 2016-05-25 | 太仓思比科微电子技术有限公司 | Hand-operated single-chip microcomputer chip testing device and operation method thereof |
| CN106022453A (en) * | 2016-05-23 | 2016-10-12 | 南宁市茂百科技有限公司 | Product counter with infrared bi-emission |
| CN207610990U (en) * | 2016-11-25 | 2018-07-13 | 太仓思比科微电子技术有限公司 | A kind of chip testing tooling with infrared emission tally function |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
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Application publication date: 20170531 |