CN106770069A - Electromagnetism accelerates enhancing plasma detecting system - Google Patents
Electromagnetism accelerates enhancing plasma detecting system Download PDFInfo
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- CN106770069A CN106770069A CN201510820261.2A CN201510820261A CN106770069A CN 106770069 A CN106770069 A CN 106770069A CN 201510820261 A CN201510820261 A CN 201510820261A CN 106770069 A CN106770069 A CN 106770069A
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Abstract
Accelerate enhancing plasma detecting system the invention discloses a kind of electromagnetism, electromagnetism is accelerated to be combined with laser plasma excitation-detection technology.Electromagnetism of the invention accelerates enhancing plasma detecting system for one can individually complete material element and component content detecting system, and the detecting system is mainly made up of light source module, electromagnetism accelerating module, sample block, control module, detecting module, logic module and display module；Logic control module link control module, detecting module and display module, control module is realized manipulating light source module, electromagnetism accelerating module and detecting module, light source module sends light irradiation detected material in sample block, induce plasma, plasma enters detecting module under the effect of electromagnetism accelerating module, and detecting module gathers sample block information transmission to logic module.The electromagnetism acceleration enhancing plasma detecting system such as of the invention has more preferable detection accuracy and lower Monitoring lower-cut, realizes the pretreatment of test sample zero.
Description
Technical field
The invention belongs to detecting system, and in particular to a kind of to speed up to strengthen the detecting system that plasma is detected by electromagnetism.
Background technology
Plasma detects, it by measurement of species spatial induction plasma spectrometry is a kind of spectrum detection technique for gradually rising in recent years to be, it is one kind of atomic emission spectrum.Up to the present, plasma technique is the technology of the known spectrum that uniquely can in any environment detect all elements；Simultaneously also can detect it is various in solid, liquid, powder, gas form sample form.While plasma detection technique also has, measuring speed is fast, remotely non-cpntact measurement, system architecture can constitute the lot of advantages such as simple.Based on plasma detection technique many advantage and versatility, someone is referred to as the detection technique of " omnipotent ".
It cannot Simultaneous multi element analysis, device be simple, sensitivity is high and destructive small simultaneously, because its unique advantage now has also been employed that and the numerous areas such as metallurgy, environment, archaeology, address, medical science.
But traditional plasma detection has a some problems, such as Monitoring lower-cut is insufficient to low, causes the minimum detectability of many constituent contents higher than national Specification value, and so all-round popularization to plasma detection increased difficulty to food security and environment measuring.Monitoring lower-cut can largely be reduced by the present invention so that more detections meet correspondence state-set standard.
Electromagnetism acceleration enhancing plasma detecting system has outstanding feature：（1）, lower Monitoring lower-cut, farthest meet different industries use demand, correspondence national Specification numerical value can be detected；（2）, the more effective plasma gone out using induced with laser, improve signal strength detection；（3）, unique electromagnetism accelerate design, without extra consumptive material, simple and convenient operation and maintenance；（4）, enhancing be applicable wide, strengthened due to being directed to the plasma for inducing, therefore suitable for all substances detection.
The content of the invention
Accelerate to strengthen plasma detecting system the invention aims to provide a kind of electromagnetism, the detecting system can preferably detect element species in material, and with lower Monitoring lower-cut；It has the outstanding features such as nulling sample pretreatment, zero consumptive material demand, zero damage.
To reach above-mentioned purpose, the present invention uses following scheme：
A kind of electromagnetism accelerates enhancing plasma detecting system, and it can be with complete independently inspection work, and without miscellaneous equipment auxiliary, detecting system is made up of light source module, electromagnetism accelerating module, sample block, control module, detecting module, logic module and display module；
Light source module is mainly LASER Light Source, or other induced plasma light sources, and the wavelength of laser can be 1064,532,355,266,213 or 193nm.
Electromagnetism accelerating module is mainly realizes the plasma displacement that tested substance is induced by electromagnetism accelerator mode, the plasma that will be induced more effectively is input into detecting module, plasma can also be suppressed simultaneously freely to dissipate, so as to realize plasma signal enhancing effect.
The controlled module control of detecting module, detecting module certain hour after light source module sends light is acquired signal, the signal transmission of collection is to logic module, logic module calculates element species contained by tie substance and content, logic module also needs to send instruction to control module simultaneously so that control module performs correspondence control information, because control instruction needed for different material is different, optimal detection could be so realized, lowest detection lower limit is reached.
One kind accelerates enhancing plasma detecting system to realize detection using above-mentioned electromagnetism, comprises the following steps：
1., logic module provides corresponding instruction and is sent to control module, and detection material is placed above Yang Ping module correspondence positions, and control module is instructed to light source module and detecting module respectively according to instruction；
2., light source module is connected to light extraction after instruction, and Laser Focusing induces plasma in detection material surface, and plasma all enters to go in electromagnetism accelerator immediately, and electromagnetism accelerator is sent into the sensing part of detecting module by plasma to greatest extent；
3., the sensing part of detecting module has optical focus function, plasma signal can more effectively be received, signal acquisition is completed, collection transfers signals to logic module after finishing, logic module treatment is obtained a result and is presented above in display module, completes whole detection process.
Present invention improves conventional plasma detection：
1st, Monitoring lower-cut is high, and many detections can not detect national Specification numerical value；
2nd, the plasma free diffusing that material is induced, effective rate of utilization is low；
3rd, additional functional modules generally need consumptive material, just do cumbersome；
4th, enhancing effect is limited, and the plasma being excited effectively gathers low relatively low.
Due to electromagnetism accelerate enhancing plasma detecting system there is sample zero to pre-process, zero consumptive material demand and zero damage etc. distinguishing feature, there is lower detection limit and applicable popularity compared with conventional plasma detection again, nearly all metal element content can direct detection.
Brief description of the drawings
Structure chart of the present invention shown in Fig. 1.
Specific embodiment
It is specific purposes, the function that can further appreciate that feature of the invention, technological means and reached, the advantages and spirit of the present invention is parsed, by the present invention is further elaborated by the following examples.
The present invention has put forward a kind of design of plasma detecting system, there is provided constituent content method in lower detection material.
The structure chart of present example is referring to accompanying drawing 1.
Patent of the present invention is main by light source module（1）, electromagnetism accelerating module（2）, sample block（3）, control module（4）, detecting module（5）, logic module（6）And display module（7）Seven parts constitute.
This patent centering is to light source module（1）With detecting module（5）It is by control module（4）Realize that Time-sharing control cooperation completes corresponding function, control module（4）According to logic module（6）The corresponding instruction for being given, sets out control light source module（1）Light extraction and detecting module（5）Time delay between collection.
Next detecting module（5）Being focused on by fibre-optical probe front end can more effectively gather plasmon signal, be transferred to logic module（6）, computing below and result output are completed so as to more accurate.
Detection sample in use, directly can be fixed to sample block by the present invention（3）Middle correspondence position（Solid-state, liquid can be fixed directly, can directly be fixed after gaseous state enrichment）, without pretreatment, especially by the pretreatment of chemical reagent.
Electromagnetism accelerating module（2）It is an indispensable part in whole plasma detecting system, it is responsible for the plasma displacement that material is induced, limits original plasma that induces and freely dissipate, by its maximally effective conveying such as detecting module（5）, realize that plasma information is at utmost gathered.
During material is detected, correspondence detection project and information are set, start detection, testing result can be just directly displayed out within short several seconds, without the abundant reaction stand-by period of traditional chemical detection.Multiple element is realized to detect simultaneously, at once.
In some application examples, the crops such as Chinese herbal medicine, grain or fruit can be directly placed at sample block（3）In, then by logic module（6）Setting correspondence parameter, starts detection, and metal species and content contained by these crops can be obtained immediately.
Advantage of the present invention：
1st, lower Monitoring lower-cut, farthest meets different industries use demand, can detect correspondence national Specification numerical value；
2nd, plasma signal utilization rate higher, the plasma that material is induced at utmost is gathered, and original freely diverging does not have using limitation and displacement is partly also carried out, and is finally reached plasma utilization rate high, improves signal acquisition intensity；
3rd, unique electromagnetism accelerates design, is combined as a whole with detecting system, it is not necessary to extra operation and consumptive material, after detection is started, can carry out correspondence work automatically according to light extraction；
4th, strengthen and be applicable extensively, it is unrelated with tested substance because electromagnetism accelerates to be directed to plasma using the design for carrying out, therefore all there is signal enhancing to all of detection material, the effect of accuracy of detection and reduction detection limit is improved.
Embodiment described above only expresses several embodiments of the invention, and its description is more specific and detailed, but therefore can not be interpreted as the limitation to the scope of the claims of the present invention.It should be pointed out that for the person of ordinary skill of the art, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to protection scope of the present invention.Therefore, the protection domain of patent of the present invention should be determined by the appended claims.
Claims (5)
1. a kind of electromagnetism accelerates enhancing plasma detecting system, it is characterised in that the plasma detecting system is by light source module（1）, electromagnetism accelerating module（2）, sample block（3）, control module（4）, detecting module（5）, logic module（6）Constituted with display module（7）Composition；
The light source module（1）Mainly be made up of laser, comprising beam shaping and focusing structure, or other excite plasma source, by control module（4）Realize to light source module（1）Light extraction is controlled, and controls out light energy and light extraction time delay；
The electromagnetism accelerating module（2）The plasma that realization goes out to induced with laser is in specific direction, i.e. detecting module（4）Direction so that only detecting module（5）There is plasma on direction, the plasma that other directions freely dissipate all is concentrated in this direction, the plasma maximum utilization rate for inducing is realized, so as to strengthen plasma signal intensity；
The sample block（3）Realize the fixation and clamping to detecting sample, it is ensured that the accuracy of detection, detecting module（5）Realize to signal acquisition, realized to signal acquisition by the fibre-optical probe for focusing on；
The logic module（6）The coordination to whole system and normal work are realized, and completes corresponding testing result output to display module（7）, while institute's detection data can be stored according to setting rule.
2. electromagnetism according to claim 1 accelerates enhancing plasma detecting system, it is characterised in that light source module（1）In laser part wavelength be 1064,532,355,266,213 or 193nm.
3. electromagnetism according to claim 1 accelerates enhancing plasma detecting system, it is characterised in that the electromagnetism accelerating module（2）, using electromagnetism accelerator as plasma signal strengthen major way, by with sample block（3）And detecting module（5）Position relationship, determines that electromagnetism accelerator has related parameter, particularly plasma motion direction and constraint to suppress direction.
4. electromagnetism according to claim 1 accelerates enhancing plasma detecting system, it is characterised in that the detecting module（5）By Optical Fiber Transmission and at fiber-optic probe end added with optically focused Coupling optics, the collection of at utmost plasma signal is realized.
5. it is a kind of that enhancing plasma detecting system is accelerated using electromagnetism described in any one of Claims 1 to 4, it is characterised in that to comprise the following steps：
1., logic module（6）Treatment detecting module（5）Gathered data, is transferred to display module after treatment（7）, testing result is finally presented, with this herewith logic module（6）It is also responsible for control module（4）Instruction is sent, collaboration completes detection；
2., when the present invention is detected, control module（4）Receive logic module（6）Corresponding mass control optical module respectively（1）, electromagnetism accelerating module（2）And detecting module（5）, in detection process, optical module（1）In light source induce tested substance plasma by electromagnetism accelerating module（2）, final detecting module（5）Plasma signal is gathered after time delay is set；
3., before the present invention is detected, detection sample is fixed on sample block（3）Above, the module ensure that the relative position uniqueness of detected sample, after so being demarcated, it is ensured that be detected the accuracy of sample material content；
4., electromagnetism accelerating module（2）Ensure that excite tested substance surface produce plasma can be with maximally effective entrance detecting module（5）In, plasma maximum utilization rate is realized, compared with traditional approach, improve accuracy of detection and reduce detection limit.
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| US5393986A (en) * | 1991-09-09 | 1995-02-28 | Sharp Kabushiki Kaisha | Ion implantation apparatus |
| CN101248505A (en) * | 2005-07-08 | 2008-08-20 | 耐克斯金思美控股公司 | Apparatus and method for controlled particle beam manufacturing |
| CN104730066A (en) * | 2015-04-09 | 2015-06-24 | 北京航空航天大学 | Near-field plume mass-spectroscopic diagnostic E*B probe based on Faraday cup |
| CN104931462A (en) * | 2014-03-17 | 2015-09-23 | 以恒科技(北京)有限公司 | Mixed light source focusing enhancing plasma detection system |
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- 2015-11-24 CN CN201510820261.2A patent/CN106770069A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5393986A (en) * | 1991-09-09 | 1995-02-28 | Sharp Kabushiki Kaisha | Ion implantation apparatus |
| CN101248505A (en) * | 2005-07-08 | 2008-08-20 | 耐克斯金思美控股公司 | Apparatus and method for controlled particle beam manufacturing |
| CN104931462A (en) * | 2014-03-17 | 2015-09-23 | 以恒科技(北京)有限公司 | Mixed light source focusing enhancing plasma detection system |
| CN104730066A (en) * | 2015-04-09 | 2015-06-24 | 北京航空航天大学 | Near-field plume mass-spectroscopic diagnostic E*B probe based on Faraday cup |
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