CN106768335B - A kind of non-linear spectral Method for Phase Difference Measurement - Google Patents
A kind of non-linear spectral Method for Phase Difference Measurement Download PDFInfo
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- CN106768335B CN106768335B CN201710090601.XA CN201710090601A CN106768335B CN 106768335 B CN106768335 B CN 106768335B CN 201710090601 A CN201710090601 A CN 201710090601A CN 106768335 B CN106768335 B CN 106768335B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
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- G01J3/2803—Investigating the spectrum using photoelectric array detector
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Abstract
The invention discloses a kind of non-linear spectral Method for Phase Difference Measurement, it is related to non-linear spectral detection technique field, the present invention is suitable for the measurement of all nonlinear optical optical spectras, such as: frequency multiplication spectrum and frequency spectrum and four-wave mixing etc. select different pumping sources to input with conllinear formula according to different nonlinear situations.The sum of nonlinear properties of sample to be tested and reference crystal and the sum of sample to be tested nonlinear properties and reference crystal nonlinear properties that half-wave loss occurs are detected respectively with two CCD type spectrometers；Simple data processing is carried out to the spectral signal collected, the amplitude information and phase information of available sample to be tested non-linear spectral are a kind of non-linear spectral information collection modes of efficiently and accurately, there are bright prospects in the research of non-linear spectral.
Description
Technical field
The present invention relates to non-linear spectral detection technique field more particularly to a kind of non-linear spectral Method for Phase Difference Measurement.
Background technique
Nonlinear optics is used for the phenomenon that studying a series of nonlinear changes caused by the substance under strong illumination.
Only there is laser sufficiently large intensity substance can just be made to generate nonlinear optical effect.
In the 1960s, nonlinear optics has obtained the development of early stage, in this stage, mainly to secondary humorous
Wave generates (frequency multiplication), difference frequency and frequency, stimulated Brillouin scattering, stimulated Raman scattering, two-photon absorption, saturated absorption, optical parameter
The nonlinear optical phenomenas such as oscillator are observed and are studied.
In the 1970s, nonlinear optics continues deeper into development, researchers have found a variety of important non-thread successively
Property optical effect, and carried out spin flip conversion stimulated Raman scattering, coherent antistockes Raman spectroscopy, two-photon absorption light
The research of the nonlinear optical phenomenas such as spectral technology, nonlinear optics phase conjugation, optical bistable effect.
In the 1980s, there is optics bifurcated and chaos, optical compression state, multi-photon atom ionization phenomena, light
Fine arc etc., and a large amount of progress are also achieved to the research of nonlinear optical material, in the base of previous nonlinear optical crystal
On plinth, the emerging nonlinear optical crystals such as KTP (potassium titanyl phosphate), BBO (barium metaborate) are had found in succession, and carried out organic
The research of nonlinear crystalline material and the research of non-linear photon crystal theory.
Since the 1990s, nonlinear optics is most significant to be progressed to develop wide wave using emerging nonlinear crystal
Section is tunable continuous or pulse optical parametric oscillator, photoparametric amplifier, has carried out the research of femtosecond nonlinear optics, has pushed
Femtosecond laser gives the successful generation of optical compression state in the multidisciplinary application ground in field, has carried out squeezed state optics
High-precision atom spectrum, low noise acoustooptic communication, in terms of research.
Currently, nonlinear optics gradually enters the application study stage by phase of basic research, either technology is led
The application of domain or research field, nonlinear optics is all very extensive.
In the prior art, many nonlinear optics detection techniques need repeatedly to be surveyed when measuring a sample signal
Amount must be measured twice if heterodyne method detection technique is when measuring sample and frequency spectrum.It not only wastes time in this way, and
And many variable factors are increased for experiment.
Summary of the invention
The present invention provides a kind of non-linear spectral Method for Phase Difference Measurement, the present invention can fast and accurately obtain non-linear
The amplitude and phase information of signal are a kind of phase information acquisition modes of efficiently and accurately, described below:
A kind of non-linear spectral Method for Phase Difference Measurement, the measurement method include: spectra collection and data processing two parts,
Optical path involved in spectra collection includes following component: the first beam splitter, the first reflecting mirror, the second reflecting mirror, reference crystal,
Second beam splitter, the first CCD type spectrometer and the second CCD type spectrometer,
Input pumping source is divided into two beams by the first beam splitter, while being radiated on reference crystal and sample to be tested, reference
Crystal and sample to be tested are excited to generate nonlinear optical spectrum signal respectively；
The nonlinear optical spectrum signal of the nonlinear optical spectrum signal of sample to be tested and reference crystal is radiated at the second beam splitter
On；Half-wave loss, the non-linear spectral letter of reference crystal has occurred in reflected light of the nonlinear optical spectrum signal of sample to be tested in the face A
There is no half-wave loss for reflected light number in the face A；
First CCD type spectrometer is used to acquire the sum of the nonlinear optical spectrum signal of sample to be tested and reference crystal；Second
CCD type spectrometer is used to acquire the nonlinear optical spectrum signal of the sample to be tested of half-wave loss and the nonlinear optical of reference crystal
The sum of spectrum signal；
Simple data are carried out according to the first CCD type spectrometer, the second CCD type spectrometer obtained spectrogram I1 and I2
Processing, can accurately and efficiently obtain the amplitude information and phase information of the non-linear spectral of sample to be tested.
The input pumping source is infrared ultra-short pulse laser and visible light ultra-short pulse laser, with the input of conllinear formula.Institute
Stating reference crystal is quartz crystal.
The face A of second beam splitter is reflecting surface, and light wave is from the reflection process that wave dredges medium directive Bomi medium, instead
Vibration when vibration of the ejected wave when leaving reflection point reaches incidence point relative to incidence wave differs half period, i.e. half-wave damages
It loses.
ωREF=B
Wherein, τ1、τ2、γ1And γ2For the attenuation coefficient of the second beam splitter, it is assumed that τ1=τ2=γ1=γ2When, then have:
Wherein, ωSAMFor the nonlinear properties of sample to be tested；A is signal strength；I is imaginary unit；For signal phase
Angle；ωREFFor the nonlinear properties of reference crystal；B is signal strength；ωSAM1For ωSAMBelieved by the transmission of the second beam splitter
Number；ωSAM2For ωSAMPass through the reflection signal of the second beam splitter；ωREF1For ωREFPass through the reflection signal of the second beam splitter；
ωREF2For ωREFPass through the transmission signal of the second beam splitter.
The beneficial effect of the technical scheme provided by the present invention is that:
1, the present invention only needs to carry out one-shot measurement, directly and quickly obtains the information of the non-linear spectral of sample to be tested；
2, data processing of the invention is simple and fast, reduces the issuable error of Data processing, improves result
Accuracy；
3, the present invention can be detected simultaneously by the amplitude information and phase information of nonlinear properties, therefore this new phase sensitivity
Non-linear spectral measurement method has great significance.
Detailed description of the invention
Fig. 1 is instrument optical path schematic diagram provided by the invention；
Wherein, 1 is input pumping source；2 be the first beam splitter；3 be the first reflecting mirror；4 be the second reflecting mirror；5 be to be measured
Sample；6 be reference crystal；7 be the second beam splitter；8 be the first CCD type spectrometer；9 be the second CCD type spectrometer.
Fig. 2 is the schematic diagram of the second beam splitter 7 in Fig. 1；
Wherein, the face A is coated surface, and light mainly reflects in the face A.Because light wave dredges medium directive Bomi medium from wave
Reflection process in, vibration of the back wave when leaving reflection point relative to incidence wave reach incidence point when vibration differ half
Period, i.e. half-wave loss；So the nonlinear properties ω of sample to be testedSAMHalf-wave loss has occurred in reflected light in the face A, and joins
Than the nonlinear properties ω of crystal 6REFThere is no half-wave loss for reflected light in the face A.
Fig. 3 is Nonlinear harmonic oscillator schematic diagram.
Wherein, (a) is the nonlinear properties ω of sample to be testedSAMAmplitude information；It (b) is the nonlinear properties of sample to be tested
ωSAMPhase information；It (c) is the nonlinear properties ω of reference crystal 6REFAmplitude information；It (d) is the nonlinear properties of reference crystal
ωREFPhase information；
(e) spectrum I is surveyed by the first CCD type spectrometer1；(f) spectrum I is surveyed by the second CCD type spectrometer2；It (g) is logical
Cross the nonlinear properties ω ' for the sample to be tested 5 being calculatedSAMAmplitude information；It (h) is sample to be tested 5 obtained by calculation
Nonlinear properties ω 'SAMPhase information.
Specific embodiment
To make the object, technical solutions and advantages of the present invention clearer, embodiment of the present invention is made below further
Ground detailed description.
Embodiment 1
Method proposes a kind of new phase sensitivity non-linear spectral measurement methods, specifically include that at spectra collection and data
Manage two parts.Instrument optical path schematic diagram is as shown in Figure 1.
This method is suitable for the measurement of all nonlinear optical optical spectras, such as: frequency multiplication spectrum and frequency spectrum and four waves are mixed
Frequency etc., different input pumping sources is selected according to different nonlinear situations.With the first CCD type spectrometer 8, the second CCD type light
Spectrometer 9 completes spectra collection.
Wherein, the first CCD type spectrometer 8 is used to acquire the nonlinear optical spectrum signal of sample to be tested 1 and reference crystal 6
The sum of；Second CCD type spectrometer 9 is used to acquire the nonlinear optical spectrum signal and reference crystal of the sample to be tested 1 of half-wave loss
The sum of 6 nonlinear optical spectrum signal.
Simply count according to the first CCD type spectrometer 8, the obtained spectrogram I1 of the second CCD type spectrometer 9 and I2
According to processing, the amplitude information and phase information of the non-linear spectral of sample to be tested 1 can be accurately and efficiently obtained.
In conclusion this method is that a kind of measurement process is quick, the simple non-linear spectral measurement method of data processing, it can
To be accurately obtained the amplitude and phase information of nonlinear properties, there are bright prospects in the research of nonlinear optics.
Embodiment 2
Below with reference to Fig. 1 and Fig. 2 and mathematical formulae, the scheme in embodiment 1 is further introduced, this hair
Bright embodiment proposes a kind of new phase sensitivity non-linear spectral measurement method, can be divided into spectra collection and data processing two
Point, this implementation method is described in detail below by taking the detection with frequency spectrum as an example in the embodiment of the present invention:
The hardware configuration of spectra collection part is as shown in Figure 1.Firstly, ultrashort using infrared ultra-short pulse laser and visible light
Pulse laser is inputted as input pumping source 1, and with conllinear formula.
Input pumping source 1 is divided into two beams by the first beam splitter 2, at the same be radiated at reference crystal 6 (such as: can be stone
English crystal, the embodiment of the present invention are without limitation) on sample to be tested 5, reference crystal 6 is excited to produce respectively with sample to be tested 5
Raw and frequency signal ωREFAnd ωSAM。
Wherein, sample to be tested 5 and frequency signal ωSAMWith reference crystal 6 and frequency signal ωREFIt is radiated at the second beam splitter
On 7, Fig. 2 is the schematic diagram of second beam splitter 7.The face A is major reflecting surfaces, because light wave dredges medium directive Bomi medium from wave
Reflection process in, vibration of the back wave when leaving reflection point relative to incidence wave reach incidence point when vibration differ half
Period, i.e. half-wave loss.
So sample to be tested 5 and frequency signal ωSAMReflected light in the face A has occurred half-wave loss, and reference crystal 6
With frequency signal ωREFThere is no half-wave loss for reflected light in the face A.First CCD type spectrometer 8, the second CCD type spectrometer 9
To spectrum be respectively I1And I2, available following formula.
ωREF=ωREF1=ωREF2=B (3)
Wherein, τ1、τ2、γ1And γ2For the attenuation coefficient of the second beam splitter 7, it is assumed that τ1=τ2=γ1=γ2When, then have:
Wherein, ωSAMFor the nonlinear properties of sample to be tested；A is signal strength；I is imaginary unit；For signal phase
Angle；ωREFFor the nonlinear properties of reference crystal；B is signal strength；ωSAM1For ωSAMPass through the transmission of the second beam splitter 7
Signal；ωSAM2For ωSAMPass through the reflection signal of the second beam splitter 7；ωREF1For ωREFBelieved by the reflection of the second beam splitter 7
Number；ωREF2For ωREFPass through the transmission signal of the second beam splitter 7.
Data processing schematic diagram is as shown in Figure 3.Wherein (a) is the nonlinear properties ω of sample to be tested 5SAMAmplitude information；
It (b) is the nonlinear properties ω of sample to be tested 5SAMPhase information；It (c) is the nonlinear properties ω of reference crystal 6REFAmplitude letter
Breath；It (d) is the nonlinear properties ω of reference crystal 6REFPhase information；(e) spectrum I is surveyed by the first CCD type spectrometer1；(f)
Spectrum I is surveyed by the second CCD type spectrometer2；It (g) is the nonlinear properties ω ' of sample to be tested 5 obtained by calculationSAMAmplitude
Information；It (h) is the nonlinear properties ω ' of sample to be tested 5 obtained by calculationSAMPhase information.
In conclusion by above-mentioned operation find out measure spectrum can restore completely the amplitude information of actual spectrum with
Phase information, to prove that this method is that a kind of measurement process is quick, data processing is simple and effective phase sensitivity is non-linear
Spectral measurement method.
The embodiment of the present invention to the model of each device in addition to doing specified otherwise, the model of other devices with no restrictions,
As long as the device of above-mentioned function can be completed.
It will be appreciated by those skilled in the art that attached drawing is the schematic diagram of a preferred embodiment, the embodiments of the present invention
Serial number is for illustration only, does not represent the advantages or disadvantages of the embodiments.
The foregoing is merely presently preferred embodiments of the present invention, is not intended to limit the invention, it is all in spirit of the invention and
Within principle, any modification, equivalent replacement, improvement and so on be should all be included in the protection scope of the present invention.
Claims (1)
1. a kind of non-linear spectral Method for Phase Difference Measurement, the measurement method includes: spectra collection and data processing two parts,
It is characterized in that,
Optical path involved in spectra collection includes following component: the first beam splitter, the first reflecting mirror, the second reflecting mirror, reference
Crystal, the second beam splitter, the first CCD type spectrometer and the second CCD type spectrometer,
Input pumping source is divided into two beams by the first beam splitter, while being radiated on reference crystal and sample to be tested, reference crystal
It is excited to generate nonlinear optical spectrum signal respectively with sample to be tested；
The nonlinear optical spectrum signal of the nonlinear optical spectrum signal of sample to be tested and reference crystal is radiated on the second beam splitter；To
Half-wave loss has occurred in reflected light of the nonlinear optical spectrum signal of sample in the face A, and the nonlinear optical spectrum signal of reference crystal is in A
There is no half-wave loss for the reflected light in face；
First CCD type spectrometer is used to acquire the sum of the nonlinear optical spectrum signal of sample to be tested and reference crystal；2nd CCD
Type spectrometer is used to acquire the nonlinear optical spectrum signal of the sample to be tested of half-wave loss and the non-linear spectral letter of reference crystal
The sum of number；
According to the first CCD type spectrometer, the obtained spectrogram I of the second CCD type spectrometer1And I2Simple data processing is carried out,
The amplitude information and phase information of the non-linear spectral of sample to be tested can accurately and efficiently be obtained；
ωREF=B
Wherein, τ1、τ2、γ1And γ2For the attenuation coefficient of the second beam splitter, it is assumed that τ1=τ2=γ1=γ2When, then have:
Wherein, ωSAMFor the nonlinear properties of sample to be tested；A is signal strength；I is imaginary unit；For signal phase angle；
ωREFFor the nonlinear properties of reference crystal；B is signal strength；ωSAM1For ωSAMPass through the transmission signal of the second beam splitter；
ωSAM2For ωSAMPass through the reflection signal of the second beam splitter；ωREF1For ωREFPass through the reflection signal of the second beam splitter；ωREF2
For ωREFPass through the transmission signal of the second beam splitter；Re is the real part for taking formula in bracket；
The input pumping source is infrared ultra-short pulse laser and visible light ultra-short pulse laser, with the input of conllinear formula；The ginseng
It is quartz crystal than crystal；
The face A of second beam splitter is reflecting surface, and light wave is from the reflection process that wave dredges medium directive Bomi medium, back wave
Vibration when vibration when leaving reflection point reaches incidence point relative to incidence wave differs half period, i.e. half-wave loss.
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| CN109612955B (en) * | 2019-01-07 | 2023-11-24 | 中国科学院力学研究所 | Sum frequency vibration spectrum phase measuring device |
| CN110940635A (en) * | 2019-11-08 | 2020-03-31 | 中国科学院福建物质结构研究所 | Ultraviolet second-order nonlinear optical testing device and testing method |
| CN111678600B (en) * | 2020-08-10 | 2020-10-30 | 中国工程物理研究院激光聚变研究中心 | Hall crystal with flat response |
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|---|---|---|---|---|
| US5883717A (en) * | 1996-06-04 | 1999-03-16 | Northeastern University | Optical quadrature interferometry utilizing polarization to obtain in-phase and quadrature information |
| EP1455170B1 (en) * | 1997-09-26 | 2008-06-11 | Japan Science and Technology Agency | Apparatus and method for measuring characteristics of light |
| CN201247199Y (en) * | 2008-06-17 | 2009-05-27 | 苏州大学 | Non-linear 4f phase coherent imaging apparatus for measuring optics |
| US20100208252A1 (en) * | 2008-10-21 | 2010-08-19 | The Board Of Trustees Of The University Of Illinois | Matched Pulse Stimulated Raman Scattering |
| WO2010125508A1 (en) * | 2009-04-27 | 2010-11-04 | Ecole Polytechnique Federale De Lausanne (Epfl) | Method and apparatus for retrieval of amplitude and phase of nonlinear electromagnetic waves |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5883717A (en) * | 1996-06-04 | 1999-03-16 | Northeastern University | Optical quadrature interferometry utilizing polarization to obtain in-phase and quadrature information |
| EP1455170B1 (en) * | 1997-09-26 | 2008-06-11 | Japan Science and Technology Agency | Apparatus and method for measuring characteristics of light |
| CN201247199Y (en) * | 2008-06-17 | 2009-05-27 | 苏州大学 | Non-linear 4f phase coherent imaging apparatus for measuring optics |
| US20100208252A1 (en) * | 2008-10-21 | 2010-08-19 | The Board Of Trustees Of The University Of Illinois | Matched Pulse Stimulated Raman Scattering |
| WO2010125508A1 (en) * | 2009-04-27 | 2010-11-04 | Ecole Polytechnique Federale De Lausanne (Epfl) | Method and apparatus for retrieval of amplitude and phase of nonlinear electromagnetic waves |
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