CN106712922A - High-precision clock signal test system and high-precision clock signal test method - Google Patents
High-precision clock signal test system and high-precision clock signal test method Download PDFInfo
- Publication number
- CN106712922A CN106712922A CN201510771469.XA CN201510771469A CN106712922A CN 106712922 A CN106712922 A CN 106712922A CN 201510771469 A CN201510771469 A CN 201510771469A CN 106712922 A CN106712922 A CN 106712922A
- Authority
- CN
- China
- Prior art keywords
- clock signal
- test
- devices
- clock
- type
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
The embodiment of the invention provides a high-precision clock signal test system and a high-precision clock signal test method. The system comprises a to-be-tested device, a clock signal simulator and at least two tester, wherein the to-be-tested device outputs at least two types of clock signals; the to-be-tested device and the clock signal simulator are connected with each corresponding tester at the same time; the clock signal simulator is used for providing corresponding at least two types of standard clock signals; and each tester is used for testing the to-be-tested device according to each type of standard clock signals outputted by the clock signal simulator and corresponding each type of to-be-tested clock signals outputted by the to-be-tested device. As each type of clock signals outputted by the to-be-tested device can be measured at the same time and the same clock source signals provided by the clock signal simulator are used, the test efficiency is thus improved, and the test precision is ensured.
Description
Technical field
The present invention relates to high accurate clock signal technical field of measurement and test, more particularly to a kind of high accurate clock signal
Test system and method.
Background technology
EPA has requirement very high to the Timing Synchronization ability between each network equipment, when high-precision
Zhong Yuanneng effectively reduces the time synchronization error of whole industrial network, accordingly, it is determined that as the every of clock source
Whether the clock signal that platform equipment is provided meets the method for testing of required precision, is just particularly important.
Existing method of testing is as shown in figure 1, when every Devices to test selects a standard according to its item to be measured
Zhong Yuan, as a example by testing IRIG-B signals, when selecting one IRIG-B of standard yards for Devices to test first
Zhong Yuan (generally gps signal), IRIG-B yards of precision tester is believed by the clock for exporting Devices to test
Cease the clock information exported with standard IRIG-B yards of clock source to be compared, determine the clock of the Devices to test
Precision, and export examining report.
, it is necessary to the device type of detection is varied in the industries such as electric power, communication, and different types of quilt
The clock signal of measurement equipment is also different, for example, IRIG-B signals, pulse per second (PPS) (pulse per second,
1PPS)+Time of Day information (Time of Day, TOD) signal, Precision Time Protocol (Precision Time
Protocol, PTP) signal or NTP (Network Time Protocol, NTP) signal etc..
And same hospitality measurement equipment may simultaneously export two or more clock signals, therefore, it is above-mentioned many testing
, it is necessary to select different signal source of clock device under test to be examined respectively during the Devices to test of kind signal output
Survey, it is less efficient.
Meanwhile, in the existing method of testing to multi-clock output signal Devices to test, precision when existing pair
Unstable problem：As a example by exporting the Devices to test of IRIG-B signals and 1PPS+TOD signals, standard
Clock source is GPS, and the accuracy rating of GPS is positive and negative 30, if when testing IRIG-B yards, should
The signal spacing of GPS positive 30, and when testing 1PPS+TOD, the signal spacing of the GPS minus 30,
The measuring accuracy presence of same the IRIG-B signals and 1PPS+TOD signals of Devices to test will be caused certain
Error.And occur in actual use when the output of each clock signal is used alone, during output
The precision of clock information is satisfied by requiring, but when simultaneously using multiple clock signal, will appear from section clock
The larger phenomenon of signal output deviation, precision when having had a strong impact on pair.
Therefore, it is existing with the industrial network continuous improvement that especially military project network is required time precision
To the method for testing of multi-clock signal output equipment, it is impossible to solve the signal interference that multi-clock signal output brings
Problem, so as to cause testing efficiency low, measuring accuracy cannot ensure.
The content of the invention
In view of the above problems, it is proposed that the present invention overcomes above mentioned problem or at least in part to provide one kind
A kind of high accurate clock signal test system and method for solving the above problems.
A kind of high accurate clock signal test system is the embodiment of the invention provides, the system includes：It is to be measured to set
Standby, clock signal emulating instrument and at least two testers, wherein,
The Devices to test exports the clock signal of at least two types；The Devices to test and the clock are believed
Number emulating instrument connects corresponding every tester simultaneously；
The clock signal emulating instrument, the standard clock signal for providing corresponding at least two type；
Every tester, for the every kind of standard time clock letter exported according to the clock signal emulating instrument
Number, and the every kind of clock signal to be measured of correspondence that the Devices to test is exported, the Devices to test is tested.
In order to ensure testing efficiency, measuring accuracy is further improved, in embodiments of the present invention every survey
Examination instrument, specifically for for each type of clock signal, this kind mark of comparison clock signal emulating instrument output
Clock signal, and this kind of clock signal to be measured that the Devices to test is exported, and according to comparative result, it is defeated
Go out test report.
Influence in order to avoid different clock sources to measuring accuracy, further improves measuring accuracy, in this hair
In bright embodiment, the clock signal emulating instrument is by high-precision clock input source and internal high stability
Oscillator generates each type of standard clock signal.
In order to meet the testing requirement of Devices to test different type clock signal, it is to avoid different clock sources is to surveying
The influence of precision is tried, measuring accuracy is further improved, in embodiments of the present invention, the clock signal emulation
Instrument generates high-precision reference signal by the oscillator of high-precision clock input source and internal high stability,
Each type of standard clock signal is generated by its internal logic unit based on the reference signal.
Influence in order to avoid different clock sources to measuring accuracy, further improves measuring accuracy, in this hair
In bright embodiment, the clock input source includes：GPS or the Big Dipper；The oscillator includes：Caesium clock,
Or rubidium clock.
In order to meet the testing requirement of Devices to test different type clock signal, it is to avoid different clock sources is to surveying
The influence of precision is tried, measuring accuracy is further improved, in embodiments of the present invention the clock signal emulating instrument
Including：The splicing interface of each type of standard clock signal of correspondence.
A kind of high accurate clock signal method of testing is the embodiment of the invention provides, is applied to include to be measured setting
In standby, clock signal emulating instrument and at least two test systems of tester, the Devices to test output is at least
Two kinds of clock signal；The Devices to test and the clock signal emulating instrument connect corresponding every simultaneously
Platform tester；Methods described includes：
Receive the clock signal of at least two types of the Devices to test output；And
Receive the standard clock signal of at least two types that the clock signal emulating instrument is provided；
According to every kind of standard clock signal that the clock signal emulating instrument is exported, and Devices to test output
The every kind of clock signal to be measured of correspondence, the Devices to test is tested.
In order to meet the testing requirement of Devices to test different type clock signal, it is to avoid different clock sources is to surveying
The influence of precision is tried, measuring accuracy is further improved, it is described in embodiments of the present invention to be believed according to the clock
Every kind of standard clock signal of number emulating instrument output, and Devices to test output the every kind of clock to be measured of correspondence
Signal, carrying out test to the Devices to test includes：
For each type of clock signal, this kind of standard time clock letter of comparison clock signal emulating instrument output
Number, and this kind of clock signal to be measured that the Devices to test is exported, and according to comparative result, output test report
Accuse.
For the ease of carrying out fault location to the Devices to test for being not up to measuring accuracy, test effect is further improved
Methods described also includes rate in embodiments of the present invention：
For each type of clock signal, judge whether test result is normal；
If it is not, then closing the clock letter of at least one other type in Devices to test and clock signal simulation instrument
Number input port, the clock signal to the type of the Devices to test tests.
For the ease of carrying out fault location to the Devices to test for being not up to measuring accuracy, carried out according to test result
Accident analysis, methods described also includes in embodiments of the present invention further to improve testing efficiency：
When the test result of the clock signal of the type to the Devices to test is normal, it is determined that described treat
The clock signal of the type of measurement equipment is subject to disturbing for the clock signal of at least one other type；
When the test result of the clock signal of the type of the Devices to test is abnormal, it is determined that described treat
The clock signal of test equipment is unsatisfactory for required precision.
A kind of high accurate clock signal test system and method are the embodiment of the invention provides, the system includes：
Devices to test, clock signal emulating instrument and at least two testers, wherein, the Devices to test output is at least
Two kinds of clock signal；The Devices to test and the clock signal emulating instrument connect corresponding every simultaneously
Platform tester；The clock signal emulating instrument, the standard time clock for providing corresponding at least two type is believed
Number；Every tester, for the every kind of standard clock signal exported according to the clock signal emulating instrument,
And the every kind of clock signal to be measured of correspondence of the Devices to test output, the Devices to test is tested.By
In Devices to test in embodiments of the present invention by the clock signal by least two types are exported and offer
The signal simulation instrument of the standard clock signal of at least two types of correspondence, while the corresponding every test of connection
Instrument, therefore, it can simultaneously measure Devices to test output each type of clock signal, and used by
The identical clock source that signal simulation instrument is provided, so as to improve testing efficiency, it is ensured that measuring accuracy.
Brief description of the drawings
By reading the detailed description of hereafter preferred embodiment, various other advantages and benefit are for ability
Domain those of ordinary skill will be clear understanding.Accompanying drawing is only used for showing the purpose of preferred embodiment, and simultaneously
It is not considered as limitation of the present invention.And in whole accompanying drawing, identical is denoted by the same reference numerals
Part.In the accompanying drawings：
Fig. 1 is the attachment structure of existing clock test method provided in an embodiment of the present invention；
Fig. 2 is a kind of attachment structure of high accurate clock signal test system provided in an embodiment of the present invention；
Fig. 3 is a kind of test process of high accurate clock signal provided in an embodiment of the present invention：
Fig. 4 is a kind of DCO process of high accurate clock signal provided in an embodiment of the present invention；
Fig. 5 is high accurate clock signal test system attachment structure example provided in an embodiment of the present invention.
Specific embodiment
The testing efficiency brought to solve the problems, such as Devices to test multi-clock signal to export is low and signal is disturbed,
Improve testing efficiency, it is ensured that measuring accuracy, the embodiment of the invention provides a kind of high accurate clock signal test
System and method.
The exemplary embodiment of the disclosure is more fully described below with reference to accompanying drawings.Although being shown in accompanying drawing
The exemplary embodiment of the disclosure, it being understood, however, that may be realized in various forms the disclosure without should be by
Embodiments set forth here is limited.Conversely, there is provided these embodiments are able to be best understood from this
It is open, and can by the scope of the present disclosure it is complete convey to those skilled in the art.
With reference to explanation accompanying drawing, the embodiment of the present invention is illustrated.
Fig. 2 is a kind of attachment structure of high accurate clock signal test system provided in an embodiment of the present invention, should
System includes：Devices to test 21, clock signal emulating instrument 22 and at least two testers 23, wherein,
The Devices to test 21 exports the clock signal of at least two types；The Devices to test 21 and described
Clock signal emulating instrument 22 connects corresponding every tester 23 simultaneously；
The clock signal emulating instrument 22, the standard clock signal for providing corresponding at least two type；
Every tester 23, for the every kind of standard time clock letter exported according to the clock signal emulating instrument
Number, and the every kind of clock signal to be measured of correspondence that the Devices to test is exported, the Devices to test is tested.
Specifically, in embodiments of the present invention when Devices to test can export multiple clock signal, it is determined that should
Devices to test needs all clock signal types of test, according to every kind of clock signal type of the Devices to test
Corresponding tester is selected to be attached, and according to every kind of clock signal type of the Devices to test, selection
Corresponding this kind of clock signal output interface of clock signal emulating instrument and the corresponding clock test instrument phase
Even, due to can simultaneously measure each type of clock letter that Devices to test is exported by above-mentioned connected mode
Number, and because having used the identical clock source provided by signal simulation instrument, avoid due to clock source
Test error caused by deviation, so as to improve testing efficiency, it is ensured that measuring accuracy.
In addition, further improving measuring accuracy to ensure testing efficiency in embodiments of the present invention, record
The test data of each type of clock signal of Devices to test, every tester 23, specifically for being directed to
Each type of clock signal, this kind of standard clock signal of comparison clock signal emulating instrument output, and it is described
This kind of clock signal to be measured of Devices to test output, and according to comparative result, export test report.
Specifically, in embodiments of the present invention according to each type of clock signal of Devices to test, it is right to select
The tester and the output interface of clock signal simulation instrument this type clock signal answered, in the test of regulation
The corresponding tester of interior this type clock signal, the Devices to test and clock signal in record test process
The time data of emulating instrument output, on the basis of this kind of clock signal of clock signal emulating instrument output, compares
Above two time data, and comparative result is exported in the form of test report.In embodiments of the present invention by
In the test data that have recorded Devices to test each type clock signal, therefore, it is easy to tester according to not
Test data in same testing time section, analyzes the increase with the testing time and the ripple of standard clock source
It is dynamic, cause the interference variations of all kinds clock signal of Devices to test output, so as to further increase survey
Examination precision.
In addition, the influence in order to avoid different clock sources to measuring accuracy in embodiments of the present invention, enters one
Step improves measuring accuracy, and the clock signal emulating instrument 22 is by high-precision clock input source and internal height
The oscillator of stability generates each type of standard clock signal.
Specifically, according to each type of clock signal of Devices to test, selecting corresponding tester and clock
The output interface of signal simulation instrument this type clock signal, every kind of tester respectively with Devices to test and clock
Signal simulation instrument is connected, the clock signal emulating instrument standard clock source unified for Devices to test is provided, and should
Clock source is converted into different types of standard clock signal, wherein it is possible to the standard clock signal type for providing
Including but not limited to：IRIG-B clock signals, 1PPS+TOD clock signals, clock synchronization compliant with precision time protocol signal and NTP
Clock signal etc..Due to when clock signal emulating instrument is each type of Devices to test in embodiments of the present invention
Clock signal, there is provided unified standard clock source, therefore, it is to avoid due to standard time clock in test process
The measurement error that signal fluctuation causes, so as to improve measuring accuracy.
In addition, in embodiments of the present invention in order to meet the test need of Devices to test different type clock signal
Ask, it is to avoid influence of the different clock sources to measuring accuracy, further improve measuring accuracy, the clock letter
Number emulating instrument 22 is generated high-precision by the oscillator of high-precision clock input source and internal high stability
Reference signal, generates each type of standard time clock and believes based on the reference signal by its internal logic unit
Number.
Influence in order to avoid different clock sources to measuring accuracy, further improves measuring accuracy, in this hair
In bright embodiment, the clock input source includes：GPS or the Big Dipper；The oscillator includes：Caesium clock,
Or rubidium clock.
Specifically, clock signal emulating instrument is included in the embodiment of the present invention：Standard time clock source unit, inside are patrolled
Unit, clock type confirmation unit and time signal compensating unit are collected, wherein, standard time clock source unit passes through
High-precision clock input source (GPS or BD) and the oscillator (or rubidium clock) of internal high stability
High-precision reference signal, internal logic unit is produced to be based on the high precision reference that standard time clock source unit is provided
The different types of clock signal of signal generation, clock type confirmation unit is used to be exported according to internal logic unit
Clock signal type and itself preserve the corresponding clock signal Type mapping list of each interface, judge in
Whether corresponding with the interface clock signal type clock signal type of portion logic unit output be consistent, when sentencing
When determining result to be, the clock signal of corresponding types is exported by the interface, otherwise, down interface is simultaneously exported
Alarm signal, time signal compensating unit is used to realize the time delay according to physical link, to data clock signal
Time bias, the above-mentioned determination to physical link time delay can be by the automatic survey of clock signal emulating instrument
Amount, it is also possible to which offset is directly inputted by tester by man-machine interface.
In order to meet the testing requirement of Devices to test different type clock signal, it is to avoid different clock sources is to surveying
The influence of precision is tried, measuring accuracy is further improved, in embodiments of the present invention the clock signal emulating instrument
Including：The splicing interface of each type of standard clock signal of correspondence.
Specifically, the different types of clock signal that clock signal emulating instrument is exported according to itself, is every kind of survey
Examination instrument provides different splicing interfaces, and real-time detection each splicing interface state, and in the display of itself
Shown in screen.
Due in embodiments of the present invention by the Devices to test of the clock signal by least two types are exported
The signal simulation instrument of the standard clock signal of at least two type corresponding with offer, while connection is corresponding every
Tester, therefore, it can measure simultaneously each type of clock signal of Devices to test output, and use
The identical clock source provided by signal simulation instrument, it is to avoid influence of the different clock sources to measuring accuracy,
So as to improve testing efficiency, it is ensured that measuring accuracy.
Fig. 3 is a kind of high accurate clock signal test process provided in an embodiment of the present invention, is applied to include treating
In measurement equipment, clock signal emulating instrument and at least two test systems of tester, the Devices to test output
The clock signal of at least two types；The Devices to test and the clock signal emulating instrument connect correspondence simultaneously
Every tester；The process is comprised the following steps：
S301：At least two testers receive the clock letter of at least two types that the Devices to test is exported
Number.
S302：At least two testers receive at least two types that the clock signal emulating instrument is provided
Standard clock signal.
S303：It is and described to be measured according to every kind of standard clock signal that the clock signal emulating instrument is exported
The every kind of clock signal to be measured of correspondence of equipment output, tests the Devices to test.
In addition, in order to ensure testing efficiency, measuring accuracy is further improved, it is described in embodiments of the present invention
According to the clock signal emulating instrument export every kind of standard clock signal, and the Devices to test output it is right
Every kind of clock signal to be measured is answered, carrying out test to the Devices to test includes：
For each type of clock signal, this kind of standard time clock letter of comparison clock signal emulating instrument output
Number, and this kind of clock signal to be measured that the Devices to test is exported, and according to comparative result, output test report
Accuse.
Specifically, type of the Devices to test according to itself every kind of clock signal to be measured, selects corresponding test
The splicing interface of instrument and clock signal emulating instrument, every tester connects a kind of type clock of Devices to test respectively
The splicing interface of the output interface of signal and corresponding clock signal emulating instrument, the tester passes through above-mentioned two
Interface receives the clock signal of Devices to test and clock signal emulating instrument the type respectively, is emulated with clock signal
On the basis of the clock signal of instrument, it is compared by the clock signal of this type exported with Devices to test,
Set when the difference of clock signal that the clock signal of Devices to test output is provided with clock signal emulating instrument is less than
During fixed threshold value, determine that the clock signal of this type of the Devices to test meets standard, otherwise, it is determined that
Do not meet standard, and the data that will be received in test process and comparative result are exported in the form of test report.
In addition, being positioned for the ease of test error in embodiments of the present invention, testing efficiency is further improved,
Ensure measuring accuracy, methods described also includes：
For each type of clock signal, judge whether test result is normal；
If it is not, then closing the clock letter of at least one other type in Devices to test and clock signal simulation instrument
Number input port, the clock signal to the type of the Devices to test tests.
In addition, testing efficiency is further improved in order to ensure measuring accuracy in embodiments of the present invention, it is convenient
Tester carries out positioning analysis to specific test error, when the clock signal for occurring being not up to testing standard
When, methods described also includes：
When the test result of the clock signal of the type to the Devices to test is normal, it is determined that described treat
The clock signal of the type of measurement equipment is subject to disturbing for the clock signal of at least one other type；
When the test result of the clock signal of the type of the Devices to test is abnormal, it is determined that described treat
The clock signal of test equipment is unsatisfactory for required precision.
Specifically, when being tested for each type of clock signal that Devices to test is exported, being believed with clock
On the basis of the clock signal of number emulating instrument, each type of clock signal and clock of Devices to test output are judged
Whether the difference of the corresponding types clock signal that signal simulation instrument is provided works as judgement in the threshold range of setting
Result is satisfied by required precision when being, to determine each type of clock signal of Devices to test output, no
Then, selection exceeds the clock signal of the threshold range of setting, and the clock signal to the type is individually tested,
On the basis of the clock signal of the type provided by clock signal emulating instrument is provided, the testing time in regulation is judged
Interior, the type clock that the clock signal and clock signal emulating instrument of the type of Devices to test output are provided is believed
Number difference whether setting threshold range in, when it is determined that the difference is in the range of setting, then recognize
For the clock signal of the type of the Devices to test is subject to the interference of other kinds of clock signal, it is necessary to enter one
Step Analysis interference reason, selects the component of higher performance, it is ensured that measuring accuracy is up to standard；Otherwise, then it is assumed that
This type clock signal of Devices to test output is unsatisfactory for required precision, it is necessary to be directed to the clock of the type
Signal carries out accident analysis, it is ensured that the type clock signal meets required precision.
A kind of DCO process of Fig. 4 high accurate clock signals provided in an embodiment of the present invention, this was tested
Journey includes following steps：
S401：At least two testers receive the clock letter of at least two types that the Devices to test is exported
Number.
S402：At least two testers receive at least two types that the clock signal emulating instrument is provided
Standard clock signal.
S403：For each type of clock signal, this kind of standard of comparison clock signal emulating instrument output
Clock signal, and this kind of clock signal to be measured that the Devices to test is exported.
S404：For each type of clock signal, judge whether test result is normal, works as result of determination
During to be, step S405 is carried out, otherwise, carrying out step S406.
S405：According to comparative result, test report is exported.
S406：Close the clock signal of at least one other type in Devices to test and clock signal simulation instrument
Input port, the clock signal to the type of the Devices to test tests.
S407：For the result that the clock signal of this type is individually tested, judge test result whether just
Often, when result of determination is to be, step S408 is carried out, otherwise, carries out step S409.
S408：Determine that the clock signal of the type of the Devices to test is subject to described at least one other
The interference of the clock signal of type, and according to comparative result, export test report.
S409：Determine that the clock signal of described equipment this type to be tested is unsatisfactory for required precision, and root
According to comparative result, test report is exported.
Polytype standard clock signal is provided by clock signal emulating instrument in embodiments of the present invention, is led to
Multiple testers are crossed, it is possible to achieve while measure each type of clock signal of Devices to test output, when going out
When existing test result does not meet the clock signal of required precision, carried out individually by the clock signal to the type
Test, analysis cause this type clock signal it is below standard the reason for, so as to further increase test essence
Degree.
Fig. 5 is high accurate clock signal test system attachment structure example provided in an embodiment of the present invention, such as
Shown in figure, Devices to test can export the clock signal of three types, including：IRIG-B signals,
1PPS+TOD signals and PTP signals, tester A~C are respectively test IRIG-B signals, 1PPS+TOD
The tester of signal and PTP signals, clock signal emulating instrument is using GPS as clock input source, inside
Using caesium clock as oscillator, the standard time clock comprising above-mentioned three types can be exported by logic unit and believed
Number.
IRIG-B signals, 1PPS+TOD signals and PTP signals that tester exports according to Devices to test
Select corresponding tester A~C, and by the different types of output port of the Devices to test and corresponding tester
It is connected, and select IRIG-B signals, 1PPS+TOD signals and the PTP signals of clock signal emulating instrument
Splicing interface is connected with tester A~C respectively, is powered unlatching test program to every tester, and in rule
Every data of tester are recorded in the fixed testing time, after test terminates, test report 1 is exported.
According to the result of test report 1, judge whether every test result of tester meets standard, when
It was found that when the test result of tester C exceedes the scope of regulation, determining the PTP letters of Devices to test output
It is number below standard, the reason in order to further analyze below standard, only by tester C respectively with Devices to test
The PTP signals splicing interface of PTP signal output interfaces and clock signal simulation instrument is connected, and device under test is defeated
The PTP signals for going out individually are tested, within the testing time of regulation, tester C output test report 2,
Judge whether the test result of test report 2 meets standard, when it is determined that test report 2 meets standard, say
The PTP signals of bright Devices to test output meet testing standard in individually test, due to the problem disturbed, when
It is below standard, it is necessary to improve the clock signal of Devices to test output when being used with other kinds of clock signal simultaneously
Jamproof ability, when it is determined that test report 2 does not meet standard, then illustrates that the Devices to test is defeated to each other
There is problem, it is necessary to improve the output accuracy of PTP signals in the PTP signals for going out.
A kind of high accurate clock signal test system and method are the embodiment of the invention provides, the system includes：
Devices to test, clock signal emulating instrument and at least two testers, wherein, the Devices to test output is at least
Two kinds of clock signal；The Devices to test and the clock signal emulating instrument connect corresponding every simultaneously
Platform tester；The clock signal emulating instrument, the standard time clock for providing corresponding at least two type is believed
Number；Every tester, for the every kind of standard clock signal exported according to the clock signal emulating instrument,
And the every kind of clock signal to be measured of correspondence of the Devices to test output, the Devices to test is tested.By
In Devices to test in embodiments of the present invention by the clock signal by least two types are exported and offer
The signal simulation instrument of the standard clock signal of at least two types of correspondence, while the corresponding every test of connection
Instrument, therefore, it can simultaneously measure Devices to test output each type of clock signal, and used by
The identical clock source that signal simulation instrument is provided, so as to improve testing efficiency, it is ensured that measuring accuracy.
Algorithm and display be not intrinsic with any certain computer, virtual system or miscellaneous equipment provided herein
It is related.Various general-purpose systems can also be used together with based on teaching in this.As described above, structure
It is obvious to make the structure required by this kind of system.Additionally, the present invention is not also directed to any certain programmed
Language.It is understood that, it is possible to use various programming languages realize the content of invention described herein, and
The description done to language-specific above is to disclose preferred forms of the invention.
In specification mentioned herein, numerous specific details are set forth.It is to be appreciated, however, that this hair
Bright embodiment can be put into practice in the case of without these details.In some instances, not in detail
Known method, structure and technology are shown, so as not to obscure the understanding of this description.
Similarly, it will be appreciated that in order to simplify the disclosure and help understand one in each inventive aspect or
Multiple, in above to the description of exemplary embodiment of the invention, each feature of the invention is sometimes by one
Rise and be grouped into single embodiment, figure or descriptions thereof.However, should not be by the method for the disclosure
It is construed to reflect following intention：I.e. the present invention for required protection requirement ratio institute in each claim is clear and definite
The more features of feature of record.More precisely, as the following claims reflect, hair
Bright aspect is all features less than single embodiment disclosed above.Therefore, it then follows specific embodiment
Claims be thus expressly incorporated in the specific embodiment, wherein each claim conduct in itself
Separate embodiments of the invention.
Those skilled in the art be appreciated that the module in the equipment in embodiment can be carried out it is adaptive
Change to answering property and they are arranged in one or more equipment different from the embodiment.Can be reality
Apply module or unit or component in example and be combined into a module or unit or component, and in addition can be it
Be divided into multiple submodule or subelement or sub-component.Except in such feature and/or process or unit
It is at least some exclude each other outside, can using any combinations to this specification (including adjoint right will
Ask, make a summary and accompanying drawing) disclosed in all features and so disclosed any method or equipment it is all
Process or unit are combined.Unless expressly stated otherwise, this specification (including adjoint claim,
Summary and accompanying drawing) disclosed in each feature can or similar purpose identical, equivalent by offer alternative features
To replace.
Although additionally, it will be appreciated by those of skill in the art that some embodiments described herein include other
Some included features are rather than further feature, but the combination meaning of the feature of different embodiments in embodiment
Taste and is within the scope of the present invention and is formed different embodiments.For example, in following claim
In book, the one of any of embodiment required for protection mode can use in any combination.
All parts embodiment of the invention can realize with hardware, or with one or more processor
The software module of upper operation is realized, or is realized with combinations thereof.It will be understood by those of skill in the art that
Can be realized using microprocessor or digital signal processor (DSP) in practice according to of the invention real
Apply some or all functions of some or all parts in the high accurate clock signal test system of example.
The present invention be also implemented as some or all equipment for performing method as described herein or
Person's program of device (for example, computer program and computer program product).It is such to realize journey of the invention
Sequence can be stored on a computer-readable medium, or can have the form of one or more signal.This
The signal of sample can be downloaded from internet website and obtained, or be provided on carrier signal, or with any
Other forms are provided.
It should be noted that above-described embodiment the present invention will be described rather than limiting the invention, and
And those skilled in the art can design replacement implementation without departing from the scope of the appended claims
Example.In the claims, any reference symbol being located between bracket should not be configured to claim
Limitation.Word "comprising" does not exclude the presence of element or step not listed in the claims.Positioned at element it
Preceding word "a" or "an" does not exclude the presence of element as multiple.The present invention can be by means of bag
Include the hardware of some different elements and realized by means of properly programmed computer.It is some listing
In the unit claim of device, several in these devices can be come specific by same hardware branch
Embody.The use of word first, second, and third does not indicate that any order.Can be by these word solutions
It is interpreted as title.
Obviously, those skilled in the art can carry out various changes and modification without deviating from this hair to the present invention
Bright spirit and scope.So, if it is of the invention these modification and modification belong to the claims in the present invention and
Within the scope of its equivalent technologies, then the present invention is also intended to comprising these changes and modification.
Claims (10)
1. a kind of high accurate clock signal test system, it is characterised in that the system includes：It is to be measured to set
Standby, clock signal emulating instrument and at least two testers, wherein,
The Devices to test exports the clock signal of at least two types；The Devices to test and the clock are believed
Number emulating instrument connects corresponding every tester simultaneously；
The clock signal emulating instrument, the standard clock signal for providing corresponding at least two type；
Every tester, for the every kind of standard time clock letter exported according to the clock signal emulating instrument
Number, and the every kind of clock signal to be measured of correspondence that the Devices to test is exported, the Devices to test is tested.
2. test system according to claim 1, it is characterised in that every tester, tool
Body is used to be directed to each type of clock signal, this kind of standard time clock letter of comparison clock signal emulating instrument output
Number, and this kind of clock signal to be measured that the Devices to test is exported, and according to comparative result, output test report
Accuse.
3. test system according to claim 1, it is characterised in that the clock signal emulating instrument
Each type of standard time clock is generated by the oscillator of high-precision clock input source and internal high stability
Signal.
4. test system according to claim 3, it is characterised in that the clock signal emulating instrument
High-precision reference signal, base are generated by the oscillator of high-precision clock input source and internal high stability
Each type of standard clock signal is generated by its internal logic unit in the reference signal.
5. test system according to claim 3, it is characterised in that the clock input source includes：
GPS or the Big Dipper；The oscillator includes：Caesium clock or rubidium clock.
6. test system according to claim 1, it is characterised in that the clock signal emulating instrument
Including：The splicing interface of each type of standard clock signal of correspondence.
7. a kind of high accurate clock signal method of testing, it is characterised in that be applied to include Devices to test,
In clock signal emulating instrument and at least two test systems of tester, the Devices to test output at least two
The clock signal of type；The Devices to test and the clock signal emulating instrument connect corresponding every survey simultaneously
Examination instrument；Methods described includes：
Receive the clock signal of at least two types of the Devices to test output；And
Receive the standard clock signal of at least two types that the clock signal emulating instrument is provided；
According to every kind of standard clock signal that the clock signal emulating instrument is exported, and Devices to test output
The every kind of clock signal to be measured of correspondence, the Devices to test is tested.
8. method according to claim 7, it is characterised in that described imitative according to the clock signal
Every kind of standard clock signal of true instrument output, and the every kind of clock to be measured of correspondence of Devices to test output is believed
Number, carrying out test to the Devices to test includes：
For each type of clock signal, this kind of standard time clock letter of comparison clock signal emulating instrument output
Number, and this kind of clock signal to be measured that the Devices to test is exported, and according to comparative result, output test report
Accuse.
9. method according to claim 7, it is characterised in that methods described also includes：
For each type of clock signal, judge whether test result is normal；
If it is not, then closing the clock letter of at least one other type in Devices to test and clock signal simulation instrument
Number input port, the clock signal to the type of the Devices to test tests.
10. method according to claim 9, it is characterised in that methods described also includes：
When the test result of the clock signal of the type to the Devices to test is normal, it is determined that described treat
The clock signal of the type of measurement equipment is subject to disturbing for the clock signal of at least one other type；
When the test result of the clock signal of the type of the Devices to test is abnormal, it is determined that described treat
The clock signal of test equipment is unsatisfactory for required precision.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510771469.XA CN106712922A (en) | 2015-11-12 | 2015-11-12 | High-precision clock signal test system and high-precision clock signal test method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510771469.XA CN106712922A (en) | 2015-11-12 | 2015-11-12 | High-precision clock signal test system and high-precision clock signal test method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106712922A true CN106712922A (en) | 2017-05-24 |
Family
ID=58930117
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510771469.XA Pending CN106712922A (en) | 2015-11-12 | 2015-11-12 | High-precision clock signal test system and high-precision clock signal test method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106712922A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109474442A (en) * | 2017-09-07 | 2019-03-15 | 中国移动通信有限公司研究院 | Log processing method, electronic equipment and storage medium |
| CN110784218A (en) * | 2019-11-11 | 2020-02-11 | 电信科学技术第五研究所有限公司 | Method for rapidly identifying rubidium clock type |
| CN114167829A (en) * | 2021-12-03 | 2022-03-11 | 浙江中控技术股份有限公司 | Clock synchronization test method and device |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2005071426A1 (en) * | 2004-01-19 | 2005-08-04 | Koninklijke Philips Electronics N.V. | Testing of circuits with multiple clock domains |
| CN101567809A (en) * | 2008-04-25 | 2009-10-28 | 中兴通讯股份有限公司 | Test switching device and test system for clock signal expansion test |
| CN102647313A (en) * | 2012-05-14 | 2012-08-22 | 瑞斯康达科技发展股份有限公司 | Network testing system |
| CN104935394A (en) * | 2015-06-26 | 2015-09-23 | 上海市计量测试技术研究院 | Time signal generator and time tester |
-
2015
- 2015-11-12 CN CN201510771469.XA patent/CN106712922A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2005071426A1 (en) * | 2004-01-19 | 2005-08-04 | Koninklijke Philips Electronics N.V. | Testing of circuits with multiple clock domains |
| CN101567809A (en) * | 2008-04-25 | 2009-10-28 | 中兴通讯股份有限公司 | Test switching device and test system for clock signal expansion test |
| CN102647313A (en) * | 2012-05-14 | 2012-08-22 | 瑞斯康达科技发展股份有限公司 | Network testing system |
| CN102647313B (en) * | 2012-05-14 | 2015-08-05 | 瑞斯康达科技发展股份有限公司 | A kind of network test system |
| CN104935394A (en) * | 2015-06-26 | 2015-09-23 | 上海市计量测试技术研究院 | Time signal generator and time tester |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109474442A (en) * | 2017-09-07 | 2019-03-15 | 中国移动通信有限公司研究院 | Log processing method, electronic equipment and storage medium |
| CN110784218A (en) * | 2019-11-11 | 2020-02-11 | 电信科学技术第五研究所有限公司 | Method for rapidly identifying rubidium clock type |
| CN110784218B (en) * | 2019-11-11 | 2023-03-21 | 电信科学技术第五研究所有限公司 | Method for rapidly identifying rubidium clock type |
| CN114167829A (en) * | 2021-12-03 | 2022-03-11 | 浙江中控技术股份有限公司 | Clock synchronization test method and device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102252820B (en) | On-line automatic testing system in production of optical module | |
| US20110286506A1 (en) | User Interface for Signal Integrity Network Analyzer | |
| US20140343883A1 (en) | User Interface for Signal Integrity Network Analyzer | |
| CN106441632B (en) | A kind of detection method of thermometer and the detection device of thermometer | |
| CN105631077A (en) | Integrated circuit with enlarged fault coverage | |
| CN106712922A (en) | High-precision clock signal test system and high-precision clock signal test method | |
| CN201072597Y (en) | Automatic detection instrument for aviation electronic flight instrument | |
| Becejac et al. | Analysis of PMU algorithm errors during fault transients and out-of-step disturbances | |
| CN102854485A (en) | Automated adjustment system for comprehensive multi-parameter electrical measuring instrument and adjustment method | |
| CN101865946B (en) | Alternating current parameter testing system and method of programmable digital integrated circuit | |
| CN104569886B (en) | Signal detection apparatus calibration method based on time and frequency parameter reference instrument mode | |
| CN105067894A (en) | Method and system of testing frequency conversion loss of mixer | |
| CN104502875B (en) | Signal detection apparatus calibration method based on time and frequency parameter standard signal source mode | |
| CN102193029A (en) | Method for measuring short-term frequency stability of unconventional sampling time | |
| CN201796119U (en) | Programmable digital integrated circuit alternating-current parameter testing system | |
| CN103542877A (en) | Method for calibrating aircraft starting box comprehensive inspection tester | |
| CN107329103A (en) | Integrated circuit test system Time Transmission standard group and its method of testing | |
| CN105117334A (en) | XML based test demand description and realization method | |
| CN103308928A (en) | Pseudo-range precision measurement system of satellite navigation signal simulator | |
| CN105891637A (en) | Intelligent substation secondary device testing method and intelligent substation secondary device testing system | |
| CN107907764B (en) | Detection method and system suitable for intelligent characteristic verification of intelligent instrument | |
| CN103200013A (en) | Transponder testing system and transponder testing method | |
| CN106990343B (en) | The test method and system of electronic component | |
| CN109541443A (en) | Real-time clock detection device and method | |
| CN106896309B (en) | Signal processing apparatus and method, signal offset detection system and method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20171114 Address after: 201203 room 5, building 3000, 802 East Dragon Road, Shanghai, Pudong New Area Applicant after: Shanghai Dongtu vision Industrial Technology Co. Ltd. Address before: 201206 building, No. 2, building 1295, new Jinqiao Road, Shanghai, Pudong New Area, 5 Applicant before: Shanghai DIGIGRID Intelligent Technology Co., Ltd. |
|
| TA01 | Transfer of patent application right | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20170524 |
|
| RJ01 | Rejection of invention patent application after publication |