CN106707149A - On-load voltage regulation tapping switch tester - Google Patents
On-load voltage regulation tapping switch tester Download PDFInfo
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- CN106707149A CN106707149A CN201611099343.3A CN201611099343A CN106707149A CN 106707149 A CN106707149 A CN 106707149A CN 201611099343 A CN201611099343 A CN 201611099343A CN 106707149 A CN106707149 A CN 106707149A
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- chip
- resistance
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- voltage switch
- operational amplifier
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
- G01R31/3272—Apparatus, systems or circuits therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M13/00—Testing of machine parts
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention relates to an on-load voltage regulation tapping switch tester, which comprises a PC (personal computer), an ARM processor, a programmable gate array unit, a signal conditioning and sampling circuit, a sampling data memory, a high-voltage switch control circuit, a current sensor and a displacement sensor. The PC is connected with the ARM processor through an Ethernet interface. The ARM processor is connected with the programmable gate array unit through a network interface. The programmable gate array unit is connected with the signal conditioning and sampling circuit and the high-voltage switch control circuit. The programmable gate array unit is connected with the sampling data memory through a photoelectric coupler. The signal conditioning and sampling circuit is respectively connected with the current sensor, the displacement sensor and a high-voltage switch. The high-voltage switch control circuit, the current sensor and the displacement sensor are all connected with the high-voltage switch. The on-load voltage regulation tapping switch tester of the invention is simple and reasonable in structural design. The detection precision and the real-time performance for the mechanical properties of the high-voltage switch are enhanced. Moreover, the circuit is high in reliability and low in cost.
Description
Technical field
The present invention relates to a kind of brake switch tester, and in particular to a kind of on-load tap changer tester.
Background technology
High-voltage switch gear be power plant, transformer station electric equipment in important control and protection equipment, when equipment and circuit
Failure can be quickly cut off when breaking down, it is ensured that no failure part normally runs, play operation protective effect.High-voltage switch gear relies on machine
Tool part completes the action of folding circuit, to ensure high-voltage switch gear safe operation, it is necessary to which the mechanical property to its mechanical part is carried out
Detect, extra display, button etc. of setting carrys out finishing man-machine interaction pattern more than prior art, and this processing mode is not only complicated,
And precision is not high, and detection has certain delay.
The content of the invention
Regarding to the issue above, the present invention proposes a kind of structure design simply, rationally, can strengthen High Voltage Breaker Mechanical Characteristic
The precision and real-time of detection, circuit reliability is high, low cost on-load tap changer tester.
Technical scheme is as follows：
Above-mentioned on-load tap changer tester, including PC, arm processor, programmable gate array unit, signal
Conditioning and sample circuit, sampled data memory, high-voltage switch gear control circuit, current sensor and displacement transducer；The PC
Machine connects arm processor by Ethernet interface；The arm processor connects the programmable gate array list by network interface
Unit；The programmable gate array unit connects the signal condition and sample circuit and is also connected with the high-voltage switch gear control electricity
Road；The programmable gate array unit also connects the sampled data memory by photoelectrical coupler；The signal condition and
Sample circuit connects the current sensor, displacement transducer and high-voltage switch gear respectively；The signal condition and sample circuit with
Switching value data is transmitted between the high-voltage switch gear；The high-voltage switch gear control circuit, current sensor and displacement transducer are equal
It is connected with high-voltage switch gear.
The on-load tap changer tester, wherein：The programmable gate array unit includes stroke AD sampling moulds
Block, voltage AD sampling modules, electric current AD sampling modules, switching value acquisition module, interface module, read-write moderator, Read-write Catrol
Device and external memory storage；The stroke AD sampling modules connect the voltage AD sampling modules, and the voltage AD sampling modules connect
The electric current AD sampling modules are connect, the electric current AD sampling modules connect the switching value acquisition module and by the switching value
Acquisition module connects the high-voltage switch gear control circuit；The stroke AD sampling modules, voltage AD sampling modules and electric current AD are adopted
The equal one end of egf block connects the read-write moderator, and the other end connects the interface module and connects institute by the interface module
State arm processor；The read-write moderator is also respectively connected with the switching value acquisition module, interface module and read-write controller；
The read-write controller is connected with the external memory storage.
The on-load tap changer tester, wherein：The signal condition and sample circuit are by chip U1, resistance
R1~R11, triode Q1~Q2, electric capacity C1~C2 and operational amplifier U2 connection composition；No. 1 pin connection of the chip U1
The colelctor electrode of triode Q2, the base stage of the triode Q2 connects the output of the operational amplifier U2 by the resistance R9
End, the grounded emitter of the triode Q2；No. 2 pins of the chip U1 connect through the resistance R8 ground connection；The electricity
Resistance R10 is for adjustable resistance and including slide plate and a pair of terminals；The one of terminals of resistance R10 connect the triode
The emitter stage of Q1, another terminals ground connection, slide plate connects No. 3 pins of the chip U1；No. 4 pins of the chip U1 connect
The base stage of the triode Q1 is connect, resistance R1 described in the colelctor electrode of the triode Q1 connects No. 8 pins of the chip U1；Institute
Electric capacity C2 one end ground connection is stated, the other end connects No. 4 pins of the chip U1；Described resistance R2 one end connects the chip U1's
No. 1 pin, the other end connects No. 8 pins of the chip U1；No. 5 pins ground connection of the chip U1, No. 6 of the chip U1
Pin is output end, No. 7 pins connection power supply VCC of the chip U1；Resistance R3 one end ground connection, other end connection is described
The in-phase input end of operational amplifier U2；Described resistance R11 one end connects the output end of the operational amplifier U2, and the other end connects
Connect the in-phase input end of the operational amplifier U2；Described resistance R4 one end connects No. 8 pins of the chip U1, and the other end connects
Connect the in-phase input end of the operational amplifier U2；Described resistance R5 one end connects No. 8 pins of the chip U1, and the other end connects
Connect the inverting input of the operational amplifier U2；Described resistance R6 one end connects negative voltage input, and other end connection is described
The inverting input of operational amplifier U2；Described resistance R7 one end connects the inverting input of the operational amplifier U2, another
End is connected the electric capacity C2 and the output end of the operational amplifier U2 is connected by the electric capacity C2.
The on-load tap changer tester, wherein：The model UC1845 of the chip U1, the operation amplifier
The model LM741J of device U2.
The on-load tap changer tester, wherein：Signal condition bag in the signal condition and sample circuit
Include isolation, buffering and amplify.
The on-load tap changer tester, wherein：The high-voltage switch gear control circuit uses A.C. contactor reality
The division of existing DC controling ac circuit, to control the high-voltage switch gear.
Beneficial effect：
On-load tap changer tester structure design of the present invention is simple, reasonable, and it is with arm processor and programmable gate
Array element is lower computer system, and with PC as master system, the disposal ability that has given full play to arm processor 2 is strong, interface
Abundant, systemic software development easily advantage and programmable gate array unit on multichannel data parallel sampling high precision it is excellent
Gesture, enhances the precision and real-time of High Voltage Breaker Mechanical Characteristic detection；Meanwhile, signal condition and sample circuit are by chip
U1, resistance R1~R11, triode Q1~Q2, electric capacity C1~C2 and operational amplifier U2 connection composition, effectively prevent to negative electricity
The cumbersome treatment of sampling is pressed, circuit reliability is improve, cost is reduced.
Brief description of the drawings
Fig. 1 is the structured flowchart of on-load tap changer tester of the present invention；
Fig. 2 is that the programmable gate array unit of on-load tap changer tester of the present invention and arm processor, height are pressed off
Close the connection block diagram between control circuit and high-voltage switch gear；
Fig. 3 is the signal condition of on-load tap changer tester of the present invention and the circuit diagram of sample circuit.
Specific embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Site preparation is described, it is clear that described embodiment is only a part of embodiment of the invention, rather than whole embodiments.It is based on
Embodiment in the present invention, it is every other that those of ordinary skill in the art are obtained under the premise of creative work is not made
Embodiment, belongs to the scope of protection of the invention.
As shown in Figures 1 to 3, it is on-load tap changer tester of the present invention, including PC 1, arm processor 2, programmable
Gate array unit 3, signal condition and sample circuit 4, sampled data memory 5, high-voltage switch gear control circuit 6, current sensor 7
With displacement transducer 8.
The PC is master system, and it connects arm processor 2 by Ethernet interface.
The arm processor 2 and programmable gate array unit 3 are master system；Wherein, the arm processor 2 passes through Bank
Interface connection programmable gate array unit 3.
The programmable gate array unit 3 is also respectively connected with signal condition and sample circuit 4 and high-voltage switch gear control circuit 6；
The programmable gate array unit 3 also connects sampled data memory 5 by photoelectrical coupler, and addition photoelectrical coupler can to isolate
Electrical connection between programming gate array unit 3 and sampled data memory 5.Wherein, the programmable gate array unit 3 includes row
Journey AD sampling modules 31, voltage AD sampling modules 32, electric current AD sampling modules 33, switching value acquisition module 34, interface module 35,
Read-write moderator 36, read-write controller 37 and external memory storage 38；The trip AD sampling modules 31 connect voltage AD sampling modules
The connection electric current AD of 32, the voltage AD sampling module 32 sampling modules 33, the connecting valve amount of electric current AD sampling modules 33 collection mould
Block 34 simultaneously connects high-voltage switch gear control circuit 6 by switching value acquisition module 34；The trip AD sampling modules 31, voltage AD are sampled
Module 32 and the equal one end of electric current AD sampling modules 33 connection read-write moderator 36, other end connection interface module 35 simultaneously pass through interface
Module 35 connects arm processor 2；The read-write moderator 36 is also respectively connected with switching value acquisition module 34, interface module 35 and reads
Writing controller 37；The read-write controller 37 is connected with external memory storage 38.
The signal condition and sample circuit 4 connect current sensor 7, displacement transducer 8 and high-voltage switch gear 9 respectively；Wherein,
Switching value data is transmitted between the signal condition and sample circuit 4 and high-voltage switch gear 9；In the signal condition and sample circuit 4
Signal condition includes isolation, buffering and amplifies.
High-voltage switch gear control circuit 6, current sensor 7 and displacement transducer 8 are connected with high-voltage switch gear 9；Wherein, should
High-voltage switch gear controls circuit 6 before closing operation, is alternating current generator to the motor that spring operation carries out energy storage；The height is pressed off
Control circuit 6 is closed using sensitivity is high, control power is low and electromagnetic interference is small A.C. contactor realizes DC controling ac electricity
The division on road is controlling high-voltage switch gear 9.
The signal condition and sample circuit 4 be by chip U1, resistance R1~R11, triode Q1~Q2, electric capacity C1~C2 and
Operational amplifier U2 connection compositions；Wherein, chip U1 model UC1845, operational amplifier U2 models LM741J.Should
No. 1 colelctor electrode of pin connecting triode Q2 of chip U1, the base stage connection resistance R9 of triode Q2 is simultaneously connected by resistance R9
The output end of operational amplifier U2 is connect, the grounded emitter of triode Q2；No. 2 pins connection resistance R8 of chip U1 simultaneously leads to
Cross resistance R8 ground connection；Resistance R10 is for adjustable resistance and including a pair of terminals and slide plate；The one of wiring of resistance R10
Hold the emitter stage of connecting triode Q1, another terminals ground connection, No. 3 pins of slide plate connection chip U1；No. 4 of chip U1
The base stage of pin connecting triode Q1, the colelctor electrode connection resistance R1 of triode Q1 simultaneously connects the 8 of chip U1 by resistance R1
Number pin；Electric capacity C2 one end is grounded, No. 4 pins of other end connection chip U1；Resistance R2 one end connects No. 1 of chip U1
Pin, No. 8 pins of other end connection chip U1；No. 5 pins ground connection of chip U1, No. 6 pins are output end, No. 7 pins
Connection power supply VCC；Resistance R3 one end is grounded, the in-phase input end of other end concatenation operation amplifier U2；Resistance R11 one end
The output end of concatenation operation amplifier U2, the in-phase input end of other end concatenation operation amplifier U2；Resistance R4 one end connects
No. 8 pins of chip U1, the in-phase input end of other end concatenation operation amplifier U2；Resistance R5 one end connects the 8 of chip U1
Number pin, the inverting input of other end concatenation operation amplifier U2；Resistance R6 one end connects negative voltage input, the other end
The inverting input of concatenation operation amplifier U2；The inverting input of resistance R7 one end concatenation operation amplifiers U2, the other end
Connection electric capacity C2 and the output end for passing through electric capacity C2 concatenation operation amplifiers U2.
Wherein, such as Fig. 3, when control source terminal voltage reduces, i.e. output loading reduces, and when output current increases, computing is put
The current potential of the inverting input of big device U2 is raised, after being compared with the reference voltage of operational amplifier U2 in-phase input ends, fortune
The current potential reduction of amplifier U2 output ends is calculated, causes No. 1 pin voltage of chip U1 to increase, i.e., chip U1 No. 6 pin is defeated
Go out the pulsewidth increase of pulse；When the increase of control source terminal voltage, i.e. output loading increase, when output current reduces, operation amplifier
The current potential reduction of the inverting input of device U2, after being compared with the reference voltage of operational amplifier U2 in-phase input ends, computing
The current potential of amplifier U2 output ends is raised, and causes No. 1 pin voltage of chip U1 to reduce, i.e. the output of chip U1 No. 6 pin
The pulsewidth of pulse reduces.
Operation principle of the invention：
External storage is arrived in the semaphore storage that present invention needs gather multi-channel analog and data signal amount and will gather simultaneously
In device 38, programmable gate array unit 3 is articulated in the Bank interfaces of arm processor 2, and arm processor 2 passes through read-write interface module
35 realize the communication of same programmable gate array unit 3；Interface module 35 needs to complete the read-write sequence of arm processor 2 and order
Parsing；After arm processor 2 is to the write-in point of interface module 35/combined floodgate order, peripheral circuit is driven to perform by interface module 35
High-voltage switch gear point/feed motion, and monitoring point/closing coil it is powered after send sample request signal immediately and adopted to stroke AD
Egf block 31, voltage AD sampling modules 32 and electric current AD sampling modules 33；Stroke AD sampling modules 31, voltage AD sampling modules 32
With electric current AD sampling modules 33 response will be carried out to sample request signal.To improve the utilization rate of external memory storage 38, reduction can be compiled
Journey gate array unit 3 reads and writes the number of times of external memory storage 38, twice or repeatedly AD sampled values will merge into one group of 32bit according to sending again
A write request of external memory storage 38 is initiated to read-write arbitrator module, because the read-write of external memory storage 38 client is more and same
Time can only process and once read or write request, so needs are arbitrated by reading and writing moderator 36, will be asked after the completion of arbitration,
Read-write Catrol, 37, the responsible read-write operation completed to external memory storage 38 of read-write controller 37 are given in address, data；Point/close a floodgate
Action completes post-sampling also by certain time, to ensure switch movable contact stabilization, after sampling is properly completed, interface module 35
Interruption will be sent out to arm processor 2, arm processor 2 gives PC after sampled data encapsulation will be read from external memory storage 38
Machine 1 is processed.
Structure design of the present invention is simple, reasonable, can strengthen the precision and real-time of High Voltage Breaker Mechanical Characteristic detection, circuit
Reliability is high, low cost, is suitable to promote and application.
Claims (6)
1. a kind of on-load tap changer tester, it is characterised in that：The brake switch tester include PC, arm processor,
Programmable gate array unit, signal condition and sample circuit, sampled data memory, high-voltage switch gear control circuit, current sense
Device and displacement transducer；
The PC connects arm processor by Ethernet interface；
The arm processor connects the programmable gate array unit by network interface；
The programmable gate array unit connects the signal condition and sample circuit and is also connected with the high-voltage switch gear control electricity
Road；The programmable gate array unit also connects the sampled data memory by photoelectrical coupler；
The signal condition and sample circuit connect the current sensor, displacement transducer and high-voltage switch gear respectively；The letter
Number conditioning and sample circuit and the high-voltage switch gear between transmit switching value data；
The high-voltage switch gear control circuit, current sensor and displacement transducer are connected with high-voltage switch gear.
2. on-load tap changer tester as claimed in claim 1, it is characterised in that：The programmable gate array unit
Including stroke AD sampling modules, voltage AD sampling modules, electric current AD sampling modules, switching value acquisition module, interface module, read-write
Moderator, read-write controller and external memory storage；
The stroke AD sampling modules connect the voltage AD sampling modules, and the voltage AD sampling modules connect the electric current AD
Sampling module, the electric current AD sampling modules are connected the switching value acquisition module and are connected by the switching value acquisition module
The high-voltage switch gear controls circuit；
The stroke AD sampling modules, voltage AD sampling modules and electric current AD sampling modules equal one end connection read-write arbitration
Device, the other end connects the interface module and connects the arm processor by the interface module；The read-write moderator is also
The switching value acquisition module, interface module and read-write controller are connected respectively；The read-write controller and the external storage
Device is connected.
3. on-load tap changer tester as claimed in claim 1, it is characterised in that：The signal condition and sampling electricity
Road is made up of chip U1, resistance R1~R11, triode Q1~Q2, electric capacity C1~C2 and operational amplifier U2 connection；
No. 1 colelctor electrode of pin connecting triode Q2 of the chip U1, the base stage of the triode Q2 passes through the resistance R9
Connect the output end of the operational amplifier U2, the grounded emitter of the triode Q2；No. 2 pins connection of the chip U1
It is grounded by the resistance R8；
The resistance R10 is for adjustable resistance and including slide plate and a pair of terminals；The one of terminals connections of resistance R10
The emitter stage of the triode Q1, another terminals ground connection, slide plate connects No. 3 pins of the chip U1；The chip U1
No. 4 pins connect the base stage of the triode Q1, resistance R1 described in the colelctor electrode of the triode Q1 connects the chip U1
No. 8 pins；Electric capacity C2 one end ground connection, the other end connects No. 4 pins of the chip U1；Resistance R2 one end connection
No. 1 pin of the chip U1, the other end connects No. 8 pins of the chip U1；No. 5 pins ground connection of the chip U1, institute
No. 6 pins of chip U1 are stated for output end, No. 7 pins connection power supply VCC of the chip U1；Resistance R3 one end ground connection,
The other end connects the in-phase input end of the operational amplifier U2；Described resistance R11 one end connects the operational amplifier U2's
Output end, the other end connects the in-phase input end of the operational amplifier U2；Described resistance R4 one end connects the 8 of the chip U1
Number pin, the other end connects the in-phase input end of the operational amplifier U2；Described resistance R5 one end connects the 8 of the chip U1
Number pin, the other end connects the inverting input of the operational amplifier U2；Described resistance R6 one end connects negative voltage input,
The other end connects the inverting input of the operational amplifier U2；Described resistance R7 one end connects the anti-of the operational amplifier U2
Phase input, the other end is connected the electric capacity C2 and the output end of the operational amplifier U2 is connected by the electric capacity C2.
4. on-load tap changer tester as claimed in claim 3, it is characterised in that：The model of the chip U1
UC1845, the model LM741J of the operational amplifier U2.
5. the on-load tap changer tester as described in claim 1 or 3, it is characterised in that：The signal condition and adopt
Signal condition in sample circuit includes isolation, buffering and amplifies.
6. on-load tap changer tester as claimed in claim 1, it is characterised in that：The high-voltage switch gear controls circuit
The division of DC controling ac circuit is realized using A.C. contactor, to control the high-voltage switch gear.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611099343.3A CN106707149A (en) | 2016-12-02 | 2016-12-02 | On-load voltage regulation tapping switch tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611099343.3A CN106707149A (en) | 2016-12-02 | 2016-12-02 | On-load voltage regulation tapping switch tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106707149A true CN106707149A (en) | 2017-05-24 |
Family
ID=58934584
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201611099343.3A Pending CN106707149A (en) | 2016-12-02 | 2016-12-02 | On-load voltage regulation tapping switch tester |
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| Country | Link |
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| CN (1) | CN106707149A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107728046A (en) * | 2017-07-04 | 2018-02-23 | 合肥合大智能科技有限公司 | A kind of stacked switch electrical property detector |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN204177564U (en) * | 2014-10-27 | 2015-02-25 | 武汉国试电气设备有限公司 | A kind of High Voltage Breaker Mechanical Characteristic test macro |
| CN104483626A (en) * | 2014-12-30 | 2015-04-01 | 成都恒锐智科数字技术有限公司 | Device and system for testing characteristics of transformer on-load tap-changer |
| CN204613300U (en) * | 2015-05-25 | 2015-09-02 | 国网山东省电力公司枣庄供电公司 | A kind of power acquirer |
| CN204631108U (en) * | 2015-05-29 | 2015-09-09 | 林敏� | A kind of negative voltage sample circuit |
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2016
- 2016-12-02 CN CN201611099343.3A patent/CN106707149A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN204177564U (en) * | 2014-10-27 | 2015-02-25 | 武汉国试电气设备有限公司 | A kind of High Voltage Breaker Mechanical Characteristic test macro |
| CN104483626A (en) * | 2014-12-30 | 2015-04-01 | 成都恒锐智科数字技术有限公司 | Device and system for testing characteristics of transformer on-load tap-changer |
| CN204613300U (en) * | 2015-05-25 | 2015-09-02 | 国网山东省电力公司枣庄供电公司 | A kind of power acquirer |
| CN204631108U (en) * | 2015-05-29 | 2015-09-09 | 林敏� | A kind of negative voltage sample circuit |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107728046A (en) * | 2017-07-04 | 2018-02-23 | 合肥合大智能科技有限公司 | A kind of stacked switch electrical property detector |
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Application publication date: 20170524 |
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