CN106653563A - Guide groove guide-in structure of wafer edge processing apparatus - Google Patents

Guide groove guide-in structure of wafer edge processing apparatus Download PDF

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Publication number
CN106653563A
CN106653563A CN201610867074.4A CN201610867074A CN106653563A CN 106653563 A CN106653563 A CN 106653563A CN 201610867074 A CN201610867074 A CN 201610867074A CN 106653563 A CN106653563 A CN 106653563A
Authority
CN
China
Prior art keywords
guide
guide groove
wafer
processing apparatus
groove
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
CN201610867074.4A
Other languages
Chinese (zh)
Inventor
吕耀安
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
WUXI HI-NANO TECHNOLOGY Co Ltd
Original Assignee
WUXI HI-NANO TECHNOLOGY Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by WUXI HI-NANO TECHNOLOGY Co Ltd filed Critical WUXI HI-NANO TECHNOLOGY Co Ltd
Priority to CN201610867074.4A priority Critical patent/CN106653563A/en
Publication of CN106653563A publication Critical patent/CN106653563A/en
Withdrawn legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02082Cleaning product to be cleaned
    • H01L21/02087Cleaning of wafer edges
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67023Apparatus for fluid treatment for general liquid treatment, e.g. etching followed by cleaning
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67057Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67745Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber characterized by movements or sequence of movements of transfer devices

Abstract

The invention relates to a guide groove guide-in structure of a water edge processing apparatus. The structure comprises a guide groove plate arranged at the upper part of a cleaning sink. The guide groove plate is provided with a plurality of parallel guide grooves. Among the guide grooves, a plurality of guide-in grooves are arranged at intervals with the guide-in grooves in the adjacent guide grooves in staggered layout. According to the invention, the specialized device for cleaning and processing a wafer edge adopts a guide groove plate structure which enables a wafer to be guided into the cleaning sink conveniently and rapidly. The structure can be conveniently used and achieves high efficiency.

Description

The guide groove guiding structure of wafer edge processing apparatus
Technical field
The present invention relates to the processing equipment in IC processing equipment field, more particularly to wafer.
Background technology
Using traditional cleaning equipment can advantageously cleaning wafer front and back pollution, but crystal round fringes Especially the pollution of chamfered region is usually ignored or to remove difficulty larger.
The content of the invention
For the problems referred to above that prior art is present, applicant is studied and is designed, there is provided a kind of wafer edge The guide groove guiding structure of reason device, is exclusively used in the cleaning treatment at wafer edge, its rational in infrastructure, easy to use, low cost.
In order to solve the above problems, the present invention adopts following scheme:
A kind of guide groove guiding structure of wafer edge processing apparatus, including the guide channel plate being installed on above service sink, institute State guide channel plate and be provided with a plurality of parallel guide groove, multiple lead-in grooves, leading in adjacent guide groove are arranged at intervals with the guide groove To enter be staggeredly arranged between groove.
As the further improvement of above-mentioned technical proposal:
Diameter of the width of the lead-in groove more than wafer.
The method have technical effect that:
The present invention is exclusively used in the cleaning treatment equipment at wafer edge, using guide channel plate structure, can easily and quickly by Wafer is directed in service sink, its easy to use, efficiency high.
Description of the drawings
Fig. 1 is the structural representation of the present invention.
Fig. 2 is the layout drawing of rinse bath in the present invention.
In figure:1st, guide channel plate;2nd, guide groove;3rd, lead-in groove;4th, wafer.
Specific embodiment
The specific embodiment of the present invention is described further below in conjunction with the accompanying drawings.
As shown in Figure 1 and Figure 2, the guide groove guiding structure of the wafer edge processing apparatus of the present embodiment is clear including being installed on Guide channel plate 1 above wash pool, guide channel plate 1 is provided with a plurality of parallel guide groove 2, and multiple lead-in grooves 3 are arranged at intervals with guide groove 2, It is staggeredly arranged between lead-in groove 3 in adjacent guide groove 2.Wherein, diameter of the width of lead-in groove 3 slightly larger than wafer 4, it is ensured that Wafer 4 can smoothly fall.When using, wafer 4 is inserted in guide groove 2 from one end of guide channel plate 1, wafer 4 is rolled During to lead-in groove 3, during the service sink (not shown) of lower section is fallen to from lead-in groove 3.
Embodiment provided above is the better embodiment of the present invention, only for the convenient explanation present invention, not to this It is bright to make any pro forma restriction, any those of ordinary skill in the art, if putting forward skill without departing from the present invention In the range of art feature, using the Equivalent embodiments locally changed done by disclosed technology contents or modify, and Without departing from the technical characteristic content of the present invention, still fall within the range of the technology of the present invention feature.

Claims (2)

1. a kind of guide groove guiding structure of wafer edge processing apparatus, it is characterised in that:Including being installed on above service sink Guide channel plate (1), the guide channel plate (1) is provided with a plurality of parallel guide groove (2), and in the guide groove (2) multiple leading is arranged at intervals with Enter groove (3), be staggeredly arranged between the lead-in groove (3) in adjacent guide groove (2).
2. the guide groove guiding structure of wafer edge processing apparatus according to claim 1, it is characterised in that:The importing Diameter of the width of groove (3) more than wafer (4).
CN201610867074.4A 2016-09-29 2016-09-29 Guide groove guide-in structure of wafer edge processing apparatus Withdrawn CN106653563A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610867074.4A CN106653563A (en) 2016-09-29 2016-09-29 Guide groove guide-in structure of wafer edge processing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610867074.4A CN106653563A (en) 2016-09-29 2016-09-29 Guide groove guide-in structure of wafer edge processing apparatus

Publications (1)

Publication Number Publication Date
CN106653563A true CN106653563A (en) 2017-05-10

Family

ID=58854698

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610867074.4A Withdrawn CN106653563A (en) 2016-09-29 2016-09-29 Guide groove guide-in structure of wafer edge processing apparatus

Country Status (1)

Country Link
CN (1) CN106653563A (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050153557A1 (en) * 2004-01-12 2005-07-14 Chan-Woo Cho Apparatus and method for treating susbtrates

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050153557A1 (en) * 2004-01-12 2005-07-14 Chan-Woo Cho Apparatus and method for treating susbtrates

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PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
WW01 Invention patent application withdrawn after publication
WW01 Invention patent application withdrawn after publication

Application publication date: 20170510