CN106650110B - Method for grouping measurement of analog waveform - Google Patents
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Abstract
A method of performing a packet measurement on an analog waveform, comprising the steps of: determining a reference waveform from the analog waveform; determining a reference point of the reference waveform according to the measurement type; calculating a measurement value of the reference waveform according to the reference point; determining corresponding reference points of other waveforms according to the principle that the distance is the closest and the trend is the same; and calculating the measurement values of the other waveforms according to the corresponding reference points. The invention has the advantages that: the reference points can be selected according to different measuring modes, basic ideas are consistent, but specific implementation methods are different, so that the method is applicable to various measuring types; in addition, the method also allows the setting of the measurement position and the specific signal threshold value, is very flexible, can meet various requirements of different users, and therefore has good expandability and practicability.
Description
Technical Field
The invention relates to the field of computer aided design of integrated circuits, in particular to a method for measuring an analog waveform.
Background
In the design of an integrated circuit, after a waveform is generated in a simulation process, various attribute values representing circuit features in the waveform are generally required to be calculated to verify the correctness of a simulation result, and a variety of measurement (Measure) methods are used in the process. For example, a set of waveforms with similar characteristics is generated after simulation is finished through a plurality of netlists generated by a Corner analysis (Multi-Corner) function of a circuit design tool, and how to accurately obtain the slight difference between the waveforms is a great problem to be solved in a waveform display (Viewer).
The waveform display is a tool for displaying the characteristics of the waveform signal, such as the numerical value, the shape and the like, and can also check the local details of the waveform through various measurement operations (such as displaying the X value, the Y value, the slope and the like) so as to verify whether the simulation result meets the requirements, and is one of the essential tools in the field of circuit design.
When a user uses the angle analysis function of the circuit design tool, a plurality of Netlist files (netlists) are generated according to different types of model information set, and simulation is sequentially performed. After the simulation is finished, the user needs the waveform display to provide functions of measuring and calculating a set of signals, such as Period (Period), Frequency (Frequency), Duty Cycle (Duty Cycle), pulse Width (Width), Time Width (noise/Fall Time), slope (slope Rate), and the like, and wants the waveform display to display a distribution graph of the measurement results.
For most measurement calculations, based on a single waveform, there are well defined and well established methods and are therefore easy to implement. However, grouping multiple waveforms into a group involves selecting a reference waveform and calculating measurements of other waveforms based thereon. In the simulation process, to compare the subtle differences between a set of similar waveforms quickly and accurately, Group Measure (Group Measure) is a very practical function.
Currently, in the field of integrated circuit simulation, waveform displays are more commonly used: CustomWaveView from Synopsys, WaveScan from Cadence, and SmartView from Silvaco. However, for the grouped measurement function of multiple analog waveforms, many waveform displays are still in the exploration phase. Therefore, a method for performing packet measurement on analog waveforms is proposed, which is a problem to be solved urgently.
Disclosure of Invention
In order to solve the defects of the prior art, the invention aims to provide a method for performing grouping measurement on analog waveforms, which can quickly and accurately calculate a group of measurement results and enhance the usability of a waveform display (Viewer).
In order to achieve the above object, the present invention provides a method for performing a packet measurement on an analog waveform, comprising the following steps:
1) determining a reference waveform from the analog waveform; 2) determining a reference point of the reference waveform according to the measurement type; 3) calculating a measurement value of the reference waveform according to the reference point; 4) determining corresponding reference points of other waveforms according to the principle that the distance is the closest and the trend is the same; 5) and calculating the measurement values of the other waveforms according to the corresponding reference points.
Further, the number of the reference waveforms is one.
Further, the step 1) further includes determining a waveform closest to the position in the analog waveform according to the position clicked by the mouse, and using the waveform as the reference waveform.
Further, the measurement types in the step 2) include: first, period, frequency and duty cycle; second, pulse width; and third, temporal width and slope.
Further, when the measurement type is the first type, period, frequency and duty ratio, a threshold point closest to a position where a mouse is clicked is selected as the reference point in the reference waveform.
Further, when the measurement type is the second type, pulse width, the position clicked by a mouse is selected as the reference point.
Further, when the measurement type is the third type, time width and slope, a low threshold point and a high threshold point closest to a position of a mouse click are selected as the reference points in the reference waveform.
Further, the step 3) of calculating the measurement value of the reference waveform is to select two left and right threshold points closest to the reference point in the reference waveform; and calculating the period, the frequency and the duty ratio of the reference waveform according to the difference value of the x values of the two threshold points.
Further, the step 3) of calculating the measurement value of the reference waveform is to select two left and right threshold points closest to the reference point in the reference waveform, and then calculate the pulse width of the reference waveform according to the difference between the x values of the two threshold points.
Further, the step 3) of calculating the measurement value of the reference waveform is to select a first reference point and a second reference point in the reference waveform, and then calculate the time width and the slope of the reference waveform according to the difference between the x values of the two reference points.
The step 4) further includes taking a threshold point, which has the same trend with the reference point of the reference waveform and is closest to the reference point of the reference waveform, in the other waveforms as the corresponding reference points of the other waveforms.
The step 4) further includes calculating a middle point of the two threshold points according to x values of the two threshold points in the reference waveform, and using the middle point as a corresponding reference point of the other waveform.
The step 4) further comprises that the trend of the first reference point of the other waveforms is the same as that of the reference waveform, and the threshold point which is closest to the first reference point of the reference waveform is used as the first corresponding reference point of the other waveforms; and taking a threshold point which has the same trend with a second reference point of the reference waveform and is closest to the second reference point of the reference waveform in the other waveforms as a second corresponding reference point of the other waveforms.
Further, the step 5) of calculating the measurement values of the other waveforms is to select two left and right threshold points closest to the corresponding reference points in the other waveforms; and calculating the period, the frequency and the duty ratio of the other waveforms according to the difference value of the x values of the two threshold points.
Further, the step 5) of calculating the measurement values of the other waveforms is to select a first threshold point which is closest to the corresponding reference point and has the same trend as a left threshold point in the reference waveform on the left side of the corresponding reference point in the other waveforms; selecting a second threshold point which is closest to the corresponding reference point and has the same trend as the right threshold point in the reference waveform on the right side of the corresponding reference point; and calculating the pulse widths of the other waveforms according to the difference value of the x values of the first threshold point and the second threshold point.
Further, the step 5) of calculating the measurement values of the other waveforms is to select a first corresponding reference point and a second corresponding reference point from the other waveforms, and then calculate the time widths and the slopes of the other waveforms according to the difference between the x values of the two corresponding reference points.
The invention has the advantages that: the reference points can be selected according to different measuring modes, basic ideas are consistent, but specific implementation methods are different, so that the method is applicable to various measuring types; in addition, the method also allows the setting of the measurement position and the specific signal threshold value, is very flexible, can meet various requirements of different users, and therefore has good expandability and practicability.
The invention provides a method for performing grouping measurement on analog waveforms in a waveform display, which aims at a plurality of waveforms generated by analog circuit simulation. The method has the characteristics of simplicity and clarity, and can quickly and accurately calculate a group of measurement results, thereby enhancing the usability of the waveform display. The measurement functions commonly used in waveform displays include, but are not limited to, Period (Period), Frequency (Frequency), Duty Cycle (Duty Cycle), pulse Width (Width), Time Width (ratio/Fall Time), and slope (slope Rate). The method can be used for checking the main characteristics of the waveform and quickly and effectively verifying the simulation result of the circuit.
The method for measuring the analog waveform in groups can quickly and effectively complete the measurement of the same characteristic value of a group of signals, and has very accurate results on several commonly used measurement functions such as duty ratio, pulse width, time width and the like. The method is particularly suitable for grouping measurement of a plurality of analog waveforms in a waveform display and detecting small differences among a group of waveforms with similar characteristics. In practical engineering application, the method can be combined with a graphical interface of a waveform display to show the difference through a table and a histogram, and greatly facilitates the verification of a designer on a simulation result.
Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.
Drawings
The accompanying drawings are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention and not to limit the invention. In the drawings:
FIG. 1 is a flow chart of a method of performing a group measurement on an analog waveform according to the present invention;
fig. 2 is a schematic diagram of the principle of periodic measurement of the packet measurement method according to the present invention;
fig. 3 is a schematic diagram of the pulse width measurement principle of the packet measurement method according to the present invention.
Detailed Description
The preferred embodiments of the present invention will be described in conjunction with the accompanying drawings, and it will be understood that they are described herein for the purpose of illustration and explanation and not limitation.
Fig. 1 is a flowchart of a method for performing a grouping measurement on an analog waveform according to the present invention, and the method for performing a grouping measurement on an analog waveform according to the present invention will be described in detail with reference to fig. 1.
In step 101, determining a reference waveform from the analog waveforms according to the mouse click position;
in the step, according to the position clicked by the mouse, determining a waveform closest to the position in the analog waveform through calculation, and taking the waveform as a unique reference waveform;
at step 102, selecting a reference point according to the measurement type;
in this step, the reference point of the reference waveform is determined according to the specific content and manner of measurement. Wherein, the measurement types are divided into three types: first, Period (Period), Frequency (Frequency), and Duty Cycle (Duty Cycle); second, pulse Width (Width); third, Time width (Raise/Fall Time) and slope (Slew Rate). Specifically, the present step further comprises:
when the measurement type is a first type, period, frequency and duty ratio, selecting a threshold point closest to the position clicked by a mouse in a reference waveform as a reference point;
when the measurement type is the second type and the pulse width is high, selecting the position clicked by a mouse as a reference point;
when the measurement type is the third type, time width and slope, in the reference waveform, the low threshold point and the high threshold point closest to the position of the mouse click are selected together as the reference point.
In step 103, calculating a measurement value of a reference waveform according to the reference point;
in step 104, according to the principle that the distance is the closest and the trend is the same, determining corresponding reference points of other waveforms; the method further comprises the following steps:
taking a threshold point which has the same trend and is closest to the reference point of the reference waveform in other waveforms as a corresponding reference point of other waveforms;
taking the middle point of the left and right threshold points in the reference waveform as the corresponding reference point of other waveforms;
and taking the threshold point which has the same trend with the first reference point in the reference waveform and is closest to the other waveforms and the threshold point which has the same trend with the second reference point in the reference waveform and is closest to the second reference point in the other waveforms as the corresponding reference points of the other waveforms.
In step 105, the measured values of the other waveforms are calculated from the corresponding reference points.
The invention has the advantages that: the reference points can be selected according to different measuring modes, basic ideas are consistent, but specific implementation methods are different, so that the method is applicable to various measuring types; in addition, the method also allows the setting of the measurement position and the specific signal threshold value, is very flexible, can meet various requirements of different users, and therefore has good expandability and practicability.
The technical solution of the present invention is described in detail below with reference to specific examples. In the waveforms in the examples below: the y (vertical) direction is the magnitude and the x (horizontal) direction is the time.
Example one
A method of grouping measurement of Period (Period), wherein Period refers to a Period of a waveform.
Fig. 2 is a schematic diagram of the principle of periodic measurement of the packet measurement method according to the present invention. In this embodiment, the analog waveform includes: waveform1, Waveform2, and other waveforms not shown. Before calculating the period value of the waveform, a threshold value in the y direction needs to be preset for determining the intermediate time point, and based on the intermediate time point, the starting time point is calculated, and then the period is calculated. As shown in fig. 2, a value Level1 is used as a threshold value in the y direction set by the Waveform1, and a value Level2 is used as a threshold value in the y direction set by the Waveform 2. And the trend of the predefined points is divided into three states: rise, fall, and flat (i.e., no change).
The Group Measure process of Period is as follows:
(1) point PM is the location of the mouse click with Waveform1 as the reference Waveform.
(2) On the Waveform1, a point is found which is closest to the point PM, the y-value of which must be equal to the given threshold Level1, and which is named P12. The point P12 is the key point for computing Period and is also the reference point for the Waveform 1.
(3) On the Waveform1, to the left of the point P12, the first point with a y value equal to a given threshold Level1 is found by calculation, and this point is named P11. Similarly, on Waveform1, to the right of point P12, the first point found to be equal to a given threshold Level1 is named P13. The distance between the point P11 and the point P13 on the x axis is a Period of the Waveform1 closest to the point PM, and is a Period value of the Waveform1, which is denoted as Period 1.
(4) The x value and trend for point P12 are recorded. In fig. 2, the point P12 is trending downward.
(5) On Waveform2, the point closest to point P12 is found by calculation, which must satisfy ① that the y value of this point must be equal to a given threshold Level2, ② that the trend of this point must be the same as that of point P12, obviously, among several points having the same trend as point P12, point P22 is the point that satisfies all the requirements, also the reference point of Waveform2, due to the distances S2< S1 and S2< S3.
(6) On the Waveform2, with the point P22 as the middle point, in a similar manner to the method in step (3), the first threshold value found on the left side and the right side of the point P22 is the point P21 and the point P23 of the Level2, respectively. The distance between the point P21 and the point P23 on the x-axis is the Period value of the Waveform Waveform2 with the Waveform Waveform1 as the reference Waveform, and is denoted as Period 2.
(7) If other waveforms exist, repeating the steps (5) to (6) to obtain corresponding period values.
Of course, in the present embodiment, only the measurement of Period itself is given, and the measurement related to Period, such as Frequency and Duty Cycle, can be obtained by the same or similar method. Wherein, Frequency refers to Frequency, and the value of Frequency is the reciprocal of Period value. Duty Cycle, meaning Duty Cycle, refers to the percentage of a period of a waveform that is greater than a given threshold.
Example two
A grouping measurement method of pulse Width (Width), wherein Width is the pulse Width of a measurement signal.
Fig. 3 is a schematic diagram of the pulse width measurement principle of the packet measurement method according to the present invention. In this embodiment, the analog waveform includes: waveform1, Waveform2, and other waveforms not shown. Before calculating the pulse width of the waveform, a threshold value in the y direction is set to determine the start time of the pulse, and then the pulse width is calculated. As shown in fig. 3, a value Level1 is used as a threshold value in the y direction set by the Waveform1, and a value Level2 is used as a threshold value in the y direction set by the Waveform 2. And the trend of the predefined points is divided into three states: rise, fall, and flat (i.e., no change).
The Group Measure process for Width is as follows:
(1) point PM is the location of the mouse click with Waveform1 as the reference Waveform. And the point PM is the reference point of the Waveform 1.
(2) On the Waveform1, a point is found which is closest to the point PM, the y-value of which must be equal to the given threshold Level1, and which is named P12.
(3) On the Waveform1, since the point P12 is on the right side of the point PM, and only two points are required to measure Width, another point must be on the left side of the point PM, and the y value of the point must be equal to the threshold Level 1. The left satisfactory point is designated P11. The distance between the point P11 and the point P12 on the x axis is the Width value of the Waveform Waveform1 closest to the point PM, and is recorded as Width 1.
(4) The x values and trends of point P11 and point P12 were recorded and their median PS1, which is the reference point for Waveform2, was calculated. In fig. 3, the trend of the point P11 is rising, and the trend of the point P12 is falling.
(5) On Waveform2, a point closest to point PS1 is found by calculation and must satisfy the condition that ① y must be equal to threshold Level2, ② if the point is to the left of point PS1, the trend must be the same as point P11, if the point is to the right of point PS1, the trend must be the same as point P12, ③ the x value of the point must be within the x interval of point P11 and point P12, because the distance S2< S1 and S2< S3, i.e., the distance corresponding to point P21 is the smallest, in addition, point P21 is to the left of point PS1, and the trend is the same as point P11, both are ascending.
(6) On Waveform2, since point P21 is to the left of point PS1, another point must be to the right of point PS 1. By calculation, to the right of the point PS1, the first y value found is equal to the threshold Level2 and the point with the same trend as the point P12, i.e., point P22. The distance between the point P21 and the point P22 on the x axis is the Width value of the Waveform Waveform2 with the Waveform Waveform1 as a reference Waveform, and is marked as Width 2.
(7) If other waveforms exist, repeating the steps (5) to (6) to obtain the corresponding Width value.
EXAMPLE III
A method for measuring the time width (Raise/Fall time) of a packet, wherein the Raise/Fall time is the time width of a measuring signal in a certain rising or falling area.
In this embodiment, the analog waveform includes: waveform1, Waveform2, and other waveforms not shown. Before calculating the time width of the waveform, two thresholds in the y-axis direction need to be set in advance, which are used for determining the start and stop times of the rising and falling intervals, respectively, and then calculating the time width. The value Upp1 and the value Low1 are a high threshold and a Low threshold, respectively, in the y direction set by the Waveform1, and the value Upp2 and the value Low2 are a high threshold and a Low threshold, respectively, in the y direction set by the Waveform 2. And the trend of the predefined points is divided into three states: rise, fall, and flat (i.e., no change).
Whether it is an ascending or descending region, it is necessary to determine which threshold value is the threshold value of the first reference point. For the sake of simplicity, the low threshold is uniformly defined as the threshold of the first reference point.
The Group Measure process for Raise/Fall time is as follows:
(1) point PM is the location of the mouse click with Waveform1 as the reference Waveform.
(2) On Waveform1, a Low threshold point is found that is closest to point PM, which point must have a y value equal to the given Low threshold Low 1. This satisfactory low threshold point is named PL1 and is taken as the first reference point for Waveform 1.
(3) On Waveform1, since the trend of point PL1 is decreasing, in order to ensure that both points are in the same trend interval, the trend of the corresponding high threshold point must also be decreasing. By calculation, a high threshold point PU1 is found which is closest to point PL1 and whose y value is equal to the high threshold Upp1, which is the second reference point of Waveform 1. The distance between point PL1 and point PU1 on the x-axis is the Time width Fall Time of Waveform Waveform1 closest to point PM, and is designated Rft 1.
(4) The x values and trends for point PL1 and point PU1 were recorded. The trends for both point PL1 and point PU1 are decreasing.
(5) On Waveform2, the Low threshold point closest to point PL1 is found by calculation, which point must have a y value equal to Low threshold Low2 and a trend the same as point PL1, i.e. also decreasing. Since distances S2< S1 and S2< S3, and the trend of point PL2 is also decreasing, point PL2 is the point that meets the requirements, which is also the first reference point of Waveform 2.
(6) Since the trend of point PL2 is decreasing, the trend of another high threshold point must also be decreasing in order to ensure that the two points are within the same drop zone. The y value of this high threshold point must be equal to the high threshold Upp2 and the trend is the same as for point PL2, i.e., decreasing. This high threshold point closest to point PL2 is designated PU2, which is the second reference point of Waveform 2. Therefore, the distance between the point PL2 and the point PU2 on the x-axis is the Time width value Fall Time of the Waveform wave 2 with the Waveform wave 1 as a reference Waveform, and is marked Rft 2.
(7) And if other waveforms exist, repeating the steps (5) to (6) to obtain a corresponding Fall Time value.
Of course, in this embodiment, only the measurement of the rain/Fall time is given, and the measurement of the skew Rate similar to the rain/Fall time may adopt a calculation process similar to the rain/Fall time, but the point trend is different, and details are not described here. Wherein, the Slew Rate is the slope between two points.
The invention provides a method for grouping and measuring analog waveforms in a waveform display, which aims at a plurality of waveforms generated by simulation of an analog circuit. The method has the characteristics of simplicity and clarity, and can quickly and accurately calculate a group of measurement results, thereby enhancing the usability of the waveform display. The present invention can be applied to measurement, including but not limited to, measurement functions commonly used in waveform displays such as period, frequency, duty cycle, pulse width, time width, and slope. The method can be used for checking the main characteristics of the waveform and quickly and effectively verifying the simulation result of the circuit.
The method for measuring the analog waveform in groups can quickly and effectively complete the measurement of the same characteristic value of a group of signals, and has very accurate results on several commonly used measurement functions such as duty ratio, pulse width, time width and the like. The method is particularly suitable for grouping measurement of a plurality of analog waveforms in a waveform display and detecting small differences among a group of waveforms with similar characteristics. In practical engineering application, the method can be combined with a graphical interface of a waveform display to show the difference through a table and a histogram, and greatly facilitates the verification of a designer on a simulation result.
Those of ordinary skill in the art will understand that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that changes may be made in the embodiments and/or equivalents thereof without departing from the spirit and scope of the invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (11)
1. A method of performing a group measurement on an analog waveform, comprising the steps of:
1) determining a reference waveform from the analog waveform;
2) determining the reference waveform reference point according to the measurement type;
3) calculating a measurement value of the reference waveform according to the reference point;
4) determining corresponding reference points of other waveforms according to the principle that the distance is the closest and the trend is the same;
5) calculating the measurement values of the other waveforms according to the corresponding reference points;
the step 2) further comprises the following steps:
if the measurement type is period, frequency and duty ratio, selecting a threshold point closest to the position clicked by a mouse in the reference waveform as the reference point;
if the measurement type is pulse width, selecting a position clicked by a mouse as the reference point in the reference waveform;
if the measurement type is time width and slope, selecting a low threshold point and a high threshold point which are closest to the position clicked by the mouse from the reference waveform as the reference points;
the step 4) further includes taking a threshold point, which has the same trend with the reference point of the reference waveform and is closest to the reference point of the reference waveform, in the other waveforms as the corresponding reference points of the other waveforms.
2. The method of claim 1, wherein the step of performing the group measurement comprises: the number of reference waveforms is one.
3. The method according to claim 1, wherein the step 1) further comprises determining a waveform closest to the position in the analog waveforms according to the position of the mouse click, and using the waveform as the reference waveform.
4. The method of claim 1, wherein the step of performing the group measurement comprises: the step 3) of calculating the measurement value of the reference waveform is to select a left threshold point and a right threshold point which are closest to the reference point in the reference waveform; and calculating the period, the frequency and the duty ratio of the reference waveform according to the difference value of the x values of the two threshold points.
5. The method of claim 1, wherein the step of performing the group measurement comprises: and 3) the step of calculating the measurement value of the reference waveform is to select a left threshold point and a right threshold point which are closest to the reference point in the reference waveform, and then calculate the pulse width of the reference waveform according to the difference of the x values of the two threshold points.
6. The method of claim 1, wherein the step of performing the group measurement comprises: the step 3) of calculating the measurement value of the reference waveform is to select a first reference point and a second reference point in the reference waveform, and then calculate the time width and the slope of the reference waveform according to the difference value of the x values of the two reference points.
7. The method according to claim 1, wherein the step 4) further comprises calculating a middle point of two threshold points in the reference waveform as a corresponding reference point of the other waveform according to x values of the two threshold points.
8. The method according to claim 1, wherein the step 4) further comprises using a threshold point of the other waveform which has the same trend as the first reference point of the reference waveform and is closest to the first reference point of the reference waveform as the first corresponding reference point of the other waveform; and taking a threshold point which has the same trend with a second reference point of the reference waveform and is closest to the second reference point of the reference waveform in the other waveforms as a second corresponding reference point of the other waveforms.
9. The method of claim 1, wherein the step of performing the group measurement comprises: the step 5) of calculating the measurement values of the other waveforms is to select two left and right threshold points closest to the corresponding reference points in the other waveforms; and calculating the period, the frequency and the duty ratio of the other waveforms according to the difference value of the x values of the two threshold points.
10. The method of claim 1, wherein the step of performing the group measurement comprises: the step 5) of calculating the measurement values of the other waveforms is to select a first threshold point which is closest to the corresponding reference point and has the same trend as a left threshold point in the reference waveform on the left side of the corresponding reference point in the other waveforms; selecting a second threshold point which is closest to the corresponding reference point and has the same trend as the right threshold point in the reference waveform on the right side of the corresponding reference point; and calculating the pulse widths of the other waveforms according to the difference value of the x values of the first threshold point and the second threshold point.
11. The method of claim 1, wherein the step of performing the group measurement comprises: the step 5) of calculating the measurement values of the other waveforms is to select a first corresponding reference point and a second corresponding reference point from the other waveforms, and then calculate the time widths and the slopes of the other waveforms according to the difference between the x values of the two corresponding reference points.
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| JP3460105B2 (en) * | 1995-09-19 | 2003-10-27 | 富士通株式会社 | Digital radio equipment |
| US6456216B2 (en) * | 1999-10-28 | 2002-09-24 | The National University Of Singapore | Method and apparatus for generating pulses from analog waveforms |
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| US9026945B2 (en) * | 2011-04-28 | 2015-05-05 | Tektronix, Inc. | Method of grouping waveforms for a single channel on a single display |
| CN103853857A (en) * | 2012-11-29 | 2014-06-11 | 北京华大九天软件有限公司 | Method for achieving measuring tools in integrated circuit simulation waveform display |
| CN105871179B (en) * | 2016-04-05 | 2019-08-27 | 全球能源互联网研究院 | A kind of reference voltage curve acquisition method based on full analog circuit |
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