Summary of the invention
The objective of the invention is: provide a kind of characterization parameter of mimic channel solder joint mechanical creep failure mechanism to determine method, can diagnose out the fault in the mimic channel whether to be caused by solder joint mechanical creep mechanism quickly and accurately.
At first introduce three definition.
Definition 1: fault is injected: artificial is applied to system with system's contingent fault under the real work situation, to study the influence that these faults cause work and the performance of system.
The definition 2: the failure mechanism degradation model: by the quantitative description of relationship in the failure mechanism mechanism Changing Pattern of certain specified quantitative, this tittle has reflected product physically or certain damage chemically or the accumulative process of consumption.
Definition 3: mimic channel: processing time and amplitude be the electronic circuit of continuous signal (continuous implication is to get infinite a plurality of numerical value in certain span) all.
Technical scheme of the present invention: in the EDA simulation software, draw out circuit diagram, replace the mechanism of solder joint mechanical creep failure mechanism in circuit with solder joint mechanical creep failure mechanism degradation model; Carry out fault at the circuit model ad-hoc location and inject, and simulated environment is set on request carries out the fault emulation experiment; Can survey node to circuit and detect, obtain fault data; Fault data is handled, extracted the characterization parameter of solder joint mechanical creep failure mechanism.
The present invention is that a kind of characterization parameter of mimic channel solder joint mechanical creep failure mechanism is determined method, and its step is as follows:
Step 1, selected mimic channel is drawn out its circuit diagram in the EDA simulation software;
Step 2 replaces the mechanism of solder joint mechanical creep failure mechanism in circuit with solder joint mechanical creep failure mechanism degradation model;
Step 3 in the EDA simulation software, according to the fault injection mode, is injected into solder joint mechanical creep failure mechanism in the circuit diagram of drawing;
Step 4 arranges the environmental baseline of emulation in the EDA simulation software on request, carries out the circuit simulation experiment;
Step 5 after emulation is finished, records the different output valves constantly of each measured node;
Step 6, each that calculates each measured node be the accumulative total rate of change of output valve constantly;
Step 7, to each measured node each constantly the accumulative total rate of change of output valve compare, find out the fastest node of variation, selection principle according to solder joint mechanical creep failure mechanism characterization parameter, with the parameter of this node representative characterization parameter as mimic channel solder joint mechanical creep failure mechanism, finish determining of the method for the invention-characterization parameter.
Wherein, the fault injection mode is in the step 3: (1) obtains suitable components and parts type, and selection standard is to utilize these components and parts can reflect the Changing Pattern of failure mechanism degradation model; (2) determine this failure mechanism degradation model parameter by consulting manual of standards; (3) according to the concrete deterioration law of obtaining of calculation of parameter; (4) add selected components and parts to break down in the circuit diagram position; (5) in the simulation document of setting up, the Changing Pattern of these components and parts is set at deterioration law in (3).
Wherein, the environmental baseline of emulation refers to input voltage, enlargement factor, environment temperature in the step 4.
Wherein, whether measured node refers to selectedly to exporting influential node by circuit analysis in the step 5, can decision circuitry break down by the variation of observing these nodes outputs.
Wherein, the selection principle of the characterization parameter of solder joint mechanical creep failure mechanism is in the step 7: the first, and selected characterization parameter will be convenient for measuring, be easy to obtain; The second, selected characterization parameter is wanted the comparatively generation of sensitive reflection solder joint mechanical creep failure mechanism, and is namely comparatively responsive to the solder joint mechanical creep failure mechanism that will characterize.
The present invention compared with prior art has following advantage:
The first, the present invention has provided the idiographic flow of the characterization parameter of definite mimic channel solder joint mechanical creep failure mechanism from the angle of experiment.
The second, the present invention combines Failure Injection Technique and circuit emulation method.
Embodiment
The characterization parameter of mimic channel solder joint mechanical creep failure mechanism of the present invention determines that method sees shown in Figure 2ly, and the embodiment step of this method is as follows:
Step 1, selected mimic channel is drawn out its circuit diagram in the EDA simulation software;
Step 2 replaces the mechanism of solder joint mechanical creep failure mechanism in circuit with solder joint mechanical creep failure mechanism degradation model, and solder joint mechanical creep failure mechanism degradation model is:
In the formula, Δ R is changes in resistance rate in the solder joint mechanical creep process; η is the growth rate of crackle in the solder joint mechanical creep process, the difference along with solder joint mechanical creep different phase; W and L be respectively solder joint with the electric current mutually perpendicular direction on wide and long; T is the time of test; Δ t is the time interval.
When the solder joint mechanical creep took place, solder joint resistance rule over time was:
R(t)=R
0(1+ΔR) (2)
Wherein, R (t) is the t actual resistance of resistance constantly; Δ R is changes in resistance rate in the solder joint mechanical creep process; R
0Be the initial resistance of solder joint, R
0Computing formula be:
Wherein, ρ is resistivity, and h is solder joint thickness, the meaning cotype (1) of W, L
Step 3 in the EDA simulation software, according to the fault injection mode, is injected into solder joint mechanical creep failure mechanism in the circuit diagram of drawing, and sees shown in Figure 1ly, and its detailed step is as follows:
Step 301 in the EDA simulation software, is chosen resistance as suitable components and parts, and selection standard is solder joint mechanical creep failure mechanism degradation model, as the formula (1), is the relational expression about resistance change rate;
Step 302 is consulted the IPC standard, obtains the parameter of solder joint mechanical creep failure mechanism degradation model;
Step 303 is according to the concrete deterioration law of calculation of parameter solder joint mechanical creep failure mechanism that obtains;
Step 304, joining resistance actual among the primary circuit figure is the position of solder joint, the position that the solder joint mechanical creep namely takes place;
Step 305, in the EDA simulation software, by the parameter scanning method, the changes in resistance rule that adding is set is the deterioration law that step 303 is obtained.Parameter scanning method concrete operations mode is: in the simulation document of setting up, select " parameter scanning " option, add the Changing Pattern of the parameter of needs setting to assigned address.
Be example with certain typical amplifying circuit, in the EDA simulation software, draw out its circuit diagram, as shown in Figure 3.By consulting the IPC-SM-782A standard, obtain L=1.65mm, W=0.57mm, h=0.15mm, η=1 * 10
-6M/s, Δ t=1s in the substitution formula (1), obtains
Suppose that the material that solder joint adopts is Sn-3.5Ag, check in its electricalresistivity=12.31u Ω cm, utilize formula (3) can obtain initial resistance R
0=19.633u Ω.
Obtain the concrete deterioration law of resistance according to formula (2), as the formula (4), wherein the unit of t is s, and the span of t is 0≤t≤547.286s,
Resistance is joined the circuit diagram that obtains behind the initial circuit figure as shown in Figure 4, the resistance of RS1-RS7 for adding wherein, circled represents the position of solder joint in the reality among Fig. 4.
In the EDA simulation software, by the parameter scanning method, the Changing Pattern of RS1-RS7 is set as the formula (5).
Step 4 arranges the environmental baseline of emulation in the EDA simulation software on request, carries out the circuit simulation experiment, and the environmental baseline of emulation refers to input voltage, enlargement factor, environment temperature;
Step 5 after emulation is finished, records the different output valves constantly of each measured node, and whether measured node refers to selected to exporting influential node by circuit analysis, can decision circuitry break down by the variation of observing these nodes outputs;
In this experiment, it is input voltage 2v that simulated environment is set, and enlargement factor-5, environment temperature are 27 ° of C.Begin to carry out fault simulation experiment afterwards, make resistance increase to 1982.933u Ω from 19.633u Ω, every increase 196.33u Ω carries out an emulation, can obtain the influence that generation and development thereof along with the solder joint mechanical creep cause external circuit thus.
When the solder joint mechanical creep takes place, can be to the V(OUT in this circuit), V(R13:2), I (R13), I (R14), V(R15:1), I(R15) node output impacts, and needs record output data in experimentation.
Step 6, each that calculates each measured node be the accumulative total rate of change of output valve constantly;
Step 7, to each measured node each constantly the accumulative total rate of change of output valve compare, find out the fastest node of variation, selection principle according to solder joint mechanical creep failure mechanism characterization parameter, with the parameter of this node representative characterization parameter as mimic channel solder joint mechanical creep failure mechanism, finish determining of the method for the invention-characterization parameter.
The selection principle of the characterization parameter of solder joint mechanical creep failure mechanism is, the first, and selected characterization parameter will be convenient for measuring, be easy to obtain; The second, selected characterization parameter is wanted the comparatively generation of sensitive reflection solder joint mechanical creep failure mechanism, and is namely comparatively responsive to the solder joint mechanical creep failure mechanism that will characterize.
In this experiment, calculate the accumulative total rate of change of each moment output valve of each measured node, the result is as shown in table 1.By data analysis as can be known, the node of accumulative total rate of change maximum is V(R13:2), when being the generation of solder joint mechanical creep, this node changes the most soon in time, the comparatively generation that reflects solder joint mechanical creep in this circuit of sensitivity, therefore according to the selection principle of the characterization parameter of solder joint mechanical creep failure mechanism, with V(R13:2) determine the characterization parameter of the solder joint mechanical creep failure mechanism in the circuit for this reason.
Each of each measured node of table 1 be the accumulative total rate of change of output valve constantly
t/s |
R/uΩ |
V(OUT)/% |
V(R13:2)/% |
I(R13)/% |
I(R14)/% |
V(R15:1)/% |
I(R15)/% |
0 |
19.633 |
0 |
0 |
0 |
0 |
0 |
0 |
547.186 |
215.963 |
1E-05 |
0.1143 |
1.17E-05 |
1.15E-05 |
1.33E-07 |
0.00856 |
547.236 |
412.293 |
2.9E-05 |
0.2517 |
2.32E-05 |
2.35E-05 |
-6.54E-06 |
0.01716 |
547.253 |
608.263 |
3.8E-05 |
0.3891 |
3.47E-05 |
3.50E-05 |
-6.54E-06 |
0.02533 |
547.261 |
804.953 |
5.7E-05 |
0.5210 |
4.67E-05 |
4.65E-05 |
-1.25E-05 |
0.03393 |
547.266 |
1001.283 |
6.7E-05 |
0.6530 |
5.82E-05 |
5.80E-05 |
-1.25E-05 |
0.04253 |
547.270 |
1197.613 |
8.6E-05 |
0.7904 |
6.97E-05 |
7.00E-05 |
-1.92E-05 |
0.05070 |
547.272 |
1393.943 |
0.00011 |
0.9223 |
8.17E-05 |
9.30E-05 |
-2.52E-05 |
0.05929 |
547.274 |
1590.273 |
0.00012 |
1.0597 |
0.00059 |
0.00010 |
-2.52E-05 |
0.06746 |
547.275 |
1786.603 |
0.00013 |
1.1916 |
0.00010 |
0.00012 |
-3.19E-05 |
0.07606 |
547.276 |
1982.933 |
0.00014 |
1.3235 |
0.00012 |
0.00013 |
-3.19E-05 |
0.08466 |