CN103258101A - Method for determining characterization parameters of simulation circuit welding spot mechanical creep failure mechanism - Google Patents

Method for determining characterization parameters of simulation circuit welding spot mechanical creep failure mechanism Download PDF

Info

Publication number
CN103258101A
CN103258101A CN2013101934964A CN201310193496A CN103258101A CN 103258101 A CN103258101 A CN 103258101A CN 2013101934964 A CN2013101934964 A CN 2013101934964A CN 201310193496 A CN201310193496 A CN 201310193496A CN 103258101 A CN103258101 A CN 103258101A
Authority
CN
China
Prior art keywords
failure mechanism
solder joint
mechanical creep
joint mechanical
creep failure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN2013101934964A
Other languages
Chinese (zh)
Other versions
CN103258101B (en
Inventor
胡薇薇
孟祥坤
孙宇锋
赵广燕
马晓丽
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Tianhang Changying Technology Development Co ltd
Original Assignee
Beihang University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beihang University filed Critical Beihang University
Priority to CN201310193496.4A priority Critical patent/CN103258101B/en
Publication of CN103258101A publication Critical patent/CN103258101A/en
Application granted granted Critical
Publication of CN103258101B publication Critical patent/CN103258101B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

A method for determining characterization parameters of a simulation circuit welding spot mechanical creep failure mechanism comprises the steps of selecting a simulation circuit, drawing a circuit diagram in EDA simulation software, using a welding spot mechanical creep failure mechanism degradation model for replacing a function process of the welding spot mechanical creep failure mechanism in the circuit, injecting the welding spot mechanical creep failure mechanism in the drawn circuit diagram in the EDA simulation software according to a fault injecting mode, setting up simulation environmental conditions in the EDA simulation software to carry out a circuit simulation experiment, recording output values of each measurement node at different moments, calculating change cumulative rates of the output values of each measurement node at different moments, comparing the change cumulative rates of the output values of each measurement node at different moments, finding out a node which changes most fast, and using parameters expressed by the node as the characterization parameters of the simulation circuit welding spot mechanical creep failure mechanism according to a selecting principle of the characterization parameters.

Description

The characterization parameter of mimic channel solder joint mechanical creep failure mechanism is determined method
Affiliated technical field
The characterization parameter that the present invention relates to mimic channel solder joint mechanical creep failure mechanism is determined method, belongs to systems engineering system reliability technical field.
Background technology
In recent years, along with microelectric technique, automatic control technology, fast development of computer technology, electronic devices and components and electronic product associated therewith have obtained using widely in commercial production, and these products almost spread all over each corner of production and sphere of life.Electromechanical Design also becomes the development trend of mechanical industry product design.Electronic and electrical equipment is the important component part in the electromechanical integration equipment, and oneself becomes the problem that the product design personnel must face the reliability design of electronic and electrical equipment and associated joint product.The fault of electronic product may cause economy, politics, military serious consequence, therefore must study the integrity problem of electronic product and troubleshooting issue as a special technology-oriented discipline.
In the electronic product, it is the one of the main reasons that causes electronic product reliability to reduce that the solder joint mechanical property lost efficacy, and mechanical creep then is a kind of important factor wherein.Solder joint mechanical creep failure mechanism may cause taking place in the mimic channel different failure modes, identical failure mode also may be to be caused by different failure mechanisms, whether simple research failure mode and the corresponding relation between the characterization parameter can accurately not judged fault and be caused by solder joint mechanical creep failure mechanism, thereby can not propose strong innovative approach.
At this situation, need exploration to the concrete approach of the characterization parameter of a definite mimic channel solder joint mechanical creep failure mechanism.Summing up domestic and international having now based on electric design automation (Electronic Design Automation, EDA) on the fault simulation basis, utilize the EDA simulation software to carry out circuit simulation, in conjunction with Failure Injection Technique, can explore a kind of characterization parameter of mimic channel solder joint mechanical creep failure mechanism and determine method.
Summary of the invention
The objective of the invention is: provide a kind of characterization parameter of mimic channel solder joint mechanical creep failure mechanism to determine method, can diagnose out the fault in the mimic channel whether to be caused by solder joint mechanical creep mechanism quickly and accurately.
At first introduce three definition.
Definition 1: fault is injected: artificial is applied to system with system's contingent fault under the real work situation, to study the influence that these faults cause work and the performance of system.
The definition 2: the failure mechanism degradation model: by the quantitative description of relationship in the failure mechanism mechanism Changing Pattern of certain specified quantitative, this tittle has reflected product physically or certain damage chemically or the accumulative process of consumption.
Definition 3: mimic channel: processing time and amplitude be the electronic circuit of continuous signal (continuous implication is to get infinite a plurality of numerical value in certain span) all.
Technical scheme of the present invention: in the EDA simulation software, draw out circuit diagram, replace the mechanism of solder joint mechanical creep failure mechanism in circuit with solder joint mechanical creep failure mechanism degradation model; Carry out fault at the circuit model ad-hoc location and inject, and simulated environment is set on request carries out the fault emulation experiment; Can survey node to circuit and detect, obtain fault data; Fault data is handled, extracted the characterization parameter of solder joint mechanical creep failure mechanism.
The present invention is that a kind of characterization parameter of mimic channel solder joint mechanical creep failure mechanism is determined method, and its step is as follows:
Step 1, selected mimic channel is drawn out its circuit diagram in the EDA simulation software;
Step 2 replaces the mechanism of solder joint mechanical creep failure mechanism in circuit with solder joint mechanical creep failure mechanism degradation model;
Step 3 in the EDA simulation software, according to the fault injection mode, is injected into solder joint mechanical creep failure mechanism in the circuit diagram of drawing;
Step 4 arranges the environmental baseline of emulation in the EDA simulation software on request, carries out the circuit simulation experiment;
Step 5 after emulation is finished, records the different output valves constantly of each measured node;
Step 6, each that calculates each measured node be the accumulative total rate of change of output valve constantly;
Step 7, to each measured node each constantly the accumulative total rate of change of output valve compare, find out the fastest node of variation, selection principle according to solder joint mechanical creep failure mechanism characterization parameter, with the parameter of this node representative characterization parameter as mimic channel solder joint mechanical creep failure mechanism, finish determining of the method for the invention-characterization parameter.
Wherein, the fault injection mode is in the step 3: (1) obtains suitable components and parts type, and selection standard is to utilize these components and parts can reflect the Changing Pattern of failure mechanism degradation model; (2) determine this failure mechanism degradation model parameter by consulting manual of standards; (3) according to the concrete deterioration law of obtaining of calculation of parameter; (4) add selected components and parts to break down in the circuit diagram position; (5) in the simulation document of setting up, the Changing Pattern of these components and parts is set at deterioration law in (3).
Wherein, the environmental baseline of emulation refers to input voltage, enlargement factor, environment temperature in the step 4.
Wherein, whether measured node refers to selectedly to exporting influential node by circuit analysis in the step 5, can decision circuitry break down by the variation of observing these nodes outputs.
Wherein, the selection principle of the characterization parameter of solder joint mechanical creep failure mechanism is in the step 7: the first, and selected characterization parameter will be convenient for measuring, be easy to obtain; The second, selected characterization parameter is wanted the comparatively generation of sensitive reflection solder joint mechanical creep failure mechanism, and is namely comparatively responsive to the solder joint mechanical creep failure mechanism that will characterize.
The present invention compared with prior art has following advantage:
The first, the present invention has provided the idiographic flow of the characterization parameter of definite mimic channel solder joint mechanical creep failure mechanism from the angle of experiment.
The second, the present invention combines Failure Injection Technique and circuit emulation method.
Description of drawings
Fig. 1 is fault injection mode process flow diagram
Fig. 2 is the method for the invention process flow diagram
The circuit diagram of Fig. 3 in the EDA simulation software, drawing
Fig. 4 is the circuit diagram of resistance after adding
Symbol description is as follows among Fig. 3,4:
L: lead
Q: triode
R: resistance
V: power supply
S: solder joint
K: resistance value unit
Vdc: magnitude of voltage unit
OUT: output terminal
RS: the back adds the resistance that replaces solder joint
Embodiment
The characterization parameter of mimic channel solder joint mechanical creep failure mechanism of the present invention determines that method sees shown in Figure 2ly, and the embodiment step of this method is as follows:
Step 1, selected mimic channel is drawn out its circuit diagram in the EDA simulation software;
Step 2 replaces the mechanism of solder joint mechanical creep failure mechanism in circuit with solder joint mechanical creep failure mechanism degradation model, and solder joint mechanical creep failure mechanism degradation model is:
ΔR = 2 η 2 tπΔt [ WL - η 2 t 2 π ] - - - ( 1 )
In the formula, Δ R is changes in resistance rate in the solder joint mechanical creep process; η is the growth rate of crackle in the solder joint mechanical creep process, the difference along with solder joint mechanical creep different phase; W and L be respectively solder joint with the electric current mutually perpendicular direction on wide and long; T is the time of test; Δ t is the time interval.
When the solder joint mechanical creep took place, solder joint resistance rule over time was:
R(t)=R 0(1+ΔR) (2)
Wherein, R (t) is the t actual resistance of resistance constantly; Δ R is changes in resistance rate in the solder joint mechanical creep process; R 0Be the initial resistance of solder joint, R 0Computing formula be:
R 0 = ρ h WL - - - ( 3 )
Wherein, ρ is resistivity, and h is solder joint thickness, the meaning cotype (1) of W, L
Step 3 in the EDA simulation software, according to the fault injection mode, is injected into solder joint mechanical creep failure mechanism in the circuit diagram of drawing, and sees shown in Figure 1ly, and its detailed step is as follows:
Step 301 in the EDA simulation software, is chosen resistance as suitable components and parts, and selection standard is solder joint mechanical creep failure mechanism degradation model, as the formula (1), is the relational expression about resistance change rate;
Step 302 is consulted the IPC standard, obtains the parameter of solder joint mechanical creep failure mechanism degradation model;
Step 303 is according to the concrete deterioration law of calculation of parameter solder joint mechanical creep failure mechanism that obtains;
Step 304, joining resistance actual among the primary circuit figure is the position of solder joint, the position that the solder joint mechanical creep namely takes place;
Step 305, in the EDA simulation software, by the parameter scanning method, the changes in resistance rule that adding is set is the deterioration law that step 303 is obtained.Parameter scanning method concrete operations mode is: in the simulation document of setting up, select " parameter scanning " option, add the Changing Pattern of the parameter of needs setting to assigned address.
Be example with certain typical amplifying circuit, in the EDA simulation software, draw out its circuit diagram, as shown in Figure 3.By consulting the IPC-SM-782A standard, obtain L=1.65mm, W=0.57mm, h=0.15mm, η=1 * 10 -6M/s, Δ t=1s in the substitution formula (1), obtains
ΔR = 2 η 2 tπΔt [ WL - η 2 t 2 π ] = 6.28 × 10 - 6 t 0.9405 - 3.14 × 10 - 6 t 2 - - - ( 4 )
Suppose that the material that solder joint adopts is Sn-3.5Ag, check in its electricalresistivity=12.31u Ω cm, utilize formula (3) can obtain initial resistance R 0=19.633u Ω.
Obtain the concrete deterioration law of resistance according to formula (2), as the formula (4), wherein the unit of t is s, and the span of t is 0≤t≤547.286s,
R ( t ) = 19.633 + 1.233 × 10 - 4 t 0.9405 - 3.14 × 10 - 6 t 2 - - - ( 5 )
Resistance is joined the circuit diagram that obtains behind the initial circuit figure as shown in Figure 4, the resistance of RS1-RS7 for adding wherein, circled represents the position of solder joint in the reality among Fig. 4.
In the EDA simulation software, by the parameter scanning method, the Changing Pattern of RS1-RS7 is set as the formula (5).
Step 4 arranges the environmental baseline of emulation in the EDA simulation software on request, carries out the circuit simulation experiment, and the environmental baseline of emulation refers to input voltage, enlargement factor, environment temperature;
Step 5 after emulation is finished, records the different output valves constantly of each measured node, and whether measured node refers to selected to exporting influential node by circuit analysis, can decision circuitry break down by the variation of observing these nodes outputs;
In this experiment, it is input voltage 2v that simulated environment is set, and enlargement factor-5, environment temperature are 27 ° of C.Begin to carry out fault simulation experiment afterwards, make resistance increase to 1982.933u Ω from 19.633u Ω, every increase 196.33u Ω carries out an emulation, can obtain the influence that generation and development thereof along with the solder joint mechanical creep cause external circuit thus.
When the solder joint mechanical creep takes place, can be to the V(OUT in this circuit), V(R13:2), I (R13), I (R14), V(R15:1), I(R15) node output impacts, and needs record output data in experimentation.
Step 6, each that calculates each measured node be the accumulative total rate of change of output valve constantly;
Step 7, to each measured node each constantly the accumulative total rate of change of output valve compare, find out the fastest node of variation, selection principle according to solder joint mechanical creep failure mechanism characterization parameter, with the parameter of this node representative characterization parameter as mimic channel solder joint mechanical creep failure mechanism, finish determining of the method for the invention-characterization parameter.
The selection principle of the characterization parameter of solder joint mechanical creep failure mechanism is, the first, and selected characterization parameter will be convenient for measuring, be easy to obtain; The second, selected characterization parameter is wanted the comparatively generation of sensitive reflection solder joint mechanical creep failure mechanism, and is namely comparatively responsive to the solder joint mechanical creep failure mechanism that will characterize.
In this experiment, calculate the accumulative total rate of change of each moment output valve of each measured node, the result is as shown in table 1.By data analysis as can be known, the node of accumulative total rate of change maximum is V(R13:2), when being the generation of solder joint mechanical creep, this node changes the most soon in time, the comparatively generation that reflects solder joint mechanical creep in this circuit of sensitivity, therefore according to the selection principle of the characterization parameter of solder joint mechanical creep failure mechanism, with V(R13:2) determine the characterization parameter of the solder joint mechanical creep failure mechanism in the circuit for this reason.
Each of each measured node of table 1 be the accumulative total rate of change of output valve constantly
t/s R/uΩ V(OUT)/% V(R13:2)/% I(R13)/% I(R14)/% V(R15:1)/% I(R15)/%
0 19.633 0 0 0 0 0 0
547.186 215.963 1E-05 0.1143 1.17E-05 1.15E-05 1.33E-07 0.00856
547.236 412.293 2.9E-05 0.2517 2.32E-05 2.35E-05 -6.54E-06 0.01716
547.253 608.263 3.8E-05 0.3891 3.47E-05 3.50E-05 -6.54E-06 0.02533
547.261 804.953 5.7E-05 0.5210 4.67E-05 4.65E-05 -1.25E-05 0.03393
547.266 1001.283 6.7E-05 0.6530 5.82E-05 5.80E-05 -1.25E-05 0.04253
547.270 1197.613 8.6E-05 0.7904 6.97E-05 7.00E-05 -1.92E-05 0.05070
547.272 1393.943 0.00011 0.9223 8.17E-05 9.30E-05 -2.52E-05 0.05929
547.274 1590.273 0.00012 1.0597 0.00059 0.00010 -2.52E-05 0.06746
547.275 1786.603 0.00013 1.1916 0.00010 0.00012 -3.19E-05 0.07606
547.276 1982.933 0.00014 1.3235 0.00012 0.00013 -3.19E-05 0.08466

Claims (5)

1. the characterization parameter of mimic channel solder joint mechanical creep failure mechanism is determined method, it is characterized in that: the concrete steps of this method are as follows:
Step 1, selected mimic channel is drawn out its circuit diagram in the EDA simulation software;
Step 2 replaces the mechanism of solder joint mechanical creep failure mechanism in circuit with solder joint mechanical creep failure mechanism degradation model;
Step 3 in the EDA simulation software, according to the fault injection mode, is injected into solder joint mechanical creep failure mechanism in the circuit diagram of drawing;
Step 4 arranges the environmental baseline of emulation in the EDA simulation software on request, carries out the circuit simulation experiment;
Step 5 after emulation is finished, records the different output valves constantly of each measured node;
Step 6, each that calculates each measured node be the accumulative total rate of change of output valve constantly;
Step 7, to each measured node each constantly the accumulative total rate of change of output valve compare, find out the fastest node of variation, selection principle according to solder joint mechanical creep failure mechanism characterization parameter, with the parameter of this node representative characterization parameter as mimic channel solder joint mechanical creep failure mechanism, finish determining of characterization parameter.
2. the characterization parameter of mimic channel solder joint mechanical creep failure mechanism according to claim 1 is determined method, it is characterized in that: in the fault injection mode described in the step 3 be: (1) obtains selected components and parts type, and selection standard is to utilize these components and parts can reflect the Changing Pattern of failure mechanism degradation model; (2) determine this failure mechanism degradation model parameter by consulting manual of standards; (3) according to the concrete deterioration law of obtaining of calculation of parameter; (4) add selected components and parts to break down in the circuit diagram position; (5) in the simulation document of setting up, the Changing Pattern of these components and parts is set at deterioration law in aforementioned (3).
3. the characterization parameter of mimic channel solder joint mechanical creep failure mechanism according to claim 1 is determined method, it is characterized in that: the environmental baseline in the emulation described in the step 4 refers to input voltage, enlargement factor and environment temperature.
4. the characterization parameter of mimic channel solder joint mechanical creep failure mechanism according to claim 1 is determined method, it is characterized in that: refer to selectedly to exporting influential node by circuit analysis in the measured node described in the step 5, can decision circuitry whether break down by the variation of observing these nodes outputs.
5. the characterization parameter of mimic channel solder joint mechanical creep failure mechanism according to claim 1 is determined method, it is characterized in that: the selection principle at the solder joint mechanical creep failure mechanism characterization parameter described in the step 7 is: the first, and selected characterization parameter will be convenient for measuring, be easy to obtain; The second, selected characterization parameter is wanted the generation of reflection solder joint mechanical creep failure mechanism that can be sensitive, and is namely comparatively responsive to the solder joint mechanical creep failure mechanism that will characterize.
CN201310193496.4A 2013-05-23 2013-05-23 The characterization parameter defining method of mimic channel solder joint mechanical creep failure mechanism Active CN103258101B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201310193496.4A CN103258101B (en) 2013-05-23 2013-05-23 The characterization parameter defining method of mimic channel solder joint mechanical creep failure mechanism

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201310193496.4A CN103258101B (en) 2013-05-23 2013-05-23 The characterization parameter defining method of mimic channel solder joint mechanical creep failure mechanism

Publications (2)

Publication Number Publication Date
CN103258101A true CN103258101A (en) 2013-08-21
CN103258101B CN103258101B (en) 2016-01-06

Family

ID=48962015

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201310193496.4A Active CN103258101B (en) 2013-05-23 2013-05-23 The characterization parameter defining method of mimic channel solder joint mechanical creep failure mechanism

Country Status (1)

Country Link
CN (1) CN103258101B (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105528943A (en) * 2015-07-06 2016-04-27 中国电子科技集团公司第二十八研究所 Design and implementation method of education and training system based on circuit simulation technology
CN108563741A (en) * 2018-04-12 2018-09-21 中国兵器工业第五九研究所 The environmental damage sensitive parameter screening technique of more performance parameter products
CN113434963A (en) * 2021-07-22 2021-09-24 中国第一汽车股份有限公司 Welding spot failure parameter determination method and device, electronic equipment and storage medium

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008115323A1 (en) * 2007-03-20 2008-09-25 Exxonmobil Upstream Research Company A framework to determine the capacity of a structure

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008115323A1 (en) * 2007-03-20 2008-09-25 Exxonmobil Upstream Research Company A framework to determine the capacity of a structure

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
ZHAO GUANGYAN 等: "Reliability Prediction Method Based on Function and Fault Reasoning for", 《2010 THIRD INTERNATIONAL CONFERENCE ON COMMUNICATION THEORY, RELIABILITY, AND QUALITY OF SERVICE》, 31 December 2010 (2010-12-31) *
赵广燕 等: "EDA仿真在电路故障诊断中的应用", 《中国航空学会2007年学术年会》, 31 December 2007 (2007-12-31) *
赵广燕 等: "电路故障仿真中的故障建模、注入及判定方法研究", 《微电子学与计算机》, vol. 24, no. 1, 31 January 2007 (2007-01-31) *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105528943A (en) * 2015-07-06 2016-04-27 中国电子科技集团公司第二十八研究所 Design and implementation method of education and training system based on circuit simulation technology
CN108563741A (en) * 2018-04-12 2018-09-21 中国兵器工业第五九研究所 The environmental damage sensitive parameter screening technique of more performance parameter products
CN113434963A (en) * 2021-07-22 2021-09-24 中国第一汽车股份有限公司 Welding spot failure parameter determination method and device, electronic equipment and storage medium
CN113434963B (en) * 2021-07-22 2022-08-09 中国第一汽车股份有限公司 Welding spot failure parameter determination method and device, electronic equipment and storage medium

Also Published As

Publication number Publication date
CN103258101B (en) 2016-01-06

Similar Documents

Publication Publication Date Title
US7559045B2 (en) Database-aided circuit design system and method therefor
CN103091596B (en) Balancing double-switching circuit and insulation detection device and method based on the same
CN103698734A (en) Method for testing virtual failures of intelligent ammeter based on simulation
Daigle et al. An event-based approach to integrated parametric and discrete fault diagnosis in hybrid systems
US8200461B2 (en) Small-signal stability analysis at transient time points of integrated circuit simulation
CN104635155A (en) Relay reliability estimation method based on Wiener process
CN106250709A (en) Gas turbine abnormality detection based on sensors association network and fault diagnosis algorithm
CN104793171A (en) Fault simulation based smart meter fault detection method
CN105786678A (en) Relevance model-based testability prediction method
Wang et al. Blind drift calibration of sensor networks using signal space projection and Kalman filter
CN103258101A (en) Method for determining characterization parameters of simulation circuit welding spot mechanical creep failure mechanism
CN105180792A (en) Transformer winding deformation quantitative diagnosis method based on model correction
CN111241660B (en) Civil engineering experiment detection system and method based on cloud computing technology
CN103869243B (en) Low pressure microcomputer protecting controller operation panel relay intelligent method of calibration
Liu et al. Condition monitoring of power electronics converters based on digital twin
Yang et al. Research on optimized SOC estimation algorithm based on extended kalman filter
JP5911581B2 (en) Logic drawing error location estimation apparatus and method
CN109190210A (en) Circuit performance analysis method for reliability based on the emulation of Saber platform modeling
CN108233356B (en) Consistency evaluation method and evaluation platform for photovoltaic inverter controller
CN106155889A (en) A kind of assessment method of explosive production monitoring system
CN107831668B (en) Method and system suitable for follow-up control self-adaptive detection
Gabrys et al. Integrated neural based system for state estimation and confidence limit analysis in water networks
CN106650110B (en) Method for grouping measurement of analog waveform
CN107885075B (en) Method and system for detecting intelligent setting of process control
US7707524B2 (en) Osculating models for predicting the operation of a circuit structure

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20210324

Address after: 215000 no.1-3-201, hangqiao Road, hejiajiao village, Wangting Town, Xiangcheng District, Suzhou City, Jiangsu Province

Patentee after: Suzhou Hangda Technology Innovation Development Co.,Ltd.

Address before: 100191 No. 37, Haidian District, Beijing, Xueyuan Road

Patentee before: BEIHANG University

TR01 Transfer of patent right
TR01 Transfer of patent right

Effective date of registration: 20231108

Address after: 215000 No.1-3, hangqiao Road, hejiajiao village, Wangting Town, Xiangcheng District, Suzhou City, Jiangsu Province

Patentee after: Suzhou Tianhang Changying Technology Development Co.,Ltd.

Address before: 215000 no.1-3-201, hangqiao Road, hejiajiao village, Wangting Town, Xiangcheng District, Suzhou City, Jiangsu Province

Patentee before: Suzhou Hangda Technology Innovation Development Co.,Ltd.

TR01 Transfer of patent right