CN106646312B - A kind of method and device of concentric ring electrode scale - Google Patents
A kind of method and device of concentric ring electrode scale Download PDFInfo
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- CN106646312B CN106646312B CN201611067217.XA CN201611067217A CN106646312B CN 106646312 B CN106646312 B CN 106646312B CN 201611067217 A CN201611067217 A CN 201611067217A CN 106646312 B CN106646312 B CN 106646312B
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- 238000000034 method Methods 0.000 title claims abstract description 36
- 239000000523 sample Substances 0.000 claims abstract description 69
- 238000005259 measurement Methods 0.000 claims abstract description 6
- 239000003990 capacitor Substances 0.000 claims abstract description 5
- 239000002184 metal Substances 0.000 claims description 18
- 229910052751 metal Inorganic materials 0.000 claims description 18
- 230000001939 inductive effect Effects 0.000 claims description 10
- 230000005611 electricity Effects 0.000 claims description 7
- 238000010606 normalization Methods 0.000 claims description 4
- 238000012417 linear regression Methods 0.000 claims description 3
- 239000012212 insulator Substances 0.000 description 8
- 238000010586 diagram Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000009413 insulation Methods 0.000 description 3
- 238000002474 experimental method Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 240000002853 Nelumbo nucifera Species 0.000 description 1
- 235000006508 Nelumbo nucifera Nutrition 0.000 description 1
- 235000006510 Nelumbo pentapetala Nutrition 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000011088 calibration curve Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000004335 scaling law Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/24—Arrangements for measuring quantities of charge
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Abstract
The invention discloses a kind of methods of concentric ring electrode scale, comprising: by several pieces of concentric ring electrode circuit boards according to circle diameter label；Round loop electrode on round loop electrode circuit board is connect with DC voltage source；Direct capacitance probe vertical is placed on circle ring center；The output that direct capacitance is popped one's head in is connected to potentiometer；Use the capacitor C between the probe end of round loop electrode and distance d on i-th piece of round loop electrode circuit board of bridge measurementi；Electric bridge is removed, DC voltage source is opened, to round loop electrode RiApply the DC voltage of different amplitudes.The invention discloses a kind of devices of concentric ring electrode scale.The device and method for carrying out scale to direct capacitance probe provided by according to the present invention can obtain induced voltage of the direct capacitance probe under each monocycle electrode respectively, and obtain popping one's head in the spatial resolution A under specific rangeeqv, the accuracy of direct capacitance probe scale is made to be significantly improved.
Description
Technical field
The invention belongs to high-tension apparatus disc insulator surface charge measurement fields, and in particular to pop one's head in and mark to direct capacitance
The improvement of degree method.
Background technique
SF6Metal enclosed switchgear (GIS) is internal with SF6Gas has good insulation performance as dielectric,
It is more extensively used in electric system.In the connection bus of GIS, disc insulator plays isolation gas chamber, support is led
The important function such as body and electric insulation, but it in the operation of long-time AC or DC, surface has different degrees of charge product
Poly-, these Accumulating charges can distort original electric field in space, may cause insulator edge flashing when serious, GIS is caused to set
Standby failure, causes huge economic losses.Therefore, surface charge of the research disc insulator under alternating current-direct current or Impulse Voltage
Accumulation phenomena has important engineering significance.
In high pressure field, the measurement method of surface charge mainly has dust figure method, supercritical ultrasonics technology, capacitance probe method etc.,
Middle capacitance probe method is divided into dynamic condenser probe method and direct capacitance probe method.Direct capacitance probe method since the early 1990s for
Some researchers are used, and are to use wide method in current surface charge measurement field in the world.
Fig. 1 shows the schematic diagram of one embodiment using concentric ring electrode scale direct capacitance probe.DC voltage
Source (1) is connected on round loop electrode circuit board (2), and direct capacitance probe (3) is vertically disposed in one spacing of round loop electrode overcentre
From place, potentiometer (4) is connected to read the inductive voltage value of probe with the output end that direct capacitance is popped one's head in, and electric bridge (5) is for surveying
Measure the capacitor between probe end and metal ring.
For the principle of direct capacitance probe method as shown in Figure of description 1, the structure of probe specifically includes that inducing probes, shielding
Insulating supporting between cover, probe and shielding case.C in figure1Indicate the equivalent capacity between probe and insulator surface, C2It indicates
Probe the sum of selfcapacity and rear class measuring system entrance capacitance, C3Indicate the equivalent capacity over the ground of surface Charge.
The electrically charged amount of insulator surface institute is Q immediately below note probe, and the above earth potential of charge Q is Ui, probe output current potential
For Uo.In the case where not considering charge leakage, formula (1) (2) is set up:
Q=σ A (1)
Wherein σ is charge density, and A is the equivalent area of the insulator surface of capacitance probe face.And because are as follows:
Q=CeqUi (3)
Output voltage U can be obtained by formula (1)~(4)oWith the relational expression of surface Charge density σ:
It can define scale factor M by formula (5), the value of M is tested by scale to be obtained:
Under normal conditions due to C2 > > C1, scale factorBy to capacitance probe
Scale can obtain M value, and thus convert surface Charge by Inversion Calculation for the output voltage popped one's head in when measuring
Density.Traditional capacitance probe Scale Method is as shown in Figure of description 2.Wherein 1 in figure is DC voltage source, and 2 be metal
Plate electrode, 3 be capacitance probe, and 4 be electrometer；The distance between d- probe and plate electrode.
It keeps probe vertical with plate electrode and distance is d (d is often taken as 2mm~10mm), probe is connected to electrometer to read
Take output voltage values.For specifically distance d, plate electrodes are applied with the DC voltage of different amplitudes, record probe output
Voltage obtains calibration curve with the variation relation for applying DC voltage.Scale factor such as formula (7) institute can be obtained by attached drawing 2 and formula (6)
Show:
Traditional scaling law of capacitance probe has the following problems: free charge distribution and actual insulation on plate electrodes
Sublist Surface charge distribution is very different, and the movement of probe may cause the redistribution of the charge on plate electrodes, influences to mark
The accuracy of degree.For this purpose, propose a kind of novel Scale Method, this method will be popped one's head in using a set of with narrow-minded round loop electrode structure
It is centrally disposed at isometry position and carries out scale experiment respectively, and each monocycle scale result is superimposed, obtain final scale system
Number and probe spatial resolution.The covering device and method, which can effectively solve probe positions movement in traditional Scale Method, leads to electricity
The problem of lotus redistributes effectively promotes the accuracy of scale.
Summary of the invention
According to aforementioned, when being measured to disc insulator surface charge distribution, it need to pop one's head in direct capacitance and carry out scale,
Determine the scale factor and spatial resolution of probe, and there are inherent shortcomings for traditional Scale Method.In consideration of it, the present invention provides
A method of scale being carried out respectively using concentric circles annular electrode, under the premise of not losing validity, overcomes current method
Limitation.
A kind of method of concentric ring electrode scale of the invention, includes the following steps:
S1. by several pieces of concentric ring electrode circuit boards according to circle diameter label, from-inner-to-outer is denoted as 1,2 respectively ...,
N, n are positive integer, and each annular radii is denoted as R1, R2..., Rn, annular width is Δ r；
S2. the round loop electrode on i-th (i ∈ { 1,2 ..., n }) block round loop electrode circuit board is connect with DC voltage source；
Direct capacitance probe vertical is placed on circle ring center, distance is d；The output that direct capacitance is popped one's head in is connected to potentiometer；
S3. between the probe end using round loop electrode and distance d on i-th piece of round loop electrode circuit board of bridge measurement
Capacitor Ci；
S4. electric bridge is removed, DC voltage source is opened, to round loop electrode RiApply the DC voltage U of different amplitudesin(i,
J), wherein j ∈ { 1,2 ..., m }, different DC voltage amplitude total m, m is positive integer；
It S5. is U when applying amplitude to i-th piece of round loop electrode circuit boardin(j) it when DC voltage, is read on potentiometer
The inductive voltage value that direct capacitance is popped one's head at distance d, is denoted as Uout(i, j)；
S6. DC voltage source is cut off, i-th piece of round loop electrode circuit board is changed to i+1 block round loop electrode circuit board, weight
Multiple S2~S5；
S7. direct capacitance is popped one's head in DC voltage UinCorresponding n group inductive voltage value superposition under (i, j), obtains and Uin
(j) corresponding Uout(j)；
S8. to (Uin(j)、Uout(j)) linear regression fit is carried out, straight slope k is obtained；
S9. according to straight slope k, scale factor M of the capacitance probe at distance d is obtained；
S10. apply DC voltage U on the metal ring electrode at distance probe din(i, j0) when (wherein j0For set
Either element in { 1,2 ..., m }), obtain free charge density average σ (i) on metal ring；
S11. by the corresponding response U of charge density σ (i)out(i, j0) normalization, unit surface charge is obtained at distance d
Respond Snorm(i)；
S12. R is drawni-Snorm(i) relational graph finds out half peak valueCorresponding metal ring equivalent half
Diameter Reqv, as spatial resolution of the probe at distance d.
Preferably, the expression formula of straight slope k are as follows:
Preferably, the expression formula of the scale factor M are as follows:
Preferably, free charge density average on the metal ring are as follows:
Preferably,
The present invention also provides a kind of device of concentric ring electrode scale, described device includes DC voltage source, annulus
Telegraph circuit plate, direct capacitance probe, potentiometer, electric bridge.
As it can be seen that the device and method for carrying out scale to direct capacitance probe provided by according to the present invention, can obtain respectively
Induced voltage of the direct capacitance probe under each monocycle electrode, is overlapped, scale factor M is calculated；Charge is close
Degree normalization, obtain popping one's head in the spatial resolution A under specific rangeeqv, obtain the accuracy of direct capacitance probe scale significantly
It is promoted.
Detailed description of the invention
Fig. 1 is direct capacitance probe method schematic illustration；
Fig. 2 is capacitance probe tradition Scale Method schematic diagram；
Fig. 3 is a set of concentric ring electrode electricity used when demarcating in one embodiment of the invention to direct capacitance probe
Road plate；
Fig. 4 is the structural schematic diagram of the device of concentric ring electrode scale of the invention.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, below in conjunction with attached drawing 1-4 and implementation
Example, the present invention will be described in further detail.It should be appreciated that described herein, specific examples are only used to explain the present invention,
It is not intended to limit the present invention.
Fig. 3 is a set of concentric ring electrode electricity used when demarcating in one embodiment of the invention to direct capacitance probe
Road plate, in Fig. 3: 1- circuit board；2- circular ring structure electrode.Fig. 4 is direct capacitance probe scale device in one embodiment of the invention
Schematic diagram, in Fig. 4: 1- DC voltage source；2- round loop electrode circuit board；3- direct capacitance probe；4- potentiometer；5- electric bridge.Fig. 4 is
The schematic device of concentric ring electrode scale of the invention, wherein described device includes DC voltage source (1), concentric loop electricity
Polar circuit plate (2), direct capacitance probe (3), potentiometer (4), electric bridge (5).Electrostatic probe equidistant vertical is placed in each circular ring shape
At electrode centers, DC voltage source is connected to round loop electrode circuit board, the output that direct capacitance is popped one's head in is connected to potentiometer, it is right respectively
Each metal ring electrode applies the DC voltage of certain amplitude, and the induced voltage of direct capacitance probe is read on potentiometer
Value.The effect of DC voltage source is to provide the DC voltage of certain amplitude to metal ring electrode；Potentiometric effect is output
Show the inductive voltage value of direct capacitance probe.Metal ring electrode is the electrode etched on circuit boards, which is also referred to as
Round loop electrode circuit board.DC voltage is applied on the metal ring electrode of circuit board.
In one embodiment, it discloses a kind of pop one's head in using concentric loop structure electrode to direct capacitance and carries out the dress of scale
It sets and method.Wherein, DC voltage source uses Tianjin east text ± 50kV D.C. regulated power supply；Potentiometer uses Keithley 617
Type electrometer；Electric bridge uses Agilent U1733C hand-held LCR electric bridge；Concentric loop structural circuit plate covers copper using pcb board
Electrode, the diameter of electrode are 1~20mm, and center sequin electrode diameter is 1~2mm, and each annular width in outer ring is 1~2mm, respectively
Diameter difference between annulus is 1~2mm.Annulus direct capacitance probe and the vertical range at round loop electrode center are 1~10mm, are being protected
This is held in the case where constant, applies the DC voltage of 0~2kV to each concentric loop structure electrode respectively, to obtain respectively
The inductive voltage value of the direct capacitance probe in the case where distance and the amplitude DC voltage is obtained, and calculate and obtains scale system
Number M and spatial resolution Aeqv。
It elaborates below to the method for concentric ring electrode scale of the invention, concentric ring electrode mark of the invention
The method of degree the following steps are included:
S1. by several pieces of concentric ring electrode circuit boards according to circle diameter label, from-inner-to-outer is denoted as 1,2 respectively ...,
N, n are positive integer, and each annular radii is denoted as R1, R2..., Rn, annular width is Δ r.Such as when there is 10 blocks of concentric ring electrode electricity
When the plate of road, n=10.Difference between each annular radii can be customized, can actually take 0~5mm.
S2. the round loop electrode on i-th (i ∈ { 1,2 ..., n }) block round loop electrode circuit board is connect with DC voltage source；
Direct capacitance probe vertical is placed on circle ring center, distance is d；The output that direct capacitance is popped one's head in is connected to potentiometer.
N is the number of round loop electrode, and i is indicated i-th therein.In one embodiment of the invention, d is 1~10mm.
S3. between the probe end using round loop electrode and distance d on i-th piece of round loop electrode circuit board of bridge measurement
Capacitor is denoted as Ci。
S4. electric bridge is removed, DC voltage source is opened, to round loop electrode RiApply the DC voltage U of different amplitudesin(i,
J), wherein j ∈ { 1,2 ..., m }, different DC voltage amplitude total m, m is positive integer.
In one embodiment, voltage magnitude Uin=0~2kV, for example, Uin(j) ∈ A={ 0,0.2,0.4 ..., 2 } kV,
Wherein card (A)=m=11.Card (A) refers to the number of element in set A, has 11 elements in A here, is denoted as
Card (A)=11.
It S5. is U when applying amplitude to i-th piece of round loop electrode circuit boardin(j) it when DC voltage, is read on potentiometer
The inductive voltage value that direct capacitance is popped one's head at distance d, is denoted as Uout(i, j).
S6. DC voltage source is cut off, i-th piece of round loop electrode circuit board is changed to i+1 block round loop electrode circuit board, weight
Multiple S2~S5.In one embodiment of the invention, DC voltage source is cut off, i-th piece of round loop electrode circuit board is changed to i-th
+ 1 piece of round loop electrode circuit board repeats S2~S5, finishes until by n=10 block circuit board all experimentss.
S7. direct capacitance is popped one's head in DC voltage UinCorresponding n group inductive voltage value superposition under (i, j), obtains and Uin
(j) corresponding Uout(j):
Below to Uin(i, j) and Uin(j)、Uout(i, j) and Uout(j) relationship between is illustrated:
Uin(i, j)=Uin(j), i.e., unrelated with which annulus to the DC voltage value of i-th of annulus application, to every
A annulus all applies the DC voltage of identical series, is denoted as Uin(j)。That is input electricity
Press Uin(j) be to the function and effect of probe a series of annulus superposition, obtained UoutIt (j) can be with Uin(j) Linear Quasi is carried out
It closes.
For input, according to UinThe literary style of (i, j), be in order to output correspond because for output for, often
A Uout(i, j) may be different；According to Uin(j) literary style, be in order to Uout(j) it is fitted, but Uin(i, j) and Uin(j) originally
Body value is identical.
S8. to (Uin(j), Uout(j)) linear regression fit is carried out, the expression formula of straight slope k is obtained:
S9. the expression formula of scale factor M of the capacitance probe at distance d are as follows:
S10. apply DC voltage U on the metal ring electrode at distance probe din(i, j0) when (wherein j0For set
Either element in { 1,2 ..., m }), free charge density average on metal ring are as follows:
It should be understood that j0As long as referring to and choosing any one from m input voltage value, so that it may determine final
Spatial resolution.It may be otherwise and replaced with j, but in order to distinguish with j before, especially use j0Literary style.
S11. by the corresponding response U of charge density σ (i)out(i, j0) normalization, unit surface charge is obtained at distance d
Response:
S12. R is drawni-Snorm(i) relational graph finds out half peak valueCorresponding metal ring equivalent redius
Reqv, as spatial resolution of the probe at distance d.
Although describing the present invention by embodiment, it will be appreciated by the skilled addressee that the present invention there are many deformation and
Variation is without departing from spirit of the invention, it is desirable to which the attached claims include these deformations and change without departing from of the invention
Spirit.
Claims (6)
1. a kind of method of concentric ring electrode scale, which is characterized in that described method includes following steps:
S1. by several pieces of concentric ring electrode circuit boards according to circle diameter label, from-inner-to-outer is denoted as 1,2 respectively ..., n, n
For positive integer, each annular radii is denoted as R1, R2..., Rn, annular width is Δr；
S2. the round loop electrode on i-th piece of round loop electrode circuit board is connect with DC voltage source, wherein i ∈ { 1,2 ..., n }；It will
Direct capacitance probe vertical is placed on circle ring center, and distance is d；The output that direct capacitance is popped one's head in is connected to potentiometer；
S3. using the capacitor between the probe end of round loop electrode and distance d on i-th piece of round loop electrode circuit board of bridge measurement
Ci；
S4. electric bridge is removed, DC voltage source is opened, to round loop electrode RiApply the DC voltage U of different amplitudesin(i, j),
Middle j ∈ { 1,2 ..., m }, different DC voltage amplitude total m, m is positive integer；
It S5. is U when applying amplitude to i-th piece of round loop electrode circuit boardin(j) when DC voltage, electrostatic is read on potentiometer
Hold inductive voltage value of the probe at distance d, is denoted as Uout(i, j)；
S6. DC voltage source is cut off, i-th piece of round loop electrode circuit board is changed to i+1 block round loop electrode circuit board, repeats S2
~S5；
S7. direct capacitance is popped one's head in DC voltage UinCorresponding n group inductive voltage value superposition under (i, j), obtains and Uin(j) corresponding
Uout(j)；
S8. to (Uin(j)、Uout(j)) linear regression fit is carried out, straight slope k is obtained；
S9. according to straight slope k, scale factor M of the capacitance probe at distance d is obtained；
S10. apply DC voltage U on the metal ring electrode at distance probe din(i, j0) when, it obtains on metal ring certainly
By charge density average value σ (i), wherein j0For the either element in set { 1,2 ..., m }；
S11. by the corresponding response U of charge density σ (i)out(i, j0) normalization, obtain response of the unit surface charge at distance d
Snorm(i)；
S12. R is drawni-Snorm(i) relational graph finds out half peak valueCorresponding metal ring equivalent redius
Reqv, as spatial resolution of the probe at distance d.
2. the method according to claim 1, wherein
The expression formula of straight slope k are as follows:
3. according to the method described in claim 2, it is characterized by:
The expression formula of the scale factor M are as follows:
4. according to the method described in claim 3, it is characterized by:
Free charge density average on the metal ring are as follows:
5. according to the method described in claim 4, it is characterized by:
6. a kind of device of concentric ring electrode scale, which is characterized in that described device includes DC voltage source, round loop electrode electricity
Road plate, direct capacitance probe, potentiometer, electric bridge；Described device is for executing method as claimed in claims 1-5.
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| CN107290702B (en) * | 2017-07-26 | 2024-01-19 | 中国电力科学研究院 | Three-dimensional alternating current electric field sensor calibration device and method |
| CN108362954A (en) * | 2018-02-01 | 2018-08-03 | 清华大学 | Disc insulator surface charge inversion algorithm based on double-sided surface potential |
| CN111766457B (en) * | 2020-05-25 | 2021-08-13 | 湖南大学 | GIL insulator surface charge on-line monitoring system based on electrostatic probe |
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|---|---|---|---|---|
| CN101639502A (en) * | 2009-07-03 | 2010-02-03 | 西安交通大学 | System for automatically measuring charge distribution on surface of solid medium |
| CN102937673A (en) * | 2012-11-25 | 2013-02-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Method for detecting surface charge density of dielectric material under electron irradiation |
| CN102944763A (en) * | 2012-11-20 | 2013-02-27 | 中国航天科技集团公司第五研究院第五一〇研究所 | System and method for in-situ testing of internal electric charge and electric field distribution of dielectric material |
| JP2013210305A (en) * | 2012-03-30 | 2013-10-10 | Mitsubishi Materials Corp | Piezoelectric property measuring device and piezoelectric property measuring method |
| CN104991129A (en) * | 2015-03-27 | 2015-10-21 | 华北电力大学 | Vacuum insulator surface charge three-dimensional measurement apparatus |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101639502A (en) * | 2009-07-03 | 2010-02-03 | 西安交通大学 | System for automatically measuring charge distribution on surface of solid medium |
| JP2013210305A (en) * | 2012-03-30 | 2013-10-10 | Mitsubishi Materials Corp | Piezoelectric property measuring device and piezoelectric property measuring method |
| CN102944763A (en) * | 2012-11-20 | 2013-02-27 | 中国航天科技集团公司第五研究院第五一〇研究所 | System and method for in-situ testing of internal electric charge and electric field distribution of dielectric material |
| CN102937673A (en) * | 2012-11-25 | 2013-02-20 | 中国航天科技集团公司第五研究院第五一〇研究所 | Method for detecting surface charge density of dielectric material under electron irradiation |
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