CN106645823A - Test connector and test apparatus - Google Patents
Test connector and test apparatus Download PDFInfo
- Publication number
- CN106645823A CN106645823A CN201710055143.6A CN201710055143A CN106645823A CN 106645823 A CN106645823 A CN 106645823A CN 201710055143 A CN201710055143 A CN 201710055143A CN 106645823 A CN106645823 A CN 106645823A
- Authority
- CN
- China
- Prior art keywords
- conductor
- test
- clamp segment
- support body
- main frame
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 88
- 239000004020 conductor Substances 0.000 claims abstract description 91
- 238000009413 insulation Methods 0.000 claims description 23
- 230000037237 body shape Effects 0.000 claims description 2
- 238000010030 laminating Methods 0.000 claims description 2
- 238000009954 braiding Methods 0.000 abstract 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 abstract 1
- 239000003990 capacitor Substances 0.000 description 18
- 238000000034 method Methods 0.000 description 2
- 238000007493 shaping process Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004411 aluminium Substances 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The invention relates to a test connector which is connected between a test main machine and two lead pins of an electronic component which his formed through braiding operation or provided with a pedestal. The test connector comprises an insulating support body which is connected with the test main machine or held by hand, a contact conductor comprising a first conductor and a second conductor and a connection conducting wire connected between the test main machine and the contact conductor, wherein the first conductor is arranged on one side of the insulating support body and corresponds to one of the lead pins, and the second conductor is arranged on the other side opposite to the first conductor and corresponds to the other lead pin. The first conductor and the second conductor are respectively arranged on two sides of the insulating support body; when the first conductor contacts with one lead pin, the second conductor contacts with the other lead pin; multiple times of clamping and debugging operation via a plurality of clamping heads is not needed, electric connection between the lead pin and the test main machine can be achieved via one step, testing efficiency of the test apparatus can be improved, and test costs of the test apparatus can be lowered.
Description
Technical field
The present invention relates to test equipment technical field, more particularly to a kind of test splice and the survey comprising the test splice
Test instrument.
Background technology
Pin class product for warp-knit tape shaping and with base, it is impossible to using Automatic Test Equipment to its performance parameter
Tested, unless removed the braid of product, can so be increased testing cost, meanwhile, also without effective method to compiling
Band is quickly removed.When using instrument manual measurement, because two pins of pin class product are already fixed in braid
Or be molded and cannot be modified, it is necessary to clamping two pins respectively by two clips just can measure, but, should
Method is cumbersome, affects the operating efficiency of batch testing.
The content of the invention
Based on this, it is necessary to provide a kind of raising testing efficiency and reduce the test splice of testing cost and comprising the survey
Try the tester of head.
A kind of test splice, for being connected to two pins of electronic component of the test main frame with braid shaping or with base
Between, including：
Insulation support body, for being connected with the test main frame or hand-held；
Contact conductor, including being arranged on the insulation support body side and corresponding with pin one of them described first
Conductor, and be arranged on the insulation support body on the opposite side relative with first conductor and with another Suo Shu and draw
The second corresponding conductor of pin；
Connecting wire, is connected between the test main frame and the contact conductor.
Wherein in one embodiment, the insulation support body includes holding section, and is connected and in cone with the holding section
The supporting section of body or stage body shape；Be provided with the first mounting surface being connected with first conductor on the supporting section, and with it is described
Second mounting surface of the second conductor connection, the angle between first mounting surface and second mounting surface is A, wherein：15°
≤A≤75°。
Wherein in one embodiment, first conductor includes the first contact site being connected with first mounting surface；
Second conductor includes the second contact site being connected with second mounting surface.
Wherein in one embodiment, first conductor also include being connected with first contact site and with the holding
First rib of section laminating；Second conductor also includes what is be connected with second contact site and fit with the holding section
Second rib.
Wherein in one embodiment, the insulation support body includes holding section, and one end is connected with the handle part
First clamp segment and the second clamp segment；
Wherein, when test starts, first clamp segment and second clamp segment are opened shape and are formed an angle relatively；Survey
After examination is finished, first clamp segment and second clamp segment are adjacent to closure and form zero angle.
Wherein in one embodiment, first conductor is arranged on end of first clamp segment away from the holding section
In portion, second conductor is arranged on end of second clamp segment away from the holding section.
Wherein in one embodiment, first fitted with first conductor is provided with the middle part of first clamp segment
Clamping face；Be provided with the middle part of second clamp segment it is corresponding with the first clamping face and fit with the second conductor
Two clamp face.
Wherein in one embodiment, the insulation support body is elastic insulated supporter.
Wherein in one embodiment, the connecting wire include be connected to first conductor and the test main frame it
Between the first wire, and the second wire being connected between second conductor and the test main frame.
A kind of tester, including test main frame and any of the above-described test splice.
Test splice and tester that the present invention is provided, because the first conductor and the second conductor are separately positioned on insulation
On the both sides of support body, when the first conductor with wherein a pin is contacted when, the second conductor will contact with another pin simultaneously, without the need for leading to
Crossing multiple chucks carries out multiple clamping and debugging, can ensure that the electrical connection between pin and test main frame is settled at one go, saves
Testing time, the testing efficiency of tester is improve, while reducing the testing cost of tester.
Description of the drawings
Fig. 1 is the structural representation of capacitor；
The structural representation of the test splice that Fig. 2 is provided for a certain embodiment；
The structural representation of the test splice that Fig. 3 is provided for another embodiment；
The structural representation of the test splice that Fig. 4 is provided for another embodiment.
Specific embodiment
For the ease of understanding the present invention, the present invention is described more fully below with reference to relevant drawings.In accompanying drawing
Give the better embodiment of the present invention.But, the present invention can be realized in many different forms, however it is not limited to herein
Described embodiment.On the contrary, the purpose for providing these embodiments is to make to understand more the disclosure
Plus it is thorough comprehensive.
It should be noted that when element is referred to as " being fixed on " another element, it can directly on another element
Or can also there is element placed in the middle.When an element is considered as " connection " another element, it can be directly connected to
To another element or may be simultaneously present centering elements.Term as used herein " interior ", " outward ", "left", "right" and
For illustrative purposes only, it is unique embodiment to be not offered as similar statement.
Refering to Fig. 1 and Fig. 2, a kind of test splice, (i.e. two pins are molded with braid for being connected to test main frame 400
510 one end is fixed in braid) electronic component two pins 510 between；Or for being connected to test main frame 400
And two pins 510 of the electronic component of band base (the patch type product i.e. with base) between.Electronic component includes resistance, electricity
Appearance and diode etc., in certain embodiments, test main frame 400 is connect by test splice with two pins 510 of capacitor 500
Touch to measure the capacitance or resistance value of capacitor 500.
Refering to Fig. 1 and Fig. 2, the test splice includes insulation support body 100, contact conductor 200 and connecting wire 300.Absolutely
Edge supporter 100 can be directly installed in test main frame 400, can be used in automatic test.Certainly, insulation support body 100
Can also can be used in artificial holding and tested by the way of hand-held.Contact conductor 200 includes the He of the first conductor 210
Second conductor 220, the first conductor 210 be arranged on the side of insulation support body 100 and with one of pin on capacitor 500
510 is corresponding, and during test, the first conductor 210 contacts with the pin 510.Second conductor 220 is arranged on insulation support body 100
On the upper opposite side relative with the first conductor 210, the second conductor 220 is corresponding with another pin 510 of capacitor 500, surveys
During examination, the second conductor 220 and this another pin 510 contacts.Connecting wire 300 is connected to test main frame 400 and leads with contact
Between body 200.
Refering to Fig. 1, in certain embodiments, connecting wire 300 includes the first wire 310 and the second wire 320, and first leads
One end of line 310 is connected with the first conductor 210, and the other end of the first wire 310 is connected with an interface of test main frame 400.
One end of second wire 320 is connected with the second conductor 220, and another of the other end of the second wire 320 and test main frame 400 connects
Mouth connection.By the effect of the first wire 310 and the second wire 320, so as to realize the first conductor 210 and the second conductor 220 with
Electrical connection between test main frame 400, is finally reached the mesh that two pins 510 of capacitor 500 are electrically connected with test main frame 400
's.
In certain embodiments, the first wire 310 and the second wire 320 are made of copper, in other embodiments, first
The wire 320 of wire 310 and second is adopted and is formed from aluminium, it will be appreciated, of course, that wrapping on the first wire 310 and the second wire 320
There is rubber insulation.
Refering to Fig. 1, insulation support body 100 includes holding section 110 and supporting section 120, during automatic test, insulation support body
100 holding section 110 is directly anchored in test main frame 400.When certainly, using manual test, section 110 is held directly with handling
Hold.Holding section 110 is strip, holds section 110 and has certain length, and for example, the length for holding section 110 can be more than support
The length of section 120, certainly, the length for holding section 110 might be less that the length of supporting section 120.It can be post to hold section 110
The shapes such as body, cone or stage body, the cross section for holding section 110 can be circle, polygon or other are irregularly shaped.
Refering to Fig. 1, one end of supporting section 120 is connected with the one end for holding section 110, and supporting section 120 can be cone, when
So, supporting section 120 can also be stage body, and the stub end (the maximum one end in cross section) of supporting section 120 is connected with holding section 110,
The little head end (the minimum one end in cross section) of supporting section 120 is free end.The He of the first mounting surface 121 is provided with supporting section 120
Second mounting surface 122, the first conductor 210 includes the first contact site 211 and the second contact site 221, the first contact site 211 and first
Mounting surface 121 is fitted and connected, and the first contact site 211 extends from the stub end of supporting section 120 to little head end.Second contact site 221
It is fitted and connected with the second mounting surface 122, the second contact site 221 extends from the stub end of supporting section 120 to little head end.
Certain included angle A is formed between first mounting surface 121 and the second mounting surface 122, the span of A is 15 °≤A
≤ 75 °, in certain embodiments, the value of A is 30 °.
During test, first by interface that the first wire 310 and the second wire 320 are corresponding with test main frame 400 respectively
Connection, then, by the supporting section 120 with the first conductor 210 and the second conductor 220 two pins 510 of capacitor 500 is inserted
Between, until make the first contact site 211 and the second contact site 221 keep good with the pin 510 of capacitor 500 respectively connecing
Touch.
Because the formation between the first mounting surface 121 and the second mounting surface 122 has certain included angle A, in fact, supporting section
120 is to go up the sphenoid that cross-sectional area successively decreases along its length.Therefore, no matter how the model of capacitor 500 changes (i.e. electric
How the distance between 500 two pins 510 of container change), can ensure that the first contact site 211 and the second contact site 221 with
Good contact between 500 two pins 510 of capacitor.In other words, when the distance between 500 two pins 510 of capacitor become
Hour, the first contact site 211 and the second contact site 221 are got over the contact point of two pins 510 apart from the little head end of supporting section 120
Closely；When the distance between 500 two pins 510 of capacitor become it is big when, the first contact site 211 and the second contact site 221 and two
The contact point of pin 510 is more remote apart from the little head end of supporting section 120.
Refering to Fig. 1, in certain embodiments, the first conductor 210 also includes the first rib 212, the edge of the first rib 212
The length direction for holding section 110 extends setpoint distance, and one end of the first rib 212 is connected with the first contact site 211, and first adds
Strong portion 212 is just corresponding with holding the junction between section 110 and supporting section 120 with the junction of the first contact site 211, the
One rib 212 is just all fitted on the one side for holding section 110.Second conductor 220 also includes the second rib 222,
Second rib 222 extends setpoint distance along the length direction for holding section 110, and one end of the second rib 222 contacts with second
Portion 221 connects, and the junction of the second rib 222 and the second contact site 221 is just with holding between section 110 and supporting section 120
Junction it is corresponding, the second rib 222 is just all fitted on the another side for holding section 110.
Due to arranging the first rib 212 and the second rib 222, the first conductor 210 and the second conductor 220 can be strengthened
With the attaching intensity between supporting section 120, prevent the first conductor 210 and the second conductor 220 from producing in the presence of external impacts
Depart from.The integral arrangement between the first wire 310 and the second wire 320 can also be facilitated, winding is prevented and interfered
Phenomenon.Meanwhile, when the distance between 500 two pins 510 of capacitor are sufficiently large, contact conductor 200 can pass through first
The rib 222 of rib 212 and second is directly contacted with two pins 510, so that it is guaranteed that test main frame 400 and pin 510 it
Between form reliable and stable electrical connection, it is ensured that the accurate reading of test main frame 400.
Refering to Fig. 3, also there are other alternatives in insulation support body 100, for example, in certain embodiments, insulating supporting
Body 100 is elastic insulated supporter.Insulation support body 100 includes holding section 110, the first clamp segment 131 and the second clamp segment
132, the first clamp segment 131 and the second clamp segment 132 it is separate, one end of the first clamp segment 131 and the second clamp segment 132 is equal
It is connected with section 110 is held, the other end of the first clamp segment 131 and the second clamp segment 132 is free end.In other words, it is separate
And the resilient clamp segment 132 of first clamp segment 131 and second of tool converges integral, the first clamp segment 131 at holding section 110
A scissors fork can be formed with the second clamp segment 132.
Hold section 110 dominated by hand, in certain embodiments, the length for holding section 110 is less, that is, hold the length of section 110
Degree is less than the first clamp segment 131 and the length of the second clamp segment 132.It will be appreciated, of course, that the length for holding section 110 can also
More than or equal to the first clamp segment 131 and the length of the second clamp segment 132.
Before test, insulation support body 100 is in free state, in the presence of elastic force, the first clamp segment 131 and second
Clamp segment 132 is parallel and fits together, and zero angle is formed between the two.During test, the first clamp segment 131 and second is clamped
132 opposite directions of section break (i.e. the first clamp segment 131 and the second clamp segment 132 are not on same straight line with section 110 is held) into two with one's hands, make
The first clamp segment 131 and the second clamp segment 132 is relative opens and shape is at a certain angle, the first conductor 210 and the are made then
The common pin 510 to capacitor 500 of two conductor 220 forms clamping force and keeps contact action.According to different capacitors 500
Model, when the distance between 500 two pins 510 of capacitor transformation period, the first clamp segment 131 and the second clamp segment 132 it
Between angle can be with respective change.After being completed, the pin 510 of the first conductor 210 and the second conductor 220 and capacitor 500
Disengage, in the presence of elastic restoring force, the first clamp segment 131 and the second clamp segment 132 will again be fitted in one automatically
Rise.
Refering to Fig. 3, in certain embodiments, the first conductor 210 is fixed on the first clamp segment 131 away from holding section 110
On end (i.e. on free end), the second conductor 220 is fixed on the second clamp segment 132 away from the end for holding section 110, when first
During 131 and second 132 opened with certain angle of clamp segment of clamp segment, to drive kept between the first conductor 210 and the second conductor 220 and fit
When spacing, to adapt to the spacing on capacitor 500 between two pins 510.
Refering to Fig. 4, in other embodiments, the inner side at the middle part of the first clamp segment 131 is provided with the first clamping face 131a, the
One conductor 210 is fitted on the first clamping face 131a.The inner side at the middle part of the second clamp segment 132 is provided with the second clamping face 132a,
Second clamping face 132a is oppositely arranged with the first clamping face 131a, and the second conductor 220 is fitted on the second clamping face 132a.When
When one clamp segment 131 and the second clamp segment 132 open special angle, because the first conductor 210 and the second conductor 220 have necessarily
Length, the first conductor 210 and the second conductor 220 can be suitable for the pin 510 that distance changes within a certain range.Work as two pins
During the distance between 510 increase, the contact point distance between the conductor 210 of pin 510 and first and the second conductor 220 holds section
110 is more remote；When the distance between two pins 510 are reduced, connecing between the conductor 210 of pin 510 and first and the second conductor 220
It is nearer that contact distance holds section 110.
Refering to Fig. 2 to Fig. 4, the present invention also provides a kind of tester, and the tester includes test main frame 400 and above-mentioned
Test splice, due to using above-mentioned test splice, can guarantee that the first conductor 210 and the second conductor 220 with two pins 510 simultaneously
Contact (i.e. pin 510 is settled at one go with the electrical connection of test main frame 400), without the need for being entered to pin 510 by multiple chucks
Row multiple clamping and debugging save the testing time of tester to realize the electrical connection of pin 510 and test main frame 400,
Operating efficiency is improve, meanwhile, reduce the testing cost of tester by saving chuck and artificial quantity.
Each technical characteristic of embodiment described above can be combined arbitrarily, to make description succinct, not to above-mentioned reality
Apply all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, the scope of this specification record is all considered to be.
Embodiment described above only expresses the several embodiments of the present invention, and its description is more concrete and detailed, but and
Can not therefore be construed as limiting the scope of the patent.It should be pointed out that for one of ordinary skill in the art comes
Say, without departing from the inventive concept of the premise, some deformations and improvement can also be made, these belong to the protection of the present invention
Scope.Therefore, the protection domain of patent of the present invention should be defined by claims.
Claims (10)
1. a kind of test splice, for be connected to test main frame be molded with braid or electronic component with base two pins it
Between, it is characterised in that include：
Insulation support body, for being connected with the test main frame or hand-held；
Contact conductor, including being arranged on the insulation support body side and corresponding with pin one of them described first leads
Body, and be arranged on the insulation support body on the opposite side relative with first conductor and with pin another described
The second corresponding conductor；
Connecting wire, is connected between the test main frame and the contact conductor.
2. test splice according to claim 1, it is characterised in that the insulation support body includes holding section, and with institute
State holding section to connect and the supporting section in cone or stage body shape；Be connected with first conductor is provided with the supporting section
One mounting surface, and the second mounting surface being connected with second conductor, between first mounting surface and second mounting surface
Angle be A, wherein：15°≤A≤75°.
3. test splice according to claim 2, it is characterised in that first conductor includes and first mounting surface
First contact site of connection；Second conductor includes the second contact site being connected with second mounting surface.
4. test splice according to claim 3, it is characterised in that first conductor also includes being contacted with described first
The first rib that portion connects and fits with the holding section；And/or, second conductor also includes and second contact site
Connection and the second rib fitted with the holding section.
5. test splice according to claim 1, it is characterised in that the insulation support body includes holding section, and one end
The first clamp segment being connected with the handle part and the second clamp segment；
Wherein, when test starts, first clamp segment and second clamp segment are opened shape and are formed an angle relatively；Test
Bi Hou, first clamp segment and second clamp segment are adjacent to closure and form zero angle.
6. test splice according to claim 5, it is characterised in that first conductor is arranged on first clamp segment
On end away from the holding section, second conductor is arranged on end of second clamp segment away from the holding section
On.
7. test splice according to claim 5, it is characterised in that be provided with the middle part of first clamp segment with it is described
First clamping face of the first conductor laminating；Be provided with the middle part of second clamp segment it is corresponding with the first clamping face and
The the second clamping face fitted with the second conductor.
8. test splice according to claim 5, it is characterised in that the insulation support body is elastic insulated supporter.
9. test splice according to claim 1, it is characterised in that the connecting wire includes that being connected to described first leads
The first wire between body and the test main frame, and second be connected between second conductor and the test main frame lead
Line.
10. a kind of tester, it is characterised in that including the test any one of test main frame and claim 1 to 9
Joint.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710055143.6A CN106645823A (en) | 2017-01-24 | 2017-01-24 | Test connector and test apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710055143.6A CN106645823A (en) | 2017-01-24 | 2017-01-24 | Test connector and test apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106645823A true CN106645823A (en) | 2017-05-10 |
Family
ID=58842239
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710055143.6A Pending CN106645823A (en) | 2017-01-24 | 2017-01-24 | Test connector and test apparatus |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106645823A (en) |
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|---|---|---|---|---|
| JP2007071753A (en) * | 2005-09-08 | 2007-03-22 | Jsr Corp | Connector for measuring electric resistance, and instrument and method for measuring electric resistance of circuit board |
| TW200942790A (en) * | 2008-04-11 | 2009-10-16 | Foxconn Tech Co Ltd | Temperature sensing device |
| CN201673175U (en) * | 2010-04-01 | 2010-12-15 | 深圳市新松科技有限公司 | Improved structure of wiring terminal for testing electrical appliance |
| CN202494690U (en) * | 2012-01-05 | 2012-10-17 | 青岛海信移动通信技术股份有限公司 | Testing tool and testing instrument |
| CN204422736U (en) * | 2015-01-04 | 2015-06-24 | 京东方光科技有限公司 | A kind of LED proving installation |
| CN204462195U (en) * | 2015-01-29 | 2015-07-08 | 京东方光科技有限公司 | Electrical part test fixture |
| CN204882626U (en) * | 2015-07-30 | 2015-12-16 | 常州银河世纪微电子有限公司 | Semiconductor component's test centre gripping frock |
| CN205120758U (en) * | 2015-10-27 | 2016-03-30 | 国网天津市电力公司 | Return circuit resistance meter test wire is with isolated clip |
| CN205404746U (en) * | 2016-03-09 | 2016-07-27 | 湘能华磊光电股份有限公司 | Portable LED testing arrangement |
| CN206601408U (en) * | 2017-01-24 | 2017-10-31 | 广东风华高新科技股份有限公司 | Test splice and tester |
-
2017
- 2017-01-24 CN CN201710055143.6A patent/CN106645823A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007071753A (en) * | 2005-09-08 | 2007-03-22 | Jsr Corp | Connector for measuring electric resistance, and instrument and method for measuring electric resistance of circuit board |
| TW200942790A (en) * | 2008-04-11 | 2009-10-16 | Foxconn Tech Co Ltd | Temperature sensing device |
| CN201673175U (en) * | 2010-04-01 | 2010-12-15 | 深圳市新松科技有限公司 | Improved structure of wiring terminal for testing electrical appliance |
| CN202494690U (en) * | 2012-01-05 | 2012-10-17 | 青岛海信移动通信技术股份有限公司 | Testing tool and testing instrument |
| CN204422736U (en) * | 2015-01-04 | 2015-06-24 | 京东方光科技有限公司 | A kind of LED proving installation |
| CN204462195U (en) * | 2015-01-29 | 2015-07-08 | 京东方光科技有限公司 | Electrical part test fixture |
| CN204882626U (en) * | 2015-07-30 | 2015-12-16 | 常州银河世纪微电子有限公司 | Semiconductor component's test centre gripping frock |
| CN205120758U (en) * | 2015-10-27 | 2016-03-30 | 国网天津市电力公司 | Return circuit resistance meter test wire is with isolated clip |
| CN205404746U (en) * | 2016-03-09 | 2016-07-27 | 湘能华磊光电股份有限公司 | Portable LED testing arrangement |
| CN206601408U (en) * | 2017-01-24 | 2017-10-31 | 广东风华高新科技股份有限公司 | Test splice and tester |
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| SE01 | Entry into force of request for substantive examination | ||
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| AD01 | Patent right deemed abandoned | ||
| AD01 | Patent right deemed abandoned |
Effective date of abandoning: 20240126 |