CN106645213A - 金属板件表面腐蚀缺陷检测和评估的微波检测探头及方法 - Google Patents
金属板件表面腐蚀缺陷检测和评估的微波检测探头及方法 Download PDFInfo
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- CN106645213A CN106645213A CN201710075260.9A CN201710075260A CN106645213A CN 106645213 A CN106645213 A CN 106645213A CN 201710075260 A CN201710075260 A CN 201710075260A CN 106645213 A CN106645213 A CN 106645213A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
- G01N22/02—Investigating the presence of flaws
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/32—Polishing; Etching
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- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
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CN201710075260.9A CN106645213B (zh) | 2017-02-14 | 2017-02-14 | 金属板件表面腐蚀缺陷检测和评估的微波检测探头及方法 |
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CN201710075260.9A CN106645213B (zh) | 2017-02-14 | 2017-02-14 | 金属板件表面腐蚀缺陷检测和评估的微波检测探头及方法 |
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CN106645213A true CN106645213A (zh) | 2017-05-10 |
CN106645213B CN106645213B (zh) | 2018-03-16 |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107703159A (zh) * | 2017-09-27 | 2018-02-16 | 山东省科学院激光研究所 | 管道内壁检测系统及方法 |
CN107727736A (zh) * | 2017-09-20 | 2018-02-23 | 东华大学 | 一种利用面共振可视化技术检测复合材料结构缺陷的方法 |
CN108007943A (zh) * | 2017-11-20 | 2018-05-08 | 福建师范大学福清分校 | 基于矩阵分解的矩形波导扫频微波成像系统及检测方法 |
CN109358077A (zh) * | 2018-10-23 | 2019-02-19 | 济源市超光传感器系统工程有限公司 | 一种利用微波传感的金属裂缝检测装置 |
Citations (5)
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US6363605B1 (en) * | 1999-11-03 | 2002-04-02 | Yi-Chi Shih | Method for fabricating a plurality of non-symmetrical waveguide probes |
JP2008241711A (ja) * | 2007-03-27 | 2008-10-09 | Tohoku Univ | マイクロ波原子間力顕微鏡のマイクロ波導波プローブ |
CN102706900B (zh) * | 2012-06-01 | 2014-09-03 | 刘马宝 | 微波谐振腔检测防护层下金属结构腐蚀的装置及方法 |
CN104964990A (zh) * | 2015-06-03 | 2015-10-07 | 北京理工大学 | 一种过孔开口环谐振器加载的金属表面缺陷检测波导探头 |
CN105896205A (zh) * | 2016-06-06 | 2016-08-24 | 江苏吴通连接器有限公司 | 一种高效耦合、强度可调射频同轴连接器 |
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2017
- 2017-02-14 CN CN201710075260.9A patent/CN106645213B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6363605B1 (en) * | 1999-11-03 | 2002-04-02 | Yi-Chi Shih | Method for fabricating a plurality of non-symmetrical waveguide probes |
JP2008241711A (ja) * | 2007-03-27 | 2008-10-09 | Tohoku Univ | マイクロ波原子間力顕微鏡のマイクロ波導波プローブ |
CN102706900B (zh) * | 2012-06-01 | 2014-09-03 | 刘马宝 | 微波谐振腔检测防护层下金属结构腐蚀的装置及方法 |
CN104964990A (zh) * | 2015-06-03 | 2015-10-07 | 北京理工大学 | 一种过孔开口环谐振器加载的金属表面缺陷检测波导探头 |
CN105896205A (zh) * | 2016-06-06 | 2016-08-24 | 江苏吴通连接器有限公司 | 一种高效耦合、强度可调射频同轴连接器 |
Non-Patent Citations (1)
Title |
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马海桃: "《金属表面缺陷的微波无损检测研究》", 《太原理工大学硕士学位论文》 * |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107727736A (zh) * | 2017-09-20 | 2018-02-23 | 东华大学 | 一种利用面共振可视化技术检测复合材料结构缺陷的方法 |
CN107727736B (zh) * | 2017-09-20 | 2020-05-26 | 东华大学 | 一种利用面共振可视化技术检测复合材料结构缺陷的方法 |
CN107703159A (zh) * | 2017-09-27 | 2018-02-16 | 山东省科学院激光研究所 | 管道内壁检测系统及方法 |
CN107703159B (zh) * | 2017-09-27 | 2021-03-09 | 山东省科学院激光研究所 | 管道内壁检测系统及方法 |
CN108007943A (zh) * | 2017-11-20 | 2018-05-08 | 福建师范大学福清分校 | 基于矩阵分解的矩形波导扫频微波成像系统及检测方法 |
CN109358077A (zh) * | 2018-10-23 | 2019-02-19 | 济源市超光传感器系统工程有限公司 | 一种利用微波传感的金属裂缝检测装置 |
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Effective date of registration: 20221115 Address after: 518000 1403, Building B, Smart Home, No. 76, Baohe Avenue, Baolong Community, Baolong Street, Longgang District, Shenzhen, Guangdong Patentee after: Shenzhen Hengli Measurement and Control Technology Co.,Ltd. Address before: 1405, Haiyan building, No.3, Yingchun Road, Jiabei community, Nanhu street, Luohu District, Shenzhen, Guangdong 518000 Patentee before: SHENZHEN HIGHNESS INDUSTRIAL DEVELOPMENT Co.,Ltd. |
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