CN106597519A - Foreign particle concentration measuring system for J-TEXT Tokamak device - Google Patents
Foreign particle concentration measuring system for J-TEXT Tokamak device Download PDFInfo
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- CN106597519A CN106597519A CN201611069713.9A CN201611069713A CN106597519A CN 106597519 A CN106597519 A CN 106597519A CN 201611069713 A CN201611069713 A CN 201611069713A CN 106597519 A CN106597519 A CN 106597519A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
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Abstract
The invention discloses a foreign particle concentration measuring system for a J-TEXT Tokamak device. The foreign particle concentration measuring system comprises an X-ray optical path module, an X-ray detection module, a pulse shaping amplification module and an MCA data processing module. When the Tokamak device is cracked, a foreign gas is injected in order to suppress high-energy high-speed escape electrons, foreign particles may generate radiation and the impurity concentration is calibrated by measuring the impurity radiation intensity. Because a radiation energy pulse signal is weak, a high-sensitivity detector is used to detect the pulse signal and the high-gain pulse shaping amplification module is used to shape and amplify the pulse signal in order to output a voltage pulse signal with amplified amplitude. The MCA data processing module, according to the collected voltage pulse signal, performs energy spectrum analysis. Because different impurities have different radiation pulse peaks, the concentration of the various impurities can be determined according to the energy spectrum.
Description
Technical field
The invention belongs to Tokamak Plasma operation IMPURITY RADIATION technical field, more particularly, to a kind of J-
TEXT tokamak device foreign particle concentration measurement systems.
Background technology
Tokamak High energy particles Radiation can react high-temperature plasma internal information, the research master to fast electronic behavior
If the various radiation that caused by fast electronics are carrying out, including the cyclotron radiation frequency that the relativistic effect of fast electronics causes
Move down, bremstrahlen and recombination radiation that fast electronics and Plasma Interaction are produced；Root beta radiation Mechanism Study can be with
Obtain the density and poly- wick-like condition of heavy seeds.
The foreign particle measurement of concetration of existing tokamak device, is by by foreign particle radiation X ray optical signal
Voltage signal is converted into, process is acquired；The different voltage signal of different emittance correspondences so that particle radiation energy
Corresponding with voltage faithful linear, different foreign particle radiant intensity is different, and emittance peak value is different, measures voltage also not
Together；Quantify foreign particle concentration by data statistics processing；But the device that existing foreign particle measurement of concetration is adopted, example
Such as PDXtokamak (U.S.), HT-7U (China), HL-2A (China), surveyed using multiple tracks grenz ray plasma
Quantity research, occupancy diagnosis interface is more, and Expenses Cost is high.
The content of the invention
For the disadvantages described above or Improvement requirement of prior art, the invention provides a kind of J-TEXT tokamak devices are miscellaneous
The sub- concentration measurement system of plasmid, its object is to overcome the diagnostic external tapping quantity of J-TEXT tokamak devices and sky
Between size restriction.
For achieving the above object, according to one aspect of the present invention, there is provided a kind of J-TEXT tokamak devices impurity
Particle concentration measurement system, including the ray light path module being sequentially connected, X-ray detection X module, shaping pulse amplification module, with
And MCA data processing modules；
Wherein, ray light path module is mechanical transfer passage, for transmitting ray；Only have with J-TEXT tokamak devices
One interface, only takes up a diagnosis interface of J-TEXT tokamak devices；
X-ray detection X module is used to detect foreign particle radiation X ray, and converts optical signals into voltage signal；
Pulse signal shaping amplification module is used for the output of X-ray detection X module, pulsewidth in the other weak pulse of Microsecond grade
Signal is amplified；
MCA data processing modules are used for using the pulse signal peak-value detection method based on phase compensation, are believed according to pulse
The output signal of number shaping amplification module carries out energy spectrum analysiss, and according to the corresponding relation of impurity and pulses of radiation peak value impurity is determined
Particle concentration.
Preferably, above-mentioned ray light path module includes grenz ray light path and hard X ray light path；Grenz ray light path is in true
Under sky；Hard X ray light path has the evenly distributed detector array at least 9 roads.
Preferably, above-mentioned J-TEXT tokamak devices foreign particle concentration measurement system, the machine of its ray light path module
Tool structure includes：Diagnosis flange, the grenz ray passage connecting tube being fixed on flange, the first grenz ray insulation connection method
Blue, the second grenz ray insulation adpting flange, soft x-ray detector mounting interface pipeline, hard X ray channel bracket, hard X ray
Path channels, Hard X-ray Detector support；
By diagnosis flange, the grenz ray passage connecting tube being fixed on flange, the first grenz ray insulation connection method
Blue, the second grenz ray insulation adpting flange, soft x-ray detector mounting interface pipeline, composition grenz ray passage；
First grenz ray insulation adpting flange and the second grenz ray insulation adpting flange are socketed in successively grenz ray passage
In connecting tube, between the first grenz ray insulation adpting flange and the second grenz ray insulation adpting flange insulating washer is provided with；
Soft x-ray detector mounting interface pipeline is fixed on the top of the second grenz ray insulation adpting flange, installs outside soft for
X-ray detector；
Hard X ray passage is constituted by hard X ray channel bracket, hard X ray path channels and Hard X-ray Detector support；
Hard X ray channel bracket is hollow structure, is fixed on diagnosis flange, and its hollow part is hollow with diagnosis flange
Dock in portion；The hard X ray path channels of hollow structure are fixed on hard X ray channel bracket top, the hard X ray light of hollow structure
The volume of the hollow bulb of paths is more than the hollow bulb for hard X ray channel bracket, for expanding light-path；Hard X ray is visited
Survey the top that device is set up in hard X ray path channels.
Preferably, above-mentioned J-TEXT tokamak devices foreign particle concentration measurement system, its X-ray detection X module includes
Grenz ray probe unit arranged side by side and hard X ray probe unit；The energy measurement scope of grenz ray probe unit is 0.5KeV
～10KeV；The energy measurement scope of hard X ray probe unit is 20KeV～200KeV.
In general, by the contemplated above technical scheme of the present invention compared with prior art, can obtain down and show
Beneficial effect：
(1) the J-TEXT tokamak device foreign particle concentration measurement systems that the present invention is provided, have expanded tokamak
The diagnostic external tapping of device, overcomes the diagnostic external tapping quantity of J-TEXT tokamak devices and bulk
Restriction, can the limited diagnosis per-interface space of effectively utilizes tokamak reach and measure simultaneously grenz ray and Hard X-ray energy spectrum mesh
's；
(2) the J-TEXT tokamak device foreign particle concentration measurement systems that the present invention is provided, its ray light path module
Frame for movement in, by the grenz ray passage connecting tube that is fixed on flange, the first grenz ray insulate adpting flange, second
The felt pad that grenz ray insulate between adpting flange, and two insulation adpting flanges, plays outer locator and support Karma
Gram completely insulated effect of device, to be vortexed the interference to testing in cancellation element wall, there is provided accuracy of measurement；
(3) the J-TEXT tokamak device foreign particle concentration measurement systems that the present invention is provided are high, real with sensitivity
The characteristics of Shi Xinggao；Test result shows that system can reach the high count rate of 500,000CPS, and resolution can at 5.9KeV peaks
Up to 136eV half-peak breadths (FWHM), the high peak intensity back of the body is made an uproar than reaching (P/B) 7000:1.
Description of the drawings
Fig. 1 is that foreign particle measurement of concetration and J-TEXT tokamak devices that embodiment is provided docks schematic diagram；
Fig. 2 is the ray light path module in the J-TEXT tokamak device foreign particle measurement of concetrations that embodiment is provided
Overall structure figure；
Fig. 3 is the ray light path module in the J-TEXT tokamak device foreign particle measurement of concetrations that embodiment is provided
Structural decomposition diagram.
In all of the figs, identical reference be used for represent identical element or structure, wherein：
1- diagnosis flanges, 2- grenz ray passage connecting tubes, the grenz rays of 3- first insulation connection method, the soft X of 4- second
Ray insulation adpting flange, 5- soft x-ray detector mounting interface pipelines, 6- hard X ray channel bracket, 7- hard X ray light paths
Passage, 8- Hard X-ray Detector supports, 22- tokamak fusion generating meanss, 11- ray light path modules, 13- grenz rays lead to
Road, 23- hard X ray passages.
Specific embodiment
In order that the objects, technical solutions and advantages of the present invention become more apparent, it is right below in conjunction with drawings and Examples
The present invention is further elaborated.It should be appreciated that specific embodiment described herein is only to explain the present invention, and
It is not used in the restriction present invention.As long as additionally, technical characteristic involved in invention described below each embodiment
Not constituting conflict each other just can be mutually combined.
The J-TEXT tokamak device foreign particle concentration measurement systems that embodiment is provided, including the ray being sequentially connected
Light path module, X-ray detection X module, shaping pulse amplification module, and MCA data processing modules；As Fig. 1 is provided for embodiment
This J-TEXT tokamak devices foreign particle measurement of concetration make schematic diagram with docking for J-TEXT tokamak devices；
Wherein, 22 is tokamak fusion generating meanss, and circular section is the plasma boundary under the shape of limiter position；11 are
Ray light path module, by detector install on that module, powered to detector by external power supply module, detector it is defeated
Go out signal and be sent to the signal of the shaped amplification of shaping pulse amplification module to be sent to MCA data processing modules and carry out power spectrum point
Analysis.
Fig. 2 is the ray light path module in the J-TEXT tokamak device foreign particle measurement of concetrations that embodiment is provided
Overall structure figure；
Wherein, 13 be grenz ray optic path passage, 23 be hard X ray optic path passage, ray light path module entirety
On tokamak device diagnosis interface；The structural decomposition diagram of ray light path module is as shown in figure 3, by diagnosis interface
Flange 1, the grenz ray passage connecting tube 2 being fixed on flange, the first grenz ray insulation adpting flange 3, the second grenz ray are exhausted
Edge adpting flange 4, soft x-ray detector mounting interface pipeline 5 constitute grenz ray passage；
First grenz ray insulation adpting flange 3 and second grenz ray insulation adpting flange 4 is socketed in successively grenz ray and leads to
In road connecting tube 2, between the first grenz ray insulation adpting flange 3 and second grenz ray insulation adpting flange 4 insulation is provided with
Packing ring；Soft x-ray detector mounting interface pipeline 5 is fixed on the top of the second grenz ray insulation adpting flange 4, for Zhi An
The outside soft x-ray detector of dress；
Hard X ray is constituted by hard X ray channel bracket 6, hard X ray path channels 7 and Hard X-ray Detector support 8 to lead to
Road；Hard X ray channel bracket 6 be hollow structure, be fixed on diagnosis flange 1 on, its hollow part with diagnosis flange 1
Hollow bulb docking；The hard X ray path channels 7 of hollow structure are fixed on the top of hard X ray channel bracket 6, hollow structure
The volume of the hollow bulb of hard X ray path channels 7 is led to more than the hollow bulb for hard X ray channel bracket 6 for expanding light
Road；Hard X-ray Detector support 8 is located at the top of hard X ray path channels 7.In embodiment, penetrated as hard X using epoxy plate
Line detector support.
Soft x-ray detector in embodiment adopts XR100-SDD semiconductor silicon drifting detectors, and it is comprising high-performance
X-ray detector, preamplifier, focus cooling system, install a field-effect transistor and one new on its cooling system
Feedback circuit, internally under temperature sensor monitors, maintains -550C working environments；There is a ultra-thin Be on package casing
Window is to detect faint X signal；It can work under very short curring time and reach high energy resolution, realize counting
The perfect adaptation of rate and resolution, it utilizes Pelter effect refrigerations, volume compact, by external electric power system, with highly sensitive
Degree, fast-response speed receives plasma inside IMPURITY RADIATION.
Hard X-ray Detector in embodiment, using cadmium telluride (CdTe) semiconductor detector, with high energy resolution
Rate, works under room temperature and by the advantage of magnetic interference, and probe size is little, is adapted to do space multiple tracks in tokamak and examines
It is disconnected.
Using in, XR100-SDD semiconductor detectors are accessed in ray light path module, install close on detector tube wall
Envelope rubber ring, by swivel nut extruding sealing effectiveness is reached；To prevent interference of the tokamak device to detector, 2mm copper coins are used
The exploring block of detector is shielded.Detector has two outer connection terminals, and a port connects supply voltage, the other end
Mouth is detector detection signal outfan；Embodiment adopts XR100 detectors, and its power supply becomes for line voltage through step-down rectifier
Change 5 exported road DC level signals.
Due to foreign particle pulses of radiation pulsewidth it is shorter, be microsecond rank, and peak value is relatively low, by shaping amplifier
It is amplified；In embodiment, anti-corrosion is carried out to grenz ray signal using using 2012 amplifiers, input stage adopts difference
Form, is output as bipolar waveform, and amplification is 8～2048 times；Two-stage amplification mode is adopted to hard X ray；Embodiment institute
Using 2012 models shaping amplifier, powered by NIM reference power supplies, be single slotting width NIM plug-in units；In the plug-in unit
Amplifier unit circuit adopts LF357, totally 5 grades of amplifications, and output voltage is 0～10V；Output is improved defeated through two-way follower
The driving force for going out；By the output DC level of control power supply in embodiment, to ensure that exporting DC level is not changed
The impact of variable-gain；The amplification of shaping pulse amplification module is 8～2048 times, linear adjustable.
MCA data processing modules are used to carry out amplitude collection to the pulse signal of shaping pulse amplification module output；Due to
Pulse is Microsecond grade, therefore using the Electrosurgical treatment equipment of the fast big data handling capacity of data processing；Using multichannel pulse scope
Analysis is classified pulse by its amplitude, and is recorded and shown in corresponding passage, is thus promptly obtained
Power spectrum；IMPURITY RADIATION intensity is obtained according to frequency spectrum.
As it will be easily appreciated by one skilled in the art that the foregoing is only presently preferred embodiments of the present invention, not to
The present invention, all any modification, equivalent and improvement made within the spirit and principles in the present invention etc. are limited, all should be included
Within protection scope of the present invention.
Claims (4)
1. a kind of J-TEXT tokamak devices foreign particle concentration measurement system, it is characterised in that including penetrating for being sequentially connected
Line light path module, X-ray detection X module, shaping pulse amplification module, and MCA data processing modules；
The ray light path module is mechanical passage, for transmitting ray；The X-ray detection X module is used to detect foreign particle
Radiation X ray, and convert optical signals into voltage signal；
The pulse signal shaping amplification module is used for the output of X-ray detection X module, pulsewidth in the other weak pulse of Microsecond grade
Signal is amplified；
The MCA data processing modules are used for using the pulse signal peak-value detection method based on phase compensation, are believed according to pulse
The output signal of number shaping amplification module carries out energy spectrum analysiss, and according to the corresponding relation of impurity and pulses of radiation peak value impurity is determined
Particle concentration.
2. J-TEXT tokamak devices foreign particle concentration measurement system as claimed in claim 1, it is characterised in that described
Ray light path module includes grenz ray light path and hard X ray light path；The grenz ray light path is in vacuum environment；Hard X ray
Light path has the evenly distributed detector array at least 9 roads.
3. J-TEXT tokamak devices foreign particle concentration measurement system as claimed in claim 1 or 2, it is characterised in that
The ray light path module includes：Diagnosis flange (1), be fixed on flange grenz ray passage connecting tube (2), first
Grenz ray insulation adpting flange (3), the second grenz ray insulation adpting flange (4), soft x-ray detector mounting interface pipeline
(5), hard X ray channel bracket (6), hard X ray path channels (7), Hard X-ray Detector support (8)；
By diagnosis flange (1), grenz ray passage connecting tube (2) being fixed on flange, the insulation of the first grenz ray
Adpting flange (3), the second grenz ray insulation adpting flange (4), soft x-ray detector mounting interface pipeline (5) constitute soft X and penetrate
Line passage；
First grenz ray insulation adpting flange (3) is socketed in successively soft X and penetrates with the second grenz ray insulation adpting flange (4)
In line passage connecting tube (2), between the first grenz ray insulation adpting flange (3) and the second grenz ray insulation adpting flange (4)
It is provided with insulating washer；Soft x-ray detector mounting interface pipeline (5) is fixed on the second grenz ray insulation adpting flange (4)
Top, for outside soft x-ray detector is installed；
Hard X is constituted by the hard X ray channel bracket (6), hard X ray path channels (7) and Hard X-ray Detector support (8)
Ray channel；Hard X ray channel bracket (6) is hollow structure, is fixed in diagnosis flange (1), its hollow part with examine
The hollow bulb docking of slave interrupt interface flange (1)；The hard X ray path channels (7) of hollow structure are fixed on hard X ray channel bracket
(6) top, the volume of the hollow bulb of the hard X ray path channels (7) of hollow structure is more than for hard X ray channel bracket (6)
Hollow bulb, for expanding light-path；Top of the Hard X-ray Detector support (8) located at hard X ray path channels (7).
4. J-TEXT tokamak devices foreign particle concentration measurement system as claimed in claim 1 or 2, it is characterised in that
The X-ray detection X module includes grenz ray probe unit and hard X ray probe unit arranged side by side；Grenz ray probe unit
Energy measurement scope is 0.5KeV～10KeV；The energy measurement scope of hard X ray probe unit is 20KeV～200KeV.
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| CN201611069713.9A CN106597519B (en) | 2016-11-29 | 2016-11-29 | A kind of J-TEXT tokamak devices foreign particle concentration measurement system |
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| CN201611069713.9A CN106597519B (en) | 2016-11-29 | 2016-11-29 | A kind of J-TEXT tokamak devices foreign particle concentration measurement system |
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Cited By (4)
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| CN109632854A (en) * | 2019-01-14 | 2019-04-16 | 东华理工大学 | A kind of online xrf analysis instrument of blocky uranium ore multielement of double detecting structures |
| CN111063458A (en) * | 2019-12-25 | 2020-04-24 | 中国科学院合肥物质科学研究院 | Device and method for accurately calibrating plasma injection impurities |
| CN113566448A (en) * | 2021-07-13 | 2021-10-29 | 中国科学院上海微系统与信息技术研究所 | Cooling device for soft X-ray spectroscopy test |
| CN114114375A (en) * | 2021-11-22 | 2022-03-01 | 核工业西南物理研究院 | Plasma thermionic measurement system and measurement method |
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| CN113566448A (en) * | 2021-07-13 | 2021-10-29 | 中国科学院上海微系统与信息技术研究所 | Cooling device for soft X-ray spectroscopy test |
| CN114114375A (en) * | 2021-11-22 | 2022-03-01 | 核工业西南物理研究院 | Plasma thermionic measurement system and measurement method |
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