CN106597270A - Structure and method for examining optical probe in arc protection apparatus - Google Patents
Structure and method for examining optical probe in arc protection apparatus Download PDFInfo
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- CN106597270A CN106597270A CN201611121623.XA CN201611121623A CN106597270A CN 106597270 A CN106597270 A CN 106597270A CN 201611121623 A CN201611121623 A CN 201611121623A CN 106597270 A CN106597270 A CN 106597270A
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- 238000012795 verification Methods 0.000 claims description 17
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
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Abstract
The invention discloses a structure and method for examining an optical probe in an arc protection apparatus. The center of the optical probe is provided with 2 light source emitter. The optical probe is evenly and symmetrically provided with a plurality of receivers on outer rings of the light source emitters. Of the 2 light source emitters, one light source emitter A (101) emits a visible light source at a wavelength of 520-640nm, a sensitive wavelength band of the optical probe, and the other light source emitter B (102) emits light at a wavelength of 200-2000nm. The 2 light source emitters assume the shape of a semi-circle and are assembled tightly to constitute a circle. A plurality of receivers are symmetrically arranged around the light sources, and the plurality of receivers are at even number. According to the invention, the structure and the method have the following beneficial effects: in the process of examination, mathematical models can be constructed based on actual varying attenuation of light sources along with varying distances; the structure and the method can examine optical probes for different common wavelengths in an easy and fast manner on the basis of sensors from different factories. The structure and the method have high examination accuracy. Examination of optical probes has high practical value, better market value and prospect.
Description
Technical field
This patent is related to the detection field of arc light protecting device optic probe, more particularly to a kind of arc short-circuit verification light
The apparatus and method for learning probe.
Background technology
With the fast development of electrical network, 110kV and above have the protective measure of comparative maturity, 6kV
(10kV) to the confession armature that station-service IVdistribution switch cabinet in 35kV this voltage class ranges is full factory's subsidiary engine/electric power system
Whether knob, can cut off rapidly failure when there is internal fault, to the safe operation of full factory (transformer station) distribution system to closing weight
Will, but by current protection scheme：In power system, the bus of 35kV and following electric pressure is not due to stably asking
Topic, does not typically install bus protection.However, due to the outlet on middle voltage bus bar it is many, frequent operation, three-phase conductor wire spacing
It is closer with the distance of the earth, easily endangered by toy, device fabrication quality is poorer than high pressure equipment, apparatus insulated aging and machine
Tool weares and teares, and service condition is severe, and system operation conditions change, and the reason such as artificial and operation mistake, the failure of middle voltage bus bar are several
Rate is more much higher than high pressure, supertension bus.But for a long time, protection of the people to middle voltage bus bar is paid little attention to always, mostly
Failure on bus is cut off using the back-up protection with larger time delay, is often developed failure, expanded.
In view of the critical role of middle pressure bus, the time delay excision of any failure, is all that we are extremely unwilling that what is seen shows
Shape, because the high temperature that produces when occurring of arclight in switch cubicle, high pressure, arc light, vibration, plosive are set to correlations such as switch cubicles
It is standby to cause serious damage, or even feed through to transformator, burning for transformator is caused, seriously jeopardizes the safety of the person, so as to make
Into huge economic loss.Such as power supply administration of Anhui electric power company 220kV transformer stations 35kV switch cubicle maloperation electric arcs in 2009
Light accident causes a people dead；Chongqing Station Service Electrical-Energy incoming line cabinet current transformer insulated electro arc fault causes to stop within 2009
Machine and house transformer depot repair；Yunnan Power Grid Company " 2.24 " accident in 2011, Nujiang transformer station of power supply administration is because of electric arc
Light accident causes a people dead.
As operation for many years shows that arc protection brings greatly infringement to the person and equipment inside mesolow power distribution cabinet, respectively
State electric power expert starts arclight failure is studied and recognized.International Electrotechnical Commission IEC has revised its IEC60298-
2003 standards Medium Voltage Switchgear internal arc light failure Producing reason, solution and method of testing, Canadian electric power and
Electronic manufacture ACSA (EEMAC) has formulated the test rule of metallic armoured switch cabinet resistance under conditions of arc fault internally
Then, the U.S. presses the test directive/guide of arc fault inside metallic armoured switch cabinet in having published IEEE C37.20.7.In addition the U.S. exists
Accident is dodged for electric arc arc of lighting in terms of electric power occupational safety production establish relevant criterion and requirement, American National fire prevention association
(NFPA), as a supplement of American National electric power specification (NBC), having formulated NFPA 70E-2004 occupation electric power safeties will
Seek standard.The country is according to IEC60298-2003 standard formulations China existing standard GB 3906-2006《3.6kV～40.5kV is handed over
Stream metal enclosed switchgear and control device》, internal arc level switchgear and control device (IAC) are defined, inside which
Fault electric arc test determination is the type approval test that must be done.
In recent years due to the continuous understanding to Internal faults arc characteristic parameter, Medium Voltage Switchgear correlation new standard is to preventing arc
The importance for installing special middle voltage bus bar protection, user are emphasized in the continuous improvement of light failure requirements, domestic some experts always
It also is intended to provide that a kind of cost is low, principle is simple, it is adaptable to the bus protection of 6-35kV, to reduce bus to greatest extent
Infringement of the failure to equipment, there is provided power supply reliability, arises at the historic moment as the special mother line arc light protecting system of prestissimo, it
Can not only be advantageously applied in new clothes switch cubicle also easily can be attached in the switch cubicle for having run, its target is exactly
Arc fault is cut off in one time minimizes personal injury and equipment damage, compared with other special bus protections has price
Advantage.
At present on the market using it is wider for electric current and optic probe as arc light protecting device detection probe, but the spy
Head arc light is difficult to verify, and then determines its optical accuracy.Application number：201610506888.5, patent name is：Arc protection
Device to test instrument, is verified using look-up table to optic probe detection signal, and this method does not account for the decay feelings of light source
Condition, thus there is the situation that not high precision, check results and practical situation have greater difference in actual checking procedure, therefore this
Patent is also to carry out in this context.
The content of the invention
The present invention mainly overcomes application number：201610506888.5, patent name is：Arc light protecting device tester, it is real
Border checking procedure has that not high precision, check results and practical situation have greater difference, while considering the decay of light source
Situation, designs a kind of new structure and mathematical algorithm,
The content of the invention of the present invention is as follows：
The structure of optic probe in a kind of verification arc light protecting device, the invention is characterised in that：At the center of optic probe
Place is provided with 2 light source emitters, receives several have been uniformly and symmetrically distributed positioned at 2 light source emitter outer shroud optic probes
Device；In 2 light source emitters, one of light source emitter A launches the visible light source of optic probe sensitive wave length section, its wavelength
For the visible ray of 520nm-640nm, light of another light source emitter B launch wavelengths for 200nm-2000nm；2 light source transmittings
Semicircular in shape becomes circular to spelling to abut to device respectively；Receptor is symmetrical centered on light source, and described several quantity take idol
It is several.
Receptor of the present invention is preferably 4 or 6 or 8.
The using method of optic probe structure in a kind of verification arc light protecting device, the invention is characterised in that：Step one：Light
Source emitter A is calibrated in Third Party Authentication mechanism, and main calibration information is accuracy situation；
Step 2：According to mathematic graph analysis method, the optical attenuation distance of light source emitter A and light source emitter B is determined；
Step 3：Light source emitter A provides calibration algorithm to light source emitter B, and under the conditions of drawing different distance, light source is sent out
The calibration factor of emitter B；
Step 4：Output light intensity calculating is carried out to light source emitter B, optics is drawn using the data of light source emitter B
The precision of probe.
Mathematic graph analysis method of the present invention refers to, ad distances, can by according to trapezoidal computing formula, according to ab away from
With a distance from, bc, cd distances calculate ad distances, concrete ad=sqrt ((cd-ab) * (cd-ab)+bc*bc).
Calibration algorithm of the present invention is：Certain wavelength light source attenuation degree is represented with φ, it is strong which is defined as light source emitter output
Spend the ratio with input intensity, φ=IGo out/IEnter, IGo outRepresent that light source emitter sends the size of light intensity, IEnterRepresent optic probe detection
To the size of light intensity, as light source sends light under conditions of the distance difference of arc light protecting device optic probe receiving light, light
Attenuation degree difference is larger, and embodiments are：When distance is more than or equal to 10cm, and when being less than 2m, φ is presented letter with distance
Number relation, between preferably 2 times functions and 3 functions；When distance is more than or equal to 2m, and when being less than 4m, φ with distance is in
Existing linear relationship, slope are preferably greater than or equal to 2；When distance is when more than or equal to 4m, φ is presented power exponent relation with distance.
In calibration algorithm of the present invention, optic probe detects light intensity, refers to receptor and receives arc light protecting device optics
Probe reflexes to the light of receptor.
Calibration algorithm of the present invention assumes that light source emitter A, light source emitter B optical attenuations are in the same size.
What the present invention was implemented has the beneficial effect that；
1st, in considering checking procedure, according to light source with apart from the different practical situation of differential declines, structure mathematical model
Compensate；
2nd, the optic probe school of common different wave length can conveniently and efficiently be carried out according to live different manufacturers sensor situation
Test.
3rd, verify accuracy higher.
4th, whole verifying work practical value is high, has preferable market value and prospect.
Description of the drawings
Fig. 1 is a kind of structure of optic probe in verification arc light protecting device；
Fig. 2 is the mathematic graph of distance calculating during optical monitoring device.
Specific embodiment
As shown in figure 1, a kind of structure for verifying optic probe in arc light protecting device, the invention is characterised in that：In optics
The center of probe is provided with 2 light source emitters, if being uniformly and symmetrically distributed positioned at 2 light source emitter outer shroud optic probes
Dry receptor；In 2 light source emitters, one of light source emitter A101 launches the visible of optic probe sensitive wave length section
Light source, visible ray of its wavelength for 520nm-640nm, another light source emitter B102 launch wavelengths are 200nm-2000nm's
Light；2 light source emitters respectively semicircular in shape to spelling against becoming circular；Receptor is symmetrical centered on light source, described
Several quantity take even number.So distribution can symmetrically receive light source information, but be distributed excessive and there is the factors such as manufacturing cost,
It is generally preferred to 4 or 6 or 8.
The present invention provides a kind of method for verifying optic probe in arc light protecting device, and starting point is：According to light in space
The concrete condition of decay, there is provided a kind of standby light by monitoring standby light input, output situation, is obtained beside light source generator
Go out light source generator defeated under Different Altitude Regions, different humiture bars, different distance, the inferior factor interference of different illumination conditions
Enter output situation, and then draw the accuracy situation of arc light protecting device optic probe.
A kind of method of optic probe in verification arc light protecting device, it is characterised in that：Step one：Light source emitter 101
In Third Party Authentication, mechanism is calibrated, and main calibration information is accuracy situation；Step 2：According to mathematic graph analysis side
Method, determines the optical attenuation distance of light source emitter 101 and light source emitter 102；Step 3：Light source emitter 101 is sent out to light source
Emitter 102 provides calibration algorithm, draws the calibration factor of light source emitter 102 under the conditions of different distance.Step 4：Light source is sent out
Emitter 102 carries out output light intensity calculating, draws the precision of optic probe using the data of light source emitter 102.Mathematic graph
Analysis method refers to, according to ad distances in distance-measuring equipment direct measurement Fig. 2, it is also possible to by according to trapezoidal computing formula, according to ab
Distance, bc distances, cd distances calculate ad distances.Calibration algorithm is：Certain wavelength light source attenuation degree is represented with φ, its definition
For the ratio of 101 output intensity of light source emitter and input intensity, φ=IGo out/IEnter, IGo outRepresent that light source emitter sends the big of light intensity
It is little, IEnterRepresent that optic probe detects the size of light intensity, as light source sends light to arc light protecting device optic probe receiving light
Under different condition, optical attenuation degree difference it is larger, embodiments are：When distance is more than or equal to 10cm, and it is less than 2m
When, φ is presented functional relationship with distance, between preferably 2 times functions and 3 functions；When distance is more than or equal to 2m, and it is little
When 4m, φ is presented linear relationship with distance, and slope is preferably greater than or equal to 2；When distance more than or equal to 4m when, φ with away from
From presentation power exponent relation.In calibration algorithm, optic probe detects light intensity, refers to receptor and receives arc light protecting device
Optic probe reflexes to the light of receptor.Calibration algorithm assumes light source emitter 101,102 optical attenuation size base of light source emitter
This is consistent.
One of the present invention is embodied as example,
As shown in figure 1, light source emitter 101,102 is rounded symmetrical, light source emitter 101 and light source emitter
102 is adjacent, it is assumed that optical attenuation size is basically identical, and light source emitter 101 launches the visible light source of optic probe sensitive wave length section,
Preferably：Visible ray of the wavelength in 520nm-640nm, light of 102 launch wavelength of light source emitter in 200nm-2000nm, connect
Receive device symmetrical centered on light source, Fig. 1 is 4, as shown in Fig. 2 c positions are light source emitter position, d positions are reception
Device position, o, a, b position are the position of arc light protecting device arc probe, and o is the geometric center of arc probe, and b is arc light
The center of detecting head surface, edges of a for arc probe surface, when light source emitter launches arc probe light, arc light is visited
Head reflects light into receptor d again, and determination methods are as follows：
Step one：Light source emitter 101 is calibrated in Third Party Authentication mechanism, and main calibration information is accuracy feelings
Condition, provides the detection data of receptor under different distance, different light-intensity conditions；
Step 2：First by the method such as infrared range-measurement system or physical distance measurement, ab, bc distance is drawn.Cd distances can be led to
Cross Fig. 1 structures to learn, then calculated by the trapezoidal distance of mathematics, determine the light decay of light source emitter 101 and light source emitter 102
Subtract apart from ad；
Step 3：Light source emitter 101 to the launching light simultaneously of light source emitter 102, according to IGo outRepresent that light source emitter is sent out
Go out the size of light intensity, IEnterRepresent that optic probe detects the size of light intensity, according to calibration algorithm, calculate light source emitter 101
Attenuation quotient, light source emitter 101 provide calibration algorithm to light source emitter 102, draw light source transmitting under the conditions of different distance
The calibration factor of device 102；Calibration algorithm is using the fitting of the combination of function such as power function, linear function, many power functions；
Step 4：Output light intensity calculating is carried out to light source emitter 102, is drawn using the data of light source emitter 102
The precision of optic probe.
In sum, the present invention provides a kind of structures and methods of optic probe in verification arc light protecting device, Ke Yishi
The verification of existing arc light protecting device optic probe, according to light source with apart from the different practical situation of differential declines, structure mathematics
Model is compensated, and the optics that according to live different manufacturers sensor situation, can conveniently and efficiently carry out common different wave length is visited
Head verification, with accuracy it is high, practical value is high the features such as, improve verification efficiency, reduce power off time to a certain extent.
The above, for the person of ordinary skill of the art, can be with technology according to the present invention scheme and technology
Other various corresponding changes and deformation are made in design, and all these changes and deformation should all belong to appended right of the invention
The protection domain of requirement.
Claims (7)
1. it is a kind of verification arc light protecting device in optic probe structure, it is characterised in that：2 are provided with the center of optic probe
Individual light source emitter, is being uniformly and symmetrically distributed several receptors positioned at 2 light source emitter outer shroud optic probes；2 light
In the emitter of source, one of light source emitter A (101) launches the visible light source of optic probe sensitive wave length section, and its wavelength is
The visible ray of 520nm-640nm, light of another light source emitter B (102) launch wavelength for 200nm-2000nm；2 light sources
Semicircular in shape becomes circular to spelling to abut to emitter respectively；Receptor is symmetrical centered on light source, described several quantity
Take even number.
2. it is according to claim 1 it is a kind of verification arc light protecting device in optic probe structure, it is characterised in that receive
Device is preferably 4 or 6 or 8.
3. it is according to claim 1 it is a kind of verification arc light protecting device in optic probe structure using method, its feature
It is：
Step one：Light source emitter A (101) is calibrated in Third Party Authentication mechanism, and calibration information is accuracy situation；
Step 2：According to mathematic graph analysis method, the light decay of light source emitter A (101) and light source emitter B (102) is determined
Subtract distance；
Step 3：Light source emitter A (101) provides calibration algorithm to light source emitter B (102), under the conditions of drawing different distance
The calibration factor of light source emitter B (102)；
Step 4：Output light intensity calculating is carried out to light source emitter B (102), is obtained using the data of light source emitter B (102)
Go out the precision of optic probe.
4. it is according to claim 3 it is a kind of verification arc light protecting device in optic probe method, it is characterised in that：Mathematics
Graph analysis method refers to, ad distances, by according to trapezoidal computing formula, being calculated according to ab distances, bc distances, cd distances
Ad distances, concrete ad=sqrt ((cd-ab) * (cd-ab)+bc*bc).
5. it is according to claim 3 it is a kind of verification arc light protecting device in optic probe method, it is characterised in that：Calibration
Algorithm is：Certain wavelength light source attenuation degree is represented with φ, its be defined as light source emitter (101) output intensity and input intensity it
Than φ=IGo out/IEnter, IGo outRepresent that light source emitter sends the size of light intensity, IEnterRepresent that optic probe detects the size of light intensity, with
Light source send light to arc light protecting device optic probe receiving light distance difference under conditions of, optical attenuation degree difference compared with
Greatly, embodiments are：When distance is more than or equal to 10cm, and when being less than 2m, φ is presented functional relationship with distance, and preferably 2
Between secondary function and 3 functions；When distance is more than or equal to 2m, and when being less than 4m, φ is presented linear relationship, slope with distance
Preferably greater than or equal to 2；When distance is when more than or equal to 4m, φ is presented power exponent relation with distance.
6. it is according to claim 5 it is a kind of verification arc light protecting device in optic probe method, it is characterised in that：Calibration
In algorithm, optic probe detects light intensity, refers to receptor and receives arc light protecting device optic probe and reflexes to receptor
Light.
7. it is according to claim 5 it is a kind of verification arc light protecting device in optic probe method, it is characterised in that：Calibration
Algorithm assumes that light source emitter A (101), light source emitter B (102) optical attenuation are in the same size.
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| CN201611121623.XA CN106597270B (en) | 2016-12-08 | 2016-12-08 | The structure of optic probe in a kind of verification arc light protecting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611121623.XA CN106597270B (en) | 2016-12-08 | 2016-12-08 | The structure of optic probe in a kind of verification arc light protecting device |
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| CN106597270A true CN106597270A (en) | 2017-04-26 |
| CN106597270B CN106597270B (en) | 2019-05-31 |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6084756A (en) * | 1999-01-22 | 2000-07-04 | Eaton Corporation | Apparatus for testing protection of an electric power distribution circuit by an arc fault circuit breaker |
| CN204065289U (en) * | 2014-09-22 | 2014-12-31 | 山东中瑞电气有限公司 | For the checkout equipment of arc light protecting device |
| CN106019135A (en) * | 2016-07-01 | 2016-10-12 | 南京五石金传感技术有限公司 | Testing instrument for arc protection device |
-
2016
- 2016-12-08 CN CN201611121623.XA patent/CN106597270B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6084756A (en) * | 1999-01-22 | 2000-07-04 | Eaton Corporation | Apparatus for testing protection of an electric power distribution circuit by an arc fault circuit breaker |
| CN204065289U (en) * | 2014-09-22 | 2014-12-31 | 山东中瑞电气有限公司 | For the checkout equipment of arc light protecting device |
| CN106019135A (en) * | 2016-07-01 | 2016-10-12 | 南京五石金传感技术有限公司 | Testing instrument for arc protection device |
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| CN106597270B (en) | 2019-05-31 |
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Effective date of registration: 20191119 Address after: 650217 Yunnan city of Kunming province by the West Development Zone No. 105 Yunnan Co-patentee after: Electric Power Research Institute of Yunnan Power System Ltd Patentee after: Yunnan Electric Power Test Research Institute (Group) Co., Ltd. Address before: 650217 Yunnan city of Kunming province by the West Development Zone No. 105 Yunnan Co-patentee before: Electric Power Research Institute of Yunnan Power System Ltd Patentee before: Yunnan Electric Power Test Research Institute (Group) Co., Ltd. Co-patentee before: Kunming Dafang Automatic Control Science and Technology Co., Ltd. |