CN106569066B - A kind of method and device detecting the bus capacitor service life - Google Patents

A kind of method and device detecting the bus capacitor service life Download PDF

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Publication number
CN106569066B
CN106569066B CN201610957383.0A CN201610957383A CN106569066B CN 106569066 B CN106569066 B CN 106569066B CN 201610957383 A CN201610957383 A CN 201610957383A CN 106569066 B CN106569066 B CN 106569066B
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parameter
bus capacitor
duty
temperature
service life
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CN106569066A (en
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张春涛
蔡雄兵
崔兆雪
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Huawei Digital Power Technologies Co Ltd
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Xian Huawei Technologies Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The embodiment of the present application provides a kind of method and device for detecting the bus capacitor service life, is related to electronic technology field, can be improved the accuracy for estimating the remaining life of bus capacitor, provides for plant maintenance replacement capacitor and accurately and effectively refers to.Concrete scheme includes: to acquire bus capacitor in the duty parameter at current time, according to the duty parameter at current time and default corresponding relationship, entire life value of the bus capacitor under the duty parameter at current time is obtained, remaining lifetime value of the bus capacitor current time under standard condition is calculated.The application is for detecting the bus capacitor service life.

Description

A kind of method and device detecting the bus capacitor service life
Technical field
This application involves electronic technology field more particularly to a kind of method and devices for detecting the bus capacitor service life.
Background technique
In switch power supply equipment, bus capacitor belongs to vulnerable part, and it is great that bus capacitor failure will lead to power-supply system generation Accident.Therefore, accurately know the service life of bus capacitor, safeguard replacement to it in time, can avoid losing as far as possible.
Currently, the Switching Power Supply sold in the market, with uninterruptible power system (full name in English: uninterruptable Power System, UPS) for product, the service life of bus capacitor generallys use countdown method and the capacitance of bus capacitor calculates Method obtains.
Bus capacitor service life countdown method is to test bus capacitor under the worst operating condition of product to obtain the capacitor service life, According to the product runing time countdown capacitor service life, the remaining life of bus capacitor is obtained.But product actual motion state with Product test state differs widely, and therefore, service life and the actual conditions for the capacitor that countdown method obtains are not inconsistent.Possible capacitor does not lose Effect just obtains condenser failure by countdown method, causes device waste.
The capacitance calculating method of bus capacitor is to record bus capacitor two by additionally increasing a capacitor discharging circuit electric discharge The voltage difference at a time point judges bus capacitance to judge the bus service life.This method can only be surveyed in the product unsocial hours Examination, cannot obtain in time the capacitor service life.And condenser failure is all not fully capacitance variation, therefore, the capacitance of bus capacitor The bus capacitor service life that calculating method obtains is not inconsistent with actual conditions yet.
It follows that the method in existing two kinds of acquisition bus capacitor service life, obtained bus capacitor service life are not smart enough Really, capacitor can not being replaced for plant maintenance, effective reference is provided.
Summary of the invention
The embodiment of the present application provides a kind of method and device for detecting the bus capacitor service life, can be improved and estimates bus capacitor Remaining life accuracy, replace capacitor for plant maintenance and provide and accurately and effectively refer to.
In order to achieve the above objectives, the application adopts the following technical scheme that
The application's in a first aspect, provide a kind of method for detecting the bus capacitor service life, applied to the detection bus capacitor longevity The device of the device of life, the detection bus capacitor service life can be some or all of terminal.Detection bus provided by the present application The method in capacitor service life may include: the duty parameter for acquiring bus capacitor at current time, and one group of duty parameter includes determining The parameter of bus capacitor service life temperature parameter;Then according to the duty parameter at current time and default corresponding relationship, bus is obtained Entire life value L of the capacitor under the duty parameter at current time, default corresponding relationship is for indicating different duty parameters and bus The relationship of entire life value of the capacitor under different duty parameters, alternatively, default corresponding relationship for indicate different duty parameters with The relationship of service life temperature parameter of the bus capacitor under different duty parameters, service life temperature parameter is for calculating L;The mother is calculated again Remaining lifetime value of the line capacitance current time under standard conditionLr is one-time detection before current time Remaining lifetime value of the bus capacitor under standard condition, t is for current time apart from preceding one-time detection bus capacitor in standard condition Under remaining lifetime value duration;When acquiring the duty parameter of bus capacitor for the first time, Lr is bus capacitor under standard condition Benchmark life value, t be for the first time acquire bus capacitor duty parameter at the time of apart from bus capacitor start to work the moment when It is long.
So, during scheme provided by the present application detects the bus capacitor service life, due to presetting corresponding relationship Including service life temperature parameter strong correlation of the content from bus capacitor under different duty parameters, so according to default corresponding relationship The service life temperature parameter strong correlation of the L and bus capacitor got.And then it ensure that the bus capacitor current time of calculating is marking Remaining lifetime value and bus capacitor service life temperature parameter strong correlation under quasi- operating condition.According to the service life of electrical type device and device This principle of temperature strong correlation is it is found that according to the lifetime results precision of the bus capacitor of the service life temperature parameter of bus capacitor calculating It is high.Therefore, scheme provided by the present application can be improved the accuracy for estimating the remaining life of bus capacitor, replace for plant maintenance Capacitor offer accurately and effectively refers to.
Wherein, the service life of capacitor element is usually determined by the temperature of device in device corresponding device operational process, by the temperature Degree is referred to as bus capacitor service life temperature parameter.And in equipment running process, the temperature of internal components can not be measured directly, but The temperature of device can be determined by some measurable parameters, and the parameter for determining the temperature of device is referred to as duty parameter, work Condition parameter is to determine the parameter of bus capacitor service life temperature parameter.
With reference to first aspect, in one possible implementation, duty parameter includes locating for bus capacitor corresponding device The output loading factor of the temperature of environment, the input voltage of bus capacitor and bus capacitor.
With reference to first aspect or any of the above-described kind of possible implementation, in alternatively possible implementation, in order to In the service life for realizing quickly detection bus capacitor, the resources occupation rate of the device in detection bus capacitor service life is reduced, improves processing speed Degree, default corresponding relationship can be used to indicate that entire life value of the different duty parameters from bus capacitor under different duty parameters Relationship.Correspondingly, obtaining L specifically may be implemented according to the duty parameter at bus capacitor current time and default corresponding relationship are as follows: It inquires in default corresponding relationship and whether there is the first duty parameter, each parameter point in the duty parameter at bus capacitor current time Not in the first duty parameter in the resolving range of each parameter;If there are the first duty parameters in default corresponding relationship, obtain It presets in corresponding, entire life value of the bus capacitor under the first duty parameter is as the L.In this process, it is equivalent to directly In default corresponding relationship, L read, it is convenient and efficient.As long as the type foot of the different duty parameters in default corresponding relationship Enough full up, the process in the service life of whole detection bus capacitor will shorten very much.
With reference to first aspect or any of the above-described kind of possible implementation, in alternatively possible implementation, if work Condition parameter includes that the output of the temperature of bus capacitor corresponding device local environment, the input voltage of bus capacitor and bus capacitor is negative Load rate, in the duty parameter at bus capacitor current time each parameter respectively in the first duty parameter each parameter resolution model In enclosing, specifically include: the temperature of environment in the duty parameter at bus capacitor current time, the environment temperature in the first duty parameter Resolving range in, the input voltage in the duty parameter at bus capacitor current time, the input voltage in the first duty parameter Resolving range in, the output loading factor in the duty parameter at bus capacitor current time exports negative in the first duty parameter In the resolving range of load rate.
Wherein, the resolving range of a parameter, is preset section, which can directly use in default corresponding relationship Interval value indicates, can also preset in corresponding relationship again, be indicated with a value, obtain resolving range area after the positive and negative extension of this value Between.
With reference to first aspect or any of the above-described kind of possible implementation, in alternatively possible implementation, in order to The integrality of guarantee scheme is needed when the first duty parameter is not present in default corresponding relationship according in default corresponding relationship Existing duty parameter obtains the service life temperature parameter for calculating the bus capacitor service life, and to obtain L, default corresponding relationship can To be also used to table on the basis of for indicating the entire life value of different duty parameters and bus capacitor under different duty parameters Show the relationship of service life temperature parameter of the different duty parameters from bus capacitor under different duty parameters.Correspondingly, pre- in inquiry If with the presence or absence of after the first duty parameter in corresponding relationship, the method also includes: if there is no the in default corresponding relationship Service life temperature parameter of the bus capacitor in default corresponding relationship under the second duty parameter is subtracted temperature difference by one duty parameter Value, obtains service life temperature parameter of the bus capacitor under the duty parameter at current time;Then according to bus capacitor when current Service life temperature parameter under the duty parameter at quarter substitutes into preset bus capacitor life formula, L is calculated.Wherein, warm Degree difference is that the environment temperature in the second duty parameter subtracts the environment temperature in the duty parameter at current time;Bus capacitor is worked as Each parameter in the duty parameter at preceding moment in addition to environment temperature, respectively in the second duty parameter in addition to environment temperature Each parameter resolving range in.
With reference to first aspect or any of the above-described kind of possible implementation, in alternatively possible implementation, if work Condition parameter further includes the input voltage and bus capacitor of bus capacitor in addition to the temperature of bus capacitor corresponding device local environment Output loading factor, each parameter in the duty parameter at bus capacitor current time in addition to environment temperature, respectively second It in the resolving range of each parameter of the service life temperature parameter of decision bus capacitor in duty parameter, specifically includes: bus electricity Hold the input voltage in the duty parameter at current time, in the second duty parameter in the resolving range of input voltage, bus electricity Hold the output loading factor in the duty parameter at current time, in the second duty parameter in the resolving range of output loading factor.
With reference to first aspect or any of the above-described kind of possible implementation, in alternatively possible implementation, in order to The storage resource for saving the device in detection bus capacitor service life, reduces the data volume in default corresponding relationship to the greatest extent, presets and corresponds to Relationship can be used to indicate that the relationship of service life temperature parameter of the different duty parameters from bus capacitor under different duty parameters.Phase It answers, according to the duty parameter at bus capacitor current time and default corresponding relationship, obtaining L specifically be may be implemented are as follows: inquiry is pre- If corresponding relationship, service life temperature parameter of the bus capacitor under the duty parameter at current time is obtained;Worked as according to bus capacitor Service life temperature parameter under the duty parameter at preceding moment substitutes into the preset bus capacitor life formula, is calculated L。
With reference to first aspect or any of the above-described kind of possible implementation, in alternatively possible implementation, for Default corresponding relationship is inquired, service life temperature parameter of the bus capacitor under the duty parameter at current time is obtained, it specifically can be real It is existing are as follows: inquiring in default corresponding relationship whether there is the first duty parameter;If there are the first duty parameter in default corresponding relationship, Service life temperature parameter of the default corresponding median generatrix capacitor under the first duty parameter is obtained, as bus capacitor at current time Service life temperature parameter under duty parameter;It, will be in default corresponding relationship if the first duty parameter is not present in default corresponding relationship Service life temperature parameter of the bus capacitor under the second duty parameter, subtracts temperature gap, obtains bus capacitor at current time Service life temperature parameter under duty parameter.
With reference to first aspect or any of the above-described kind of possible implementation, in alternatively possible implementation, in order to Preset bus capacitor life formula is adapted to, the content of bus capacitor service life temperature parameter is the preset bus capacitor service life The temperature value for needing to obtain in calculation formula.Bus capacitor service life temperature parameter includes bus capacitor body temperature and bus capacitor Interior nuclear temperature, alternatively, bus capacitor service life temperature parameter includes nuclear temperature in bus capacitor.
With reference to first aspect or any of the above-described kind of possible implementation, in alternatively possible implementation, bus Capacitor service life temperature parameter includes the body temperature of bus capacitor and the interior nuclear temperature of bus capacitor, preset bus capacitor service life Calculation formula are as follows:Wherein, Ld is the bus capacitor that provides of bus capacitor producer specification in direct current work Make the nominal service life under voltage;To is that the nominal highest of the bus capacitor that provides of bus capacitor producer specification guarantees temperature;T For itself environment temperature of bus capacitor;K is that the nominal ripple current of the bus capacitor that provides of bus capacitor producer specification accelerates The factor;Δ T is that the interior nuclear temperature of bus capacitor subtracts the body temperature of bus capacitor.
With reference to first aspect or any of the above-described kind of possible implementation, in alternatively possible implementation, if female Line capacitance service life temperature parameter includes the interior nuclear temperature of bus capacitor, the preset bus capacitor life formula are as follows:
Second aspect, the embodiment of the invention provides a kind of device for detecting the bus capacitor service life, which be may be implemented The function of the above method, described device can also execute corresponding software realization by hardware realization by hardware.It is described Hardware or software include one or more above-mentioned corresponding modules of function.
In conjunction with second aspect, in one possible implementation, in the structure of the device include processor and transceiver, The processor is configured as that the device is supported to execute the above method.The transceiver is for supporting between the device and other network elements Communication.The device can also include memory, which saves the necessary program of the device and refer to for coupling with processor Order and data.
The third aspect, the embodiment of the invention provides a kind of computer storage mediums, for being stored as used in above-mentioned apparatus Computer software instructions, it includes for executing program designed by above-mentioned aspect.
The scheme that above-mentioned second aspect or the third aspect provide, the detection bus electricity provided for realizing above-mentioned first aspect Hold the method in service life, therefore identical beneficial effect can be reached with first aspect, is no longer repeated herein.
Detailed description of the invention
Technical solution in ord to more clearly illustrate embodiments of the present application, below will be in embodiment or description of the prior art Required attached drawing is briefly described, it should be apparent that, the accompanying drawings in the following description is only some realities of the application Example is applied, it for those of ordinary skill in the art, without any creative labor, can also be attached according to these Figure obtains other attached drawings.
Fig. 1 is a kind of equipment configuration diagram provided by the embodiments of the present application;
Fig. 2 is a kind of structural schematic diagram of device for detecting the bus capacitor service life provided by the embodiments of the present application;
Fig. 3 is a kind of flow diagram of method for detecting the bus capacitor service life provided by the embodiments of the present application;
Fig. 4 is that a kind of acquisition bus capacitor service life provided by the embodiments of the present application is total under the duty parameter at current time The flow diagram of the method for life value;
Fig. 5 is another acquisition bus capacitor service life provided by the embodiments of the present application under the duty parameter at current time The flow diagram of the method for entire life value;
Fig. 6 is the structural schematic diagram of the device in another detection bus capacitor service life provided by the embodiments of the present application;
Fig. 7 is the structural schematic diagram of the device in another detection bus capacitor service life provided by the embodiments of the present application.
Specific embodiment
Below in conjunction with the attached drawing in the embodiment of the present application, technical solutions in the embodiments of the present application carries out clear, complete Site preparation description, it is clear that described embodiments are only a part of embodiments of the present application, instead of all the embodiments.It is based on Embodiment in the application, it is obtained by those of ordinary skill in the art without making creative efforts every other Embodiment shall fall in the protection scope of this application.
It should be noted that for the ease of clearly describing the technical solution of the embodiment of the present application, in embodiments herein In, it uses the printed words such as " first ", " second " and function and the essentially identical identical entry of effect or similar item is distinguished, ability Field technique personnel are understood that the printed words such as " first ", " second " are not defined quantity and execution order.
Basic principle of the invention is: using the principle of the temperature strong correlation in the service life and device of electrical type device, according to The corresponding relationship of the temperature of device and collectable duty parameter, acquisition obtain the temperature of duty parameter and calculating device service life Value, the service life for calculating device.In device corresponding device operational process, by acquiring duty parameter, corresponding relationship is inquired Obtain device lifetime.Device lifetime is got by temperature, substantially increases the accuracy of detection device lifetime.
The method in detection bus capacitor service life provided in an embodiment of the present invention, applied in equipment framework as shown in Figure 1. The equipment framework can be switch power supply equipment or other need the equipment in sensing capacitor part service life, the embodiment of the present invention pair This is without specifically limiting.
Specifically, equipment framework shown in FIG. 1 includes functions of the equipments unit 10, the device 20 for detecting the bus capacitor service life. It include the bus capacitor 101 for needing to detect the service life in functions of the equipments unit 10.
It should be noted that for the internal structure and function of functions of the equipments unit 10, depending on the function of equipment framework, It is not be described in detail herein, also without limiting.
In framework shown in Fig. 1, the method in detection bus capacitor service life provided in an embodiment of the present invention is applied particularly to On the device 20 for detecting the bus capacitor service life.The device 20 in bus capacitor service life is detected by testing in functions of the equipments unit 10 Point is tested, and obtains bus capacitor in the duty parameter at current time to execute detection bus electricity provided in an embodiment of the present invention Hold the method in service life.
Fig. 2 shows be that a kind of structure of device 20 for detecting the bus capacitor service life relevant to various embodiments of the present invention is shown It is intended to.
As shown in Fig. 2, the device 20 in detection bus capacitor service life may include: processor 201, memory 202, communicate always Line 203.
Memory 202 is transferred to the processor 201 for storing program code, and by the program code, so as to processor 201 execute the various functions that program code realizes the device 20 in detection bus capacitor service life.Memory 202 can be volatibility and deposit Reservoir (volatile memory), such as random access memory (full name in English: random-access memory, RAM); Or nonvolatile memory (full name in English: non-volatile memory), such as read-only memory (full name in English: Read-only memory, ROM), flash memory (full name in English: flash memory), hard disk (full name in English: hard Disk drive, HDD) or solid state hard disk (full name in English: solid-state drive, SSD);Or the storage of mentioned kind The combination of device.
Processor 201 is the control centre for detecting the device 20 in bus capacitor service life, can be a central processing unit (English Literary full name: central processing unit, CPU), it is also possible to specific integrated circuit (full name in English: Application Specific Integrated Circuit, ASIC), or be arranged to implement the one or more of the embodiment of the present invention Integrated circuit, such as: one or more microprocessors (full name in English: digital singnal processor, DSP), or, One or more field programmable gate array (full name in English: Field Programmable Gate Array, FPGA).Place Reason device 201 can be by running or execute the program code being stored in memory 202, and calls and be stored in memory 202 Interior data realize the various functions of the device 20 in detection bus capacitor service life.
Wherein, communication bus 203 can be industry standard architecture (full name in English: Industry Standard Architecture, ISA) bus, external equipment interconnection (full name in English: Peripheral Component, PCI) bus or expansion Open up industry standard architecture (full name in English: Extended Industry Standard Architecture, EISA) bus Deng.The bus 203 can be divided into address bus, data/address bus, control bus etc..For convenient for indicating, only with a thick line in Fig. 2 It indicates, it is not intended that an only bus or a type of bus.
With reference to the accompanying drawing, the embodiment of the present invention is specifically addressed.
On the one hand, the embodiment of the present invention provides a kind of method for detecting the bus capacitor service life, is applied to the embodiment of the present invention The device in the detection bus capacitor service life of offer.As shown in figure 3, the method may include:
S301, bus capacitor is acquired in the duty parameter at current time.
Wherein, at the time of current time refers to execution S301, which can be system time or other are used to embody At the time of time point, as long as during carrying into execution a plan, using metering at the same time.
It include the parameter for determining bus capacitor service life temperature parameter in duty parameter, duty parameter can acquire measurement Parameter.
Optionally, for the process of acquisition duty parameter, following two kinds of implementations be can include but is not limited to:
The collector for acquiring parameters in duty parameter is deployed in mode 1, the equipment belonging to bus capacitor. After these collectors acquire duty parameter, it is transmitted to the device in detection bus capacitor service life.Detect the device in bus capacitor service life The duty parameter of bus capacitor at various moments can be directly obtained.
Wherein, collector can be sensor, or the chip etc. with acquisition function.The embodiment of the present invention is for acquisition The type of device is without specifically limiting.
Mode 2 disposes the acquisition for acquiring parameters in duty parameter in the device in detection bus capacitor service life Device.The acquisition port of these collectors is connected to inside equipment belonging to bus capacitor, and the operating condition for acquiring bus capacitor is joined Number.
It should be noted that can be selected according to actual needs above two for the implementation for acquiring duty parameter Other modes except mode, the embodiment of the present invention is to this without specifically limiting.
Further, duty parameter may include at least one of parameters described below: ring locating for bus capacitor corresponding device The temperature in border, the output loading factor of bus capacitor input voltage and bus capacitor.
Bus capacitor service life temperature parameter, refers to the temperature that can be used for calculating the service life of bus capacitor.Optionally, bus electricity Holding service life temperature parameter may include the body temperature of bus capacitor and the interior nuclear temperature of bus capacitor.Alternatively, the bus capacitor longevity Life temperature parameter may include the interior nuclear temperature of bus capacitor.
In general, bus capacitor service life temperature parameter is difficult to obtain, realize complicated and difficult.And directly acquire bus capacitor Service life temperature parameter, can speed-up capacitor failure.Therefore, bus capacitor service life temperature parameter (can be determined according to duty parameter Parameter) with the corresponding relationship of bus capacitor service life temperature parameter mother is got according to corresponding relationship when collecting duty parameter Line capacitance service life temperature parameter, to calculate the service life of bus capacitor.
Wherein, the service life of capacitor element is usually determined by the temperature of device in device corresponding device operational process, by the temperature Degree is referred to as bus capacitor service life temperature parameter.And in equipment running process, the temperature of internal components can not be measured directly, but The temperature of device can be determined by some measurable parameters, will determine that the parameter of the temperature of device is referred to as to determine bus capacitor The duty parameter of aging effects temperature.
It should be noted that for the parameter for the decision bus capacitor service life temperature parameter for including in duty parameter, it can be with It determines according to actual needs, the embodiment of the present invention is to this without specifically limiting.
Certainly, the content of parameter that the duty parameter of the service life temperature parameter of bus capacitor includes is determined, it can be according to reality Demand adjustment.The particular content that duty parameter for the service life temperature parameter of decision bus capacitor includes, the embodiment of the present invention To this without specifically limiting.
Further, for determining the duty parameter of the service life temperature parameter of bus capacitor and the service life temperature of bus capacitor The corresponding relationship of parameter can be obtained with experimental test.The embodiment of the present invention no longer repeats this process.
S302, duty parameter and default corresponding relationship according to bus capacitor at current time obtain bus capacitor and are working as Entire life value L under the duty parameter at preceding moment.
Wherein, default corresponding relationship can be used to indicate that different duty parameters from bus capacitor under different duty parameters The relationship of entire life value.Alternatively, default corresponding relationship can be used to indicate that different duty parameters from bus capacitor in different operating conditions The relationship of service life temperature parameter under parameter.Specifically, bus capacitor service life temperature parameter is for calculating L.
Optionally, presetting corresponding relationship both can be used to indicate that different duty parameters from bus capacitor in different duty parameters Under entire life value relationship, can be also used for indicating service life of the different duty parameters from bus capacitor under different duty parameters Temperature parameter.
It should be noted that the content for including in default corresponding relationship, can test in the lab belonging to bus capacitor The model machine of equipment acquire.It during the test, can operation by exhaustive mode, to equipment belonging to bus capacitor Operating condition be classified as according to the output loading factor of the temperature of local environment, the input voltage of bus capacitor and bus capacitor all kinds of Duty parameter.The service life temperature parameter of bus capacitor under each duty parameter, and establish duty parameter and service life temperature parameter Corresponding relationship.By the default corresponding relationship of foundation, inquiry when storing the service life for detecting bus capacitor.
Further, during the test, the service life temperature parameter of the capacitor under each operating condition is tested, and calculates each operating condition ginseng The entire life value of number Down Highway capacitor, establishes the corresponding relationship of the entire life value of duty parameter and bus capacitor.
Further, it when Self -adaptive presets corresponding relationship, in order to guarantee data cover rate when use, presets and corresponds to The classification for the duty parameter for including in relationship can be detailed as far as possible, it is ensured that data cover rate when use is as far as possible Greatly.For presetting the categorical measure for the duty parameter for including in corresponding relationship, can set according to actual needs, the present invention is implemented Example is to this without specifically limiting.
Specifically, in data test statistics, since similar duty parameter data difference is seldom, in order to save default pair It should be related to the storage resource of occupancy, be tested working hour also for reducing, each group of duty parameter for including in default corresponding relationship can To set resolving range, if point of the multiple groups duty parameter of i.e. actual test a certain group of duty parameter all in default corresponding relationship It distinguishes in range, then this multiple groups duty parameter is matched with the duty parameter.
Wherein, the resolving range of one group of duty parameter, the resolving range including each parameter in this group of duty parameter.One The resolving range of a parameter is a pre-set interval.The resolving range section of parameter can pass through a numerical value expression, the numerical value Positive and negative preset value in then be parameter resolution section.Alternatively, the resolving range section of parameter can also pass through an interval table Show.The embodiment of the present invention is to this without specifically limiting.
Further, presetting the duty parameter for including in corresponding relationship can be the data of actual test, be also possible to roll over Calculate the parameter under standard condition.The embodiment of the present invention is to this also without specifically limiting.
Optionally, standard condition can be 25 degree of environment temperatures, 220 volts of (V) input voltages and 100% output loading factor.
Illustratively, as shown in table 1, table 2, table 3, three kinds of different contents that default corresponding relationship includes are illustrated.With Duty parameter is the temperature of bus capacitor corresponding device local environment, the output of the input voltage and bus capacitor of bus capacitor is negative For load rate.
Table 1
Illustratively, in table 2 and table 3, service life temperature parameter is by taking the interior nuclear temperature of bus capacitor as an example.
Table 2
Environment temperature (DEG C) Input voltage (V) Output loading factor Interior nuclear temperature (DEG C)
25 223.7 10% 37.71
…… …… …… ……
25 225.8 50% 42.47
…… …… …… ……
25 220.6 100% 49
Table 3
It should be noted that above-mentioned table 1 only by way of example carries out the content in default corresponding relationship to table 3 It illustrates, is not specifically to be limited the content and data that include in default corresponding relationship.In practical applications, may be used With according to actual test as a result, obtaining the content in default corresponding relationship.
It should also be noted that, above-mentioned indicate default corresponding relationship with table, only example is described, and is not to default pair The form that should be related to is defined.It in practical applications, can be using matrix table as the form of expression for presetting corresponding relationship.
Illustratively, by taking the duty parameter that table 1 includes into table 3 as an example, the resolving range of duty parameter uses a number Value embodies in table.The resolving range of environment temperature is numerical value itself in table.The resolving range of input voltage is that numerical value adds in table The range for subtracting 10.Output loading factor is the range of data plus-minus 5% in table.Assuming that collected current time duty parameter is 25 Degree, 220V input voltage, 50% loads, then 25 in table degree, 225.8V input voltage, and 50% loads this duty parameter In resolving range, with 25 degree in table, 225.8V input voltage, 50% loads the matching of this duty parameter.
Further, in S302, duty parameter and default corresponding relationship according to bus capacitor at current time are obtained The specific implementation process of entire life value L of the bus capacitor under the duty parameter at current time depends in default corresponding relationship Including content, can specifically include but be not limited to following two kinds of situations.
The first situation: default corresponding relationship is for indicating different duty parameters from bus capacitor under different duty parameters Entire life value relationship.
In the first case, as shown in figure 4, executing S302 can specifically include:
S3021, it inquires in default corresponding relationship with the presence or absence of the first duty parameter.
Specifically, executing S3022 if being inquired in default corresponding relationship in S3021 there are the first duty parameter.
Wherein, bus capacitor each parameter each ginseng in the first duty parameter respectively in the duty parameter at current time In several resolving ranges.
Illustratively, it is assumed that include temperature, the bus capacitor of bus capacitor corresponding device local environment in duty parameter The output loading factor of input voltage and bus capacitor, then, bus capacitor each parameter point in the duty parameter at current time Do not refer in the resolving range of each parameter in the first duty parameter: ring of the bus capacitor in the duty parameter at current time Border temperature is in the first duty parameter in the resolving range of environment temperature;Bus capacitor is defeated in the duty parameter at current time Enter voltage in the first duty parameter in the resolving range of input voltage;Bus capacitor is defeated in the duty parameter at current time Load factor is in the first duty parameter in the resolving range of output loading factor out.
S3022, it obtains in default correspond to, entire life value of the bus capacitor under the first duty parameter is as L.
It should be noted that if the content covering surface sufficiently complete for the duty parameter for including in default corresponding relationship, then in advance If certainly existing the first duty parameter in corresponding relationship, the purpose of S302 only can be completed by executing S3021 and S3022.
Further, if the first duty parameter is not present in default corresponding relationship, presetting corresponding relationship is including bus electricity It further include service life temperature of the bus capacitor under different duty parameters on the basis of holding the entire life value under different duty parameters Parameter.If inquiring in S3021 in default corresponding relationship and the first duty parameter being not present, also need to execute after S3021 S3023 and S3024, to complete the purpose of S302.
S3023, the service life temperature parameter by bus capacitor in default corresponding relationship under the second duty parameter, subtract temperature Difference obtains service life temperature parameter of the bus capacitor under the duty parameter at current time.
Wherein, temperature gap is that the environment temperature in the second duty parameter subtracts the environment in the duty parameter at current time Temperature.Each parameter of the bus capacitor in the duty parameter at current time in addition to environment temperature is joined in the second operating condition respectively In the resolving range of each parameter in number in addition to environment temperature.For the resolving range of parameter, carry out in front detailed It describes in detail bright, is no longer repeated herein.
S3024, the service life temperature parameter according to bus capacitor under the duty parameter at current time, substitute into preset bus Capacitor life formula, is calculated L.
It should be noted that preset bus capacitor life formula can be preset, or by bus capacitor factory Family's specification provides, and the embodiment of the present invention is to this without specifically limiting.All service life temperature parameters by bus capacitor calculate The formula in bus capacitor service life all can serve as preset bus capacitor life formula, belong to protection model of the invention It encloses.
Second situation: default corresponding relationship is only used for indicating different duty parameters from bus capacitor in different duty parameters Under service life temperature parameter relationship.
In second situation, as shown in figure 5, executing S302 can specifically include S302a and S302b:
S302a, default corresponding relationship is inquired, obtains service life temperature ginseng of the bus capacitor under the duty parameter at current time Number.
Specifically, the process of default corresponding relationship is inquired in S302a, it is similar to the query process in S3021.Simply retouch The detailed process for realizing S302a is stated, may include steps of a to step c:
Step a, inquiring in default corresponding relationship whether there is the first duty parameter.
Wherein, the first duty parameter has been described in detail in S3021, has no longer been repeated herein.
Specifically, if thening follow the steps b there are the first duty parameter in default corresponding relationship;If in default corresponding relationship There is no the first duty parameters, then follow the steps c.
Step b, it obtains in default correspond to, service life temperature parameter of the bus capacitor under the first duty parameter, as bus Service life temperature parameter of the capacitor under the duty parameter at current time.
Step c, the service life temperature parameter by default corresponding relationship median generatrix capacitor under the second duty parameter, subtracts temperature Difference obtains service life temperature parameter of the bus capacitor under the duty parameter at current time.
Wherein, step c is identical as above-mentioned S3023, is no longer repeated herein.
S302b, the service life temperature parameter according to bus capacitor under the duty parameter at current time, substitute into preset bus Capacitor life formula, is calculated L.
Optionally, preset bus capacitor life formula can be with are as follows:
Correspondingly, bus capacitor service life temperature parameter includes the body temperature of bus capacitor and the kernel temperature of bus capacitor Degree.
Wherein, Ld is nominal service life of the bus capacitor under direct-current working volts;To is that bus capacitor is nominal most Height guarantees temperature;T is itself environment temperature of bus capacitor;K is the nominal ripple current accelerated factor of bus capacitor;Δ T is The interior nuclear temperature of bus capacitor subtracts the body temperature of bus capacitor.
Further, Ld, To, K are the parameter that provides in the vendor specifications of bus capacitor.
Illustratively, Ld is 2000 hours, To is 105 degree, and K is 2 or 4.
Further, due to the body temperature of itself environment temperature T of bus capacitor and bus capacitor can consider it is identical, It is considered that T=Tc, therefore, above-mentioned formula 1 can simplify as following formula 2 so in above-mentioned formula:
I.e. preset bus capacitor life formula are as follows:Correspondingly, bus capacitor service life temperature Parameter includes the interior nuclear temperature of bus capacitor.
S303, remaining lifetime value of the bus capacitor current time under standard condition is calculated
Wherein, Lr is remaining lifetime value of the bus capacitor under standard condition of one-time detection before current time;T is current The duration of remaining lifetime value of the moment apart from preceding one-time detection bus capacitor under standard condition parameter.
Further, when detecting the bus capacitor service life for the first time, Lr is benchmark service life of the bus capacitor under standard condition Value, t are duration at the time of acquiring the duty parameter of bus capacitor for the first time apart from the bus capacitor start-up operation moment.
Specifically, t is equivalent to runing time of the bus capacitor under the duty parameter at current time, then, bus capacitor Life reduction value under the duty parameter at current time is thenTherefore, service life of the bus capacitor under standard condition reduces Value is then
Specifically, since the duty parameter of bus capacitor changes in real time, the work of current working not necessarily subsequent time Condition.When detecting the bus capacitor service life each time, remaining lifetime value pair of the bus capacitor current time under standard condition is calculated There is better reference significance in user, the remaining lifetime value of the bus capacitor of detection is continuous.Further, detection is female next time It when the line capacitance service life, is reduced on the basis of the remaining lifetime value that preceding one-time detection obtains, calculates bus capacitor current time Remaining lifetime value under standard condition has reference significance to detection next time.
It should be noted that the duration of t can be set according to actual needs.If smaller, the mother detected of t setting The service life of line capacitance is more accurate.Preferably, t can be 1 hour.
It should be noted that benchmark life value of the bus capacitor under standard condition, can set according to actual needs.It is logical Often, benchmark life value of the bus capacitor under standard condition provides specification by bus capacitor manufacturer.
Further, can be continued by periodically executing the method provided by the invention for detecting the bus capacitor service life The detection bus capacitor service life.
Further, after S303, residue of the bus capacitor current time that can be will test under standard condition Life value is shown to user by the monitoring interface of equipment belonging to bus capacitor.
Explanation is needed further exist for, the embodiment of the present invention only describes the method in detection bus capacitor service life, this method It can also be applied to detect the service life of other capacitor elements, specific implementation is not limited to the embodiment that the application is proposed.
During the method in detection bus capacitor service life provided in an embodiment of the present invention, since default corresponding relationship includes Service life temperature parameter strong correlation of the content from bus capacitor under different duty parameters, so being obtained according to default corresponding relationship The service life temperature parameter strong correlation of the L and bus capacitor arrived.And then it ensure that the bus capacitor current time of calculating in standard work Remaining lifetime value and bus capacitor service life temperature parameter strong correlation under condition.According to the temperature in the service life of electrical type device and device This principle of strong correlation is it is found that high according to the lifetime results precision of the bus capacitor of the service life temperature parameter of bus capacitor calculating. Therefore, scheme provided by the present application can be improved the accuracy for estimating the remaining life of bus capacitor, for plant maintenance replacement electricity Hold to provide and accurately and effectively refer to.
It is described below by process of the citing to the method in detection bus capacitor service life provided by the invention.
Illustratively, it is assumed that default corresponding relationship is as shown in table 4.Benchmark life value of the bus capacitor under standard condition be 12 years.
Table 4
Illustratively, it is assumed that at some moment, acquiring duty parameter of the bus capacitor at current time for the first time is 25 degree, 220V input voltage, 50% load, and the bus capacitor has run 4380 hours (6 months, i.e., 0.5 year), passes through 4 institutes of tabling look-up The default corresponding relationship shown determines that the duty parameter at current time is being worked as in the resolving range of operating condition 5 to get to bus capacitor Total preceding life value is 17.41 under the duty parameter at preceding moment.
So, which has run 0.5 year under the duty parameter at current time, i.e. the service life reduces 0.5 year, quite In service life reduction 0.34 under standard condition, remaining longevity of the bus capacitor current time under standard condition can be calculated Life value is 12-0.34=11.66.
On this basis, operation a period of time, into the period in next detection bus capacitor service life.Assuming that collecting mother Duty parameter of the line capacitance at current time is 25 degree, 220V input voltage, 80% load, and current time once adopts apart from preceding When a length of 4380 hours (6 months, i.e., 0.5 year) for collecting bus capacitor duty parameter pass through to table look-up and preset corresponding close shown in 4 System determines that the duty parameter at current time is joined in the resolving range of operating condition 8 to get the operating condition to bus capacitor at current time Several lower total preceding life values are 9.73.
So, which has run 0.5 year under the duty parameter at current time, i.e. the service life reduces 0.5 year, quite In service life reduction 0.62 under standard condition, remaining longevity of the bus capacitor current time under standard condition can be calculated Life value is 11.66-0.62=11.04.
It should be noted that this example only describes to execute the detection bus capacitor service life twice, it is not specifically to limit.
It is above-mentioned mainly from detection the bus capacitor service life device the course of work angle to provided in an embodiment of the present invention Scheme is described.It is understood that the device in detection bus capacitor service life is in order to realize the above functions, it comprises hold The corresponding hardware configuration of each function of row and/or software module.Those skilled in the art should be readily appreciated that, in conjunction with herein Disclosed in embodiment description each exemplary unit and algorithm steps, the present invention can be soft with hardware or hardware and computer The combining form of part is realized.Some functions is executed in a manner of hardware or computer software driving hardware actually, is depended on In the specific application and design constraint of technical solution.Professional technician can carry out using difference each specific application Method realizes described function, but such implementation should not be considered as beyond the scope of the present invention.
The embodiment of the present invention can carry out functional module according to device of the above method example to the detection bus capacitor service life Division two or more functions can also be integrated for example, each functional module of each function division can be corresponded to In a processing module.Above-mentioned integrated module both can take the form of hardware realization, can also use software function mould The form of block is realized.It should be noted that being schematical, only a kind of logic to the division of module in the embodiment of the present invention Function division, there may be another division manner in actual implementation.
In the case where each function division of use correspondence each functional module, Fig. 6 shows involved in above-described embodiment And detection the bus capacitor service life device 20 a kind of possible structural schematic diagram.The device 20 for detecting the bus capacitor service life wraps It includes: acquisition unit 601, acquiring unit 602, computing unit 603.Acquisition unit 601 is used to support the detection bus capacitor service life Device 20 executes the process S301 in Fig. 3;Acquiring unit 602 is used to support the device 20 in detection bus capacitor service life to execute Fig. 3 In process S302;Computing unit 603 is used to support the device 20 in detection bus capacitor service life to execute the process S303 in Fig. 3. Wherein, the function that all related contents for each step that above method embodiment is related to can quote corresponding function module is retouched It states, details are not described herein.
Using integrated unit, Fig. 7 shows the detection bus capacitor longevity involved in above-described embodiment A kind of possible structural schematic diagram of the device 20 of life.The device 20 for detecting the bus capacitor service life may include: processing module 701, communication module 702.Processing module 701 is used to carry out control management to the movement of the device 20 in detection bus capacitor service life. For example, the process S301 to S303 in the execution of device 20 Fig. 3 that processing module 701 is used to support to detect the bus capacitor service life, and/ Or other processes for techniques described herein.Communication module 702 is used to support the device 20 in detection bus capacitor service life With the communication of other network entities.The device 20 for detecting the bus capacitor service life can also include memory module 703, for storing inspection Survey the program code and data of the device 20 in bus capacitor service life.
Wherein, processing module 701 can be in the entity structure of the device 20 in detection bus capacitor service life shown in Fig. 2 Processor 201 can be processor or controller.Such as can be CPU, general processor, DSP, ASIC, FPGA or other Programmable logic device, transistor logic, hardware component or any combination thereof.It, which may be implemented or executes, combines this hair Various illustrative logic blocks, module and circuit described in bright disclosure.The processor 201 is also possible to realize meter The combination of function is calculated, such as is combined comprising one or more microprocessors, DSP and the combination of microprocessor etc..Communication module 702 can be communication port, or can be transceiver, transmission circuit or communication interface etc..Memory module 703 can be Fig. 2 Shown in detection the bus capacitor service life device 20 entity structure in memory 202.
When processing module 701 is processor, and memory module 703 is memory, inspection involved in Fig. 7 of the embodiment of the present invention The device 20 for surveying the bus capacitor service life can be the device 20 in detection bus capacitor service life shown in Fig. 2.
The step of method in conjunction with described in the disclosure of invention or algorithm can realize in a manner of hardware, can also It is realized in a manner of being to execute software instruction by processor.Software instruction can be made of corresponding software module, software mould Block can be stored on RAM, flash memory, ROM, Erasable Programmable Read Only Memory EPROM (Erasable Programmable ROM, EPROM), Electrically Erasable Programmable Read-Only Memory (Electrically EPROM, EEPROM), register, hard disk, movement are hard In the storage medium of disk, CD-ROM (CD-ROM) or any other form well known in the art.A kind of illustrative storage Medium couples to enable a processor to from the read information, and can be written to the storage medium and believe to processor Breath.Certainly, storage medium is also possible to the component part of processor.Pocessor and storage media can be located in ASIC.In addition, The ASIC can be located in core network interface equipment.Certainly, pocessor and storage media can also be used as discrete assembly and be present in In core network interface equipment.
It is apparent to those skilled in the art that for convenience and simplicity of description, the system of foregoing description, The specific work process of device and unit, can refer to corresponding processes in the foregoing method embodiment, and details are not described herein.
In several embodiments provided herein, it should be understood that disclosed system, device and method can be with It realizes by another way.For example, the apparatus embodiments described above are merely exemplary, for example, the unit It divides, only a kind of logical function partition, there may be another division manner in actual implementation, such as multiple units or components It can be combined or can be integrated into another system, or some features can be ignored or not executed.Another point, it is shown or The mutual coupling, direct-coupling or communication connection discussed can be through some interfaces, the indirect coupling of device or unit It closes or communicates to connect, can be electrical or other forms.
The unit as illustrated by the separation member may or may not be physically separated, aobvious as unit The component shown may or may not be physical unit, it can and it is in one place, or may be distributed over multiple In network unit.It can select some or all of unit therein according to the actual needs to realize the mesh of this embodiment scheme 's.
It, can also be in addition, each functional unit in each embodiment of the application can integrate in one processing unit It is that the independent physics of each unit includes, can also be integrated in one unit with two or more units.Above-mentioned integrated list Member both can take the form of hardware realization, can also realize in the form of hardware adds SFU software functional unit.
The above-mentioned integrated unit being realized in the form of SFU software functional unit can store and computer-readable deposit at one In storage media.Above-mentioned SFU software functional unit is stored in a storage medium, including some instructions are used so that a computer The portion of equipment (can be personal computer, server or the network equipment etc.) execution each embodiment the method for the application Step by step.And storage medium above-mentioned includes: USB flash disk, mobile hard disk, read-only memory (Read-Only Memory, abbreviation ROM), random access memory (Random Access Memory, abbreviation RAM), magnetic or disk etc. are various can store The medium of program code.
Finally, it should be noted that above embodiments are only to illustrate the technical solution of the application, rather than its limitations;Although The application is described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: it still may be used To modify the technical solutions described in the foregoing embodiments or equivalent replacement of some of the technical features; And these are modified or replaceed, each embodiment technical solution of the application that it does not separate the essence of the corresponding technical solution spirit and Range.

Claims (16)

1. a kind of method for detecting the bus capacitor service life characterized by comprising
Bus capacitor is acquired in the duty parameter at current time, wherein the duty parameter includes determining the bus capacitor longevity Order the parameter of temperature parameter;
Bus capacitor service life temperature parameter refers to the temperature value for influencing the bus capacitor service life;
According to the duty parameter at the current time and default corresponding relationship, the bus capacitor is obtained at the current time Entire life value L under duty parameter, wherein the default corresponding relationship is for indicating different duty parameters and the bus capacitor The relationship of entire life value under different duty parameters, alternatively, the default corresponding relationship for indicate different duty parameters with The relationship of service life temperature parameter of the bus capacitor under different duty parameters, the service life temperature parameter are described for calculating L;
Calculate remaining lifetime value of the bus capacitor current time under standard conditionWherein, in non-head When the secondary detection bus capacitor service life, the Lr be the current time before one-time detection the bus capacitor in standard work Remaining lifetime value under condition, the t is for the current time apart from bus capacitor described in the preceding one-time detection in standard condition Under remaining lifetime value duration;When detecting the bus capacitor service life for the first time, the Lr is the bus capacitor in standard Benchmark life value under operating condition, the t are at the time of acquiring the duty parameter of the bus capacitor for the first time apart from the bus electricity Hold the duration at moment of starting to work.
2. the method according to claim 1, wherein the duty parameter includes at least one in parameters described below It is a: the temperature of the bus capacitor corresponding device local environment, the bus capacitor input voltage and the bus capacitor it is defeated Load factor out.
3. method according to claim 1 or 2, which is characterized in that the default corresponding relationship is for indicating different operating conditions The relationship of entire life value of the parameter from the bus capacitor under different duty parameters, the operating condition according to the current time Parameter and default corresponding relationship obtain entire life value L of the bus capacitor under the duty parameter at the current time, packet It includes:
It inquires in the default corresponding relationship with the presence or absence of the first duty parameter, wherein in the duty parameter at the current time Each parameter is respectively in first duty parameter in the resolving range of each parameter;
If there are the first duty parameters in the default corresponding relationship, obtain in the default correspondence, the bus capacitor is in institute The entire life value under the first duty parameter is stated as the L.
4. according to the method described in claim 3, it is characterized in that, the default corresponding relationship is also used to indicate different operating condition ginsengs The relationship of service life temperature parameter of the number from the bus capacitor under different duty parameters, the duty parameter includes the bus The temperature of capacitor corresponding device local environment;
The duty parameter and default corresponding relationship according to the current time, obtains the bus capacitor when described current Entire life value L under the duty parameter at quarter further include:
If first duty parameter is not present in the default corresponding relationship, by the bus capacitor in the default corresponding pass Service life temperature parameter in system under the second duty parameter, subtracts temperature gap, obtains the bus capacitor at the current time Duty parameter under service life temperature parameter, wherein the temperature gap be second duty parameter in environment temperature subtract The environment temperature in the duty parameter at the current time is gone, in the duty parameter at the current time in addition to environment temperature Each parameter, respectively in the resolving range of each parameter in second duty parameter in addition to environment temperature;
By service life temperature parameter of the bus capacitor under the duty parameter at the current time, the preset bus is substituted into The L is calculated in capacitor life formula.
5. method according to claim 1 or 2, which is characterized in that the default corresponding relationship is for indicating different operating conditions The relationship of service life temperature parameter of the parameter from the bus capacitor under different duty parameters, it is described according to the current time Duty parameter and default corresponding relationship obtain entire life value L of the bus capacitor under the duty parameter at the current time, Include:
The default corresponding relationship is inquired, service life temperature of the bus capacitor under the duty parameter at the current time is obtained Parameter;
By service life temperature parameter of the bus capacitor under the duty parameter at the current time, the preset bus is substituted into The L is calculated in capacitor life formula.
6. according to the method described in claim 5, it is characterized in that, the duty parameter includes the bus capacitor corresponding device The temperature of local environment, the inquiry default corresponding relationship, obtains the bus capacitor in the operating condition at the current time Service life temperature parameter under parameter, comprising:
It inquires in the default corresponding relationship with the presence or absence of the first duty parameter, wherein in the duty parameter at the current time Each parameter is respectively in first duty parameter in the resolving range of each parameter;
If there are first duty parameters in the default corresponding relationship, obtain in the default correspondence, the bus capacitor Service life temperature parameter under first duty parameter, as the bus capacitor under the duty parameter at the current time Service life temperature parameter;
If first duty parameter is not present in the default corresponding relationship, by the electricity of bus described in the default corresponding relationship Hold the service life temperature parameter under the second duty parameter, subtracts temperature gap, obtain the bus capacitor at the current time Duty parameter under service life temperature parameter, wherein the temperature gap be second duty parameter in environment temperature subtract The environment temperature in the duty parameter at the current time is gone, in the duty parameter at the current time in addition to environment temperature Each parameter, respectively in the resolving range of each parameter in second duty parameter in addition to environment temperature.
7. -2,4,6 described in any item methods according to claim 1, which is characterized in that the bus capacitor service life temperature parameter The interior nuclear temperature of body temperature and the bus capacitor including the bus capacitor, alternatively, the bus capacitor service life temperature Parameter includes the interior nuclear temperature of the bus capacitor.
8. the method according to the description of claim 7 is characterized in that
If the bus capacitor service life temperature parameter includes the body temperature of the bus capacitor and the kernel of the bus capacitor Temperature, the preset bus capacitor life formula are as follows:
Wherein, the Ld is nominal service life of the bus capacitor under direct-current working volts, and the To is the bus The nominal highest of capacitor guarantees temperature, and T is the environment temperature of itself of the bus capacitor, and the K is the bus capacitor mark The ripple current accelerated factor of title, the Δ T are that the interior nuclear temperature of the bus capacitor subtracts this body temperature of the bus capacitor Degree;
If the bus capacitor service life temperature parameter includes the interior nuclear temperature of the bus capacitor, the preset bus electricity Hold life formula are as follows:
9. a kind of device for detecting the bus capacitor service life characterized by comprising
Acquisition unit, for acquiring bus capacitor in the duty parameter at current time, wherein the duty parameter includes determining institute State the parameter of bus capacitor service life temperature parameter;
Bus capacitor service life temperature parameter refers to the temperature value for influencing the bus capacitor service life;
Acquiring unit, the duty parameter and default corresponding relationship at the current time for being acquired according to the acquisition unit, Obtain entire life value L of the bus capacitor under the duty parameter at the current time, wherein the default corresponding relationship is used In the relationship for indicating entire life value of the different duty parameters from the bus capacitor under different duty parameters, alternatively, described pre- If corresponding relationship is for indicating service life temperature parameter of the different duty parameters from the bus capacitor under different duty parameters Relationship, the service life temperature parameter is for calculating the L;
Computing unit, for calculating remaining lifetime value of the bus capacitor current time under standard conditionWherein, it is non-detect the bus capacitor service life for the first time when, the Lr is primary before the current time Remaining lifetime value of the bus capacitor of detection under standard condition, the t are the current time apart from preceding one-time detection The duration of remaining lifetime value of the bus capacitor under standard condition;It is described when detecting the bus capacitor service life for the first time Lr is benchmark life value of the bus capacitor under standard condition, and the t is the operating condition ginseng for acquiring the bus capacitor for the first time Apart from the duration at the bus capacitor start-up operation moment at the time of number.
10. device according to claim 9, which is characterized in that the duty parameter includes at least one in parameters described below It is a: the temperature of the bus capacitor corresponding device local environment, the input voltage of the bus capacitor and the bus capacitor Output loading factor.
11. device according to claim 9 or 10, which is characterized in that the default corresponding relationship is for indicating different works The relationship of entire life value of the condition parameter from the bus capacitor under different duty parameters, the acquiring unit are specifically used for:
It inquires in the default corresponding relationship with the presence or absence of the first duty parameter, wherein in the duty parameter at the current time Each parameter is respectively in first duty parameter in the resolving range of each parameter;
If there are the first duty parameters in the default corresponding relationship, obtain in the default correspondence, the bus capacitor is in institute The entire life value under the first duty parameter is stated as the L.
12. device according to claim 11, which is characterized in that the default corresponding relationship is also used to indicate different operating conditions The relationship of service life temperature parameter of the parameter from the bus capacitor under different duty parameters, the duty parameter include the mother The temperature of line capacitance corresponding device local environment;
The acquiring unit is specifically used for:
If first duty parameter is not present in the default corresponding relationship, by the bus capacitor in the default corresponding pass Service life temperature parameter in system under the second duty parameter, subtracts temperature gap, obtains the bus capacitor at the current time Duty parameter under service life temperature parameter, wherein the temperature gap be second duty parameter in environment temperature subtract The environment temperature in the duty parameter at the current time is gone, in the duty parameter at the current time in addition to environment temperature Each parameter, respectively in the resolving range of each parameter in second duty parameter in addition to environment temperature;
By service life temperature parameter of the bus capacitor under the duty parameter at the current time, the preset bus is substituted into The L is calculated in capacitor life formula.
13. device according to claim 9 or 10, which is characterized in that the default corresponding relationship is for indicating different works The relationship of service life temperature parameter of the condition parameter from the bus capacitor under different duty parameters, the acquiring unit are specifically used In:
The default corresponding relationship is inquired, service life temperature of the bus capacitor under the duty parameter at the current time is obtained Parameter;
By service life temperature parameter of the bus capacitor under the duty parameter at the current time, the preset bus is substituted into The L is calculated in capacitor life formula.
14. device according to claim 13, which is characterized in that the duty parameter includes setting belonging to the bus capacitor The temperature of standby local environment, the acquiring unit are specifically used for:
It inquires in the default corresponding relationship with the presence or absence of the first duty parameter, wherein in the duty parameter at the current time Each parameter is respectively in first duty parameter in the resolving range of each parameter;
If there are first duty parameters in the default corresponding relationship, obtain in the default correspondence, the bus capacitor Service life temperature parameter under first duty parameter, as the bus capacitor under the duty parameter at the current time Service life temperature parameter;
If first duty parameter is not present in the default corresponding relationship, by the electricity of bus described in the default corresponding relationship Hold the service life temperature parameter under the second duty parameter, subtracts temperature gap, obtain the bus capacitor at the current time Duty parameter under service life temperature parameter, wherein the temperature gap be second duty parameter in environment temperature subtract The environment temperature in the duty parameter at the current time is gone, in the duty parameter at the current time in addition to environment temperature Each parameter, respectively in the resolving range of each parameter in second duty parameter in addition to environment temperature.
15. according to the described in any item devices in claim 9-10,12,14, which is characterized in that the bus capacitor service life temperature Parameter includes body temperature and interior nuclear temperature, alternatively, the bus capacitor service life temperature parameter includes the interior of the bus capacitor Nuclear temperature.
16. device according to claim 15, which is characterized in that
If the bus capacitor service life temperature parameter includes the body temperature of the bus capacitor and the kernel of the bus capacitor Temperature, the preset bus capacitor life formula are as follows:
Wherein, the Ld is nominal service life of the bus capacitor under direct-current working volts, and the To is the bus The nominal highest of capacitor guarantees temperature, and T is the environment temperature of itself of the bus capacitor, and the K is the bus capacitor mark The ripple current accelerated factor of title, the Δ T are that the interior nuclear temperature of the bus capacitor subtracts this body temperature of the bus capacitor Degree;
If the bus capacitor service life temperature parameter includes the interior nuclear temperature of the bus capacitor, the preset bus electricity Hold life formula are as follows:
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