CN106556466A - A kind of quick temperature measurement method based on magnetic nanometer magnetic strength temperature curve - Google Patents
A kind of quick temperature measurement method based on magnetic nanometer magnetic strength temperature curve Download PDFInfo
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- 235000007164 Oryza sativa Nutrition 0.000 description 3
- 235000009566 rice Nutrition 0.000 description 3
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- G—PHYSICS
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- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K3/00—Thermometers giving results other than momentary value of temperature
- G01K3/08—Thermometers giving results other than momentary value of temperature giving differences of values; giving differentiated values
- G01K3/10—Thermometers giving results other than momentary value of temperature giving differences of values; giving differentiated values in respect of time, e.g. reacting only to a quick change of temperature
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- G—PHYSICS
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- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/36—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using magnetic elements, e.g. magnets, coils
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Abstract
The invention discloses a kind of quick temperature measurement method based on magnetic nanometer magnetic strength temperature curve, which comprises the following steps:(1) magnetic nanometer sample is placed in the surface of object to be measured;(2) apply continuous current excitation magnetic field in the magnetic nanometer sample region;(3) initial temperature T (0) of the object to be measured is obtained, and original magnetization M (0) is calculated according to initial temperature T (0);(4) caused response signal u (t) of magnetization change using search coil detection by temperature change;(5) calculate the magnetization M (t) of magnetic nanometer according to the original magnetization M (0) and response signal u (t) in real time;(6) temperature T (t) of object to be measured is calculated according to the magnetization M (t) using the intensity of magnetization temperature curve for fitting.Achievable nanosecond order fast temperature measurement of the invention, has the advantages that the quick timely, measurement result of measurement is accurate.
Description
Technical field
The invention belongs to nano measurement technical field, more particularly, to a kind of bent based on magnetic nanometer magnetic intensity-temperature
The quick temperature measurement method of line.
Background technology
Due to there is a kind of intrinsic relation between the intensity of magnetization and temperature of magnetic material, therefore can be by measuring magnetic
The magnetics parameter of material is come the anti-temperature for releasing magnetic material.If ferrimagnet is processed into the nanometer with one-domain structure
Particle, ferrimagnet can show superparamagnetism.Superparamagnetic material magnetization curve does not have stagnant ring, can directly using youth it
Ten thousand functions are described, can be with simplified operation for ferrimagnet.After magnetic nano-particle is using special groups parcel, can
To be applied in the middle of biomedicine.
Thermometric method is carried out using magnetic nano-particle magnetism characteristic various, for example, to magnetic nanometer
Sample applies sinusoidal excitation, can solve temperature using the amplitude of harmonic wave and the relation of temperature of response signal;For another example, using magnetic
Change on intensity curve discrete point building the equation containing temperature parameter, it is also possible to solve temperature, this method first has to measure
Magnetization curve could solve a temperature spot.Due to the presence of relaxation phenomena, temperature renewal speed in above-mentioned several temp measuring methods
It is general not over megahertz.
In a kind of patent CN201410374814.1 " the non-intrusion type fast temperature measure of the change side under continuous current excitation magnetic field
In method ", there is provided a kind of measuring method of fast temperature change, the method can be realized quick accurate in the case of non-invasive
Temperature survey, thus solve thermometric speed is slow, precision is low technical problem.But in this approach, use ferromagnetic
Property material, external magnetic field must make ferrimagnet in saturated magnetization state, and the patent not provide specific temperature anti-
Drill method.
The content of the invention
For the disadvantages described above or Improvement requirement of prior art, the invention provides it is a kind of based on magnetic nanometer magnetic intensity-
The quick temperature measurement method of temperature curve, which is based on temperature and the relation of intensity of magnetization single-value mapping and inclined using relatively low direct current
Magnetic field is put, realizes that nanosecond order fast temperature is measured, its extrinsic motivated magnetic field intensity need not make superparamagnetic material in full
And magnetized state, have the advantages that the quick timely, measurement result of measurement is accurate.
For achieving the above object, the present invention proposes a kind of quick temperature measurement based on magnetic nanometer magnetic intensity-temperature curve
Method, comprises the following steps:
(1) magnetic nanometer sample is placed in the surface of object to be measured;
(2) apply continuous current excitation magnetic field in the magnetic nanometer sample region;
(3) initial temperature T (0) of the object to be measured is obtained, and initial magnetization is calculated according to initial temperature T (0)
Intensity M (0);
(4) caused response signal u (t) of magnetization change using search coil detection by temperature change;
(5) magnetization for calculating magnetic nanometer in real time according to the original magnetization M (0) and response signal u (t) is strong
Degree M (t);
(6) object to be measured is calculated using the intensity of magnetization-temperature curve for fitting according to the magnetization M (t)
Temperature T (t).
As it is further preferred that coil or permanent magnet are located to magnetic nanometer sample used in the step (2)
Region applies D.C. magnetic field.
As it is further preferred that the M (0) calculates acquisition using equation below:
In formula:N is magnetic nanometer number, and v is single magnetic nanometer volume, and V is magnetic nanotube sample cumulative volume, and H is
Extrinsic motivated magnetic field, k is Boltzmann constant, and T (0) is object initial temperature to be measured, M0=Ms0(1-bT(0)a),Ms0It is absolute
Magnetic nanometer saturation magnetization when temperature is 0K, a, b are constant.
As it is further preferred that the M (t) in the step (5) is calculated using equation below and is obtained:
In formula:α is the fixed coefficient of coup, and k is amplifier magnification ratio, μ0For permeability of vacuum, n is coil turn, S
For area coil, M (0) is original magnetization.
As it is further preferred that temperature T (t) method for solving of t in the step (6) is as follows:According to relation
Formula
Fit the intensity of magnetization-temperature curve T=p1 × M6+p2×M5+p3×M4+p4×M3+p5×M2+p6×M+p7;By institute
The input value that M (t) is stated as M is substituted in the curve for fitting, and obtains T (t).
In general, possess following compared with prior art, mainly by the contemplated above technical scheme of the present invention
Technological merit:
1. the present invention uses the magnetic nanoparticle with superparamagnetism as temperature-sensing element (device), and which only needs to receive magnetic
Rice corpuscles apply continuous current excitation, and magnetic nanometer need not be made to be in saturated magnetization state, you can realize relatively low outer
Plus the temperature survey under magnetic field, reduce the intensity of excitation field.
2. the present invention is based on temperature and the relation of intensity of magnetization single-value mapping, it is possible to use relatively low DC bias magnetic field,
Which is by sample response signal inverting to actual temp, it is contemplated that impact of the temperature to magnetic nanometer saturation magnetization, makes
Model has higher precision within the scope of wider temperature.
3. the present invention is directly according to the intensity of magnetization-temperature curve fitted under specific magnetic fields solving temperature, due to magnetic
Nanoparticle can reach balance in picosecond magnitude because of the magnetization change that temperature causes, therefore the speed of thermometric is solely dependent upon
The bandwidth of measuring circuit, is capable of achieving the measurement of nanosecond order fast temperature.
Description of the drawings
Fig. 1 is the flow chart of the quick temperature measurement method based on magnetic nanometer magnetic intensity-temperature curve according to the present invention;
Fig. 2 is derivative figure of the intensity of magnetization to temperature under different excitation fields;
Fig. 3 is temperature-magnetisation curve under different excitation fields;
Fig. 4 is the intensity of magnetization-temperature and fit error curve for fitting;
Fig. 5 is the temperature pulse figure simulated with double-exponential function;
Fig. 6 is derivative figure of the intensity of magnetization to the time after normalization;
Fig. 7 is the comparison diagram of the temperature and original temperature being finally inversed by using the intensity of magnetization-temperature curve;
The laser pulse shape figure that Fig. 8 is measured for photodiode;
Fig. 9 measures sample response oscillogram for search coil;
Figure 10 is the sample temperature figure being finally inversed by using the inventive method;
Figure 11 is laser pulse, sample response and inverting temperature waveform comparison diagram after normalization.
Specific embodiment
In order that the objects, technical solutions and advantages of the present invention become more apparent, it is below in conjunction with drawings and Examples, right
The present invention is further elaborated.It should be appreciated that specific embodiment described herein is only to explain the present invention, and
It is not used in the restriction present invention.As long as additionally, technical characteristic involved in invention described below each embodiment
Do not constitute conflict each other can just be mutually combined.
First to the present invention temperature-measurement principle be introduced, when the particle diameter of ferrimagnet it is little to one-domain structure when,
Superparamagnetism is shown externally.Consider impact of the temperature to saturation magnetization, between the magnetic nanometer intensity of magnetization and temperature
Relation can use Langevin function representation:
In formula, n is magnetic nanometer number, and v is single magnetic nanometer volume, and V is magnetic nanotube sample volume, M0=Ms0
(1-bTa), T be absolute temperature (absolute temperature of magnetic nanometer, namely the temperature of object to be measured), Ms0It is that absolute temperature is 0K
When magnetic nanometer saturation magnetization, a, b are the constants relevant with sample, and H is extrinsic motivated magnetic field, and k is that Boltzmann is normal
Number.
From formula (1) as can be seen that when extrinsic motivated magnetic field H is constant, temperature T has dull corresponding with magnetization M
Relation, can fit the intensity of magnetization under specific magnetic fields-temperature dependence T=p1 × M according to formula (1)6+p2×M5+p3×M4
+p4×M3+p5×M2+ p6 × M+p7, and if it is known that the magnetization M (t) at a certain moment, the relational expression for fitting is substituted into,
Can be obtained by temperature T (t) now.
Based on this thinking, embodiments of the present invention are as follows:
(1) magnetic nanotube sample is positioned over into position to be measured
Magnetic nanometer surface is modified so as to adsorptivity, be adsorbed in measurand surface, or magnetic is received
Rice corpuscles pressed powder is mixed with adhesive, is applied to measurand surface.
(2) apply suitable D.C. magnetic field in magnetic nanometer region
Coil or permanent magnet can be used to apply D.C. magnetic field, the direct current of applying to magnetic nanometer sample region
Magnetic field size can be selected to the sensitivity of temperature according to the intensity of magnetization under different continuous current excitation magnetic fields.Given in Fig. 2 respectively
Excitation field is gone out for 100gauss, 500gauss, 900gauss, derivative of the intensity of magnetization to temperature under 1300gauss, from figure
In it can be seen that in 300K to 450K temperature ranges, with excitation field increase, after the intensity of magnetization first increases to the derivative of temperature
Reduce, therefore 900gauss can be selected as excitation field.
(3) object initial temperature T (0) to be measured is obtained, and calculates original magnetization M (0)
Temperature T of magnetic nanometer, the relation between excitation field H and magnetization M are Initial temperature T (0) is substituted into into relational expression, you can calculate original magnetization M (0).In measurement process
In, relational expression In externally-applied magnetic field H be known quantity, n, v, V measurement
During be all definite value, temperature T and magnetization M into dull corresponding relation, as shown in Figure 3.
(4) detect response signal u (t) caused by temperature change
As temperature change can cause magnetization change, using the measurable this change of search coil, by magnetic nanometer sample
Product are placed on search coil center, and when additional excitation field is constant, temperature change can cause magnetization change, detect line
Circle can sense this change and produce induced voltage ε (t), as search coil output induced voltage is in microvolt magnitude, need
Signal beyond Measurement bandwidth, wherein signal u (t) that meets with a response=k ε (t), k are filtered by amplifier amplification and filter circuit
For amplifier magnification ratio, u (t) is converted into digital signal by data collecting card then carries out subsequent treatment again.
(5) magnetic nanometer magnetization M (t) is calculated in real time according to original magnetization M (0) and response signal u (t)
By Faraday law of electromagnetic induction:Coil-induced voltageWith physicss' fundamental formular:Φ=
BS, B=μ0, and response signal u (t)=k ε (t) can obtain the intensity of magnetization of t (H+M):
In formula, α is a fixed coefficient of coup, can be obtained according to cooling or temperature-rise period fitting, and n is step
(4) the search coil number of turn in, S are search coil area in step (4), μ0For permeability of vacuum, k is amplifier in step (4)
Amplification, M (0) are original magnetization, are obtained by step (3).
(6) temperature T (t) of object to be measured is calculated using the intensity of magnetization-temperature curve for fitting
The intensity of magnetization and temperature under specific incentives magnetic field is fitted using method of least square, approximating method is as follows:
If the fit correlation between temperature T and magnetization M is polynomial relation, then the intensity of magnetization-temperature dependence is T=p1 × M6
+p2×M5+p3×M4+p4×M3+p5×M2+p6×M+p7;Obtained under specific incentives magnetic field by formula (1), different temperatures T
Corresponding magnetization M;The value of the M for obtaining and T is updated in fit correlation formula, fit correlation is obtained by method of least square
The coefficient of formula, is the known intensity of magnetization-temperature dependence according to coefficient is obtained by the coefficient obtained:T=p1 × M6+p2
×M5+p3×M4+p4×M3+p5×M2+p6×M+p7。
M (t) is substituted into calculated T in the intensity of magnetization-temperature dependence for fitting as the input value of M as to treat
Survey temperature T (t) of object.The p1=0.5903 fitted using 6 rank multinomials when excitation field is 900gauss;P2=-
6.318;P3=28.72;P4=-74.03;P5=117.7;P6=-189.2;P7=534.7.Closed by the intensity of magnetization-temperature
It is the intensity of magnetization-temperature curve that formula is obtained as shown in figure 4, in order that multinomial coefficient is in a zone of reasonableness, transverse axis contracting
It is little to original 1/20.It can be seen that absolute error is fitted in the range of 300K to 450K in below 0.07K, by M
T () is updated to the intensity of magnetization-temperature for fitting and closes Xiang Shizhong, you can obtain temperature T (t).
Simulation example:
For more specifically bright above implementation steps, it is given below and is received using the EMG1300 magnetic of Ferrotec companies
The simulation example of rice corpuscles sample parameters.EMG1300 mean diameters 10nm, saturation magnetization 50-70emu/g under room temperature,
M is taken in emulations=0.6T/ μ0, externally-applied magnetic field B=2.8E-5, a=1.65, the intensity of magnetization with
Temperature variation curve is as shown in Figure 3.
With double-exponential function T (t)=A* (e-αt-e-βt)+T0 simulates a temperature pulse, wherein amplitude coefficient A takes 100,
Wave rear time constant inverse α takes 1/300e-9, and wave front time constant beta takes 1/45e-9, and T0 takes 300K, and t is the time, temperature waveform
As shown in Figure 5.Using this temperature pulse as input, the induction coil normalization waveform for obtaining is as shown in fig. 6, to this
Signal is integrated, and substitutes in the intensity of magnetization-temperature dependence for fitting, and obtains temperature and the temperature error song for fitting
Line is as shown in fig. 7, it can be seen from figure 7 that in the range of 300K-360K, the absolute error being finally inversed by is less than 0.08K.
Experiment embodiment:
Magnetic nanometer sample, pulse laser individual pulse energy 20mJ, arteries and veins are heated using pulse laser as thermal source
Wide 200ns, rising edge 130ns.Laser is divided into into two-way using spectroscope, wherein beating sharp to record on the photodiode all the way
Optical pulse waveform, is beaten on magnetic nanometer sample in addition all the way, while recording photodiode output and magnetic nanometer
Response signal.As the photodiode rise time is in 1ns or so, can be using photodiode output signal as sample response
The reference of signal and inverting temperature signal.Photodiode output signal is as shown in figure 8, sample response signal is as shown in figure 9, anti-
Drill temperature as shown in Figure 10.In order to illustrate the rapidity of this thermometric mode, by laser pulse signal, sample response signal, anti-
It is put in a figure to compare after drilling temperature signal normalization, as shown in figure 11, as can be seen from the figure inverting temperature curve
Rise time is less than 200ns.
As it will be easily appreciated by one skilled in the art that the foregoing is only presently preferred embodiments of the present invention, not to
The present invention, all any modification, equivalent and improvement made within the spirit and principles in the present invention etc. are limited, all should be included
Within protection scope of the present invention.
Claims (5)
1. a kind of quick temperature measurement method based on magnetic nanometer magnetic intensity-temperature curve, it is characterised in that comprise the following steps:
(1) magnetic nanometer sample is placed in the surface of object to be measured;
(2) apply continuous current excitation magnetic field in the magnetic nanometer sample region;
(3) initial temperature T (0) of the object to be measured is obtained, and original magnetization M is calculated according to initial temperature T (0)
(0);
(4) caused response signal u (t) of magnetization change using search coil detection by temperature change;
(5) calculate the magnetization M of magnetic nanometer according to the original magnetization M (0) and response signal u (t) in real time
(t);
(6) temperature T of object to be measured is calculated according to the magnetization M (t) using the intensity of magnetization-temperature curve for fitting
(t)。
2. the quick temperature measurement method based on magnetic nanometer magnetic intensity-temperature curve according to claim 1, its feature exist
In used in the step (2), coil or permanent magnet apply D.C. magnetic field to magnetic nanometer sample region.
3. the quick temperature measurement method based on magnetic nanometer magnetic intensity-temperature curve according to claim 2, its feature exist
In the M (0) is calculated using equation below and obtained:
In formula:N is magnetic nanometer number, and v is single magnetic nanometer volume, and V is magnetic nanotube sample cumulative volume, and H is additional
Excitation field, k is Boltzmann constant, and T (0) is object initial temperature to be measured, M0=Ms0(1-bT(0)a),Ms0It is absolute temperature
For 0K when magnetic nanometer saturation magnetization, a, b be constant.
4. the quick temperature measurement method based on magnetic nanometer magnetic intensity-temperature curve according to claim 3, its feature exist
In the M (t) in the step (5) is calculated using equation below and obtained:
In formula:α is the fixed coefficient of coup, and k is amplifier magnification ratio, μ0For permeability of vacuum, n is the search coil number of turn, S
For search coil area, M (0) is original magnetization.
5. the quick temperature measurement method based on magnetic nanometer magnetic intensity-temperature curve according to claim 4, its feature exist
In temperature T (t) method for solving of the t in the step (6) is as follows:According to relational expression
Fit the intensity of magnetization-temperature curve T=p1 × M6+p2×M5+p3×M4+p4×M3+p5×M2+p6×M+p7;By institute
State M (t) and substitute in the curve that fits as the input value of M and obtain T (t).
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CN109506805A (en) * | 2018-12-17 | 2019-03-22 | 华中科技大学 | A kind of Double deference thermometry based on magnetic nanometer |
CN110987224A (en) * | 2019-12-05 | 2020-04-10 | 华中科技大学 | Based on low field magnetic resonance T2Relaxation magnetic nanoparticle temperature calculation method |
CN113945297A (en) * | 2020-07-16 | 2022-01-18 | 华中科技大学 | Dynamic temperature measurement method for magnetic nanometer temperature measurement calibration |
CN112394306B (en) * | 2020-11-02 | 2021-08-24 | 广西师范大学 | Calibration method for multi-temperature initial magnetization curve |
CN112394306A (en) * | 2020-11-02 | 2021-02-23 | 广西师范大学 | Calibration method for multi-temperature initial magnetization curve |
CN113820034A (en) * | 2020-12-11 | 2021-12-21 | 中冶长天国际工程有限责任公司 | Online temperature measurement method in microwave field |
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CN113820034B (en) * | 2020-12-11 | 2023-09-29 | 中冶长天国际工程有限责任公司 | Online temperature measurement method in microwave field |
WO2022172350A1 (en) * | 2021-02-10 | 2022-08-18 | 日本電信電話株式会社 | Temperature measurement device |
JP7556414B2 (en) | 2021-02-10 | 2024-09-26 | 日本電信電話株式会社 | Temperature Measuring Device |
CN113280940A (en) * | 2021-05-26 | 2021-08-20 | 华中科技大学 | Magnetic nano temperature measuring method and system |
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