CN106525700A - Online calibration system of xenon lamp aging test chamber and calibration method of system - Google Patents
Online calibration system of xenon lamp aging test chamber and calibration method of system Download PDFInfo
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- CN106525700A CN106525700A CN201610891964.9A CN201610891964A CN106525700A CN 106525700 A CN106525700 A CN 106525700A CN 201610891964 A CN201610891964 A CN 201610891964A CN 106525700 A CN106525700 A CN 106525700A
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Abstract
The invention provides an online calibration system of a xenon lamp aging test chamber and a calibration method of the system. The xenon lamp aging test chamber is provided with a spectrum detector and a temperature sensor. The calibration method of the online calibration system of the xenon lamp aging test chamber comprises the steps that firstly, radiation calibration is conducted on the spectrum detector, spectra of the spectrum detector on the same light source at different temperatures are detected, and then a temperature calibration coefficient matrix as shown in a formula (2) is obtained through a formula as shown in a formula (1) according to the obtained spectroscopic data; then, when practical testing is conducted, according to the temperature value T fed back by the temperature sensor and the spectral intensity measured by the spectrum detector when the temperature is T, calibration is conducted on spectrum response curves I of the spectrum detector at different temperatures according to a formula (3). By adopting the online calibration method, the testing accuracy is greatly improved, the result obtained when the spectrum detector tests the spectrum irradiance at different temperatures is more accurate and is hardly affected by the experimental temperature, and real-time online calibration is achieved.
Description
Technical field
The present invention relates to a kind of temperature correction method, more particularly to a kind of on-line calibration system of xenon lamp aging chamber and
Its calibration steps.
Background technology
The calibration of ultraviolet (xenon lamp) ageing oven at present is all to separate the measurement of light radiation illumination, temperature and humidity
Carry out, and different ultraviolet (xenon lamp) ageing oven light radiation illumination photometry wave bands or wavelength points are not quite similar, so to
Effectively calibrate the instrument to be accomplished by being equipped with the illumination photometer of different-waveband or wavelength points, not only increase relevant device expense but also to making
Employment an ancient official title goes out carrying and also brings inconvenience.In addition, light radiation illumination often affects the temperature of experimental situation.If by each
Parameter separates individually calibration, so there is obvious difference with state during instrument and equipment actual motion, also just cannot be true
The actual state and interactional result of parameters during real reflection sample test.
On-line instrument calibration is relatively backward field in current collimation technique, or many online no phases of instrument and meter
The technology of pass, equipment and cannot be calibrated, or stopping production shutdown is carried out, to dismantle toward contact.This not only largely effects on enterprise
Production and instrument running status, and instrument is impacted under non-online (static state) and the online different conditions of (dynamic)
Factor is different, and the result for often reflecting is also possible to produce very big difference, so as to increased the uncertainty of calibration result,
Also requirement of the on-line instrument instrument to product quality monitor in real time just cannot really be met.For ensureing product quality, realize to producing
How the monitor in real time of quality, realize that on-line calibration of the in-line meter under applying working condition just becomes currently urgently to be resolved hurrily and ask
Topic.
The calibration of at present light radiation ageing oven be all by the measurement of light radiation illumination, temperature and humidity separate into
OK.But has a problem in that light radiation illumination often affects the temperature of experimental situation.If parameters are separated individually calibration, this
Sample there is obvious difference with state during instrument and equipment actual motion, each ginseng when also just cannot truly reflect sample test
Several actual states and interactional result.
In addition, the instrument and equipment of existing measurement ageing oven illuminance is under single wavelength, such as mostly in the market
340nm, 420nm etc., such correcting mechanism just must be equipped with the instrument under various different wave lengths, are only equipped with instrument and equipment and are accomplished by
Very big cost.And the chamber door of ageing oven cannot be closed during these standard uses, so with real use state difference compared with
Greatly, test data cannot just ensure.In addition, under different temperatures, spectral detector exists larger to the response curve of same light source
Difference.
The content of the invention
For above technical problem, the invention discloses a kind of on-line calibration system of xenon lamp aging chamber and its calibration
Method, realizes on-line calibration, realizes the integrated collection of spectral irradiance, temperature and humidity, convenient and practical.Wherein, the xenon
The spectral region of the on-line calibration system detection of lamp ageing oven is 250-1100nm, i.e., can not only cover ultraviolet portion, also
Cover visible and near infrared band.
In this regard, the technical solution used in the present invention is:
A kind of calibration steps of the on-line calibration system of xenon lamp aging chamber, the xenon lamp aging chamber are provided with spectrum
Detector and temperature sensor, the calibration steps of the on-line calibration system of the xenon lamp aging chamber are comprised the following steps:Step
Rapid S1:Radiation calibration is carried out to spectral detector, including:
Test spectral detector spectrum at different temperatures to same light source, then according to the spectroscopic data that obtains according to
The formula fitting of formula (1) obtains temperature correction coefficient matrix such as formula (2):
I (T)=IT*[1+A1*(T-T0)+A2*(T-T0)2+…+Ak*(T-T0)k] (1)
In formula (1), I (T) is the spectral intensity after calibration, that is, is more accurately worth;ITFor temperature T when the spectrum that measures
Intensity original value;T0For reference temperature;A1、A2、A3、…AkFor calibration factor, obtained by test and before test is started
Write spectrometer internal memory;0,1,2 ..., k are the exponent number of data fitting;
In formula (2), 0,1 ..., n is pixel number, and 0,1,2 ..., k is the exponent number of data fitting;
Step S2:According to the spectral intensity that spectral detector when temperature value T and temperature T of temperature sensor feedback is measured,
Spectral response curve I under the different temperatures of the spectral detector is calibrated according to such as following formula (3):
Wherein, I (T) is the spectral intensity after calibration, and 0,1 ..., n is pixel number, In(T) for pixel number for n point
Spectral intensity after calibration;ITFor temperature T when the spectral intensity that measures;T0For reference temperature;A1、A2、A3、…AkFor calibration system
Number, is obtained by testing;0,1,2 ..., k are the exponent number of data fitting.
It is found through experiments, under different temperatures, spectral detector has larger difference to the response curve of same light source,
Find there is the relation as described in formula (1) between spectral response I and temperature T of spectrometer detectors, and pass through through research
Experiment is with reference to actual test spectral line, it has been found that the change of the corresponding wavelength with temperature of different pixels has differences, it is therefore desirable to
Calibrated for each pixel, the temperature correction matrix different so as to obtain different pixels.During actual measurement, according to detection
The temperature value that device is returned, can carry out real time calibration spectrum test result according to formula (3).
Using this technical scheme, not only measurable visible, near-infrared light source including including ultraviolet source, and can be same
When measure humiture;Measurable wave-length coverage is 250~1100nm, is covered from ultraviolet near infrared range, prior art
Other separate the only measurable 250~380nm of ultraviolet range of calibration steps.
It is further preferred that T0The normal temperature selected when carrying out radiation calibration for spectral detector, after calibration
At a temperature of radiation intensity is normalized to this, it is often preferred that 25 DEG C.
The invention provides a kind of on-line calibration system of xenon lamp aging chamber, which adopts xenon lamp aging as above
The calibration steps of the on-line calibration system of chamber carries out the calibration of spectral detector.
It is further preferred which includes spectra collection module, humiture collection module and main frame, the spectra collection module
It is single including spectral detector, controller, FPGA (Field-Programmable Gate Array, field programmable gate array)
Unit, ADC (Analog-to-Digital Converter, analog-digital converter) unit, the spectral detector and ADC units electricity
Connection, the ADC units are electrically connected with the controller, and the FPGA unit is simultaneously electric with spectral detector, ADC units, controller
Connection carries out data transmission, and the controller is electrically connected with main frame;The humiture collection module includes temperature sensor, humidity
Sensor and single-chip microcomputer, the temperature sensor and humidity sensor respectively with monolithic mechatronics, the single-chip microcomputer and main frame
Electrical connection.The main frame carries out spectrum spy using the calibration steps of the on-line calibration system of xenon lamp aging chamber as above
Survey the calibration of device.
During measurement, equipment built-in lithium battery need not connect any power supply or data cable, and equipment can be individually placed in instrument to be checked
Inside device, without the need for extra cable-through hole, test result is closer to real use state, thus test result is more accurate for equipment to be checked
Really.
Preferably, the on-line calibration system of the xenon lamp aging chamber is provided with wireless transport module, described to be wirelessly transferred
Module is connected with single-chip microcomputer and controller respectively.Using this technical scheme, the single-chip microcomputer and controller are by being wirelessly transferred mould
Block realizes wireless transmission function, using convenient.
It is further preferred that the humiture collection module also include inverter circuit, dc source, operational amplification circuit,
ADC units, the temperature sensor are electrically connected with operational amplification circuit by inverter circuit, the operational amplification circuit and ADC
Unit is electrically connected, and the ADC units are connected with single-chip microcomputer, and the dc source is connected offer power supply with inverter circuit, single-chip microcomputer.
It is further preferred that the dc source includes 12V D/C powers and DC-DC conversion circuits, the 12V D/C powers
5V D/C powers are provided by DC-DC conversion circuits, the 12V D/C powers are connected with inverter circuit, the 5V D/C powers and list
Piece machine connects.
It is further preferred that model PT100 of the temperature sensor;Model DHT11 of the humidity sensor.
It is further preferred which also includes USB-RS232 converters, USB HUB, the spectra collection module includes USB
Control chip, the controller are connected with USB HUB by USB control chips, and the single-chip microcomputer passes through USB-RS232 converters
It is connected with USB HUB, the USB HUB are connected with main frame.
Compared with prior art, beneficial effects of the present invention are:
First, using technical scheme, on-line calibration is realized, spectrum and temperature correction are more accurate, and energy
The integrated collection of spectral irradiance, temperature and humidity is carried out, it is convenient and practical.
Second, when being calibrated, in 0 to 55 DEG C of temperature range, spectrometer irradiation level test result error highest can
Up to 10%, after calibration, this error can be reduced within 1%, substantially increase test accuracy.Through a large amount of statistical experiments
Show, the temperature correction algorithm cause spectrometer at different temperatures test spectral irradiation level when result it is more accurate, almost
Do not affected by experimental temperature.During the actual measurement of prior art, it is poor that the temperature of spectral detector is present with temperature during radiometric calibration
Different, so as to the accuracy for affecting which to measure, said temperature calibration algorithm can solve this problem well.
3rd, using technical scheme, realize covering entirely for wavelength needed for monomer light radiation ageing oven calibrator (-ter) unit
Lid, can meet the unrestricted choice of Single wavelength point and special wave band simultaneously.
Description of the drawings
Fig. 1 is the spectral detector response curve at different temperatures to same light source of an embodiment of the present invention.
Fig. 2 is the irradiation curve of spectrum of an embodiment of the present invention after temperature correction is carried out.
Fig. 3 is a kind of module map of the on-line calibration system of xenon lamp aging chamber of the invention.
Specific embodiment
Below in conjunction with the accompanying drawings, the preferably embodiment of the present invention is described in further detail.
Embodiment 1
A kind of calibration steps of the on-line calibration system of xenon lamp aging chamber, the xenon lamp aging chamber are provided with spectrum
Detector and temperature sensor, comprise the following steps:
Step S1:Demarcate:Test spectral detector spectroscopic data at different temperatures to same light source, meet with a response song
Line, as shown in figure 1, and then obtain temperature correction coefficient matrix according to these data using below equation fitting.
Find there is following relation between spectral response I and temperature T of spectrometer detectors through research:
I (T)=IT*[1+A1*(T-T0)+A2*(T-T0)2+…+Ak*(T-T0)k] (1)
Wherein:
I (T) is the spectral intensity obtained after calibration, that is, is more accurately worth;
ITFor temperature T when the spectral intensity that measures, there is larger error in that is, not calibrated original value;
T0Temperature for reference temperature, when our general chosen spectrum instrument carry out radiation calibration here;
1, A1, A2..., AkFor calibration factor, it is to be obtained by test and write spectrometer internal memory before starting to test
's.
According to actual test spectral line, it has been found that the change of the corresponding wavelength with temperature of different pixels has differences, therefore
Need to be calibrated for each pixel, so can be obtained by temperature correction matrix, 0,1 in formula (2) ..., n is compiled for pixel
Number, 0,1,2 ..., k is the exponent number of data fitting.
Step S2:According to the spectral intensity that spectral detector when temperature value T and temperature T of temperature sensor feedback is measured,
Calibration spectrum test result is carried out according to such as following formula (3) to the spectral response curve I under the different temperatures of the spectral detector.
Fig. 2 is the result for carrying out k=7 rank fittings to n=2048 pixel lights spectrometer, from Figure 2 it can be seen that through the school of the present invention
After quasi- method so that spectral detector at different temperatures test spectral irradiation level when result it is more accurate, hardly tested
Temperature affects, and the irradiation level test result error of spectral detector is little, improves test accuracy.
Draw through repetition test contrast, when not carrying out temperature correction, in 0 to 55 DEG C of temperature range, spectrometer irradiation
Degree test result error reaches as high as 10%, and after calibration, this error can be reduced within 1%, substantially increases test accurate
Property.Show through a large amount of statistical experiments, the temperature correction algorithm cause spectrometer at different temperatures test spectral irradiation level when
Result it is more accurate, hardly affected by experimental temperature.
Embodiment 2
A kind of on-line calibration system of xenon lamp aging chamber, as shown in figure 3, which includes spectra collection module, humiture
Acquisition module and main frame, the spectra collection module include spectral detector, controller, FPGA unit, ADC units, the light
Spectrum detector is electrically connected with ADC units, and the ADC units are electrically connected with the controller, and the FPGA unit is while and spectrographic detection
Device, ADC units, controller electrical connection carry out data transmission, and the controller is electrically connected with main frame;The humiture collection module
Including temperature sensor, humidity sensor and single-chip microcomputer, the temperature sensor and humidity sensor are electrically connected with single-chip microcomputer respectively
Connect, the single-chip microcomputer is electrically connected with main frame.The FPGA unit can connect peripheral interface.
As shown in figure 3, the humiture collection module also includes inverter circuit, dc source, operational amplification circuit, ADC
Unit, the temperature sensor are electrically connected with operational amplification circuit by inverter circuit, the operational amplification circuit and ADC units
Electrical connection, the ADC units are connected with single-chip microcomputer, and the dc source is connected offer power supply with inverter circuit, single-chip microcomputer.:Institute
Stating dc source includes 12V D/C powers and DC-DC conversion circuits, and the 12V D/C powers provide 5V by DC-DC conversion circuits
D/C power, the 12V D/C powers are connected with inverter circuit, and the 5V D/C powers are connected with single-chip microcomputer.The temperature sensor
Model PT100;Model DHT11 of the humidity sensor.Which also includes USB-RS232 converters, USB HUB, institute
Stating spectra collection module includes USB control chips, and the controller is connected with USB HUB by USB control chips, the monolithic
Machine is connected with USB HUB by USB-RS232 converters, and the USB HUB are connected with main frame.
The main frame built-in algorithms, the method for the algorithm are the online school of the xenon lamp aging chamber described in embodiment 1
The calibration steps of Barebone.As equipment can gather spectral irradiance degrees of data and temperature data simultaneously, therefore, it can in measurement
When, calibration result is obtained in real time by built-in algorithms.
The on-line calibration system of the xenon lamp aging chamber of the present invention, realizes needed for monomer light radiation ageing oven calibrator (-ter) unit
The all standing of wavelength, can meet the unrestricted choice of Single wavelength point and special wave band simultaneously.Realize spectral irradiance, temperature and wet
Integrated collection is spent, it is convenient and practical.
Above content is with reference to specific preferred embodiment further description made for the present invention, it is impossible to assert
The present invention be embodied as be confined to these explanations.For general technical staff of the technical field of the invention,
On the premise of without departing from present inventive concept, some simple deduction or replace can also be made, should all be considered as belonging to the present invention's
Protection domain.
Claims (8)
1. a kind of calibration steps of the on-line calibration system of xenon lamp aging chamber, the xenon lamp aging chamber are provided with spectrum spy
Survey device and temperature sensor, it is characterised in that comprise the following steps:
Step S1:Radiation calibration is carried out to spectral detector, including:
Test spectral detector spectrum at different temperatures to same light source, then according to the spectroscopic data for obtaining according to formula
(1) formula fitting obtains temperature correction coefficient matrix such as formula (2):
I (T)=IT*[1+A1*(T-T0)+A2*(T-T0)2+…+Ak*(T-T0)k] (1)
In formula (1), I (T) is the spectral intensity after calibration;ITFor temperature T when the spectral intensity original value that measures;T0It is with reference to temperature
Degree;A1、A2、A3、…AkFor calibration factor;0,1,2 ..., k are the exponent number of data fitting.
In formula (2), 0,1 ..., n is pixel number, and 0,1,2 ..., k is the exponent number of data fitting;
Step S2:According to the spectral intensity that spectral detector when temperature value T and temperature T of temperature sensor feedback is measured, to institute
The spectral response curve I stated under the different temperatures of spectral detector is calibrated according to such as following formula (3):
Wherein, I (T) is the spectral intensity after calibration, and 0,1 ..., n is pixel number, In(T) point for pixel number for n is calibrated
Spectral intensity afterwards;ITFor temperature T when the spectral intensity that measures;T0For reference temperature;A1、A2、A3、…AkFor calibration factor, lead to
Overtesting is obtained;0,1,2 ..., k are the exponent number of data fitting.
2. the calibration steps of the on-line calibration system of xenon lamp aging chamber according to claim 1, it is characterised in that:T0
The normal temperature selected when carrying out radiation calibration for spectral detector.
3. a kind of on-line calibration system of xenon lamp aging chamber, it is characterised in that:Using xenon as claimed in claim 1 or 2
The calibration steps of the on-line calibration system of lamp ageing oven carries out the calibration of spectral detector.
4. the on-line calibration system of xenon lamp aging chamber according to claim 3, it is characterised in that:Which includes that spectrum is adopted
Collection module, humiture collection module and main frame, the spectra collection module include spectral detector, controller, FPGA unit,
ADC units, the spectral detector are electrically connected with ADC units, and the ADC units are electrically connected with the controller, the FPGA unit
Electrically connect and carry out data transmission with spectral detector, ADC units, controller simultaneously, the controller is electrically connected with main frame;It is described
Humiture collection module includes temperature sensor, humidity sensor and single-chip microcomputer, the temperature sensor and humidity sensor point
Not with monolithic mechatronics, the single-chip microcomputer is electrically connected with main frame, and the main frame is existed using described xenon lamp aging chamber
The calibration steps of line calibration system carries out the calibration of spectral detector.
5. the on-line calibration system of xenon lamp aging chamber according to claim 4, it is characterised in that:The humiture is adopted
Collection module also includes inverter circuit, dc source, operational amplification circuit, ADC units, and the temperature sensor passes through inverter circuit
Electrically connect with operational amplification circuit, the operational amplification circuit is electrically connected with ADC units, the ADC units are connected with single-chip microcomputer,
The dc source is connected offer power supply with inverter circuit, single-chip microcomputer.
6. the on-line calibration system of xenon lamp aging chamber according to claim 5, it is characterised in that:The dc source
Including 12V D/C powers and DC-DC conversion circuits, the 12V D/C powers provide 5V D/C powers, institute by DC-DC conversion circuits
State 12V D/C powers to be connected with inverter circuit, the 5V D/C powers are connected with single-chip microcomputer.
7. the on-line calibration system of xenon lamp aging chamber according to claim 5, it is characterised in that:The TEMP
Model PT100 of device;Model DHT11 of the humidity sensor.
8. the on-line calibration system of xenon lamp aging chamber according to claim 4, it is characterised in that:Which also includes USB-
RS232 converters, USB HUB, the spectra collection module include USB control chips, and the controller passes through USB control chips
It is connected with USB HUB, the single-chip microcomputer is connected with USB HUB by USB-RS232 converters, the USB HUB are connected with main frame
Connect.
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Cited By (2)
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CN109813360A (en) * | 2019-01-31 | 2019-05-28 | 中国人民解放军92493部队计量测试研究所 | A kind of environmental parameter temperature and humidity on-line calibration device |
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