CN106524895B - A kind of strain detection testing device of the magnetic control shape memory alloy based on capacitance sensor - Google Patents

A kind of strain detection testing device of the magnetic control shape memory alloy based on capacitance sensor Download PDF

Info

Publication number
CN106524895B
CN106524895B CN201610957553.5A CN201610957553A CN106524895B CN 106524895 B CN106524895 B CN 106524895B CN 201610957553 A CN201610957553 A CN 201610957553A CN 106524895 B CN106524895 B CN 106524895B
Authority
CN
China
Prior art keywords
memory alloy
movable plate
magnetic control
shape memory
testing device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201610957553.5A
Other languages
Chinese (zh)
Other versions
CN106524895A (en
Inventor
杨少杰
李植涵
陈丕志
谢致薇
袁乾开
韦东海
杨伟鑫
杨元政
陈先朝
何玉定
许佳雄
蔡伟通
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Guangdong University of Technology
Original Assignee
Guangdong University of Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Guangdong University of Technology filed Critical Guangdong University of Technology
Priority to CN201610957553.5A priority Critical patent/CN106524895B/en
Publication of CN106524895A publication Critical patent/CN106524895A/en
Application granted granted Critical
Publication of CN106524895B publication Critical patent/CN106524895B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/16Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
    • G01B7/22Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in capacitance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)

Abstract

The invention discloses a kind of strain detection testing devices of magnetic control shape memory alloy based on capacitance sensor, it is converted into the variation of the parallel plate electrode area of plane-parallel capacitor probe by miniature deformations amounts such as magneto-strains magnetic control memory alloy, displacement is converted to the variable quantity of capacitance.Magnetic memorial alloy is effectively solved by the technical issues of around high-intensity magnetic field is influenced, so that improving it detects accuracy.A kind of strain detection testing device of the magnetic control shape memory alloy based on capacitance sensor in the present invention, comprising: the components such as capacitance probe, gear enlarger mechanism (10), input mechanism (11) and output mechanism (9).

Description

A kind of strain detection testing device of the magnetic control shape memory alloy based on capacitance sensor
Technical field
The present invention relates to technical field of electromechanical control more particularly to a kind of magnetic control shape memory conjunctions based on capacitance sensor The strain detection testing device of gold.
Background technique
In the research process of magnetic shape memory alloy, need to measure magneto-strain, but there is no dedicated magnetic at present Property strain testing instrument.When test using existing strain testing instrument, accuracy inevitably will receive magnetism The influence of high-intensity magnetic field around memorial alloy, this brings big inconvenience to the research of magnetic memorial alloy material.
Summary of the invention
The present invention provides a kind of strain detection testing devices of magnetic control shape memory alloy based on capacitance sensor, pass through handle The miniature deformations amount such as magneto-strain of magnetic control memory alloy is converted into the variation of the parallel plate electrode area of plane-parallel capacitor probe, Displacement is converted to the variable quantity of capacitance.Magnetic memorial alloy is effectively solved by the technical issues of around high-intensity magnetic field is influenced, Accuracy is detected to improve it.
A kind of strain detection testing device of the magnetic control shape memory alloy based on capacitance sensor in the present invention, comprising: capacitor Probe, gear enlarger mechanism 10, input mechanism 11 and output mechanism 9;
The gear enlarger mechanism 10 includes N number of gear set, and each gear set is by installing two differences on the same axis The gear of reference diameter forms, for realizing the amplification of transmitting step by step of micro-displacement by N number of gear set;
The input unit 11 and the output mechanism 9 are located at the upper and lower part of the gear enlarger mechanism 10, and lead to It crosses rack gear and engages connection with the gear inside the gear enlarger;
The capacitance probe includes: fixed plate group, movable plate electrode group and guide rail mechanism 17;
The movable plate electrode group is slidably connected with the fixed plate group by guide rail mechanism 17;
The rack gear determines pole with described for pushing movable plate electrode, by the movable plate electrode group that displacive transformation is popped one's head at capacitor Plate relatively moves, the area of capacitor probe and the variation of capacitance.
Optionally,
The fixed plate group includes fixed plate fixed frame 1 and N number of fixed plate 4 for being fixed on the fixed plate fixed frame 1.
Optionally,
The fixed plate 4 includes metal or the non-conductor through surface metalation.
Optionally,
The fixed plate 4 passes through fixed plate fixed frame 1 and its prominent surface.
Optionally,
The fixed plate 4 passes through fixed plate fixed frame 1 and prominent 3-7mm of its surface.
Optionally,
The movable plate electrode group includes movable plate electrode fixed frame 5 and N number of movable plate electrode 8 for being fixed on the movable plate electrode fixed frame 5.
Optionally,
The movable plate electrode 8 includes metal or the non-conductor through surface metalation.
Optionally,
The movable plate electrode 8 passes through movable plate electrode fixed frame 5 and its prominent surface.
Optionally,
The movable plate electrode 8 passes through movable plate electrode fixed frame 5 and prominent 3-7mm of its surface.
Optionally,
The capacitance probe further include: termination electrode terminal plate 2-3 and 6-7;The electrode connection plate is by substrate 3 and thereon Several thin copper film 12-15 compositions;
For the relative position by changing termination electrode terminal plate and fixed plate 4 and movable plate electrode 8, to change capacitance probe Internal multilayer connection type;
When outside thin copper film 12 or outside thin copper film 15 are connected with pole plate, it is respectively formed and is connected in series or in parallel;
When inside thin copper film 13 or inside thin copper film 14 are connect with pole plate, it is respectively formed and is connected in series or in parallel
As can be seen from the above technical solutions, the embodiment of the present invention specifically has the advantage that
Small feature is influenced on capacitor capacitance value according to magnetic field, and one kind is provided and pops one's head in based on capacitor and has gear Enlarger, test device especially suitable for magnetic control shape memory alloy magneto-strain.By being made of multi-stage gear group Enlarger, multistage transmitting is carried out to the small magneto-strain that magnetic control memory alloy generates and is amplified, then by rack gear arrangement, It pushes the movable plate electrode of capacitor probe mobile, changes the area between pole plate, displacive transformation is become to the variation of capacitance.
Detailed description of the invention
Fig. 1 is a kind of strain detection testing device embodiment knot of the magnetic control shape memory alloy based on capacitance sensor of the present invention Composition;
Fig. 2 is a kind of strain detection testing device embodiment end of the magnetic control shape memory alloy based on capacitance sensor of the present invention Electrode connection plate schematic diagram;
Fig. 3 is that a kind of strain detection testing device embodiment of the magnetic control shape memory alloy based on capacitance sensor of the present invention is led Rail mechanism schematic diagram.
Specific embodiment
The present invention provides a kind of strain detection testing devices of magnetic control shape memory alloy based on capacitance sensor, pass through handle The miniature deformations amount such as magneto-strain of magnetic control memory alloy is converted into the variation of the parallel plate electrode area of plane-parallel capacitor probe, Displacement is converted to the variable quantity of capacitance.Magnetic memorial alloy is effectively solved by the technical issues of around high-intensity magnetic field is influenced, Accuracy is detected to improve it.
It please refers to Fig.1 to Fig.3, a kind of strain testing of the magnetic control shape memory alloy based on capacitance sensor in the present invention Device, comprising: capacitance probe, gear enlarger mechanism 10, input mechanism 11 and output mechanism 9;
The gear enlarger mechanism 10 includes N number of gear set, and each gear set is by installing two differences on the same axis The gear of reference diameter forms, for realizing the amplification of transmitting step by step of micro-displacement by N number of gear set;
The input unit 11 and the output mechanism 9 are located at the upper and lower part of the gear enlarger mechanism 10, and lead to It crosses rack gear and engages connection with the gear inside the gear enlarger;
The capacitance probe includes: fixed plate group, movable plate electrode group and guide rail mechanism 17;
The movable plate electrode group is slidably connected with the fixed plate group by guide rail mechanism 17, and movable plate electrode group can be along guide rail mechanism It is moved on 17, to change the area of electrode for capacitors.
The rack gear determines pole with described for pushing movable plate electrode, by the movable plate electrode group that displacive transformation is popped one's head at capacitor Plate relatively moves, the area of capacitor probe and the variation of capacitance.
It should be noted that the device is popped one's head in by capacitor, gear enlarger mechanism 10 and appendage form.Capacitor is visited Head is multilayer parallel plate variable condenser structure, is converted into suitable for miniature deformations amounts such as magneto-strains magnetic control memory alloy Displacement, is converted to the variable quantity of capacitance by the variation of the parallel plate electrode area of plane-parallel capacitor probe.According to magnetic field pair Capacitor capacitance value influences small feature, by the enlarger being made of multi-stage gear group, generates to magnetic control memory alloy Small magneto-strain carries out multistage transmitting amplification, then by rack gear arrangement, pushes the movable plate electrode of capacitor probe mobile, change Displacive transformation is become the variation of capacitance by the area between pole plate.
A kind of strain detection testing device of the magnetic control shape memory alloy based on capacitance sensor further comprises in the present invention:
The fixed plate group includes fixed plate fixed frame 1 and N number of fixed plate 4 for being fixed on the fixed plate fixed frame 1.
The fixed plate 4 includes metal or the non-conductor through surface metalation.
The fixed plate 4 passes through fixed plate fixed frame 1 and prominent 3-7mm of its surface.
It should be noted that fixed plate group is made of fixed plate fixed frame 1 and several fixed plates 4 being fixed on this, Fixed plate is made of the metal with some strength or the non-conductor through surface metalation, and pole plate passes through fixed frame and its prominent table Face about 2-7mm, to ensure well to contact with terminal plate.
A kind of strain detection testing device of the magnetic control shape memory alloy based on capacitance sensor further comprises in the present invention:
The movable plate electrode group includes movable plate electrode fixed frame 5 and N number of movable plate electrode 8 for being fixed on the movable plate electrode fixed frame 5.
The movable plate electrode 8 includes metal or the non-conductor through surface metalation.
The movable plate electrode 8 passes through movable plate electrode fixed frame 5 and its prominent surface.
The movable plate electrode 8 passes through movable plate electrode fixed frame 5 and prominent 3-7mm of its surface.
It should be noted that movable plate electrode group by movable plate electrode fixed frame 5 and be fixed on this several movable plate electrodes (8 form, Movable plate electrode 8 is made of the metal with some strength or the non-conductor through surface metalation, and pole plate passes through fixed frame and protrudes it Surface about 2-7mm, to ensure well to contact with terminal plate.
A kind of strain detection testing device of the magnetic control shape memory alloy based on capacitance sensor further comprises in the present invention:
The capacitance probe further include: termination electrode terminal plate 2-3 and 6-7;The electrode connection plate is by substrate 3 and thereon Several thin copper film 12-15 compositions;
For the relative position by changing termination electrode terminal plate and fixed plate 4 and movable plate electrode 8, to change capacitance probe Internal multilayer connection type;
When outside thin copper film 12 or outside thin copper film 15 are connected with pole plate, it is respectively formed and is connected in series or in parallel;
When inside thin copper film 13 or inside thin copper film 14 are connect with pole plate, it is respectively formed several series and parallel mixing Connection type.
It should be noted that several thin copper film 12-15 groups of the termination electrode terminal plate of capacitor probe by substrate 3 and thereon At.By the relative position for changing termination electrode terminal plate and fixed plate and movable plate electrode, thus it is possible to vary each layer in multi-layer capacitor Connection type.When outside thin copper film 12 or outside thin copper film 15 are connected with pole plate, it can be respectively formed and be connected in series or in parallel, When inside thin copper film 13 or inside thin copper film 14 are connect with pole plate, the connection type of several series and parallel mixing can be formed.
In the strain detection testing device of above-mentioned magnetic control shape memory alloy, the guide rail mechanism of capacitor probe can be one side Rectangular metal type can also be fixedly mounted with larger rectangular channel, in rectangular channel by one side in insulating materials 17 with rectangular channel The insulating materials of material 16 forms.Rectangular channel inner surface is conducive to the movement of movable plate electrode on it through polishing or polishing treatment.
The above, the above embodiments are merely illustrative of the technical solutions of the present invention, rather than its limitations;Although referring to before Stating embodiment, invention is explained in detail, those skilled in the art should understand that: it still can be to preceding Technical solution documented by each embodiment is stated to modify or equivalent replacement of some of the technical features;And these It modifies or replaces, the spirit and scope for technical solution of various embodiments of the present invention that it does not separate the essence of the corresponding technical solution.

Claims (10)

1. a kind of strain detection testing device of the magnetic control shape memory alloy based on capacitance sensor characterized by comprising capacitor Probe, gear enlarger mechanism (10), input mechanism (11) and output mechanism (9);
The gear enlarger mechanism (10) includes N number of gear set, and each gear set is by installing two differences point on the same axis The gear composition for spending circular diameter, for realizing the amplification of transmitting step by step of micro-displacement by N number of gear set;
The input unit (11) and the output mechanism (9) are located at the upper and lower part of the gear enlarger mechanism (10), and Connection is engaged with the gear inside the gear enlarger by rack gear;
The capacitance probe includes: fixed plate group, movable plate electrode group and guide rail mechanism (17);
The movable plate electrode group is slidably connected with the fixed plate group by guide rail mechanism (17);
The rack gear for pushing movable plate electrode, send out by the movable plate electrode group and the fixed plate that displacive transformation is popped one's head at capacitor Raw relative movement, the area of capacitor probe and the variation of capacitance.
2. a kind of strain detection testing device of magnetic control shape memory alloy based on capacitance sensor according to claim 1, It is characterized in that,
The fixed plate group includes fixed plate fixed frame (1) and N number of fixed plate for being fixed on the fixed plate fixed frame (1) (4)。
3. a kind of strain detection testing device of magnetic control shape memory alloy based on capacitance sensor according to claim 2, It is characterized in that,
The fixed plate (4) includes metal or the non-conductor through surface metalation.
4. a kind of strain detection testing device of magnetic control shape memory alloy based on capacitance sensor according to claim 2, It is characterized in that,
The fixed plate (4) passes through fixed plate fixed frame (1) and its prominent surface.
5. a kind of strain detection testing device of magnetic control shape memory alloy based on capacitance sensor according to claim 4, It is characterized in that,
The fixed plate (4) passes through fixed plate fixed frame (1) and prominent 3-7mm of its surface.
6. a kind of strain detection testing device of magnetic control shape memory alloy based on capacitance sensor according to claim 1, It is characterized in that,
The movable plate electrode group includes movable plate electrode fixed frame (5) and N number of movable plate electrode for being fixed on the movable plate electrode fixed frame (5) (8)。
7. a kind of strain detection testing device of magnetic control shape memory alloy based on capacitance sensor according to claim 6, It is characterized in that,
The movable plate electrode (8) includes metal or the non-conductor through surface metalation.
8. a kind of strain detection testing device of magnetic control shape memory alloy based on capacitance sensor according to claim 6, It is characterized in that,
The movable plate electrode (8) passes through movable plate electrode fixed frame (5) and its prominent surface.
9. a kind of strain detection testing device of magnetic control shape memory alloy based on capacitance sensor according to claim 8, It is characterized in that,
The movable plate electrode (8) passes through movable plate electrode fixed frame (5) and prominent 3-7mm of its surface.
10. a kind of strain detection testing device of magnetic control shape memory alloy based on capacitance sensor according to claim 1, It is characterized in that,
The capacitance probe further include: termination electrode terminal plate (2-3,6-7);The electrode connection plate is by substrate (3) and thereon Several thin copper film (12-15) compositions;
For the relative position by changing termination electrode terminal plate and fixed plate (4) and movable plate electrode (8), to change capacitance probe Internal multilayer connection type;
When outside thin copper film (12 or 15) is connected with pole plate, it is respectively formed and is connected in series or in parallel;
When inside thin copper film (13 or 14) is connect with pole plate, it is respectively formed the connection type of several series and parallel mixing.
CN201610957553.5A 2016-10-27 2016-10-27 A kind of strain detection testing device of the magnetic control shape memory alloy based on capacitance sensor Active CN106524895B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610957553.5A CN106524895B (en) 2016-10-27 2016-10-27 A kind of strain detection testing device of the magnetic control shape memory alloy based on capacitance sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610957553.5A CN106524895B (en) 2016-10-27 2016-10-27 A kind of strain detection testing device of the magnetic control shape memory alloy based on capacitance sensor

Publications (2)

Publication Number Publication Date
CN106524895A CN106524895A (en) 2017-03-22
CN106524895B true CN106524895B (en) 2019-01-01

Family

ID=58325458

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610957553.5A Active CN106524895B (en) 2016-10-27 2016-10-27 A kind of strain detection testing device of the magnetic control shape memory alloy based on capacitance sensor

Country Status (1)

Country Link
CN (1) CN106524895B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107102279B (en) * 2017-05-26 2019-06-11 东北石油大学 A kind of magnetic strain measurement method
CN108469221B (en) * 2018-05-29 2023-06-02 南京铁道职业技术学院 High-speed railway pantograph carbon slide plate surface damage displacement-charge converter
CN108759654B (en) * 2018-06-27 2023-05-30 南京铁道职业技术学院 Transducer for measuring low-recess gap on surface of single-probe pantograph carbon slide plate
CN112857557A (en) * 2021-01-14 2021-05-28 中国地质大学(武汉) Auditory sensor based on 4D printing technology shaping

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3921237A1 (en) * 1989-06-26 1991-01-10 Bam Bundesanstalt Matforschung Capacitive deformation sensor for high temp. operation - has two stages of flat, parallel and rectangular, parallel plates forming differential capacitor
CN1084636A (en) * 1993-10-09 1994-03-30 胡耿 Capacitive force-sensing element and manufacture method thereof
CN2393077Y (en) * 1999-09-30 2000-08-23 南京达捷大坝安全技术发展公司 Differential capacitance type deformation monitoring instrument having self-checking function
CN102997837A (en) * 2012-10-10 2013-03-27 中国电子科技集团公司第四十九研究所 Capacitor type superhigh strain sensor
CN105783696A (en) * 2016-04-25 2016-07-20 天津大学 Strain sensor based on flexible capacitor and manufacturing and test method thereof

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3921237A1 (en) * 1989-06-26 1991-01-10 Bam Bundesanstalt Matforschung Capacitive deformation sensor for high temp. operation - has two stages of flat, parallel and rectangular, parallel plates forming differential capacitor
CN1084636A (en) * 1993-10-09 1994-03-30 胡耿 Capacitive force-sensing element and manufacture method thereof
CN2393077Y (en) * 1999-09-30 2000-08-23 南京达捷大坝安全技术发展公司 Differential capacitance type deformation monitoring instrument having self-checking function
CN102997837A (en) * 2012-10-10 2013-03-27 中国电子科技集团公司第四十九研究所 Capacitor type superhigh strain sensor
CN105783696A (en) * 2016-04-25 2016-07-20 天津大学 Strain sensor based on flexible capacitor and manufacturing and test method thereof

Also Published As

Publication number Publication date
CN106524895A (en) 2017-03-22

Similar Documents

Publication Publication Date Title
CN106524895B (en) A kind of strain detection testing device of the magnetic control shape memory alloy based on capacitance sensor
CN203365045U (en) Capacitive air pressure sensor of microelectronic mechanical system
CN104001563B (en) Pipettor
CN102062662A (en) Monolithic integrated SiC MEMS (Micro-Electro-Mechanical Systems) pressure sensor and production method thereof
MY134203A (en) Microcontactor probe and electric probe unit
CN106841319B (en) A kind of humidity sensor based on MEMS terminal type microwave power detector structure
CN105648403B (en) A kind of MoS2/ Cu nano particle SERS substrates and preparation method thereof
CN103616549A (en) Broadband low-current measurement device based on isolated PCB-type Rogowski coil
CN1271418C (en) Circuit and apparatus for detection of capacitance and microphone device
CN105136893A (en) Thin film transistor biosensor and preparation method thereof
CN110230031B (en) Broadband passive high-temperature-resistant flexible vibration sensor and preparation process thereof
CN116518830B (en) Power cable turning radius measuring equipment
CN203752154U (en) Battery adsorption mechanism
CN103464526B (en) A kind of press machine counting device
CN206599604U (en) A kind of coating machine of automatic actual displacement
CN107843385A (en) A kind of alundum (Al2O3) film vacuum is regulated
CN105336845A (en) High-polarization-intensity bismuth ferrite thick film material system and medium and low temperature preparation method
CN107976277A (en) Vacuum transducer based on graphene oxide and preparation method and application
CN104713466B (en) High-precision differential type multi-layer annular capacitance gage
CN103714882B (en) A kind of production method of the plating Ag conducting film being applied to touch screen induction device
CN203944404U (en) A kind of pipettor
CN209689715U (en) A kind of ultrasonic sensor detection circuit and circuit board
CN203648559U (en) Quantitative-alarming liquid moving device
CN109405733B (en) Quick high-precision plane parallelism measuring device
CN110646474A (en) Based on WO3Wireless passive H2Gas sensor and preparation method thereof

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant