CN106484309A - A kind of bit flipping detection method and device - Google Patents
A kind of bit flipping detection method and device Download PDFInfo
- Publication number
- CN106484309A CN106484309A CN201510543085.2A CN201510543085A CN106484309A CN 106484309 A CN106484309 A CN 106484309A CN 201510543085 A CN201510543085 A CN 201510543085A CN 106484309 A CN106484309 A CN 106484309A
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- Prior art keywords
- flash
- partition
- bit flipping
- flash partition
- flash memory
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
Abstract
The invention discloses a kind of bit flipping detection method and device.The method includes：The working condition for determining flash partition is Idle state, and the flash memory device includes at least one flash partition；Blocked scan operation is carried out to the flash partition, in order to determine the flash partition with the presence or absence of bit flipping.The detection for overturning region in time to flash memory middle position is achieved, so as to improve the reliability of flash memory.
Description
Technical field
The present invention relates to storage management domain, espespecially a kind of bit flipping detection method and device.
Background technology
Nand-flash is one kind of flash memory (flash), wherein, Nand-flash as a kind of storage device,
Have the advantages that capacity big, rewrite that speed is fast, be applied to storage mass data, thus in the industry cycle obtain
Increasingly it is widely applied.
During using Nand-flash internal memory, generally pass through in system to the Nand-flash internal memory
During storage region carries out read operation, it can be found that bit flipping phenomenon, that is to say, that send out reading
Bit flipping is can be found that during raw bit flipping region, then by error checking and (Error can be corrected
Correcting Code, abbreviation ECC) algorithm contraposition upset region repaired, wherein, bit flipping is referred to
There is upset or overturn by report in one bit bit.
Above-mentioned prior art is to find bit flipping region by read operation, however, those skilled in the art
Find during stating prior art in realization, if bit flipping region does not find in time, the position of bit flipping
After number is more than a limit value, ECC algorithm will be unable to repair the bit flipping region, so as to cause flash memory
Reliability relatively low.
Content of the invention
In order to solve above-mentioned technical problem, the invention provides a kind of bit flipping detection method and device, use
To solve the problems, such as to find bit flipping region in time.
In order to reach the object of the invention, the invention provides a kind of bit flipping detection method, including：
The working condition for determining flash partition is Idle state, and the flash memory device includes that at least one flash memory divides
Area；
Blocked scan operation is carried out to the flash partition, in order to determine the flash partition with the presence or absence of position
Upset.
Further, the working condition for determining flash partition is Idle state, including following any one group
Or its combination:
Determine that the current no user of flash partition is accessed；
Determine first utilization rate of current CPU less than the first threshold value, the central processor CPU and institute
Flash memory device connection is stated, for operation is controlled to the flash memory device；
The second utilization rate of current memory is determined less than the second threshold value, the internal memory is connected with the CPU.
Further, first threshold value is 20%；Second threshold value is 50%.
Further, described blocked scan operation is carried out to the flash partition of depositing, including：
Piecemeal is sent to the flash memory device and read nanddump instruction, the piecemeal reading instruction includes to read institute
The data of flash partition are stated, in order to determine the flash partition with the presence or absence of bit flipping.
Further, described blocked scan operation is carried out to the flash partition after, also include:
Determine that the flash partition has bit flipping region；
The bit flipping region is carried out repair process.
The invention provides a kind of bit flipping detection means, including：
Determining module, the working condition for determining flash partition are Idle state, and the flash memory device includes
At least one flash partition；
Scan module, for carrying out blocked scan operation to the flash partition, in order to determine the flash memory
Subregion whether there is bit flipping.
Further, the determining module, specifically for executing following any one group or its combination:
Determine that the current no user of flash partition is accessed；
Determine first utilization rate of Current central processor CPU less than the first threshold value, the CPU and institute
Flash memory device connection is stated, for operation is controlled to the flash memory device；
The second utilization rate of current memory is determined less than the second threshold value, the internal memory is connected with the CPU.
Further, first threshold value is 20%；Second threshold value is 50%.
Further, the scan module, reads specifically for sending piecemeal to the flash memory device
Nanddump is instructed, and the piecemeal reading instruction includes the data for reading the flash partition, in order to determine
Flash partition is stated with the presence or absence of bit flipping.
Further, the determining module, is additionally operable to determine that the flash partition has bit flipping region；
The bit flipping region is carried out repair process.
In the present embodiment, the working condition for determining flash partition is Idle state, and the flash memory device includes
At least one flash partition；Blocked scan operation is carried out to the flash partition, in order to determine the flash memory
Subregion whether there is bit flipping.The detection for overturning region in time to flash memory middle position is achieved, so as to improve
The reliability of flash memory.
Other features and advantages of the present invention will be illustrated in the following description, also, partly from froming the perspective of
Become apparent in bright book, or understood by implementing the present invention.The purpose of the present invention is excellent with other
Point can be realized and be obtained by specifically noted structure in specification, claims and accompanying drawing.
Description of the drawings
Accompanying drawing is used for providing further understanding technical solution of the present invention, and constitutes one of specification
Point, it is used for together with embodiments herein technical scheme to be explained, does not constitute to the present invention
The restriction of technical scheme.
Fig. 1 is the schematic flow sheet of one embodiment of bit flipping detection method of the present invention；
Fig. 2 is the schematic flow sheet of two embodiment of bit flipping detection method of the present invention；
Fig. 3 is the structural representation of one embodiment of bit flipping detection means of the present invention.
Specific embodiment
For making the object, technical solutions and advantages of the present invention become more apparent, below in conjunction with accompanying drawing
Embodiments of the invention are described in detail.It should be noted that in the case of not conflicting, this Shen
Please in embodiment and the feature in embodiment mutually can be combined.
Bit flipping detection method provided in an embodiment of the present invention is applied particularly to detection flash memory, such as Nand-flash
With the presence or absence of bit flipping region, wherein, bit flipping refers to that a bit bit occurs upset or overturn by report
?.The bit flipping detection implementation method that the present embodiment is provided can be executed by bit flipping detection means, should
Bit flipping detection means can be separately provided, it is also possible to be arranged on for detecting flash memory whether the setting of bit flipping
In standby, the equipment can be computer or mobile terminal etc., and wherein, the device can be realized using software/hardware.
Hereinafter bit flipping detection method and device are described in detail.
Fig. 1 is the schematic flow sheet of one embodiment of bit flipping detection method of the present invention, as shown in figure 1,
The bit flipping detection method that the present invention is provided be applied to the flash partition of flash memory device carry out read operation it
Before, the bit flipping detection method, including：
Step 101, determine flash partition working condition be Idle state.
In the present embodiment, the flash memory device includes at least one flash partition, the flash partition bag
At least one storage region is included, the size of the storage region is identical with the size of erasing block.For example,
The data of NandFlash are stored in the way of bit bit in memory cell (memory cell), one
As for, a bit can only be stored in a memory cell.These memory cell are with 8 bit or 16
Individual bit is unit, is linked to be bit line (bit line), is formed so-called byte (byte/word), and this is just
It is the bit wide of flash memory.These bit line meeting recomposition page (page), page can blockings (block).NandFlash
Data are read and write in units of page, data are wiped in units of block.
For example, the working condition for determination flash partition is Idle state, including following any one group
Or its combination：
Determine that the current no user of flash partition is accessed；
First utilization rate of current CPU is determined less than the first threshold value, the central processor CPU is to institute
State flash memory device and be controlled operation；
The second utilization rate of current memory is determined less than the second threshold value, the internal memory is connected with the CPU.
Step 102, blocked scan operation is carried out to the flash partition, in order to determine that the flash partition is
No have bit flipping.
In the present embodiment, the working condition for determining flash partition is Idle state, and flash memory device includes at least
One flash partition；Blocked scan operation is carried out to the flash partition, in order to determine the flash partition
With the presence or absence of bit flipping.The detection for overturning region in time to flash memory middle position is achieved, so as to improve flash memory
Reliability.
It should be noted that on the basis of above-described embodiment, first threshold value can be 20%；
Second threshold value can be 50%.
Further, on the basis of above-described embodiment, blocked scan behaviour is carried out to the flash partition
Make, can include：
Piecemeal is sent to the flash memory device and read nanddump instruction, the piecemeal reading instruction includes to read institute
The data of flash partition are stated, in order to determine the flash partition with the presence or absence of bit flipping.
Further, on the basis of above-described embodiment, described piecemeal is carried out to the flash partition sweep
After retouching operation, also include:
Determine that the flash partition has bit flipping region；
The bit flipping region is carried out repair process.
Fig. 2 is the schematic flow sheet of two embodiment of bit flipping detection method of the present invention, as shown in Fig. 2
The method includes：
Step 201, determine the number of flash partition in flash memory, in order to determine the flash partition number for needing scanning
Mesh.
Step 202, according in flash memory wipe block size, determine each flash partition need scanning number of times.
First using a flash partition as current flash subregion, step 202 is carried out.
For example, the size of each flash partition is divided by with erasing block size, then by division result
Obtaining after rounding needs the number of times of scanning.
The second current utilization rate of step 203, acquisition internal memory；
The first current utilization rate of step 204, acquisition CPU；
Whether step 205, inspection current flash subregion have other users to access；
Step 206, determine flash partition working condition be Idle state.
Specifically, according to the result of step 203～205, however, it is determined that the working condition of flash partition is the free time
State, then execution step 207；If it is determined that the working condition of flash partition is not Idle state, then enter dormancy shape
State, in the first preset duration, such as recovers from resting state after 24 hours, execution step 201 automatically.
For example, for implementation of the working condition for Idle state for determining flash partition, including：
Memory usage is less than 50%, and CPU usage is less than 20%, and current flash subregion does not have user
Access.
If it should be noted that any of the above does not meet, it is determined that the working condition of flash partition is not
Idle state.
Step 207, blocked scan operation is carried out to the flash partition, in order to determine that the flash partition is
No have bit flipping.
Specifically, execute piecemeal and read nanddump order reading flash data.If it find that position during being somebody's turn to do
Turning problem, can be repaired automatically by hardware.
Step 208, determine whether the flash partition is scanned.
Specifically, according to the flash partition scanning times are obtained in step 202, determine that the flash partition is
No scanned, if not scanned, execution step 203, i.e. repeat step 203- step 205.If
Scanned, then execution step 209.
Step 209, determine whether all flash partitions of flash memory device are scanned.
Specifically, if not scanned, using in the flash partition not scanned as current flash
Subregion, execution step 202, if scanned, resting state is entered, in the second preset duration, such as 24
Automatically recover from resting state after hour, execution step 201.
Fig. 3 is the structural representation of one embodiment of bit flipping detection means of the present invention, as shown in figure 3,
The bit flipping detection means, including：Determining module 31 and scan module 32.Wherein,
Determining module 31, the working condition for determining flash partition are Idle state, the flash memory device bag
Include at least one flash partition；
Scan module 32, for carrying out blocked scan operation to the flash partition, in order to determine the sudden strain of a muscle
Subregion is deposited with the presence or absence of bit flipping.
In the present embodiment, the working condition for determining flash partition is Idle state, and flash memory device includes at least
One flash partition；Blocked scan operation is carried out to the flash partition, in order to determine the flash partition
With the presence or absence of bit flipping.The detection for overturning region in time to flash memory middle position is achieved, so as to improve flash memory
Reliability.
On the basis of above-described embodiment, the determining module 31, following any one group specifically for executing
Or its combination:
Determine that the current no user of flash partition is accessed；
Determine first utilization rate of current CPU less than the first threshold value, the central processor CPU and institute
Flash memory device connection is stated, for operation is controlled to the flash memory device；
The second utilization rate of current memory is determined less than the second threshold value, the internal memory is connected with the CPU.
Further, on the basis of above-described embodiment, first threshold value is 20%；Described second
Threshold value is 50%.
Further, on the basis of above-described embodiment, the scan module 32, specifically for described
Flash memory device sends piecemeal and reads nanddump instruction, and the piecemeal reading instruction includes to read the flash partition
Data, in order to determine the flash partition with the presence or absence of bit flipping.
Further, on the basis of above-described embodiment, the determining module 31, it is additionally operable to determination described
There is bit flipping region in flash partition；The bit flipping region is carried out repair process.
The present embodiment, reduces the mistake of the unrepairable brought because bit flipping accumulates, reduces data
Or the probability of file corruption, the reliability of system is improve, while do not affect systematic function, this enforcement again
System in example includes internal memory, CPU and flash memory.
Although disclosed herein embodiment as above, described content is only and readily appreciates the present invention
And the embodiment for adopting, it is not limited to the present invention.Technology people in any art of the present invention
Member, without departing from disclosed herein spirit and scope on the premise of, can be in the form that implements and thin
Carry out any modification and change on section, but the scope of patent protection of the present invention, still must be with appended right
The scope defined by claim is defined.
Claims (10)
1. a kind of bit flipping detection method, it is characterised in that include：
The working condition for determining flash partition is Idle state, and flash memory device includes at least one flash partition；
Blocked scan operation is carried out to the flash partition, in order to determine the flash partition with the presence or absence of position
Upset.
2. method according to claim 1, it is characterised in that the work of the determination flash partition
State be Idle state, including following any one group or its combination:
Determine that the current no user of the flash partition is accessed；
Determine first utilization rate of Current central processor CPU less than the first threshold value, the CPU and institute
Flash memory device connection is stated, for operation is controlled to the flash memory device；
The second utilization rate of current memory is determined less than the second threshold value, the internal memory is connected with the CPU.
3. method according to claim 2, it is characterised in that first threshold value is 20%；
Second threshold value is 50%.
4. the method according to any one of claim 1-3, it is characterised in that described deposit sudden strain of a muscle to described
Depositing subregion carries out blocked scan operation, including：
Piecemeal is sent to the flash memory device and read nanddump instruction, the piecemeal reading instruction includes to read institute
The data of flash partition are stated, in order to determine the flash partition with the presence or absence of bit flipping.
5. method according to claim 4, it is characterised in that described the flash partition is carried out
After blocked scan operation, also include:
Determine that the flash partition has bit flipping region；
The bit flipping region is carried out repair process.
6. a kind of bit flipping detection means, it is characterised in that include：
Determining module, the working condition for determining flash partition are Idle state, and flash memory device is included at least
One flash partition；
Scan module, for carrying out blocked scan operation to the flash partition, in order to determine the flash memory
Subregion whether there is bit flipping.
7. device according to claim 6, it is characterised in that the determining module, specifically for
Execute following any one group or its combination:
Determine that the current no user of the flash partition is accessed；
Determine first utilization rate of Current central processor CPU less than the first threshold value, the CPU and institute
Flash memory device connection is stated, for operation is controlled to the flash memory device；
The second utilization rate of current memory is determined less than the second threshold value, the internal memory is connected with the CPU.
8. device according to claim 7, it is characterised in that first threshold value is 20%；
Second threshold value is 50%.
9. the device according to any one of claim 6-8, it is characterised in that the scan module,
Read nanddump instruction specifically for piecemeal being sent to the flash memory device, the piecemeal reading instruction includes to read
The data of the flash partition are taken, in order to determine the flash partition with the presence or absence of bit flipping.
10. device according to claim 9, it is characterised in that the determining module, is additionally operable to
Determine that the flash partition has bit flipping region；The bit flipping region is carried out repair process.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510543085.2A CN106484309A (en) | 2015-08-28 | 2015-08-28 | A kind of bit flipping detection method and device |
| PCT/CN2016/084171 WO2017036202A1 (en) | 2015-08-28 | 2016-05-31 | Bit-flipping detection method and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510543085.2A CN106484309A (en) | 2015-08-28 | 2015-08-28 | A kind of bit flipping detection method and device |
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| Publication Number | Publication Date |
|---|---|
| CN106484309A true CN106484309A (en) | 2017-03-08 |
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|---|---|---|---|
| CN201510543085.2A Pending CN106484309A (en) | 2015-08-28 | 2015-08-28 | A kind of bit flipping detection method and device |
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| CN (1) | CN106484309A (en) |
| WO (1) | WO2017036202A1 (en) |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7502986B2 (en) * | 2005-02-09 | 2009-03-10 | International Business Machines Corporation | Method and apparatus for collecting failure information on error correction code (ECC) protected data |
| US20090327581A1 (en) * | 2008-06-30 | 2009-12-31 | Coulson Richard L | Nand memory |
| KR101529880B1 (en) * | 2008-10-31 | 2015-06-19 | 삼성전자주식회사 | Method for estimating error and method for correcting the error |
| TWI395226B (en) * | 2008-11-07 | 2013-05-01 | Silicon Motion Inc | Method for testing storage apparatus and system thereof |
| CN102354294B (en) * | 2011-08-23 | 2015-04-22 | 西安空间无线电技术研究所 | Method for detecting spatial single event upset of space-borne DSP (Digital Signal Processor) chip |
| CN103092709A (en) * | 2013-01-22 | 2013-05-08 | 浪潮电子信息产业股份有限公司 | Memory error processing method |
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2015
- 2015-08-28 CN CN201510543085.2A patent/CN106484309A/en active Pending
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| WO2017036202A1 (en) | 2017-03-09 |
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| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20170308 |
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| WD01 | Invention patent application deemed withdrawn after publication |