CN106405908A - Embedded touch testing circuit - Google Patents
Embedded touch testing circuit Download PDFInfo
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- CN106405908A CN106405908A CN201610647563.9A CN201610647563A CN106405908A CN 106405908 A CN106405908 A CN 106405908A CN 201610647563 A CN201610647563 A CN 201610647563A CN 106405908 A CN106405908 A CN 106405908A
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- 230000008878 coupling Effects 0.000 claims abstract description 22
- 238000010168 coupling process Methods 0.000 claims abstract description 22
- 238000005859 coupling reaction Methods 0.000 claims abstract description 22
- 239000010409 thin film Substances 0.000 claims description 208
- 239000000463 material Substances 0.000 abstract description 7
- 239000002699 waste material Substances 0.000 abstract description 5
- 238000003491 array Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 12
- 238000005516 engineering process Methods 0.000 description 5
- 230000001808 coupling effect Effects 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/13338—Input devices, e.g. touch panels
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0412—Digitisers structurally integrated in a display
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0416—Control or interface arrangements specially adapted for digitisers
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Human Computer Interaction (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mathematical Physics (AREA)
- Optics & Photonics (AREA)
- Computer Hardware Design (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Liquid Crystal (AREA)
Abstract
The invention provides an embedded touch testing circuit which comprises touch electrodes arranged in arrays, a capacitance coupling module, a first switch module and a second switch module, wherein n touch electrodes are disposed in each row, and m touch electrodes are disposed in each column; the capacitance coupling module is in a coupled connection with the touch electrodes; the first switch module comprises a first input end, a first control ends and n first output ends; and the second switch module comprises m second input ends, b second control ends and a second output end, n, m, a and b are positive integers, n is not larger than 2^a, and m is not larger than 2^b. The embedded touch testing circuit provided by the invention is characterized in that capacitance coupling module is used to trigger the touch electrodes to generate touch signals; the first switch module and the second switch module are used to collect the touch signals generated by each touch electrode one by one; and the collected touch signals are compared. In this way, a production function test of a touch screen could be achieved; thus, waste of materials such as chips and flat cables could be avoided; and production efficiency is increased.
Description
Technical Field
The invention relates to the technical field of touch control, in particular to an embedded touch control test circuit.
Background
Compared with the conventional technology of disposing a touch panel on a liquid crystal panel, research on integration of the touch panel function and the liquid crystal panel is increasing, and thus an in-cell touch screen appears. In-cell touch screen technologies include both in-cell and on-cell. In-cell touch screen technology refers to the embedding of touch panel functionality into liquid crystal pixels, while on-cell touch screen technology refers to the embedding of touch panel functionality between a color filter substrate and a polarizer. Compared with an on-cell touch screen, the in-cell touch screen can realize the second lighter and thinner panel.
In the in-cell touch screen technology, in a cell (assembly process), only the display function of the touch screen is generally tested, but the touch function of the touch screen is not tested. The touch function needs to be tested after the chip and the flat cable are bound, so that a touch screen with poor touch cannot be screened out in a cell stage, the waste of materials such as the chip and the flat cable is caused, and the production efficiency is reduced.
Therefore, it is desirable to provide an in-cell touch test circuit to solve the problems of the prior art.
Disclosure of Invention
The invention aims to provide an embedded touch control test circuit, which aims to solve the technical problems that the existing touch screen cannot test the touch function in a cell stage, and can test the touch screen after bonding materials such as chips, cables and the like, so that the material waste is caused, and the production efficiency is reduced.
In order to solve the above problems, the technical scheme provided by the invention is as follows:
an embodiment of the present invention provides an embedded touch test circuit, which includes:
the touch control electrodes are arranged in an array, each touch control electrode is connected with the source electrode of the corresponding first thin film transistor, n touch control electrodes are arranged in each row, and m touch control electrodes are arranged in each column;
the capacitive coupling module is coupled with the touch electrode and used for triggering the touch electrode to generate a touch signal;
the first switch module comprises a first input end, a first control ends and n first output ends, wherein the first control ends are connected with a corresponding first control signal source, the first input ends are connected with a constant voltage high level source, the first output ends are connected with the grid electrodes of corresponding first thin film transistors, and the first switch module is used for transmitting the constant voltage high level provided by the constant voltage high level source to the grid electrodes of the first thin film transistors under the control of a first control signal provided by the first control signal source and transmitting a touch signal generated by one row of touch electrodes to the drain electrodes of the corresponding first thin film transistors;
the second switch module comprises m second input ends, b second control ends and a second output end, the second input ends are connected with the drain electrodes of the corresponding first thin film transistors, the second control ends are connected with corresponding second control signal sources, and the second output ends are connected with the touch signal acquisition terminals and used for outputting touch signals generated by one row of touch electrodes to the touch signal acquisition terminals one by one under the control of second control signals provided by the second control signal sources;
wherein n, m, a and b are positive integers, n is less than or equal to 2^ a, and m is less than or equal to 2^ b.
In the embedded touch test circuit of the invention, the capacitive coupling module comprises:
a constant voltage power supply for providing a constant voltage level;
a scan line input signal source for providing a scan line input signal;
the scanning line control signal source is used for providing a scanning line control signal; and the number of the first and second groups,
the control unit is used for receiving the scanning line input signal and outputting the scanning line input signal under the control of the scanning line control signal; wherein,
the constant voltage power supply is connected with the data line, the scanning line input signal source is connected with the input end of the control unit, the scanning line control signal source is connected with the control end of the control unit, and the output end of the control unit is connected with the scanning line.
In the embedded touch control test circuit, the control unit comprises a plurality of second thin film transistors, the grid electrode of each second thin film transistor is connected with the scanning line control signal source, the source electrode of each second thin film transistor is connected with the scanning line input signal source, and the drain electrode of each second thin film transistor is connected with the corresponding scanning line.
In the in-cell touch test circuit of the invention, the first switch module includes a plurality of third thin film transistors, and a gate of each first thin film transistor is connected with a plurality of third thin film transistors connected in series.
In the in-cell touch test circuit of the present invention, the second switch module includes a plurality of fourth tfts, and a drain of each of the first tfts is connected to b series-connected fourth tfts.
The invention also provides an embedded touch control test circuit, which comprises:
the touch control electrodes are arranged in an array, each touch control electrode is connected with the source electrode of the corresponding first thin film transistor, n touch control electrodes are arranged in each row, and m touch control electrodes are arranged in each column;
the capacitive coupling module is coupled with the touch electrode and used for triggering the touch electrode to generate a touch signal;
the first switch module comprises a first input end, a first control ends and n first output ends, wherein the first control ends are connected with a corresponding first control signal source, the first input ends are connected with a constant voltage high level source, the first output ends are connected with the grid electrodes of corresponding first thin film transistors, and the first switch module is used for transmitting the constant voltage high level provided by the constant voltage high level source to the grid electrodes of the first thin film transistors under the control of a first control signal provided by the first control signal source and transmitting a touch signal generated by one row of touch electrodes to the drain electrodes of the corresponding first thin film transistors;
the second switch module comprises m second input ends, b second control ends and a second output end, the second input ends are connected with the drain electrodes of the corresponding first thin film transistors, the second control ends are connected with corresponding second control signal sources, and the second output ends are connected with the touch signal acquisition terminals and used for outputting touch signals generated by one row of touch electrodes to the touch signal acquisition terminals one by one under the control of second control signals provided by the second control signal sources;
wherein n, m, a and b are positive integers, n is less than or equal to 2^ a, and m is less than or equal to 2^ (b + 1).
In the embedded touch test circuit of the invention, the capacitive coupling module comprises:
a constant voltage power supply for providing a constant voltage level;
a scan line input signal source for providing a scan line input signal;
the scanning line control signal source is used for providing a scanning line control signal; and the number of the first and second groups,
the control unit is used for receiving the scanning line input signal and outputting the scanning line input signal under the control of the scanning line control signal; wherein,
the constant voltage power supply is connected with the data line, the scanning line input signal source is connected with the input end of the control unit, the scanning line control signal source is connected with the control end of the control unit, and the output end of the control unit is connected with the scanning line.
In the embedded touch control test circuit, the control unit comprises a plurality of second thin film transistors, the grid electrode of each second thin film transistor is connected with the scanning line control signal source, the source electrode of each second thin film transistor is connected with the scanning line input signal source, and the drain electrode of each second thin film transistor is connected with the corresponding scanning line.
In the in-cell touch test circuit of the invention, the first switch module includes a plurality of third thin film transistors, and a gate of each first thin film transistor is connected with a plurality of third thin film transistors connected in series.
In the in-cell touch test circuit of the present invention, the second switch module includes a plurality of fourth tfts, and a drain of each of the first tfts is connected to b series-connected fourth tfts.
The embedded touch control test circuit triggers the touch control electrodes through the capacitive coupling module to generate touch control signals, acquires the touch control signals generated by each touch control electrode one by one through the first switch module and the second switch module, and compares the acquired touch control signals, so that the output function test of the touch screen is completed; the technical problems that the touch function of the existing touch screen needs to be tested after the chip and the flat cable are bound, so that the touch screen with poor touch cannot be screened out in a cell stage, materials such as the chip and the flat cable are wasted, and production efficiency is reduced are solved.
In order to make the aforementioned and other objects of the present invention more comprehensible, preferred embodiments accompanied with figures are described in detail below:
drawings
The technical solution and other advantages of the present invention will become apparent from the following detailed description of specific embodiments of the present invention, which is to be read in connection with the accompanying drawings.
FIG. 1 is a schematic diagram of a first preferred embodiment of an in-cell touch test circuit according to the present invention;
FIG. 2 is a schematic circuit diagram of a capacitive coupling module according to a first preferred embodiment of an in-cell touch test circuit of the present invention;
FIG. 3 is a schematic circuit diagram of a first switch module and a second switch module of a first preferred embodiment of an in-cell touch test circuit according to the present invention;
FIG. 4 is a schematic diagram illustrating a second preferred embodiment of an in-cell touch test circuit according to the present invention;
FIG. 5 is a schematic circuit diagram of a capacitive coupling module according to a second preferred embodiment of the in-cell touch test circuit of the present invention;
fig. 6 is a schematic circuit diagram of a first switch module and a second switch module of a second preferred embodiment of an in-cell touch test circuit according to the present invention.
Detailed Description
To further illustrate the technical means and effects of the present invention, the following detailed description is given with reference to the preferred embodiments of the present invention and the accompanying drawings.
It should be noted that, the embodiment of the in-cell touch test circuit of the present invention is exemplified by a 4 × 4 matrix touch electrode, and those skilled in the art can deduce the circuit connection relationship of all touch electrodes of the touch screen according to the following teaching and teachings.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a first preferred embodiment of an in-cell touch test circuit according to the present invention;
the embedded touch control test circuit of the preferred embodiment comprises:
the touch control electrodes are arranged in an array, each touch control electrode is connected with the source electrode of the corresponding first thin film transistor, each row is provided with 4 touch control electrodes, and each column is provided with 4 touch control electrodes;
the capacitive coupling module 109 is coupled with the touch electrode and used for triggering the touch electrode to generate a touch signal;
the first switch module 104 includes a first input terminal, 2 first control terminals and 4 first output terminals, the first control terminals are connected to a corresponding first control signal source, the first input terminal is connected to the constant voltage high level source 101, the first output terminals are connected to the gates of the corresponding first thin film transistors, and the first switch module is controlled by a first control signal provided by the first control signal source to transmit the constant voltage high level provided by the constant voltage high level source 101 to the gates of the first thin film transistors and transmit the touch signals generated by one row of touch electrodes to the drains of the corresponding first thin film transistors;
the second switch module 108 includes 4 second input terminals, 2 second control terminals, and a second output terminal, the second input terminals are connected to the drains of the corresponding first thin film transistors, the second control terminals are connected to the corresponding second control signal sources, and the second output terminals are connected to the touch signal collecting terminals, so that the second switch module is controlled by the second control signals provided by the second control signal sources to output the touch signals generated by one row of touch electrodes to the touch signal collecting terminals 107 one by one.
In particular, the 2 first control signal sources of the first switch module 104 and the 2 control signal sources of the second switch module 108 of the preferred embodiment can control the one-by-one collection of the touch signals generated on the 16 touch electrodes at most.
In the embedded touch test circuit of the preferred embodiment, the 2 first control signal sources on the first switch module 104 include: a first control signal source 102 and a second first control signal source 103; the 2 second control signal sources on the second switch module 108 include: a first second control signal source 105 and a second control signal source 106.
Referring to fig. 2, fig. 2 is a schematic circuit diagram of a capacitive coupling module according to a first preferred embodiment of an in-cell touch test circuit of the present invention;
in the embedded touch test circuit of the preferred embodiment, the capacitive coupling module 109 includes: a constant voltage power source 113, a scan line input signal source 112, a scan line control signal source 111, and a control unit 110. A constant voltage power supply 113 for supplying a constant voltage level; a scan line input signal source 112 for providing a scan line input signal; a scan line control signal source 111 for providing a scan line control signal; a control unit 110 for receiving a scan line input signal and outputting the scan line input signal under the control of the scan line control signal;
the constant voltage source 113 is connected to the data line 116, the scan line input signal source 112 is connected to the input terminal of the control unit 110, the scan line control signal source 111 is connected to the control terminal of the control unit 110, and the output terminal of the control unit 110 is connected to the scan line 115.
Specifically, the control unit 110 includes 12 second thin film transistors T17 to T28, one thin film transistor corresponding to one scanning line 115, a gate of each thin film transistor being connected to the scanning line control signal source 111, a source of each thin film transistor being connected to the scanning line input signal source 112, and a drain of each thin film transistor being connected to the corresponding scanning line 115.
Referring to fig. 3, fig. 3 is a schematic circuit diagram of a first switch module and a second switch module of a first preferred embodiment of an in-cell touch test circuit according to the present invention;
in the embedded touch test circuit of the preferred embodiment, the first switch module 104 includes 8 third tfts, and the gate of each first tft is connected to 2 third tfts connected in series;
specifically, the third thin film transistors T29 and T30 are connected in series, the source of the third thin film transistor T29 is connected to the constant voltage high level source 101, and the drain of the third thin film transistor T30 is connected to the gates of the first thin film transistors T13, T14, T15, and T16;
the third thin film transistors T31 and T32 are connected in series, the source of the third thin film transistor T31 is connected to the constant voltage high level source 101, and the drain of the third thin film transistor T32 is connected to the gates of the first thin film transistors T9, T10, T11, and T12;
the third thin film transistors T33 and T34 are connected in series, the source of the third thin film transistor T33 is connected to the constant voltage high level source 101, and the drain of the third thin film transistor T34 is connected to the gates of the first thin film transistors T5, T6, T7, and T8;
the third thin film transistors T35 and T36 are connected in series, the source of the third thin film transistor T35 is connected to the constant voltage high level source 101, and the drain of the third thin film transistor T36 is connected to the gates of the first thin film transistors T1, T2, T3, and T4.
The first control signal source 102 is connected to the gates of the third tfts T29, T31, T33, T35; the second first control signal source 103 is connected to the gates of the third tfts T30, T32, T34, and T36.
In the embedded touch test circuit of the preferred embodiment, the second switch module 108 includes 8 fourth tfts, and the drain of each first tft is connected to 2 fourth tfts connected in series;
specifically, the fourth thin film transistors T37 and T38 are connected in series, the source of the fourth thin film transistor T38 is connected to the first thin film transistors T1, T5, T9, and T13, and the drain of the fourth thin film transistor T37 is connected to the touch signal collecting terminal 107;
the fourth thin film transistors T39 and T40 are connected in series, the source of the fourth thin film transistor T40 is connected to the first thin film transistors T2, T6, T10 and T14, and the drain of the fourth thin film transistor T40 is connected to the touch signal acquisition terminal 107;
the fourth thin film transistors T41 and T42 are connected in series, the source of the fourth thin film transistor T42 is connected to the first thin film transistors T3, T7, T11 and T15, and the drain of the fourth thin film transistor T42 is connected to the touch signal acquisition terminal 107;
the fourth thin film transistors T43 and T44 are connected in series, the source of the fourth thin film transistor T44 is connected to the first thin film transistors T4, T8, T12 and T16, and the drain of the fourth thin film transistor T44 is connected to the touch signal acquisition terminal 107;
the first second control signal source 105 is connected to the gates of the fourth thin film transistors T37, T39, T41, T43; the second control signal source 106 is connected to the gates of the fourth tfts T38, T40, T42, and T44.
In the embedded touch test circuit of the preferred embodiment, the first thin film transistors T1-T16, the second thin film transistors T17-T28, the third thin film transistors T32, T33, T35 and T36, and the fourth thin film transistors T40, T41, T43 and T44 are N-type thin film transistors; the third thin film transistors T29, T30, T31, and T34, and the fourth thin film transistors T37, T38, T39, and T42 are P-type thin film transistors.
When the embedded touch test circuit of the preferred embodiment is used, firstly, the constant voltage power supply 113 provides 0V voltage to the data line 116, so as to prevent the data line from generating electrical interference to the touch electrode; then, the scan line control signal source 111 provides a scan line control signal with a high potential to the tfts T17-T28, and the scan line input signal source 112 provides a scan line input signal with a certain frequency and a certain voltage to the scan lines via the tfts T17-T28, so as to trigger the touch electrodes to generate touch signals due to the capacitive coupling effect between the scan lines 115 and the touch electrodes.
Then, the first control signal source 102 and the second first control signal source 103 provide control signals of high potential, the third thin film transistors T35 and T36 connected in series are turned on, the constant voltage high potential provided by the constant voltage high level source 101 is transmitted to the gates of the first thin film transistors T1, T2, T3 and T4, the first thin film transistors T1, T2, T3 and T4 are turned on, and the touch signals on the first, second, third and four electrodes are transmitted to the drains of the first thin film transistors T1, T2, T3 and T4;
at this time, when the first second control signal 105 source and the second control signal source 106 provide low-level control signals, the series-connected fourth thin film transistors T37 and T38 are turned on, and the touch signal on the first touch electrode is output to the touch signal collecting terminal 107;
when the first second control signal source 105 provides a low-level control signal, the second control signal source 106 provides a high-level control signal, the fourth tfts T39 and T40 connected in series are turned on, and the touch signal on the second touch electrode is output to the touch signal collecting terminal 107;
when the first second control signal source 105 provides a high-level control signal, the second control signal source 106 provides a low-level control signal, the fourth tfts T41 and T42 connected in series are turned on, and the touch signal on the third touch electrode is output to the touch signal collecting terminal 107;
when the first second control signal source 105 and the second control signal source 106 provide a high-potential control signal, the fourth thin film transistors T43 and T44 connected in series are turned on, and the touch signal on the fourth touch electrode is output to the touch signal collecting terminal 107.
At the next moment, the first control signal source 102 provides a control signal with a high potential, the second first control signal source 103 provides a control signal with a low potential, the third thin film transistors T33 and T34 connected in series are turned on, the constant voltage high potential provided by the constant voltage high level source 101 is transmitted to the gates of the first thin film transistors T5, T6, T7 and T8, the first thin film transistors T5, T6, T7 and T8 are turned on, and the touch signals on the fifth, sixth, seventh and eight electrodes are transmitted to the drains of the first thin film transistors T5, T6, T7 and T8;
at this time, when the first second control signal source 105 and the second control signal source 106 provide low-level control signals, the series-connected fourth thin film transistors T37 and T38 are turned on, and the touch signal on the fifth touch electrode is output to the touch signal collecting terminal 107;
when the first second control signal source 105 provides a low-level control signal, the second control signal source 106 provides a high-level control signal, the fourth tfts T39 and T40 connected in series are turned on, and the touch signal on the sixth touch electrode is output to the touch signal collecting terminal 107;
when the first second control signal source 105 provides a high-potential control signal, the second control signal source 106 provides a low-potential control signal, the fourth tfts T41 and T42 connected in series are turned on, and the touch signal on the seventh touch electrode is output to the touch signal collecting terminal 107;
when the first second control signal source 105 and the second control signal source 106 provide the high-potential control signal, the fourth thin film transistors T43 and T44 connected in series are turned on, and the touch signal on the eighth touch electrode is output to the touch signal collecting terminal 107.
At the next moment, the first control signal source 102 provides a control signal with a low potential, the second first control signal source provides a control signal 103 with a high potential, the third thin film transistors T31 and T32 connected in series are turned on, the constant voltage high potential provided by the constant voltage high level source 101 is transmitted to the gates of the first thin film transistors T9, T10, T11 and T12, the first thin film transistors T9, T10, T11 and T12 are turned on, and the touch signals on the ninth, tenth, eleventh and twelfth electrodes are transmitted to the drains of the first thin film transistors T9, T10, T11 and T12;
at this time, when the first second control signal source 105 and the second control signal source 106 provide low-potential control signals, the fourth thin film transistors T37 and T38 connected in series are turned on, and the touch signal on the ninth touch electrode is output to the touch signal collecting terminal;
when the first second control signal source 105 provides a low-level control signal, the second control signal source 106 provides a high-level control signal, the fourth tfts T39 and T40 connected in series are turned on, and the touch signal on the tenth touch electrode is output to the touch signal collecting terminal 107;
when the first second control signal source 105 provides a high-level control signal, the second control signal source 106 provides a low-level control signal, the series-connected fourth thin film transistors T41 and T42 are turned on, and the touch signal on the eleventh touch electrode is output to the touch signal collecting terminal 107;
when the first second control signal source 105 and the second control signal source 106 provide the high-potential control signal, the fourth thin film transistors T43 and T44 connected in series are turned on, and the touch signal on the twelfth touch electrode is output to the touch signal collecting terminal 107.
At the next moment, the first control signal source 102 and the second first control signal source 103 provide control signals with low potential, the third thin film transistors T29 and T30 connected in series are turned on, the constant voltage high potential provided by the constant voltage high level source 101 is transmitted to the gates of the first thin film transistors T13, T14, T15 and T16, the first thin film transistors T13, T14, T15 and T16 are turned on, and touch signals on the thirteenth, fourteenth, fifteenth and sixteenth electrodes are transmitted to the drains of the first thin film transistors T13, T14, T15 and T16;
at this time, when the first second control signal source 105 and the second control signal source 106 provide low-level control signals, the series-connected fourth thin film transistors T37 and T38 are turned on, and the touch signal on the thirteenth touch electrode is output to the touch signal collecting terminal 107;
when the first second control signal source 105 provides a low-potential control signal, the second control signal source 106 provides a high-potential control signal, the fourth thin film transistors T39 and T40 connected in series are turned on, and the touch signal on the fourteenth touch electrode is output to the touch signal collecting terminal 107;
when the first second control signal source 105 provides a high-level control signal, the second control signal source 106 provides a low-level control signal, the fourth tfts T41 and T42 connected in series are turned on, and the touch signal on the fifteenth touch electrode is output to the touch signal collecting terminal 107;
when the first second control signal source 105 and the second control signal source 106 provide the high-potential control signal, the fourth thin film transistors T43 and T44 connected in series are turned on, and the touch signal on the sixteenth touch electrode is output to the touch signal collecting terminal 107.
Finally, comparing the acquired touch signals, and if the waveforms of all the acquired touch signals are consistent, determining that the touch screen is a good product; if the waveform difference between a certain touch signal and other touch signals is large, it can be concluded that the touch electrode is short-circuited or open-circuited.
In the embedded touch test circuit of the preferred embodiment, the capacitive coupling module 109 triggers the touch electrodes to generate the touch signals, the first switch module 104 and the second switch module 108 collect the touch signals generated by each touch electrode one by one, and the collected touch signals are compared, so that the touch screen function test of the touch screen is completed, the waste of materials such as chips and cables is avoided, and the production efficiency is improved.
Referring to fig. 4, fig. 4 is a schematic structural diagram of a second preferred embodiment of an in-cell touch test circuit according to the present invention;
the difference between the preferred embodiment and the first preferred embodiment is that the use of one control signal source is reduced, and since each control signal source needs to reserve a position on the touch screen frame, the reduction of the use of the control signal source is beneficial to narrowing the frame.
The embedded touch control test circuit of the preferred embodiment comprises:
the touch control electrodes are arranged in an array, each touch control electrode is connected with the source electrode of the corresponding first thin film transistor, each row is provided with 4 touch control electrodes, and each column is provided with 4 touch control electrodes;
the capacitive coupling module 209 is coupled with the touch electrode and used for triggering the touch electrode to generate a touch signal;
the first switch module 204 includes a first input terminal, 2 first control terminals and 4 first output terminals, the first control terminals are connected to a corresponding first control signal source, the first input terminal is connected to the constant voltage high level source 201, the first output terminals are connected to the gates of the corresponding first thin film transistors, and the first switch module is controlled by a first control signal provided by the first control signal source to transmit the constant voltage high level provided by the constant voltage high level source 201 to the gates of the first thin film transistors and transmit the touch signals generated by one row of touch electrodes to the drains of the corresponding first thin film transistors;
the second switch module 208 includes 4 second input terminals, 1 second control terminal, and a second output terminal, where the second input terminal is connected to the drain of the corresponding first thin film transistor, the second control terminal is connected to the corresponding second control signal source, and the second output terminal is connected to the touch signal collecting terminal, and is used for outputting the touch signals generated by one row of touch electrodes to the touch signal collecting terminal 207 one by one under the control of the second control signal provided by the second control signal source.
In particular, the 2 first control signal sources of the first switch module 204 and the 1 control signal source of the second switch module 208 of the preferred embodiment can control the one-by-one collection of the touch signals generated on the 16 touch electrodes at most.
In the embedded touch test circuit of the preferred embodiment, the 2 first control signal sources on the first switch module 204 include: a first control signal source 202 and a second first control signal source 203; 1 second control signal source 205 on the second switch module 208.
Referring to fig. 5, fig. 5 is a schematic circuit diagram of a capacitive coupling module according to a second preferred embodiment of the in-cell touch test circuit of the present invention;
in the embedded touch test circuit of the preferred embodiment, the capacitive coupling module 209 includes: a constant voltage power source 213, a scan line input signal source 212, a scan line control signal source 211, and a control unit 210. A constant voltage power supply 213 for supplying a constant voltage level; a scan line input signal source 212 for providing a scan line input signal; a scan line control signal source 211 for providing a scan line control signal; a control unit 210 for receiving a scan line input signal and outputting the scan line input signal under the control of the scan line control signal;
the constant voltage source 213 is connected to the data line 216, the scan line input signal source 212 is connected to the input terminal of the control unit 210, the scan line control signal source 211 is connected to the control terminal of the control unit 210, and the output terminal of the control unit 210 is connected to the scan line 215.
Specifically, the control unit 210 includes 12 second thin film transistors D17 through D28, one thin film transistor corresponding to one scan line 215, a gate of each thin film transistor connected to the scan line control signal source 211, a source of each thin film transistor connected to the scan line input signal source 212, and a drain of each thin film transistor connected to the corresponding scan line 215.
Referring to fig. 6, fig. 6 is a schematic circuit diagram of a first switch module and a second switch module of a second preferred embodiment of an in-cell touch test circuit according to the present invention;
in the embedded touch test circuit of the preferred embodiment, the first switch module 204 includes 8 third tfts, and the gate of each first tft is connected to 2 serially connected third tfts;
specifically, the third thin film transistors D29 and D30 are connected in series, the source of the third thin film transistor D29 is connected to the constant voltage high level source 201, and the drain of the third thin film transistor D30 is connected to the gates of the first thin film transistors D13, D14, D15, and D16;
the third thin film transistors D31 and D32 are connected in series, the source of the third thin film transistor D31 is connected to the constant voltage high level source 201, and the drain of the third thin film transistor D32 is connected to the gates of the first thin film transistors D9, D10, D11, and D12;
the third thin film transistors D33 and D34 are connected in series, the source of the third thin film transistor D33 is connected to the constant voltage high level source 201, and the drain of the third thin film transistor D34 is connected to the gates of the first thin film transistors D5, D6, D7, and D8;
the third thin film transistors D35 and D36 are connected in series, the source of the third thin film transistor D35 is connected to the constant voltage high level source 201, and the drain of the third thin film transistor D36 is connected to the gates of the first thin film transistors D1, D2, D3, and D4.
The first control signal source 202 is connected with the gates of the third thin film transistors D29, D31, D33 and D35; the second first control signal source 203 is connected to the gates of the third TFTs D30, D32, D34, D36.
In the embedded touch test circuit of the preferred embodiment, the second switch module 208 includes 4 fourth tfts, and the drain of each first tft is connected to 1 fourth tft;
specifically, the source of the fourth thin film transistor D37 is connected to the first thin film transistors D1, D5, D9 and D13, and the drain of the fourth thin film transistor D37 is connected to the touch signal acquisition terminal 207;
the source of the fourth thin film transistor D38 is connected to the first thin film transistors D2, D6, D10 and D14, and the drain of the fourth thin film transistor D38 is connected to the touch signal acquisition terminal 207;
the fourth thin film transistor D39 is connected to the first thin film transistors D3, D7, D11 and D15, and the drain of the fourth thin film transistor D39 is connected to the touch signal acquisition terminal 207;
the fourth thin film transistor D40 is connected to the first thin film transistors D4, D8, D12 and D16, and the drain of the fourth thin film transistor D40 is connected to the touch signal acquisition terminal 207;
the second control signal source 205 is connected to the gates of the fourth thin film transistors D37, D38, D39, and D40.
In the embedded touch test circuit of the preferred embodiment, the first thin film transistors D1-D16, the second thin film transistors D23-D28, the third thin film transistors D32, D33, D35 and D36, and the fourth thin film transistors D38 and D40 are N-type thin film transistors; the second thin film transistors D17 to D22, the third thin film transistors D29, D30, D31 and D34, and the fourth thin film transistors D37 and D39 are P-type thin film transistors.
When the embedded touch test circuit of the preferred embodiment is used, firstly, the constant voltage power source 213 provides 0V voltage to the data line 216 to prevent the data line from generating electrical interference to the touch electrode; then, the scan line control signal source 211 provides a high-voltage scan line control signal to the tfts D17-D28, and the scan line input signal source 212 provides a scan line input signal with a certain frequency and a certain voltage to the scan lines via the tfts D23-D28, so as to trigger the first, second, fifth, sixth, ninth, tenth, thirteenth, and fourteenth touch electrodes to generate touch signals due to the capacitive coupling effect between the scan lines 215 and the touch electrodes.
Then, the first control signal source 202 and the second first control signal source 203 provide high-potential control signals, the third thin film transistors D35 and D36 connected in series are turned on, the constant-voltage high-potential provided by the constant-voltage high-level source 201 is transmitted to the gates of the first thin film transistors D1, D2, D3 and D4, the first thin film transistors D1, D2, D3 and D4 are turned on, and the touch signals on the first and second electrodes are transmitted to the drains of the first thin film transistors D1 and D2;
at this time, when the source of the second control signal 205 provides a low-level control signal, the fourth thin film transistor D37 is turned on, and the touch signal on the first touch electrode is output to the touch signal collecting terminal 207;
when the second control signal source 205 provides a high-level control signal, the fourth thin film transistor D38 is turned on, and the touch signal on the second touch electrode is output to the touch signal collecting terminal 207.
At the next moment, the first control signal source 202 provides a high-potential control signal, the second first control signal source 203 provides a low-potential control signal, the third thin film transistors D33 and D34 connected in series are turned on, the constant-voltage high potential provided by the constant-voltage high-level source 201 is transmitted to the gates of the first thin film transistors D5, D6, D7 and D8, the first thin film transistors D5, D6, D7 and D8 are turned on, and the touch signals on the fifth and sixth electrodes are transmitted to the drains of the first thin film transistors D5 and D6;
at this time, when the second control signal source 205 provides a low-potential control signal, the fourth thin film transistor D37 is turned on, and the touch signal on the fifth touch electrode is output to the touch signal collecting terminal 207;
when the second control signal source 205 provides a high-level control signal, the fourth thin film transistor D38 is turned on, and the touch signal on the sixth touch electrode is output to the touch signal collecting terminal 207.
At the next moment, the first control signal source 202 provides a low-potential control signal, the second first control signal source 203 provides a high-potential control signal, the third thin film transistors D31 and D32 connected in series are turned on, the constant-voltage high potential provided by the constant-voltage high-level source 201 is transmitted to the gates of the first thin film transistors D9, D10, D11 and D12, the first thin film transistors D9, D10, D11 and D12 are turned on, and the touch signals on the ninth and tenth electrodes are transmitted to the drains of the first thin film transistors D9 and D10;
at this time, when the second control signal source 205 provides a low-level control signal, the fourth thin film transistor D37 is turned on, and the touch signal on the ninth touch electrode is output to the touch signal collecting terminal 207;
when the second control signal source 205 provides a high-level control signal, the fourth thin film transistor D38 is turned on, and the touch signal on the tenth touch electrode is output to the touch signal collecting terminal 207.
At the next moment, the first control signal source 202 and the second first control signal source 203 provide control signals with low potential, the third thin film transistors D29 and D30 connected in series are turned on, the constant voltage high potential provided by the constant voltage high level source 201 is transmitted to the gates of the first thin film transistors D13, D14, D15 and D16, the first thin film transistors D13, D14, D15 and D16 are turned on, and the touch signals on the thirteenth and fourteenth electrodes are transmitted to the drains of the first thin film transistors D13 and D14;
at this time, when the second control signal source 205 provides a low-level control signal, the fourth thin film transistor D37 is turned on, and the touch signal on the thirteenth touch electrode is output to the touch signal collecting terminal 207;
when the second control signal source 205 provides a high-level control signal, the fourth thin film transistor D38 is turned on, and the touch signal on the fourteenth touch electrode is output to the touch signal collecting terminal 207.
Then, the scan line control signal source 211 provides scan line control signals with low voltage to the tfts D17-D28, and the scan line input signal source 212 provides scan line input signals with certain frequency and certain voltage to the scan lines via the tfts D17-D22, so as to trigger the third, fourth, seventh, eighth, eleventh, twelfth, fifteenth, and sixteen touch electrodes to generate touch signals due to the capacitive coupling effect between the scan lines 215 and the touch electrodes.
Then, the first control signal source 202 and the second first control signal source 203 provide high-potential control signals, the third thin film transistors D35 and D36 connected in series are turned on, the constant-voltage high-potential provided by the constant-voltage high-level source 201 is transmitted to the gates of the first thin film transistors D1, D2, D3 and D4, the first thin film transistors D1, D2, D3 and D4 are turned on, and the touch signals on the third and the fourth electrodes are transmitted to the drains of the first thin film transistors D3 and D4;
at this time, when the source of the second control signal 205 provides a low-level control signal, the fourth thin film transistor D39 is turned on, and the touch signal on the third touch electrode is output to the touch signal collecting terminal 207;
when the second control signal source 205 provides a high-level control signal, the fourth thin film transistor D40 is turned on, and the touch signal on the fourth touch electrode is output to the touch signal collecting terminal 207.
At the next moment, the first control signal source 202 provides a high-potential control signal, the second first control signal source 203 provides a low-potential control signal, the third thin film transistors D33 and D34 connected in series are turned on, the constant-voltage high potential provided by the constant-voltage high-level source 201 is transmitted to the gates of the first thin film transistors D5, D6, D7 and D8, the first thin film transistors D5, D6, D7 and D8 are turned on, and the touch signals on the seventh and eight electrodes are transmitted to the drains of the first thin film transistors D7 and D8;
at this time, when the second control signal source 205 provides a low-potential control signal, the fourth thin film transistor D39 is turned on, and the touch signal on the seventh touch electrode is output to the touch signal collecting terminal 207;
when the second control signal source 205 provides a high-level control signal, the fourth thin film transistor D40 is turned on, and the touch signal on the eighth touch electrode is output to the touch signal collecting terminal 207.
At the next moment, the first control signal source 202 provides a low-potential control signal, the second first control signal source 203 provides a high-potential control signal, the third thin film transistors D31 and D32 connected in series are turned on, the constant-voltage high potential provided by the constant-voltage high-level source 201 is transmitted to the gates of the first thin film transistors D9, D10, D11 and D12, the first thin film transistors D9, D10, D11 and D12 are turned on, and the touch signals on the eleventh and tenth electrodes are transmitted to the drains of the first thin film transistors D11 and D12;
at this time, when the second control signal source 205 provides a low-level control signal, the fourth thin film transistor D39 is turned on, and the touch signal on the eleventh touch electrode is output to the touch signal collecting terminal 207;
when the second control signal source 205 provides the high-level control signal, the fourth thin film transistor D40 is turned on, and the touch signal on the twelfth touch electrode is output to the touch signal collecting terminal 207.
At the next moment, the first control signal source 202 and the second first control signal source 203 provide control signals with low potential, the third thin film transistors D29 and D30 connected in series are turned on, the constant voltage high potential provided by the constant voltage high level source 201 is transmitted to the gates of the first thin film transistors D13, D14, D15 and D16, the first thin film transistors D13, D14, D15 and D16 are turned on, and the touch signals on the fifteenth and sixteenth electrodes are transmitted to the drains of the first thin film transistors D15 and D16;
at this time, when the second control signal source 205 provides a low-level control signal, the fourth thin film transistor D39 is turned on, and the touch signal on the fifteenth touch electrode is output to the touch signal collecting terminal 207;
when the second control signal source 205 provides a high-level control signal, the fourth thin film transistor D40 is turned on, and the touch signal on the sixteenth touch electrode is output to the touch signal collecting terminal 207.
Finally, comparing the acquired touch signals, and if the waveforms of all the acquired touch signals are consistent, determining that the touch screen is a good product; if the waveform difference between a certain touch signal and other touch signals is large, it can be concluded that the touch electrode is short-circuited or open-circuited.
The embedded touch control test circuit of the preferred embodiment triggers the touch control electrodes to generate the touch control signals through the capacitive coupling module 209, collects the touch control signals generated by each touch control electrode one by one through the first switch module 204 and the second switch module 208, and compares the collected touch control signals, so that the touch screen function test of the touch screen is completed, the waste of materials such as chips and cables is avoided, and the production efficiency is improved.
In summary, although the present invention has been described with reference to the preferred embodiments, the above-described preferred embodiments are not intended to limit the present invention, and those skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention, therefore, the scope of the present invention shall be determined by the appended claims.
Claims (10)
1. An in-cell touch test circuit, comprising:
the touch control electrodes are arranged in an array, each touch control electrode is connected with the source electrode of the corresponding first thin film transistor, n touch control electrodes are arranged in each row, and m touch control electrodes are arranged in each column;
the capacitive coupling module is coupled with the touch electrode and used for triggering the touch electrode to generate a touch signal;
the first switch module comprises a first input end, a first control ends and n first output ends, wherein the first control ends are connected with corresponding first control signal sources, the first input ends are connected with a constant voltage high level source, the first output ends are connected with the grids of the corresponding first thin film transistors, and the first switch module is used for transmitting the constant voltage high level provided by the constant voltage high level source to the grids of the first thin film transistors under the control of the first control signals provided by the first control signal sources and transmitting the touch signals generated by one row of the touch electrodes to the corresponding drains of the first thin film transistors;
the second switch module comprises m second input ends, b second control ends and a second output end, the second input ends are connected with the drain electrodes of the corresponding first thin film transistors, the second control ends are connected with corresponding second control signal sources, and the second output ends are connected with the touch signal acquisition terminals and used for outputting the touch signals generated by one row of the touch electrodes to the touch signal acquisition terminals one by one under the control of the second control signals provided by the second control signal sources;
wherein n, m, a and b are positive integers, n is less than or equal to 2^ a, and m is less than or equal to 2^ b.
2. The in-cell touch test circuit of claim 1, wherein the capacitive coupling module comprises:
a constant voltage power supply for providing a constant voltage level;
a scan line input signal source for providing a scan line input signal;
the scanning line control signal source is used for providing a scanning line control signal; and the number of the first and second groups,
the control unit is used for receiving the scanning line input signal and outputting the scanning line input signal under the control of the scanning line control signal; wherein,
the constant voltage power supply is connected with the data line, the scanning line input signal source is connected with the input end of the control unit, the scanning line control signal source is connected with the control end of the control unit, and the output end of the control unit is connected with the scanning line.
3. The in-cell touch test circuit of claim 2, wherein the control unit comprises a plurality of second TFTs, a gate of each of the second TFTs is connected to the scan line control signal source, a source of each of the second TFTs is connected to the scan line input signal source, and a drain of each of the second TFTs is connected to a corresponding scan line.
4. The in-cell touch test circuit of claim 1, wherein the first switch module comprises a plurality of third TFTs, and a gate of each of the first TFTs is connected to a series of the third TFTs.
5. The in-cell touch test circuit of claim 1, wherein the second switch module comprises a plurality of fourth TFTs, and a drain of each of the first TFTs is connected to b of the fourth TFTs connected in series.
6. An in-cell touch test circuit, comprising:
the touch control electrodes are arranged in an array, each touch control electrode is connected with the source electrode of the corresponding first thin film transistor, n touch control electrodes are arranged in each row, and m touch control electrodes are arranged in each column;
the capacitive coupling module is coupled with the touch electrode and used for triggering the touch electrode to generate a touch signal;
the first switch module comprises a first input end, a first control ends and n first output ends, wherein the first control ends are connected with corresponding first control signal sources, the first input ends are connected with a constant voltage high level source, the first output ends are connected with the grids of the corresponding first thin film transistors, and the first switch module is used for transmitting the constant voltage high level provided by the constant voltage high level source to the grids of the first thin film transistors under the control of the first control signals provided by the first control signal sources and transmitting the touch signals generated by one row of the touch electrodes to the corresponding drains of the first thin film transistors;
the second switch module comprises m second input ends, b second control ends and a second output end, the second input ends are connected with the drain electrodes of the corresponding first thin film transistors, the second control ends are connected with corresponding second control signal sources, and the second output ends are connected with the touch signal acquisition terminals and used for outputting the touch signals generated by one row of the touch electrodes to the touch signal acquisition terminals one by one under the control of the second control signals provided by the second control signal sources;
wherein n, m, a and b are positive integers, n is less than or equal to 2^ a, and m is less than or equal to 2^ (b + 1).
7. The in-cell touch test circuit of claim 6, wherein the capacitive coupling module comprises:
a constant voltage power supply for providing a constant voltage level;
a scan line input signal source for providing a scan line input signal;
the scanning line control signal source is used for providing a scanning line control signal; and the number of the first and second groups,
the control unit is used for receiving the scanning line input signal and outputting the scanning line input signal under the control of the scanning line control signal; wherein,
the constant voltage power supply is connected with the data line, the scanning line input signal source is connected with the input end of the control unit, the scanning line control signal source is connected with the control end of the control unit, and the output end of the control unit is connected with the scanning line.
8. The in-cell touch test circuit of claim 7, wherein the control unit comprises a plurality of second TFTs, a gate of each of the second TFTs is connected to the scan line control signal source, a source of each of the second TFTs is connected to the scan line input signal source, and a drain of each of the second TFTs is connected to a corresponding scan line.
9. The in-cell touch test circuit of claim 6, wherein the first switch module comprises a plurality of third TFTs, and a gate of each of the first TFTs is connected to a series of the third TFTs.
10. The in-cell touch test circuit of claim 6, wherein the second switch module comprises a plurality of fourth TFTs, and a drain of each of the first TFTs is connected to b of the fourth TFTs connected in series.
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