CN106371959B - Show test method and device - Google Patents
Show test method and device Download PDFInfo
- Publication number
- CN106371959B CN106371959B CN201610785645.XA CN201610785645A CN106371959B CN 106371959 B CN106371959 B CN 106371959B CN 201610785645 A CN201610785645 A CN 201610785645A CN 106371959 B CN106371959 B CN 106371959B
- Authority
- CN
- China
- Prior art keywords
- edp
- tcon
- pattern
- display
- screen self
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
Abstract
The invention discloses a kind of display test method and devices.This method comprises: eDP TCON grabs whole frame after eDP source exports the first pattern；After eDP source exports the second pattern, the pattern of selected areas is obtained from the second pattern, frame frame updating region in the memory of eDP TCON is used to indicate the storage location of the pattern of selected areas, and the control register of eDP TCON is for being turned on or off screen self-refresh mode 2；EDP TCON enters screen self-refresh mode 2 by controlling register；The region chosen in first pattern and the second pattern is subjected to mixed display, to test display.The test that the present invention solves the screen self-refresh function of chip in the related technology is higher to the dependence of eDp source or DP source, leads to the technical problem that testing efficiency is lower, reliability is poor.
Description
Technical field
The present invention relates to electronic fields, in particular to a kind of display test method and device.
Background technique
Screen self-refresh function 2 (PSR2) is the new features of eDP1.4a, and maximum feature is exactly the change according to input video
Change the local updating for carrying out screen, to reduce the power consumption of CPU.Under existing standard, PSR2 is to eDPsource or DP
The requirement of source is very high, for example, PSR, PSR2 and normal mode of operation are supported in the output of eDPsource video；EDPsource exists
Under different mode, the matched SDP data packet of output phase；EDPsource is carried out by AUX CH and eDP Sink about PSR's
Communication.
It is existing in the market, the video card with standard DP output interface does not support the function of PSR and PSR2.Only
The built-in LCD Panel of part laptop uses eDP interface, and also only some high-end system therein
Support PSR and PSR2 function, this reality all causes very big puzzlement to the debugging and test of PSR2 function.Although in laboratory
The platform that part system builds PSR2 inside can be used, but in the case where entering large-scale volume production and use, in this way
Platform either stability and cost, be all unable to meet demand.
For dependence of the test to eDp source or DP source of the screen self-refresh function of chip in the related technology
It is higher, lead to the problem that testing efficiency is lower, reliability is poor, currently no effective solution has been proposed.
Summary of the invention
The embodiment of the invention provides a kind of display test method and devices, at least to solve the screen of chip in the related technology
The test of curtain self-refresh function is higher to the dependence of eDp source or DP source, cause testing efficiency is lower, reliability compared with
The technical problem of difference.
According to an aspect of an embodiment of the present invention, a kind of display test method is provided, comprising: eDP TCON is in eDP
After source exports the first pattern, whole frame is grabbed；EDP TCON is after eDP source exports the second pattern, from the second figure
The pattern of selected areas is obtained in case, wherein the frame frame updating region in the memory of eDP TCON is used to indicate selected areas
The storage location of the pattern in domain, the control register in eDP TCON is for opening or closing screen self-refresh mode 2；eDP
TCON enters screen self-refresh mode 2 by controlling register；EDP TCON is by choosing in first pattern and the second pattern
Region carries out mixed display, to test display.
Further, the register that frame frame updating region needs includes: that start of line address register, row end address are posted
Storage, column initial address register, column end address register.
Further, eDP TCON is before grabbing whole frame, method further include: eDP TCON input order, wherein order
It is used to indicate and enters screen self-refresh mode；EDP TCON enters screen self-refresh mode.
Further, eDP TCON by the region of choosing in first pattern and the second pattern carry out mixed display it
Afterwards, method further include: eDP TCON calculates the check value of the data of mixed display.
Further, eDP TCON by the region of choosing in first pattern and the second pattern carry out mixed display it
Afterwards, method further include: eDP TCON exits screen self-refresh mode 2 and/or screen self-refresh mode；EDP TCON receives third
Pattern；EDP TCON shows third pattern, to test display.
According to another aspect of an embodiment of the present invention, a kind of display test device is additionally provided, comprising: picking unit is used
In eDP TCON after eDP source exports the first pattern, whole frame is grabbed；Acquiring unit, for eDP TCON in eDP
After source exports the second pattern, the pattern of selected areas is obtained from the second pattern, wherein in the memory of eDP TCON
Frame frame updating region be used to indicate selected areas pattern storage location, the control register in eDP TCON is for opening
Open or close screen self-refresh mode 2；Reading unit enters screen self-refresh mode by controlling register for eDP TCON
2；The region chosen in first pattern and the second pattern is carried out mixed display for eDP TCON by the first display unit, with
Display is tested.
Further, the register that frame frame updating region needs includes: that start of line address register, row end address are posted
Storage, column initial address register, column end address register.
Further, device further include: input unit, for eDP TCON before grabbing whole frame, eDP TCON input
Order, wherein order is used to indicate into screen self-refresh mode；Into unit, enter screen self-refresh for eDP TCON
Mode.
Further, device further include: computing unit, in eDP TCON by the choosing in first pattern and the second pattern
In region carry out mixed display after, eDP TCON calculate mixed display data check value.
Further, device further include: exit unit, in eDP TCON by the choosing in first pattern and the second pattern
In region carry out mixed display after, eDP TCON exits screen self-refresh mode 2 and/or screen self-refresh mode；It receives
Unit receives third pattern for eDP TCON；Second display unit shows third pattern for eDP TCON, to display
It is tested.
To achieve the goals above, according to another aspect of the present invention, a kind of storage medium, the storage medium are provided
Program including storage, wherein equipment where controlling the storage medium in described program operation executes described above show
Show test method.
To achieve the goals above, according to another aspect of the present invention, a kind of processor is provided, the processor is used for
Run program, wherein described program executes display test method described above when running.
In embodiments of the present invention, whole frame is grabbed after eDP source exports the first pattern by eDP TCON；
EDP TCON obtains the pattern of selected areas, wherein eDP after eDP source exports the second pattern from the second pattern
Frame frame updating region in the memory of TCON is used to indicate the storage location of the pattern of selected areas, the control in eDP TCON
Register processed opens or closes screen self-refresh mode 2 for controlling；EDP TCON enters screen from brush by controlling register
New model 2；The region chosen in first pattern and the second pattern is carried out mixed display by eDP TCON, to survey to display
Examination, has achieved the purpose that PSR2 self-test function reduces the dependence to eDP source or DP source, has mentioned to realize
The technical effect of high testing efficiency and reliability, and then solve the test pair of the screen self-refresh function of chip in the related technology
The dependence of eDp source or DP source are higher, lead to the technical problem that testing efficiency is lower, reliability is poor.
Detailed description of the invention
The drawings described herein are used to provide a further understanding of the present invention, constitutes part of this application, this hair
Bright illustrative embodiments and their description are used to explain the present invention, and are not constituted improper limitations of the present invention.In the accompanying drawings:
Fig. 1 is the schematic diagram of the normal process of PSR2 according to an embodiment of the present invention；
Fig. 2 is the flow chart of display test method according to an embodiment of the present invention；
Fig. 3 is the schematic diagram of the self-test process of PSR2 according to an embodiment of the present invention；
Fig. 4 is the schematic diagram of the display effect of the self-test function of PSR2 according to an embodiment of the present invention；And
Fig. 5 is the schematic diagram of display test device according to an embodiment of the present invention.
Specific embodiment
In order to enable those skilled in the art to better understand the solution of the present invention, below in conjunction in the embodiment of the present invention
Attached drawing, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described embodiment is only
The embodiment of a part of the invention, instead of all the embodiments.Based on the embodiments of the present invention, ordinary skill people
The model that the present invention protects all should belong in member's every other embodiment obtained without making creative work
It encloses.
It should be noted that description and claims of this specification and term " first " in above-mentioned attached drawing, "
Two " etc. be to be used to distinguish similar objects, without being used to describe a particular order or precedence order.It should be understood that using in this way
Data be interchangeable under appropriate circumstances, so as to the embodiment of the present invention described herein can in addition to illustrating herein or
Sequence other than those of description is implemented.In addition, term " includes " and " having " and their any deformation, it is intended that cover
Cover it is non-exclusive include, for example, the process, method, system, product or equipment for containing a series of steps or units are not necessarily limited to
Step or unit those of is clearly listed, but may include be not clearly listed or for these process, methods, product
Or other step or units that equipment is intrinsic.
Firstly, the part noun or term that occur during the embodiment of the present invention is described are suitable for following solution
It releases:
EDP source or DP source, the display port source with eDP interface or DP interface.
EDP TCON, the TCON display chip with eDP interface.
According to embodiments of the present invention, a kind of embodiment of the method for showing test method is provided, it should be noted that attached
The step of process of figure illustrates can execute in a computer system such as a set of computer executable instructions, though also,
So logical order is shown in flow charts, but in some cases, it can be to be different from shown by sequence execution herein
Or the step of description.
Before the display test method to the embodiment of the present invention describes in detail, standard is introduced first herein
The entrance of PSR2 and the process exited.Fig. 1 is the schematic diagram of the normal process of PSR2 according to an embodiment of the present invention, such as Fig. 1 institute
Show, the normal process of PSR2 may comprise steps of:
The sending port of step S11, eDP TX namely eDP source export the first pattern.
Step S12, eDP TX sends SDP data packet and eDP TCON, eDP TX is given to enter PSR mode.
The receiving port of step S13, eDP RX namely eDP TCON grab whole frame data into PSR mode.
Step S14, eDP TX exports the second pattern, wherein the second pattern only has partial region hair compared with the first pattern
It is raw to change.
The SDP data packet that step S15, eDP TX sends the update in the region chosen in the second pattern gives eDP TCON,
In, comprising the location information in the region chosen in the SDP data packet of update.
Step S16, eDP RX reacquires the SDP data packet updated, and updates the figure in the region chosen in the second pattern
Case.
Step S17, eDP TX sends to eDP TCON and is used to indicate the SDP data packet for exiting PSR mode, wherein the SDP
It include to indicate that eDP TCON exits the information of PSR mode in data packet.
Step S18, eDP RX reacquire this and are used to indicate the SDP data packet for exiting PSR mode, exit PSR mode, with
Normal mode of operation work.
For the normal process of above-mentioned PSR2, it should be noted that step S13, step S16 and step S18 is eDP
The operation that TCON is executed, other steps are all the operations that eDP Source is executed.Through the above steps as can be seen that the function of PSR2
Can dependency degree to whole system it is high, in the case where eDP source does not have corresponding ability, can not be verified completely, greatly
Affect debugging and production.
Defect existing for normal process for above-mentioned PSR2, the embodiment of the invention provides a kind of completely new PSR2 tests
Process.
Fig. 2 is the flow chart of display test method according to an embodiment of the present invention, as shown in Fig. 2, this method includes as follows
Step:
Step S21, eDP TCON grabs whole frame after eDP source exports the first pattern；
Step S22, eDP TCON obtains selected areas from the second pattern after eDP source exports the second pattern
Pattern, wherein the frame frame updating region in the memory of eDP TCON is used to indicate the storage position of the pattern of selected areas
It sets, the control register in eDP TCON opens or closes screen self-refresh mode 2 for controlling for controlling；
Step S23, eDP TCON enters screen self-refresh mode 2 by controlling register；
The region chosen in first pattern and the second pattern is carried out mixed display by step S24, eDP TCON, to aobvious
Show and is tested.
Through the above steps, dependence of the PSR2 self-test function reduction to eDPsource or DP source may be implemented
Purpose, so solve chip in the related technology screen self-refresh function test to eDp source or DP source's
Dependence is higher, leads to the technical problem that testing efficiency is lower, reliability is poor, realizes the skill for improving testing efficiency and reliability
Art effect.
In the scheme that step S21 is provided, the embodiment of the present invention does not make specifically the first pattern that eDP source is exported
It limits, the first pattern can be arbitrary graphic pattern.EDP source after exporting the first pattern, eDP TCON can grab this
The whole frame data of one pattern, wherein the whole frame data that eDP TCON is grabbed can serve to indicate that the of eDP source output
One pattern.
Optionally, for eDP TCON before grabbing whole frame, the display test method of the embodiment can also include following step
It is rapid:
Step S201, eDP TCON input order, wherein the order can serve to indicate that eDP TCON enters screen from brush
New model；
Step S202, eDP TCON enter screen self-refresh mode.
It should be noted that the order of eDP TCON input can support two data channel, it is respectively as follows: for eDP TX
The channel AUX CH；For the I2C interface of the eDP TCON of controller (such as MCU, ARM).
In the scheme that step S22 is provided, eDP TCON enters after screen self-refresh mode, and eDP source can be defeated
Second pattern out, the embodiment of the present invention are also not specifically limited the second pattern, wherein the second pattern is different from the first pattern.
After eDP source can export the second pattern, the pattern of selected areas can be obtained from the second pattern, wherein eDP
Frame frame updating region in the memory of TCON is used to indicate the storage location of the pattern of selected areas, wherein the second pattern
In the region chosen can to need the area of the pattern that update, the control register in eDP TCON can be used for controlling unlatching or
Close the screen self-refresh mode 2.
Optionally, the register that PSR2 self-test function needs may include: the register that frame frame updating region needs
The register needed with control area, in which:
Frame frame updating region need register may include: start of line address register, row end address register,
Column initial address register, column end address register, specifically:
Frame frame updating region, start of line address (Horizontal Line Start Address)
Low eight initial address registers: PSR2_H_Line_Start_Addr_L [7:0]
Gao Wuwei initial address register: PSR2_H_Line_Start_Addr_H [4:0]
Frame frame updating region, row end address (Horizontal Line End Address)
Low eight initial address registers: PSR2_H_Line_End_Addr_L [7:0]
Gao Wuwei initial address register: PSR2_H_Line_End_Addr_H [4:0]
Frame frame updating region, column initial address (Vertical Line Start Address)
Low eight initial address registers: PSR2_V_Line_Start_Addr_L [7:0]
Gao Wuwei initial address register: PSR2_V_Line_Start_Addr_H [4:0]
Frame frame updating region arranges end address (Vertical Line End Address)
Low eight initial address registers: PSR2_V_Line_End_Addr_L [7:0]
Gao Wuwei initial address register: PSR2_V_Line_End_Addr_H [4:0]
PSR2 controls register, into PSR2
PSR2_Self_Test_CTRL[0]
PSR2 controls register, exits PSR2
PSR2_Self_Test_CTRL[1]
In the technical solution that step S23 is provided, eDP TCON can enter screen self-refresh mould by controlling register
Formula 2, and according to the region chosen in instruction second pattern of storage in frame frame updating region.Herein it should be noted that
The area of the pattern that the region chosen in two patterns can update for needs part.The embodiment is posted by the control of eDP TCON
Storage makes eDP TCON enter PSR2 mode, and the partial pattern for needing to update according to the instruction storage in frame frame updating region
Region can be realized the purpose that pattern local updating is carried out under PSR2 mode.
In the technical solution that step S24 is provided, the region chosen in first pattern and the second pattern carries out mixed display,
It can be realized and local updating is carried out to the partial pattern in the first pattern, partial pattern herein is to choose in the second pattern
Region, and then realize and display is tested, that is, realize PSR2 self-test function.
As a kind of optionally embodiment, in step S24eDP TCON by choosing in first pattern and the second pattern
After region carries out mixed display, the display test method of the embodiment can also include: step S25, and eDP TCON calculates mixed
Close the check value of the data of display.It should be noted that the check value of the data of mixed display can serve to indicate that this PSR2
The performance of self-test, for the embodiment by calculating the check values of the data of mixed display, may be implemented can be with according to the check value
The purpose of overall merit is carried out to PSR2 self-test function.
As a kind of optionally embodiment, in step S24eDP TCON by choosing in first pattern and the second pattern
After region carries out mixed display, the display test method of the embodiment can also include:
Step S26, eDP TCON exit screen self-refresh mode 2 and/or screen self-refresh mode；
Step S27, eDP TCON receives third pattern；
Step S28, eDP TCON shows third pattern, to test display.
In above-mentioned steps, the embodiment is that the region chosen in first pattern and the second pattern is carried out mixing is aobvious
Show, after realizing PSR2 self-test function, eDP TCON can exit PSR2 mode and/or PSR mode, in the normal mode work
Make.When eDP TCON is in normal mode of operation, the third pattern of eDP source output can receive, and by eDP
The third pattern is shown in TCON, realizes the purpose for carrying out display test to eDP TCON in the normal mode of operation.The implementation
Example by executed PSR2 self-test and then to normal mode of operation under eDP TCON carry out display test, Neng Gouti
Height carries out the effect of the accuracy of display test to eDP TCON.
The entire flow of the PSR2 self-test of the embodiment of the present invention can be as shown in figure 3, the self-test process of PSR2 can be with
The following steps are included:
The sending port of step S31, eDP TX namely eDP source export the first pattern.
Step S32, eDP TCON input order, the order can serve to indicate that eDP TCON enters PSR mode, eDP
The order of TCON input can support two data channel, be respectively as follows: the channel AUX CH for eDP TX；For controller
The I2C interface of the eDP TCON of (such as MCU, ARM).
Step S33, eDP TCON enter PSR mode, grab whole frame data.
Step S34, eDP TX exports the second pattern, wherein the second pattern only has partial region hair compared with the first pattern
It is raw to change.
Step S35, eDP TCON input is used to indicate the order into PSR2 mode.Wherein, the memory of eDP TCON
In frame frame updating region be used to indicate selected areas pattern storage location, wherein the region chosen in the second pattern
It can be to need the area of the pattern updated, the control register in eDP TCON opens or closes screen self-refresh mould for controlling
Formula 2.
Step S36, eDP TCON enter PSR2 mode, and store the pattern of selected areas in the second pattern.
Step S37, eDP TCON is by the pattern mixed display of selected areas in the first pattern and the second pattern.
Step S38, eDP TCON calculates the check value of the data of mixed display.
Step S39, eDP TX exports third pattern.
Step S310, eDP TCON exit PSR2 mode and/or PSR mode.
Step S311, eDP TCON shows third pattern, works in the normal mode.
Fig. 4 is the schematic diagram of the display effect of the self-test function of PSR2 according to an embodiment of the present invention, as shown in figure 4,
After eDP TX exports the first pattern, eDP TCON enters PSR mode, and grabs whole frame data；EDP TX exports the second pattern
Later, eDP TCON enters PSR2 mode, realizes partial pattern local updating；After eDP TX exports third pattern, eDP
TCON returns to normal mode, shows third pattern.
The principle of PSR2 self-test function of the embodiment of the present invention is to be replaced using the register of eDP TCON itself from eDP
The SDP data packet that source is sended over.By configuring itself register, PSR2 function is triggered.In this case, only
SDP data packet receives logic and does not work.The received video information of eDP TCON still comes from eDP source, other PSR2
Functional module and normal use condition be consistent, remain consistency to greatest extent.It is completed under PSR2 self-test
Debugging and verification, there is no errors with the result of modular system, facilitate positioning and problem analysis.
The PSR2 self-test function of the PSR2 process of contrast standard, the embodiment of the present invention is greatly reduced to special eDP/DP
The requirement of source greatlys improve as long as basic DP source can be carried out the debugging and test of PSR2 function to core
The efficiency and reliability of piece verifying, and a kind of reliable way is provided for large batch of chip checking and volume production.
To achieve the goals above, according to another aspect of the present invention, the embodiment of the invention also provides a kind of storage Jie
Matter, the storage medium include the program of storage, wherein equipment where controlling the storage medium in described program operation is held
Row display test method described above.
To achieve the goals above, according to another aspect of the present invention, the embodiment of the invention also provides a kind of processor,
The processor is for running program, wherein described program executes display test method described above when running.
According to embodiments of the present invention, a kind of Installation practice of display test is additionally provided, it should be noted that the display
Test device can be used for executing the display test method in the embodiment of the present invention, the display test method in the embodiment of the present invention
It can be executed in the display test device.
Fig. 5 is the schematic diagram of display test device according to an embodiment of the present invention, as shown in figure 5, the apparatus may include:
Picking unit 51 grabs whole frame for eDP TCON after eDP source exports the first pattern；Acquiring unit
52, for eDP TCON after eDP source exports the second pattern, the pattern of selected areas is obtained from the second pattern,
Frame frame updating region in the memory of eDP TCON is used to indicate the storage location of the pattern of selected areas, the eDP
Control register in TCON opens or closes screen self-refresh mode 2 for controlling；Reading unit 53, it is logical for eDP TCON
It crosses control register and enters screen self-refresh mode 2；First display unit 54 is used for eDP TCON for the first pattern and the second figure
The region chosen in case carries out mixed display, to test display.
It should be noted that the picking unit 51 in the embodiment can be used for executing the step in the embodiment of the present application
S21, the acquiring unit 52 in the embodiment can be used for executing the step S22 in the embodiment of the present application, the reading in the embodiment
Unit 53 is taken to can be used for executing the step S23 in the embodiment of the present application, the first display unit 54 in the embodiment can be used
Step S24 in execution the embodiment of the present application.Above-mentioned module is identical as example and application scenarios that corresponding step is realized,
But it is not limited to the above embodiments disclosure of that.
Optionally, the register that frame frame updating region needs may include: start of line address register, row end address
Register, column initial address register, column end address register.
Optionally, the display test device of the fact can also include: input unit, grab whole frame for eDP TCON
Before, eDP TCON input order, wherein order is used to indicate into screen self-refresh mode；Into unit, it to be used for eDP
TCON enters screen self-refresh mode.
Optionally, the display test device of the fact can also include: computing unit, in eDP TCON by the first figure
After the region chosen in case and the second pattern carries out mixed display, eDP TCON calculates the verification of the data of mixed display
Value.
Optionally, the display test device of the fact can also include: to exit unit, in eDP TCON by the first figure
After the region chosen in case and the second pattern carries out mixed display, eDP TCON exits screen self-refresh mode 2 and/or screen
Curtain self-refresh mode；Receiving unit receives third pattern for eDP TCON；Second display unit is shown for eDP TCON
Third pattern, to test display.
Display test device through the embodiment of the present invention, can be realized PSR2 self-test function reduces to eDPsource
Or the purpose of the dependence of DP source, and then solve chip in the related technology screen self-refresh function test to eDp
The dependence of source or DP source is higher, leads to the technical problem that testing efficiency is lower, reliability is poor, realizes raising
The technical effect of testing efficiency and reliability.
The serial number of the above embodiments of the invention is only for description, does not represent the advantages or disadvantages of the embodiments.
In the above embodiment of the invention, it all emphasizes particularly on different fields to the description of each embodiment, does not have in some embodiment
The part of detailed description, reference can be made to the related descriptions of other embodiments.
In several embodiments provided herein, it should be understood that disclosed technology contents can pass through others
Mode is realized.Wherein, the apparatus embodiments described above are merely exemplary, such as the division of the unit, Ke Yiwei
A kind of logical function partition, there may be another division manner in actual implementation, for example, multiple units or components can combine or
Person is desirably integrated into another system, or some features can be ignored or not executed.Another point, shown or discussed is mutual
Between coupling, direct-coupling or communication connection can be through some interfaces, the INDIRECT COUPLING or communication link of unit or module
It connects, can be electrical or other forms.
The unit as illustrated by the separation member may or may not be physically separated, aobvious as unit
The component shown may or may not be physical unit, it can and it is in one place, or may be distributed over multiple
On unit.It can some or all of the units may be selected to achieve the purpose of the solution of this embodiment according to the actual needs.
It, can also be in addition, the functional units in various embodiments of the present invention may be integrated into one processing unit
It is that each unit physically exists alone, can also be integrated in one unit with two or more units.Above-mentioned integrated list
Member both can take the form of hardware realization, can also realize in the form of software functional units.
If the integrated unit is realized in the form of SFU software functional unit and sells or use as independent product
When, it can store in a computer readable storage medium.Based on this understanding, technical solution of the present invention is substantially
The all or part of the part that contributes to existing technology or the technical solution can be in the form of software products in other words
It embodies, which is stored in a storage medium, including some instructions are used so that a computer
Equipment (can for personal computer, server or network equipment etc.) execute each embodiment the method for the present invention whole or
Part steps.And storage medium above-mentioned includes: that USB flash disk, read-only memory (ROM, Read-Only Memory), arbitrary access are deposited
Reservoir (RAM, Random Access Memory), mobile hard disk, magnetic or disk etc. be various to can store program code
Medium.
The above is only a preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
For member, various improvements and modifications may be made without departing from the principle of the present invention, these improvements and modifications are also answered
It is considered as protection scope of the present invention.
Claims (12)
1. a kind of display test method characterized by comprising
EDP TCON grabs whole frame after eDP source exports the first pattern；
The eDP TCON obtains selected areas from second pattern after the eDP source exports the second pattern
Pattern, wherein the frame frame updating region in the memory of the eDP TCON is used to indicate the pattern of the selected areas
Storage location, the control register in the eDP TCON opens or closes screen self-refresh mode 2 for controlling；
The eDP TCON enters the screen self-refresh mode 2 by the control register；
The region chosen described in first pattern and second pattern is carried out mixed display by the eDP TCON, with
Display is tested.
2. the method according to claim 1, wherein
The register that frame frame updating region needs includes: start of line address register, row end address register, arranges
Beginning address register, column end address register.
3. described the method according to claim 1, wherein the eDP TCON is before grabbing the whole frame
Method further include:
The eDP TCON input order, wherein the order is used to indicate into screen self-refresh mode；
The eDP TCON enters the screen self-refresh mode.
4. the method according to claim 1, wherein in the eDP TCON by first pattern and described
After the region chosen in two patterns carries out mixed display, the method also includes:
The eDP TCON calculates the check value of the data of mixed display.
5. the method according to claim 1, wherein in the eDP TCON by first pattern and described
After the region chosen in two patterns carries out mixed display, the method also includes:
The eDP TCON exits the screen self-refresh mode 2 and/or screen self-refresh mode；
The eDP TCON receives third pattern；
The eDP TCON shows the third pattern, to test display.
6. a kind of display test device characterized by comprising
Picking unit grabs whole frame for eDP TCON after eDP source exports the first pattern；
Acquiring unit, for the eDP TCON after the eDP source exports the second pattern, from second pattern
The middle pattern for obtaining selected areas, wherein the frame frame updating region in the memory of the eDP TCON is used to indicate described
The storage location of the pattern of selected areas, the control register user in the eDP TCON open or close screen self-refresh mould
Formula 2；
Reading unit enters the screen self-refresh mode 2 by the control register for the eDP TCON；
First display unit, the area that will be chosen described in first pattern and second pattern for the eDP TCON
Domain carries out mixed display, to test display.
7. device according to claim 6, which is characterized in that
The register that frame frame updating region needs includes: start of line address register, row end address register, arranges
Beginning address register, column end address register.
8. device according to claim 6, which is characterized in that described device further include:
Input unit, for the eDP TCON before grabbing the whole frame, the eDP TCON input order, wherein institute
Order is stated to be used to indicate into screen self-refresh mode；
Into unit, enter the screen self-refresh mode for the eDP TCON.
9. device according to claim 6, which is characterized in that described device further include:
Computing unit, in the region that the eDP TCON will choose described in first pattern and second pattern
After carrying out mixed display, the eDP TCON calculates the check value of the data of mixed display.
10. device according to claim 6, which is characterized in that described device further include:
Unit is exited, in the region that the eDP TCON will choose described in first pattern and second pattern
After carrying out mixed display, the eDP TCON exits the screen self-refresh mode 2 and/or screen self-refresh mode；
Receiving unit receives third pattern for the eDP TCON；
Second display unit shows the third pattern for the eDP TCON, to test display.
11. a kind of storage medium, which is characterized in that the storage medium includes the program of storage, wherein run in described program
When control the storage medium where equipment perform claim require 1 to the display test side described in any one of claim 5
Method.
12. a kind of processor, which is characterized in that the processor is for running program, wherein right of execution when described program is run
Benefit requires 1 to the display test method described in any one of claim 5.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610785645.XA CN106371959B (en) | 2016-08-30 | 2016-08-30 | Show test method and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610785645.XA CN106371959B (en) | 2016-08-30 | 2016-08-30 | Show test method and device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106371959A CN106371959A (en) | 2017-02-01 |
| CN106371959B true CN106371959B (en) | 2019-06-04 |
Family
ID=57899605
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610785645.XA Active CN106371959B (en) | 2016-08-30 | 2016-08-30 | Show test method and device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106371959B (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104361871A (en) * | 2014-11-07 | 2015-02-18 | 硅谷数模半导体（北京）有限公司 | Display screen debugging method, device and system |
| CN105025334A (en) * | 2014-04-22 | 2015-11-04 | Lg电子株式会社 | Display device and method of controlling therefor |
| CN105719604A (en) * | 2014-09-17 | 2016-06-29 | 中华映管股份有限公司 | Method for improving panel automatic updating picture flicker of display panel and control circuit thereof |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101315084B1 (en) * | 2012-04-24 | 2013-10-15 | 주식회사 실리콘웍스 | Embedded displayport system, timing controller and control method with panel self refresh mode for embedded display port |
-
2016
- 2016-08-30 CN CN201610785645.XA patent/CN106371959B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105025334A (en) * | 2014-04-22 | 2015-11-04 | Lg电子株式会社 | Display device and method of controlling therefor |
| CN105719604A (en) * | 2014-09-17 | 2016-06-29 | 中华映管股份有限公司 | Method for improving panel automatic updating picture flicker of display panel and control circuit thereof |
| CN104361871A (en) * | 2014-11-07 | 2015-02-18 | 硅谷数模半导体（北京）有限公司 | Display screen debugging method, device and system |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106371959A (en) | 2017-02-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104268079B (en) | A kind of method and system of POS Application testings | |
| US20130055022A1 (en) | Flexible soc design verification environment | |
| US20140052430A1 (en) | Partitionless Multi User Support For Hardware Assisted Verification | |
| CN105874682A (en) | Charging method and charging apparatus for electronic device | |
| CN107273299A (en) | Software testing device, software test platform and method | |
| CN112270149A (en) | Verification platform automation integration method and system, electronic equipment and storage medium | |
| TW201032529A (en) | Test apparatus and testing method | |
| US6643811B1 (en) | System and method to test internal PCI agents | |
| CN104978213B (en) | Realize the link acquisition methods and device of application installation package | |
| CN108763743A (en) | Verification platform, method and electronic equipment | |
| CN109933376A (en) | PCIE silk-screen information updating method, device, controlled terminal and storage medium in a kind of BIOS setup | |
| CN106951358A (en) | A kind of quick display status information method and system during computer system power-on self-test based on UEFI standards | |
| CN107729246A (en) | For the auxiliary test methods of intended application, device, equipment and storage medium | |
| CN105092992A (en) | Method and device for conducting vector-controlled test on ATE (automatic test equipment) | |
| CN106371959B (en) | Show test method and device | |
| CN112434478B (en) | Method for simulating virtual interface of logic system design and related equipment | |
| CN106445752B (en) | Show test method and device | |
| CN106874485A (en) | The method and picture that a kind of picture is presented are presented device | |
| CN109425796A (en) | A kind of backboard tooling test macro | |
| CN108052677A (en) | Page processing method, device and readable storage medium storing program for executing | |
| US20060247879A1 (en) | Site loops | |
| CN111324323A (en) | Multi-screen display control method and device, embedded processing system and video controller | |
| CN110262841A (en) | The method and apparatus that a kind of pair of bytecode is enhanced | |
| CN107766231A (en) | A kind of automated testing method and device | |
| CN109791534A (en) | Switchable topology machine |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |