CN106371959A - Display test method and device - Google Patents
Display test method and device Download PDFInfo
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- CN106371959A CN106371959A CN201610785645.XA CN201610785645A CN106371959A CN 106371959 A CN106371959 A CN 106371959A CN 201610785645 A CN201610785645 A CN 201610785645A CN 106371959 A CN106371959 A CN 106371959A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
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- General Physics & Mathematics (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
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Abstract
The invention discloses a display test method and device. The method comprises the following steps that after eDP TCON outputs a first pattern at an eDP source, a whole frame is captured; after a second pattern is output at the eDP source, a pattern of a selected region is obtained from the second pattern, wherein a frame image updating region in a memory of the eDP TCON is used for indicating the storage position of the pattern of the selected region, and a control register of the eDP TCON is used for starting or stopping a screen self-refreshing mode 2; the eDP TCON enters the screen self-refreshing mode 2 through the control register; the selected regions in the first pattern and the second pattern are subjected to mixed display so as to test the display. The method and the device provided by the invention solve the technical problems that in the prior art, the test of the screen self-refreshing function of a chip has high rely on the eDp source or a DP source, so that the test efficiency is low, and the reliability is relatively poor.
Description
Technical field
The present invention relates to electronic applications, in particular to a kind of display method of testing and device.
Background technology
Screen self-refresh function 2 (psr2) is the new features of edp1.4a, and maximum feature is exactly the change according to input video
Change the local updating carrying out screen, thus reducing the power consumption of cpu.Under existing standard, psr2 is to edpsource or dp
The requirement of source is very high, and for example, edpsource video frequency output supports psr, psr2 and normal mode of operation；Edpsource exists
Under different mode, the sdp packet matching to be exported；Edpsource is carried out with regard to psr's by aux ch and edp sink
Communication.
On existing market, video card with standard dp output interface, do not support the function of psr and psr2.Only
The built-in LCD Panel of part notebook computer uses edp interface, and also some high-end system therein
Support psr and psr2 function, this reality all causes very big puzzlement to the debugging of psr2 function and test.Although in laboratory
The interior platform that can build psr2 using part system, but in the case of entering large-scale volume production and using, so
Platform either stability and cost, all can not meet demand.
The dependence tested to edp source or dp source for the screen self-refresh function of correlation technique chips
Higher, lead to the problem that testing efficiency is relatively low, reliability is poor, not yet propose effective solution at present.
Content of the invention
Embodiments provide a kind of display method of testing and device, at least to solve the screen of correlation technique chips
The test of curtain self-refresh function is higher to the dependence of edp source or dp source, lead to that testing efficiency is relatively low, reliability relatively
The technical problem of difference.
A kind of one side according to embodiments of the present invention, there is provided display method of testing, comprising: edp tcon exists
After edpsource exports the first pattern, capture whole frame；Edp tcon after edp source exports the second pattern, from the
The pattern of selected areas is obtained, wherein, the frame frame updating region in the memorizer of edp tcon is used for instruction choosing in two patterns
The storage location of the pattern in middle region, the control register in edp tcon is used for being turned on and off screen self-refresh mode 2；
Edp tcon enters screen self-refresh mode 2 by control register；Edp tcon is by the choosing in the first pattern and the second pattern
In region carry out mixed display, to test to display.
Further, the depositor that frame frame updating region needs includes: start of line address register, row end address are posted
Storage, row initial address register, row end address register.
Further, before capturing whole frame, method also includes edp tcon: edp tcon input order, wherein, order
Enter screen self-refresh mode for instruction；Edp tcon enters screen self-refresh mode.
Further, edp tcon by the region chosen in the first pattern and the second pattern carry out mixed display it
Afterwards, method also includes: edp tcon calculates the check value of the data of mixed display.
Further, edp tcon by the region chosen in the first pattern and the second pattern carry out mixed display it
Afterwards, method also includes: edp tcon exits screen self-refresh mode 2 and/or screen self-refresh mode；Edp tcon receives the 3rd
Pattern；Edp tcon shows the 3rd pattern, to test to display.
Another aspect according to embodiments of the present invention, additionally provides a kind of display test device, comprising: placement unit, uses
In edp tcon after edp source exports the first pattern, capture whole frame；Acquiring unit, for edp tcon in edp
From the second pattern, after source exports the second pattern, obtain the pattern of selected areas, wherein, in the memorizer of edp tcon
Frame frame updating region be used for indicating the storage location of the pattern of selected areas, the control register in edp tcon is used for out
Open or close screen self-refresh mode 2；Reading unit, enters screen self-refresh mode for edp tcon by control register
2；The region chosen in first pattern and the second pattern is carried out mixed display for edp tcon by the first display unit, with
Display is tested.
Further, the depositor that frame frame updating region needs includes: start of line address register, row end address are posted
Storage, row initial address register, row end address register.
Further, device also includes: input block, and for edp tcon before capturing whole frame, edp tcon inputs
Order, wherein, orders and enters screen self-refresh mode for instruction；Enter unit, enter screen self-refresh for edp tcon
Pattern.
Further, device also includes: computing unit, in edp tcon by the choosing in the first pattern and the second pattern
In region carry out mixed display after, edp tcon calculate mixed display data check value.
Further, device also includes: exit unit, in edp tcon by the choosing in the first pattern and the second pattern
In region carry out mixed display after, edp tcon exits screen self-refresh mode 2 and/or screen self-refresh mode；Receive
Unit, receives the 3rd pattern for edp tcon；Second display unit, shows the 3rd pattern for edp tcon, with to display
Tested.
In embodiments of the present invention, by edp tcon after edp source exports the first pattern, capture whole frame；
Edp tcon, after edp source exports the second pattern, obtains the pattern of selected areas, wherein, edp from the second pattern
Frame frame updating region in the memorizer of tcon is used for indicating the storage location of the pattern of selected areas, the control in edp tcon
Depositor processed is turned on and off screen self-refresh mode 2 for control；Edp tcon enters screen from brush by control register
New model 2；The region chosen in first pattern and the second pattern is carried out mixed display by edp tcon, to survey to display
Examination, has reached the purpose that psr2 self-test function reduces the dependence to edp source or dpsource, it is achieved thereby that carrying
High testing efficiency and the technique effect of reliability, and then it is right to solve the test of the screen self-refresh function of correlation technique chips
The dependence of edp source or dp source is higher, leads to the technical problem that testing efficiency is relatively low, reliability is poor.
Brief description
Accompanying drawing described herein is used for providing a further understanding of the present invention, constitutes the part of the application, this
Bright schematic description and description is used for explaining the present invention, does not constitute inappropriate limitation of the present invention.In the accompanying drawings:
Fig. 1 is the schematic diagram of the normal process of psr2 according to embodiments of the present invention；
Fig. 2 is the flow chart of display method of testing according to embodiments of the present invention；
Fig. 3 is the schematic diagram of the self-test flow process of psr2 according to embodiments of the present invention；
Fig. 4 is the schematic diagram of the display effect of the self-test function of psr2 according to embodiments of the present invention；And
Fig. 5 is the schematic diagram of display test device according to embodiments of the present invention.
Specific embodiment
In order that those skilled in the art more fully understand the present invention program, below in conjunction with the embodiment of the present invention
Accompanying drawing, is clearly and completely described to the technical scheme in the embodiment of the present invention it is clear that described embodiment is only
The embodiment of a present invention part, rather than whole embodiments.Based on the embodiment in the present invention, ordinary skill people
The every other embodiment that member is obtained under the premise of not making creative work, all should belong to the model of present invention protection
Enclose.
It should be noted that term " first " in description and claims of this specification and above-mentioned accompanying drawing, "
Two " it is etc. for distinguishing similar object, without for describing specific order or precedence.It should be appreciated that such use
Data can exchange in the appropriate case so that embodiments of the invention described herein can with except here diagram or
Order beyond those of description is implemented.Additionally, term " comprising " and " having " and their any deformation are it is intended that cover
Cover non-exclusive comprising, for example, contain series of steps or process, method, system, product or the equipment of unit are not necessarily limited to
Those steps clearly listed or unit, but may include clearly not listing or for these processes, method, product
Or the intrinsic other steps of equipment or unit.
First, the part noun occurring during the embodiment of the present invention is described or term are applied to following solution
Release:
Edp source or dp source, has the display port source of edp interface or dp interface.
Edp tcon, has the tcon display chip of edp interface.
According to embodiments of the present invention, there is provided a kind of embodiment of the method for display method of testing, it should be noted that attached
The step that the flow process of figure illustrates can execute in the computer system of such as one group of computer executable instructions, though and,
So show logical order in flow charts, but in some cases, can be with shown different from order execution herein
Or the step of description.
Before the display method of testing to the embodiment of the present invention describes in detail, introduce standard first herein
The entrance of psr2 and the flow process exiting.Fig. 1 is the schematic diagram of the normal process of psr2 according to embodiments of the present invention, as Fig. 1 institute
Show, the normal process of psr2 may comprise steps of:
Step s11, edp tx, namely the sending port of edp source, export the first pattern.
Step s12, edp tx sends sdp packet to edp tcon, and edp tx enters psr pattern.
Step s13, edp rx, namely the receiving port of edp tcon, enter psr pattern, capture whole frame data.
Step s14, edp tx exports the second pattern, and wherein, the second pattern only subregion compared with the first pattern is sent out
Raw change.
Step s15, edp tx sends the sdp packet of the renewal in region chosen in the second pattern to edp tcon, its
In, comprise the positional information in region chosen in the sdp packet of renewal.
Step s16, edp rx reacquires the sdp packet updating, and updates the figure in the region chosen in the second pattern
Case.
Step s17, edp tx sends the sdp packet exiting psr pattern for instruction, wherein, this sdp to edp tcon
The information that instruction edp tcon exits psr pattern is included in packet.
Step s18, edp rx reacquire this for instruction exit the sdp packet of psr pattern, exit psr pattern, with
Normal mode of operation works.
For the normal process of above-mentioned psr2, it should be noted that step s13, step s16 and step s18 are edp
The operation of tcon execution, other steps are all the operations of edp source execution.By above-mentioned steps as can be seen that the work(of psr2
Can be high to the dependency degree of whole system, do not possess under corresponding ability in edp source, cannot be carried out verifying, greatly completely
Have impact on debugging and produce.
The defect existing for the normal process of above-mentioned psr2, embodiments provides a kind of brand-new psr2 test
Flow process.
Fig. 2 is the flow chart of display method of testing according to embodiments of the present invention, as shown in Fig. 2 the method include as follows
Step:
Step s21, edp tcon, after edp source exports the first pattern, captures whole frame；
Step s22, edp tcon, after edp source exports the second pattern, obtains selected areas from the second pattern
Pattern, wherein, frame frame updating region in the memorizer of edp tcon is used for indicating the storage position of the pattern of selected areas
Put, the control register in edp tcon is used for control and is turned on and off screen self-refresh mode 2 for control；
Step s23, edp tcon enters screen self-refresh mode 2 by control register；
Step s24, the region chosen in the first pattern and the second pattern is carried out mixed display by edp tcon, with to aobvious
Show and tested.
By above-mentioned steps, it is possible to achieve psr2 self-test function reduces the dependence to edpsource or dp source
Purpose, so solve correlation technique chips screen self-refresh function test to edp source or dpsource according to
Relying higher, leading to the technical problem that testing efficiency is relatively low, reliability is poor it is achieved that improving the technology of testing efficiency and reliability
Effect.
In the scheme that step s21 provides, the first pattern that the embodiment of the present invention exports to edp source does not do specifically
Limit, the first pattern can be arbitrary graphic pattern.Edp source after output the first pattern, edp tcon can capture this
The whole frame data of one pattern, wherein, whole frame data that edp tcon is captured can serve to indicate that the of edp source output
One pattern.
Alternatively, before capturing whole frame, the display method of testing of this embodiment can also include following walking to edp tcon
Rapid:
Step s201, edp tcon input order, wherein, this order can serve to indicate that edp tcon enters screen from brush
New model；
Step s202, edp tcon enters screen self-refresh mode.
It should be noted that the order of edp tcon input can support two data channel, it is respectively as follows: for edp tx
Aux ch passage；I2c interface for the edp tcon of controller (such as mcu, arm).
In the scheme that step s22 provides, after edp tcon enters screen self-refresh mode, edp source can be defeated
Go out the second pattern, the embodiment of the present invention is also not specifically limited to the second pattern, wherein, the second pattern is different from the first pattern.
The pattern of selected areas, wherein, edp after edp source can export the second pattern, can be obtained from the second pattern
Frame frame updating region in the memorizer of tcon is used for indicating the storage location of the pattern of selected areas, wherein, the second pattern
In the region chosen can for needing the area of the pattern updating, the control register in edp tcon can be used for controlling open or
Close described screen self-refresh mode 2.
Alternatively, the depositor that psr2 self-test function needs may include that the depositor that frame frame updating region needs
The depositor needing with control area, wherein:
Frame frame updating region need depositor may include that start of line address register, row end address register,
Row initial address register, row end address register, specifically:
Frame frame updating region, start of line address (horizontal line start address)
Low eight initial address register: psr2_h_line_start_addr_l [7:0]
High five initial address register: psr2_h_line_start_addr_h [4:0]
Frame frame updating region, row end address (horizontal line end address)
Low eight initial address register: psr2_h_line_end_addr_l [7:0]
High five initial address register: psr2_h_line_end_addr_h [4:0]
Frame frame updating region, row initial address (vert ical line start address)
Low eight initial address register: psr2_v_line_start_addr_l [7:0]
High five initial address register: psr2_v_line_start_addr_h [4:0]
Frame frame updating region, row end address (vert ical line end address)
Low eight initial address register: psr2_v_line_end_addr_l [7:0]
High five initial address register: psr2_v_line_end_addr_h [4:0]
Psr2 control register, enters psr2
psr2_self_test_ctrl[0]
Psr2 control register, exits psr2
psr2_self_test_ctrl[1]
In the technical scheme that step s23 provides, edp tcon can enter screen self-refresh mould by control register
Formula 2, and according to the region chosen in instruction storage second pattern in frame frame updating region.Herein it should be noted that
The region chosen in two patterns can be the area of the pattern needing part to update.This embodiment is posted by the control of edp tcon
Storage makes edp tcon enter psr2 pattern, and needs the partial pattern updating according to the instruction storage in frame frame updating region
Region, is capable of carrying out the purpose of pattern local updating under psr2 pattern.
In the technical scheme that step s24 provides, the region chosen in the first pattern and the second pattern carries out mixed display,
It is capable of carrying out local updating to the partial pattern in the first pattern, choose in partial pattern as the second pattern herein
Region, and then realize display is tested, that is, realize psr2 self-test function.
As one kind alternatively embodiment, in step s24edp tcon by choosing in the first pattern and the second pattern
After region carries out mixed display, the display method of testing of this embodiment can also include: step s25, and edp tcon calculates mixed
Close the check value of the data of display.It should be noted that the check value of the data of mixed display can serve to indicate that this psr2
The performance of self-test, this embodiment is passed through to calculate the check value of the data of mixed display, it is possible to achieve permissible according to this check value
Psr2 self-test function is carried out with the purpose of overall merit.
As one kind alternatively embodiment, in step s24edp tcon by choosing in the first pattern and the second pattern
After region carries out mixed display, the display method of testing of this embodiment can also include:
Step s26, edp tcon exits screen self-refresh mode 2 and/or screen self-refresh mode；
Step s27, edp tcon receives the 3rd pattern；
Step s28, edp tcon shows the 3rd pattern, to test to display.
In above-mentioned steps, this embodiment is that the region chosen in the first pattern and the second pattern is carried out mixing is aobvious
Show, after realizing psr2 self-test function, edp tcon can exit psr2 pattern and/or psr pattern, work in the normal mode
Make.The 3rd pattern of edp source output when edp tcon is in normal mode of operation, can be received, and by edp
Show the 3rd pattern in tcon, realize edp tcon being carried out showing the purpose of test in the normal mode of operation.This enforcement
Example is passed through after having executed psr2 self-test, then the edptcon under normal mode of operation is carried out with display test, it is possible to increase
Edp tcon is carried out show the effect of the accuracy of test.
The entire flow of the psr2 self-test of the embodiment of the present invention can be as shown in figure 3, the self-test flow process of psr2 be permissible
Comprise the following steps:
Step s31, edp tx, namely the sending port of edp source, export the first pattern.
Step s32, edp tcon input order, this order can serve to indicate that edp tcon enters psr pattern, edp
The order of tcon input can support two data channel, is respectively as follows: the aux ch passage for edp tx；For controller
The i2c interface of the edp tcon of (such as mcu, arm).
Step s33, edp tcon enters psr pattern, captures whole frame data.
Step s34, edp tx exports the second pattern, and wherein, the second pattern only subregion compared with the first pattern is sent out
Raw change.
Step s35, edp tcon inputs the order entering psr2 pattern for instruction.Wherein, the memorizer of edp tcon
In frame frame updating region be used for indicating the storage location of the pattern of selected areas, wherein, the region chosen in the second pattern
Can be for needing the area of the pattern updating, the control register in edp tcon is turned on and off screen self-refresh mould for control
Formula 2.
Step s36, edp tcon enters psr2 pattern, and stores the pattern of selected areas in the second pattern.
Step s37, edp tcon is by the pattern mixed display of selected areas in the first pattern and the second pattern.
Step s38, edp tcon calculates the check value of the data of mixed display.
Step s39, edp tx exports the 3rd pattern.
Step s310, edp tcon exits psr2 pattern and/or psr pattern.
Step s311, edp tcon shows the 3rd pattern, works in the normal mode.
Fig. 4 is the schematic diagram of the display effect of the self-test function of psr2 according to embodiments of the present invention, as shown in figure 4,
After edp tx exports the first pattern, edp tcon enters psr pattern, and captures whole frame data；Edp tx exports the second pattern
Afterwards, edp tcon enters psr2 pattern, realizes partial pattern local updating；After edp tx exports the 3rd pattern, edp
Tcon returns normal mode, shows the 3rd pattern.
The principle of embodiment of the present invention psr2 self-test function is using the edp tcon depositor of itself, replace from
The sdp packet that edpsource sends over.By configuring the depositor of itself, trigger psr2 function.In this case,
Only sdp packet receives logic and does not work.The video information that edp tcon receives still is derived from edpsource, other
The functional module of psr2 and normal use condition are consistent, and remain concordance to greatest extent.Complete under psr2 self-test
The debugging and verification becoming, the result with modular system is not in error, contributes to positioning and problem analysis.
The psr2 flow process of contrast standard, the psr2 self-test function of the embodiment of the present invention greatly reduces to special edp/dp
The requirement of source, as long as basic dp source can be carried out debugging and the test of psr2 function, is greatly enhanced to core
The efficiency of piece checking and reliability, and provide a kind of reliable way for large batch of chip checking and volume production.
According to embodiments of the present invention, additionally provide a kind of device embodiment of display test, it should be noted that this display
Test device can be used for executing the display method of testing in the embodiment of the present invention, the display method of testing in the embodiment of the present invention
Can execute in this display test device.
Fig. 5 is the schematic diagram of display test device according to embodiments of the present invention, as shown in figure 5, this device may include that
Placement unit 51, for edp tcon after edp source exports the first pattern, captures whole frame；Acquiring unit
52, from the second pattern, for edp tcon after edp source exports the second pattern, obtain the pattern of selected areas,
Frame frame updating region in the memorizer of edp tcon is used for indicating the storage location of the pattern of selected areas, described edp
Control register in tcon is turned on and off screen self-refresh mode 2 for control；Reading unit 53, leads to for edp tcon
Cross control register and enter screen self-refresh mode 2；First display unit 54, for edp tcon by the first pattern and the second figure
The region chosen in case carries out mixed display, to test to display.
It should be noted that the placement unit 51 in this embodiment can be used for executing the step in the embodiment of the present application
S21, the acquiring unit 52 in this embodiment can be used for executing step s22 in the embodiment of the present application, the reading in this embodiment
Unit 53 is taken to can be used for executing step s23 in the embodiment of the present application, the first display unit 54 in this embodiment can be used
Step s24 in execution the embodiment of the present application.Above-mentioned module is identical with the example that corresponding step is realized and application scenarios,
But it is not limited to above-described embodiment disclosure of that.
Alternatively, the depositor that frame frame updating region needs may include that start of line address register, row end address
Depositor, row initial address register, row end address register.
Alternatively, the display test device of this fact can also include: input block, is capturing whole frame for edp tcon
Before, edp tcon input order, wherein, orders and enters screen self-refresh mode for instruction；Enter unit, for edp
Tcon enters screen self-refresh mode.
Alternatively, the display test device of this fact can also include: computing unit, in edp tcon by the first figure
After the region chosen in case and the second pattern carries out mixed display, edp tcon calculates the verification of the data of mixed display
Value.
Alternatively, the display test device of this fact can also include: exit unit, in edp tcon by the first figure
After the region chosen in case and the second pattern carries out mixed display, edp tcon exits screen self-refresh mode 2 and/or screen
Curtain self-refresh mode；Receiving unit, receives the 3rd pattern for edp tcon；Second display unit, shows for edp tcon
3rd pattern, to test to display.
By the display test device of the embodiment of the present invention, it is capable of psr2 self-test function and reduces to edpsource
Or the purpose of the dependence of dp source, and then solve correlation technique chips screen self-refresh function test to edp
The dependence of source or dp source is higher, leads to the technical problem that testing efficiency is relatively low, reliability is poor it is achieved that improving
Testing efficiency and the technique effect of reliability.
The embodiments of the present invention are for illustration only, do not represent the quality of embodiment.
In the above embodiment of the present invention, the description to each embodiment all emphasizes particularly on different fields, and does not have in certain embodiment
The part describing in detail, may refer to the associated description of other embodiment.
It should be understood that disclosed technology contents in several embodiments provided herein, can pass through other
Mode is realized.Wherein, device embodiment described above is only the schematically division of for example described unit, Ke Yiwei
A kind of division of logic function, actual can have other dividing mode when realizing, for example multiple units or assembly can in conjunction with or
Person is desirably integrated into another system, or some features can be ignored, or does not execute.Another, shown or discussed is mutual
Between coupling or direct-coupling or communication connection can be by some interfaces, the INDIRECT COUPLING of unit or module or communication link
Connect, can be electrical or other form.
The described unit illustrating as separating component can be or may not be physically separate, show as unit
The part showing can be or may not be physical location, you can with positioned at a place, or can also be distributed to multiple
On unit.The purpose to realize this embodiment scheme for some or all of unit therein can be selected according to the actual needs.
In addition, can be integrated in a processing unit in each functional unit in each embodiment of the present invention it is also possible to
It is that unit is individually physically present it is also possible to two or more units are integrated in a unit.Above-mentioned integrated list
Unit both can be to be realized in the form of hardware, it would however also be possible to employ the form of SFU software functional unit is realized.
If described integrated unit is realized and as independent production marketing or use using in the form of SFU software functional unit
When, can be stored in a computer read/write memory medium.Based on such understanding, technical scheme is substantially
The part in other words prior art being contributed or all or part of this technical scheme can be in the form of software products
Embody, this computer software product is stored in a storage medium, including some instructions with so that a computer
Equipment (can be personal computer, server or network equipment etc.) execution each embodiment methods described of the present invention whole or
Part steps.And aforesaid storage medium includes: u disk, read only memory (rom, read-onlymemory), random access memory are deposited
Reservoir (ram, random access memory), portable hard drive, magnetic disc or CD etc. are various can be with store program codes
Medium.
The above is only the preferred embodiment of the present invention it is noted that ordinary skill people for the art
For member, under the premise without departing from the principles of the invention, some improvements and modifications can also be made, these improvements and modifications also should
It is considered as protection scope of the present invention.
Claims (10)
1. a kind of display method of testing is it is characterised in that include:
Edp tcon, after edp source exports the first pattern, captures whole frame；
Described edp tcon, after described edp source exports the second pattern, obtains selected areas from described second pattern
Pattern, wherein, frame frame updating region in the memorizer of described edp tcon is used for indicating the pattern of described selected areas
Storage location, the control register in described edp tcon is turned on and off described screen self-refresh mode 2 for control；
Described edp tcon enters described screen self-refresh mode 2 by described control register；
The region chosen described in described first pattern and described second pattern is carried out mixed display by described edp tcon, with
Display is tested.
2. method according to claim 1 it is characterised in that
The depositor that described frame frame updating region needs includes: start of line address register, row end address register, arranges
Beginning address register, row end address register.
3. method according to claim 1 is it is characterised in that described edp tcon is before capturing described whole frame, described
Method also includes:
Described edp tcon input order, wherein, described order enters screen self-refresh mode for instruction；
Described edp tcon enters described screen self-refresh mode.
4. method according to claim 1 is it is characterised in that in described edp tcon by described first pattern and described
After the region chosen described in two patterns carries out mixed display, methods described also includes:
Described edp tcon calculates the check value of the data of mixed display.
5. method according to claim 1 is it is characterised in that in described edp tcon by described first pattern and described
After the region chosen described in two patterns carries out mixed display, methods described also includes:
Described edp tcon exits described screen self-refresh mode 2 and/or described screen self-refresh mode；
Described edp tcon receives the 3rd pattern；
Described edp tcon shows described 3rd pattern, to test to display.
6. a kind of display test device is it is characterised in that include:
Placement unit, for edp tcon after edp source exports the first pattern, captures whole frame；
Acquiring unit, for described edp tcon after described edp source exports the second pattern, from described second pattern
The middle pattern obtaining selected areas, wherein, the frame frame updating region in the memorizer of described edp tcon is used for indicating described
The storage location of the pattern of selected areas, the control register user in described edp tcon is turned on and off described screen from brush
New model 2；
Reading unit, enters described screen self-refresh mode 2 for described edp tcon by described control register；
First display unit, the area that will choose described in described first pattern and described second pattern for described edp tcon
Domain carries out mixed display, to test to display.
7. device according to claim 6 it is characterised in that
The depositor that described frame frame updating region needs includes: start of line address register, row end address register, arranges
Beginning address register, row end address register.
8. device according to claim 6 is it is characterised in that described device also includes:
Input block, for described edp tcon before capturing described whole frame, described edp tcon input order, wherein, institute
State order for instruction entrance screen self-refresh mode；
Enter unit, enter described screen self-refresh mode for described edp tcon.
9. device according to claim 6 is it is characterised in that described device also includes:
Computing unit, for the region that will choose described in described first pattern and described second pattern in described edp tcon
After carrying out mixed display, described edp tcon calculates the check value of the data of mixed display.
10. device according to claim 6 is it is characterised in that described device also includes:
Exit unit, for the region that will choose described in described first pattern and described second pattern in described edp tcon
After carrying out mixed display, described edp tcon exits described screen self-refresh mode 2 and/or described screen self-refresh mode；
Receiving unit, receives the 3rd pattern for described edp tcon；
Second display unit, shows described 3rd pattern for described edp tcon, to test to display.
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| CN201610785645.XA CN106371959B (en) | 2016-08-30 | 2016-08-30 | Show test method and device |
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| CN201610785645.XA CN106371959B (en) | 2016-08-30 | 2016-08-30 | Show test method and device |
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| CN106371959B CN106371959B (en) | 2019-06-04 |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20130278591A1 (en) * | 2012-04-24 | 2013-10-24 | Silicon Works Co., Ltd. | Embedded displayport system and method for controlling panel self refresh mode |
| CN104361871A (en) * | 2014-11-07 | 2015-02-18 | 硅谷数模半导体（北京）有限公司 | Display screen debugging method, device and system |
| CN105025334A (en) * | 2014-04-22 | 2015-11-04 | Lg电子株式会社 | Display device and method of controlling therefor |
| CN105719604A (en) * | 2014-09-17 | 2016-06-29 | 中华映管股份有限公司 | Method for improving panel automatic updating picture flicker of display panel and control circuit thereof |
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2016
- 2016-08-30 CN CN201610785645.XA patent/CN106371959B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20130278591A1 (en) * | 2012-04-24 | 2013-10-24 | Silicon Works Co., Ltd. | Embedded displayport system and method for controlling panel self refresh mode |
| CN105025334A (en) * | 2014-04-22 | 2015-11-04 | Lg电子株式会社 | Display device and method of controlling therefor |
| CN105719604A (en) * | 2014-09-17 | 2016-06-29 | 中华映管股份有限公司 | Method for improving panel automatic updating picture flicker of display panel and control circuit thereof |
| CN104361871A (en) * | 2014-11-07 | 2015-02-18 | 硅谷数模半导体（北京）有限公司 | Display screen debugging method, device and system |
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