CN106370993A - Equipment door and thin film transistor test device - Google Patents
Equipment door and thin film transistor test device Download PDFInfo
- Publication number
- CN106370993A CN106370993A CN201610814936.7A CN201610814936A CN106370993A CN 106370993 A CN106370993 A CN 106370993A CN 201610814936 A CN201610814936 A CN 201610814936A CN 106370993 A CN106370993 A CN 106370993A
- Authority
- CN
- China
- Prior art keywords
- slideway
- folding
- film transistor
- thin film
- appliance doors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
Abstract
The invention discloses an equipment door and a thin film transistor test device. The equipment door is used for enclosing a thin film transistor test chamber and comprises a slideway structure and a folding structure, wherein the slideway structure and thin film transistor test chamber are fixedly connected, and the slideway structure comprises a first slideway and a second slideway in opposite arrangement; the folding structure comprises multiple folds, adjacent folds are mutually connected through a rotating shaft, the two ends of each fold are each provided with a slideway hole, a first slideway and a second slideway are respectively arranged in the corresponding slideway holes, and the folds, close to a front end, of the fold structure are fixedly connected with the slideway structure. According to the technical scheme provided by the invention, the equipment door is open and closed through a folding push-and-pull mode, the equipment door is enabled to not occupy space above the thin film transistor test chamber any more, therefore, when a thin film transistor is tested, a microscope does not have to be moved, and test time is saved.
Description
Technical field
The present invention relates to display technology field, more particularly, to a kind of appliance doors and thin film transistor (TFT) test equipment.
Background technology
Among prior art, the test to thin film transistor (TFT) is carried out among test cabinet, in order to ensure that test environment is black
Dark state, the top of each test cabinet is provided with thick and heavy appliance doors.Before test, need to open appliance doors, then will be micro-
Mirror moves on to the top of test cabinet；During test, need to remove microscope, then the said equipment door is closed.However, existing appliance doors
Excessively thick and heavy, lead to need to waste more manpowers when opening.In addition, must set above-mentioned when thin film transistor (TFT) is tested
Standby door upwardly opens, and the appliance doors due to opening can take the space above thin film transistor (TFT) test cabinet, and therefore also needing to will be aobvious
Micro mirror is removed, and so virtually wastes a lot of testing times.
Content of the invention
For solving the above problems, the present invention provides a kind of appliance doors and thin film transistor (TFT) test equipment, at least partly solves
Existing appliance doors waste the time of a lot of tests and the problem of manpower.
For this reason, the present invention provides a kind of appliance doors, for closed film transistor testing room, including slideway structure and folding
Structure, described slideway structure is fixedly connected with described thin film transistor (TFT) test cabinet, and described slideway structure includes being oppositely arranged
One slideway and the second slideway；
Described hinge structure includes multiple foldings, is connected with each other by rotating shaft between adjacent folding, the two ends of described folding
It is respectively arranged with skidway hole, described first slideway is separately positioned within corresponding skidway hole with described second slideway, described folding
The folding near front end for the page structure is fixedly connected with described slideway structure.
Optionally, the side of described folding is connected with previous folding by rotating shaft, and the opposite side of described folding passes through to turn
Axle is connected with a rear folding.
Optionally, described hinge structure folding foremost is fixedly connected with described slideway structure.
Optionally, described first slideway and the rear end of described second slideway are bent downwardly.
Optionally, also include light barrier structure, the shape of described light barrier structure is mutual with the shape of described slideway structure
Coupling, to block the part that described slideway structure is contacted with each other with described hinge structure.
Optionally, described light barrier structure includes the first light barrier and the second light barrier, and described first light barrier is arranged on
The top of described slideway structure, described second light barrier is arranged on the outside of described slideway structure.
Optionally, the folding near front end for the described hinge structure is fixedly connected by welding manner with described slideway structure.
Optionally, described slideway structure is threaded connection mode with described thin film transistor (TFT) test cabinet and is fixedly connected.
Optionally, the folding of the rearmost end of described hinge structure is provided with handle.
The present invention also provides a kind of thin film transistor (TFT) test equipment, including thin film transistor (TFT) test cabinet and arbitrary described setting
Standby door.
The present invention has following beneficial effects:
Among the appliance doors of present invention offer and thin film transistor (TFT) test equipment, described appliance doors are used for closed film crystal
Pipe test cabinet, including slideway structure and hinge structure, described slideway structure is fixedly connected with described thin film transistor (TFT) test cabinet, institute
State the first slideway and the second slideway that slideway structure includes being oppositely arranged；Described hinge structure includes multiple foldings, adjacent folding
Between be connected with each other by rotating shaft, the two ends of described folding are respectively arranged with skidway hole, and described first slideway is sliding with described second
Road is separately positioned within corresponding skidway hole, and the folding near front end for the described hinge structure is fixing with described slideway structure even
Connect.The present invention provide technical scheme pass through folding push-pull fashion carry out appliance doors opening and closing so that appliance doors no longer
Take the space above thin film transistor (TFT) test cabinet, be also no longer needed for microscope when therefore thin film transistor (TFT) being tested
Remove, thus saving the testing time.In addition, the present invention provide appliance doors open and close when, hinge structure slideway it
Upper light and fast ground slides, thus saving more manpowers.
Brief description
A kind of structural representation of appliance doors that Fig. 1 provides for the embodiment of the present invention one；
Fig. 2 is the connection diagram between adjacent folding shown in Fig. 1；
Fig. 3 is the structural representation of folding shown in Fig. 1；
The structural representation of the light barrier structure that Fig. 4 provides for embodiment one.
Specific embodiment
For making those skilled in the art more fully understand technical scheme, below in conjunction with the accompanying drawings the present invention is carried
For appliance doors and thin film transistor (TFT) test equipment be described in detail.
Embodiment one
A kind of structural representation of appliance doors that Fig. 1 provides for the embodiment of the present invention one.As shown in figure 1, described appliance doors
For closed film transistor testing room, including hinge structure 100 and slideway structure 200, described slideway structure 200 is thin with described
Film transistor test cabinet is fixedly connected, and described slideway structure 200 includes the first slideway 201 being oppositely arranged and the second slideway 202.
Preferably, described slideway structure 200 is threaded connection mode with described thin film transistor (TFT) test cabinet and is fixedly connected.The present embodiment
The technical scheme providing carries out the opening and closing of appliance doors so that appliance doors no longer take thin film crystalline substance by folding push-pull fashion
Space above body pipe test cabinet, is also no longer needed for when therefore thin film transistor (TFT) being tested removing microscope, thus
Save the testing time.In addition, when the appliance doors that the present embodiment provides open and close, hinge structure is light fast on slideway
Slide, thus saving more manpowers promptly.
Fig. 2 is the connection diagram between adjacent folding shown in Fig. 1, and Fig. 3 is the structural representation of folding shown in Fig. 1.As
Shown in Fig. 1 and Fig. 2, described hinge structure 100 includes multiple foldings 101, is connected with each other by rotating shaft between adjacent folding.Optional
, described rotating shaft is thin wire.The two ends of described folding 101 are respectively arranged with skidway hole 102, described first slideway 201 and institute
State the second slideway 202 and be separately positioned within corresponding skidway hole 102, the folding 101 near front end for the described hinge structure 100 with
Described slideway structure 200 is fixedly connected.Optionally, the folding 101 near front end for the described hinge structure 100 and described slideway structure
200 are fixedly connected by welding manner.Preferably, the folding 101 foremost of described hinge structure 100 and described slideway structure
200 are fixedly connected.
Referring to Fig. 2, the side of described folding 101 is connected with previous folding by rotating shaft, the opposite side of described folding 101
It is connected with a rear folding by rotating shaft.The rotary action of rotating shaft allows the technical scheme that the present embodiment provides to pass through to fold
Push-pull fashion carries out the opening and closing of appliance doors so that appliance doors no longer take the space above thin film transistor (TFT) test cabinet,
Also it is no longer needed for when therefore thin film transistor (TFT) being tested removing microscope, thus saving the testing time.In addition, this
When the appliance doors that embodiment provides open and close, hinge structure slides on slideway light and fast, thus saving more
Many manpowers.
Referring to Fig. 1, the rear end of described first slideway 201 is bent downwardly, and the rear end of described second slideway 202 is turned under simultaneously
Bent.Reclinate first slideway 201 and reclinate second slideway 202 achieve the envelope to thin film transistor (TFT) test cabinet
Close, thus ensure that the dark state of test environment.In addition, being provided with the folding 101 of the rearmost end of described hinge structure 100
Handle 102, user folds, by above-mentioned handle 102, the opening and closing that push-pull fashion carries out appliance doors, conveniently and efficiently real
The now closing to thin film transistor (TFT) test cabinet.
The structural representation of the light barrier structure that Fig. 4 provides for embodiment one.As shown in figure 4, described appliance doors also include
Light barrier structure 300, the shape of described light barrier structure 300 is mutually matched with the shape of described slideway structure 200, to block
State the part that slideway structure 200 is contacted with each other with described hinge structure 100.Preferably, described light barrier structure 300 includes first
Light barrier 301 and the second light barrier 302, described first light barrier 301 is arranged on the top of described slideway structure 200, and described
Two light barriers 302 are arranged on the outside of described slideway structure 200.Among practical application, described slideway structure 200 and described folding
The partly easy light leak that page structure 100 contacts with each other, so will destroy the black of test environment among thin film transistor (TFT) test cabinet
Dark state.The light barrier structure 300 that the present embodiment provides just can block contact portion, thus preventing light leakage phenomena.Specifically
For, the first light barrier 301 that the present embodiment provides can block the top of slideway structure 200, and described second light barrier 302 can
To block the outside of slideway structure 200, it is achieved thereby that the thorough closing to thin film transistor (TFT) test cabinet, finally ensure that test
The dark state of environment.
The appliance doors that the present embodiment provides are used for closed film transistor testing room, including slideway structure and hinge structure,
Described slideway structure is fixedly connected with described thin film transistor (TFT) test cabinet, and described slideway structure includes the first slideway being oppositely arranged
With the second slideway；Described hinge structure includes multiple foldings, is connected with each other by rotating shaft between adjacent folding, and the two of described folding
End is respectively arranged with skidway hole, and described first slideway is separately positioned within corresponding slideway with described second slideway, described folding
The folding near front end for the page structure is fixedly connected with described slideway structure.The technical scheme that the present embodiment provides is passed through to fold push-and-pull
Mode carries out the opening and closing of appliance doors so that appliance doors no longer take the space above thin film transistor (TFT) test cabinet, therefore
Also it is no longer needed for when thin film transistor (TFT) is tested removing microscope, thus saving the testing time.In addition, this enforcement
When the appliance doors that example provides open and close, hinge structure slides on slideway light and fast, thus saving more
Manpower.
Embodiment two
The present embodiment provides a kind of thin film transistor (TFT) test equipment, provides including thin film transistor (TFT) test cabinet and embodiment one
Appliance doors, particular content can refer to the description of embodiment one, and here is omitted.
Among the thin film transistor (TFT) test equipment that the present embodiment provides, described appliance doors are used for closed film transistor testing
Room, including slideway structure and hinge structure, described slideway structure is fixedly connected with described thin film transistor (TFT) test cabinet, described slideway
Structure includes the first slideway being oppositely arranged and the second slideway；Described hinge structure includes multiple foldings, logical between adjacent folding
Cross rotating shaft to be connected with each other, the two ends of described folding are respectively arranged with skidway hole, described first slideway is with described second slideway respectively
It is arranged within corresponding slideway, the folding near front end for the described hinge structure is fixedly connected with described slideway structure.This enforcement
The technical scheme that example provides carries out the opening and closing of appliance doors so that appliance doors no longer take thin film by folding push-pull fashion
Space above transistor testing room, is also no longer needed for when therefore thin film transistor (TFT) being tested removing microscope, from
And save the testing time.In addition, when the appliance doors that the present embodiment provides open and close, hinge structure is light on slideway
Quickly slide, thus saving more manpowers.
It is understood that the embodiment of above principle being intended to be merely illustrative of the present and the exemplary enforcement adopting
Mode, but the invention is not limited in this.For those skilled in the art, in the essence without departing from the present invention
In the case of god and essence, various modifications and improvement can be made, these modifications and improvement are also considered as protection scope of the present invention.
Claims (10)
1. a kind of appliance doors, for closed film transistor testing room it is characterised in that including slideway structure and hinge structure,
Described slideway structure is fixedly connected with described thin film transistor (TFT) test cabinet, and described slideway structure includes the first slideway being oppositely arranged
With the second slideway；
Described hinge structure includes multiple foldings, is connected with each other by rotating shaft between adjacent folding, and the two ends of described folding are respectively
It is provided with skidway hole, described first slideway is separately positioned within corresponding skidway hole with described second slideway, described folding knot
The folding near front end for the structure is fixedly connected with described slideway structure.
2. appliance doors according to claim 1 are it is characterised in that rotating shaft and previous folding are passed through in the side of described folding
Connect, the opposite side of described folding is connected with a rear folding by rotating shaft.
3. appliance doors according to claim 1 are it is characterised in that the folding foremost of described hinge structure and described slideway
Structure is fixedly connected.
4. appliance doors according to claim 1 it is characterised in that described first slideway and described second slideway rear end to
Lower bending.
5. appliance doors according to claim 1 are it is characterised in that also include light barrier structure, described light barrier structure
Shape is mutually matched with the shape of described slideway structure, to block the portion that described slideway structure is contacted with each other with described hinge structure
Point.
6. appliance doors according to claim 5 are it is characterised in that described light barrier structure includes the first light barrier and second
Light barrier, described first light barrier is arranged on the top of described slideway structure, and described second light barrier is arranged on described slideway knot
The outside of structure.
7. appliance doors according to claim 1 are it is characterised in that the folding near front end for the described hinge structure and described cunning
Road structure is fixedly connected by welding manner.
8. appliance doors according to claim 1 are it is characterised in that described slideway structure and described thin film transistor (TFT) test cabinet
The mode of being threaded connection is fixedly connected.
9. appliance doors according to claim 1 are it is characterised in that be provided with the folding of the rearmost end of described hinge structure
Handle.
10. a kind of thin film transistor (TFT) test equipment is it is characterised in that inclusion thin film transistor (TFT) test cabinet and claim 1-9 are appointed
Appliance doors described in one.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610814936.7A CN106370993A (en) | 2016-09-09 | 2016-09-09 | Equipment door and thin film transistor test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610814936.7A CN106370993A (en) | 2016-09-09 | 2016-09-09 | Equipment door and thin film transistor test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106370993A true CN106370993A (en) | 2017-02-01 |
Family
ID=57899489
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610814936.7A Pending CN106370993A (en) | 2016-09-09 | 2016-09-09 | Equipment door and thin film transistor test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106370993A (en) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2839527Y (en) * | 2005-09-06 | 2006-11-22 | 黄锦洪 | The nothing ground rail folding door of a kind of tape guide location |
| KR100780759B1 (en) * | 2005-01-24 | 2007-11-30 | 삼성전자주식회사 | TFT Array Inspecting Apparatus |
| CN201007764Y (en) * | 2007-03-01 | 2008-01-16 | 北京京东方光电科技有限公司 | Formed box checking device of TFT LCD box forming section |
| CN201464157U (en) * | 2009-06-04 | 2010-05-12 | 中茂电子(深圳)有限公司 | Testing machine with flexible sliding door |
| CN102928286A (en) * | 2012-11-08 | 2013-02-13 | 沈阳建筑大学 | Novel experiment slide bearing device |
| CN203428151U (en) * | 2013-08-28 | 2014-02-12 | 台州天禧家居用品有限公司 | Foldable storage box |
| CN204813029U (en) * | 2015-07-23 | 2015-12-02 | 广州金阳广告制作有限公司 | Folding display board in supermarket |
| CN105888366A (en) * | 2013-10-11 | 2016-08-24 | 中山市雅西环保科技有限公司 | Foldable sunshade |
-
2016
- 2016-09-09 CN CN201610814936.7A patent/CN106370993A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100780759B1 (en) * | 2005-01-24 | 2007-11-30 | 삼성전자주식회사 | TFT Array Inspecting Apparatus |
| CN2839527Y (en) * | 2005-09-06 | 2006-11-22 | 黄锦洪 | The nothing ground rail folding door of a kind of tape guide location |
| CN201007764Y (en) * | 2007-03-01 | 2008-01-16 | 北京京东方光电科技有限公司 | Formed box checking device of TFT LCD box forming section |
| CN201464157U (en) * | 2009-06-04 | 2010-05-12 | 中茂电子(深圳)有限公司 | Testing machine with flexible sliding door |
| CN102928286A (en) * | 2012-11-08 | 2013-02-13 | 沈阳建筑大学 | Novel experiment slide bearing device |
| CN203428151U (en) * | 2013-08-28 | 2014-02-12 | 台州天禧家居用品有限公司 | Foldable storage box |
| CN105888366A (en) * | 2013-10-11 | 2016-08-24 | 中山市雅西环保科技有限公司 | Foldable sunshade |
| CN204813029U (en) * | 2015-07-23 | 2015-12-02 | 广州金阳广告制作有限公司 | Folding display board in supermarket |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20170201 |
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| RJ01 | Rejection of invention patent application after publication |