CN106370565A - Quantitative detection method for primary silicon phases in hypereutectic aluminum-silicon alloy - Google Patents
Quantitative detection method for primary silicon phases in hypereutectic aluminum-silicon alloy Download PDFInfo
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Abstract
The invention discloses a quantitative detection method for primary silicon phases in a hypereutectic aluminum-silicon alloy. The method comprises the steps that a test sample to be detected is intercepted, ground flush and polished, and then images of the whole polished surface are continuously and exhaustively collected with overlapping in sequence by means of a camera accompanied with a microscope, the images are spliced by means of image software in sequence, overlapping is processed, and the area of each primary silicon phase is clicked on by means of a magic wand tool; all the primary silicon phases in the whole section are saved in the same image, statistics and quantitative processing to the primary silicon phases are conducted by using image processing software and data processing and analysis software, thus the size information of each primary silicon phase, the statistical information of all the primary silicon phases and the total area of the whole detected section are obtained, and the content of the primary silicon phases is the ratio of the total area of the primary silicon phases to the total area of the whole detected section. The method achieves quantitative detection of the primary silicon phases in the whole section to be detected, and is more accurate in detection result.
Description
Technical field
The present invention relates in a kind of transcocrystallized Al-Si alloy primary silicon phase quantitative detecting method, belong to metallographic structure quantitative
Detection technique field.
Background technology
Hypereutectic al-si alloy has excellent physicochemical characteristicss, and as light in density, thermal coefficient of expansion is low, dimensionally stable
Property good, heat conduction, wear-resisting, anti-corrosion etc., be commonly used to manufacture light wear-resistant parts, in Aeronautics and Astronautics, transportation, machining
In field, particularly it is widely used in automobile industry.Transcocrystallized Al-Si alloy in process of setting, due to liquid contraction
And solidification shrinkage, form the shrinkage cavity concentrated or small and scattered shrinkage porosite greatly at the position of foundry goods final set.Make before melting
With moist, have corrosion, the transcocrystallized Al-Si alloy furnace charge of greasy dirt, fusion process high temperature transcocrystallized Al-Si alloy melt
With surrounding atmosphere, casting mold interact, and solubility with temperature in transcocrystallized Al-Si alloy melt for the gas reduction and
The factors such as reduction lead to pore and non-metallic inclusion to produce.The depositing of the defects such as shrinkage cavity and porosity, pore and non-metallic inclusion
Effective lifting surface area of foundry goods can reduced, and producing stress concentration phenomenon, not only reduce the mechanical performance of foundry goods, also reduce
The air-tightness of foundry goods and physical and chemical performance.The content of the serviceability of hypereutectic aluminum-silicon alloy casting and primary silicon phase, pattern,
Size and distribution are closely related, and therefore, detection by quantitative primary silicon phase is the important interior of transcocrystallized Al-Si alloy material metallographic detection
Hold.
Metallographic method is the quantitative detecting method of primary silicon phase in the transcocrystallized Al-Si alloy commonly used at present.Hans in 1961
Elias proposes quantitative stereology concept, and many scholars of the former Soviet Union and the U.S. establish a whole set of method according to stereology principle,
Two dimensional character parameter that can be actually measured from micro-image, derives various three-dimensional coefficient.Stereology is based on statistics
A large amount of repeated detection in meaning, need grid division during concrete operations, the friendship situation of cutting of determinand phase and grid is united
Meter.Originally adopt metallographic ocular estimate, it is most of that the method includes 2: image acquisition and quantitative analyses.In terms of image acquisition, main
If with the microscope with camera function, microstructure picture is developed, form paper image；In quantitative analyses side
Face, conventional method has grading relative method, resection and area-method.Grading relative method is by by the pattern of testing sample and mark
Quasi- judge picture contrast is evaluated, and this assessment method is simple and efficient to handle, is to apply a kind of most methods in current production,
But certainty of measurement is not high, can only achieve semiquantitative degree.Resection is measurement line segment or the grid being aided with given length, utilizes
Target phase to be measured carries out quantitative Analysis with the phase intercept point number of these line segments or grid, resection can be divided into again straight line resection,
Single circle resection and three circle resections.Area-method is to measure target phase size to be measured with the target number of phases to be measured in given area
Method.Metallographic ocular estimate, mainly by manual calculation, mathematical processes are complicated, and workload is big, its accuracy, concordance, weight
Renaturation and detection speed all very poor it is impossible to reach expected purpose, some work even cannot be carried out because workload is too big.
With the development of computer software technology and digital image processing techniques, it is that image automatic analytical system provides weight
The technical support wanted, creates the Quantitative metallography based on image procossing.It is most of that the method includes 3: at image acquisition, image
Reason and quantitative analyses.In terms of image acquisition, mainly using the microscope having store function, microstructure picture is saved as
Digital picture.Image procossing aspect, mainly uses some softwares, such as siscias v8.0, micro-image analysis＆
Process system (miaps), quantimet 500 etc. extract target phase to be measured.Accurately extract target phase to be measured, be to obtain
The premise of reliable quantification metallographic result, is also based on the Quantitative metallography key technology to be solved of image procossing.Carry at present
The step taking target phase to be measured is typically: reads in original image → switch to the automatic color of gray level image → gray scale with image processing software
Rank → adjustment brightness, colourity, saturation, contrast etc. → binary conversion treatment → obtain in white and black gray level image.Quantitative point
Analysis aspect, the content of quantitative analyses is identical with metallographic ocular estimate with method, only utilizes related software so that quantitative analyses
Workload mitigates significantly.Quantitative metallography based on image procossing and metallographic ocular estimate, when doing quantitative metallographic analysis, are random
Choose or choose representative multiple visual fields, area of detection is very limited, and testing result can only represent very limited amount of inspection
Survey the content of target phase to be measured, pattern, size and distribution in region, testing result is not accurate enough.
Patent cn1651905a, discloses a kind of quantitative analyzing, and the flow process of the method is
[non-metallic inclusion analysis of the non-metallic inclusion → single image of collection single image → extraction single image] → repeat
The non-metallic inclusion analysis of abovementioned steps → all images collect → generate report, and non-metallic inclusion extracts and adopts gray scale threshold
Value is extracted.It is characterized in that, metallurgical microscope, automatic carrier are connected by it with video camera, computer, by video camera from metallographic
In microscope, collection nonmetal inclusion object image is sent into computer and is carried out image procossing, realize the identification to non-metallic inclusion with
And parameter measurement, by measurement result with quantitative model calculate or with standard diagram relative analyses, quantitative evaluation result, permissible
Realize the detection of whole tested surface.This kind of method is according to the national standard of the top level representing current field trash touchstone
(gb, astm, jis, din, iso etc.) carries out non-metallic inclusion defect analysiss.And these standards carry out non-metallic inclusion and lack
When falling into analysis, itself there is certain scope of application, its scope of application is more than or equal in 3 rolling or forging steel for compression ratio
Non-metallic inclusion micro- assessment method, versatility is strong；This method is widely used in adaptive to given purposes steel
Assessment, but, due to the impact of the personnel of being put to the test, even if also being difficult to reproduction test result using a large amount of samples, repeatability is poor；Though
The detection of whole tested surface so can be realized, but in detection process, need every image of collection is processed, extraction is treated
Survey target phase, process is quite loaded down with trivial details；Furthermore the method extracting non-metallic inclusion defect, with conventional determining based on image procossing
Amount metallographic method is identical, is also the regulation by image is carried out with brightness, colourity, saturation, contrast etc., uses gray level threshold segmentation
Method and clustering technique extract target phase to be measured, and accuracy has much room for improvement.Therefore easy, to extract target phase exactly be still that this method needs
Key technology to be solved.
Document [Shen Jingwen. application [j] in Metallographic Analysis for the image processing techniquess. Casting Equipment and technique, 2014,06:
60-62.] metallograph is carried out splice using photoshop image processing software, the operation such as cut removes is so that be subject to photo
Size limitation shows that infull metallographic completely shows in spliced wide cut photo.Using image mosaic, in theory can also
Realize the quantitative metallographic analysis of whole tested surface.But the method mentioned with the document, before realizing stitching image, not only needs
Every image to be spliced is carried out brightness, contrast adjustment in addition it is also necessary to the step such as the cutting of photo, shearing, stickup, preservation,
Spliced again, the image processing process before splicing is complicated；Furthermore, it desired to two width adjacent images to be spliced should have to a certain degree
Overlapping region, the optimum of registration is 50%, under so big registration requires, identical area of section to be checked condition
Under, the amount of images that need to gather is many, and before splicing, the workload of image procossing is big.
Content of the invention
It is an object of the invention to overcoming the deficiencies in the prior art, provide primary silicon phase in a kind of transcocrystallized Al-Si alloy
Quantitative detecting method, the method processing procedure is easier, and can more accurately extract primary silicon phase, improves detection by quantitative result
Accuracy.
The present invention take technical scheme is:
The quantitative detecting method of primary silicon phase in a kind of transcocrystallized Al-Si alloy, comprises the following steps:
(1) all images are gathered: transcocrystallized Al-Si alloy section to be detected is polished and polishes, then with photograph work(
Can optical microscope in order exhaustive and have overlappingly to whole burnishing surface gather image；
(2) picture mosaic: splice the image of described collection with the software with jigsaw puzzle function in order successively, process overlapping, obtain
Stitching image to entirely section to be detected；
(3) extract whole primary silicon phase in entirely section to be detected: extract in described stitching image and there is polygon
Shape, the region of gray, then the region extracting in whole cross section are saved in same image, that is, obtain containing just
The image of raw silicon phase size, pattern and distribution；
(4) in image, the analysis of all primary silicon phases collects calculating: with image processing software open described in contain primary silicon
Phase size, pattern, the image of distribution, count to primary silicon phase；Statistical result is exported data processing and analysis software
In carry out quantitative Treatment, obtain the dimension information of each primary silicon phase, the statistical information of all primary silicon phases and entirely to be detected
The gross area in section；
The ratio of the primary silicon phase gross area and the entirely gross area in section to be detected is the content of primary silicon phase.
In step (1), described transcocrystallized Al-Si alloy is more than the aluminum silicon two of 12.6% (mass percent) for silicone content
First alloy or aluminum silicon multicomponent alloy.
In order to more clearly obtain image photograph, described section to be detected successively use 80#, 240#, 800#,
1500#, 4000# sand paper polishes after polishing.
In step (2), the described software with jigsaw puzzle function can for photoshop software or have jigsaw puzzle function its
Its software.
So that testing result is more accurate, detection method is easier it is preferred that described process overlapping method
For: during picture mosaic, after successfully inserting piece image, choose the second width image to be inserted, the opacity of this figure layer is set to
30～80%, movement the second width image to be inserted, make have overlapping partly completely overlapped with piece image, now can be formed
The clearly stitching image of two images, carriage return determines inserts, then the opacity of this figure layer is set to 100%, completes two
The splicing of image and coupling, repeat the above steps, can achieve splicing and the coupling in section entirely to be checked.
In step (3), observe under an optical microscope, light occurs refraction in bright in smooth fine and close alusil alloy matrix
Color, gets along Lycoperdon polymorphum Vitt in primary silicon phase and Eutectic Silicon in Al-Si Cast Alloys, and light is in the fault location meeting such as non-metallic inclusion, shrinkage cavity and porosity and pore
Scattering is occurred to be in black；Eutectic silicon is needle-like, and primary silicon phase is in polygon-shaped.
In order to more accurately and easily extract primary silicon phase it is preferred that being extracted using photoshop software.?
Select the region of each primary silicon phase with magic wand menu point in the newly-built figure layer of photoshop software.
In step (4), according to the information to primary silicon phase acquisition, the present invention obtains a kind of easy to use, fast through screening
Prompt image processing software primary silicon phase is counted, and this image processing software is image-pro plus (ipp).
Described data processing and analysis software are excel software, it is possible to achieve the quantitative Treatment to statistical result.
Described primary silicon phase statistics concretely comprises the following steps with quantitative Treatment:
A () opens image: open primary silicon phase stitching image in ipp software；
(b) binary conversion treatment: carry out binary conversion treatment in ipp software；
C () parameter selects: select " count/size " in " measure " drop-down menu, enter in the dialog box ejecting
Row is following to be arranged: select measurements:area (area), diameter (max) (maximum gauge), diameter
(min) (minimum diameter), diameter (mean) (average diameter), click automatic bright objects；
D () measures: click on " count " in " count/size " pop-up dialogue box, each is measured automatically and simultaneously by software
The area of primary silicon phase, maximum gauge (dmax), minimum diameter (dmin) and average diameter (dmean)；Wherein, by primary silicon phase
The straight line of the centre of form is cut obtained line segment, the referred to as diameter of primary silicon phase by its profile phase；Wherein long diameter is referred to as
Maximum gauge, minimum diameter is referred to as minimum diameter, crosses the centre of form referred to as averagely straight every the meansigma methodss of 2 ° of all diameters obtaining
Footpath.
E () result exports: the result output of [e1] each primary silicon phase information: in " count/size " pop-up dialogue box
" file " drop-down menu in select " export data ", system can generate an excel file, include with pixel unit Lai
The area of each primary silicon phase of expression, dmax、dmin、dmean；
The output of [e2] all primary silicons phase statistical result: " view " in " count/size " pop-up dialogue box is drop-down
Select " statistics " in menu, can pop-up dialogue box, the number containing primary silicon phase and use pixel unit in dialog box
The statistical information of all primary silicon phases representing, the such as gross area, maximum area, minimum area, average area, area distributions, etc.
Effect circular diameter, maximum dmax, minimum dmax, average dmax、dmaxDistribution, maximum dmin, minimum dmin, average dmin、dminDistribution, maximum
dmean, minimum dmean, average dmeanAnd dmeanDistribution.Wherein, each primary silicon mutually has a dmax, all primary silicon phases
dmaxMiddle the maximum is referred to as maximum dmax, the referred to as minimum d of recklingmax, the d of all primary silicon phasesmaxMeansigma methodss referred to as average
dmax；By that analogy, define maximum dmin, minimum dmin, average dmin, maximum dmean, minimum dmean, average dmean.
The step of realizing that primary silicon phase size calculates is:
When () capture is taken pictures a, with the subsidiary image processing software superposition scale of optical microscope；
Before (b) quantitative Analysis and statistical result process, the pixel unit in ipp software is converted into long measure.
The method that pixel unit in ipp software is converted into long measure is: amplifies stitching image in ipp software, makes in image
The length of scale occupies more than the 2/3 of computer screen length, surveyors' staff length, obtains the pixel value of scale physical length, leads to
Cross conversion and obtain the physical length represented by each pixel unit；
C () exports to quantitative Analysis and statistical result in excel file, by the quantitative Analysis being represented with pixel unit and
Statistical result is converted into physical length unit, obtains area, the d of each primary silicon phasemax、dmin、dmeanEntirely section to be checked
Actual size；
D () primary silicon phase gross area is primary silicon phase area percentage ratio with the ratio of the gross area of whole detection sectional plane.According to
According to stereology principle, thing phase volume hundred in three dimensions is determined by the two-dimensional parametric measuring on metallographic specimen flour milling and calculate
Fraction it may be assumed that
vv=aa=ll=pp,
In formula: vv--- determinand phase volume percentage ratio；
aa--- determinand phase area percentage ratio；
ll--- determinand phase line percentage ratio；
pp--- determinand phase point percentage ratio.
This formula is that the two dimensional character parameter of material microstructure is converted into material microstructure three-dimensional feature parameter
Method.The area percentage of primary silicon phase, is also the percent by volume of primary silicon phase, that is, the reality of primary silicon phase contains
Amount.
The dimension information of each described primary silicon phase includes the area of primary silicon phase, dmax、dmin、dmean；Described institute
The statistical information having primary silicon phase includes: the gross area, maximum area, minimum area, average area, area distributions, equivalent circular are straight
Footpath, maximum dmax, minimum dmax, average dmax、dmaxDistribution, maximum dmin, minimum dmin, average dmin、dminDistribution, maximum dmean、
Minimum dmean, average dmeanAnd dmeanDistribution.
Technique scheme has the advantages that
The present invention passes through picture mosaic step and realizes extracting with figure, and process is simpler, the evil spirit rod work in available photoshop software
Tool clicks, and can accurately, more quickly extract primary silicon phase.Quantitative analyses are directly carried out by software, without standard diagram data
Storehouse, is not limited by data base.The invention provides in a kind of detection by quantitative transcocrystallized Al-Si alloy primary silicon phase new approaches.
The content of quantitative analyses of the present invention, not only can reference area percentage composition, also can get primary silicon and cut whole
The pattern in face, distribution, the information (area of primary silicon phase, maximum gauge, minimum diameter, average diameter) of each primary silicon phase and
Information (gross area, maximum area, minimum area, average area, area distributions, equivalent diameter, the maximum of all primary silicon phases
dmax, minimum dmax, average dmax、dmaxDistribution, maximum dmin, minimum dmin, average dmin、dminDistribution, maximum dmean, minimum dmean、
Average dmeanAnd dmeanDistribution), detection content is more rich.
The inventive method can detect the primary silicon phase in transcocrystallized Al-Si alloy material, can automatic data collection, also can be manual
Collection, is not limited by appointed condition, and detection is not limited by material preparation condition, can be foundry goods, heat treatment part, rolled parts, forging
The transcocrystallized Al-Si alloy material of the various solid-state form such as part, extrusion, not only repeatability, and versatility is higher.
The invention provides image acquisition, joining method, by image procossing data process software application in hypereutectic aluminum
In the detection by quantitative of the content of primary silicon phase, pattern, size and distribution in silicon alloy, it is possible to achieve entirely section to be checked primary silicon
The content of phase, pattern, size and distribution detection by quantitative, testing result is more accurate.
Brief description
Fig. 1 stitching image.
Fig. 2 contains primary silicon phase size, pattern, the image of distribution.
After Fig. 3 binary conversion treatment containing primary silicon phase size, pattern, distribution image.
Fig. 4 primary silicon phase area is distributed.
Specific embodiment
By the following examples and combine accompanying drawing the present invention is described in further detail.
Embodiment 1
The detection by quantitative of primary silicon phase is carried out to the b390 alusil alloy as cast condition tensile test bar of nominal chemical composition such as table 1.
The nominal chemical composition (wt.%) of table 1 b390 alusil alloy
| si | fe | cu | mn | mg | ni | zn | sn | al |
| 16.0～18.0 | 0.9 | 4.0～5.0 | 0.50 | 0.50～0.65 | 0.30 | 1.5 | 0.30 | bal. |
, quantitative detecting method is as follows taking the area of primary silicon phase as a example:
(1) all images are gathered: it is taken about being about the b390 alusil alloy sample of 5mm in tensile test bar fracture, to be checked
Section to be checked, away from fracture about 5mm, is polished after inlaying by section successively with 80#, 240#, 800#, 1500#, 4000# water-proof abrasive paper
After polish, with the subsidiary photographic head of optical microscope continuous exhaustive and having overlappingly to whole burnishing surface collection figure in order
Picture, and it is superimposed scale with the subsidiary image processing software of optical microscope.
(2) picture mosaic: with photoshop software or the other softwares with jigsaw puzzle function splice in order successively, process weight
Folded, obtain the stitching image (Fig. 1) in entirely section to be checked.Processing overlapping method is: during picture mosaic, successfully inserts piece image
Afterwards, choose the second width image to be inserted, the opacity of this figure layer is set to 30～80%, movement the second width figure to be inserted
Picture, makes have overlapping partly completely overlapped with piece image, now can form the stitching image of clearly two images, carriage return
Determination is inserted, then the opacity of this figure layer is set to 100%, completes splicing and the coupling of two images, repeat the above steps,
Can achieve splicing and the coupling in section entirely to be checked.
(3) extract whole primary silicon phase in entirely face to be checked: observe under an optical microscope, light is in smooth densification
There is refraction in light tone (for Lycoperdon polymorphum Vitt and black be light tone) in matrix, get along gray in primary silicon phase and Eutectic Silicon in Al-Si Cast Alloys,
And light can occur scattering in black in fault locations such as non-metallic inclusion, shrinkage cavity and porosity and pores.Eutectic silicon is needle-like,
And primary silicon phase is in polygon-shaped, in the newly-built figure layer of photoshop software, select each primary silicon with magic wand menu point
The region of phase, all primary silicon phases in whole cross section is saved in same image, obtains containing primary silicon phase size, shape
Looks, the image (Fig. 2) of distribution；
(4) in image, the analysis of all primary silicon phases collects calculating, specifically comprises the following steps that
A () opens image: open primary silicon phase stitching image (Fig. 2) in ipp software, in figure black region is primary silicon
Phase；
(b) binary conversion treatment: in ipp software, binary conversion treatment is carried out to primary silicon phase stitching image (Fig. 2), obtain two
Primary silicon phase stitching image (Fig. 3) after value process, in figure light tone region is primary silicon phase；
C () parameter selects: select " count/size " in " measure " drop-down menu, enter in the dialog box ejecting
Row is following to be arranged: select measurements:area (area)；
D () measures: click on " count " in " count/size " pop-up dialogue box, each is measured automatically and simultaneously by software
The area of primary silicon phase；
E () result exports: the result output of [e1] each primary silicon phase information: in " count/size " pop-up dialogue box
" file " drop-down menu in select " export data ", system can generate an excel file, include with pixel unit Lai
The area of each the primary silicon phase representing；The output of [e2] all primary silicons phase statistical result: it is right to eject at " count/size "
" statistics " is selected, meeting pop-up dialogue box, containing primary silicon phase in dialog box in " view " drop-down menu in words frame
Number and the statistical information of all primary silicon phases being represented with pixel unit, as the gross area, maximum area, minimum area, put down
All areas etc..
(f) analytical calculation: when [f1] capture is taken pictures, with the subsidiary image processing software superposition scale of optical microscope；Just
Raw silicon phase size is converted into actual size by pixel unit: amplifies stitching image in ipp software, makes the length of scale in image
Occupy more than the 2/3 of computer screen length, surveyors' staff length, obtain the pixel value of scale physical length, obtained by conversion
Physical length represented by each pixel unit, the quantitative Analysis representing and statistical result with pixel unit are converted into actual (tube) length
Degree unit, obtains the total of the area of each primary silicon phase, the area statistics information of primary silicon phase and the image containing primary silicon phase
Area (table 2)；[f2] primary silicon phase content calculates: the primary silicon phase gross area with the ratio of the gross area of whole detection sectional plane is
6.8%, that is, the actual content of primary silicon phase is 6.8%.[f3] primary silicon phase area is distributed: all primary silicon phases is pressed area big
Little sequence, is divided into 8 intervals, counts the number of contained primary silicon phase in each interval, with primary silicon phase contained in each interval
Number account for the ratio of total number and make vertical coordinate, abscissa is made with the area intermediate value that each is interval, with the mapping of origin software, obtains
To the area distribution plot (see Fig. 4) of primary silicon phase, matching area distribution plot obtains the area distributions analytic expression of primary silicon phase:
The area statistics information of table 2 primary silicon phase and the image containing primary silicon phase the gross area (square measure: μm2)
Below only with 78mm2Measuring samples as a example the detection method of the present invention is described, if detected sample in practical application
When product area takes other value, using the present invention detection method equally it is achieved that being considered as protection scope of the present invention.
Above-described embodiment is the present invention preferably embodiment, but embodiments of the present invention are not subject to above-described embodiment
Limit, other any spirit without departing from the present invention and the change made under principle, modification, replacement, combine, simplify,
All should be equivalent substitute mode, be included within protection scope of the present invention.
Claims (10)
1. in a kind of transcocrystallized Al-Si alloy primary silicon phase quantitative detecting method, it is characterized in that, comprise the following steps:
(1) all images are gathered: transcocrystallized Al-Si alloy section to be detected is polished and polishes, then with camera function
Optical microscope in order exhaustive and have overlappingly to whole burnishing surface gather image；
(2) picture mosaic: splice the image of described collection with the software with jigsaw puzzle function in order successively, process overlapping, obtain whole
The stitching image in individual section to be detected；
(3) extract whole primary silicon phase in whole section to be detected: extract have in described stitching image polygon-shaped, be in
The region of Lycoperdon polymorphum Vitt, then the region extracting in whole cross section is saved in same image, that is, obtains containing primary silicon
The image of phase size, pattern and distribution；
(4) in image, the analysis of all primary silicon phases collects calculating: is opened described mutually big containing primary silicon with image processing software
Little, pattern, the image of distribution, count to primary silicon phase；Statistical result is exported in data processing and analysis software
Row quantitative Treatment, obtains the dimension information of each primary silicon phase, the statistical information of all primary silicon phases and whole section to be detected
The gross area.
2. detection method as claimed in claim 1, is characterized in that: in step (1), described transcocrystallized Al-Si alloy is siliceous
Aluminum silicon binary alloy or aluminum silicon multicomponent alloy that amount content is more than 12.6%；Preferably, described transcocrystallized Al-Si alloy to be detected
Section polishes after being polished with 80#, 240#, 800#, 1500#, 4000# sand paper successively.
3. detection method as claimed in claim 1, is characterized in that: in step (2), described there is jigsaw puzzle function software be
Photoshop software or other softwares with jigsaw puzzle function.
4. detection method as claimed in claim 1, is characterized in that: in step (2), the overlapping method of described process is: picture mosaic
When, after successfully inserting piece image, choose the second width image to be inserted, the opacity of this figure layer is set to 30～
80%, movement the second width image to be inserted, make have overlapping partly completely overlapped with piece image, now formed clearly
The stitching image of two images, carriage return determines inserts, then the opacity of this figure layer is set to 100%, completes two images
Splicing and coupling, repeat the above steps, realize the entirely splicing in section to be detected and coupling.
5. detection method as claimed in claim 1, is characterized in that: in step (3), observes under an optical microscope, light exists
It is in light tone that smooth fine and close alusil alloy matrix occurs refraction, gets along gray in primary silicon phase and Eutectic Silicon in Al-Si Cast Alloys, and light is non-
Scattering can be occurred at metallic inclusion, shrinkage cavity and porosity and gas hole defect to be in black；Eutectic silicon is needle-like, and primary silicon phase is in
Polygon-shaped.
6. detection method as claimed in claim 1, is characterized in that: in step (3), is extracted nascent using photoshop software
Silicon phase；Preferably, the region of each primary silicon phase is selected in the newly-built figure layer of photoshop software with magic wand menu point.
7. detection method as claimed in claim 1, is characterized in that: in step (4), it is image- that described image processes software
pro plus；Described data processing and analysis software are excel software.
8. detection method as claimed in claim 7, is characterized in that: in step (4), described primary silicon phase counts and quantitative Treatment
Comprise the following steps: (a) opens image；(b) binary conversion treatment；C () parameter selects；D () measures；E () result exports；Preferably
, in described step (a), ipp software is opened primary silicon phase stitching image；Preferably, in described step (b), soft in ipp
Carry out binary conversion treatment in part；Preferably, in described step (c), " measure " drop-down menu selects " count/
Size ", is arranged: select measurements:area, diameter (max) in the dialog box ejecting as follows
(dmax)、diameter(min)(dmin)、diameter(mean)(dmean), click automatic bright objects；Excellent
Choosing, in described step (d), in " count/size " pop-up dialogue box, click on " count ", software is measured every automatically and simultaneously
The area of individual primary silicon phase, dmax、dminAnd dmean；Preferably, in described step (e), the knot of [e1] each primary silicon phase information
Fruit exports: selects " export data " in " file " drop-down menu in " count/size " pop-up dialogue box, system can be given birth to
Become an excel file, include the area of each primary silicon phase being represented with pixel unit, dmax、dminAnd dmean；[e2] institute
There is the output of primary silicon phase statistical result: select in " view " drop-down menu in " count/size " pop-up dialogue box
" statistics ", can pop-up dialogue box, in dialog box the number containing primary silicon phase and with pixel unit represent all
The statistical information of primary silicon phase.
9. detection method as claimed in claim 8, is characterized in that: in step (4), what primary silicon phase size calculated realizes step
It is:
When () capture is taken pictures a, with the subsidiary image processing software superposition scale of optical microscope；
Before (b) quantitative Analysis and statistical result process, the pixel unit in ipp software is converted into long measure；
C () exports to quantitative Analysis and statistical result in excel file, by the quantitative Analysis being represented with pixel unit and statistics
Result is converted into physical length unit, obtains the actual size of the dimension information of each primary silicon phase；
D () primary silicon phase gross area is primary silicon phase area percentage ratio with the ratio of the gross area of whole detection sectional plane.
10. detection method as claimed in claim 1, is characterized in that: in step (4), the size letter of each primary silicon phase described
Breath includes area, the d of primary silicon phasemax、dminAnd dmean；The statistical information of described all primary silicon phases includes: the gross area, maximum
Area, minimum area, average area, area distributions, equivalent diameter, maximum dmax, minimum dmax, average dmax、dmaxDistribution,
Big dmin, minimum dmin, average dmin、dminDistribution, maximum dmean, minimum dmean, average dmeanAnd dmeanDistribution.
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106446835A (en) * | 2016-09-27 | 2017-02-22 | 山东省科学院新材料研究所 | Method for quantitatively detecting defects in aluminium and aluminium alloy |
| CN108830849A (en) * | 2018-06-28 | 2018-11-16 | 东北大学 | A kind of rotten stage division of mistake/hypoeutectic Al-Si alloy based on image processing techniques |
| CN110533149A (en) * | 2019-07-19 | 2019-12-03 | 麦斯克电子材料有限公司 | A kind of method that silicon chip back side damaging layer counts automatically |
| CN111398307A (en) * | 2020-03-23 | 2020-07-10 | 首钢集团有限公司 | Method and system for detecting slab subcutaneous defects |
| CN112051263A (en) * | 2020-09-15 | 2020-12-08 | 中南钻石有限公司 | Detection method for yield of diamond synthesized by graphite powder core column |
| CN112102268A (en) * | 2020-09-01 | 2020-12-18 | 北京航空航天大学 | Intelligent laser polishing module based on machine learning ultra-thin mask version of polishing |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1341923A (en) * | 2000-06-22 | 2002-03-27 | Tdk株式会社 | Optical recording medium and optical recording method |
| CN1651905A (en) * | 2005-02-05 | 2005-08-10 | 石家庄钢铁股份有限公司 | Quantitative analyzing method for non-metal residue in steel |
| JP2011013071A (en) * | 2009-07-01 | 2011-01-20 | Kurimoto Ltd | Structure evaluation method of ductile cast iron |
| CN102331391A (en) * | 2011-06-16 | 2012-01-25 | 东方电气集团东方锅炉股份有限公司 | Method for measuring and calculating aggregation and coarsening degree of multi-phase grain in refractory steel |
| CN102364323A (en) * | 2011-10-18 | 2012-02-29 | 广东电网公司电力科学研究院 | Display method of tempered martensitic steel carbide colour metallography and electrothermal metallographic chromogenic device special for display method |
| CN102866172A (en) * | 2012-08-31 | 2013-01-09 | 广东电网公司电力科学研究院 | Measuring method of Laves phase content of T/P 92 steel |
| CN103063576A (en) * | 2012-12-14 | 2013-04-24 | 天津钢铁集团有限公司 | Method for quantitatively analyzing inclusions in steel under laser microscope |
-
2016
- 2016-09-27 CN CN201610855043.7A patent/CN106370565A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1341923A (en) * | 2000-06-22 | 2002-03-27 | Tdk株式会社 | Optical recording medium and optical recording method |
| CN1651905A (en) * | 2005-02-05 | 2005-08-10 | 石家庄钢铁股份有限公司 | Quantitative analyzing method for non-metal residue in steel |
| JP2011013071A (en) * | 2009-07-01 | 2011-01-20 | Kurimoto Ltd | Structure evaluation method of ductile cast iron |
| CN102331391A (en) * | 2011-06-16 | 2012-01-25 | 东方电气集团东方锅炉股份有限公司 | Method for measuring and calculating aggregation and coarsening degree of multi-phase grain in refractory steel |
| CN102364323A (en) * | 2011-10-18 | 2012-02-29 | 广东电网公司电力科学研究院 | Display method of tempered martensitic steel carbide colour metallography and electrothermal metallographic chromogenic device special for display method |
| CN102866172A (en) * | 2012-08-31 | 2013-01-09 | 广东电网公司电力科学研究院 | Measuring method of Laves phase content of T/P 92 steel |
| CN103063576A (en) * | 2012-12-14 | 2013-04-24 | 天津钢铁集团有限公司 | Method for quantitatively analyzing inclusions in steel under laser microscope |
Non-Patent Citations (2)
| Title |
|---|
| 易琨 等: "用Photoshop处理金相图片", 《理化检验(物理分册)》 * |
| 沈静雯: "图像处理技术在金相分析中的应用", 《铸造设备与工艺》 * |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106446835A (en) * | 2016-09-27 | 2017-02-22 | 山东省科学院新材料研究所 | Method for quantitatively detecting defects in aluminium and aluminium alloy |
| CN108830849A (en) * | 2018-06-28 | 2018-11-16 | 东北大学 | A kind of rotten stage division of mistake/hypoeutectic Al-Si alloy based on image processing techniques |
| CN108830849B (en) * | 2018-06-28 | 2021-11-16 | 东北大学 | Hypereutectic/hypoeutectic Al-Si alloy modification grading method based on image processing technology |
| CN110533149A (en) * | 2019-07-19 | 2019-12-03 | 麦斯克电子材料有限公司 | A kind of method that silicon chip back side damaging layer counts automatically |
| CN110533149B (en) * | 2019-07-19 | 2021-08-06 | 麦斯克电子材料股份有限公司 | Method for automatically counting damaged layers on back of silicon wafer |
| CN111398307A (en) * | 2020-03-23 | 2020-07-10 | 首钢集团有限公司 | Method and system for detecting slab subcutaneous defects |
| CN112102268A (en) * | 2020-09-01 | 2020-12-18 | 北京航空航天大学 | Intelligent laser polishing module based on machine learning ultra-thin mask version of polishing |
| CN112051263A (en) * | 2020-09-15 | 2020-12-08 | 中南钻石有限公司 | Detection method for yield of diamond synthesized by graphite powder core column |
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