CN106367738A - Preparation method of ZnTiO3 film for photoelectrocatalysis - Google Patents
Preparation method of ZnTiO3 film for photoelectrocatalysis Download PDFInfo
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- CN106367738A CN106367738A CN201610902287.6A CN201610902287A CN106367738A CN 106367738 A CN106367738 A CN 106367738A CN 201610902287 A CN201610902287 A CN 201610902287A CN 106367738 A CN106367738 A CN 106367738A
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- zntio
- thin film
- preparation
- conductive glass
- sol
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/125—Process of deposition of the inorganic material
- C23C18/1254—Sol or sol-gel processing
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/1204—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material inorganic material, e.g. non-oxide and non-metallic such as sulfides, nitrides based compounds
- C23C18/1208—Oxides, e.g. ceramics
- C23C18/1216—Metal oxides
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/125—Process of deposition of the inorganic material
- C23C18/1295—Process of deposition of the inorganic material with after-treatment of the deposited inorganic material
Abstract
To further simplify a preparation method of a ZnTiO3 film, the invention discloses a preparation method of the ZnTiO3 film for photoelectrocatalysis. The preparation method comprises the following steps: firstly, preparing ZnTiO3 precursor sol by using a sol-gel method, then, adopting a dip-coating method to finish film coating on ITO conductive glass, and finally, carrying out late annealing treatment on the ITO conductive glass to obtain the ZnTiO3 film. The ZnTiO3 film is illuminated by light and energy is absorbed, and when the energy hv is equal or greater than the self forbidden bandwidth, electrons on a valence band are motivated and jump to an empty conduction band, and a photoproduction electron hole is left on the valence band to form a photoproduction electron hole pair (e<->-h<+>), and the photoproduction electron hole and the electron motivated by light on the surface of a semiconductor photocatalyst have high oxidizing capacity and reducing capacity.
Description
Technical field
The invention belongs to technical field of material, specially a kind of zntio for photoelectrocatalysiss3The preparation side of thin film
Method.
Background technology
Photoelectrocatalysiss hydrogen production by water decomposition is to prepare one of desirable route of fuel using solar energy, since nearly half a century,
Various countries' scientists unremitting effort, is devoted to developing efficient, stable solar energy electrocatalytic decomposition aqueous systems.Research team exists
While deployment solar energy photocatalytic decomposes wate research, start the research of solar energy electrocatalytic decomposition water, the pass of photoelectrocatalysiss
The design of key section light anode system and preparation aspect are study hotspots.Traditional optoelectronic pole material zno and tio2It is Dan Jin
Belong to ion Binary-phase oxide semiconductor.According to pertinent literature, the semi-conducting material of many metal ions is compared with monometallic ion
Material has more superior photocatalysis performance.Particularly prominent in the photocatalysis performance of titanate many metal semiconductors material among these
Go out, this is because metatitanic acid salt form quasiconductor usually has perovskite structure, and perovskite structure abo3In, b cation is
ti+In catalysis activity in the highest flight, ti in conventional experiment+Photocatalysis performance have been obtained for the height of all circles and recognize
Can.In addition, a ion can produce impact for b ion to a great extent, improves its photoresponse scope.And in this base
On plinth, zn2+Ion as second generation catalysis material comform de- in polyion draw, and existing ti4+Ion population becomes
zntio3Ca-Ti ore type semi-conducting material because have simple preparation technology, excellent optical property and cause the wide of people
General concern.
Existing zntio3The preparation method of thin film needs to simplify further.
Content of the invention
In order to simplify zntio further3The preparation method of thin film, it is an object of the invention to propose one kind urge for photoelectricity
The zntio changing3The preparation method of thin film.
A kind of zntio for photoelectrocatalysiss that the present invention provides3The preparation method of thin film is as follows: coagulates first by colloidal sol
Glue method prepares zntio3Precursor sol, then completes plated film using dipping-pulling method, finally to it on ito electro-conductive glass
The annealing carrying out the later stage obtains zntio3Thin film.
The present invention is given at the specific process parameter on the basis of said method further:
First, prepare zntio3The technological parameter of precursor sol:
Using sol-gal process, under magnetic agitation, configuration zinc concentration is 0.02~0.03mol l-1Dehydrated alcohol molten
Liquid, adds acid on a small quantity and adjusts ph value to 5;It is added dropwise over c thereto16h36o4Ti solution, the mol ratio making ti and zn is 1:1,
Magnetic agitation 2~5h obtains shallow yellow transparent solution;It is hydrolyzed at normal temperatures and pressures formation zntio after 24h3Presoma is molten
Glue.
2nd, prepare zntio3The technological parameter of thin film:
Using dipping-pulling method on ito electro-conductive glass membrane, after completing membrane process by glass be placed in baking oven be dried
Appropriate time.Repeat the above steps carry out second membrane to ito electro-conductive glass, and put into and carry out in fabric resistor stove at heat
Reason, obtains one layer of fine and close zntio on electro-conductive glass3Thin film.
The mechanism of action of the present invention is: when the energy h ν that semiconductor light-catalyst is absorbed by illumination is equal to or more than
During the energy gap of itself, the electrons in valence band are excited on the conduction band transitting to sky, and leave photohole in valence band,
Thus forming photo-generate electron-hole to (e--h+).The photohole on semiconductor light-catalyst surface excited by light and electronics are respectively
There is very strong oxidability and reducing power.
Beneficial effect
1st, with respect to traditional catalysis material such as tio2, zno, zntio3Have narrower energy gap, about
3.06ev, energy needed for its electron transition is less, is more also easy to produce photo-generated carrier.Simultaneously because zntio3Belong to bimetallic ion
The ternary system of oxide, its abundant phase structure gives its more probability changing and improving in terms of photocatalysis.Right
Visible ray respective capabilities are strong, and photoelectrocatalysiss effect is good.
2nd, perovskite structure is titanium typical structure present in nature, and perovskite structure makes it be easy to and other gold
Belong to ion and be doped modified its light-catalysed characteristic extra-high, and zntio3The PhotoelectrocatalytiPerformance Performance of thin film has good application
Prospect.
3rd, a kind of zntio for photoelectrocatalysiss3The preparation method of thin film, the material feedstock of employing is enriched, using process
Pollution-free.
4th, a kind of zntio for photoelectrocatalysiss3The preparation method of thin film, further simplify zntio3The preparation of thin film
Technique, the zntio preparing3Thin film has good PhotoelectrocatalytiPerformance Performance.
Brief description
Fig. 1 is the zntio of gained in embodiment3Thin film and traditional tio2, zno quasiconductor can carry schematic diagram.
Fig. 2 is the zntio of gained in embodiment3The scanning electron microscope image of thin film.
Fig. 3 is the zntio of gained in embodiment3Thin film and traditional tio2, zno quasiconductor is through UV-Vis spectrophotometry luminosity
Measure test result.
Specific embodiment
The following examples can make those skilled in the art be more completely understood by the present invention, but limits never in any form
The present invention.
Embodiment 1
First, prepare zntio using sol-gal process3Precursor sol, by the zn (ch of 0.3g3coo)2·2h2O adds
To in dehydrated alcohol, make 0.027mol l-1Ethanol solution 50ml, wherein add a small amount of hydrochloric acid to 5, adjust ph
It is worth to 5;It is added dropwise over c more thereto16h36o4Ti (mol ratio of ti and zn is 1:1), magnetic agitation 2h obtains light yellow clear
Solution;Shallow yellow transparent solution is hydrolyzed at normal temperatures and pressures formation zntio after 24h3Precursor sol.Using dipping-lifting
Method membrane on ito electro-conductive glass, electro-conductive glass fixation is dipped vertically into zntio with the speed of 1mm/s3In colloidal sol and quiet
Put after 20s takes out and be placed in 60 DEG C of dryings in baking oven.Repeat the above steps carry out to ito electro-conductive glass putting into fibre after second membrane
Carry out heat treatment in dimension resistance furnace to be made annealing treatment with 550 DEG C, obtain zntio3Thin film.
The zntio that the present invention is obtained3Thin film, it can be with schematic diagram as shown in figure 1, can be observed prepared zntio3
Thin film energy gap is less than tio2, zno, can effectively absorb visible ray.The zntio that the present invention is obtained3Thin film, dense uniform, survey
Test result is as shown in Figure 2.The zntio that the present invention is obtained3Thin film, with traditional tio2, zno quasiconductor compare its photon absorbing intensity with
And band-gap energy all increases, test result is as shown in Figure 3.
Embodiment 2
First, prepare zntio using sol-gal process3Precursor sol, using znso4Preparation zinc concentration is 0.02mol
l-1Ethanol solution 50ml, add a small amount of hydrochloric acid, adjust ph value to 5;It is added dropwise over c thereto16h36o4Ti (ti and zn
Mol ratio be 1:1), magnetic agitation 3h obtains shallow yellow transparent solution.It is hydrolyzed at normal temperatures and pressures and is formed after 24h
zntio3Precursor sol.Using dipping-pulling method on ito electro-conductive glass membrane, by electro-conductive glass fixation with the speed of 1mm/s
Degree is dipped vertically into zntio3In colloidal sol, and stand 20s take out after be placed in 60 DEG C of dryings in baking oven.Repeat the above steps are to ito
Electro-conductive glass is put into after carrying out second membrane in fabric resistor stove and is carried out heat treatment and made annealing treatment with 550 DEG C, obtains
zntio3Thin film.
Embodiment 3
First, prepare zntio using sol-gal process3Precursor sol, using zn (ch3coo)2·2h2It is dense that o prepares zinc
Spend for 0.03mol l-1Ethanol solution 50ml, add a small amount of hydrochloric acid, adjust ph value to 5;It is added dropwise over thereto
c16h36o4Ti (mol ratio of ti and zn is 1:1), magnetic agitation 5h obtains shallow yellow transparent solution.By its water at normal temperatures and pressures
Form zntio after solution 24h3Precursor sol.Using dipping-pulling method on ito electro-conductive glass membrane, electro-conductive glass is fixed
Zntio is dipped vertically into the speed of 1mm/s3In colloidal sol, and stand 20s take out after be placed in 60 DEG C of dryings in baking oven.On repeating
State step and ito electro-conductive glass is carried out put into after second membrane and carry out heat treatment in fabric resistor stove and annealed with 550 DEG C
Process, obtain zntio3Thin film.
The above, the only present invention preferably specific embodiment, but protection scope of the present invention is not limited thereto,
Any those familiar with the art the invention discloses technical scope in, the change or replacement that can readily occur in,
All should be included within the scope of the present invention.Therefore, protection scope of the present invention should be with scope of the claims
It is defined.
Claims (5)
1. a kind of zntio for photoelectrocatalysiss3The preparation method of thin film is it is characterised in that prepare first by sol-gal process
zntio3Precursor sol, then completes plated film on ito electro-conductive glass using dipping-pulling method, finally carries out the later stage to it
Annealing obtain zntio3Thin film.
2. a kind of zntio for photoelectrocatalysiss as claimed in claim 13The preparation method of thin film is it is characterised in that prepare
Described zntio3The technological parameter of precursor sol is: adopt sol-gal process, under magnetic agitation, configuration zinc concentration be 0.02~
0.03mol·l-1Ethanol solution, add acid on a small quantity and adjust ph value to 5;It is added dropwise over c thereto16h36o4Ti is molten
Liquid, the mol ratio making ti and zn is 1:1, obtains shallow yellow transparent solution after magnetic agitation 2~5h;By its water at normal temperatures and pressures
Solution 24h forms zntio3Precursor sol.
3. a kind of zntio for photoelectrocatalysiss as claimed in claim 13The preparation method of thin film is it is characterised in that prepare
Described zntio3The technological parameter of thin film is: using dipping-pulling method on ito electro-conductive glass membrane, using dipping-pulling method
Membrane on ito electro-conductive glass, electro-conductive glass fixation is dipped vertically into zntio with the speed of 1mm/s3In colloidal sol, and stand
20s is placed in 60 DEG C of dryings in baking oven after taking out;Repeat the above steps carry out second membrane to ito electro-conductive glass, and put into fibre
Carry out heat treatment in dimension resistance furnace, one layer of fine and close zntio is obtained on electro-conductive glass3Thin film.
4. a kind of zntio for photoelectrocatalysiss as claimed in claim 23The preparation method of thin film is it is characterised in that prepare
Described zntio3Precursor sol adopt for zn (ch3coo)2·2h2O or znso4.
5. a kind of zntio for photoelectrocatalysiss as claimed in claim 33The preparation method of thin film is it is characterised in that described
Carrying out heat treatment in fabric resistor stove is to be annealed under conditions of 550 DEG C.
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3794717A (en) * | 1971-03-26 | 1974-02-26 | Fuji Photo Film Co Ltd | Method of preparing compound oxides of titanium and zinc |
CN101054266A (en) * | 2007-05-30 | 2007-10-17 | 北京科技大学 | Method of preparing photoelectrocatalysis material zinc ferrite film from lead-zinc tailings |
CN101367035A (en) * | 2008-09-24 | 2009-02-18 | 中国科学院广州地球化学研究所 | Preparation method for nano-titanium dioxide film photocatalyst |
-
2016
- 2016-10-17 CN CN201610902287.6A patent/CN106367738A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3794717A (en) * | 1971-03-26 | 1974-02-26 | Fuji Photo Film Co Ltd | Method of preparing compound oxides of titanium and zinc |
CN101054266A (en) * | 2007-05-30 | 2007-10-17 | 北京科技大学 | Method of preparing photoelectrocatalysis material zinc ferrite film from lead-zinc tailings |
CN101367035A (en) * | 2008-09-24 | 2009-02-18 | 中国科学院广州地球化学研究所 | Preparation method for nano-titanium dioxide film photocatalyst |
Non-Patent Citations (1)
Title |
---|
陈亮: ""TiO2和钛酸盐的制备及光催化性能的研究"", 《中国优秀硕士学位论文全文数据库(电子期刊)工程Ⅰ辑》 * |
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Application publication date: 20170201 |