CN106338682A - Driver board testing device - Google Patents
Driver board testing device Download PDFInfo
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- CN106338682A CN106338682A CN201510394646.7A CN201510394646A CN106338682A CN 106338682 A CN106338682 A CN 106338682A CN 201510394646 A CN201510394646 A CN 201510394646A CN 106338682 A CN106338682 A CN 106338682A
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Abstract
The invention discloses a driver board testing device, which comprises a digital signal processor (DSP) chip, and is characterized in that the DSP chip comprises an enhanced pulse width modulation (EPWM) module and an enhanced capture (ECAP) module; the EPWM module is connected with a tested driver board and used for generating and outputting test pulses to the tested driver board so as to enable the tested driver board to output corresponding pulse signals according to the test pulses; the ECAP module is connected with the tested driver board and used for acquiring the dead time of the tested driver board according to the pulse signals outputted by the tested driver board so as to test the tested driver board. The driver board testing device carries out testing on the driver board without through a manual means, and is fast, simple and convenient in test. In addition, the driver board testing device can avoid influences imposed on a test result by artificial factors, improves the test efficiency and the test accuracy, and meets high-standard driver board testing requirements.
Description
Technical field
The present invention relates to the test device in circuit test field, more particularly to driving plate.
Background technology
Driving plate is generally used for driving insulated gate bipolar transistor (insulated gate bipolar
Transistor), igbt), it is widely used in the parts such as inverter.
In practical application, typically require the key property to driving plate before use and test, existing
The test process of driving plate is typically, accesses input pulse in pin pwma and pwmb, lead to
The output signal crossing artificial observation driving plate pin to be contrasted with the default Dead Time of hardware,
Thus realizing the test to driving plate.
This method of testing complexity is loaded down with trivial details, inefficient, and the generation of error can be led to cause test
Precision relatively low it is impossible to meet high-level driving plate test request.
Content of the invention
The present invention provides a kind of test device of driving plate, multiple in order to solve method of testing of the prior art
Miscellaneous loaded down with trivial details, inefficient, measuring accuracy relatively low it is impossible to meet asking of high-level driving plate test request
Topic.
The test device of the driving plate that the present invention provides, comprising: digital signal processor dsp chip,
Described dsp chip includes strengthening pulsewidth modulation epwm module and strengthens capture ecap module；
Described epwm module is connected with tested driving plate, for generation and defeated to described tested driving plate
Go out test pulse, so that described tested driving plate exports corresponding pulse signal according to described test pulse；
Described ecap module is connected with described tested driving plate, for defeated according to described tested driving plate
The described pulse signal going out, obtains the Dead Time of described tested driving plate, with to described tested driving plate
Tested.
The test device of the driving plate that the present invention provides, is produced by the epwm module in dsp chip
And export test pulse to described tested driving plate, make described tested driving plate defeated according to described test pulse
Go out corresponding pulse signal, the described pulse signal that ecap module exports according to described tested driving plate,
Obtain the Dead Time of described tested driving plate, thus the scheme that described tested driving plate is tested,
By artificial means, driving plate need not be tested, test is fast and simple, and it can be avoided that artificial because
The impact to test result for the element, improves testing efficiency and precision, meets high-level driving plate test request.
Brief description
The structural representation of the test device of the driving plate that Fig. 1 provides for the embodiment of the present invention one；
The structural representation of the test device of the driving plate that Fig. 2 provides for the embodiment of the present invention two；
The structural representation of the test device of the driving plate that Fig. 3 provides for the embodiment of the present invention three；
The structural representation of the test device of the driving plate that Fig. 4 provides for the embodiment of the present invention four.
Specific embodiment
Embodiment one
The structural representation of the test device of the driving plate that Fig. 1 provides for the embodiment of the present invention one.As Fig. 1
Shown, the present invention provides a kind of test device of driving plate to include: digital signal processor (digital signal
Processing, dsp) chip 1,
Described dsp chip 1 includes strengthening pulsewidth modulation epwm (enhance width modulator) mould
Block 11 and ecap (enhance capture module) strengthen trapping module 12；
Described epwm module 11 is connected with tested driving plate 2, for generation and to described tested drive
Dynamic plate 2 exports test pulse, so that described tested driving plate 2 is corresponding according to the output of described test pulse
Pulse signal；
Described ecap module 12 is connected with described tested driving plate 2, for according to described tested driving
The described pulse signal of plate 2 output, obtains the Dead Time of described tested driving plate 2, with to described quilt
Survey driving plate 2 to be tested.
Specifically, described epwm module 11 produces the test pulse that the complementary dutycycle of two-way is 50%
It is input to the input pin of tested driving plate 2, for example, pwma and pwmb of tested driving plate 2
Pin, the output pin of tested driving plate 2 by described output of pulse signal to ecap module 12, tested
Driving plate 2 exports corresponding pulse signal according to described test pulse, according to the output of tested driving plate 2
Pulse signal, you can tested driving plate 2 is tested.Specifically, epwm module 11 is to tested
Driving plate 2 inputs two-way test pulse, and accordingly, described tested driving plate 2 exports two pulse signals.
In the present embodiment, produced and to described tested driving plate by the epwm module in dsp chip
Output test pulse, makes described tested driving plate export corresponding pulse signal according to described test pulse,
Ecap module obtains described tested driving plate according to the described pulse signal that described tested driving plate exports
Dead Time, thus the scheme that described tested driving plate is tested, need not be by artificial means to drive
Dynamic plate is tested, and test is fast and simple, and it can be avoided that the impact to test result for the artifact,
Improve testing efficiency and precision, meet high-level driving plate test request.
Preferably, on the basis of shown in Fig. 1, for the suitability of the test device of driving plate, in quilt
Survey before driving plate receives test pulse, can be first at the test pulse to the output of epwm module
Reason, accordingly, described device also includes: the first level conversion unit, described first level conversion unit
Input be connected with described epwm module, the input pin phase of outfan and described tested driving plate
Connect；The pulse signal that described first level conversion unit is used for exporting epwm module enters line level and turns
Change, and export to described tested driving plate.
Specifically, the test pulse of generation is exported to the first level conversion unit by epwm module 11,
The test pulse that first level conversion unit exports to epwm module 11 carries out level conversion, makes level
Test pulse after conversion is mated with the input request signal of tested driving plate, and by the survey after level conversion
Examination pulse exports to tested driving plate.
By arranging the first level conversion unit, the pulse signal of epwm module output can be carried out electricity
Flat turn is changed, and mates with multiple tested driving plates, makes the suitability of the test device of driving plate higher.
Embodiment two
The structural representation of the test device of the driving plate that Fig. 2 provides for the embodiment of the present invention two, this enforcement
Example, on the basis of embodiment one, increased short-circuit fault simulation circuit, short to driving plate fault to realize
The test of line state.As shown in Fig. 2 the present invention provides a kind of test device of driving plate also to include short circuit
Fault simulation circuit 31；Described dsp chip 1 also includes: the first GIO (general
Purpose input output, gpio) the 13, the 2nd gpio module 14 and main control module 15；
A described gpio module 13 is connected with described main control module 15, in described main control module
Under 15 control, to described short-circuit fault simulation circuit 31 output control signal；
The input of described short-circuit fault simulation circuit 31 is connected with a described gpio module 13,
Outfan is connected with described tested driving plate 2, for exported according to a described gpio module 13
Control signal, provides fault simulation signal to described tested driving plate 2；
Output port and the feedback output with described tested driving plate 2 respectively of described 2nd gpio module 14
Port connects, for receiving the feedback signal of described feedback output end mouth output and described tested driving plate 2
Output port output pulse signal；
Described main control module 15, respectively with described 2nd gpio module 14 and described ecap module 12
Connect, feed back the defeated of signal and described tested driving plate 2 for export according to described feedback output end mouth
Exit port output pulse signal, monitoring output under fault simulation signal for the described tested driving plate 2 with
Whether feedback signal is correct, if correctly it indicates that described ecap module 12 is to described tested driving plate 2
Tested.
In actual applications, a gpio module 13 and the 2nd gpio module 14 can be for being arranged on
The different port group of same gpio module on dsp chip or identical port set..
Control process specifically, a gpio module 13 under the control of described main control module 15 to short
Road fault simulation circuit 31 output control signal；Short-circuit fault simulation circuit 31 is according to a described gpio
The control signal of module 13 output, provides fault simulation signal to tested driving plate 2；Tested driving plate 2
The feedback signal that exports feedback output end mouth and the pulse signal transmission that export of output port are to second
Gpio module 14；The feedback output end mouth that main control module 15 receives according to the 2nd gpio module 14 is defeated
The feedback signal going out and the pulse signal of output port output, monitor tested driving plate 2 and believe in fault simulation
Whether the output under number is correct with feedback signal, and when result is correct, instruction ecap module 12 is to tested
Driving plate 2 is tested.The process that ecap module 12 is tested to described tested driving plate 2 is concrete
With reference to embodiment one content, the present embodiment repeats no more.
Certainly, in normal work, the output of tested driving plate 2 output port for pulse signal；When
When breaking down, output is level signal.For example, during normal work, when tested driving plate 2 is defeated
Exit port output for pulse signal, the feedback signal of feedback output end mouth output is high level signal；
When fault, tested driving plate 2 output port exports low level signal, and feedback output end mouth also exports
Low level signal.
In embodiment, by arranging short-circuit fault simulation circuit, in dsp chip, it is provided with a gpio
Module 13, the 2nd gpio module 14 and main control module 15, to realize being driven plate Dead Time
Before test, whether output under short trouble for the driving plate is correctly tested with feedback, improve and drive
The test function of the test device of dynamic plate, and then guarantee is subsequently using driving plate to drive igbt that event occurs
During barrier, the safety of igbt.
Embodiment three
The structural representation of the test device of the driving plate that Fig. 3 provides for the embodiment of the present invention three, this enforcement
Example, on the basis of embodiment two, is further described to the test device of driving plate.As shown in figure 3,
Preferably, short-circuit fault simulation circuit 31 may include that relay group 310 and the 4th level conversion unit
311；
A described gpio module 13 is connected with the input of described 4th level conversion unit 311,
Described relay group 310 includes the first relay 3101 and the second relay 3102；Described 4th level
The outfan of converting unit 311 is defeated with described first relay 3101 and the second relay 3102 respectively
Enter end to be connected；
First outfan 231 of described tested driving plate 2 and the 3rd outfan 221 are respectively with described first
First contact c1 of relay 3101 and the second contact c2 is connected；The second of described tested driving plate 2
Outfan 232 and the 4th outfan 222 respectively with the first contact c3 of described second relay 3102 and
Second contact c4 is connected.
Specifically, a gpio module 13 is under the control of described main control module 15, electric by the 4th
Flat converting unit 311, to relay group 310 output control signal control relay group contact adhesive or
Disconnect, to realize whether the output under driving plate short trouble is correctly tested with feedback.Wherein,
Control signal is used for controlling the first contact c1 of the first relay 3101 and the second contact c2 adhesive or breaks
Open, thus controlling the first outfan 231 of tested driving plate 2 and the 3rd outfan 221 short-circuit or disconnected
Road；Control signal is additionally operable to control the first contact c3 of the second relay 3102 and the second contact c4 adhesive
Or disconnect, thus control the second outfan 232 and the 4th outfan 222 short circuit of tested driving plate 2
Or open circuit.
For example, when a gpio module 13 output high level, the of the first relay 3101
One contact c1 and the second contact c2 adhesive, the first contact c3 of the second relay 3102 and the second contact
C4 adhesive, accordingly, the first outfan 231 of tested driving plate 2 and the 3rd outfan 221 are short-circuit,
Second outfan 232 and the 4th outfan 222 short circuit, to simulate the normal condition of igbt with this.Phase
Anti-, during a gpio module 13 output low level, the first contact c1 of the first relay 3101 and
Second contact c2 disconnects, and the first contact c3 and the second contact c4 of the second relay 3102 disconnect, phase
Answer, the first outfan 231 of tested driving plate 2 and the 3rd outfan 221 disconnect, the second outfan
232 and the 4th outfan 222 disconnect, the malfunction of igbt is simulated with this.
Certainly, the feedback output end mouth that main control module 15 receives always according to the 2nd gpio module 14 is defeated
The feedback signal going out and the pulse signal of output port 22 output, monitoring tested driving plate 2 is in fault simulation
Whether the output under signal is correct with feedback signal.
In embodiment, turned by setting relay group 310 and the 4th level in short-circuit fault simulation circuit
Change unit 311, under the control of described main control module 15, by the 4th level conversion unit 311, to
The contact adhesive of relay group 310 output control signal control relay group or disconnection, by simulating igbt
Normal condition and malfunction, to test output under short trouble for the tested driving plate 2 with feedback is
The no test function correctly tested, improve the test device of driving plate, and then ensure in follow-up use
When driving plate drives igbt to break down, the safety of igbt.Example IV
The structural representation of the test device of the driving plate that Fig. 4 provides for the embodiment of the present invention four, this enforcement
Example, on the basis of above-described embodiment, is further described to the test device of driving plate.As Fig. 4 institute
Show, the test device of driving plate also includes: second electrical level converting unit 41, XOR gate, not gate and the 3rd
Level conversion unit 42；
The input of described 3rd level conversion unit 42 is connected with described tested driving plate 2, and described
The outfan of three level conversion units 42 respectively with the input of described not gate and described XOR gate first
Input is connected, and the outfan of described not gate is connected with the second input of described XOR gate；Described
The outfan of XOR gate is connected with the input of described second electrical level converting unit 41；Described second electrical level
The outfan of converting unit 41 is connected with described ecap module 12.
Specifically, the output of the input of described 3rd level conversion unit 42 and described tested driving plate 2
Port is connected, and described tested driving plate 2 has two groups of output ports, and first group of output port is the 3rd
Output port 221 and the 5th output port 223, second group of output port is the 4th output port 222 He
6th output port 224, corresponding with a drive test examination pulsion phase one group of first group of output port output defeated
Go out pulse signal, the one group output arteries and veins corresponding with another drive test examination pulsion phase of second group of output port output
Rush signal.3rd level conversion unit 42 is used for the arteries and veins of two groups of output pin outputs to tested driving plate 2
Rush signal and carry out level conversion.
First outfan e1 output of described 3rd level conversion unit 42 is after level translation
The pulse signal of first group of output port output, the second outfan of described 3rd level conversion unit 42
E2 output is the pulse signal that second group of output port after level translation exports, described 3rd electricity
The signal of the 3rd outfan e3 output of flat converting unit 42 is identical with the output signal of the first outfan e1,
4th outfan e4 output signal of described 3rd level conversion unit 42 and the output of the second outfan e2
Signal is identical.
More specifically, in the 3rd level conversion unit 42 first outfan e1 and the second outfan e2
Arbitrary outfan is connected with the input of described not gate, the first input of another outfan and described XOR gate
End is connected.The outfan of described not gate is connected with the second input of described XOR gate；Described XOR
The outfan of door is connected with the input of described second electrical level converting unit 41；Described second electrical level conversion
The outfan of unit 41 is connected with described ecap module 12.
Detailed process is, in the case of removing short trouble, will be by by the 3rd level conversion unit 42
Survey the 3rd output port 221 and the 5th output port 223 and the 4th output port 222 of driving plate 2
The pulse being converted into being matched with logic circuit with the two pulse signals of the 6th output port 224 output is believed
Number, and the arbitrary road pulse signal in the two pulse signals after level conversion is negated by not gate,
Another road pulse signal and pulse signal of the inverted are inputed to XOR gate, carries out XOR, obtain
The output pulse of XOR gate.Again the output pulse of XOR gate is transferred to second electrical level converting unit 41 to carry out
Level conversion, and the pulse after level conversion is transferred to ecap module, ecap module is according to reception
To impulsive measurement go out pulse width, obtain the Dead Time of described tested driving plate 2, with to described quilt
Survey driving plate 2 to be tested.
In embodiment, turned by arranging second electrical level converting unit 41, XOR gate, not gate and the 3rd level
Change unit 42, so that the input of the 3rd level conversion unit 42 is connected with described tested driving plate 2,
Outfan is connected with the input of described not gate and the first input end of described XOR gate respectively, described non-
The outfan of door is connected with the second input of described XOR gate；The outfan of described XOR gate with described
The input of second electrical level converting unit 41 is connected；The outfan of described second electrical level converting unit 41
It is connected with described ecap module 12.Logical operationss are carried out to the output pulse signal of tested driving plate 2,
Obtain one group of pulse signal corresponding with Dead Time and be input in ecap module, by ecap mould
The pulse width that block is measured obtains the Dead Time of described tested driving plate 2, with to described tested driving
Plate 2 is tested.
Further, the test device of driving plate can also include: the 5th level conversion unit 51 and the 6th
Level conversion unit 52；The input of described 5th level conversion unit 51 and described 3rd level conversion
3rd outfan e3 of unit 42 and the 4th outfan e4 is connected, described 5th level conversion unit 51
Outfan be connected with described 2nd gpio module 14；
The input of described 6th level conversion unit 52 is exported with the described feedback of described tested driving plate 2
Port is connected, the outfan of described 6th level conversion unit 52 and described 2nd gpio module 14
It is connected.
Wherein, feedback output end mouth includes feedback port 241 and feedback port 242, for exporting and surveying
The examination corresponding one group of feedback level signal of pulsion phase.
Specifically, described feedback port 241 and feedback port 242 pass through the 6th level conversion unit 52,
Level conversion is carried out to feedback level signal, then by the feedback level signal after level conversion, defeated
Enter to the 2nd gpio module 14.3rd outfan e3 of the 3rd level conversion unit 42 and the 4th output
The output signal of the tested driving plate through level conversion is transferred to the 5th level conversion unit 51 by end e4,
5th level conversion unit 51 carries out level conversion again to the signal receiving, and by after level conversion
Signal transmission is to the 2nd gpio module 14.
Certainly, the two-way test pulse that described epwm module 11 produces passes through input port 211 and defeated
Inbound port 212 is input in tested driving plate 2.
In embodiment, by arranging the 5th level conversion unit 51 and the 6th level conversion unit 52, right
Feedback level signal, the 3rd outfan e3 of the 3rd level conversion unit 42 and the 4th outfan e4 defeated
Go out signal and carry out level conversion, make main control module preferably monitor described tested driving plate 2 in fault simulation
Whether the output under signal is correct with feedback signal, improves the test function of the test device of driving plate, enters
And ensure when subsequently driving igbt to break down using driving plate, the safety of igbt.Preferably, exist
On the basis of above-described embodiment, the test device of described driving plate can also include:
First display unit, is connected with described dsp chip, for exporting the dead band of described tested driving plate
Time；
Described main control module, is connected with described first display unit, is additionally operable in described tested driving plate
When Dead Time is in default time range, control described first display unit to export described tested drive
The normal test result of dynamic plate.
The output of test result in practical application, can be realized by numerous embodiments, for example, described
The normal test result of tested driving plate can light or send acoustical signal by LED lamp or other refer to
Show signal output, for concrete example, the first display unit can be a LED lamp, when described tested drive
When the Dead Time of dynamic plate is in default time range, master control module controls LED lamp lights, to represent
Tested driving plate test result is normal, and the present embodiment here does not limit.
By arranging the first display unit, the test result of the test device of driving plate can be made to be shown in
In one display unit, it is more easy to observe, convenient use.
More preferred, on the basis of above-described embodiment, the test device of described driving plate can also be wrapped
Include: the second display unit, described second display unit is connected with described dsp chip, for indicating
Whether the output stating tested driving plate is correct with feedback.
The output of test result in practical application, can be realized by numerous embodiments, for example, described
Whether the output of tested driving plate correctly can be lighted by LED lamp with feedback or extinguish or other instructions
Signal output, for concrete example, the second display unit can be a LED lamp, when tested driving plate
When output is normal with feedback, LED lamp lights；When the output of tested driving plate is abnormal with feedback, led
Lamp extinguishes, and the present embodiment here does not limit.
By arranging the second display unit, can intuitively judge whether are the output of tested driving plate and feedback
Correctly, it is easy to use.
It should be noted that above two embodiment both can individually have been implemented to implement it is also possible to combine,
The present embodiment here is not limited.
Last it is noted that above example is only in order to illustrating technical scheme, rather than to it
Limit；Although being described in detail to the present invention with reference to the foregoing embodiments, the ordinary skill of this area
Personnel it is understood that it still can be modified to the technical scheme described in foregoing embodiments, or
Person carries out equivalent to wherein some technical characteristics；And these modifications or replacement, do not make corresponding skill
The essence of art scheme departs from the spirit and scope of various embodiments of the present invention technical scheme.
Claims (8)
1. a kind of test device of driving plate is it is characterised in that include: digital signal processor dsp
Chip,
Described dsp chip includes strengthening pulsewidth modulation epwm module and strengthens capture ecap module；
Described epwm module is connected with tested driving plate, for generation and defeated to described tested driving plate
Go out test pulse, so that described tested driving plate exports corresponding pulse signal according to described test pulse；
Described ecap module is connected with described tested driving plate, for defeated according to described tested driving plate
The described pulse signal going out, obtains described tested；The Dead Time of driving plate, with to described tested driving plate
Tested.
2. driving plate according to claim 1 test device it is characterised in that described device also
Including short-circuit fault simulation circuit；Described dsp chip also includes:
First universal input output gpio module, the 2nd gpio module and main control module；
Described first universal input output gpio module is connected with described main control module, in described master
Under the control of control module, to described short-circuit fault simulation circuit output control signal；
The input of described short-circuit fault simulation circuit is connected with a described gpio module, outfan
It is connected with described tested driving plate, for the control signal according to a described gpio module output,
There is provided fault simulation signal to described tested driving plate；
Described 2nd gpio module output port and the feedback output end mouth with described tested driving plate respectively
Connect, for receiving the feedback signal of described feedback output end mouth output and the output of described tested driving plate
The pulse signal of port output；
Described main control module, is connected with described 2nd gpio module and described ecap module respectively, uses
Output port output in the feedback signal being exported according to described feedback output end mouth and described tested driving plate
Pulse signal, with feedback signal whether monitoring output under fault simulation signal for the described tested driving plate
Correctly, if correctly it indicates that described ecap module is tested to described tested driving plate.
3. driving plate according to claim 1 test device it is characterised in that described device also
Including:
First level conversion unit, the input of described first level conversion unit and described epwm module
It is connected, outfan is connected with the input pin of described tested driving plate；Described first level conversion list
Unit is for carrying out level conversion by the pulse signal of epwm module output, and exports to described tested driving
Plate.
4. driving plate according to claim 2 test device it is characterised in that described device also
Including:
Second electrical level converting unit, XOR gate, not gate and the 3rd level conversion unit；
The input of described 3rd level conversion unit is connected with described tested driving plate, described 3rd electricity
The outfan of flat converting unit respectively with the input of described not gate and the 3rd outfan phase of described XOR gate
Connect, the outfan of described not gate is connected with the 4th outfan of described XOR gate；Described XOR gate
Outfan is connected with the input of described second electrical level converting unit；Described second electrical level converting unit
Outfan is connected with described ecap module.
5. the test device of driving plate according to claim 2 is it is characterised in that described short circuit is former
Barrier analog circuit includes:
Relay group and the 4th level conversion unit；
A described gpio module is connected with the input of described 4th level conversion unit, described continues
Electrical equipment group includes the first relay and the second relay；The outfan of described 4th level conversion unit is respectively
It is connected with the input of described first relay and the second relay；
First outfan of described tested driving plate and the 3rd outfan respectively with described first relay
One contact is connected with the second contact；Second outfan of described tested driving plate and the 4th outfan are respectively
It is connected with the first contact of described second relay and the second contact.
6. driving plate according to claim 4 test device it is characterised in that described device also
Including:
5th level conversion unit and the 6th level conversion unit；The input of described 5th level conversion unit
End is connected with the 3rd outfan of described 3rd level conversion unit and the 4th outfan, described 5th electricity
The outfan of flat converting unit is connected with described 2nd gpio module；
The input of described 6th level conversion unit and the described feedback output end mouth of described tested driving plate
It is connected, the outfan of described 6th level conversion unit is connected with described 2nd gpio module.
7. the driving plate according to any one of claim 2-6 test device it is characterised in that
Described device also includes:
First display unit is connected with described dsp chip, for exporting the dead band of described tested driving plate
Time；
Described main control module, is connected with described first display unit, is additionally operable in described tested driving plate
When Dead Time is in default time range, described first display unit is controlled to export described tested driving
The normal test result of plate.
8. the driving plate according to any one of claim 1-6 test device it is characterised in that
Described device also includes:
Second display unit, described second display unit is connected with described dsp chip, for indicating
Whether the output stating tested driving plate is correct with feedback.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN110837035A (en) * | 2018-08-15 | 2020-02-25 | 珠海恒途电子有限公司 | Software and hardware testing system and method for air conditioning system |
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| CN102879726A (en) * | 2012-10-29 | 2013-01-16 | 湖南南车时代电动汽车股份有限公司 | Insulated gate bipolar translator (IGBT) module performance detection device and method |
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| CN203069746U (en) * | 2012-12-31 | 2013-07-17 | 浙江海得新能源有限公司 | IGBT driving board test tooling plate |
| CN103516294A (en) * | 2013-10-12 | 2014-01-15 | 索肯和平(上海)电气有限公司 | Driver dead time detecting system and method |
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| CN110837035A (en) * | 2018-08-15 | 2020-02-25 | 珠海恒途电子有限公司 | Software and hardware testing system and method for air conditioning system |
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