CN106326609A - Method and system for obtaining failure rate of hybrid integrated circuit - Google Patents
Method and system for obtaining failure rate of hybrid integrated circuit Download PDFInfo
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- CN106326609A CN106326609A CN201610975248.9A CN201610975248A CN106326609A CN 106326609 A CN106326609 A CN 106326609A CN 201610975248 A CN201610975248 A CN 201610975248A CN 106326609 A CN106326609 A CN 106326609A
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- integrated circuit
- activation energy
- hydrid integrated
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/39—Circuit design at the physical level
Abstract
The invention provides a method and system for obtaining the failure rate of a hybrid integrated circuit. The method includes analyzing the types and the number of components of the hybrid integrated circuit, obtaining the activation energy value and the failure percentage corresponding to each component, and taking the failure percentage as the weight coefficient to carry out the weighting calculation, accessing to activation energy of the hybrid integrated circuit, and calculating the failure rate of the hybrid integrated circuit. The whole process does not need the complicated implementation process, the weighting calculation is carried out based on the failure percentage to obtain the activation energy of the hybrid integrated circuit, and finally the failure rate of the hybrid integrated circuit can be calculated accurately.
Description
Technical field
The present invention relates to component reliability detection technique field, particularly relate to hydrid integrated circuit crash rate acquisition side
Method and system.
Background technology
Hydrid integrated circuit (Hybrid Integrated Circuit, HIC) is by quasiconductor integrated technique and thin (thick)
The integrated circuit that membrane process combines and makes.Hydrid integrated circuit is to make thick film or thin-film component with film build method on substrate
And interconnection line, and by discrete semiconductor chip, monolithic integrated optical circuit or microelement Hybrid assembling on same substrate, then
Additional encapsulation forms.Compared with discrete device, hydrid integrated circuit has that packing density is big, reliability is high, circuit performance is good
Feature.Compared with monolithic integrated optical circuit, its flexible design, technique is convenient, it is simple to Multi-varieties and Small-batch Production, and component parameters
Wide ranges, precision are high, good stability, can bear high voltage and relatively high power.
Owing to hydrid integrated circuit inside modules comprises a series of components and parts, therefore product can only be in the temperature of regulation
Work under scope (-55 DEG C≤shell temperature≤125 DEG C) and specified loading condition.Any temperature beyond prescribed limit and electric current should
Power all may cause the forfeiture of circuit function.
General, electronic devices and components activation energy extract the acceleration service life test method frequently with three different temperature points,
By the life time data under three different temperature points.But hydrid integrated circuit is owing to, in structure, it normally works
Time shell temperature be necessarily less than 125 DEG C, when shell temperature is more than 125 DEG C, internal protection circuit will start, and disconnects output.Therefore,
When the acceleration service life test method using three temperature spots carries out activation energy parameter extraction when, due to accelerated life test
Shell temperature relatively low (the highest shell temperature not can exceed that 125 DEG C), under three different temperature spots, will obtain a number of inefficacy sample,
Carrying out the extraction of circuit module activation energy, need the test period grown very much, this makes this kind of test method be difficult in engineering should
With, can i.e. be difficult to accurately obtain the crash rate data of hydrid integrated circuit accurately to obtain the activation energy of hydrid integrated circuit.
Summary of the invention
Based on this, it is necessary to realize complexity for generally mixing with ic failure rate acquisition methods, and obtain result not
Problem accurately, it is provided that one realizes simple and result of calculation hydrid integrated circuit crash rate acquisition methods and system accurately.
A kind of hydrid integrated circuit crash rate acquisition methods, including step:
Analyze components and parts kind and all kinds of component number that hydrid integrated circuit includes；
Obtain activation energy value corresponding to all kinds of components and parts and percentage of failures；
Using percentage of failures as weight coefficient, according to components and parts kind, all kinds of component number and all kinds of components and parts
Corresponding activation energy value is weighted with percentage of failures, obtains the activation energy of hydrid integrated circuit；
According to the activation energy of hydrid integrated circuit, calculate hydrid integrated circuit crash rate.
A kind of hydrid integrated circuit crash rate obtains system, including:
Analyze module, for analyzing components and parts kind and all kinds of component number that hydrid integrated circuit includes；
Acquisition module, for obtaining activation energy value corresponding to all kinds of components and parts and percentage of failures；
Weighted calculation module, for using percentage of failures as weight coefficient, according to components and parts kind, all kinds of components and parts number
Amount and activation energy value corresponding to all kinds of components and parts are weighted with percentage of failures, the activation of acquisition hydrid integrated circuit
Energy；
Crash rate computing module, for the activation energy according to hydrid integrated circuit, calculates hydrid integrated circuit crash rate.
Hydrid integrated circuit crash rate acquisition methods of the present invention and system, analyze the components and parts kind that hydrid integrated circuit includes
Class and all kinds of component number, obtain activation energy value corresponding to all kinds of components and parts and percentage of failures, makees with percentage of failures
For weight coefficient, it is weighted, obtains the activation energy of hydrid integrated circuit, calculate hydrid integrated circuit crash rate.Whole
Process need not complicated implementation process, is weighted based on percentage of failures, obtains the activation energy of hydrid integrated circuit,
The most accurately calculate hydrid integrated circuit crash rate.
Accompanying drawing explanation
Fig. 1 is the schematic flow sheet of hydrid integrated circuit first embodiment of crash rate acquisition methods of the present invention；
Fig. 2 is the schematic flow sheet of hydrid integrated circuit second embodiment of crash rate acquisition methods of the present invention；
Fig. 3 is the structural representation that hydrid integrated circuit crash rate of the present invention obtains first embodiment of system；
Fig. 4 is the structural representation that hydrid integrated circuit crash rate of the present invention obtains second embodiment of system.
Detailed description of the invention
As it is shown in figure 1, a kind of hydrid integrated circuit crash rate acquisition methods, including step:
S100: analyze components and parts kind and all kinds of component number that hydrid integrated circuit includes.
Being integrated with substantial amounts of components and parts, different types of components and parts in hydrid integrated circuit, its activation energy is the most different, because of
This, for characterizing the reliability of whole power module, it is necessary to consider various components and parts used in circuit module, carry out hybrid integrated
The calculating of circuit module entirety activation energy.We can analyze its unit included by basic introduction based on hydrid integrated circuit
The component number that part category and each components and parts kind include.Here components and parts kind is based on circuit components row
The kind that industry specification divides, such as resistance, inductance, electric capacity etc..As a example by certain hydrid integrated circuit, its include 3 transformators,
30 resistance, 4 inductance, 18 electric capacity, 2 manostat, 4 diodes, 2 rectifier tubes, 1 audion and 1 optocoupler
Deng.
S200: obtain activation energy value corresponding to all kinds of components and parts and percentage of failures.
In general, its key property attribute of components and parts of the total single kind of hydrid integrated circuit is known, Wo Menke
To obtain based on historical empirical data, the activation energy value of such as certain resistance and percentage of failures.For unknown or
The not components and parts of history of existence empirical data, we can use existing conventional techniques means to go it and detect and test
Obtain the key property attributes such as its activation energy value and percentage of failures.It is noted that components and parts activation energy at different temperatures
Value there may be different from percentage of failures value, therefore, the hydrid integrated circuit crash rate finally calculated also be with
Its shell temperature is correlated with, and the ic failure rate i.e. calculated is this integrated circuit lower crash rate at a temperature of certain.
S300: using percentage of failures as weight coefficient, according to components and parts kind, all kinds of component number and all kinds of unit
The activation energy value that device is corresponding is weighted with percentage of failures, obtains the activation energy of hydrid integrated circuit.
All kinds of component failure percentage ratios based on the acquisition of step S200, as weight coefficient, are weighted.Consider
In hydrid integrated circuit, the inefficacy of components and parts typically will not uniformly occur, and needs to arrange in the computational methods of overall activation energy
One weight, to revise the calculating data of overall activation energy.In order to carry out hydrid integrated circuit module entirety activation energy value of calculation
Correction, need from the failure analysis of hydrid integrated circuit, by the conclusion to hydrid integrated circuit failure analysis report
Arrange, draw the percent of dissimilar component failure, with this percent as weight, utilize the activation energy of each components and parts,
And then obtain the activation energy of hydrid integrated circuit.Specifically, computing formula is:
In formula, EaActivation energy, q for hydrid integrated circuit1For first kind component failure percent, n1For first kind unit
Number of devices, Ea1For first kind components and parts activation energy, q2For Equations of The Second Kind component failure percent, n2For Equations of The Second Kind components and parts number
Amount, Ea2For Equations of The Second Kind components and parts activation energy, qkFor kth class component failure percent, nkFor kth class component number, EakFor
Kth class components and parts activation energy.
S400: according to the activation energy of hydrid integrated circuit, calculates hydrid integrated circuit crash rate.
Activation energy based on the hydrid integrated circuit that step S300 has calculated that, carries out hydrid integrated circuit crash rate and obtains
Take.Whole calculating process and mode can use known way to carry out.For further, Arrhenius side can be first passed through
Journey calculates the accelerator coefficient of hydrid integrated circuit, further according to accelerator coefficient, calculates hydrid integrated circuit crash rate.
Arrhenius equation Arrhenius equation (or formula) is between the speed constant of chemical reaction and temperature
Relational expression, it is adaptable to elementary reaction and nonelementary reaction, even some inhomogeneous reaction.Refer specifically to chemically in kinetics for
The equation of relation between reaction activity, temperature, reaction rate constant is described.Its concrete formula is:
In formula, k is rate constant during temperature T；A is pre-exponential factor, also referred to as Arrhenius constant, unit with
K is identical；E is activation energy, kJ/mol；T is absolute temperature, K；R is gas constant, kJ/mol K；E is the end of natural logrithm.
Hydrid integrated circuit crash rate acquisition methods of the present invention, analyze the components and parts kind that includes of hydrid integrated circuit and
All kinds of component numbers, obtain activation energy value corresponding to all kinds of components and parts and percentage of failures, using percentage of failures as weight
Coefficient, is weighted, and obtains the activation energy of hydrid integrated circuit, calculates hydrid integrated circuit crash rate.Whole process is not
Need complicated implementation process, be weighted based on percentage of failures, obtain the activation energy of hydrid integrated circuit, the most accurately
Calculate hydrid integrated circuit crash rate.
As in figure 2 it is shown, wherein in an embodiment, step S400 includes:
S420: according to the activation energy of hydrid integrated circuit, calculate the accelerator coefficient of hydrid integrated circuit.
Step S300 weighted calculation obtains the activation energy of current (Current Temperatures, i.e. operating temperature), then based on this activation energy
Calculate the accelerator coefficient of hydrid integrated circuit.Non-essential, when needing to obtain the acceleration of hydrid integrated circuit under different temperatures
During coefficient, under the conditions of different operating can being obtained based on above-mentioned steps S200 to step S420, different shell temperature hybrid integrated electricity
The accelerator coefficient on road.More particularly, the accelerator coefficient of hydrid integrated circuit can be calculated by Arrhenius equation.
S440: according to accelerator coefficient, calculates hydrid integrated circuit crash rate.
After accelerator coefficient calculates, utilize experiment of high-temperature load data, can quickly obtain different operating condition
Under crash rate data.
In order to further explain the technical scheme of hydrid integrated circuit crash rate acquisition methods of the present invention and the effect brought
Really, below concrete for employing one application example is explained.
If including k kind components and parts in hydrid integrated circuit module, wherein the number of components and parts 1 is n1, its activation energy
Value is Ea1, the quantity in this circuit module is n1；The number of components and parts 2 is n2, the value of its activation energy is Ea2, at this circuit
Quantity in module is n2Only；By that analogy, the number of components and parts k is nk, its activation energy is Eak, number in this circuit module
Amount is nkOnly.
Typically will not uniformly occur in view of the inefficacy of components and parts in hydrid integrated circuit, need the meter in overall activation energy
Calculation method arranges a weight, to revise the calculating data of overall activation energy.Overall in order to carry out hydrid integrated circuit module
The correction of activation energy value of calculation, needs the failure analysis from hydrid integrated circuit, divides by losing efficacy hydrid integrated circuit
The induction-arrangement of analysis report, draws the percent of dissimilar component failure, with this percent as weight, utilizes each yuan of device
The activation energy of part, and then obtain the overall activation energy of power module, formulation is as follows:
In formula: EaThe activation energy of circuit module, eV；
n1The number of components and parts 1；
Ea1The activation energy of components and parts 1, eV；
q1The inefficacy percent (weight) of components and parts 1；
n2The number of components and parts 2；
Ea2The activation energy of components and parts 2, eV；
q2The inefficacy percent (weight) of components and parts 2；
nkThe number of components and parts k；
EakThe activation energy of components and parts k, eV.
qkThe inefficacy percent (weight) of components and parts k.
As can be seen from the above equation, for easily there are the components and parts lost efficacy, the components and parts that i.e. crash rate is high, activation energy calculates
Time corresponding weight also big, the inefficacy of the dissimilar components and parts that the weight factor of each activation energy obtains from failure analysis report
Percent.
The calculated examples of hydrid integrated circuit module activation energy
Assume that the component number of this hydrid integrated circuit inside modules and the activation energy data of correspondence are shown in Table 1,
According to institute's column data in table 1, utilize the formula of above-mentioned activation energy weighted calculation, the hydrid integrated circuit module calculated comprehensive
Activation energy is 0.656eV.
Component number in table 1 hydrid integrated circuit module and the activation energy data of correspondence
The quick calculating of crash rate under the conditions of utilizing activation energy to be operated
After the value of activation energy is calculated, it is possible to go to work according to Arrhenius (Arrhenius) Equation for Calculating
Accelerator coefficient under the conditions of work, thus the crash rate number under working condition can be quickly extrapolated from the crash rate hot environment
According to.Assume that the crash rate data under the conditions of this hydrid integrated circuit shell temperature 125 DEG C are 42.5 × 10-6/ h, under working condition
Shell temperature is 35 DEG C.If the value of activation energy takes 0.656eV, the acceleration gone out according to Arrhenius (Arrhenius) Equation for Calculating
Coefficient is 267, and then the crash rate data under working condition are 42.5 × 10-6/ 267=0.159 × 10-6/h.
As it is shown on figure 3, a kind of hydrid integrated circuit crash rate obtains system, including:
Analyze module 100, for analyzing components and parts kind and all kinds of component number that hydrid integrated circuit includes.
Acquisition module 200, for obtaining activation energy value corresponding to all kinds of components and parts and percentage of failures.
Weighted calculation module 300, for using percentage of failures as weight coefficient, according to components and parts kind, all kinds of units device
Number of packages amount and activation energy value corresponding to all kinds of components and parts are weighted with percentage of failures, obtain hydrid integrated circuit
Activation energy.
Crash rate computing module 400, for the activation energy according to hydrid integrated circuit, calculates hydrid integrated circuit and lost efficacy
Rate.
Hydrid integrated circuit crash rate of the present invention obtains system, analyzes module 100 and analyzes the unit that hydrid integrated circuit includes
Part category and all kinds of component number, acquisition module 200 obtains activation energy value corresponding to all kinds of components and parts and inefficacy percentage
Ratio, weighted calculation module 300, using percentage of failures as weight coefficient, is weighted, and obtains swashing of hydrid integrated circuit
Energy alive, crash rate computing module 400 calculates hydrid integrated circuit crash rate.Whole process need not complicated implementation process, based on
Percentage of failures is weighted, and obtains the activation energy of hydrid integrated circuit, and the final hydrid integrated circuit that accurately calculates lost efficacy
Rate
As shown in Figure 4, wherein in an embodiment, crash rate computing module 400 includes:
Accelerator coefficient computing unit 420, for the activation energy according to hydrid integrated circuit, calculates adding of hydrid integrated circuit
Speed coefficient.
Crash rate computing unit 440, for according to accelerator coefficient, calculates hydrid integrated circuit crash rate.
Wherein in an embodiment, accelerator coefficient computing unit 420 is specifically for the activation according to hydrid integrated circuit
Can, the accelerator coefficient of hydrid integrated circuit is calculated by Arrhenius equation.
In one of them embodiment, acquisition module 200 includes:
Historical analysis acquiring unit, is used for obtaining all kinds of component failure analysis results in historical record.
Interpretation of result acquiring unit, for according to component failure analysis results all kinds of in historical record, obtains all kinds of unit
Activation energy value that device is corresponding and percentage of failures.
Wherein in an embodiment, weighted calculation module 300 is using percentage of failures as weight coefficient, according to components and parts
The activation energy value that kind, all kinds of component number and all kinds of components and parts are corresponding is weighted with percentage of failures, obtains
The computing formula of the activation energy of hydrid integrated circuit particularly as follows:
In formula, EaActivation energy, q for hydrid integrated circuit1For first kind component failure percent, n1For first kind unit
Number of devices, Ea1For first kind components and parts activation energy, q2For Equations of The Second Kind component failure percent, n2For Equations of The Second Kind components and parts number
Amount, Ea2 is Equations of The Second Kind components and parts activation energy, qkFor kth class component failure percent, nkFor kth class component number, EakFor
Kth class components and parts activation energy.
Specifically, hydrid integrated circuit crash rate acquisition methods of the present invention and system, it is applied to actual production life tool
There is following significantly effect.
(1) hydrid integrated circuit crash rate acquisition methods of the present invention and system solve hydrid integrated circuit module synthesis and swash
The difficult problem that can calculate alive, such that it is able to according to the survey calculation accelerator coefficient of different operating condition lower casing temperature.When accelerator coefficient meter
After calculating, utilize experiment of high-temperature load data, can quickly obtain the crash rate data under the conditions of different operating.
(2), during hydrid integrated circuit is widely used in machine system, by the quick calculating of crash rate under working condition, have
It is beneficial to machine system and carries out reliability design.
(3) hydrid integrated circuit crash rate acquisition methods of the present invention can promote the fast of hydrid integrated circuit new product with system
Speed is released.The components and parts (such as integrated circuit, capacitor, field-effect transistor etc.) new when part are applied to hydrid integrated circuit
Time in module, owing to these new components and parts lack activation energy data, can be by the way of giving a reasonable value, weighting meter
Calculate the comprehensive activation energy data of hydrid integrated circuit module, thus the reliability of new product is carried out Fast Evaluation, accelerate mixed
Close the Time To Market of integrated circuit new product.
Embodiment described above only have expressed the several embodiments of the present invention, and it describes more concrete and detailed, but also
Can not therefore be construed as limiting the scope of the patent.It should be pointed out that, come for those of ordinary skill in the art
Saying, without departing from the inventive concept of the premise, it is also possible to make some deformation and improvement, these broadly fall into the protection of the present invention
Scope.Therefore, the protection domain of patent of the present invention should be as the criterion with claims.
Claims (10)
1. a hydrid integrated circuit crash rate acquisition methods, it is characterised in that include step:
Analyze components and parts kind and all kinds of component number that hydrid integrated circuit includes；
Obtain activation energy value corresponding to all kinds of components and parts and percentage of failures；
Using described percentage of failures as weight coefficient, according to described components and parts kind, all kinds of component number and described respectively
The activation energy value that class components and parts are corresponding is weighted with percentage of failures, obtains the activation energy of described hydrid integrated circuit；
According to the activation energy of described hydrid integrated circuit, calculate described hydrid integrated circuit crash rate.
Hydrid integrated circuit crash rate acquisition methods the most according to claim 1, it is characterised in that described according to described mixed
Closing the activation energy of integrated circuit, the step calculating described hydrid integrated circuit crash rate includes:
According to the activation energy of described hydrid integrated circuit, calculate the accelerator coefficient of described hydrid integrated circuit；
According to described accelerator coefficient, calculate described hydrid integrated circuit crash rate.
Hydrid integrated circuit crash rate acquisition methods the most according to claim 2, it is characterised in that described according to described mixed
Closing the activation energy of integrated circuit, the step of the accelerator coefficient calculating described hydrid integrated circuit includes:
According to the activation energy of described hydrid integrated circuit, calculated the acceleration of described hydrid integrated circuit by Arrhenius equation
Coefficient.
Hydrid integrated circuit crash rate acquisition methods the most according to claim 1, it is characterised in that all kinds of unit of described acquisition
Activation energy value corresponding to device includes with the step of percentage of failures:
Obtain all kinds of component failure analysis results in historical record；
According to component failure analysis results all kinds of in described historical record, obtain activation energy value corresponding to all kinds of components and parts and mistake
Effect percentage ratio.
Hydrid integrated circuit crash rate acquisition methods the most according to claim 1, it is characterised in that described with described inefficacy
Percentage ratio is as weight coefficient, corresponding according to described components and parts kind, all kinds of component number and described all kinds of components and parts
Activation energy value is weighted with percentage of failures, and the computing formula of the activation energy obtaining described hydrid integrated circuit is concrete
For:
In formula, EaActivation energy, q for described hydrid integrated circuit1For first kind component failure percent, n1For described first
Class component number, Ea1For described first kind components and parts activation energy, q2For Equations of The Second Kind component failure percent, n2For described
Two class component numbers, Ea2For described Equations of The Second Kind components and parts activation energy, qkFor kth class component failure percent, nkFor described
Kth class component number, EakFor described kth class components and parts activation energy.
6. a hydrid integrated circuit crash rate obtains system, it is characterised in that including:
Analyze module, for analyzing components and parts kind and all kinds of component number that hydrid integrated circuit includes；
Acquisition module, for obtaining activation energy value corresponding to all kinds of components and parts and percentage of failures；
Weighted calculation module, for using described percentage of failures as weight coefficient, according to described components and parts kind, all kinds of units device
Number of packages amount and activation energy value corresponding to described all kinds of components and parts are weighted with percentage of failures, obtain described mixing collection
Become the activation energy of circuit；
Crash rate computing module, for the activation energy according to described hydrid integrated circuit, calculates described hydrid integrated circuit and lost efficacy
Rate.
Hydrid integrated circuit crash rate the most according to claim 6 obtains system, it is characterised in that described crash rate calculates
Module includes:
Accelerator coefficient computing unit, for the activation energy according to described hydrid integrated circuit, calculates described hydrid integrated circuit
Accelerator coefficient；
Crash rate computing unit, for according to described accelerator coefficient, calculates described hydrid integrated circuit crash rate.
Hydrid integrated circuit crash rate the most according to claim 7 obtains system, it is characterised in that described accelerator coefficient meter
Calculation unit, specifically for the activation energy according to described hydrid integrated circuit, calculates described hybrid integrated by Arrhenius equation
The accelerator coefficient of circuit.
Hydrid integrated circuit crash rate the most according to claim 6 obtains system, it is characterised in that described acquisition module bag
Include:
Historical analysis acquiring unit, is used for obtaining all kinds of component failure analysis results in historical record；
Interpretation of result acquiring unit, for according to component failure analysis results all kinds of in described historical record, obtains all kinds of unit
Activation energy value that device is corresponding and percentage of failures.
Hydrid integrated circuit crash rate the most according to claim 6 obtains system, it is characterised in that described weighted calculation
Module using described percentage of failures as weight coefficient, according to described components and parts kind, all kinds of component number and described respectively
The activation energy value that class components and parts are corresponding is weighted with percentage of failures, obtains the activation energy of described hydrid integrated circuit
Computing formula particularly as follows:
In formula, EaActivation energy, q for described hydrid integrated circuit1For first kind component failure percent, n1For described first
Class component number, Ea1For described first kind components and parts activation energy, q2For Equations of The Second Kind component failure percent, n2For described
Two class component numbers, Ea2For described Equations of The Second Kind components and parts activation energy, qkFor kth class component failure percent, nkFor described
Kth class component number, EakFor described kth class components and parts activation energy.
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