CN106291307A - The method that microwave oven is tested with diodes age - Google Patents
The method that microwave oven is tested with diodes age Download PDFInfo
- Publication number
- CN106291307A CN106291307A CN201610686891.XA CN201610686891A CN106291307A CN 106291307 A CN106291307 A CN 106291307A CN 201610686891 A CN201610686891 A CN 201610686891A CN 106291307 A CN106291307 A CN 106291307A
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- CN
- China
- Prior art keywords
- water
- test
- microwave oven
- stove
- container
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F24—HEATING; RANGES; VENTILATING
- F24C—DOMESTIC STOVES OR RANGES ; DETAILS OF DOMESTIC STOVES OR RANGES, OF GENERAL APPLICATION
- F24C7/00—Stoves or ranges heated by electric energy
- F24C7/02—Stoves or ranges heated by electric energy using microwaves
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F24—HEATING; RANGES; VENTILATING
- F24C—DOMESTIC STOVES OR RANGES ; DETAILS OF DOMESTIC STOVES OR RANGES, OF GENERAL APPLICATION
- F24C7/00—Stoves or ranges heated by electric energy
- F24C7/08—Arrangement or mounting of control or safety devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Combustion & Propulsion (AREA)
- Mechanical Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Constitution Of High-Frequency Heating (AREA)
Abstract
The method that the invention discloses a kind of microwave oven diodes age test of household electrical appliances production field.Using constant load degradation, the method step of described diodes age test is as follows: 1) being removed by microwave oven original timer, select a long-time digitimer to substitute, intervalometer is the longest set the time as 999 hours；2) aperture will be made a call to bottom original-pack water plastic containers, and connect a high-temperature resistance plastice pipe and lead to the outer water container of a stove by microwave oven intracavity one aperture；3) being set 500 hours by intervalometer, the appropriate location of regulation liquid level controller liquid level sensor probe, setting power sets total power and starts test, and outer container is supplemented water when being in lower limit water-level alarm by the water level observing outer container in test, until off-test.The present invention has the test advantage such as constant and easy to operate.
Description
Technical field
The method that the invention discloses a kind of microwave oven diodes age test of household electrical appliances production field.
Background technology
High-voltage diode be the high-voltage rectifying of microwave oven critical component, the quality of its dynamic property directly influences microwave oven
Life-span.Conventional test method is: 1) microwave power is set as total power.2) test period 500 hours.3) load is
The water load of 1000ML.
Process of the test is as used common microwave stove because the time is at most set as 90 minutes, owing to water is as load, in examination
Can reduce due to evaporation of water during testing, cause load non-constant, the process that adds water must be opened the door, and at this moment microwave oven trade council stops adding
Heat, thus decrease the efficiency test time.It is short that the present invention solves the common microwave stove setting time, loads inconstant deficiency.
Summary of the invention
The purpose of the present invention by micro-stove is reequiped, solve common microwave stove because of set the time short, can not for a long time continuously the most not between
Disconnected work and and load inconstant deficiency, it is provided that the method for a kind of microwave oven diodes age test.
The present invention is achieved by the following technical solutions:
The method of a kind of microwave oven diodes age test, uses constant load degradation, it is characterised in that: described two
The method step of pole pipe degradation is as follows:
1) being removed by microwave oven original timer, select a long-time digitimer to substitute, intervalometer is the longest sets the time
It it is 999 hours；
2) aperture will be made a call to bottom original-pack water plastic containers, and connect a high-temperature resistance plastice pipe and drawn by microwave oven intracavity one aperture
Going out to the outer water container of a stove, this water outlet of container is filled an electromagnetic valve and is connected by a pipeline with stove inner pressurd vessel, and exterior at stove
One automatic liquid-level switch, to control electromagnetic valve work, when in test chamber water level less than setting value time, electromagnetic valve action, water from
Outer container injects inner pressurd vessel, until closed electromagnetic valve stops adding water when setting liquid level；
3) being set 500 hours by intervalometer, the appropriate location of regulation liquid level controller liquid level sensor probe, setting power sets
Total power starts test, and outer container is supplemented water when being in lower limit water-level alarm by the water level observing outer container in test, until
Off-test；Test period 500 hours；Load is the water load of 1000ML.
The present invention solve common microwave stove diodes age test in the setting time short and load inconstant problem,
The present invention has the advantages that test is constant and easy to operate.
Accompanying drawing explanation
Fig. 1 is the Method And Principle figure of microwave oven diodes age test.
Detailed description of the invention
Below in conjunction with the accompanying drawings present disclosure is further described:
It as shown is the Method And Principle figure of microwave oven diodes age test.
The present invention by microwave oven is reelected, solve common microwave stove because of the setting time short, it is impossible to long-time the most not
Discontinuous, and load inconstant deficiency.
The drip irrigation device of solution problem:
1. the intervalometer of common test microwave oven is removed, replace with a long-time timing device.
2. in microwave oven, increase automatic watering system so that the water heated ensures the amount needed for 3, to ensure water load
Constant.
3. the present invention solve common microwave stove because of the setting time short, test needs reset the time, cause test not
Continuous print problem.Test causes the inconstant deficiency of load because water reduces.And the discontinuous problem of test is caused because adding water.
Specific experiment scheme is as follows:
1) microwave oven original timer is removed with one digital (the longest set timing 999 hours) replacement；
2) aperture will be made a call to bottom original-pack water plastic containers, and connect a high-temperature resistance plastice pipe and drawn by microwave oven intracavity one aperture
Going out to the outer water container of a stove, this water outlet of container is filled an electromagnetic valve and is connected by a pipeline with stove inner pressurd vessel, and exterior at stove
One automatic liquid-level switch, to control electromagnetic valve work.When in test chamber water level less than setting value time, electromagnetic valve action, water from
Outer container injects inner pressurd vessel, until closed electromagnetic valve stops adding water when setting liquid level；
3) being set 500 hours by intervalometer, the appropriate location of regulation liquid level controller liquid level sensor probe, setting power sets
Total power starts test.Outer container is supplemented water when being in lower limit water-level alarm by the water level observing outer container in test, until
Off-test.
Claims (2)
1. the method that microwave oven is tested with diodes age, uses constant load degradation, it is characterised in that: described
The method step of diodes age test is as follows:
1) being removed by microwave oven original timer, select a long-time digitimer to substitute, intervalometer is the longest sets the time
It it is 999 hours；
2) aperture will be made a call to bottom original-pack water plastic containers, and connect a high-temperature resistance plastice pipe and drawn by microwave oven intracavity one aperture
Going out to the outer water container of a stove, this water outlet of container is filled an electromagnetic valve and is connected by a pipeline with stove inner pressurd vessel, and exterior at stove
One automatic liquid-level switch, to control electromagnetic valve work, when in test chamber water level less than setting value time, electromagnetic valve action, water from
Outer container injects inner pressurd vessel, until closed electromagnetic valve stops adding water when setting liquid level；
3) being set 500 hours by intervalometer, the appropriate location of regulation liquid level controller liquid level sensor probe, setting power sets
Total power starts test, and outer container is supplemented water when being in lower limit water-level alarm by the water level observing outer container in test, until
Off-test.
The method of microwave oven diodes age the most according to claim 1 test, it is characterised in that: test period 500
Hour；Load is the water load of 1000ML.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610686891.XA CN106291307A (en) | 2016-08-19 | 2016-08-19 | The method that microwave oven is tested with diodes age |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610686891.XA CN106291307A (en) | 2016-08-19 | 2016-08-19 | The method that microwave oven is tested with diodes age |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106291307A true CN106291307A (en) | 2017-01-04 |
Family
ID=57660476
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610686891.XA Pending CN106291307A (en) | 2016-08-19 | 2016-08-19 | The method that microwave oven is tested with diodes age |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106291307A (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201096866Y (en) * | 2007-08-31 | 2008-08-06 | 比亚迪股份有限公司 | A diode life tester |
| CN202649399U (en) * | 2012-06-18 | 2013-01-02 | 常州佳讯光电产业发展有限公司 | Diode voltage aging test stand |
| CN103245900A (en) * | 2013-04-19 | 2013-08-14 | 南通皋鑫电子股份有限公司 | Fully dynamic aging tester for high-power and high-voltage silicon stack |
| CN203196651U (en) * | 2012-10-08 | 2013-09-18 | 广西地博矿业集团股份有限公司 | Dryout-free constant-water-level constant-temperature water bath |
| CN204620031U (en) * | 2015-04-29 | 2015-09-09 | 南京信息工程大学 | A kind of thermostat water bath of improvement |
-
2016
- 2016-08-19 CN CN201610686891.XA patent/CN106291307A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201096866Y (en) * | 2007-08-31 | 2008-08-06 | 比亚迪股份有限公司 | A diode life tester |
| CN202649399U (en) * | 2012-06-18 | 2013-01-02 | 常州佳讯光电产业发展有限公司 | Diode voltage aging test stand |
| CN203196651U (en) * | 2012-10-08 | 2013-09-18 | 广西地博矿业集团股份有限公司 | Dryout-free constant-water-level constant-temperature water bath |
| CN103245900A (en) * | 2013-04-19 | 2013-08-14 | 南通皋鑫电子股份有限公司 | Fully dynamic aging tester for high-power and high-voltage silicon stack |
| CN204620031U (en) * | 2015-04-29 | 2015-09-09 | 南京信息工程大学 | A kind of thermostat water bath of improvement |
Non-Patent Citations (1)
| Title |
|---|
| 徐淼: "《家电维修入门》", 31 May 2013 * |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20170104 |