CN106199379A - Image co-registration circuit modulation transfer function test system - Google Patents
Image co-registration circuit modulation transfer function test system Download PDFInfo
- Publication number
- CN106199379A CN106199379A CN201610489897.8A CN201610489897A CN106199379A CN 106199379 A CN106199379 A CN 106199379A CN 201610489897 A CN201610489897 A CN 201610489897A CN 106199379 A CN106199379 A CN 106199379A
- Authority
- CN
- China
- Prior art keywords
- light
- image
- ccd
- slit
- function test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Analysis (AREA)
Abstract
The invention discloses a kind of image co-registration circuit modulation transfer function test system, on each assembly of headend equipment optics based on base guide rail, ensure same optical axis, Halogen light in light source assembly is as light source, light hurdle and optical filter are used for regulating light intensity and controlling wavelength, the light that Halogen light sends spreads out of respectively through light hurdle and optical filter, enters collimator by integrating sphere.The light that Halogen light is sent by integrating sphere is converted into uniform light, uniform light passes through slit, image in standard CC D, the sub image signal supplementary biography of acquisition is defeated by image co-registration circuit board and sample of high-resolution image card by CCD, and the image that now image pick-up card obtains obtains the modulation transfer function of CCD after calculating processing system and processing (fourier transform FFT)CCD, the second tunnel picture signal is gathered by image pick-up card after testing image merges circuit board again, is transferred to calculate processing system.Present system is easily achieved, simple to operate, measures accurately.
Description
Technical field
The present invention relates to test philosophy and the method for modulation transfer function (MTF) (MTF), particularly a kind of for image co-registration electricity
The system that the modulation transfer function (MTF) (MTF) of road plate is measured.
Technical background
On the premise of linear shifting is constant, optical system can be counted as a spatial frequency filtering device, and its imaging is special
Property and image quality evaluation can represent with the ratio (the most so-called optical transfer function) of the frequency spectrum between image, and optical delivery letter
The mould of number is exactly modulation transfer function (MTF).
Many problems attracted attention in the evaluation of optical system imaging quality, always Application Optics field, and modulate transmission
Function has been recognized optical system imaging quality method objective, effective of evaluating at present.Therefore, for image co-registration circuit, also
Necessary its modulation transfer function (MTF) is studied.
The main method of testing of modulation transfer function (MTF) has directly to be measured and indirectly measures.The direct method of measurement is directly to measure light
System different space frequency thing and the modulation degree of picture, based on detector for SIN function or the response of bar target.Indirectly
Measurement is to measure the optical system response to pulsed optical signals, calculating based on Fourier transformation.Merge the modulation transmission of circuit
Function can not directly record, and needs to realize by the way of measurement indirectly.Indirect measurement method uses fixing slit mesh
Mark, point source or the edge of a knife, and mobile target.For linear invariant system, all of measuring technology is in testing precision scope
Planted agent obtains identical MTF end value.
Summary of the invention
It is an object of the invention to provide the test system of the modulation transfer function (MTF) of a set of image co-registration circuit board, the most first allow
The light of light source is through optical system imaging in standard CC D, and imaging one tunnel is through fusion circuit board to be measured and image acquisition
Card, another road is transmitted directly on image pick-up card, gathers two paths of signals respectively, completes CCD's by computer system subsequently
Modulation function and the measurement of the modulation transfer function (MTF) after merging circuit board, both are divided by and obtain merging the modulation transmission of circuit
Function.
The technical solution realizing the present invention is: a kind of image co-registration circuit modulation transfer function test system, is divided into
Modulation function test headend equipment and modulation function test rear end equipment；Modulation function test headend equipment includes integrating sphere, light
Source, Guang Lan, optical filter, light barrier, collimator, slit, CCD and optics guide rail；Modulation function test rear end equipment includes height
Resolution acquisition card and computer system；The equal position of integrating sphere, light source, Guang Lan, optical filter, light barrier, collimator, slit, CCD
On optics guide rail, placing light hurdle and optical filter, be the light entrance port of integrating sphere after optical filter after light source, light barrier is at integrating sphere
Internal and be positioned at its light entrance port dead ahead, after collimator is positioned over the optical emission exit of integrating sphere, collimator rear end is put
Putting slit, slit is placed CCD, CCD rear end and is connected to the first transmission line and the second transmission line, and the first transmission line is connected to treat
Altimetric image merges circuit board, and the second transmission line is connected to high-resolution acquisition card, and testing image merges circuit board and high-resolution
Capture card is connected, and high-resolution acquisition card is connected to computer processing system.
In described modulation function test headend equipment, integrating sphere, light source, Guang Lan, optical filter, light barrier, collimator, narrow
Seam, the same optical axis of CCD, the object lens of CCD are positioned at directional light after slit on the focal plane of imaging.
In described modulation function test headend equipment, the lateral magnification of this optical system is β, and limiting resolution is μc,
Then the width a maximum of slit is amax=1/ β μc, i.e. the span of slit [9] is (0, amax)。
The present invention compared with prior art, its remarkable advantage: (1), in product on the market, has not been used to measurement and melts
Close the equipment of the MFT of circuit board, present invention achieves innovation；(2) modulation transfer function test headend equipment each assembly is the end of based on
On the optics guide rail of seat, can well ensure same optical axis and can easily be accommodated, the Halogen light in light source assembly is as light source, simultaneously
In conjunction with light hurdle and optical filter so that the wavelength of light intensity and light can regulate；(3) in front end slit designs, take into full account point
The zero point of cloth function and filter function limits, and is calculated the applicable seam width meeting condition；(4) test equipment rear end uses circuit
System, i.e. uniform light are through slit, after front end optical system, image in standard CC D, and ccd image is respectively by rear end
Image co-registration circuit and high-resolution acquisition card, then calculated test modulation transfer function (MTF) by the data analysis system of rear end equipment,
The MFT so recorded is the most accurate；(5) utilize indirect measurement method to calculate test and merge circuit modulation transfer function (MTF), the method
Simple innovation, it is easy to accomplish；(6) this device is simple to operate, measures accurately.
Accompanying drawing explanation
Fig. 1 is image co-registration circuit modulation transfer function test system schematic.
Fig. 2 is image co-registration circuit MTF test curve.1:CCD+ merges circuit MTF curve (MTFtotal)；2:CCD's
MTF curve (MTFCCD)；3: merge circuit MTF curve (MTFcircle).
Detailed description of the invention
Inventive principle
1. fusion circuit MTF measuring principle:
MTF is output modulation degree and the ratio of input modulation degree, is normalized to 1 at kernel frequency.MTF reflection
The system response to spatial frequency, it is the modulus value of optical transfer function, and optical transfer function is then Fu of point spread function
In leaf transformation.Modulation transfer function (MTF) is applicable to linear spatially invariant system, and landlord's form of this function is then completely by imaging system
The imaging performance of system is determined, therefore transmission function reflects the image quality of imaging system objectively, for by a series of tools
There is the imaging system that the subsystem of certain frequency characteristic (space or time) is formed, as long as obtaining the biography of subsystem one by one
Delivery function, its product is exactly the transmission function of whole system, and available equation below describes:
Image co-registration circuit will complete two groundworks: image registration and image co-registration.Image pixel mismatch introduces mould
(x y), can cause the fuzzy of pixel to stick with paste function b.Because image registration is the affine transformation in space, it is with certain point as initial point
The translation done, scaling and rotate, system errors can cause the difference of the value of the registration error of diverse location, so mismatch obscures
(x y) does not have translation invariance to function b.
The quality of image interfusion method is closely related with the quality of final fusion image, and the fusion method of difference results even in
The decline of fusion mass.Common fusion method has weighting method, PCA method, maximum measure method, low repetition system (Laplace, contrast
Degree etc.), wavelet method (s), center-cincture enhancing, color TRANSFER METHOD etc..Common image fusion method is all localized region picture
Element operates, and introducing fusion function f (x, y).
Image co-registration circuit needs to be acquired incoming video signal, and it is defeated to carry out video DA after registration and fusion
Go out.According to pal video collection analysis, this process is introduced into aliasing effect, is likely to introduce other noises simultaneously.?
This process introduce be referred to as circuit function e (x, y)
If the receptance function of CCD is that (x, y), its frequency-domain function is F (h (x, y)), then the light of fusion of imaging system to h
Learning transmission function is
O (f)=F (h (x, y)) F (b (x, y)) F (f (x, y)) F (e (x, y))
In formula, (((e (x, y)) is respectively b, and (x, y), (x, y) (x, y) frequency domain becomes f f (x, y)) and F F with e for b (x, y)), F
Change.Modulation transfer function (MTF) after merging circuit is
MTFtotal(f)=MTFCCD(f)·MTFb(f)·MTFf(f)·MTFe(f)
Therefore, the modulation transfer function (MTF) merging circuit is
MTFcircuit(f)=MTFb(f)·MTFf(f)·MTFe(f)
The modulation transfer function (MTF) merging circuit can not directly record, and will realize by the way of measurement indirectly.First
Image pick-up card is utilized to complete modulation function MTF of CCDCCDF () measures, then measure the modulation after merging circuit board and pass
Delivery function MTFtotalF (), both are divided by and obtain merging the modulation transfer function of circuitcircuit(f):
2. the design of slit
Ideally, slit should be that one highly infinitely great, width is 0, and δ (x) function that " area " is 1, but
During actual measurement, slit must is fulfilled for one fixed width and requires just can have enough light energies to measure.Meanwhile, slit width
Degree is not the bigger the better, and it can be limited by first dead-center position of filter function.Therefore, suitable slit width how is selected
Degree is that this project is firstly the need of the problem solved.Owing to slit has developed width a, its distribution function is
Being the system of β to lateral magnification, in order to eliminate seam width impact, measurement result should be divided by filter function Π (μ):
It can be seen that first dead-center position of filter function Π (μ) is at μ0=1/ (β a) place, along with seam width increases, this is zero years old
Point position is close to low frequency by high frequency.Apparent: first dead-center position of filter function Π (μ) falls in system limits resolution
μcIn addition, now the correction of filter function is the most meaningful.Therefore, the maximum a of slit widthmaxShould meet
In this measurement apparatus, collimator focal length is fcollimatorThe focal length of mm, CCD camera lens is fCCDMm, so system is horizontal
To amplification β=fCCD/fcollimator, so the maximum of slit width to be measured is:
3. integrated testability process
Below in conjunction with the accompanying drawings the test process of the present invention is described in further detail:
The invention discloses the modulation transfer function test system of a kind of image co-registration circuit board, system structure such as Fig. 1 institute
Show, on each assembly of headend equipment optics based on base guide rail, it is ensured that same to optical axis, the Halogen light in light source assembly as light source,
Light hurdle and optical filter are used for regulating light intensity and controlling wavelength, and the light that Halogen light sends passes respectively through light hurdle and optical filter
Go out, enter collimator by integrating sphere.The light that Halogen light is sent by integrating sphere is converted into uniform light, and uniform light passes through slit,
Imaging in standard CC D, the sub image signal supplementary biography of acquisition is defeated by image co-registration circuit board and sample of high-resolution image by CCD
Card, the image that now image pick-up card obtains obtains the modulation of CCD after calculating processing system and processing (fourier transform FFT)
Transmission function MTFCCD, the second tunnel picture signal is gathered by image pick-up card after testing image merges circuit board again, transmission
To calculating processing system, after processing (fourier transform FFT), obtain CCD and the comprehensive modulation of testing image fusion circuit board
Transmission function MTFtotal.By theory analysis, by MTFtotalDivided by MTFCCDI.e. can get the modulation transmission of circuit board under test
MTFcircle。MTFcircle、MTFtotalAnd MTFCCDBetween curve linear relationship as shown in Figure 2.
Claims (4)
1. an image co-registration circuit modulation transfer function test system, it is characterised in that: it is divided into modulation function test front end to set
Standby [1] and modulation function test rear end equipment [2]；Modulation function test headend equipment [1] include integrating sphere [3], light source [4],
Light hurdle [5], optical filter [6], light barrier [7], collimator [8], slit [9], CCD [10] and optics guide rail [11]；Modulation letter
Number test rear end equipment [2] includes high-resolution acquisition card [12] and computer system [13]；Integrating sphere [3], light source [4], light
Hurdle [5], optical filter [6], light barrier [7], collimator [8], slit [9], CCD [10] are respectively positioned on optics guide rail [11], light
Source [4] places light hurdle [5] and optical filter [6] afterwards, and optical filter [6] is the light entrance port of integrating sphere [3] afterwards, and light barrier [7] is long-pending
Bulb separation [3] is internal and is positioned at its light entrance port dead ahead, after collimator [8] is positioned over the optical emission exit of integrating sphere [3], flat
Slit [9] is placed in row light pipe [8] rear end, and slit [9] places CCD [10], and CCD [10] rear end is connected to the first transmission line
[14] and the second transmission line [15], the first transmission line [14] is connected to testing image and merges circuit board [16], the second transmission line
[15] being connected to high-resolution acquisition card [12], testing image merges circuit board [16] and is connected with high-resolution acquisition card [12],
High-resolution acquisition card [12] is connected to computer processing system [17].
Image co-registration circuit modulation transfer function test system the most according to claim 1, it is characterised in that: described modulation
In function test headend equipment [1], integrating sphere [3], light source [4], light hurdle [5], optical filter [6], light barrier [7], collimator
[8], slit [9], CCD [10] same to optical axis, the object lens of CCD [10] are positioned at directional light after slit [9] on the focal plane of imaging.
Image co-registration circuit modulation transfer function test system the most according to claim 1 and 2, it is characterised in that: described
In modulation function test headend equipment [1], the lateral magnification of this optical system is β, and limiting resolution is μc, then slit [9]
Width a maximum be amax=1/ β μc, i.e. the span of slit [9] is (0, amax)。
Image co-registration circuit modulation transfer function test system the most according to claim 1 and 2, it is characterised in that: light source
[4] the employing Halogen light in is as light source.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610489897.8A CN106199379A (en) | 2016-06-28 | 2016-06-28 | Image co-registration circuit modulation transfer function test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610489897.8A CN106199379A (en) | 2016-06-28 | 2016-06-28 | Image co-registration circuit modulation transfer function test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106199379A true CN106199379A (en) | 2016-12-07 |
Family
ID=57462600
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610489897.8A Pending CN106199379A (en) | 2016-06-28 | 2016-06-28 | Image co-registration circuit modulation transfer function test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106199379A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106679934A (en) * | 2016-12-19 | 2017-05-17 | 西安微电子技术研究所 | Low-frequency transfer-function test device of image sensor and test method thereof |
| CN108200425A (en) * | 2017-12-08 | 2018-06-22 | 北京空间机电研究所 | A kind of multi-direction biography letter detecting system and method based on TDI linear array detectors |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU420963A1 (en) * | 1972-01-06 | 1974-03-25 | А. А. Горлач, Г. Е. Максимов , А. А. Маслова | CONVERTER OF THE VALUE OF COEFFICIENTAMODULATION OF AMPLITUDE-MODULATED SYNUSOIDAL SIGNAL |
| US5199086A (en) * | 1991-01-17 | 1993-03-30 | Massachusetts Institute Of Technology | Electro-optic system |
| CN1963430A (en) * | 2006-12-08 | 2007-05-16 | 中国科学院上海光学精密机械研究所 | Measuring instrument and measuring method for modulation transfer function |
| CN104280214A (en) * | 2014-09-26 | 2015-01-14 | 中国科学院西安光学精密机械研究所 | CCD modulation transfer function measuring device and measuring method |
| CN204810456U (en) * | 2015-04-19 | 2015-11-25 | 刘晓岚 | Camera limiting resolving angle test system |
-
2016
- 2016-06-28 CN CN201610489897.8A patent/CN106199379A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU420963A1 (en) * | 1972-01-06 | 1974-03-25 | А. А. Горлач, Г. Е. Максимов , А. А. Маслова | CONVERTER OF THE VALUE OF COEFFICIENTAMODULATION OF AMPLITUDE-MODULATED SYNUSOIDAL SIGNAL |
| US5199086A (en) * | 1991-01-17 | 1993-03-30 | Massachusetts Institute Of Technology | Electro-optic system |
| CN1963430A (en) * | 2006-12-08 | 2007-05-16 | 中国科学院上海光学精密机械研究所 | Measuring instrument and measuring method for modulation transfer function |
| CN104280214A (en) * | 2014-09-26 | 2015-01-14 | 中国科学院西安光学精密机械研究所 | CCD modulation transfer function measuring device and measuring method |
| CN204810456U (en) * | 2015-04-19 | 2015-11-25 | 刘晓岚 | Camera limiting resolving angle test system |
Non-Patent Citations (3)
| Title |
|---|
| 李升才 等: "微光增强型电荷耦合装置成像系统调制传递函数测量方法研究", 《兵工技术》 * |
| 皇甫俊 等: "一种利用CCD测量像增强器MTF的方法研究", 《光学精密工程》 * |
| 钱惠国: "光学传递函数的测量即透镜成像质量分析", 《光电信息专业实践训练指导》 * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106679934A (en) * | 2016-12-19 | 2017-05-17 | 西安微电子技术研究所 | Low-frequency transfer-function test device of image sensor and test method thereof |
| CN106679934B (en) * | 2016-12-19 | 2019-04-09 | 西安微电子技术研究所 | A kind of image sensing device low frequency transmission function test device and its test method |
| CN108200425A (en) * | 2017-12-08 | 2018-06-22 | 北京空间机电研究所 | A kind of multi-direction biography letter detecting system and method based on TDI linear array detectors |
| CN108200425B (en) * | 2017-12-08 | 2019-08-09 | 北京空间机电研究所 | A kind of multi-direction biography letter detection system and method based on TDI linear array detector |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Mu et al. | Snapshot linear-Stokes imaging spectropolarimeter using division-of-focal-plane polarimetry and integral field spectroscopy | |
| CN106895780B (en) | The Optical devices of position for measurement object | |
| CN109186759B (en) | Grating spectrometer image quality measuring method and device | |
| CN100370306C (en) | High precision light beam coaxiality adjusting method | |
| US20230204418A1 (en) | High-speed and high-precision spectral video system and method for flame shooting | |
| CN104266755B (en) | A kind of spectral measurement method improving luminous flux and system | |
| CN105486489A (en) | Television imaging system modulation transfer function test device and method | |
| US20140240489A1 (en) | Optical inspection systems and methods for detecting surface discontinuity defects | |
| EP3411680B1 (en) | Miniature spectrometer and method for switching a miniature spectrometer between imaging mode and spectrometer mode | |
| Benes et al. | Multi-focus thermal image fusion | |
| DE102016218291A1 (en) | Method for non-contact determination of a two-dimensional temperature information and infrared measurement system | |
| US20230123777A1 (en) | Real-Time, Reference-Free Background Oriented Schlieren Imaging System | |
| CN106153301A (en) | A kind of detection method for rigid endoscope modulation transfer function (MTF) | |
| CN106199379A (en) | Image co-registration circuit modulation transfer function test system | |
| EP3276412A1 (en) | Object simulating apparatus for testing a camera lens and diagnostic system | |
| CN109632264A (en) | A kind of detection device and method of photographic device environmental test stability | |
| DE102012005417B4 (en) | Apparatus and method for angle-resolved scattered light measurement | |
| DE102011086226B3 (en) | Method for receiving spectrally resolved two-dimensional image by Fourier transform spectroscopy, involves feeding light to interferometer and splitting light into two partial-beams | |
| CN110160978A (en) | A kind of detection system and detection method of the comprehensive organoleptic indicator of drinking water | |
| CN103957404A (en) | Laboratory measurement device and method for satellite-borne push-broom camera point spread functions | |
| CN209283391U (en) | The lens detecting device of distance element | |
| Dittrich et al. | Measurement principle and arrangement for the determination of spectral channel-specific angle dependencies for multispectral resolving filter-on-chip CMOS cameras | |
| CN103411757B (en) | Measuring system based on optical transfer function of endoscope with special spatial frequency and calibrating method thereof | |
| DE102010014215A1 (en) | Method for determining optical property of lens system that is utilized as e.g. objective lens of movie camera, involves determining optical property of lens system for image position based on determined property and determined identifier | |
| CN206235769U (en) | A kind of mobile phone spectrometer |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20161207 |